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JPS54132173A - Schottky barrier diode - Google Patents

Schottky barrier diode

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Publication number
JPS54132173A
JPS54132173A JP4012978A JP4012978A JPS54132173A JP S54132173 A JPS54132173 A JP S54132173A JP 4012978 A JP4012978 A JP 4012978A JP 4012978 A JP4012978 A JP 4012978A JP S54132173 A JPS54132173 A JP S54132173A
Authority
JP
Japan
Prior art keywords
layer
type
schottky barrier
width
reverse
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4012978A
Other languages
Japanese (ja)
Inventor
Kimii Sumino
Hisao Osawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP4012978A priority Critical patent/JPS54132173A/en
Publication of JPS54132173A publication Critical patent/JPS54132173A/en
Pending legal-status Critical Current

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Abstract

PURPOSE: To improve the relation between the reverse surge rating and the forward property by providing the barrier metal to the outer N layer of the semiconductor wafer composed of the N+-N-N+-N layer.
CONSTITUTION: N-type layer 22 of width W02, N+-type layer 23 and N-type layer 24 of width W2 are formed on N+-type Si substrate 21 in lamination. Thus a diode composed of the N+-N-N+-N laye is obtained. Then barrier metal 25 is coated on layer 24. With applicatin of the reverse surge voltage to the Schottky barrier diode thus composed, space charge region 26 extending into layer 24 is prevented by layer 23 from extending further. Thus, the forward resistance is reduced with imporved forward characteristics although the reverse dielectric strength is lowered slightly. Furthermore, the characteristic dispersion is also reduced. In this way, the new N+-N layer is formed in addition to the normal N+-N layer.
COPYRIGHT: (C)1979,JPO&Japio
JP4012978A 1978-04-05 1978-04-05 Schottky barrier diode Pending JPS54132173A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4012978A JPS54132173A (en) 1978-04-05 1978-04-05 Schottky barrier diode

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4012978A JPS54132173A (en) 1978-04-05 1978-04-05 Schottky barrier diode

Publications (1)

Publication Number Publication Date
JPS54132173A true JPS54132173A (en) 1979-10-13

Family

ID=12572192

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4012978A Pending JPS54132173A (en) 1978-04-05 1978-04-05 Schottky barrier diode

Country Status (1)

Country Link
JP (1) JPS54132173A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6690035B1 (en) * 2000-03-03 2004-02-10 Matsushita Electric Industrial Co., Ltd. Semiconductor device having an active region of alternating layers
CN106898638A (en) * 2017-01-16 2017-06-27 中国电子科技集团公司第五十五研究所 A kind of SiC schottky diode structure and preparation method for improving surge capacity

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6690035B1 (en) * 2000-03-03 2004-02-10 Matsushita Electric Industrial Co., Ltd. Semiconductor device having an active region of alternating layers
US6989553B2 (en) 2000-03-03 2006-01-24 Matsushita Electric Industrial Co., Ltd. Semiconductor device having an active region of alternating layers
CN106898638A (en) * 2017-01-16 2017-06-27 中国电子科技集团公司第五十五研究所 A kind of SiC schottky diode structure and preparation method for improving surge capacity
CN106898638B (en) * 2017-01-16 2019-09-10 中国电子科技集团公司第五十五研究所 A kind of SiC schottky diode structure and preparation method improving surge capacity

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