JPH11349790A - Sealing resin composition and semiconductor device - Google Patents
Sealing resin composition and semiconductor deviceInfo
- Publication number
- JPH11349790A JPH11349790A JP17393798A JP17393798A JPH11349790A JP H11349790 A JPH11349790 A JP H11349790A JP 17393798 A JP17393798 A JP 17393798A JP 17393798 A JP17393798 A JP 17393798A JP H11349790 A JPH11349790 A JP H11349790A
- Authority
- JP
- Japan
- Prior art keywords
- silica
- resin composition
- filler
- weight
- particle diameter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000011342 resin composition Substances 0.000 title claims abstract description 27
- 239000004065 semiconductor Substances 0.000 title claims abstract description 22
- 238000007789 sealing Methods 0.000 title claims abstract description 21
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims abstract description 155
- 239000000377 silicon dioxide Substances 0.000 claims abstract description 72
- 239000002245 particle Substances 0.000 claims abstract description 45
- 239000000945 filler Substances 0.000 claims abstract description 36
- 229920005989 resin Polymers 0.000 claims abstract description 27
- 239000011347 resin Substances 0.000 claims abstract description 27
- 229920001187 thermosetting polymer Polymers 0.000 claims abstract description 21
- 238000003825 pressing Methods 0.000 claims abstract description 10
- 239000012736 aqueous medium Substances 0.000 claims abstract description 8
- 239000003822 epoxy resin Substances 0.000 claims description 13
- 229920000647 polyepoxide Polymers 0.000 claims description 13
- 239000010419 fine particle Substances 0.000 claims description 10
- 239000000843 powder Substances 0.000 abstract description 16
- 238000000034 method Methods 0.000 abstract description 11
- 238000001721 transfer moulding Methods 0.000 abstract description 6
- 238000002156 mixing Methods 0.000 abstract description 5
- 238000000465 moulding Methods 0.000 abstract description 5
- 238000000227 grinding Methods 0.000 abstract description 4
- 239000000203 mixture Substances 0.000 description 13
- 229920003986 novolac Polymers 0.000 description 6
- 239000003054 catalyst Substances 0.000 description 4
- 230000000052 comparative effect Effects 0.000 description 4
- 239000011256 inorganic filler Substances 0.000 description 4
- 229910003475 inorganic filler Inorganic materials 0.000 description 4
- 238000004898 kneading Methods 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 239000005011 phenolic resin Substances 0.000 description 4
- 238000010298 pulverizing process Methods 0.000 description 4
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 4
- QTWJRLJHJPIABL-UHFFFAOYSA-N 2-methylphenol;3-methylphenol;4-methylphenol Chemical compound CC1=CC=C(O)C=C1.CC1=CC=CC(O)=C1.CC1=CC=CC=C1O QTWJRLJHJPIABL-UHFFFAOYSA-N 0.000 description 3
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 3
- 239000004593 Epoxy Substances 0.000 description 3
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 3
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 3
- 238000001816 cooling Methods 0.000 description 3
- 229930003836 cresol Natural products 0.000 description 3
- 238000009826 distribution Methods 0.000 description 3
- VLKZOEOYAKHREP-UHFFFAOYSA-N n-Hexane Chemical compound CCCCCC VLKZOEOYAKHREP-UHFFFAOYSA-N 0.000 description 3
- 239000000047 product Substances 0.000 description 3
- 235000012239 silicon dioxide Nutrition 0.000 description 3
- 239000002904 solvent Substances 0.000 description 3
- 229920003002 synthetic resin Polymers 0.000 description 3
- 239000000057 synthetic resin Substances 0.000 description 3
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 2
- 238000005299 abrasion Methods 0.000 description 2
- 150000001298 alcohols Chemical class 0.000 description 2
- 229910002026 crystalline silica Inorganic materials 0.000 description 2
- 230000006378 damage Effects 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 239000002609 medium Substances 0.000 description 2
- 238000002844 melting Methods 0.000 description 2
- 230000008018 melting Effects 0.000 description 2
- GHMLBKRAJCXXBS-UHFFFAOYSA-N resorcinol Chemical compound OC1=CC=CC(O)=C1 GHMLBKRAJCXXBS-UHFFFAOYSA-N 0.000 description 2
- RYHBNJHYFVUHQT-UHFFFAOYSA-N 1,4-Dioxane Chemical compound C1COCCO1 RYHBNJHYFVUHQT-UHFFFAOYSA-N 0.000 description 1
- VXQBJTKSVGFQOL-UHFFFAOYSA-N 2-(2-butoxyethoxy)ethyl acetate Chemical compound CCCCOCCOCCOC(C)=O VXQBJTKSVGFQOL-UHFFFAOYSA-N 0.000 description 1
- NQBXSWAWVZHKBZ-UHFFFAOYSA-N 2-butoxyethyl acetate Chemical compound CCCCOCCOC(C)=O NQBXSWAWVZHKBZ-UHFFFAOYSA-N 0.000 description 1
- ZNQVEEAIQZEUHB-UHFFFAOYSA-N 2-ethoxyethanol Chemical compound CCOCCO ZNQVEEAIQZEUHB-UHFFFAOYSA-N 0.000 description 1
- SVONRAPFKPVNKG-UHFFFAOYSA-N 2-ethoxyethyl acetate Chemical compound CCOCCOC(C)=O SVONRAPFKPVNKG-UHFFFAOYSA-N 0.000 description 1
- 239000004925 Acrylic resin Substances 0.000 description 1
- 229920000178 Acrylic resin Polymers 0.000 description 1
- 239000004640 Melamine resin Substances 0.000 description 1
- 229920000877 Melamine resin Polymers 0.000 description 1
- FXHOOIRPVKKKFG-UHFFFAOYSA-N N,N-Dimethylacetamide Chemical compound CN(C)C(C)=O FXHOOIRPVKKKFG-UHFFFAOYSA-N 0.000 description 1
- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical compound CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 description 1
- 239000004372 Polyvinyl alcohol Substances 0.000 description 1
- 239000006004 Quartz sand Substances 0.000 description 1
- 229920001807 Urea-formaldehyde Polymers 0.000 description 1
- XTXRWKRVRITETP-UHFFFAOYSA-N Vinyl acetate Chemical compound CC(=O)OC=C XTXRWKRVRITETP-UHFFFAOYSA-N 0.000 description 1
- 239000000654 additive Substances 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 239000007822 coupling agent Substances 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- HNPDNOZNULJJDL-UHFFFAOYSA-N ethyl n-ethenylcarbamate Chemical compound CCOC(=O)NC=C HNPDNOZNULJJDL-UHFFFAOYSA-N 0.000 description 1
- 239000012467 final product Substances 0.000 description 1
- 239000005350 fused silica glass Substances 0.000 description 1
- LNEPOXFFQSENCJ-UHFFFAOYSA-N haloperidol Chemical compound C1CC(O)(C=2C=CC(Cl)=CC=2)CCN1CCCC(=O)C1=CC=C(F)C=C1 LNEPOXFFQSENCJ-UHFFFAOYSA-N 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- FPYJFEHAWHCUMM-UHFFFAOYSA-N maleic anhydride Chemical compound O=C1OC(=O)C=C1 FPYJFEHAWHCUMM-UHFFFAOYSA-N 0.000 description 1
- 239000002480 mineral oil Substances 0.000 description 1
- 235000010446 mineral oil Nutrition 0.000 description 1
- 230000035699 permeability Effects 0.000 description 1
- 229920006122 polyamide resin Polymers 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 239000009719 polyimide resin Substances 0.000 description 1
- 229920005749 polyurethane resin Polymers 0.000 description 1
- 229920002451 polyvinyl alcohol Polymers 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 239000003566 sealing material Substances 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 229920002050 silicone resin Polymers 0.000 description 1
- 238000004513 sizing Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 229920002803 thermoplastic polyurethane Polymers 0.000 description 1
- 239000004711 α-olefin Substances 0.000 description 1
Landscapes
- Compositions Of Macromolecular Compounds (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、半導体チップ等の
電子部品をトランスファー成形などで封止するに用いる
封止用樹脂組成物と、該組成物によって樹脂封止された
半導体装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a sealing resin composition used for sealing an electronic component such as a semiconductor chip by transfer molding or the like, and a semiconductor device resin-sealed with the composition.
【0002】[0002]
【従来の技術】半導体チップ等の電子部品は、それを外
部環境から保護するためにセラミックパッケージや樹脂
パッケージで封止されているが、この封止材料について
は、コスト、生産性等の面から無機質充填剤を含有させ
た合成樹脂組成物によるものが普及している。2. Description of the Related Art Electronic components such as semiconductor chips are sealed with a ceramic package or a resin package in order to protect them from an external environment. A synthetic resin composition containing an inorganic filler has been widely used.
【0003】この合成樹脂組成物は、エポキシ樹脂など
の熱硬化性樹脂とシリカ等の無機充填剤とから構成され
ているが、これらの合成樹脂組成物は、熱膨張係数が小
さく、良熱伝導性、低透湿性で機械的特性などに優れ、
しかも低コストのものが望ましいことから、この無機質
充填剤をその成形性の許す限り、できるだけ多量に配合
する必要がある。[0003] This synthetic resin composition is composed of a thermosetting resin such as an epoxy resin and an inorganic filler such as silica. However, these synthetic resin compositions have a small coefficient of thermal expansion and a good thermal conductivity. , Low moisture permeability, excellent mechanical properties, etc.
In addition, since a low-cost one is desirable, it is necessary to mix this inorganic filler in as large an amount as possible, as long as its moldability is allowed.
【0004】しかしながら、充填剤として用いる無機質
粉末は、主としてその塊状物を、適度の大きさと分布を
もった粉末に粉砕するため、その形状は一般に角をもっ
ており、これとエポキシ樹脂等の熱硬化性樹脂を混練し
て封止材料とした場合、その流動性が十分ではなく、充
填性や作業性が悪いうえ、成形加工工程で使用する装置
類を著しく摩耗するという欠点をもっていた。また、封
止される半導体チップにとっても、充填剤粒子の鋭くと
がった角が半導体素子表面を傷つけ、そのことがソフト
エラーを引き起こす原因となるとの報告も出されてい
る。[0004] However, the inorganic powder used as a filler is mainly crushed into a powder having an appropriate size and distribution. When a resin is kneaded to form a sealing material, the fluidity is not sufficient, the filling property and the workability are poor, and the devices used in the molding process have the drawback of being significantly worn. In addition, it has been reported that, even for a semiconductor chip to be sealed, sharp sharp corners of the filler particles damage the surface of the semiconductor element, which causes a soft error.
【0005】一般に、熱硬化性樹脂が硬化する際には、
収縮することにより応力が生じるが、この応力のほか半
導体素子から発生する熱により、半導体基板と封止樹脂
組成物の熱膨張係数の差が大きいために生ずる応力が存
在する。これらの内部応力のうち、後者の応力を緩和す
るために、通常、熱膨張率の小さい無機質充填剤を、で
きるだけ多量に充填することが望ましい。しかしなが
ら、この面においても、粉砕によって製造された角ばっ
た充填剤では、充填剤を増やすと極端に流動性が低下す
るために、量的な制約を受けざるを得ず、その制約のも
とでは内部応力の緩和には役立たない。Generally, when a thermosetting resin is cured,
The shrinkage causes stress, but in addition to this stress, there is a stress generated due to a large difference in thermal expansion coefficient between the semiconductor substrate and the sealing resin composition due to heat generated from the semiconductor element. Of these internal stresses, in order to relieve the latter stress, it is usually desirable to fill the inorganic filler having a low coefficient of thermal expansion as much as possible. However, also in this aspect, in the case of a square filler produced by pulverization, an increase in the amount of the filler extremely decreases the flowability, so that the amount of the filler must be limited, and under such restrictions, It does not help alleviate internal stress.
【0006】このような問題点を解決するため、例え
ば、特開昭 58-145613号公報または特開昭 61-118131号
公報によれば、結晶微粉末シリカをガス流とともにノズ
ルから噴出させ、粒子の分散、溶融、冷却等を適当な条
件に制御して、球状の溶融微粉末シリカをつくる方法が
提案されている。しかしながら、この方法はコストが高
くなる欠点を有する。In order to solve such a problem, for example, according to JP-A-58-145613 or JP-A-61-118131, silica fine powder is ejected from a nozzle together with a gas flow to form particles. There has been proposed a method for producing spherical fused fine powder silica by controlling dispersion, melting, cooling and the like of the powder under appropriate conditions. However, this method has the disadvantage of increasing costs.
【0007】一方、結晶タイプの球状シリカの丸味を帯
びたシリカ微粉末粒子の製造方法については、特公平 4
-60053号公報(シリカ微粉末粒子の製造方法)が公告さ
れている。しかしながら、この方法は、シリカ充填剤の
不純物イオン濃度が高くなり、また、シリカ充填剤の水
分含有量も高くなる等の欠点があった。On the other hand, a method for producing rounded silica fine powder of crystalline spherical silica is disclosed in
No. -60053 (a method for producing silica fine powder particles) has been published. However, this method has drawbacks such as an increase in the impurity ion concentration of the silica filler and an increase in the water content of the silica filler.
【0008】[0008]
【発明が解決しようとする課題】本発明の目的は、シリ
カ充填剤を配合した熱硬化性樹脂の組成物であって、ト
ランスファー成形に適して充填性や作業性がよく、成形
加工工程で使用する装置の摩耗も少なくて、かつ電子部
品の内部応力が小さい封止用樹脂組成物および半導体装
置を提供しようとするものである。SUMMARY OF THE INVENTION An object of the present invention is to provide a thermosetting resin composition containing a silica filler, which is suitable for transfer molding, has good filling properties and workability, and is used in a molding process. It is an object of the present invention to provide a sealing resin composition and a semiconductor device in which the abrasion of the device is small and the internal stress of the electronic component is small.
【0009】[0009]
【課題を解決するための手段】本発明者は、上記の目的
を達成しようと鋭意研究を重ねた結果、機械的応力を加
えながら気体中で粒子同士を摩砕して、最大粒子径が20
0 μm以下で、平均粒子径が36μm以上70μm以下であ
り、かつ3 μm以下の微粒子シリカを12重量%以上、1
μm以下の微粒子シリカを2 重量%以上含有するシリカ
粉末が、熱硬化性樹脂に配合するシリカ充填剤として、
特に、良好な流動性を付与するとともに高配合を可能に
することを知った。Means for Solving the Problems As a result of intensive studies to achieve the above object, the present inventor has crushed particles in a gas while applying mechanical stress, and has a maximum particle diameter of 20 μm.
0 μm or less, the average particle size is 36 μm or more and 70 μm or less, and 3 μm or less
Silica powder containing 2% by weight or more of fine particle silica having a particle size of not more than 2 μm
In particular, it has been found that it imparts good fluidity and enables high blending.
【0010】さらに、上記特定の方法で角を丸めたシリ
カ微粉末粒子を熱硬化性樹脂に配合すれば、トランスフ
ァー成形における充填性や作業性がよく、成形加工工程
での装置の摩耗も少なくて、かつ半導体封止装置などの
内部応力が小さい封止用樹脂組成物が得られることをも
見いだし、本発明を完成したものである。Furthermore, if the silica fine powder particles whose corners are rounded by the above-mentioned specific method are mixed with a thermosetting resin, the filling property and the workability in transfer molding are good, and the wear of the apparatus in the molding process is small. Further, the present inventors have also found that a sealing resin composition having a small internal stress in a semiconductor sealing device or the like can be obtained, and the present invention has been completed.
【0011】即ち、本発明は、熱硬化性樹脂とシリカ充
填剤とからなり、シリカ充填剤が、破砕状シリカに外部
から押圧力を加えながら水系媒体存在下で粒子同士を摩
砕することによってシリカ粒子の角をとり、丸みをおび
させたシリカ微粉末であって、最大粒子径が200μm以
下で平均粒子径が36 μm以上70μm以下であり、か
つ、3 μm以下の微粒子シリカを12重量%以上、1 μm
以下の微粒子シリカを2 重量%以上含有するとともに、
熱硬化性樹脂100 重量部に対して該シリカ充填剤が100
〜2000重量部の割合に配合されることを特徴とする封止
用樹脂組成物であり、また、熱硬化性樹脂がエポキシ樹
脂である上記封止用樹脂組成物の硬化物によって、半導
体チップが封止されてなることを特徴とする半導体装置
である。That is, the present invention comprises a thermosetting resin and a silica filler, and the silica filler grinds the particles in the presence of an aqueous medium while applying an external pressing force to the crushed silica. 12% by weight of fine silica particles having a maximum particle diameter of 200 μm or less, an average particle diameter of 36 μm or more and 70 μm or less, and a particle diameter of 3 μm or less. 1 μm
It contains not less than 2% by weight of the following particulate silica,
100 parts by weight of the thermosetting resin and 100 parts by weight of the silica filler
~ 2000 parts by weight is a sealing resin composition characterized by being blended, the thermosetting resin is a cured product of the sealing resin composition is an epoxy resin, the semiconductor chip, A semiconductor device characterized by being sealed.
【0012】以下、本発明を詳細に説明する。Hereinafter, the present invention will be described in detail.
【0013】本発明に用いる破砕状シリカは、結晶シリ
カ、溶融シリカのいずれでも構わず、結晶シリカとして
は、一般に天然の高純度の珪石、珪砂、水晶等が用いら
れ、溶融シリカは、これら結晶シリカを高温で溶融して
インゴットにしたものである。通常、これらをジョーク
ラッシャー、ロールクラッシャー等で粗砕し、これら粗
砕品をさらにボールミル等で微粉砕し、本発明における
破砕状シリカとして用いる。ここで得られる破砕状シリ
カの平均粒子径は、最終製品の角をとって丸みを帯びた
シリカ充填剤のそれよりもやや大きくしておく必要があ
る。The crushed silica used in the present invention may be either crystalline silica or fused silica. As the crystalline silica, natural high-purity silica, quartz sand, quartz or the like is generally used. It is obtained by melting silica at a high temperature to form an ingot. Usually, these are coarsely crushed by a jaw crusher, a roll crusher or the like, and these crushed products are further finely crushed by a ball mill or the like, and used as crushed silica in the present invention. The average particle size of the crushed silica obtained here must be slightly larger than that of the silica filler which is rounded at the corners of the final product.
【0014】本発明においては、破砕状シリカに外部か
ら押圧力を加えながら、水系媒体存在下で粒子同士を摩
砕とてシリカ微粉末とするが、この水系媒体が存在しな
いと押圧力が粉体に円滑に伝達されず、摩砕の効率は極
めて低くなる。通常、破砕状シリカに対して0.5 〜18
%、好ましくは3 〜13%の水系媒体の存在が、摩砕に対
して有効に作用する。In the present invention, while applying a pressing force to the crushed silica from the outside, the particles are ground together in the presence of an aqueous medium to produce fine silica powder. It is not transmitted smoothly to the body, and the grinding efficiency is extremely low. Typically 0.5-18 for crushed silica
%, Preferably 3 to 13% of an aqueous medium effectively acts on the attrition.
【0015】使用する水系媒体としては、シリカ微粒子
同士が相互に作用しあい、外部から粉体への圧力が伝達
し易い液体であればよく、水、アルコール類、鉱油等の
液状物質が有利に使用できるが、媒体のコスト、操作時
の取扱い易さ、操作後の分離し易さなどから水単独、ま
たは水にエタノール、メタノール等のアルコール類を溶
かした媒体が工業的に最も有利に使用できる。As the aqueous medium to be used, any liquid may be used as long as the fine silica particles interact with each other and the pressure from the outside to the powder is easily transmitted. Liquid substances such as water, alcohols and mineral oil are advantageously used. However, water alone or a medium in which alcohols such as ethanol and methanol are dissolved in water can be used most industrially in view of the cost of the medium, ease of handling during operation, ease of separation after operation, and the like.
【0016】また、本発明において、外部から破砕状シ
リカに加える押圧力は、機械により押圧の仕方が異なる
ので数値的に限定できないが、押圧力があまり強い場
合、角とりのみならず粒子の体積破壊がおき、粉砕が進
行し角とりが阻害される。また、あまり弱い場合は、角
とりの効率が低下してくるので、機械、原料、品種(結
晶質、非結晶質)等に応じて、適切に決めればよい。ま
た、数mm以下の粗砕品を直接この角とり工程に送っ
て、所望粒度への粉砕と同時に角とり操作を行うことも
できる。In the present invention, the pressing force applied to the crushed silica from the outside cannot be numerically limited because the pressing method differs depending on the machine. However, when the pressing force is too strong, not only the cornering but also the particle volume Destruction occurs, crushing proceeds, and cornering is hindered. In addition, if it is too weak, the efficiency of the squaring decreases, so it may be appropriately determined according to the machine, raw material, type (crystalline, non-crystalline) and the like. In addition, a crushed product having a size of several mm or less can be directly sent to the de-squaring step, and the de-sizing operation can be performed simultaneously with the pulverization to a desired particle size.
【0017】このように外部から押圧力を加えながら粒
子同士を摩砕する手段には、種々の方法があるが、エネ
ルギー等のコストあるいは効率性の面からみてローラミ
ルが最も有効に使用できる。There are various methods for grinding the particles while applying a pressing force from the outside as described above, but a roller mill can be used most effectively from the viewpoint of cost and efficiency of energy and the like.
【0018】本発明に用いるシリカ充填剤は、特定の粒
度分布を有するとともにシリカ微粉末を含有するもので
ある。そのシリカ充填剤の最大粒子径は、200 μm以下
で、好ましくは100 μm以下である。最大粒子径が200
μmを超えると、半導体の樹脂封止の工程でつまりを生
じるため使用できい。更に平均粒子径は、36μm以上70
μm以下である。36μm未満または70μmを超えると樹
脂組成物の良好な流動性が損なわれる。The silica filler used in the present invention has a specific particle size distribution and contains silica fine powder. The maximum particle size of the silica filler is 200 μm or less, preferably 100 μm or less. Maximum particle size is 200
If it exceeds μm, it will not be used because it will cause clogging in the resin sealing process of the semiconductor. Further, the average particle size is 36 μm or more and 70
μm or less. If it is less than 36 μm or more than 70 μm, good fluidity of the resin composition is impaired.
【0019】次に、シリカ充填剤中の微粒子シリカの存
在量であるが、3 μm以下の微粒子シリカを12重量%以
上、1 μm以下の微粒子シリカを2 重量%以上含有する
と良好な流動性が得られ、かつ、高充填化が図れる。但
し、3 μm以下の微粒子シリカは、必ずしも角をとって
丸みを帯びる必要はなく、破砕状微粒子でもよい。いず
れの場合も上記規定存在量未満であると、樹脂組成物の
流動性は低下してくる。なお、微粒子シリカの存在量の
上限は、上記した平均粒子径の範囲規定により決められ
る。Next, regarding the abundance of the particulate silica in the silica filler, good fluidity is obtained when the particulate silica having a particle size of 3 μm or less is contained at 12% by weight or more and the particulate silica having a particle size of 1 μm or less is contained at 2% by weight or more. It is possible to achieve high filling. However, the fine silica having a particle diameter of 3 μm or less does not necessarily have to take a corner and be rounded, and may be crushed fine particles. In any case, when the amount is less than the above specified amount, the fluidity of the resin composition is reduced. In addition, the upper limit of the abundance of the particulate silica is determined by the above-described range definition of the average particle diameter.
【0020】上記、36〜70μmの平均粒子径および所定
の割合で微粒子が存在するシリカ充填剤は、押圧力ある
いは、回転数、水系媒体の量等を適宜調節することによ
り得ることができるし、また、3 μm以下の破砕状シリ
カを本処理前、処理途中または処理後に分級により除去
しても得ることができる。The silica filler having an average particle diameter of 36 to 70 μm and fine particles present in a predetermined ratio can be obtained by appropriately adjusting the pressing force, the number of rotations, the amount of the aqueous medium, and the like. Further, it can also be obtained by removing crushed silica having a size of 3 μm or less by classification before, during or after the main treatment.
【0021】本発明の封止用樹脂組成物は、上述したシ
リカ充填剤を熱硬化性樹脂に配合させたものである。The sealing resin composition of the present invention is obtained by mixing the above-mentioned silica filler with a thermosetting resin.
【0022】ここで用いる熱硬化性樹脂としては、例え
ば、ユリア樹脂、メラミン樹脂、フェノール樹脂、レゾ
ルシノール樹脂、エポキシ樹脂、ポリウレタン樹脂、酢
酸ビニル樹脂、ポリビニルアルコール樹脂、アクリル樹
脂、ビニルウレタン樹脂、シリコーン樹脂、α−オレフ
ィン無水マレイン酸樹脂、ポリアミド樹脂、ポリイミド
樹脂等が挙げられ、これらは単独又は2 種以上混合して
使用することができる。このなかでもエポキシ樹脂が工
業的に有利に用いられる。これらの熱硬化性樹脂100 重
量部に対して、本発明のシリカ充填剤を100 〜2000重量
部の範囲で配合すると所望の樹脂組成物が得られる。な
お、熱硬化性樹脂の100 重量部のなかには、その熱硬化
性樹脂に必要な硬化剤および硬化触媒の配合量が含まれ
る。シリカ充填剤配合が100 重量部未満では内部応力低
下の効果がみられず、2000重量部を超えると、樹脂の流
動性が著しく低下するので好ましくない。熱硬化性樹脂
に充填剤を混練する方法としては、通常、ニーダ、ロー
ルミル、ミキサー等を用いればよい。Examples of the thermosetting resin used here include urea resin, melamine resin, phenol resin, resorcinol resin, epoxy resin, polyurethane resin, vinyl acetate resin, polyvinyl alcohol resin, acrylic resin, vinyl urethane resin, and silicone resin. , Α-olefin maleic anhydride resin, polyamide resin, polyimide resin and the like, and these can be used alone or in combination of two or more. Among them, epoxy resins are industrially advantageously used. By mixing the silica filler of the present invention in an amount of 100 to 2,000 parts by weight with respect to 100 parts by weight of the thermosetting resin, a desired resin composition can be obtained. The amount of the curing agent and curing catalyst required for the thermosetting resin is included in 100 parts by weight of the thermosetting resin. When the amount of the silica filler is less than 100 parts by weight, the effect of lowering the internal stress is not seen. When the amount is more than 2,000 parts by weight, the fluidity of the resin is unpreferably reduced. As a method of kneading the filler with the thermosetting resin, usually, a kneader, a roll mill, a mixer, or the like may be used.
【0023】本発明の封止用樹脂組成物は、上述したシ
リカ充填剤および熱硬化性樹脂を主成分とするが、本発
明の目的に反しない限り、また必要に応じて、粘度調整
用の溶剤、カップリング剤、その他の添加剤を配合する
ことができる。その溶剤ととしては、ジオキサン、ヘキ
サン、ベンゼン、トルエン、ソルベントナフサ、工業用
ガソリン、酢酸セロソルブ、エチルセロソルブ、ブチル
セロソルブアセテート、ブチルカルビトールアセテー
ト、ジメチルホルムアミド、ジメチルアセトアミド、N
−メチルピロリドン等が挙げられ、これらは単独又は2
種以上混合して使用することができる。The encapsulating resin composition of the present invention contains the above-mentioned silica filler and thermosetting resin as main components, but it does not detract from the object of the present invention, and if necessary, adjusts the viscosity. Solvents, coupling agents, and other additives can be blended. Examples of the solvent include dioxane, hexane, benzene, toluene, solvent naphtha, industrial gasoline, cellosolve acetate, ethyl cellosolve, butyl cellosolve acetate, butyl carbitol acetate, dimethylformamide, dimethylacetamide, N
-Methylpyrrolidone and the like, which may be used alone or 2
A mixture of more than one species can be used.
【0024】さらに、本発明の半導体装置は、エポキシ
樹脂を熱硬化性樹脂とした上記樹脂組成物を用いて半導
体チップを封止して容易に製造することができる。Further, the semiconductor device of the present invention can be easily manufactured by encapsulating a semiconductor chip using the above resin composition in which an epoxy resin is a thermosetting resin.
【0025】[0025]
【作用】本発明において角が丸められるとともに特定粒
度分布かつ微粒子シリカを特定量含有するシリカ充填剤
と、熱硬化性樹脂とを配合することによって、本発明の
封止用樹脂組成物が得られる。この封止用樹脂組成物を
使用することにより、トランスファー成形における充填
性や作業性がよく、成形加工工程での装置の摩耗も少な
くなり、かつ内部応力の小さい半導体装置を製造するこ
とができる。According to the present invention, the sealing resin composition of the present invention can be obtained by blending a thermosetting resin with a silica filler having rounded corners, a specific particle size distribution and a specific amount of fine-particle silica. . By using this sealing resin composition, it is possible to manufacture a semiconductor device having good filling properties and workability in transfer molding, reduced wear of the device in the molding process, and small internal stress.
【0026】[0026]
【発明の実施の形態】以下、本発明を実施例によって説
明するが、本発明は、これらの実施例によって限定され
るものではない。DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, the present invention will be described with reference to examples, but the present invention is not limited to these examples.
【0027】実施例1 破砕状シリカに外部から押圧力を加えながら水系媒体存
在下で粒子同士を摩砕することによってシリカ粒子の角
をとり、丸みをおびさせたシリカ微粉末であって、最大
粒子径が180 μmで平均粒子径が45μmであり、かつ3
μm以下の微粒子シリカの含有量が17重量%、1 μm以
下の微粒子シリカの含有量が4.5 重量%であるシリカ充
填剤Aを、エポキシ樹脂100 重量部に対し、表1に示す
重量部を配合し、ロールミルにて混練後冷却、粉砕し、
エポキシ樹脂組成物1〜4を得た。Example 1 A fine silica powder which was obtained by grinding particles in the presence of an aqueous medium while applying a pressing force to the crushed silica from the outside to make corners of the silica particles round and rounded. The particle size is 180 μm, the average particle size is 45 μm, and 3
A silica filler A containing 17% by weight of fine silica particles having a particle size of 1 μm or less and 4.5% by weight of fine particle silica particles having a particle size of 1 μm or less was mixed with 100 parts by weight of an epoxy resin in parts by weight shown in Table 1. Then, after kneading with a roll mill, cooling and pulverizing,
Epoxy resin compositions 1 to 4 were obtained.
【0028】比較例1 同様に、丸みをおびさせたシリカ微粉末であって、最大
粒子径が180 μmで平均粒子径が18μmであり、かつ3
μm以下の微粒子シリカの含有量が19重量%、1 μm以
下の微粒子シリカの含有量が7.3 重量%であるシリカ充
填剤Bを、エポキシ樹脂100 重量部に対し、表2に示す
重量部を配合し、ロールミルにて混練後冷却、粉砕し、
エポキシ樹脂組成物5〜8を得た。Comparative Example 1 Similarly, a rounded silica fine powder having a maximum particle size of 180 μm, an average particle size of 18 μm, and
Silica filler B having a content of fine particle silica of 1 μm or less of 19% by weight and a content of fine particle silica of 1 μm or less of 7.3% by weight is mixed with 100 parts by weight of the epoxy resin in parts by weight shown in Table 2. Then, after kneading with a roll mill, cooling and pulverizing,
Epoxy resin compositions 5 to 8 were obtained.
【0029】比較例2 角張ったシリカ微粉末であって、最大粒子径が120 μm
で平均粒子径が25μmであり、かつ3 μm以下の微粒子
シリカの含有量が15重量%、1 μm以下の微粒子シリカ
の含有量が3.3 重量%であるシリカ充填剤Cを、エポキ
シ樹脂100 重量部に対し、表3に示す重量部を配合し、
ロールミルにて混練後冷却、粉砕し、エポキシ樹脂組成
物9〜12を得た。Comparative Example 2 An angular silica fine powder having a maximum particle size of 120 μm
A silica filler C having an average particle diameter of 25 μm, a content of fine particle silica of 3 μm or less of 15% by weight, and a content of fine particle silica of 1 μm or less of 3.3% by weight, 100 parts by weight of epoxy resin With the parts by weight shown in Table 3,
After kneading with a roll mill, the mixture was cooled and pulverized to obtain epoxy resin compositions 9 to 12.
【0030】前記実施例1および比較例1〜2で作成し
たエポキシ樹脂組成物の流動性をみるため、高化式フロ
ー粘度およびスパイラルフローを測定してこの結果を表
1〜3にそれぞれ示した。実施例1におけるシリカ充填
剤Aを使用した番号1〜4の樹脂組成物が、比較例1〜
2におけるシリカ充填剤B、Cを使用した番号5〜12
の樹脂組成物より流動性に優れ、また、フィラーを高充
填しても樹脂組成物粘度が低く、成形性および作業性に
優れていて、本発明の効果が確認された。In order to check the fluidity of the epoxy resin compositions prepared in Example 1 and Comparative Examples 1 and 2, the flow viscosity and spiral flow were measured, and the results are shown in Tables 1 to 3, respectively. . The resin compositions of Nos. 1 to 4 using the silica filler A in Example 1 were compared with Comparative Examples 1 to 4.
Nos. 5 to 12 using silica fillers B and C in No. 2
The resin composition was more excellent in fluidity than the resin composition described above, the viscosity of the resin composition was low even when the filler was filled at a high level, the moldability and the workability were excellent, and the effect of the present invention was confirmed.
【0031】[0031]
【表1】 *1 :クレゾールノボラックエポキシ樹脂−ノボラックフェノール樹脂等量配合 、有機燐系触媒。 *2 :175 ℃、荷重10kg(島津フローテスターCFT−500型)。 *3 :175 ℃×2 分硬化、EMMI規格1一66に準じる。[Table 1] * 1: Cresol novolak epoxy resin-novolak phenol resin equivalent weight blend, organophosphorus catalyst. * 2: 175 ° C, load 10kg (Shimadzu flow tester CFT-500 type). * 3: Cured at 175 ° C for 2 minutes, according to EMMI Standard 1-166.
【0032】[0032]
【表2】 *1 :クレゾールノボラックエポキシ樹脂−ノボラックフェノール樹脂等量配合 、有機燐系触媒。 *2 :175 ℃、荷重10kg(島津フローテスターCFT−500型)。 *3 :175 ℃×2 分硬化、EMMI規格1一66に準じる[Table 2] * 1: Cresol novolak epoxy resin-novolak phenol resin equivalent weight blend, organophosphorus catalyst. * 2: 175 ° C, load 10kg (Shimadzu flow tester CFT-500 type). * 3: Curing at 175 ° C for 2 minutes, according to EMMI Standard 1-166
【0033】[0033]
【表3】 *1 :クレゾールノボラックエポキシ樹脂−ノボラックフェノール樹脂等量配合 、有機燐系触媒。 *2 :175 ℃、荷重10kg(島津フローテスターCFT−500型)。 *3 :175 ℃×2 分硬化、EMMI規格1一66に準じる[Table 3] * 1: Cresol novolak epoxy resin-novolak phenol resin equivalent weight blend, organophosphorus catalyst. * 2: 175 ° C, load 10kg (Shimadzu flow tester CFT-500 type). * 3: Curing at 175 ° C for 2 minutes, according to EMMI Standard 1-166
【0034】[0034]
【発明の効果】本発明のシリカ充填剤を含有する熱硬化
性樹脂組成物を半導体等の電子部品の封止に用いること
により、トランスファー成形工程における流動性、摩耗
性が改善されるうえ、封止物の内部応力の低下にも役立
ち、作業性、特性の両面で改善をはかることができる。By using the thermosetting resin composition containing the silica filler of the present invention for sealing electronic parts such as semiconductors, the fluidity and abrasion in the transfer molding step are improved and the sealing property is improved. It also helps to reduce the internal stress of the fastener and improves both workability and characteristics.
Claims (2)
り、シリカ充填剤が、破砕状シリカに外部から押圧力を
加えながら水系媒体存在下で粒子同士を摩砕することに
よってシリカ粒子の角をとり、丸みをおびさせたシリカ
微粉末であって、最大粒子径が200 μm以下で平均粒子
径が36μm以上70μm以下であり、かつ、3 μm以下の
微粒子シリカを12重量%以上、1 μm以下の微粒子シリ
カを2 重量%以上含有するとともに、熱硬化性樹脂100
重量部に対して該シリカ充填剤が100 〜2000重量部の割
合に配合されることを特徴とする封止用樹脂組成物。1. A silica filler comprising a thermosetting resin and a silica filler, wherein the silica filler grinds the particles in the presence of an aqueous medium while applying a pressing force to the crushed silica from the outside to thereby form corners of the silica particles. A finely divided silica having a maximum particle diameter of 200 μm or less, an average particle diameter of 36 μm or more and 70 μm or less, and 3 μm or less of 12% by weight or more and 1 μm 2% by weight or more of the following fine particle silica,
A sealing resin composition characterized in that the silica filler is blended in an amount of 100 to 2,000 parts by weight with respect to parts by weight.
項1記載の封止用樹脂組成物の硬化物によって、半導体
チップが封止されてなることを特徴とする半導体装置。2. A semiconductor device wherein a semiconductor chip is sealed with a cured product of the sealing resin composition according to claim 1, wherein the thermosetting resin is an epoxy resin.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17393798A JPH11349790A (en) | 1998-06-05 | 1998-06-05 | Sealing resin composition and semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17393798A JPH11349790A (en) | 1998-06-05 | 1998-06-05 | Sealing resin composition and semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH11349790A true JPH11349790A (en) | 1999-12-21 |
Family
ID=15969841
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP17393798A Pending JPH11349790A (en) | 1998-06-05 | 1998-06-05 | Sealing resin composition and semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH11349790A (en) |
-
1998
- 1998-06-05 JP JP17393798A patent/JPH11349790A/en active Pending
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