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JPS5154487A - - Google Patents

Info

Publication number
JPS5154487A
JPS5154487A JP50107558A JP10755875A JPS5154487A JP S5154487 A JPS5154487 A JP S5154487A JP 50107558 A JP50107558 A JP 50107558A JP 10755875 A JP10755875 A JP 10755875A JP S5154487 A JPS5154487 A JP S5154487A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP50107558A
Inventor
Ruuho Chan Reimondo
Mahadeban Paramesuwaa
Jei Baagukuisuto Daarii
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SERUSUKO IND Inc
Original Assignee
SERUSUKO IND Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SERUSUKO IND Inc filed Critical SERUSUKO IND Inc
Publication of JPS5154487A publication Critical patent/JPS5154487A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G01N21/278—Constitution of standards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G01N21/276—Calibration, base line adjustment, drift correction with alternation of sample and standard in optical path
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N2021/6482—Sample cells, cuvettes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/128—Alternating sample and standard or reference part in one path
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/128—Alternating sample and standard or reference part in one path
    • G01N2201/1285—Standard cuvette
    • G01N2201/1286—More than one cuvette

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Optical Measuring Cells (AREA)
JP50107558A 1974-10-04 1975-09-04 Pending JPS5154487A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/512,338 US3944834A (en) 1974-10-04 1974-10-04 Pollution monitor with self-contained calibration and cell-block therefor

Publications (1)

Publication Number Publication Date
JPS5154487A true JPS5154487A (ja) 1976-05-13

Family

ID=24038681

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50107558A Pending JPS5154487A (ja) 1974-10-04 1975-09-04

Country Status (4)

Country Link
US (1) US3944834A (ja)
JP (1) JPS5154487A (ja)
DE (1) DE2543726A1 (ja)
GB (1) GB1483159A (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08327546A (ja) * 1995-05-29 1996-12-13 Horiba Ltd 紫外線螢光分析法を用いたガス分析計

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4469942A (en) * 1982-03-15 1984-09-04 The United States Of America As Represented By The United States National Aeronautics And Space Administration Means and method for calibrating a photon detector utilizing electron-photon coincidence
SE8302468L (sv) * 1983-05-02 1984-11-03 Lagesson Andrasko Ludmila Anordning vid en gasflodescell for spektrofotometrisk analys av kemiska substanser
US4749276A (en) * 1986-01-23 1988-06-07 Mcdonnell Douglas Corporation Long path absorption cell
ES2041583B1 (es) * 1992-01-15 1996-08-16 Univ Madrid Detector sintonizable de la radiacion ultravioleta en el rango 200-400 nm.
US5627362A (en) * 1995-05-01 1997-05-06 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Portable light source unit for simulating fires having an adjustable aperture
US5561290A (en) * 1995-06-09 1996-10-01 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Optical detector calibrator system
US5670375A (en) * 1996-02-21 1997-09-23 Biomerieux Vitek, Inc. Sample card transport method for biological sample testing machine
AU1591299A (en) * 1998-09-23 2000-04-10 Turner Designs Fluorescent standards
US6565352B2 (en) 2001-04-09 2003-05-20 Ken E. Nielsen Smoke density monitor
US7148488B2 (en) * 2002-06-13 2006-12-12 University Of Hawaii Apparatus for measuring radiation and method of use
US7268355B2 (en) * 2002-12-27 2007-09-11 Franek Olstowski Excimer UV fluorescence detection
US20050287040A1 (en) * 2004-06-29 2005-12-29 Molecular Devices Corporation Fluorescence validation plate
EP1956358A1 (en) * 2007-02-07 2008-08-13 FOSS Analytical AB Sample holder
CN101226143B (zh) * 2007-08-15 2011-01-05 武汉市天虹仪表有限责任公司 一种长光程大气监测仪
US8791412B2 (en) * 2010-09-01 2014-07-29 Analogic Corporation Optical system calibration verification
DE102012200739A1 (de) * 2012-01-19 2013-07-25 Robert Bosch Gmbh Vorrichtung zum Kalibrieren eines Streulichtmessgerätes
CN104655567B (zh) * 2015-03-19 2017-11-10 重庆川仪分析仪器有限公司 可自动校准的紫外气体分析装置
CN105092472A (zh) * 2015-09-17 2015-11-25 天津港东科技发展股份有限公司 一种原子荧光火焰观察窗
JP6895819B2 (ja) * 2017-06-26 2021-06-30 アークレイ株式会社 液体クロマトグラフィ装置
GB2598636A (en) * 2020-09-08 2022-03-09 Starna Scient Limited Fluorimeter cell and its calibration

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS488302U (ja) * 1971-06-12 1973-01-30
US3795812A (en) * 1972-11-27 1974-03-05 Us Commerce Sulfur dioxide pollution monitor

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2974227A (en) * 1958-05-07 1961-03-07 Phillips Petroleum Co Analyzer
US3409774A (en) * 1966-05-25 1968-11-05 United States Steel Corp Method of determining the thickness of a coating on a metal base and method of calibrating the thickness gauge
US3854050A (en) * 1973-09-11 1974-12-10 Department Of Health Education High precision fluorometer for measuring enzymatic substrates in tissue

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS488302U (ja) * 1971-06-12 1973-01-30
US3795812A (en) * 1972-11-27 1974-03-05 Us Commerce Sulfur dioxide pollution monitor

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08327546A (ja) * 1995-05-29 1996-12-13 Horiba Ltd 紫外線螢光分析法を用いたガス分析計

Also Published As

Publication number Publication date
US3944834A (en) 1976-03-16
GB1483159A (en) 1977-08-17
DE2543726A1 (de) 1976-04-08

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