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JPS54143662A - Optical system for semiconductor laser - Google Patents

Optical system for semiconductor laser

Info

Publication number
JPS54143662A
JPS54143662A JP5185378A JP5185378A JPS54143662A JP S54143662 A JPS54143662 A JP S54143662A JP 5185378 A JP5185378 A JP 5185378A JP 5185378 A JP5185378 A JP 5185378A JP S54143662 A JPS54143662 A JP S54143662A
Authority
JP
Japan
Prior art keywords
semiconductor laser
elements
thickness function
becomes
optical elements
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5185378A
Other languages
Japanese (ja)
Inventor
Naoto Kawamura
Koichi Sakugi
Isao Hakamata
Haruo Uchiyama
Takashi Kitamura
Masaaki Ishii
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP5185378A priority Critical patent/JPS54143662A/en
Publication of JPS54143662A publication Critical patent/JPS54143662A/en
Pending legal-status Critical Current

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Abstract

PURPOSE: To correct astigmatic difference with simple optical elements by providing a cylincrical system which comprises opposing two optical elements whose thickness functions may be expressed by the specific formula in the one-dimensional direction in mutually opposite directions and which is adjustable in the stripe direction.
CONSTITUTION: If it is assumed that the thickness function f(x) of a transparent element is f(x) = ax3 + bx2 + cx + d, then the thickness function g(x) where the x direction is made opposite becomes g(x) = -ax3 + bx2 - cx + d. Now, if f(x) is moved right by Δ and g(x) to left by Δ, then the combined thickness function T(x, Δ) becomes T(X, Δ)=2 {(3aΔ + b)x2 + cx + aΔ3 + bΔ2 + d}, thus having the same effect as that of a cylindrical lens. Hence, the astigmatic difference may be corrected in compliance with the characteristics of the semiconductor laser because the power of the elements changes simply by deviating such elements in the lateral direction.
COPYRIGHT: (C)1979,JPO&Japio
JP5185378A 1978-04-28 1978-04-28 Optical system for semiconductor laser Pending JPS54143662A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5185378A JPS54143662A (en) 1978-04-28 1978-04-28 Optical system for semiconductor laser

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5185378A JPS54143662A (en) 1978-04-28 1978-04-28 Optical system for semiconductor laser

Publications (1)

Publication Number Publication Date
JPS54143662A true JPS54143662A (en) 1979-11-09

Family

ID=12898411

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5185378A Pending JPS54143662A (en) 1978-04-28 1978-04-28 Optical system for semiconductor laser

Country Status (1)

Country Link
JP (1) JPS54143662A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5735824A (en) * 1980-08-14 1982-02-26 Ricoh Co Ltd Light beam scanner
US4339178A (en) * 1980-06-09 1982-07-13 The United States Of America As Represented By The Secretary Of The Army Log-log scale refractor
JP2016049515A (en) * 2014-09-02 2016-04-11 株式会社オーエスアイツール Object inspection device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4339178A (en) * 1980-06-09 1982-07-13 The United States Of America As Represented By The Secretary Of The Army Log-log scale refractor
JPS5735824A (en) * 1980-08-14 1982-02-26 Ricoh Co Ltd Light beam scanner
JP2016049515A (en) * 2014-09-02 2016-04-11 株式会社オーエスアイツール Object inspection device

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