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JPS523367A - Conduction testing device by dust or the like for xy matrix panel - Google Patents

Conduction testing device by dust or the like for xy matrix panel

Info

Publication number
JPS523367A
JPS523367A JP50078621A JP7862175A JPS523367A JP S523367 A JPS523367 A JP S523367A JP 50078621 A JP50078621 A JP 50078621A JP 7862175 A JP7862175 A JP 7862175A JP S523367 A JPS523367 A JP S523367A
Authority
JP
Japan
Prior art keywords
dust
testing device
matrix panel
conduction testing
conduction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP50078621A
Other languages
Japanese (ja)
Inventor
Shuichi Iida
Tsunemitsu Koizumi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AGC Inc
Original Assignee
Asahi Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asahi Glass Co Ltd filed Critical Asahi Glass Co Ltd
Priority to JP50078621A priority Critical patent/JPS523367A/en
Publication of JPS523367A publication Critical patent/JPS523367A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Electronic Switches (AREA)

Abstract

PURPOSE:Electrically testing the dust or the like entered into a XY matrix panel.
JP50078621A 1975-06-26 1975-06-26 Conduction testing device by dust or the like for xy matrix panel Pending JPS523367A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP50078621A JPS523367A (en) 1975-06-26 1975-06-26 Conduction testing device by dust or the like for xy matrix panel

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP50078621A JPS523367A (en) 1975-06-26 1975-06-26 Conduction testing device by dust or the like for xy matrix panel

Publications (1)

Publication Number Publication Date
JPS523367A true JPS523367A (en) 1977-01-11

Family

ID=13666947

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50078621A Pending JPS523367A (en) 1975-06-26 1975-06-26 Conduction testing device by dust or the like for xy matrix panel

Country Status (1)

Country Link
JP (1) JPS523367A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007256958A (en) * 2002-04-26 2007-10-04 Toshiba Matsushita Display Technology Co Ltd Method of driving el display panel

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007256958A (en) * 2002-04-26 2007-10-04 Toshiba Matsushita Display Technology Co Ltd Method of driving el display panel

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