JPH1184256A - Microscope - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a microscope capable of making observations with vertical illumination in the same way as a normal objective lens is used, even in the case of using an extremely low variable power objective lens. SOLUTION: As for the microscope provided with a vertical illumination system 17 equipped with a lighting source 20 and a deflecting member 18 for deflecting the light emitted from the lighting source so as to irradiate a sample with the light, an auxiliary lens 16 which can be inserted/detached to/from the optical path of the microscope, the extremely low variable power objective lens 15 which is arranged together with the auxiliary lens 16 in the optical path so as to observe the image of the sample, an objective lens 19 through which the image of the sample is observed in a state where the auxiliary lens 16 is deviated from the optical path, the deflecting member 18 is arranged at a position where the sample can be irradiated with the light emitted from the lighting source 20 through the auxiliary lens 16 and the extremely low variable power objective lens 15.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a microscope, and more particularly to a microscope provided with a 0.5.times. Or 1.times. Ultra-low magnification objective lens that requires an auxiliary lens.

[0002]

2. Description of the Related Art Conventionally, in order to perform epi-illumination on a microscope, a reflecting mirror (half mirror, dichroic mirror, or the like) is disposed at a position as close as possible to an objective lens (in the case of an upright microscope, above the objective lens). Illumination light was applied to the specimen. This is because, if the epi-illumination device is not located directly above the objective lens due to the optical arrangement, the illumination light will be dark or it will be difficult to achieve proper illumination of the specimen. Therefore, in a microscope to which an epi-illumination device can be attached or a microscope having a built-in epi-illumination device, the reflection mirror is usually arranged above the revolver to which the objective lens is attached.

In recent years, very low magnification objective lenses requiring an auxiliary lens have been commercialized. This is for observing the specimen in a wider field of view, and is attached to a revolver like an ordinary objective lens. When observing a specimen using this ultra-low magnification objective lens, it is necessary to arrange an auxiliary lens above the ultra-low magnification objective lens in addition to simply arranging the ultra-low magnification objective lens in the optical path as in a normal objective lens. Then, the light from the sample is converted into a parallel light beam through the extremely low magnification objective lens and the auxiliary lens, so that the image of the sample can be observed.

[0004]

Conventionally, in a microscope in which an extremely low-magnification objective lens can be used, that is, a microscope in which an auxiliary lens can be inserted into and removed from the optical path of the microscope, the epi-illumination device is conventionally located as close to the objective lens as possible. Had been arranged. The very low magnification objective lens is a special objective lens that requires an auxiliary lens, and has not been targeted for epi-illumination observation.

[0005] For this reason, the auxiliary lens is disposed above the reflecting mirror of the epi-illumination device or substantially at the same position as the position where the reflecting mirror of the epi-illumination device is disposed. Had been placed. Here, the inventor of the present application paid attention to the problem that epi-illumination observation cannot be performed with an extremely low magnification lens. The present invention has been made to provide a microscope capable of performing observation by epi-illumination similarly to a normal objective lens even when an extremely low-magnification objective lens is used.

[0006]

According to the first aspect of the present invention, there is provided an epi-illumination system (17) having an illumination light source (20) and a deflection member (18) for deflecting light from the illumination light source and irradiating the specimen with light. ), An auxiliary lens (16) that can be inserted into and removed from the microscope optical path, an extremely low-magnification objective lens (15) that is arranged in the optical path together with the auxiliary lens, so that an image of the specimen can be observed, and an auxiliary lens. An objective lens (19) for observing an image of the specimen while the light is out of the optical path, the deflecting member (18) transmits light from the illumination light source to the auxiliary lens (16) and the extremely low magnification. Objective lens (15)
Characterized in that it is arranged at a position to irradiate the sample via the.

The present invention eliminates the conventional idea that the deflecting member (reflection mirror) of the epi-illumination device must be near the objective lens, and provides an extremely low magnification between the deflecting member and the objective lens. That is, an auxiliary lens for the objective lens is arranged. As a result, observation by epi-illumination of both a normal objective lens and an extremely low magnification objective lens is enabled.

The present invention according to claim 2 provides an auxiliary lens (1)
6) is provided on the arm part (11a) of the microscope, and the epi-illumination system (17) is detachably provided inside or on the upper part of the arm part. Specifically, the epi-illumination system is unitized,
The configuration is such that it can be attached to and detached from the microscope. Since the auxiliary lens is provided on the arm portion and the epi-illumination system is mounted on the upper portion thereof, the epi-illumination device can be easily attached and detached.

The present invention according to claim 3 provides an epi-illumination system (1).
7) is characterized in that it has a correction lens (30) for correcting a change in illumination characteristics of illumination light due to insertion and removal of the auxiliary lens (16). Due to the insertion and removal of the auxiliary lens in the optical path, the illumination characteristics of the epi-illumination system may be slightly different between the extremely low magnification objective lens and the ordinary objective lens. More specifically, the optical design is such that an image of the illumination light source is formed almost at the position of the pupil of the objective lens when the specimen is properly illuminated by epi-illumination.

In the case of an extremely low magnification objective lens, the same function as a normal objective lens is achieved by combining with an auxiliary lens, and the position of the pupil is defined. For example, even when an image of an illumination light source is formed almost at the position of a pupil of a normal objective lens, when an extremely low magnification objective lens and an auxiliary lens are arranged in an optical path, The image of the illumination light source is not always formed at the position of the pupil determined by the auxiliary lens. The opposite is also true.

[0011] If the illumination is not properly performed, the peripheral portion in the observation visual field becomes dark or uneven illumination occurs. By accurately correcting the difference in the illumination characteristics by the correction lens, it is possible to achieve the optimal observation by epi-illumination without illumination unevenness in any of the objective lenses. More specifically, whether a normal objective lens or an ultra-low magnification objective lens is used, by operating this correction lens, the objective lens and the optical system including the ultra-low magnification objective lens and the auxiliary lens are formed. An image of the illumination light source is formed substantially at the position of the pupil of the system.

In the present specification, an objective lens that requires an auxiliary lens is referred to as an “extremely low magnification objective lens”.
An objective lens that does not require an auxiliary lens is referred to as a “normal objective lens” or simply as an “objective lens”.

[0013]

FIG. 1 is a side view showing a schematic configuration of a first embodiment of a microscope according to the present invention. The microscope main body 11 has a U shape, and is provided with a stage ST on which the sample S is mounted. A revolver 13 is provided on the arm 11 a of the microscope main body 11. An objective lens 19 and an extremely low magnification objective lens 15 are attached to the revolver 13. An auxiliary lens 16 is provided on the arm 11a. The auxiliary lens 16 slides on the guide 9 by pushing and pulling the operation knob 10, and can be inserted into and removed from the optical path of the microscopic mirror. Ultra low magnification objective lens 15
In the case of using an optical lens, it is advantageous to have an auxiliary lens 16 in addition to the ultra-low magnification objective lens 15 in terms of optical design, and since the ultra-low magnification objective lens 15 and the auxiliary lens 16 are arranged in the optical path, The microscope can be magnified twice. This has been proposed by the present applicant in Japanese Patent Application No. 8-66193.

When using a normal objective lens 19,
The observation is performed with the auxiliary lens 16 removed from the optical path. Further, the extremely low magnification objective lens 15 performs the same function as a normal objective lens when combined with the auxiliary lens 16. Therefore, the overall length of the lens system is longer than that of a normal objective lens. An epi-illumination device 17 is provided on the arm 11a. The epi-illumination device 17 includes a lamp house 14 having an illumination light source (lamp) 20 and a half mirror 18.
And an illumination optical system (not shown). The epi-illumination device 17 is unitized, and is detachably provided inside the arm 11a. Half mirror 18
Is an objective lens (in FIG. 1, an extremely low magnification objective lens 1).
It is arranged on the optical axis of 5). Half mirror 1
Reference numeral 8 is provided above the auxiliary lens. That is,
It is arranged on the opposite side of the sample S with the extremely low magnification objective lens 15 and the auxiliary lens 16 interposed therebetween.

FIG. 1 shows a very low magnification objective lens 15 and an auxiliary lens 16 arranged in an optical path. Therefore, the light from the lamp 20 is supplied to the illumination optical system (not shown), the half mirror 18, the auxiliary lens 16, and the extremely low magnification objective lens 1.
The sample is irradiated through 5. Light from the specimen reaches the observation lens barrel 12 via the ultra-low magnification objective lens 15, the auxiliary lens 16, and the half mirror 18, and is observed from the eyepiece of the observation lens barrel 12.

In order to properly illuminate the specimen, it is necessary to form an image of the illumination light source substantially at the position of the pupil of the objective lens. Therefore, the illumination optical system is composed of the ordinary objective lens 19 and the extremely low magnification objective lens 15. Need to change. Lamp House 14
Is provided with an adjustment mechanism 31 for finely moving the condenser lens 30. This is for adjusting the focus of the lamp 20 to the pupil plane of the objective lens. By performing the work of re-focusing the lamp when switching between the ultra-low magnification objective lens 15 and the normal objective lens 19, observation with optimal epi-illumination can be performed with any objective lens.

With the above configuration, the ordinary objective lens 1
9 and the extremely low magnification objective lens 15 enabled observation by epi-illumination. In addition, it is possible to achieve observation with optimal epi-illumination without illumination unevenness by using any of the ultra-low magnification objective lens and the ordinary objective lens. FIG.
FIG. 3 is a side view showing a schematic configuration of a second embodiment in the microscope of the present invention. Members having the same functions as those in FIG. 1 are denoted by the same reference numerals, and descriptions of those members will be omitted.

In the illumination optical system of the epi-illumination device 17, a correction lens 21 is disposed so as to be insertable and removable. When switching between the extremely low magnification objective lens 15 and the normal objective lens 19, the lens 21 can be inserted into and removed from the illumination optical path. Specifically, when switching to the ultra-low magnification objective lens 15, the lens 21 is inserted into the illumination optical path,
Is switched, the lens 21 is deviated from the optical path. With this, it is possible to use any one of the ordinary objective lens 19 and the extremely low magnification objective lens 15.
The specimen can be illuminated correctly. Further, a lamp house without a focus adjustment mechanism can be used. In addition, if the removable lens 21 does not need to re-focus the lamp house when the objective lens is switched, the trouble of re-focusing the lamp house every time the objective lens is switched is eliminated. I can do it.

FIG. 3 is a side view showing a schematic configuration of a third embodiment of the microscope according to the present invention. The normal objective lens 19 is an epi-illumination device 17a below the auxiliary lens 16.
Is used, and there is no state on the optical axis above the auxiliary lens 16. When the extremely low magnification objective lens 15 is used, the reflection mirror 18a of the epi-illumination device 17a is removed from the optical axis, and the epi-illumination device 17b on the auxiliary lens 16 is used. This epi-illumination device is detachable on the upper part of the arm 11a.

According to this embodiment, the ordinary objective lens 1
Optimal illumination for 9 and extremely low magnification objective lens 15
It is possible to perform the optimal epi-illumination for the camera. The lamp house itself of the illumination light source 14b is in a space or a problem such as heat,
Since it is difficult to overlap with the illumination light source 14a, in the present embodiment, the arrangement is such that the optical path of the epi-illumination is bent 90 degrees in the middle.

In this embodiment, when all the switching operations are performed automatically, it is not necessary to perform a troublesome switching operation. When the extremely low-magnification objective lens is set in the optical path, the reflection mirror of the epi-illumination device 17a is removed from the optical axis, and the epi-illumination device 1
It is sufficient that the reflection mirror of the epi-illumination device of 7b is inserted into the optical axis. At the same time, if the auxiliary lens 16 is also automatically inserted into the optical axis, two epi-illumination devices can be used as one epi-illumination device, and the ultra-low magnification objective lens 15 can be handled in the same way as a normal objective lens 19. . If each component is provided with an actuator, a means for detecting the position, and a controller for integrating them, epi-illumination observation can be performed with the ordinary objective lens 19 and the ultra-low magnification objective lens 15, and the switching operation can be easily performed.

In the first to third embodiments described above,
The epi-illumination device 17 may be an epi-fluorescence device. That is, a configuration may be adopted in which a dichroic mirror is arranged instead of the half mirror 18 and the fluorescence of the sample is observed. Further, the correction lens 21 may not be configured to be inserted into and removed from the illumination optical path, but may be configured to be movable in the optical axis direction of the illumination optical path.

[0023]

According to the first aspect of the present invention, the deflecting member of the epi-illumination system is arranged at a position where the light from the illumination light source is irradiated on the sample via the auxiliary lens and the ultra-low magnification objective lens. That is, an auxiliary lens for an extremely low magnification objective lens is arranged between the deflection member and the objective lens. This enables observation by epi-illumination of both the objective lens and the ultra-low magnification objective lens.

According to the second aspect of the present invention, since the auxiliary lens is provided on the arm portion and the epi-illumination device is mounted on the upper portion thereof, the epi-illumination system can be easily attached and detached. According to the third aspect of the present invention, it is possible to achieve observation by optimal epi-illumination without illumination unevenness in any of the extremely low magnification objective lens and the ordinary objective lens.

[Brief description of the drawings]

FIG. 1 is a configuration diagram showing a first embodiment of a microscope according to the present invention.

FIG. 2 is a configuration diagram showing a second embodiment of the microscope according to the present invention.

FIG. 3 is a configuration diagram showing a third embodiment of the microscope according to the present invention.

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 11 ... Microscope main body 12 ... Observation lens-barrel 13 ... Revolver 14 ... Lamp house 15 ... Ultra-low magnification objective lens 16 ... Auxiliary lens 17 ... Epi-illumination device 18 ... Half mirror 19 ... Normal objective lens 20 ... Illumination light source (lamp) 21 ... Correction lens

Claims (3)

[Claims] An epi-illumination system having an illumination light source and a deflection member for deflecting light from the illumination light source and irradiating the specimen with light.
An auxiliary lens that can be inserted into and removed from the microscope optical path, an extremely low magnification objective lens that is arranged in the optical path together with the auxiliary lens so that an image of the sample can be observed, and that the auxiliary lens is outside the optical path. An objective lens capable of observing the image of the specimen in a state where the specimen is deflected, wherein the deflecting member transmits light from the illumination light source to the specimen via the auxiliary lens and the extremely low magnification objective lens. A microscope, which is arranged at a position to be irradiated. 2. The microscope according to claim 1, wherein the auxiliary lens is provided on an arm of the microscope, and the epi-illumination system is detachably provided inside or on an upper part of the arm. Microscope as described. 3. The microscope according to claim 1, wherein the epi-illumination system includes a correction lens for correcting a change in illumination characteristics of the illumination light due to insertion and removal of the auxiliary lens.