JPS55146959A - Semiconductor device having silicon nitride film and integrated circuit using the same - Google Patents
Semiconductor device having silicon nitride film and integrated circuit using the sameInfo
- Publication number
- JPS55146959A JPS55146959A JP5345479A JP5345479A JPS55146959A JP S55146959 A JPS55146959 A JP S55146959A JP 5345479 A JP5345479 A JP 5345479A JP 5345479 A JP5345479 A JP 5345479A JP S55146959 A JPS55146959 A JP S55146959A
- Authority
- JP
- Japan
- Prior art keywords
- film
- si3n4
- semiconductor device
- sio2
- insulating film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 229910052581 Si3N4 Inorganic materials 0.000 title abstract 4
- 239000004065 semiconductor Substances 0.000 title abstract 4
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 title 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract 6
- 229910052681 coesite Inorganic materials 0.000 abstract 3
- 229910052906 cristobalite Inorganic materials 0.000 abstract 3
- 239000000377 silicon dioxide Substances 0.000 abstract 3
- 235000012239 silicon dioxide Nutrition 0.000 abstract 3
- 229910052682 stishovite Inorganic materials 0.000 abstract 3
- 239000000758 substrate Substances 0.000 abstract 3
- 229910052905 tridymite Inorganic materials 0.000 abstract 3
- 229910001218 Gallium arsenide Inorganic materials 0.000 abstract 1
- 230000008020 evaporation Effects 0.000 abstract 1
- 238000001704 evaporation Methods 0.000 abstract 1
- 239000000463 material Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
Landscapes
- Bipolar Transistors (AREA)
- Thyristors (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Formation Of Insulating Films (AREA)
- Bipolar Integrated Circuits (AREA)
- Non-Volatile Memory (AREA)
- Led Devices (AREA)
Abstract
PURPOSE:To obtain a current control type negative resistance, switching function, photo-switch characteristic and so forth, by providing a semiconductor device of the type having opposite electrodes formed on a semiconductor substrate through an insulating film, wherein the insulating film is composed of an Si3N4 film or a double-layered film including the Si3N4 film and an SiO2 film. CONSTITUTION:An Al evaporation film 10 as an opposing region is formed through a medium of an insulating film 1 on a semiconductor substrate 100 of n- type made of Si, GaP, InP, GaAs or the like material. A predetermined potential is applied between the substrate 100 and the film 10. In this structure, the film 1 is an SiO2 film having a thickness of 30Angstrom or so or a double layer of the SiO2 film and an Si3N4 film of 20-150Angstrom thick superposed to the latter. This arrangement permits an abrupt change of current flowing through the device, from cut-off state to conductive state, by a suitable control of the voltage applied to the device, so that a good switching function is obtained.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5345479A JPS55146959A (en) | 1979-05-02 | 1979-05-02 | Semiconductor device having silicon nitride film and integrated circuit using the same |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5345479A JPS55146959A (en) | 1979-05-02 | 1979-05-02 | Semiconductor device having silicon nitride film and integrated circuit using the same |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP63217955A Division JPH01117369A (en) | 1988-08-31 | 1988-08-31 | Semiconductor device provided with silicon nitride film |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS55146959A true JPS55146959A (en) | 1980-11-15 |
JPH0454395B2 JPH0454395B2 (en) | 1992-08-31 |
Family
ID=12943297
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5345479A Granted JPS55146959A (en) | 1979-05-02 | 1979-05-02 | Semiconductor device having silicon nitride film and integrated circuit using the same |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS55146959A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58168275A (en) * | 1982-03-29 | 1983-10-04 | Fujitsu Ltd | semiconductor equipment |
JPH01117369A (en) * | 1988-08-31 | 1989-05-10 | Agency Of Ind Science & Technol | Semiconductor device provided with silicon nitride film |
EP0512717A2 (en) * | 1991-05-02 | 1992-11-11 | Dow Corning Corporation | Threshold switching device with negative differential resistance |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS49131391A (en) * | 1973-04-19 | 1974-12-17 | ||
JPS5115396A (en) * | 1974-07-30 | 1976-02-06 | Hochiki Co | KEIHOSHISUTEMU |
JPS5234678A (en) * | 1975-06-18 | 1977-03-16 | Sperry Rand Corp | Multiiterminal inversion controlled semiconductor device |
JPS54156486A (en) * | 1978-05-31 | 1979-12-10 | Toshiba Corp | Negative resistance element |
-
1979
- 1979-05-02 JP JP5345479A patent/JPS55146959A/en active Granted
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS49131391A (en) * | 1973-04-19 | 1974-12-17 | ||
JPS5115396A (en) * | 1974-07-30 | 1976-02-06 | Hochiki Co | KEIHOSHISUTEMU |
JPS5234678A (en) * | 1975-06-18 | 1977-03-16 | Sperry Rand Corp | Multiiterminal inversion controlled semiconductor device |
JPS54156486A (en) * | 1978-05-31 | 1979-12-10 | Toshiba Corp | Negative resistance element |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58168275A (en) * | 1982-03-29 | 1983-10-04 | Fujitsu Ltd | semiconductor equipment |
JPH01117369A (en) * | 1988-08-31 | 1989-05-10 | Agency Of Ind Science & Technol | Semiconductor device provided with silicon nitride film |
JPH0550148B2 (en) * | 1988-08-31 | 1993-07-28 | Kogyo Gijutsuin | |
EP0512717A2 (en) * | 1991-05-02 | 1992-11-11 | Dow Corning Corporation | Threshold switching device with negative differential resistance |
Also Published As
Publication number | Publication date |
---|---|
JPH0454395B2 (en) | 1992-08-31 |
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