JPS51117080A - Magnetic field measuring method using hall element - Google Patents
Magnetic field measuring method using hall elementInfo
- Publication number
- JPS51117080A JPS51117080A JP50042517A JP4251775A JPS51117080A JP S51117080 A JPS51117080 A JP S51117080A JP 50042517 A JP50042517 A JP 50042517A JP 4251775 A JP4251775 A JP 4251775A JP S51117080 A JPS51117080 A JP S51117080A
- Authority
- JP
- Japan
- Prior art keywords
- magnetic field
- measuring method
- hall element
- field measuring
- measurement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title abstract 2
- 238000005259 measurement Methods 0.000 abstract 2
Landscapes
- Measuring Magnetic Variables (AREA)
Abstract
PURPOSE: A measuring method of magnetic field using hall element, enable to provide appropriate measurement regardlessly to temperature change in the measurement space.
COPYRIGHT: (C)1976,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP50042517A JPS51117080A (en) | 1975-04-07 | 1975-04-07 | Magnetic field measuring method using hall element |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP50042517A JPS51117080A (en) | 1975-04-07 | 1975-04-07 | Magnetic field measuring method using hall element |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS51117080A true JPS51117080A (en) | 1976-10-14 |
Family
ID=12638257
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP50042517A Pending JPS51117080A (en) | 1975-04-07 | 1975-04-07 | Magnetic field measuring method using hall element |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS51117080A (en) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006126012A (en) * | 2004-10-28 | 2006-05-18 | Asahi Kasei Microsystems Kk | Magneto-electric conversion system, magneto-electric conversion apparatus and its control circuit |
JP2008513762A (en) * | 2004-09-16 | 2008-05-01 | リエゾン、エレクトロニク−メカニク、エルウエム、ソシエテ、アノニム | Continuous calibration magnetic field sensor |
CN103116141A (en) * | 2013-01-28 | 2013-05-22 | 山东大学 | Device and method for quickly estimating magnetic field intensity |
WO2014199654A1 (en) * | 2013-06-13 | 2014-12-18 | 日本航空電子工業株式会社 | Current sensor |
JP2015510593A (en) * | 2012-02-16 | 2015-04-09 | アレグロ・マイクロシステムズ・エルエルシー | Circuit and method using adjustable feedback to self-calibrate or self-test magnetic field sensors with adjustable time constants |
US9645220B2 (en) | 2014-04-17 | 2017-05-09 | Allegro Microsystems, Llc | Circuits and methods for self-calibrating or self-testing a magnetic field sensor using phase discrimination |
US9735773B2 (en) | 2014-04-29 | 2017-08-15 | Allegro Microsystems, Llc | Systems and methods for sensing current through a low-side field effect transistor |
-
1975
- 1975-04-07 JP JP50042517A patent/JPS51117080A/en active Pending
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008513762A (en) * | 2004-09-16 | 2008-05-01 | リエゾン、エレクトロニク−メカニク、エルウエム、ソシエテ、アノニム | Continuous calibration magnetic field sensor |
JP4757260B2 (en) * | 2004-09-16 | 2011-08-24 | リエゾン、エレクトロニク−メカニク、エルウエム、ソシエテ、アノニム | Continuous calibration magnetic field sensor |
JP2006126012A (en) * | 2004-10-28 | 2006-05-18 | Asahi Kasei Microsystems Kk | Magneto-electric conversion system, magneto-electric conversion apparatus and its control circuit |
JP2015510593A (en) * | 2012-02-16 | 2015-04-09 | アレグロ・マイクロシステムズ・エルエルシー | Circuit and method using adjustable feedback to self-calibrate or self-test magnetic field sensors with adjustable time constants |
CN103116141A (en) * | 2013-01-28 | 2013-05-22 | 山东大学 | Device and method for quickly estimating magnetic field intensity |
WO2014199654A1 (en) * | 2013-06-13 | 2014-12-18 | 日本航空電子工業株式会社 | Current sensor |
US9645220B2 (en) | 2014-04-17 | 2017-05-09 | Allegro Microsystems, Llc | Circuits and methods for self-calibrating or self-testing a magnetic field sensor using phase discrimination |
US9735773B2 (en) | 2014-04-29 | 2017-08-15 | Allegro Microsystems, Llc | Systems and methods for sensing current through a low-side field effect transistor |
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