JPS54126476A - Offset voltage measuring method of semiconductor integrated operational amplifier circuit - Google Patents
Offset voltage measuring method of semiconductor integrated operational amplifier circuitInfo
- Publication number
- JPS54126476A JPS54126476A JP3430278A JP3430278A JPS54126476A JP S54126476 A JPS54126476 A JP S54126476A JP 3430278 A JP3430278 A JP 3430278A JP 3430278 A JP3430278 A JP 3430278A JP S54126476 A JPS54126476 A JP S54126476A
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- expression
- indicated
- offset
- offset voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
PURPOSE: To simplify measurement by measuring previously the offset voltage at the time when one input bias resistance having a known value is inserted to the input to terminal of an operational amplifier and calculating the offset voltage at the time, when a differnt bias resistance is inserted, by an arithmetic processing circuit.
CONSTITUTION: In measurement of offset voltage V103 in case of input bias resistance "0", contacts a and b of lead relay K1 are short-circuited previously, and output voltage V03 of null amplifier 2 is measured by measuring circuit 3 and is digitized, and this digitized value is first stored in arithmetic processing circuit 4. Next, contacts a and b are opened to connect bias resistances RSa and RSb, and output voltage V04 obtained under this state is measured, and difference vltage V05 between this voltage V04 and voltage V03 stored in circuit 4 is obtained, and offset current IOFF1 indicated by expression-(3) is obtained from this voltage V05. After that, offset current IOFF2 indicated by expression-(4) is obtained from voltage VOX2 at the time when different bias resistance RX is connected, and voltage VOX2 indicated by expression-(5) is calculated from expressions-(3) and (4) to obtain desired voltage VOX1 to be measured, which is indicated by expression-(6).
COPYRIGHT: (C)1979,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3430278A JPS54126476A (en) | 1978-03-24 | 1978-03-24 | Offset voltage measuring method of semiconductor integrated operational amplifier circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3430278A JPS54126476A (en) | 1978-03-24 | 1978-03-24 | Offset voltage measuring method of semiconductor integrated operational amplifier circuit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS54126476A true JPS54126476A (en) | 1979-10-01 |
Family
ID=12410351
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3430278A Pending JPS54126476A (en) | 1978-03-24 | 1978-03-24 | Offset voltage measuring method of semiconductor integrated operational amplifier circuit |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS54126476A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| RU2612872C1 (en) * | 2016-01-14 | 2017-03-13 | Акционерное общество "Российская корпорация ракетно-космического приборостроения и информационных систем" (АО "Российские космические системы") | Device for measuring electrical parameters of operational amplifiers and voltage comparators |
| CN110361646A (en) * | 2019-07-12 | 2019-10-22 | 北京华峰测控技术股份有限公司 | A kind of operational amplifier test circuit and test method |
| CN117092484A (en) * | 2023-07-04 | 2023-11-21 | 江苏润石科技有限公司 | High-speed operational amplifier test circuit and test method thereof |
| CN117214661A (en) * | 2023-09-11 | 2023-12-12 | 无锡市晶源微电子股份有限公司 | Input offset voltage testing device for operational amplifier |
-
1978
- 1978-03-24 JP JP3430278A patent/JPS54126476A/en active Pending
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| RU2612872C1 (en) * | 2016-01-14 | 2017-03-13 | Акционерное общество "Российская корпорация ракетно-космического приборостроения и информационных систем" (АО "Российские космические системы") | Device for measuring electrical parameters of operational amplifiers and voltage comparators |
| CN110361646A (en) * | 2019-07-12 | 2019-10-22 | 北京华峰测控技术股份有限公司 | A kind of operational amplifier test circuit and test method |
| CN110361646B (en) * | 2019-07-12 | 2024-01-02 | 北京华峰测控技术股份有限公司 | Operational amplifier test circuit and test method |
| CN117092484A (en) * | 2023-07-04 | 2023-11-21 | 江苏润石科技有限公司 | High-speed operational amplifier test circuit and test method thereof |
| CN117214661A (en) * | 2023-09-11 | 2023-12-12 | 无锡市晶源微电子股份有限公司 | Input offset voltage testing device for operational amplifier |
| CN117214661B (en) * | 2023-09-11 | 2024-04-19 | 无锡市晶源微电子股份有限公司 | Input offset voltage testing device for operational amplifier |
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