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JPS54123054A - Test piece processor - Google Patents

Test piece processor

Info

Publication number
JPS54123054A
JPS54123054A JP3062878A JP3062878A JPS54123054A JP S54123054 A JPS54123054 A JP S54123054A JP 3062878 A JP3062878 A JP 3062878A JP 3062878 A JP3062878 A JP 3062878A JP S54123054 A JPS54123054 A JP S54123054A
Authority
JP
Japan
Prior art keywords
test
test piece
unit
tests
units
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3062878A
Other languages
Japanese (ja)
Inventor
Hajime Saito
Shizuo Kamikura
Mamoru Yoneda
Kazuo Aoki
Hironori Kawaguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP3062878A priority Critical patent/JPS54123054A/en
Publication of JPS54123054A publication Critical patent/JPS54123054A/en
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

PURPOSE: To improve the test processing efficiency by selectively connecting the respective pin terminals of a single test piece with a plurality of test units so that they may be subjected to the center control by a host data processor.
CONSTITUTION: A test piece 1 is selectively connected in a pin corresponding manner with a DC parametric test unit 4, a function test unit 5 and an AC test unit 6 and is tested. The test piece is tested solely or jointly by the respective test units 4, 5 and 6. These tests are centrally controlled by a host data processor 2. As a result, the tests such as a DC parametric test, a function test or an AC test can be accomplished at one time. The tesing conditions are preset by the unit 5, and the tests by the units 4 and 6 can be accomplished so that the efficiency of the test processing can be improved.
COPYRIGHT: (C)1979,JPO&Japio
JP3062878A 1978-03-17 1978-03-17 Test piece processor Pending JPS54123054A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3062878A JPS54123054A (en) 1978-03-17 1978-03-17 Test piece processor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3062878A JPS54123054A (en) 1978-03-17 1978-03-17 Test piece processor

Publications (1)

Publication Number Publication Date
JPS54123054A true JPS54123054A (en) 1979-09-25

Family

ID=12309107

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3062878A Pending JPS54123054A (en) 1978-03-17 1978-03-17 Test piece processor

Country Status (1)

Country Link
JP (1) JPS54123054A (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59111597A (en) * 1982-12-16 1984-06-27 横河電機株式会社 Test system
JPS59111596A (en) * 1982-12-16 1984-06-27 横河電機株式会社 Test system
JPS59163695A (en) * 1983-03-07 1984-09-14 横河電機株式会社 Testing system
JPS60236240A (en) * 1984-05-09 1985-11-25 Mitsubishi Electric Corp Semiconductor testing device
JPS63191976A (en) * 1987-02-05 1988-08-09 Hitachi Electronics Eng Co Ltd IC inspection equipment
JPS63201527A (en) * 1987-02-18 1988-08-19 Anritsu Corp Measuring instrument
JPH01117518U (en) * 1988-02-03 1989-08-08
JPH0317575A (en) * 1989-06-14 1991-01-25 Mitsubishi Electric Corp Lsi testing apparatus

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59111597A (en) * 1982-12-16 1984-06-27 横河電機株式会社 Test system
JPS59111596A (en) * 1982-12-16 1984-06-27 横河電機株式会社 Test system
JPS59163695A (en) * 1983-03-07 1984-09-14 横河電機株式会社 Testing system
JPS60236240A (en) * 1984-05-09 1985-11-25 Mitsubishi Electric Corp Semiconductor testing device
JPS63191976A (en) * 1987-02-05 1988-08-09 Hitachi Electronics Eng Co Ltd IC inspection equipment
JPS63201527A (en) * 1987-02-18 1988-08-19 Anritsu Corp Measuring instrument
JPH01117518U (en) * 1988-02-03 1989-08-08
JPH0317575A (en) * 1989-06-14 1991-01-25 Mitsubishi Electric Corp Lsi testing apparatus

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