JPS5149689A - Handotaisochi - Google Patents
HandotaisochiInfo
- Publication number
- JPS5149689A JPS5149689A JP50103392A JP10339275A JPS5149689A JP S5149689 A JPS5149689 A JP S5149689A JP 50103392 A JP50103392 A JP 50103392A JP 10339275 A JP10339275 A JP 10339275A JP S5149689 A JPS5149689 A JP S5149689A
- Authority
- JP
- Japan
- Prior art keywords
- handotaisochi
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/60—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D10/00 or H10D18/00, e.g. integration of BJTs
- H10D84/611—Combinations of BJTs and one or more of diodes, resistors or capacitors
- H10D84/613—Combinations of vertical BJTs and one or more of diodes, resistors or capacitors
- H10D84/615—Combinations of vertical BJTs and one or more of resistors or capacitors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D99/00—Subject matter not provided for in other groups of this subclass
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/10—Measuring as part of the manufacturing process
- H01L22/14—Measuring as part of the manufacturing process for electrical parameters, e.g. resistance, deep-levels, CV, diffusions by electrical means
Landscapes
- Bipolar Transistors (AREA)
- Electrodes Of Semiconductors (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US05/500,448 US3988759A (en) | 1974-08-26 | 1974-08-26 | Thermally balanced PN junction |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5149689A true JPS5149689A (en) | 1976-04-30 |
| JPS5523468B2 JPS5523468B2 (ja) | 1980-06-23 |
Family
ID=23989460
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP50103392A Granted JPS5149689A (en) | 1974-08-26 | 1975-08-25 | Handotaisochi |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US3988759A (ja) |
| JP (1) | JPS5149689A (ja) |
| CA (1) | CA1041221A (ja) |
| DE (1) | DE2537327A1 (ja) |
| FR (1) | FR2283548A1 (ja) |
| GB (1) | GB1500325A (ja) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS53122170U (ja) * | 1977-03-04 | 1978-09-28 | ||
| JPS5457963U (ja) * | 1977-09-29 | 1979-04-21 | ||
| JPS5496161U (ja) * | 1977-12-19 | 1979-07-07 | ||
| JPS56146271A (en) * | 1980-04-16 | 1981-11-13 | Nec Corp | Semiconductor device |
| JPS57138174A (en) * | 1981-02-20 | 1982-08-26 | Hitachi Ltd | Semiconductor device |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5397379A (en) * | 1977-02-07 | 1978-08-25 | Fujitsu Ltd | Transistor |
| US4691220A (en) * | 1983-10-07 | 1987-09-01 | American Telephone And Telegraph Company, At&T Bell Laboratories | Radial high voltage bidirectional switch structure with concavo-concave shaped semiconductor regions |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB1153497A (en) * | 1966-07-25 | 1969-05-29 | Associated Semiconductor Mft | Improvements in and relating to Semiconductor Devices |
| US3667008A (en) * | 1970-10-29 | 1972-05-30 | Rca Corp | Semiconductor device employing two-metal contact and polycrystalline isolation means |
| US3740621A (en) * | 1971-08-30 | 1973-06-19 | Rca Corp | Transistor employing variable resistance ballasting means dependent on the magnitude of the emitter current |
-
1974
- 1974-08-26 US US05/500,448 patent/US3988759A/en not_active Expired - Lifetime
-
1975
- 1975-07-23 CA CA232,101A patent/CA1041221A/en not_active Expired
- 1975-08-14 GB GB33911/75A patent/GB1500325A/en not_active Expired
- 1975-08-21 DE DE19752537327 patent/DE2537327A1/de not_active Withdrawn
- 1975-08-25 FR FR7526179A patent/FR2283548A1/fr not_active Withdrawn
- 1975-08-25 JP JP50103392A patent/JPS5149689A/ja active Granted
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS53122170U (ja) * | 1977-03-04 | 1978-09-28 | ||
| JPS5457963U (ja) * | 1977-09-29 | 1979-04-21 | ||
| JPS5496161U (ja) * | 1977-12-19 | 1979-07-07 | ||
| JPS56146271A (en) * | 1980-04-16 | 1981-11-13 | Nec Corp | Semiconductor device |
| JPS57138174A (en) * | 1981-02-20 | 1982-08-26 | Hitachi Ltd | Semiconductor device |
| JPH049378B2 (ja) * | 1981-02-20 | 1992-02-20 |
Also Published As
| Publication number | Publication date |
|---|---|
| DE2537327A1 (de) | 1976-03-11 |
| FR2283548A1 (fr) | 1976-03-26 |
| JPS5523468B2 (ja) | 1980-06-23 |
| GB1500325A (en) | 1978-02-08 |
| US3988759A (en) | 1976-10-26 |
| CA1041221A (en) | 1978-10-24 |