JPS515316B1 - - Google Patents
Info
- Publication number
- JPS515316B1 JPS515316B1 JP7585469A JP7585469A JPS515316B1 JP S515316 B1 JPS515316 B1 JP S515316B1 JP 7585469 A JP7585469 A JP 7585469A JP 7585469 A JP7585469 A JP 7585469A JP S515316 B1 JPS515316 B1 JP S515316B1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7585469A JPS515316B1 (en) | 1969-09-25 | 1969-09-25 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7585469A JPS515316B1 (en) | 1969-09-25 | 1969-09-25 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS515316B1 true JPS515316B1 (en) | 1976-02-19 |
Family
ID=13588210
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7585469A Pending JPS515316B1 (en) | 1969-09-25 | 1969-09-25 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS515316B1 (en) |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3204095A (en) * | 1960-12-21 | 1965-08-31 | Hitachi Ltd | Electron probe microanalyzer with means to eliminate the effect of surface irregularities |
| US3319064A (en) * | 1963-08-27 | 1967-05-09 | Cie D Applic Mecaniques A L El | Slidable window for x-ray microanalyzers selectively permeable to hard or soft x-rays |
| US3402292A (en) * | 1963-06-07 | 1968-09-17 | Baecklund Johannes | Apparatus for x-ray analysis of a material having a specific filter in the primary x-ray beam path |
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1969
- 1969-09-25 JP JP7585469A patent/JPS515316B1/ja active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3204095A (en) * | 1960-12-21 | 1965-08-31 | Hitachi Ltd | Electron probe microanalyzer with means to eliminate the effect of surface irregularities |
| US3402292A (en) * | 1963-06-07 | 1968-09-17 | Baecklund Johannes | Apparatus for x-ray analysis of a material having a specific filter in the primary x-ray beam path |
| US3319064A (en) * | 1963-08-27 | 1967-05-09 | Cie D Applic Mecaniques A L El | Slidable window for x-ray microanalyzers selectively permeable to hard or soft x-rays |