JPS524887A - Optical surface scar inspector - Google Patents
Optical surface scar inspectorInfo
- Publication number
- JPS524887A JPS524887A JP8134075A JP8134075A JPS524887A JP S524887 A JPS524887 A JP S524887A JP 8134075 A JP8134075 A JP 8134075A JP 8134075 A JP8134075 A JP 8134075A JP S524887 A JPS524887 A JP S524887A
- Authority
- JP
- Japan
- Prior art keywords
- inspector
- optical surface
- surface scar
- light receiving
- scar
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Examining Or Testing Airtightness (AREA)
Abstract
PURPOSE: Inspection surface is illuminated by projectors and the light receiving surface of the light receiving equipment is constituted by photoelectric elements to resemble visual inspection methods in order to increase reliability and to distinguish the largeness of scars.
COPYRIGHT: (C)1977,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8134075A JPS524887A (en) | 1975-06-30 | 1975-06-30 | Optical surface scar inspector |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8134075A JPS524887A (en) | 1975-06-30 | 1975-06-30 | Optical surface scar inspector |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS524887A true JPS524887A (en) | 1977-01-14 |
Family
ID=13743630
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8134075A Pending JPS524887A (en) | 1975-06-30 | 1975-06-30 | Optical surface scar inspector |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS524887A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5671173A (en) * | 1979-11-14 | 1981-06-13 | Hitachi Ltd | Pattern detection method of printed circuit substrate |
JPS57124244A (en) * | 1981-01-26 | 1982-08-03 | Nippon Kokan Kk <Nkk> | Detection for surface flaw of steel product |
JPS6162844A (en) * | 1984-09-05 | 1986-03-31 | Sumitomo Bakelite Co Ltd | Method for inspecting surface appearance of semiconductive resin sealed molded product |
US4687107A (en) * | 1985-05-02 | 1987-08-18 | Pennwalt Corporation | Apparatus for sizing and sorting articles |
-
1975
- 1975-06-30 JP JP8134075A patent/JPS524887A/en active Pending
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5671173A (en) * | 1979-11-14 | 1981-06-13 | Hitachi Ltd | Pattern detection method of printed circuit substrate |
JPS6225221B2 (en) * | 1979-11-14 | 1987-06-02 | Hitachi Ltd | |
JPS57124244A (en) * | 1981-01-26 | 1982-08-03 | Nippon Kokan Kk <Nkk> | Detection for surface flaw of steel product |
JPH0520695B2 (en) * | 1981-01-26 | 1993-03-22 | Nippon Kokan Kk | |
JPS6162844A (en) * | 1984-09-05 | 1986-03-31 | Sumitomo Bakelite Co Ltd | Method for inspecting surface appearance of semiconductive resin sealed molded product |
US4687107A (en) * | 1985-05-02 | 1987-08-18 | Pennwalt Corporation | Apparatus for sizing and sorting articles |
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