Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co LtdfiledCriticalToshiba Corp
Priority to JP3494476ApriorityCriticalpatent/JPS52117659A/en
Publication of JPS52117659ApublicationCriticalpatent/JPS52117659A/en
Publication of JPS5618085B2publicationCriticalpatent/JPS5618085B2/ja
PURPOSE: To precisely measure the diamter of a large test piece by using both a laser interferometer for measurement of length and measuring means following the Abbe's principle.