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JPS5449184A - Analyzer - Google Patents

Analyzer

Info

Publication number
JPS5449184A
JPS5449184A JP11543277A JP11543277A JPS5449184A JP S5449184 A JPS5449184 A JP S5449184A JP 11543277 A JP11543277 A JP 11543277A JP 11543277 A JP11543277 A JP 11543277A JP S5449184 A JPS5449184 A JP S5449184A
Authority
JP
Japan
Prior art keywords
flux
light
reflecting mirror
light source
ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11543277A
Other languages
Japanese (ja)
Inventor
Keigo Nakamura
Takusuke Izumi
Shozo Sekino
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anritsu Corp
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
Agency of Industrial Science and Technology
Anritsu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency of Industrial Science and Technology, Anritsu Corp filed Critical Agency of Industrial Science and Technology
Priority to JP11543277A priority Critical patent/JPS5449184A/en
Publication of JPS5449184A publication Critical patent/JPS5449184A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/33Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using ultraviolet light

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To measure simultaneously substances having abosrption spectra respectively in the regions of ultraviolet ray and visible ray by composing a flux of light by coinciding the optical axes of ultraviolet ray shielded at a specific period by an optical chopper and visible ray by means of partially transmitting and reflecting mirror. CONSTITUTION:The light from a light source which radiate ultraviolet rays is shielded at specific period by an optical chopper 5 which rotates a disc by means of a servomotor 6 to be made into a parallel flux of light by a lens 4, and permitted to pass through a partially transmitting and partially reflecting mirror 8. On the other hand, the flux from a light source 1' which radiates visible rays is reflected at right angles by the mirror 8 to be coincides with the flux from the light source 1. The flux containing the ultraviolet ray and visible ray is bent by a full reflecting mirror 9 and is fed into an incidence window 11 of an absorption cell 10, then discharged out of the departure window 12. These parallel fluxes are introduced into a spectroscope 40 to be analyzed into spectrum. Then, the intensity of light delivered through outlet slits 55, 55' ... of this spectroscope 40 is converted into the strength of electric signal by the photoelectric transducer 8, and is processed in an electric processing system 100 having a switching circuit synchronized with the shielding period of the optical chopper 5.
JP11543277A 1977-09-26 1977-09-26 Analyzer Pending JPS5449184A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11543277A JPS5449184A (en) 1977-09-26 1977-09-26 Analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11543277A JPS5449184A (en) 1977-09-26 1977-09-26 Analyzer

Publications (1)

Publication Number Publication Date
JPS5449184A true JPS5449184A (en) 1979-04-18

Family

ID=14662414

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11543277A Pending JPS5449184A (en) 1977-09-26 1977-09-26 Analyzer

Country Status (1)

Country Link
JP (1) JPS5449184A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60115831A (en) * 1983-11-29 1985-06-22 Shimadzu Corp Image measuring device for two-dimensional electrophoresis gel
US5040889A (en) * 1986-05-30 1991-08-20 Pacific Scientific Company Spectrometer with combined visible and ultraviolet sample illumination

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5057285A (en) * 1973-09-18 1975-05-19

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5057285A (en) * 1973-09-18 1975-05-19

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60115831A (en) * 1983-11-29 1985-06-22 Shimadzu Corp Image measuring device for two-dimensional electrophoresis gel
US5040889A (en) * 1986-05-30 1991-08-20 Pacific Scientific Company Spectrometer with combined visible and ultraviolet sample illumination

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