JPS54153583A - Semiconductor device - Google Patents
Semiconductor deviceInfo
- Publication number
- JPS54153583A JPS54153583A JP6161378A JP6161378A JPS54153583A JP S54153583 A JPS54153583 A JP S54153583A JP 6161378 A JP6161378 A JP 6161378A JP 6161378 A JP6161378 A JP 6161378A JP S54153583 A JPS54153583 A JP S54153583A
- Authority
- JP
- Japan
- Prior art keywords
- film
- covered
- forming part
- photo resist
- channel
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 title abstract 2
- 239000010408 film Substances 0.000 abstract 6
- 229920002120 photoresistant polymer Polymers 0.000 abstract 5
- 150000002500 ions Chemical class 0.000 abstract 4
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract 2
- 238000002347 injection Methods 0.000 abstract 2
- 239000007924 injection Substances 0.000 abstract 2
- 229910052681 coesite Inorganic materials 0.000 abstract 1
- 230000000295 complement effect Effects 0.000 abstract 1
- 229910052906 cristobalite Inorganic materials 0.000 abstract 1
- 238000004519 manufacturing process Methods 0.000 abstract 1
- 230000003647 oxidation Effects 0.000 abstract 1
- 238000007254 oxidation reaction Methods 0.000 abstract 1
- 239000000377 silicon dioxide Substances 0.000 abstract 1
- 229910052682 stishovite Inorganic materials 0.000 abstract 1
- 239000000758 substrate Substances 0.000 abstract 1
- 239000010409 thin film Substances 0.000 abstract 1
- 229910052905 tridymite Inorganic materials 0.000 abstract 1
Landscapes
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Abstract
PURPOSE: To establish the semiconductor device in which the mobility of n channel transistor is increased and the complementary element having the same performance is possible to be manufactured in lesser area.
CONSTITUTION: Taking an example of the inverter manufacture, first, the Si thin film 5 of (111) plane including acceptor is grown on the (0001) plane of the substrate 4 (Fig. a), and the part of form the CMOS inverter element is covered with the CVD SiO2 film 6. Further, the film 5 is etched in island shape (Fig. b). The P channel forming part is covered with the photo resist 7 and B+ ion injection is made to the side surface of the islands of n channel forming part (Fig. c). After removing the photo resist 7, the n channel is covered with the photo resist 8 and P+ ion injection is made to the side surface of the islands of P channel (Fig. d). Further, the film 6 is removed, the gate oxide film 12 is formed with thermal oxidation, P channel forming part is covered with the photo resist 9, and the B+ ions are injected to the n channel forming part (Fig. e). Further, the n channel forming part is covered with the photo resist 10, P+ ions are injected (Fig. f), polycrystal Si film 12 is coated, and the film 12 is removed by leaving only the gate.
COPYRIGHT: (C)1979,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6161378A JPS54153583A (en) | 1978-05-25 | 1978-05-25 | Semiconductor device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6161378A JPS54153583A (en) | 1978-05-25 | 1978-05-25 | Semiconductor device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS54153583A true JPS54153583A (en) | 1979-12-03 |
Family
ID=13176183
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6161378A Pending JPS54153583A (en) | 1978-05-25 | 1978-05-25 | Semiconductor device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS54153583A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5754371A (en) * | 1980-09-19 | 1982-03-31 | Toshiba Corp | Manufacture of semiconductor device |
| US5153702A (en) * | 1987-06-10 | 1992-10-06 | Hitachi, Ltd. | Thin film semiconductor device and method for fabricating the same |
| US6455875B2 (en) | 1992-10-09 | 2002-09-24 | Semiconductor Energy Laboratory Co., Ltd. | Thin film transistor having enhanced field mobility |
| US6624477B1 (en) * | 1992-10-09 | 2003-09-23 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
-
1978
- 1978-05-25 JP JP6161378A patent/JPS54153583A/en active Pending
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5754371A (en) * | 1980-09-19 | 1982-03-31 | Toshiba Corp | Manufacture of semiconductor device |
| US5153702A (en) * | 1987-06-10 | 1992-10-06 | Hitachi, Ltd. | Thin film semiconductor device and method for fabricating the same |
| US6455875B2 (en) | 1992-10-09 | 2002-09-24 | Semiconductor Energy Laboratory Co., Ltd. | Thin film transistor having enhanced field mobility |
| US6624477B1 (en) * | 1992-10-09 | 2003-09-23 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
| US6790749B2 (en) | 1992-10-09 | 2004-09-14 | Semiconductor Energy Laboratory Co., Ltd. | Method of manufacturing a semiconductor device |
| US7109108B2 (en) | 1992-10-09 | 2006-09-19 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device having metal silicide |
| US7602020B2 (en) | 1992-10-09 | 2009-10-13 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for forming the same |
| US7723788B2 (en) | 1992-10-09 | 2010-05-25 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for forming the same |
| US8017506B2 (en) | 1992-10-09 | 2011-09-13 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for forming the same |
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