JPS51140578A - Autohandler - Google Patents
AutohandlerInfo
- Publication number
- JPS51140578A JPS51140578A JP6431275A JP6431275A JPS51140578A JP S51140578 A JPS51140578 A JP S51140578A JP 6431275 A JP6431275 A JP 6431275A JP 6431275 A JP6431275 A JP 6431275A JP S51140578 A JPS51140578 A JP S51140578A
- Authority
- JP
- Japan
- Prior art keywords
- autohandler
- measurement
- many places
- providing many
- providing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 abstract 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
PURPOSE: Ro provide an autohandler capable of providing many places for measurement.
COPYRIGHT: (C)1976,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6431275A JPS51140578A (en) | 1975-05-30 | 1975-05-30 | Autohandler |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6431275A JPS51140578A (en) | 1975-05-30 | 1975-05-30 | Autohandler |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS51140578A true JPS51140578A (en) | 1976-12-03 |
Family
ID=13254583
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6431275A Pending JPS51140578A (en) | 1975-05-30 | 1975-05-30 | Autohandler |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS51140578A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS588145U (en) * | 1981-07-08 | 1983-01-19 | 富士通株式会社 | Vacuum chuck for high temperature testing |
-
1975
- 1975-05-30 JP JP6431275A patent/JPS51140578A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS588145U (en) * | 1981-07-08 | 1983-01-19 | 富士通株式会社 | Vacuum chuck for high temperature testing |
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