JPS5423278B2 - - Google Patents
Info
- Publication number
- JPS5423278B2 JPS5423278B2 JP8896074A JP8896074A JPS5423278B2 JP S5423278 B2 JPS5423278 B2 JP S5423278B2 JP 8896074 A JP8896074 A JP 8896074A JP 8896074 A JP8896074 A JP 8896074A JP S5423278 B2 JPS5423278 B2 JP S5423278B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
- H01J49/421—Mass filters, i.e. deviating unwanted ions without trapping
- H01J49/4215—Quadrupole mass filters
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/22—Electrostatic deflection
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
- H01J49/4255—Device types with particular constructional features
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Tubes For Measurement (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US00389329A US3818228A (en) | 1973-08-17 | 1973-08-17 | Field termination plates for charged particle analyzers |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5051386A JPS5051386A (en) | 1975-05-08 |
JPS5423278B2 true JPS5423278B2 (en) | 1979-08-13 |
Family
ID=23537798
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8896074A Expired JPS5423278B2 (en) | 1973-08-17 | 1974-08-02 |
Country Status (5)
Country | Link |
---|---|
US (1) | US3818228A (en) |
JP (1) | JPS5423278B2 (en) |
DE (1) | DE2431415C3 (en) |
FR (1) | FR2241158B1 (en) |
GB (1) | GB1427906A (en) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4079254A (en) * | 1975-09-11 | 1978-03-14 | Analog Technology Corporation | Mass spectrometer filter |
JPS5320995A (en) * | 1976-08-09 | 1978-02-25 | Minnesota Mining & Mfg | Apparatus for surface layer analysis |
US4146787A (en) * | 1977-02-17 | 1979-03-27 | Extranuclear Laboratories, Inc. | Methods and apparatus for energy analysis and energy filtering of secondary ions and electrons |
JPS597736Y2 (en) * | 1977-02-25 | 1984-03-09 | 日本電子株式会社 | electron spectrometer |
JPS6037644A (en) * | 1983-08-10 | 1985-02-27 | Anelva Corp | Surface analyzer device |
US4714831A (en) * | 1986-05-01 | 1987-12-22 | International Business Machines | Spherical retarding grid analyzer |
US5097125A (en) * | 1986-06-04 | 1992-03-17 | Arch Development Corporation | Photo ion spectrometer |
US5008535A (en) * | 1988-09-02 | 1991-04-16 | U.S. Philips Corporation | Energy analyzer and spectrometer for low-energy electrons |
GB2244369A (en) * | 1990-05-22 | 1991-11-27 | Kratos Analytical Ltd | Charged particle energy analysers |
SE9702053D0 (en) * | 1997-05-29 | 1997-05-29 | Staffan Jonsson | Quadrupole gas detector |
EP1946352A4 (en) * | 2005-11-01 | 2010-10-13 | Univ Colorado | MULTICHANNEL ENERGY ANALYZER FOR CHARGED PARTICLES |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3735128A (en) * | 1971-08-27 | 1973-05-22 | Physical Electronics Ind Inc | Field termination plate |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2945124A (en) * | 1955-08-04 | 1960-07-12 | Bell & Howell Co | Formation of electrical fields |
US3670162A (en) * | 1970-09-23 | 1972-06-13 | Avco Corp | Charged particle analyzer |
US3739170A (en) * | 1971-12-20 | 1973-06-12 | Physical Electronics Ind Inc | Auger electron spectroscopy |
-
1973
- 1973-08-17 US US00389329A patent/US3818228A/en not_active Expired - Lifetime
-
1974
- 1974-04-11 GB GB1629874A patent/GB1427906A/en not_active Expired
- 1974-05-15 FR FR7416904A patent/FR2241158B1/fr not_active Expired
- 1974-06-29 DE DE2431415A patent/DE2431415C3/en not_active Expired
- 1974-08-02 JP JP8896074A patent/JPS5423278B2/ja not_active Expired
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3735128A (en) * | 1971-08-27 | 1973-05-22 | Physical Electronics Ind Inc | Field termination plate |
Also Published As
Publication number | Publication date |
---|---|
FR2241158A1 (en) | 1975-03-14 |
GB1427906A (en) | 1976-03-10 |
US3818228A (en) | 1974-06-18 |
DE2431415A1 (en) | 1975-03-20 |
FR2241158B1 (en) | 1980-04-11 |
JPS5051386A (en) | 1975-05-08 |
DE2431415B2 (en) | 1977-07-28 |
DE2431415C3 (en) | 1978-03-23 |