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JPS5343441A - Test method for ic memory element - Google Patents

Test method for ic memory element

Info

Publication number
JPS5343441A
JPS5343441A JP11821576A JP11821576A JPS5343441A JP S5343441 A JPS5343441 A JP S5343441A JP 11821576 A JP11821576 A JP 11821576A JP 11821576 A JP11821576 A JP 11821576A JP S5343441 A JPS5343441 A JP S5343441A
Authority
JP
Japan
Prior art keywords
test method
memory element
shorten
fault
address
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11821576A
Other languages
Japanese (ja)
Other versions
JPS5843840B2 (en
Inventor
Seishichi Kishi
Noboru Onishi
Tadashi Kawanobe
Yoshikatsu Otsu
Toshio Oma
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Nippon Telegraph and Telephone Corp
Original Assignee
Fujitsu Ltd
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd, Nippon Telegraph and Telephone Corp filed Critical Fujitsu Ltd
Priority to JP51118215A priority Critical patent/JPS5843840B2/en
Publication of JPS5343441A publication Critical patent/JPS5343441A/en
Publication of JPS5843840B2 publication Critical patent/JPS5843840B2/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/41—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
    • G11C11/413—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Static Random-Access Memory (AREA)

Abstract

PURPOSE:To realize a test method for an IC memory element using an inverting cell system, which can detect the fault of the address and data systems and also shorten the test time without receiving any influence of the element's physical structure.
JP51118215A 1976-10-01 1976-10-01 IC memory device testing method Expired JPS5843840B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP51118215A JPS5843840B2 (en) 1976-10-01 1976-10-01 IC memory device testing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP51118215A JPS5843840B2 (en) 1976-10-01 1976-10-01 IC memory device testing method

Publications (2)

Publication Number Publication Date
JPS5343441A true JPS5343441A (en) 1978-04-19
JPS5843840B2 JPS5843840B2 (en) 1983-09-29

Family

ID=14731054

Family Applications (1)

Application Number Title Priority Date Filing Date
JP51118215A Expired JPS5843840B2 (en) 1976-10-01 1976-10-01 IC memory device testing method

Country Status (1)

Country Link
JP (1) JPS5843840B2 (en)

Also Published As

Publication number Publication date
JPS5843840B2 (en) 1983-09-29

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