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JPS4918472A - - Google Patents

Info

Publication number
JPS4918472A
JPS4918472A JP47057520A JP5752072A JPS4918472A JP S4918472 A JPS4918472 A JP S4918472A JP 47057520 A JP47057520 A JP 47057520A JP 5752072 A JP5752072 A JP 5752072A JP S4918472 A JPS4918472 A JP S4918472A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP47057520A
Other languages
Japanese (ja)
Other versions
JPS5528414B2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP5752072A priority Critical patent/JPS5528414B2/ja
Publication of JPS4918472A publication Critical patent/JPS4918472A/ja
Publication of JPS5528414B2 publication Critical patent/JPS5528414B2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Mounting And Adjusting Of Optical Elements (AREA)
JP5752072A 1972-06-09 1972-06-09 Expired JPS5528414B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5752072A JPS5528414B2 (en) 1972-06-09 1972-06-09

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5752072A JPS5528414B2 (en) 1972-06-09 1972-06-09

Publications (2)

Publication Number Publication Date
JPS4918472A true JPS4918472A (en) 1974-02-18
JPS5528414B2 JPS5528414B2 (en) 1980-07-28

Family

ID=13057997

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5752072A Expired JPS5528414B2 (en) 1972-06-09 1972-06-09

Country Status (1)

Country Link
JP (1) JPS5528414B2 (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5191955A (en) * 1975-02-10 1976-08-12 Tomeiseino suguretahoripuropirenseishiitono seizohoho
JPS5346366U (en) * 1976-09-27 1978-04-20
JPS54157478A (en) * 1978-06-01 1979-12-12 Canon Inc Alignment method
JPS57113227A (en) * 1980-12-19 1982-07-14 Ibm Method and device for inspecting article to be inspected with pattern
JPS5818713A (en) * 1981-07-25 1983-02-03 Nippon Kogaku Kk <Nikon> Positioning device for discoid object
US5082900A (en) * 1989-03-29 1992-01-21 Chisso Corporation Opacified molded product
US5084519A (en) * 1990-02-20 1992-01-28 Chisso Corporation Stretched article having pearly gloss and process for preparing same
JP2015046427A (en) * 2013-08-27 2015-03-12 トヨタ自動車株式会社 Alignment method and patterning mask

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6039351U (en) * 1983-08-27 1985-03-19 株式会社新潟工器 snow removal nozzle

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3497705A (en) * 1968-02-12 1970-02-24 Itek Corp Mask alignment system using radial patterns and flying spot scanning

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3497705A (en) * 1968-02-12 1970-02-24 Itek Corp Mask alignment system using radial patterns and flying spot scanning

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5191955A (en) * 1975-02-10 1976-08-12 Tomeiseino suguretahoripuropirenseishiitono seizohoho
JPS5315894B2 (en) * 1975-02-10 1978-05-27
JPS5346366U (en) * 1976-09-27 1978-04-20
JPS54157478A (en) * 1978-06-01 1979-12-12 Canon Inc Alignment method
JPS63942B2 (en) * 1978-06-01 1988-01-09 Canon Kk
JPS57113227A (en) * 1980-12-19 1982-07-14 Ibm Method and device for inspecting article to be inspected with pattern
JPS5818713A (en) * 1981-07-25 1983-02-03 Nippon Kogaku Kk <Nikon> Positioning device for discoid object
US5082900A (en) * 1989-03-29 1992-01-21 Chisso Corporation Opacified molded product
US5114638A (en) * 1989-03-29 1992-05-19 Chisso Corporation & Maruzen Petrochemical Co., Ltd. Process for producing an opacified molded product
US5084519A (en) * 1990-02-20 1992-01-28 Chisso Corporation Stretched article having pearly gloss and process for preparing same
JP2015046427A (en) * 2013-08-27 2015-03-12 トヨタ自動車株式会社 Alignment method and patterning mask

Also Published As

Publication number Publication date
JPS5528414B2 (en) 1980-07-28

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