JPS54107269A - Non-volatile semiconductor memory and its production - Google Patents
Non-volatile semiconductor memory and its productionInfo
- Publication number
- JPS54107269A JPS54107269A JP1423178A JP1423178A JPS54107269A JP S54107269 A JPS54107269 A JP S54107269A JP 1423178 A JP1423178 A JP 1423178A JP 1423178 A JP1423178 A JP 1423178A JP S54107269 A JPS54107269 A JP S54107269A
- Authority
- JP
- Japan
- Prior art keywords
- diffused
- boron
- window
- production
- region
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 title 1
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 abstract 2
- 229910052796 boron Inorganic materials 0.000 abstract 2
- 239000012535 impurity Substances 0.000 abstract 2
- 239000000126 substance Substances 0.000 abstract 2
- 238000003486 chemical etching Methods 0.000 abstract 1
- 239000013078 crystal Substances 0.000 abstract 1
- 238000009792 diffusion process Methods 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
- 150000004767 nitrides Chemical class 0.000 abstract 1
- 238000000059 patterning Methods 0.000 abstract 1
- 239000000758 substrate Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/68—Floating-gate IGFETs
- H10D30/681—Floating-gate IGFETs having only two programming levels
Landscapes
- Semiconductor Memories (AREA)
- Non-Volatile Memory (AREA)
Abstract
PURPOSE:To reduce the write voltage by providing a high-density impurity region, which has the same conductive type as a substance, outside a floating gate electrode and a drain diffusion region. CONSTITUTION:Boron is diffused in Si substrate 1 to form channel stopper region 2; and after growing oxide films 3 and 4, poly-crystal Si film 5, nitride film 6, and Si oxide films 7 and 8, window 12 is provided by patterning, and window 10 is provided by chemical etching. Then, boron is diffused on the exposed substance surface by the ion unjection method, etc., thereby forming writing high-density impurity region 11.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1423178A JPS54107269A (en) | 1978-02-10 | 1978-02-10 | Non-volatile semiconductor memory and its production |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1423178A JPS54107269A (en) | 1978-02-10 | 1978-02-10 | Non-volatile semiconductor memory and its production |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS54107269A true JPS54107269A (en) | 1979-08-22 |
Family
ID=11855289
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1423178A Pending JPS54107269A (en) | 1978-02-10 | 1978-02-10 | Non-volatile semiconductor memory and its production |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS54107269A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5519851A (en) * | 1978-07-31 | 1980-02-12 | Hitachi Ltd | Manufacture of non-volatile memories |
JPS5834976A (en) * | 1981-08-26 | 1983-03-01 | Nec Corp | Nonvolatile semiconductor device |
-
1978
- 1978-02-10 JP JP1423178A patent/JPS54107269A/en active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5519851A (en) * | 1978-07-31 | 1980-02-12 | Hitachi Ltd | Manufacture of non-volatile memories |
JPS5729860B2 (en) * | 1978-07-31 | 1982-06-25 | ||
JPS5834976A (en) * | 1981-08-26 | 1983-03-01 | Nec Corp | Nonvolatile semiconductor device |
JPS6322625B2 (en) * | 1981-08-26 | 1988-05-12 | Nippon Electric Co |
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