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JPS52130383A - Scratch measuring device - Google Patents

Scratch measuring device

Info

Publication number
JPS52130383A
JPS52130383A JP4744976A JP4744976A JPS52130383A JP S52130383 A JPS52130383 A JP S52130383A JP 4744976 A JP4744976 A JP 4744976A JP 4744976 A JP4744976 A JP 4744976A JP S52130383 A JPS52130383 A JP S52130383A
Authority
JP
Japan
Prior art keywords
measuring device
value signal
scratch measuring
signal
scratch
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4744976A
Other languages
Japanese (ja)
Inventor
Michiaki Miyagawa
Kunihiko Edamatsu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP4744976A priority Critical patent/JPS52130383A/en
Publication of JPS52130383A publication Critical patent/JPS52130383A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To easily identfy scratches, without employing a two dimensional picture information, by obtaining differential between the one dimentional 2-value signal from the picture signal and the output from the retrigger type timing element actuated by the ordinal pattern of the 2-value signal.
JP4744976A 1976-04-26 1976-04-26 Scratch measuring device Pending JPS52130383A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4744976A JPS52130383A (en) 1976-04-26 1976-04-26 Scratch measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4744976A JPS52130383A (en) 1976-04-26 1976-04-26 Scratch measuring device

Publications (1)

Publication Number Publication Date
JPS52130383A true JPS52130383A (en) 1977-11-01

Family

ID=12775452

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4744976A Pending JPS52130383A (en) 1976-04-26 1976-04-26 Scratch measuring device

Country Status (1)

Country Link
JP (1) JPS52130383A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5664649A (en) * 1979-11-01 1981-06-01 Fuji Electric Co Ltd Optical inspection system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5664649A (en) * 1979-11-01 1981-06-01 Fuji Electric Co Ltd Optical inspection system

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