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JPS54143193A - Deffct testing method and apparatus for packaged articles - Google Patents

Deffct testing method and apparatus for packaged articles

Info

Publication number
JPS54143193A
JPS54143193A JP4978278A JP4978278A JPS54143193A JP S54143193 A JPS54143193 A JP S54143193A JP 4978278 A JP4978278 A JP 4978278A JP 4978278 A JP4978278 A JP 4978278A JP S54143193 A JPS54143193 A JP S54143193A
Authority
JP
Japan
Prior art keywords
mask
sheet
deffct
improve
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4978278A
Other languages
Japanese (ja)
Inventor
Shinichi Nakajima
Toshio Sato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP4978278A priority Critical patent/JPS54143193A/en
Publication of JPS54143193A publication Critical patent/JPS54143193A/en
Pending legal-status Critical Current

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34—Sorting according to other particular properties
    • B07C5/3404—Sorting according to other particular properties according to properties of containers or receptacles, e.g. rigidity, leaks, fill-level
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To improve the accuracy of package tests by subjecting the portion other than the test area to mask treatment so that the signal output from the unnecessary portion may be eliminated. CONSTITUTION:A mask 21 is formed with a slot-shaped aperture or transparent portion 23 corresponding to a pocket 22 for receiving each product. On the other hand, the mask 21 itself is made of such a suitable material as can prevent the signals from the undesired portion from passing therethrough. The mask 21 is arranged between the sheet 1 and an image sensor 4 above a conveyor 2 by which the PTP sheet is conveyed. As a result, the sensor 4 is shielded from the light from above the sheet so that only the light from the product or the test piece can come. On the other hand, the testing mask at the sheet portion has its transparent and shielding portions reversed from those of the mask 21. By masking the portion other than the test area to block the generation of the undesired signals, it is possible to improve the testing accuracy.
JP4978278A 1978-04-28 1978-04-28 Deffct testing method and apparatus for packaged articles Pending JPS54143193A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4978278A JPS54143193A (en) 1978-04-28 1978-04-28 Deffct testing method and apparatus for packaged articles

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4978278A JPS54143193A (en) 1978-04-28 1978-04-28 Deffct testing method and apparatus for packaged articles

Publications (1)

Publication Number Publication Date
JPS54143193A true JPS54143193A (en) 1979-11-08

Family

ID=12840722

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4978278A Pending JPS54143193A (en) 1978-04-28 1978-04-28 Deffct testing method and apparatus for packaged articles

Country Status (1)

Country Link
JP (1) JPS54143193A (en)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62163950A (en) * 1986-01-14 1987-07-20 Eisai Co Ltd Method and apparatus for detecting defective thermally adhered seal of ptp packed body
JPS62259046A (en) * 1986-05-02 1987-11-11 Fuji Photo Film Co Ltd Inspection method for surface of magnetic disk
EP0375315A2 (en) * 1988-12-23 1990-06-27 Shionogi Europe B.V. Capsule-inspection apparatus
WO1998058241A1 (en) * 1997-06-17 1998-12-23 Yuki Engineering System, Ltd Device for checking sheet packaging
JP2001041900A (en) * 1997-11-07 2001-02-16 Yuki Gijutsu Sogo:Kk Sheet package inspecting apparatus
JP2001041894A (en) * 1997-06-17 2001-02-16 Yuki Gijutsu Sogo:Kk Apparatus and method for inspecting sheet package
JP2007121290A (en) * 2005-10-24 2007-05-17 General Electric Co <Ge> Method and device for generating mask
JP2007327751A (en) * 2006-06-06 2007-12-20 Ckd Corp Visual inspection apparatus and ptp sheet manufacturing apparatus
JP2019207193A (en) * 2018-05-30 2019-12-05 Ckd株式会社 Inspection device and ptp packing machine

Cited By (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62163950A (en) * 1986-01-14 1987-07-20 Eisai Co Ltd Method and apparatus for detecting defective thermally adhered seal of ptp packed body
JPS62259046A (en) * 1986-05-02 1987-11-11 Fuji Photo Film Co Ltd Inspection method for surface of magnetic disk
US4789238A (en) * 1986-05-02 1988-12-06 Fuji Photo Film Co., Ltd. Method of inspecting magnetic disk surface
EP0375315A2 (en) * 1988-12-23 1990-06-27 Shionogi Europe B.V. Capsule-inspection apparatus
JP2001041894A (en) * 1997-06-17 2001-02-16 Yuki Gijutsu Sogo:Kk Apparatus and method for inspecting sheet package
WO1998058241A1 (en) * 1997-06-17 1998-12-23 Yuki Engineering System, Ltd Device for checking sheet packaging
US6445452B1 (en) 1997-06-17 2002-09-03 Yuki Engineering System Co., Ltd. Device for checking sheet packaging
JP2001041900A (en) * 1997-11-07 2001-02-16 Yuki Gijutsu Sogo:Kk Sheet package inspecting apparatus
JP2007121290A (en) * 2005-10-24 2007-05-17 General Electric Co <Ge> Method and device for generating mask
JP2007327751A (en) * 2006-06-06 2007-12-20 Ckd Corp Visual inspection apparatus and ptp sheet manufacturing apparatus
JP2019207193A (en) * 2018-05-30 2019-12-05 Ckd株式会社 Inspection device and ptp packing machine
WO2019230051A1 (en) * 2018-05-30 2019-12-05 Ckd株式会社 Inspecting device, and ptp packing machine
CN112262311A (en) * 2018-05-30 2021-01-22 Ckd株式会社 Inspection device and PTP packaging machine
US11414231B2 (en) 2018-05-30 2022-08-16 Ckd Corporation Inspection device and PTP packaging machine
CN112262311B (en) * 2018-05-30 2024-10-11 Ckd株式会社 Inspection device and PTP packaging machine

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