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JPS5513895A - Superlarge integrated circuit - Google Patents

Superlarge integrated circuit

Info

Publication number
JPS5513895A
JPS5513895A JP6758879A JP6758879A JPS5513895A JP S5513895 A JPS5513895 A JP S5513895A JP 6758879 A JP6758879 A JP 6758879A JP 6758879 A JP6758879 A JP 6758879A JP S5513895 A JPS5513895 A JP S5513895A
Authority
JP
Japan
Prior art keywords
superlarge
integrated circuit
integrated
circuit
superlarge integrated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6758879A
Other languages
Japanese (ja)
Inventor
Reinaa Hansu
Auto Berunaa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TDK Micronas GmbH
Original Assignee
Deutsche ITT Industries GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Deutsche ITT Industries GmbH filed Critical Deutsche ITT Industries GmbH
Publication of JPS5513895A publication Critical patent/JPS5513895A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP6758879A 1978-06-02 1979-06-01 Superlarge integrated circuit Pending JPS5513895A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19782824224 DE2824224A1 (en) 1978-06-02 1978-06-02 Very large scale integrated circuit with integral test circuit - has counter, combination circuit and selection switch with shift register

Publications (1)

Publication Number Publication Date
JPS5513895A true JPS5513895A (en) 1980-01-31

Family

ID=6040865

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6758879A Pending JPS5513895A (en) 1978-06-02 1979-06-01 Superlarge integrated circuit

Country Status (2)

Country Link
JP (1) JPS5513895A (en)
DE (1) DE2824224A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2905271A1 (en) * 1979-02-12 1980-08-21 Philips Patentverwaltung INTEGRATED CIRCUIT ARRANGEMENT IN MOS TECHNOLOGY WITH FIELD EFFECT TRANSISTORS
DE2905294A1 (en) * 1979-02-12 1980-08-21 Philips Patentverwaltung INTEGRATED CIRCUIT ARRANGEMENT IN MOS TECHNOLOGY WITH FIELD EFFECT TRANSISTORS

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3790885A (en) * 1972-03-27 1974-02-05 Ibm Serial test patterns for mosfet testing
US3961252A (en) * 1974-12-20 1976-06-01 International Business Machines Corporation Testing embedded arrays
US4051353A (en) * 1976-06-30 1977-09-27 International Business Machines Corporation Accordion shift register and its application in the implementation of level sensitive logic system

Also Published As

Publication number Publication date
DE2824224A1 (en) 1979-12-20

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