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JPS5244573A - Method of mesuring thermal resistance of impatt diode - Google Patents

Method of mesuring thermal resistance of impatt diode

Info

Publication number
JPS5244573A
JPS5244573A JP12043475A JP12043475A JPS5244573A JP S5244573 A JPS5244573 A JP S5244573A JP 12043475 A JP12043475 A JP 12043475A JP 12043475 A JP12043475 A JP 12043475A JP S5244573 A JPS5244573 A JP S5244573A
Authority
JP
Japan
Prior art keywords
thermal resistance
mesuring
impatt diode
pulse current
impatt
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12043475A
Other languages
Japanese (ja)
Other versions
JPS5740986B2 (en
Inventor
Kazuo Nishitani
Osamu Ishihara
Hiroshi Sawano
Shigeru Mitsui
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP12043475A priority Critical patent/JPS5244573A/en
Publication of JPS5244573A publication Critical patent/JPS5244573A/en
Publication of JPS5740986B2 publication Critical patent/JPS5740986B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE: Reverse direction pulse current that may expand depletion layer to the entire part of an operating region is applied and impatt coefficient is varied and temperature is varied under the constant pulse current, and thermal resistance is accurately measured from the changes in voltage and temperature coefficients.
COPYRIGHT: (C)1977,JPO&Japio
JP12043475A 1975-10-06 1975-10-06 Method of mesuring thermal resistance of impatt diode Granted JPS5244573A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12043475A JPS5244573A (en) 1975-10-06 1975-10-06 Method of mesuring thermal resistance of impatt diode

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12043475A JPS5244573A (en) 1975-10-06 1975-10-06 Method of mesuring thermal resistance of impatt diode

Publications (2)

Publication Number Publication Date
JPS5244573A true JPS5244573A (en) 1977-04-07
JPS5740986B2 JPS5740986B2 (en) 1982-08-31

Family

ID=14786105

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12043475A Granted JPS5244573A (en) 1975-10-06 1975-10-06 Method of mesuring thermal resistance of impatt diode

Country Status (1)

Country Link
JP (1) JPS5244573A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59129255A (en) * 1983-01-12 1984-07-25 Osaka Soda Co Ltd Vulcanizable epichlorhydrin rubber composition
US4575675A (en) * 1984-06-18 1986-03-11 Raytheon Company Tester for pulsed IMPATT diode and method of operating same

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59129255A (en) * 1983-01-12 1984-07-25 Osaka Soda Co Ltd Vulcanizable epichlorhydrin rubber composition
JPS625942B2 (en) * 1983-01-12 1987-02-07 Osaka Soda Co Ltd
US4575675A (en) * 1984-06-18 1986-03-11 Raytheon Company Tester for pulsed IMPATT diode and method of operating same

Also Published As

Publication number Publication date
JPS5740986B2 (en) 1982-08-31

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