JPS52154689A - Eddy current testing method and apparatus - Google Patents
Eddy current testing method and apparatusInfo
- Publication number
- JPS52154689A JPS52154689A JP7101676A JP7101676A JPS52154689A JP S52154689 A JPS52154689 A JP S52154689A JP 7101676 A JP7101676 A JP 7101676A JP 7101676 A JP7101676 A JP 7101676A JP S52154689 A JPS52154689 A JP S52154689A
- Authority
- JP
- Japan
- Prior art keywords
- eddy current
- testing method
- current testing
- eddy
- testing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP51071016A JPS5824739B2 (en) | 1976-06-18 | 1976-06-18 | Eddy current test method and device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP51071016A JPS5824739B2 (en) | 1976-06-18 | 1976-06-18 | Eddy current test method and device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS52154689A true JPS52154689A (en) | 1977-12-22 |
JPS5824739B2 JPS5824739B2 (en) | 1983-05-23 |
Family
ID=13448283
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP51071016A Expired JPS5824739B2 (en) | 1976-06-18 | 1976-06-18 | Eddy current test method and device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5824739B2 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5776451A (en) * | 1980-10-30 | 1982-05-13 | Shimadzu Corp | Measuring circuit for eddy current magnetic field |
WO2006046358A1 (en) * | 2004-10-28 | 2006-05-04 | Shinshu University | Apparatus equipped with high frequency coil |
JP2020201114A (en) * | 2019-06-10 | 2020-12-17 | 株式会社東芝 | Eddy current flaw detection device and method |
-
1976
- 1976-06-18 JP JP51071016A patent/JPS5824739B2/en not_active Expired
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5776451A (en) * | 1980-10-30 | 1982-05-13 | Shimadzu Corp | Measuring circuit for eddy current magnetic field |
WO2006046358A1 (en) * | 2004-10-28 | 2006-05-04 | Shinshu University | Apparatus equipped with high frequency coil |
JPWO2006046358A1 (en) * | 2004-10-28 | 2008-05-22 | 国立大学法人信州大学 | Equipment with high frequency coil |
JP2020201114A (en) * | 2019-06-10 | 2020-12-17 | 株式会社東芝 | Eddy current flaw detection device and method |
Also Published As
Publication number | Publication date |
---|---|
JPS5824739B2 (en) | 1983-05-23 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS5291235A (en) | Speeddlevel indicating method and apparatus therefor | |
JPS527801A (en) | Method and device for testing well | |
GB1557512A (en) | Method and an apparatus for detecting the presence of yarnirregularities | |
JPS5233791A (en) | Method and device for nonndestructive test by eddy current | |
JPS52112372A (en) | Method and device for nonndestructively testing welded part | |
JPS5246891A (en) | Analysis method and apparatus | |
GB1549492A (en) | Method and apparatus for detecting foreign matter | |
JPS52112369A (en) | Method and device for testing welded part | |
ZA772396B (en) | Method and apparatus for riveting | |
JPS5395092A (en) | Apparatus and method of inspection | |
JPS5491296A (en) | Immunologically testing method and apparatus | |
DE3068908D1 (en) | Eddy current inspection apparatus and probe | |
JPS5327054A (en) | Method and apparatus for testing buffer and so forth | |
JPS5316685A (en) | Method of and apparatus for magnetic inspection | |
JPS55149063A (en) | Integrated circuit testing method and apparatus | |
JPS52119367A (en) | Method and apparatus for detecting voltage using phototransformer | |
GB1540887A (en) | Brake testing method and apparatus | |
GB1557354A (en) | Benefication apparatus and method | |
JPS5374489A (en) | Continuous measuring method and apparatus | |
GB2003274B (en) | Measurement method and apparatus | |
IL53107A (en) | Lens testing method and apparatus | |
JPS5280148A (en) | Contactless measuring method and apparatus for same | |
GB1540837A (en) | Dehusking apparatus and method | |
JPS52154689A (en) | Eddy current testing method and apparatus | |
JPS5282722A (en) | Immunologically measuring method and apparatus |