JPS5121358B2 - - Google Patents
Info
- Publication number
- JPS5121358B2 JPS5121358B2 JP46070240A JP7024071A JPS5121358B2 JP S5121358 B2 JPS5121358 B2 JP S5121358B2 JP 46070240 A JP46070240 A JP 46070240A JP 7024071 A JP7024071 A JP 7024071A JP S5121358 B2 JPS5121358 B2 JP S5121358B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20091—Measuring the energy-dispersion spectrum [EDS] of diffracted radiation
Landscapes
- Chemical & Material Sciences (AREA)
- Dispersion Chemistry (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP46070240A JPS5121358B2 (ja) | 1971-09-10 | 1971-09-10 | |
| NL7211685A NL7211685A (ja) | 1971-09-10 | 1972-08-28 | |
| US00285059A US3790792A (en) | 1971-09-10 | 1972-08-30 | Device for x-ray analysis |
| GB4050772A GB1382649A (en) | 1971-09-10 | 1972-08-31 | Apparatus for x-ray analysis |
| DE2244160A DE2244160B2 (de) | 1971-09-10 | 1972-09-08 | Vorrichtung für die Röntgenanalyse |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP46070240A JPS5121358B2 (ja) | 1971-09-10 | 1971-09-10 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS4837181A JPS4837181A (ja) | 1973-06-01 |
| JPS5121358B2 true JPS5121358B2 (ja) | 1976-07-01 |
Family
ID=13425833
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP46070240A Expired JPS5121358B2 (ja) | 1971-09-10 | 1971-09-10 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US3790792A (ja) |
| JP (1) | JPS5121358B2 (ja) |
| DE (1) | DE2244160B2 (ja) |
| GB (1) | GB1382649A (ja) |
| NL (1) | NL7211685A (ja) |
Families Citing this family (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2703562A1 (de) * | 1977-01-28 | 1978-08-03 | Max Planck Gesellschaft | Verfahren und einrichtung zur roentgenfluoreszenzanalyse |
| NL8201342A (nl) * | 1982-03-31 | 1983-10-17 | Philips Nv | Roentgen analyse apparaat met pulsschiftcorrectie. |
| JP2602209B2 (ja) * | 1986-05-12 | 1997-04-23 | 株式会社島津製作所 | Ｘ線分析装置 |
| EP0566191B1 (en) * | 1992-04-15 | 2000-01-19 | Koninklijke Philips Electronics N.V. | X-ray analysis apparatus with pulse amplitude shift correction |
| DE69327609T2 (de) * | 1992-04-15 | 2000-08-10 | Koninklijke Philips Electronics N.V., Eindhoven | Röntgenanalysegerät mit Impulsamplitudenverschiebungskorrektur |
| US6929735B2 (en) | 1999-11-19 | 2005-08-16 | Perkin Elmer Instruments Llc | Electrochemical sensor having improved response time |
| US6682638B1 (en) | 1999-11-19 | 2004-01-27 | Perkin Elmer Llc | Film type solid polymer ionomer sensor and sensor cell |
| US7013707B2 (en) | 1999-11-19 | 2006-03-21 | Perkinelmer Las, Inc | Method and apparatus for enhanced detection of a specie using a gas chromatograph |
| US7404882B2 (en) | 1999-11-19 | 2008-07-29 | Perkinelmer Las, Inc. | Film-type solid polymer ionomer sensor and sensor cell |
| US6932941B2 (en) | 1999-11-19 | 2005-08-23 | Perkinelmer Instruments Llc | Method and apparatus for improved gas detection |
| JP4479354B2 (ja) * | 2004-06-01 | 2010-06-09 | Ｊｆｅスチール株式会社 | 亜鉛系めっき鋼板の表層酸化膜の膜厚測定方法 |
| DE602005013435D1 (de) * | 2005-09-26 | 2009-04-30 | Jfe Steel Corp | Verfahren zur messung der filmdicke eines oberflächenoxidfilms eines mit zink galvanisierten stahlblechs |
| EP1978354A1 (en) * | 2007-04-05 | 2008-10-08 | Panalytical B.V. | Wavelength dispersive X-ray Fluorescence Apparatus with energy dispersive detector in the form of a silicon drift detector to improve background supression |
| GB2497170B (en) * | 2011-11-29 | 2018-02-21 | Rigaku Denki Co Ltd | X-ray analysis apparatus |
| CN103674986A (zh) * | 2013-12-20 | 2014-03-26 | 江苏天瑞仪器股份有限公司 | 基于数字多道脉冲幅度分析的x射线荧光光谱仪 |
| CN103645203A (zh) * | 2013-12-20 | 2014-03-19 | 江苏天瑞仪器股份有限公司 | 用于x射线荧光光谱仪的数字多道脉冲幅度分析器 |
| CN103674987A (zh) * | 2013-12-20 | 2014-03-26 | 江苏天瑞仪器股份有限公司 | 数字多道脉冲幅度分析方法 |
| CN113427650B (zh) * | 2021-06-17 | 2023-03-14 | 西北工业大学 | 一种定向凝固合金单晶取向测定及籽晶切割的方法 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3193680A (en) * | 1960-10-06 | 1965-07-06 | Herbert L Anderson | Thickness measurement using alpha particles |
| US3322948A (en) * | 1964-12-21 | 1967-05-30 | Owens Illinois Inc | X-ray diffraction goniometer wherein the specimen is stationary and the source and detector are movable |
| US3397312A (en) * | 1964-08-15 | 1968-08-13 | Hitachi Ltd | Laminated X-ray analyzing crystal wherein the respective laminations have different lattice spacings |
| US3566111A (en) * | 1967-06-19 | 1971-02-23 | Siemens Ag | Apparatus for varying the detector slit width in fully focusing x-ray spectrometers |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2837655A (en) * | 1953-08-28 | 1958-06-03 | Philips Corp | X-ray fluorescent analysis apparatus |
| NL247901A (ja) * | 1960-01-29 |
-
1971
- 1971-09-10 JP JP46070240A patent/JPS5121358B2/ja not_active Expired
-
1972
- 1972-08-28 NL NL7211685A patent/NL7211685A/xx not_active Application Discontinuation
- 1972-08-30 US US00285059A patent/US3790792A/en not_active Expired - Lifetime
- 1972-08-31 GB GB4050772A patent/GB1382649A/en not_active Expired
- 1972-09-08 DE DE2244160A patent/DE2244160B2/de active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3193680A (en) * | 1960-10-06 | 1965-07-06 | Herbert L Anderson | Thickness measurement using alpha particles |
| US3397312A (en) * | 1964-08-15 | 1968-08-13 | Hitachi Ltd | Laminated X-ray analyzing crystal wherein the respective laminations have different lattice spacings |
| US3322948A (en) * | 1964-12-21 | 1967-05-30 | Owens Illinois Inc | X-ray diffraction goniometer wherein the specimen is stationary and the source and detector are movable |
| US3566111A (en) * | 1967-06-19 | 1971-02-23 | Siemens Ag | Apparatus for varying the detector slit width in fully focusing x-ray spectrometers |
Also Published As
| Publication number | Publication date |
|---|---|
| DE2244160A1 (de) | 1973-03-22 |
| NL7211685A (ja) | 1973-03-13 |
| DE2244160B2 (de) | 1974-04-11 |
| GB1382649A (en) | 1975-02-05 |
| JPS4837181A (ja) | 1973-06-01 |
| US3790792A (en) | 1974-02-05 |