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JPS5467672A - Jig of inspecting characteristic of electronic parts - Google Patents

Jig of inspecting characteristic of electronic parts

Info

Publication number
JPS5467672A
JPS5467672A JP13340777A JP13340777A JPS5467672A JP S5467672 A JPS5467672 A JP S5467672A JP 13340777 A JP13340777 A JP 13340777A JP 13340777 A JP13340777 A JP 13340777A JP S5467672 A JPS5467672 A JP S5467672A
Authority
JP
Japan
Prior art keywords
jig
electronic parts
inspecting
characteristic
inspecting characteristic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13340777A
Other languages
Japanese (ja)
Other versions
JPS6058831B2 (en
Inventor
Hiroki Shiraishi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP52133407A priority Critical patent/JPS6058831B2/en
Publication of JPS5467672A publication Critical patent/JPS5467672A/en
Publication of JPS6058831B2 publication Critical patent/JPS6058831B2/en
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP52133407A 1977-11-09 1977-11-09 Characteristic inspection jig for electronic components Expired JPS6058831B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP52133407A JPS6058831B2 (en) 1977-11-09 1977-11-09 Characteristic inspection jig for electronic components

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP52133407A JPS6058831B2 (en) 1977-11-09 1977-11-09 Characteristic inspection jig for electronic components

Publications (2)

Publication Number Publication Date
JPS5467672A true JPS5467672A (en) 1979-05-31
JPS6058831B2 JPS6058831B2 (en) 1985-12-21

Family

ID=15104028

Family Applications (1)

Application Number Title Priority Date Filing Date
JP52133407A Expired JPS6058831B2 (en) 1977-11-09 1977-11-09 Characteristic inspection jig for electronic components

Country Status (1)

Country Link
JP (1) JPS6058831B2 (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5914074U (en) * 1982-06-18 1984-01-27 利昌工業株式会社 Insulating substrate for semiconductor device testing
JPS5917870U (en) * 1982-07-24 1984-02-03 利昌工業株式会社 Flat semiconductor package test substrate
JPS59214235A (en) * 1983-05-20 1984-12-04 Ibiden Co Ltd Method and apparatus for inspecting semiconductor wafer
JPS6033661U (en) * 1982-07-31 1985-03-07 利昌工業株式会社 Small outline package type semiconductor device testing board
JPS61228636A (en) * 1985-04-01 1986-10-11 Yamagata Nippon Denki Kk Transporting container for semiconductor device
JPS63245931A (en) * 1986-12-15 1988-10-13 ティアールダブリュー　インコーポレーテッド Probe card for testing integrated circuit chip
JPH01296178A (en) * 1988-05-25 1989-11-29 Sumitomo Electric Ind Ltd Apparatus for measuring integrated circuit

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51683A (en) * 1974-06-17 1976-01-06 Chomerics Inc
JPS5120587A (en) * 1974-08-10 1976-02-18 Omron Tateisi Electronics Co KIBANSETSUZOKUSOCHI
JPS5265892A (en) * 1975-11-26 1977-05-31 Shinetsu Polymer Co Nonnisotropic conductiveesheet type composite materials and method of manufacture thereof

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51683A (en) * 1974-06-17 1976-01-06 Chomerics Inc
JPS5120587A (en) * 1974-08-10 1976-02-18 Omron Tateisi Electronics Co KIBANSETSUZOKUSOCHI
JPS5265892A (en) * 1975-11-26 1977-05-31 Shinetsu Polymer Co Nonnisotropic conductiveesheet type composite materials and method of manufacture thereof

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5914074U (en) * 1982-06-18 1984-01-27 利昌工業株式会社 Insulating substrate for semiconductor device testing
JPS5917870U (en) * 1982-07-24 1984-02-03 利昌工業株式会社 Flat semiconductor package test substrate
JPS6033661U (en) * 1982-07-31 1985-03-07 利昌工業株式会社 Small outline package type semiconductor device testing board
JPS59214235A (en) * 1983-05-20 1984-12-04 Ibiden Co Ltd Method and apparatus for inspecting semiconductor wafer
JPS61228636A (en) * 1985-04-01 1986-10-11 Yamagata Nippon Denki Kk Transporting container for semiconductor device
JPS63245931A (en) * 1986-12-15 1988-10-13 ティアールダブリュー　インコーポレーテッド Probe card for testing integrated circuit chip
JPH01296178A (en) * 1988-05-25 1989-11-29 Sumitomo Electric Ind Ltd Apparatus for measuring integrated circuit

Also Published As

Publication number Publication date
JPS6058831B2 (en) 1985-12-21

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