[go: up one dir, main page]

JPH10270164A - Method and apparatus for manufacturing organic electroluminescence element - Google Patents

Method and apparatus for manufacturing organic electroluminescence element

Info

Publication number
JPH10270164A
JPH10270164A JP9073343A JP7334397A JPH10270164A JP H10270164 A JPH10270164 A JP H10270164A JP 9073343 A JP9073343 A JP 9073343A JP 7334397 A JP7334397 A JP 7334397A JP H10270164 A JPH10270164 A JP H10270164A
Authority
JP
Japan
Prior art keywords
chamber
organic
deposition chamber
substrate
metal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9073343A
Other languages
Japanese (ja)
Inventor
Toshio Sakai
俊男 酒井
Hiroshi Shoji
弘 東海林
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Idemitsu Kosan Co Ltd
Original Assignee
Idemitsu Kosan Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Idemitsu Kosan Co Ltd filed Critical Idemitsu Kosan Co Ltd
Priority to JP9073343A priority Critical patent/JPH10270164A/en
Publication of JPH10270164A publication Critical patent/JPH10270164A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/10Deposition of organic active material
    • H10K71/16Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering
    • H10K71/164Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering using vacuum deposition

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Electroluminescent Light Sources (AREA)

Abstract

(57)【要約】 【課題】 蒸着室間における蒸発物の流入を防止でき、
これにより、優れた素子性能を確保できる有機EL素子
の製造方法およびその製造装置を提供する。 【解決手段】 有機物蒸着室21および金属蒸着室23
を含みかつ互いに連通可能に接続された複数の真空室3
4,21,22,23,54に基板15を搬送しながら
基板15上に有機物層および電極を成膜する有機EL素
子の製造方法において、基板15を配置した真空室と隣
接した真空室との圧力差が5×10-4Pa以下の状態で
基板15を隣接した真空室に搬送する。これにより、基
板15の搬送時に蒸発物や不純物が相互に流入すること
なく二室の圧力が平衡状態に達するので他の真空室の蒸
発物や不純物による膜の汚染を防止できるから優れた素
子性能を確保できる。
(57) [Summary] [Problem] To prevent inflow of evaporant between vapor deposition chambers,
This provides a method and an apparatus for manufacturing an organic EL element capable of ensuring excellent element performance. SOLUTION: An organic substance evaporation chamber 21 and a metal evaporation chamber 23 are provided.
And a plurality of vacuum chambers 3 including
In a method of manufacturing an organic EL device in which an organic material layer and an electrode are formed on a substrate 15 while transporting the substrate 15 to 4, 21, 22, 23, 54, a vacuum chamber in which the substrate 15 is disposed and a vacuum chamber adjacent to the vacuum chamber are disposed. The substrate 15 is transferred to an adjacent vacuum chamber with the pressure difference being 5 × 10 −4 Pa or less. Thereby, when the substrate 15 is conveyed, the pressure of the two chambers reaches an equilibrium state without the vaporized substances and impurities flowing into each other, so that the contamination of the film by the vaporized substances and impurities in other vacuum chambers can be prevented. Can be secured.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、有機エレクトロル
ミネッセンス素子の製造方法およびその製造装置に関す
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for manufacturing an organic electroluminescence device and an apparatus for manufacturing the same.

【0002】[0002]

【背景技術】近年、有機物層を含む発光デバイスである
有機エレクトロルミネッセンス素子(以下、有機EL素
子という)が注目されており、ディスプレイ等への利用
に向けて研究が進められている。有機EL素子は、一般
に、基板上に透明電極(陽極)、発光層等の有機物層、
および対向電極(陰極)を積層した構造を備え、これら
の各層は真空蒸着法によって基板上に成膜されている。
なお、有機EL素子に用いられる基板は、表面にITO
膜等の透明電極を成膜した状態で供給されることが多
い。
2. Description of the Related Art In recent years, an organic electroluminescence element (hereinafter, referred to as an organic EL element), which is a light emitting device including an organic material layer, has been attracting attention, and research is proceeding toward use for a display or the like. An organic EL device generally includes a transparent electrode (anode), an organic layer such as a light emitting layer,
And a structure in which a counter electrode (cathode) is laminated, and each of these layers is formed on a substrate by a vacuum evaporation method.
The substrate used for the organic EL element has an ITO surface on the surface.
It is often supplied in a state where a transparent electrode such as a film is formed.

【0003】このような有機EL素子を連続的に製造す
る場合には、有機物の蒸着を行う有機物蒸着室と金属の
蒸着を行う金属蒸着室とをバルブを介して接続した製造
装置が用いられている。この装置では、有機物蒸着室に
おいて基板の透明電極上に有機物層を蒸着し、バルブを
開けて基板を有機物蒸着室から金属蒸着室に搬送し、金
属蒸着室において有機物層上に金属を蒸着して対向電極
の成膜を行っていた。
In order to continuously manufacture such an organic EL element, a manufacturing apparatus is used in which an organic substance deposition chamber for depositing an organic substance and a metal deposition chamber for depositing a metal are connected via a valve. I have. In this apparatus, an organic layer is deposited on a transparent electrode of a substrate in an organic deposition chamber, a valve is opened, the substrate is transferred from the organic deposition chamber to the metal deposition chamber, and a metal is deposited on the organic layer in the metal deposition chamber. A counter electrode was formed.

【0004】[0004]

【発明が解決しようとする課題】この方法では、基板を
搬送するためにバルブを開放して有機物蒸着室および金
属蒸着室を連通させるので、有機物蒸着室内の蒸発物や
不純物が金属蒸着室に流入したり、金属蒸着室内の蒸発
物等が有機物蒸着室に流入したりすることがあった。こ
のため、各蒸着室における蒸着の際に、流入した他の蒸
発室の蒸発物等が膜に付着して有機EL素子の品質が低
下するおそれがあった。とくに、金属蒸着室では金属の
加熱によって多量の脱ガスが発生するため、この脱ガス
や金属の蒸発物が有機物蒸着室に流入して有機物層に混
入しやすかった。
In this method, a valve is opened to transfer the substrate to connect the organic vapor deposition chamber and the metal vapor deposition chamber, so that the evaporation and impurities in the organic vapor deposition chamber flow into the metal vapor deposition chamber. In some cases, evaporates and the like in the metal evaporation chamber flow into the organic evaporation chamber. For this reason, at the time of vapor deposition in each vapor deposition chamber, there is a possibility that the inflow material and the like of the other vaporization chambers adhere to the film and the quality of the organic EL element deteriorates. In particular, since a large amount of degas is generated by heating the metal in the metal vapor deposition chamber, it is easy for the degas and the evaporated matter of the metal to flow into the organic vapor deposition chamber and be mixed into the organic substance layer.

【0005】本発明の目的は、蒸着室間における蒸発物
の流入を防止でき、これにより、優れた素子性能を確保
できる有機EL素子の製造方法およびその製造装置を提
供することにある。
An object of the present invention is to provide a method of manufacturing an organic EL device and an apparatus for manufacturing the same, which can prevent inflow of evaporant between vapor deposition chambers, thereby ensuring excellent device performance.

【0006】[0006]

【課題を解決するための手段】本発明は、各蒸着室の圧
力差を低減することで蒸発物の流入を防止しようとする
ものである。具体的には、本発明は、有機物層の蒸着を
行う有機物蒸着室および電極の蒸着を行う金属蒸着室を
含みかつ互いに連通可能に接続された複数の真空室に基
板を搬送しながら基板上に有機物層および電極を順次成
膜する有機エレクトロルミネッセンス素子の製造方法で
あって、基板を配置した真空室とこの真空室に隣接した
真空室との圧力差が5×10-4Pa以下の状態で、基板
を隣接した真空室に搬送することを特徴とする。
SUMMARY OF THE INVENTION The present invention aims at preventing the inflow of evaporated substances by reducing the pressure difference between the respective vapor deposition chambers. Specifically, the present invention includes an organic material vapor deposition chamber for vapor deposition of an organic material layer and a metal vapor deposition chamber for vapor deposition of electrodes, and transports the substrate to a plurality of vacuum chambers communicably connected to each other. A method for manufacturing an organic electroluminescent element in which an organic material layer and an electrode are sequentially formed, wherein a pressure difference between a vacuum chamber in which a substrate is arranged and a vacuum chamber adjacent to the vacuum chamber is 5 × 10 −4 Pa or less. And transporting the substrate to an adjacent vacuum chamber.

【0007】本発明では、基板を配置した真空室とこの
真空室に隣接した真空室との圧力差が5×10-4Pa以
下の状態で基板を隣接した真空室に搬送するため、基板
の搬送時にこれらの真空室を互いに連通させても、各真
空室内の蒸発物や不純物が相互にほとんど流入すること
なく平衡状態に達する。従って、有機物蒸着室および金
属蒸着室における蒸着の際に、他の真空室の蒸発物や不
純物が、膜に混入または膜の表面(界面)に付着するこ
とがなくなるので、各蒸着室において純度の高い膜を形
成できるから、優れた素子性能を確保できる。また、各
層の蒸着は、通常、5×10-4Pa以下の圧力で行うた
め、蒸着室に隣接した真空室を常圧以下に減圧すること
で圧力差を5×10-4以下に低減できる。
In the present invention, the substrate is transferred to the adjacent vacuum chamber in a state where the pressure difference between the vacuum chamber in which the substrate is arranged and the vacuum chamber adjacent to the vacuum chamber is 5 × 10 −4 Pa or less. Even when these vacuum chambers are communicated with each other at the time of transfer, the equilibrium state is reached with little evaporation or impurities in each vacuum chamber flowing into each other. Therefore, during evaporation in the organic vapor deposition chamber and the metal vapor deposition chamber, evaporated substances and impurities in other vacuum chambers do not enter the film or adhere to the surface (interface) of the film. Since a high film can be formed, excellent element performance can be secured. In addition, since the deposition of each layer is usually performed at a pressure of 5 × 10 −4 Pa or less, the pressure difference can be reduced to 5 × 10 −4 or less by reducing the pressure in a vacuum chamber adjacent to the deposition chamber to a normal pressure or less. .

【0008】さらに、有機物蒸着室および金属蒸着室を
移送路を介して連通させた場合、この移送路を遮断した
状態で有機物蒸着室および金属蒸着室の圧力差を5×1
-4Pa以下にした後、基板を有機物蒸着室から移送路
を通じて金属蒸着室に搬送することが望ましい。
When the organic vapor deposition chamber and the metal vapor deposition chamber are communicated with each other via a transfer path, the pressure difference between the organic vapor deposition chamber and the metal vapor deposition chamber is reduced by 5 × 1 with the transfer path being shut off.
After reducing the pressure to 0 -4 Pa or less, it is desirable to transfer the substrate from the organic substance deposition chamber to the metal deposition chamber through a transfer path.

【0009】このようにすれば、金属の加熱によって金
属蒸着室に脱ガスが発生して金属蒸着室が有機物蒸着室
より高圧になっても、有機物蒸着室および金属蒸着室の
圧力差を5×10-4Pa以下にしてから基板を搬送する
ので、基板の搬送時に金属蒸着室内の脱ガスや金属の蒸
発物が有機物蒸着室に流入することがなくなり、脱ガス
等が有機物層に混入するのを確実に防止できる。
With this configuration, even if degassing occurs in the metal deposition chamber due to heating of the metal and the pressure of the metal deposition chamber becomes higher than that of the organic deposition chamber, the pressure difference between the organic deposition chamber and the metal deposition chamber is reduced by 5 ×. Since the substrate is transported after the pressure is reduced to 10 −4 Pa or less, degassing in the metal deposition chamber and evaporation of metal do not flow into the organic deposition chamber when the substrate is transported. Can be reliably prevented.

【0010】或いは、複数の真空室が有機物蒸着室およ
び金属蒸着室の間に設けられた移送室を含む場合、有機
物蒸着室および移送室の圧力差を5×10-4Pa以下に
した後、基板を有機物蒸着室から移送室に搬送し、移送
室および金属蒸着室の圧力差を5×10-4Pa以下にし
た後、基板を移送室から金属蒸着室に搬送することが望
ましい。
Alternatively, when the plurality of vacuum chambers include a transfer chamber provided between the organic deposition chamber and the metal deposition chamber, after the pressure difference between the organic deposition chamber and the transfer chamber is reduced to 5 × 10 −4 Pa or less, It is desirable that the substrate be transported from the organic deposition chamber to the transfer chamber, the pressure difference between the transport chamber and the metal deposition chamber be reduced to 5 × 10 −4 Pa or less, and then the substrate be transported from the transport chamber to the metal deposition chamber.

【0011】このようにすると、有機物蒸着室および移
送室、移送室および金属蒸着室において、それぞれ互い
の蒸発物等の流入を防止できるので、各室の汚染を低減
できる。また、万一、蒸発物等が有機物蒸着室または金
属蒸着室から流出しても、移送室に流入して直接他の蒸
着室に流入しないから、流出した蒸発物等が他の蒸着室
での蒸着時に膜に混入するのを一層確実に防止できる。
[0011] In this case, since the inflow of vaporized substances and the like can be prevented from flowing into the organic substance deposition chamber, the transfer chamber, the transfer chamber, and the metal deposition chamber, contamination of each chamber can be reduced. Also, even if the evaporant or the like flows out of the organic substance evaporation chamber or the metal evaporation chamber, it flows into the transfer chamber and does not directly flow into the other evaporation chamber. Mixing into the film at the time of vapor deposition can be prevented more reliably.

【0012】一方、本発明の有機エレクトロルミネッセ
ンス素子の製造装置は、基板上に有機物層の蒸着を行う
有機物蒸着室と、この有機物蒸着室に第一開閉手段を介
して連通可能に接続された移送室と、この移送室に第二
開閉手段を介して連通可能に接続されかつ基板上に電極
の蒸着を行う金属蒸着室と、有機物蒸着室と移送室との
圧力差および移送室と金属蒸着室との圧力差をそれぞれ
5×10-4Pa以下にするための圧力調整手段とを備え
たことを特徴とする。
On the other hand, the apparatus for manufacturing an organic electroluminescence element of the present invention comprises an organic deposition chamber for depositing an organic layer on a substrate, and a transfer connected to the organic deposition chamber via first opening / closing means. Chamber, a metal vapor deposition chamber communicably connected to the transfer chamber via a second opening / closing means, and for vapor deposition of an electrode on the substrate; a pressure difference between the organic substance vapor deposition chamber and the transfer chamber; and a transfer chamber and a metal vapor deposition chamber. And pressure adjusting means for reducing the pressure difference between the pressure and the pressure to 5 × 10 −4 Pa or less, respectively.

【0013】本発明においては、有機物蒸着室および移
送室間で基板を搬送する場合や、移送室および金属蒸着
室間で基板を搬送する場合に、圧力調整手段によって、
有機物蒸着室と移送室との圧力差および移送室と金属蒸
着室との圧力差をそれぞれ5×10-4Pa以下に低減で
きるから、第一、第二開閉手段によって各室を連通させ
ても、各室相互で蒸発物や不純物がほとんど流入するこ
となく平衡状態に達する。従って、各蒸着室における蒸
着の際に他の蒸着室の蒸発物等が膜に混入することがな
くなるため、各真空室において純度の高い膜を形成でき
るから、優れた素子性能を確保できる。
In the present invention, when a substrate is transported between the organic deposition chamber and the transfer chamber, or when the substrate is transported between the transfer chamber and the metal deposition chamber, the pressure adjusting means is used.
Since the pressure difference between the organic material deposition chamber and the transfer chamber and the pressure difference between the transfer chamber and the metal deposition chamber can each be reduced to 5 × 10 −4 Pa or less, even if the first and second opening / closing means allow the respective chambers to communicate with each other. In each chamber, an equilibrium state is reached with little inflow of evaporates and impurities. Therefore, during the vapor deposition in each vapor deposition chamber, evaporated substances and the like in other vapor deposition chambers do not mix into the film, and a film with high purity can be formed in each vacuum chamber, so that excellent element performance can be secured.

【0014】前述した圧力調整手段は、有機物蒸着室、
移送室および金属蒸着室の排気を行う排気手段を含むこ
とが望ましい。このようにすれば、各室を排気すること
により圧力差を減少させるので、各蒸着室の圧力を比較
的低く維持できるから、有機物蒸着室および金属蒸着室
で蒸着を行う際に、各室の圧力を成膜に適した圧力に容
易に調整できる。
The above-described pressure adjusting means includes an organic substance deposition chamber,
It is desirable to include exhaust means for exhausting the transfer chamber and the metal deposition chamber. By doing so, the pressure difference is reduced by evacuating each chamber, so that the pressure in each vapor deposition chamber can be kept relatively low. The pressure can be easily adjusted to a pressure suitable for film formation.

【0015】[0015]

【発明の実施の形態】BEST MODE FOR CARRYING OUT THE INVENTION

〔第一実施形態〕以下、本発明の第一実施形態を図面に
基づいて説明する。図1には、本実施形態の有機EL素
子1が示されている。この素子1は、基板11と、この
基板11上に成膜されたITO膜からなる透明電極(陽
極)12と、この透明電極12上に成膜された有機物層
としての発光層13と、この発光層13上に成膜された
対向電極(陰極)14とを備えている。
[First Embodiment] Hereinafter, a first embodiment of the present invention will be described with reference to the drawings. FIG. 1 shows an organic EL device 1 of the present embodiment. The element 1 includes a substrate 11, a transparent electrode (anode) 12 made of an ITO film formed on the substrate 11, a light emitting layer 13 as an organic material layer formed on the transparent electrode 12, and And a counter electrode (cathode) 14 formed on the light emitting layer 13.

【0016】このような有機EL素子1は、図2に示す
ような製造装置2を用いて製造される。本実施形態の有
機EL素子の製造装置2は、基板11の表面に透明電極
12を形成した電極付基板15(図1参照)に対して成
膜を行う装置であり、陽極形成装置は含まない。この装
置2は、有機物蒸着室21と、この有機物蒸着室21に
接続された移送室22と、この移送室22に接続された
金属蒸着室23と、有機物蒸着室21および移送室22
の圧力差、移送室22および金属蒸着室23の圧力差を
それぞれ5×10-4Pa以下にするための圧力調整手段
33,43,53とを有して構成されている。
Such an organic EL device 1 is manufactured using a manufacturing apparatus 2 as shown in FIG. The organic EL device manufacturing apparatus 2 of the present embodiment is an apparatus for forming a film on the electrode-attached substrate 15 (see FIG. 1) having the transparent electrode 12 formed on the surface of the substrate 11, and does not include an anode forming apparatus. . The apparatus 2 includes an organic substance deposition chamber 21, a transfer chamber 22 connected to the organic substance deposition chamber 21, a metal deposition chamber 23 connected to the transfer chamber 22, an organic substance deposition chamber 21 and a transfer chamber 22.
, And pressure adjusting means 33, 43, 53 for reducing the pressure difference between the transfer chamber 22 and the metal deposition chamber 23 to 5 × 10 −4 Pa or less, respectively.

【0017】有機物蒸着室21は、電極付基板15上、
具体的には透明電極12(図1参照)上に発光層13の
蒸着を行う真空室であり、電極付基板15を保持するた
めの基板ホルダ31と、発光層13を構成する蒸着材料
を加熱して蒸発させる蒸着源32とを備えている。蒸着
源32は、蒸着材料をるつぼ321に入れて蒸発させる
抵抗加熱式の蒸着源であり、るつぼ321の上方に蒸発
物を遮断するためのシャッタ322を備えている。ま
た、有機物蒸着室21は、室内の排気を行う圧力調整手
段としての排気手段33を有し、この排気手段33は、
真空ポンプを含む真空排気系により構成されている。
The organic substance deposition chamber 21 is provided on the substrate 15 with electrodes.
Specifically, this is a vacuum chamber in which the light emitting layer 13 is deposited on the transparent electrode 12 (see FIG. 1), and a substrate holder 31 for holding the electrode-attached substrate 15 and a vapor deposition material forming the light emitting layer 13 are heated. And a vapor deposition source 32 for evaporating. The vapor deposition source 32 is a resistance heating type vapor deposition source for evaporating a vapor deposition material in a crucible 321, and has a shutter 322 above the crucible 321 to shut off evaporant. Further, the organic substance deposition chamber 21 has an exhaust unit 33 as a pressure adjusting unit for exhausting the room, and the exhaust unit 33 is
It is constituted by a vacuum exhaust system including a vacuum pump.

【0018】この有機物蒸着室21には、圧力調整手段
としての排気手段(図示省略)を備えた真空室であるロ
ードロック室34が付設されている。ロードロック室3
4と有機物蒸着室21とはバルブ35を介して互いに連
通可能に接続され、このロードロック室34を介して基
板15を有機物蒸着室21に搬入することにより、有機
物蒸着室21を大気中に開放することなく電極付基板1
5の搬入を行えるようになっている。ロードロック室3
4は、電極付基板15を保持する基板ホルダ36および
電極付基板15を室34内に搬入するための搬入口37
を備え、この搬入口37には開閉用のバルブ38が設け
られている。
The organic vapor deposition chamber 21 is provided with a load lock chamber 34 which is a vacuum chamber provided with an exhaust means (not shown) as a pressure adjusting means. Load lock room 3
The organic vapor deposition chamber 21 is open to the atmosphere by loading the substrate 15 into the organic vapor deposition chamber 21 via the load lock chamber 34. Substrate 1 without electrode
5 can be loaded. Load lock room 3
Reference numeral 4 denotes a substrate holder 36 for holding the substrate 15 with electrodes and a carry-in port 37 for carrying the substrate 15 with electrodes into the chamber 34.
The carry-in port 37 is provided with a valve 38 for opening and closing.

【0019】有機物蒸着室21は第一開閉手段である第
一バルブ24を介して移送室22に連通し、この第一バ
ルブ24を閉塞することにより有機物蒸着室21および
移送室22を遮断できるようになっている。移送室22
は、電極付基板15を待機させるための真空室であり、
有機物蒸着室21の基板ホルダ31および排気手段33
と同様な基板ホルダ41および圧力調整手段としての排
気手段43を備えている。
The organic vapor deposition chamber 21 communicates with the transfer chamber 22 through a first valve 24 which is a first opening / closing means. By closing the first valve 24, the organic vapor deposition chamber 21 and the transfer chamber 22 can be shut off. It has become. Transfer room 22
Is a vacuum chamber for holding the substrate 15 with electrodes,
Substrate holder 31 and evacuation means 33 of organic substance deposition chamber 21
And a gas exhaust unit 43 as a pressure adjusting unit.

【0020】この移送室22は第二開閉手段である第二
バルブ25を介して金属蒸着室23と連通し、この第二
バルブ25を閉塞することにより移送室22および金属
蒸着室23を遮断できるようになっている。金属蒸着室
23は、電極付基板15上、具体的には、発光層13
(図1参照)上に対向電極14を蒸着するための真空室
であり、基板ホルダ51と、対向電極14を構成する金
属を加熱して蒸発させる蒸着源52とを備えている。蒸
着源52は、金属をるつぼ521に入れて蒸発させる抵
抗加熱式の蒸着源であり、るつぼ521の上方にシャッ
タ522を備えている。この金属蒸着室23も、有機物
蒸着室21と同様に、圧力調整手段としての排気手段5
3を備えている。
The transfer chamber 22 communicates with a metal deposition chamber 23 via a second valve 25 serving as a second opening / closing means. By closing the second valve 25, the transfer chamber 22 and the metal deposition chamber 23 can be shut off. It has become. The metal deposition chamber 23 is provided on the substrate 15 with electrodes, specifically, the light emitting layer 13.
A vacuum chamber for vapor-depositing the counter electrode 14 thereon (see FIG. 1). The vacuum chamber includes a substrate holder 51 and a vapor source 52 for heating and evaporating the metal constituting the counter electrode 14. The vapor deposition source 52 is a resistance heating type vapor deposition source for evaporating metal in a crucible 521, and includes a shutter 522 above the crucible 521. The metal vapor deposition chamber 23 is also provided with an exhaust means 5 as a pressure adjusting means similarly to the organic substance vapor deposition chamber 21.
3 is provided.

【0021】この金属蒸着室23には、圧力調整手段で
ある排気手段(図示省略)を備えた真空室としてのロー
ドロック室54が付設されている。このロードロック室
54と金属蒸着室23とはバルブ55を介して互いに連
通可能に接続され、これにより、金属蒸着室23を大気
中に開放することなく電極付基板15を搬出できるよう
になっている。ロードロック室54は、基板ホルダ56
および電極付基板15を室54内から搬出するための搬
出口57を備え、この搬出口57には開閉用のバルブ5
8が設けられている。
The metal deposition chamber 23 is provided with a load lock chamber 54 as a vacuum chamber having an exhaust means (not shown) as a pressure adjusting means. The load lock chamber 54 and the metal deposition chamber 23 are communicably connected to each other via a valve 55, so that the substrate 15 with electrodes can be carried out without opening the metal deposition chamber 23 to the atmosphere. I have. The load lock chamber 54 includes a substrate holder 56.
And an outlet 57 for unloading the electrode-attached substrate 15 from the chamber 54. The outlet 57 is provided with a valve 5 for opening and closing.
8 are provided.

【0022】このような装置2では、各室21,22,
23,34,54内にそれぞれ搬送系26(移送室22
およびロードロック室34,54の各搬送系は図示省
略)が配設され、これらの搬送系26により、各室3
4,21,22,23,54を大気中に開放することな
く電極付基板15を移送して各室21,22,23,3
4,54の基板ホルダ36,31,41,51,56に
セットできるようになっている。なお、この搬送系26
は、例えば、ベルト式のもの或いはトレイ式のものであ
ってもよく、さらには、電極付基板15を保持して移動
させるアームを備えたロボットであってもよい。
In such an apparatus 2, each of the chambers 21, 22, 22
Each of the transfer systems 26 (the transfer chamber 22)
And the transport systems of the load lock chambers 34 and 54 are not shown).
The substrate 15 with electrodes is transferred without opening the 4, 21, 22, 23, 54 to the atmosphere and the chambers 21, 22, 23, 3
4, 54 can be set on the substrate holders 36, 31, 41, 51, 56. The transfer system 26
May be, for example, a belt type or a tray type, or may be a robot provided with an arm for holding and moving the substrate 15 with electrodes.

【0023】次に、本実施形態の製造装置2を用いて有
機EL素子1を製造する方法について説明する。本実施
形態では、電極付基板15を各室34,21,22,2
3,54に搬送しながら有機物蒸着室21および金属蒸
着室23においてそれぞれ発光層13および対向電極1
4を成膜する。すなわち、基板11上に透明電極12を
成膜した電極付基板15を用意し、この電極付基板15
を超音波洗浄およびUVオゾン洗浄等により予め洗浄し
ておく。また、有機物蒸着室21、移送室22、金属蒸
着室23およびロードロック室54を各排気手段33,
43,53によって所定圧力になるまで排気しておく。
有機物蒸着室21および金属蒸着室23内の圧力がそれ
ぞれ所定圧力になったら、各々蒸着源32,52を加熱
して所定の成膜速度が得られるように加熱状態を制御す
る。なお、蒸着源32,52の加熱は、各シャッタ32
2,522を閉塞した状態で行う。
Next, a method for manufacturing the organic EL element 1 using the manufacturing apparatus 2 of the present embodiment will be described. In the present embodiment, the substrate 15 with electrodes is divided into the chambers 34, 21, 22, 2, and 2.
3 and 54, the light emitting layer 13 and the counter electrode 1 in the organic deposition chamber 21 and the metal deposition chamber 23, respectively.
4 is formed. That is, an electrode-attached substrate 15 in which the transparent electrode 12 is formed on the substrate 11 is prepared, and the electrode-attached substrate 15 is prepared.
Is previously cleaned by ultrasonic cleaning, UV ozone cleaning, or the like. Further, the organic material evaporation chamber 21, the transfer chamber 22, the metal evaporation chamber 23, and the load lock chamber 54 are connected to the respective exhaust means 33,
Air is exhausted until a predetermined pressure is reached by 43 and 53.
When the pressures in the organic vapor deposition chamber 21 and the metal vapor deposition chamber 23 reach a predetermined pressure, the vaporization sources 32 and 52 are heated to control the heating state so that a predetermined film forming rate is obtained. The heating of the evaporation sources 32 and 52 is performed by the shutters 32 and
2, 522 is closed.

【0024】次いで、ロードロック室34のバルブ38
を開放し、洗浄した電極付基板15を搬入口37からロ
ードロック室34内に搬入して基板ホルダ36に取り付
けて、バルブ38を閉める。この後、図示しない排気手
段により、ロードロック室34と有機物蒸着室21との
圧力差が5×10-4Pa以下になるまでロードロック室
34の排気を行う。
Next, the valve 38 of the load lock chamber 34
Is opened, the cleaned substrate 15 with electrodes is carried into the load lock chamber 34 from the carry-in port 37, attached to the substrate holder 36, and the valve 38 is closed. Thereafter, the load lock chamber 34 is evacuated by a not-shown exhaust means until the pressure difference between the load lock chamber 34 and the organic substance deposition chamber 21 becomes 5 × 10 −4 Pa or less.

【0025】続いて、ロードロック室34と有機物蒸着
室21の間のバルブ35を開ける。すると、各室34,
21間の圧力差が5×10-4Pa以下にされているた
め、各室34,21内の蒸発物や不純物が互いにほとん
ど流入することなく二室34,21の圧力が平衡状態に
なる。この後、各室34,21の搬送系26によって、
電極付基板15をロードロック室34から有機物蒸着室
21内に搬送し、透明電極12(図1参照)側の面を蒸
着源32側に向けて基板ホルダ31に保持させる。基板
15をセットした後、バルブ35を閉めて有機物蒸着室
21を密閉し、室21内の圧力を成膜に適した圧力にな
るように調整してから、シャッタ322を開放して基板
15の透明電極12上に発光層13を蒸着する。所定の
膜厚が得られたら再びシャッタ322を閉塞して成膜を
終了する。
Subsequently, the valve 35 between the load lock chamber 34 and the organic substance deposition chamber 21 is opened. Then, each room 34,
Since the pressure difference between the two chambers 21 is set to 5 × 10 −4 Pa or less, the pressure in the two chambers 34 and 21 is in an equilibrium state with almost no evaporant and impurities in each of the chambers 34 and 21 flowing into each other. Thereafter, the transfer system 26 in each of the chambers 34 and 21 provides
The substrate 15 with electrodes is transported from the load lock chamber 34 into the organic vapor deposition chamber 21, and is held by the substrate holder 31 with the transparent electrode 12 (see FIG. 1) side facing the vapor deposition source 32. After the substrate 15 is set, the valve 35 is closed to close the organic substance deposition chamber 21, the pressure in the chamber 21 is adjusted to a pressure suitable for film formation, and then the shutter 322 is opened to release the substrate 15. The light emitting layer 13 is deposited on the transparent electrode 12. When a predetermined film thickness is obtained, the shutter 322 is closed again to terminate the film formation.

【0026】この後、有機物蒸着室21および移送室2
2の圧力差を修正して5×10-4Pa以下にする。具体
的には、有機物蒸着室21が移送室22よりも高圧にな
っている場合には、排気手段33によって有機物蒸着室
21の圧力を下げる。或いは、移送室22が有機物蒸着
室21よりも高圧になっている場合には、排気手段43
によって移送室22の圧力を下げる。
Thereafter, the organic substance deposition chamber 21 and the transfer chamber 2
The pressure difference of 2 is corrected to 5 × 10 −4 Pa or less. Specifically, when the pressure of the organic substance deposition chamber 21 is higher than that of the transfer chamber 22, the pressure of the organic substance deposition chamber 21 is reduced by the exhaust unit 33. Alternatively, when the transfer chamber 22 has a higher pressure than the organic substance deposition chamber 21,
Thereby, the pressure in the transfer chamber 22 is reduced.

【0027】そして、有機物蒸着室21および移送室2
2の圧力差が5×10-4Pa以下の状態で、第一バルブ
24を開ける。すると、各室21,22内の蒸発物や不
純物が互いにほとんど流入することなく二室21,22
の圧力が平衡状態に達する。続いて、各室21,22の
搬送系26により、電極付基板15を有機物蒸着室21
から移送室22に移送して基板ホルダ41に保持させ
て、第一バルブ24を閉める。
Then, the organic substance deposition chamber 21 and the transfer chamber 2
The first valve 24 is opened in a state where the pressure difference of No. 2 is 5 × 10 −4 Pa or less. Then, the evaporants and impurities in each of the chambers 21 and 22 hardly flow into each other and the two chambers 21 and 22
Pressure reaches equilibrium. Subsequently, the substrate with electrodes 15 is moved by the transfer system 26 in each of the chambers 21 and 22 to the organic substance evaporation chamber 21.
Is transferred to the transfer chamber 22, and is held by the substrate holder 41, and the first valve 24 is closed.

【0028】この後、前述した有機物蒸着室21および
移送室22の圧力差を修正したときと同様に、排気手段
43,53を用いて移送室22および金属蒸着室23の
圧力差を5×10-4Pa以下にする。
After that, the pressure difference between the transfer chamber 22 and the metal deposition chamber 23 is reduced to 5 × 10 by using the exhaust means 43 and 53 in the same manner as when the pressure difference between the organic deposition chamber 21 and the transfer chamber 22 is corrected. -4 Pa or less.

【0029】次いで、移送室22および金属蒸着室23
の圧力差が5×10-4Pa以下の状態で、第二バルブ2
5を開ける。すると、各室22,23内の蒸発物や不純
物が互いにほとんど流入することなく二室22,23の
圧力が平衡状態に達する。続いて、各室22,23の搬
送系26により、電極付基板15を移送室22から金属
蒸着室23に移送して基板ホルダ51に保持させ、第二
バルブ25を閉めて金属蒸着室23を密閉する。この
後、金属蒸着室23の圧力を成膜に適した圧力になるよ
うに調整し、シャッタ522を開放して基板15の発光
層13上に金属を蒸着して対向電極14を成膜する。所
定の膜厚が得られたら再びシャッタ522を閉塞して成
膜を終了する。
Next, the transfer chamber 22 and the metal deposition chamber 23
The second valve 2 with a pressure difference of 5 × 10 −4 Pa or less
Open 5 Then, the pressure in the two chambers 22 and 23 reaches an equilibrium state with almost no evaporant and impurities in the chambers 22 and 23 flowing into each other. Subsequently, the substrate with electrodes 15 is transferred from the transfer chamber 22 to the metal deposition chamber 23 by the transfer system 26 of each of the chambers 22 and 23 and held by the substrate holder 51, and the second valve 25 is closed to close the metal deposition chamber 23. Seal tightly. Thereafter, the pressure in the metal deposition chamber 23 is adjusted to a pressure suitable for film formation, the shutter 522 is opened, and metal is deposited on the light emitting layer 13 of the substrate 15 to form the counter electrode 14. When a predetermined film thickness is obtained, the shutter 522 is closed again to terminate the film formation.

【0030】次いで、前述した有機物蒸着室21および
移送室22の圧力差を修正したときと同様に、排気手段
53およびロードロック室54の排気手段(図示省略)
を用いて金属蒸着室23およびロードロック室54の圧
力差を5×10-4Pa以下にする。続いて、金属蒸着室
23とロードロック室54との間のバルブ55を開け
る。すると、各室23,54内の蒸発物や不純物が互い
にほとんど流入することなく二室23,54の圧力が平
衡状態に達する。そして、各室23,54の搬送系26
によって、電極付基板15を金属蒸着室23からロード
ロック室54に搬送して基板ホルダ56に保持させ、バ
ルブ55を閉める。この後、ロードロック室54のバル
ブ58を開けて、発光層13および対向電極14を成膜
した基板15、つまり有機EL素子1を搬出口57から
取り出す。
Next, similarly to the case where the pressure difference between the organic substance deposition chamber 21 and the transfer chamber 22 is corrected, the exhaust means 53 and the exhaust means of the load lock chamber 54 (not shown).
To make the pressure difference between the metal deposition chamber 23 and the load lock chamber 54 5 × 10 −4 Pa or less. Subsequently, the valve 55 between the metal deposition chamber 23 and the load lock chamber 54 is opened. Then, the pressures in the two chambers 23 and 54 reach an equilibrium state with almost no evaporant and impurities in the chambers 23 and 54 flowing into each other. And the transport system 26 of each chamber 23, 54
Thus, the substrate with electrodes 15 is transferred from the metal deposition chamber 23 to the load lock chamber 54 and held by the substrate holder 56, and the valve 55 is closed. Thereafter, the valve 58 of the load lock chamber 54 is opened, and the substrate 15 on which the light emitting layer 13 and the counter electrode 14 are formed, that is, the organic EL element 1 is taken out from the carry-out port 57.

【0031】このような本実施形態によれば、以下のよ
うな効果がある。すなわち、ロードロック室34および
有機物蒸着室21間の圧力差、有機物蒸着室21および
移送室22間の圧力差、移送室22および金属蒸着室2
3間の圧力差、金属蒸着室23およびロードロック室5
4間の圧力差が、それぞれ5×10-4Pa以下の状態
で、電極付基板15の各室34,21,22,23,5
4間の搬送を行うので、基板15の搬送時にこれらの真
空室34,21,22,23,54を互いに連通させて
も、各真空室34,21,22,23,54内の蒸発物
や不純物がほとんど相互に流入することなく平衡状態に
達する。従って、有機物蒸着室21および金属蒸着室2
3に、他の蒸着室23,21内の蒸発物やロードロック
室34,54および移送室22内の不純物が流入するの
を防止できるため、各蒸着室21,23における蒸着の
際に他の真空室の蒸発物や不純物が膜に混入することが
なくなり、各蒸着室21,23において純度の高い膜を
形成できるから、優れた素子性能を確保できる。
According to this embodiment, the following effects can be obtained. That is, the pressure difference between the load lock chamber 34 and the organic deposition chamber 21, the pressure difference between the organic deposition chamber 21 and the transfer chamber 22, the transfer chamber 22 and the metal deposition chamber 2
3, the metal deposition chamber 23 and the load lock chamber 5
The pressure difference between the 4, at 5 × 10 -4 Pa or less each state, each chamber of the electrode with the substrate 15 34,21,22,23,5
Since the transfer between the vacuum chambers 34, 21, 22, 23, and 54 is carried out when the substrate 15 is transferred, even if the vacuum chambers 34, 21, 22, 23, and 54 communicate with each other, the vaporized material in each of the vacuum chambers 34, 21, 22, 23, and 54 is removed. Equilibrium is reached with almost no impurities flowing into each other. Therefore, the organic substance deposition chamber 21 and the metal deposition chamber 2
3 can be prevented from flowing into the evaporation chambers 23, 21 and impurities in the load lock chambers 34, 54 and the transfer chamber 22. Evaporates and impurities in the vacuum chamber are not mixed into the film, and a high-purity film can be formed in each of the vapor deposition chambers 21 and 23. Therefore, excellent element performance can be secured.

【0032】とくに、有機物蒸着室21および移送室2
2の圧力差を5×10-4Pa以下にした後、基板15を
有機物蒸着室21から移送室22に搬送し、移送室22
および金属蒸着室23の圧力差を5×10-4Pa以下に
した後、基板15を移送室22から金属蒸着室23に搬
送するので、有機物蒸着室21および移送室22、移送
室22および金属蒸着室23において、それぞれ互いの
蒸発物や不純物の流入を防止できるので、各室21〜2
3の汚染を低減できる。また、万一、蒸発物が有機物蒸
着室21または金属蒸着室23から流出しても移送室2
2に流入するため、直接互いの蒸着室23,21に流入
しないので、流出した蒸発物による汚染を一層確実に防
止できる。
In particular, the organic substance deposition chamber 21 and the transfer chamber 2
After the pressure difference between the two below 5 × 10 -4 Pa, and conveyed to the transfer chamber 22 the substrate 15 from the organic vapor deposition chamber 21, transfer chamber 22
After the pressure difference between the metal vapor deposition chamber 23 and the metal vapor deposition chamber 23 is reduced to 5 × 10 −4 Pa or less, the substrate 15 is transported from the transport chamber 22 to the metal vapor deposition chamber 23. Therefore, the organic substance vapor deposition chamber 21 and the transport chamber 22, the transport chamber 22, and the metal In the vapor deposition chamber 23, it is possible to prevent the inflow of the evaporated substances and impurities from each other.
3 can be reduced. Also, even if the evaporant flows out of the organic evaporation chamber 21 or the metal evaporation chamber 23, the transfer chamber 2
2 and does not directly flow into the vapor deposition chambers 23 and 21, so that the contamination due to the evaporate that has flowed out can be more reliably prevented.

【0033】また、金属の加熱により発生した金属蒸着
室23内の脱ガスや金属の蒸発物が、電極付基板15の
搬送時に有機物蒸着室21に流入することがなくなるの
で、脱ガス等が発光層13に混入するのを確実に防止で
きる。
In addition, degassing in the metal deposition chamber 23 generated by heating of the metal and evaporation of the metal do not flow into the organic deposition chamber 21 when the substrate 15 with electrodes is conveyed. Mixing into the layer 13 can be reliably prevented.

【0034】さらに、本実施形態の製造装置2では、各
室34,21,22,23,54にそれぞれ排気手段3
3,43,53が設けられているため、各室34,2
1,22,23,54の圧力差をそれぞれ確実に5×1
-4Pa以下にすることができる。
Further, in the manufacturing apparatus 2 of this embodiment, the exhaust means 3 is provided in each of the chambers 34, 21, 22, 23 and 54, respectively.
3, 43, 53 are provided, so that each room 34, 2
Ensure that the pressure difference between 1, 22, 23 and 54 is 5 × 1
It can be 0 -4 Pa or less.

【0035】また、圧力調整手段を排気手段33,4
3,53により構成したので、基板15を搬送する二室
のいずれか高圧な室を排気することにより二室の圧力差
を減少させることができる。従って、圧力差の修正によ
って、有機物蒸着室21および金属蒸着室23の圧力を
比較的低い圧力に維持できるから、成膜の際に各蒸着室
21,23の圧力をそれぞれ発光層13および対向電極
14の成膜に適した圧力に容易に調整できる。
Further, the pressure adjusting means is replaced by the exhaust means 33, 4
Since the pressure chambers 3 and 53 are used, the pressure difference between the two chambers can be reduced by exhausting one of the two chambers for transporting the substrate 15 which has a high pressure. Therefore, by correcting the pressure difference, the pressures in the organic vapor deposition chamber 21 and the metal vapor deposition chamber 23 can be maintained at relatively low pressures. 14 can be easily adjusted to a pressure suitable for film formation.

【0036】〔第二実施形態〕図3に示す本実施形態の
有機EL素子1の製造装置3は、前記第一実施形態の真
空室としての移送室22を省略したものであり、図2と
同一部分には同一符号を付して詳しい説明は省略し、以
下には異なる部分のみを詳述する。本実施形態の製造装
置3の有機物蒸着室21および金属蒸着室23は、移送
路27を介して連通している。この移送路27の中間部
分には開閉バルブ28が設けられ、この開閉バルブ28
を閉めることにより有機物蒸着室21および金属蒸着室
23を遮断できるようになっている。
[Second Embodiment] A manufacturing apparatus 3 for an organic EL device 1 according to the present embodiment shown in FIG. 3 omits the transfer chamber 22 as a vacuum chamber of the first embodiment. The same portions are denoted by the same reference numerals, and detailed description thereof will be omitted. Only different portions will be described below in detail. The organic vapor deposition chamber 21 and the metal vapor deposition chamber 23 of the manufacturing apparatus 3 according to the present embodiment communicate with each other via a transfer path 27. An opening / closing valve 28 is provided at an intermediate portion of the transfer path 27.
By closing, the organic substance vapor deposition chamber 21 and the metal vapor deposition chamber 23 can be shut off.

【0037】本実施形態の装置3では、開閉バルブ28
を閉めて移送路27を遮断した状態で、前記第一実施形
態と同様にして電極付基板15に発光層13を蒸着す
る。この後、各蒸着室21,23の排気手段33,53
によって、有機物蒸着室21および金属蒸着室23の圧
力差を修正して5×10-4Pa以下にする。具体的に
は、有機物蒸着室21が金属蒸着室23よりも高圧にな
っている場合には、排気手段33によって有機物蒸着室
21の圧力を下げる。或いは、金属蒸着室23が有機物
蒸着室21よりも高圧になっている場合には、排気手段
53によって金属蒸着室23の圧力を下げる。
In the device 3 of this embodiment, the open / close valve 28
The light emitting layer 13 is vapor-deposited on the electrode-attached substrate 15 in the same manner as in the first embodiment in a state where is closed and the transfer path 27 is shut off. Thereafter, the exhaust means 33, 53 of each of the vapor deposition chambers 21, 23 are provided.
Thus, the pressure difference between the organic vapor deposition chamber 21 and the metal vapor deposition chamber 23 is corrected to 5 × 10 −4 Pa or less. Specifically, when the pressure in the organic vapor deposition chamber 21 is higher than that in the metal vapor deposition chamber 23, the pressure in the organic vapor deposition chamber 21 is reduced by the exhaust unit 33. Alternatively, when the pressure of the metal deposition chamber 23 is higher than that of the organic deposition chamber 21, the pressure of the metal deposition chamber 23 is reduced by the exhaust unit 53.

【0038】そして、これらの蒸着室21,23間の圧
力差が5×10-4Pa以下の状態で、開閉バルブ28を
開けて有機物蒸着室21および金属蒸着室23を連通さ
せる。すると、各蒸着室21,23内の蒸発物や不純物
が互いにほとんど流入することなく各室21,23の圧
力が平衡状態に達する。続いて、各蒸着室21,23搬
送系26によって、電極付基板15を有機物蒸着室21
から移送路27を通じて金属蒸着室23に搬送し、基板
ホルダ51にセットする。この後、前記第一実施形態と
同様にして対向電極14を成膜して有機EL素子1を得
る。このような本実施形態によれば、前記第一実施形態
と同様な作用、効果を奏することができる。
When the pressure difference between the vapor deposition chambers 21 and 23 is 5 × 10 −4 Pa or less, the open / close valve 28 is opened to communicate the organic vapor deposition chamber 21 and the metal vapor deposition chamber 23. Then, the pressure in each of the chambers 21 and 23 reaches an equilibrium state with almost no evaporant and impurities in the evaporation chambers 21 and 23 flowing into each other. Subsequently, the substrates 15 with electrodes are moved by the respective vapor deposition chambers 21 and 23 to the organic vapor deposition chamber 21.
Is transferred to the metal deposition chamber 23 through the transfer path 27 and set on the substrate holder 51. Then, the organic EL element 1 is obtained by forming the counter electrode 14 in the same manner as in the first embodiment. According to this embodiment, the same operation and effect as those of the first embodiment can be obtained.

【0039】なお、本発明は前記各実施形態に限定され
るものではなく、本発明の目的を達成できる他の構成等
を含み、以下に示すような変形なども本発明に含まれ
る。すなわち、前記各実施形態では、電極付基板15を
各蒸着室21,23に搬入する前に蒸着源32,52を
加熱しておいたが、基板15を搬入してから蒸着源3
2,52を加熱してもよい。また、本発明は、前記各実
施形態の構造の有機EL素子1に限定されず、例えば、
透明電極および発光層の間に有機物層である正孔注入層
を介装した構造の有機EL素子、或いは、発光層および
対向電極の間には有機物層である電子注入層を介装した
有機EL素子等、各種の有機EL素子に適用できる。
It should be noted that the present invention is not limited to the above embodiments, but includes other configurations that can achieve the object of the present invention, and also includes the following modifications. That is, in each of the above-described embodiments, the vapor deposition sources 32 and 52 are heated before the substrate with electrodes 15 is carried into each of the vapor deposition chambers 21 and 23.
2, 52 may be heated. Further, the present invention is not limited to the organic EL element 1 having the structure of each of the above embodiments.
An organic EL device having a structure in which a hole injection layer as an organic material layer is interposed between a transparent electrode and a light emitting layer, or an organic EL device in which an electron injection layer as an organic material layer is interposed between a light emitting layer and a counter electrode. It can be applied to various organic EL devices such as devices.

【0040】[0040]

【発明の効果】以上に述べたように、本発明の方法によ
れば、基板を配置した真空室とこの真空室に隣接した真
空室との圧力差が5×10-4Pa以下の状態で基板を隣
接した真空室に搬送するため、基板の搬送時にこれらの
真空室を互いに連通させても、各真空室内の蒸発物や不
純物が相互にほとんど流入することなく二室の圧力が平
衡状態に達する。従って、有機物蒸着室および金属蒸着
室における蒸着の際に他の真空室の蒸発物や不純物が膜
に混入することがなくなり、各蒸着室において純度の高
い膜を形成できるから、優れた素子性能を確保できる。
As described above, according to the method of the present invention, the pressure difference between the vacuum chamber in which the substrate is disposed and the vacuum chamber adjacent to the vacuum chamber is 5 × 10 −4 Pa or less. Since the substrates are transferred to adjacent vacuum chambers, even when these vacuum chambers are connected to each other when transferring the substrates, the pressure in the two chambers is in an equilibrium state with little evaporation or impurities in each vacuum chamber flowing into each other. Reach. Therefore, during evaporation in the organic vapor deposition chamber and the metal vapor deposition chamber, evaporated materials and impurities in other vacuum chambers do not enter the film, and a film with high purity can be formed in each vapor deposition chamber, so that excellent element performance can be obtained. Can be secured.

【0041】また、本発明の装置によると、有機物蒸着
室と移送室との圧力差および移送室と金属蒸着室との圧
力差をそれぞれ5×10-4Pa以下にするための圧力調
整手段とを備えているため、有機物蒸着室および移送室
間で基板を搬送する場合や、移送室および金属蒸着室間
で基板を搬送する場合に、圧力調整手段によって、有機
物蒸着室と移送室との圧力差および移送室と金属蒸着室
との圧力差をそれぞれ5×10-4Pa以下に低減できる
から、各室を連通させても各室相互で蒸発物がほとんど
流入することなく平衡状態になる。従って、各蒸着室に
おける蒸着の際に他の蒸着室の蒸発物が不純物として膜
に混入することがなくなるので、各真空室において純度
の高い膜を形成できるから、優れた素子性能を確保でき
る。
Further, according to the apparatus of the present invention, the pressure difference between the organic vapor deposition chamber and the transfer chamber and the pressure differential between the transport chamber and the metal vapor deposition chamber are each 5 × 10 −4 Pa or less. When the substrate is transferred between the organic deposition chamber and the transfer chamber, or when the substrate is transported between the transfer chamber and the metal deposition chamber, the pressure between the organic deposition chamber and the transfer chamber is controlled by the pressure adjusting means. Since the difference and the pressure difference between the transfer chamber and the metal deposition chamber can be reduced to 5 × 10 −4 Pa or less, even when the chambers are connected, the chambers are in an equilibrium state with almost no evaporant flowing into each other. Therefore, during the vapor deposition in each vapor deposition chamber, evaporated substances from other vapor deposition chambers do not enter the film as impurities, and a film with high purity can be formed in each vacuum chamber, so that excellent element performance can be secured.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の第一実施形態の有機EL素子を示す断
面図。
FIG. 1 is a sectional view showing an organic EL device according to a first embodiment of the present invention.

【図2】前記第一実施形態の有機EL素子の製造装置を
示す模式図。
FIG. 2 is a schematic view showing an apparatus for manufacturing an organic EL device according to the first embodiment.

【図3】本発明の第二実施形態の有機EL素子の製造装
置を示す模式図。
FIG. 3 is a schematic view showing an apparatus for manufacturing an organic EL device according to a second embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1 有機エレクトロルミネッセンス素子 2,3 有機エレクトロルミネッセンス素子の製造装置 11 基板 12 透明電極 13 発光層(有機物層) 14 対向電極 15 電極付基板 21 有機物蒸着室(真空室) 22 移送室(真空室) 23 金属蒸着室(真空室) 24 第一バルブ(第一開閉手段) 25 第二バルブ(第二開閉手段) 27 移送路 33,43,53 排気手段(圧力調整手段) 34,54 ロードロック室(真空室) DESCRIPTION OF SYMBOLS 1 Organic electroluminescent element 2, 3 Manufacturing apparatus of organic electroluminescent element 11 Substrate 12 Transparent electrode 13 Light emitting layer (organic layer) 14 Counter electrode 15 Substrate with electrode 21 Organic substance vapor deposition chamber (vacuum chamber) 22 Transfer chamber (vacuum chamber) 23 Metal deposition chamber (vacuum chamber) 24 First valve (first opening / closing means) 25 Second valve (second opening / closing means) 27 Transfer path 33, 43, 53 Exhaust means (pressure adjusting means) 34, 54 Load lock chamber (vacuum) Room)

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 有機物層の蒸着を行う有機物蒸着室およ
び電極の蒸着を行う金属蒸着室を含みかつ互いに連通可
能に接続された複数の真空室に基板を搬送しながら前記
基板上に有機物層および電極を順次成膜する有機エレク
トロルミネッセンス素子の製造方法であって、 前記基板を配置した真空室とこの真空室に隣接した真空
室との圧力差が5×10-4Pa以下の状態で、前記基板
を前記隣接した真空室に搬送することを特徴とする有機
エレクトロルミネッセンス素子の製造方法。
An organic layer and an organic layer are provided on a substrate while transporting the substrate to a plurality of vacuum chambers including an organic substance vapor deposition chamber for vapor deposition of an organic substance layer and a metal vapor deposition chamber for vapor deposition of electrodes and connected to each other. A method for manufacturing an organic electroluminescent element, in which electrodes are sequentially formed, wherein a pressure difference between a vacuum chamber in which the substrate is arranged and a vacuum chamber adjacent to the vacuum chamber is 5 × 10 −4 Pa or less. A method for manufacturing an organic electroluminescence device, comprising transferring a substrate to the adjacent vacuum chamber.
【請求項2】 請求項1に記載した有機エレクトロルミ
ネッセンス素子の製造方法において、 前記有機物蒸着室および金属蒸着室を移送路を介して連
通させ、 この移送路を遮断した状態で前記有機物蒸着室および金
属蒸着室の圧力差を5×10-4Pa以下にした後、 前記基板を前記有機物蒸着室から前記移送路を通じて前
記金属蒸着室に搬送することを特徴とする有機エレクト
ロルミネッセンス素子の製造方法。
2. The method of manufacturing an organic electroluminescence device according to claim 1, wherein the organic deposition chamber and the metal deposition chamber are communicated via a transfer path, and the organic deposition chamber and the metal deposition chamber are connected in a state where the transfer path is blocked. A method for manufacturing an organic electroluminescent device, comprising: transferring the substrate from the organic deposition chamber to the metal deposition chamber through the transfer path after reducing the pressure difference in the metal deposition chamber to 5 × 10 −4 Pa or less.
【請求項3】 請求項1に記載した有機エレクトロルミ
ネッセンス素子の製造方法において、 前記複数の真空室は、前記有機物蒸着室および金属蒸着
室の間に設けられた移送室を含み、 前記有機物蒸着室および移送室の圧力差を5×10-4
a以下にした後、 前記基板を前記有機物蒸着室から前記移送室に搬送し、 前記移送室および金属蒸着室の圧力差を5×10-4Pa
以下にした後、 前記基板を前記移送室から前記金属蒸着室に搬送するこ
とを特徴とする有機エレクトロルミネッセンス素子の製
造方法。
3. The method for manufacturing an organic electroluminescence device according to claim 1, wherein the plurality of vacuum chambers include a transfer chamber provided between the organic deposition chamber and a metal deposition chamber. And the transfer chamber pressure difference is 5 × 10 -4 P
a, the substrate is transferred from the organic deposition chamber to the transfer chamber, and the pressure difference between the transfer chamber and the metal deposition chamber is 5 × 10 −4 Pa
A method for manufacturing an organic electroluminescence device, comprising: transporting the substrate from the transfer chamber to the metal deposition chamber after the following.
【請求項4】 基板上に有機物層の蒸着を行う有機物蒸
着室と、 この有機物蒸着室に第一開閉手段を介して連通可能に接
続された移送室と、 この移送室に第二開閉手段を介して連通可能に接続され
かつ前記基板上に電極の蒸着を行う金属蒸着室と、 前記有機物蒸着室と移送室との圧力差、および前記移送
室と金属蒸着室との圧力差をそれぞれ5×10-4Pa以
下にするための圧力調整手段とを備えたことを特徴とす
る有機エレクトロルミネッセンス素子の製造装置。
4. An organic substance deposition chamber for depositing an organic substance layer on a substrate, a transfer chamber communicably connected to the organic substance deposition chamber via a first opening / closing means, and a second opening / closing means in the transfer chamber. A metal vapor deposition chamber that is connected to communicate with each other and vapor-deposits an electrode on the substrate; a pressure difference between the organic substance vapor deposition chamber and the transfer chamber; and a pressure difference between the transport chamber and the metal vapor deposition chamber, each of which is 5 ×. An apparatus for producing an organic electroluminescence device, comprising: a pressure adjusting means for reducing the pressure to 10 −4 Pa or less.
【請求項5】 請求項4に記載した有機エレクトロルミ
ネッセンス素子の製造装置において、前記圧力調整手段
は、前記有機物蒸着室、移送室および金属蒸着室の排気
を行う排気手段を含むことを特徴とする有機エレクトロ
ルミネッセンス素子の製造装置。
5. The apparatus for manufacturing an organic electroluminescence device according to claim 4, wherein the pressure adjusting unit includes an exhaust unit that exhausts the organic deposition chamber, the transfer chamber, and the metal deposition chamber. Manufacturing equipment for organic electroluminescent elements.
JP9073343A 1997-03-26 1997-03-26 Method and apparatus for manufacturing organic electroluminescence element Pending JPH10270164A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9073343A JPH10270164A (en) 1997-03-26 1997-03-26 Method and apparatus for manufacturing organic electroluminescence element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9073343A JPH10270164A (en) 1997-03-26 1997-03-26 Method and apparatus for manufacturing organic electroluminescence element

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2002071063A Division JP2002334783A (en) 2002-03-14 2002-03-14 Organic electroluminescence device manufacturing equipment

Publications (1)

Publication Number Publication Date
JPH10270164A true JPH10270164A (en) 1998-10-09

Family

ID=13515430

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9073343A Pending JPH10270164A (en) 1997-03-26 1997-03-26 Method and apparatus for manufacturing organic electroluminescence element

Country Status (1)

Country Link
JP (1) JPH10270164A (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0998170A3 (en) * 1998-10-28 2001-10-31 TDK Corporation System and process for fabricating an organic electro-luminescent display device
KR20020008352A (en) * 2000-07-22 2002-01-30 이영춘 electroluminescent dispay
SG120097A1 (en) * 2002-05-09 2006-03-28 Sony Corp Method and apparatus for manufacturing organic electroluminescence device and system and method for manufacturing display unit using organic electroluminescence devices
KR100744037B1 (en) * 2000-12-30 2007-08-01 현대엘씨디주식회사 Organic electroluminescent device manufacturing device
CN100358109C (en) * 2001-11-16 2007-12-26 郑光镐 Apparatus for manufacturing organic electro-luminescent devices for mass production
CN100452480C (en) * 2004-04-08 2009-01-14 日本东北先锋公司 Method of and system for manufacturing organic EL devices
JP2010165620A (en) * 2009-01-19 2010-07-29 Konica Minolta Holdings Inc Method of manufacturing organic electroluminescent element
JP2013147754A (en) * 1999-12-27 2013-08-01 Semiconductor Energy Lab Co Ltd Film formation method

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6380406A (en) * 1986-09-22 1988-04-11 セイコーエプソン株式会社 Manufacture of multi-layer film
JPS63137169A (en) * 1986-11-27 1988-06-09 Nec Corp Vacuum treatment apparatus
JPS6450414A (en) * 1987-08-21 1989-02-27 Hitachi Ltd Vacuum treatment apparatus
JPH04276074A (en) * 1991-03-05 1992-10-01 Fujitsu Ltd Vacuum treatment equipment
JPH0598434A (en) * 1991-10-04 1993-04-20 Matsushita Electron Corp Multichamber type sputtering apparatus
JPH07106215A (en) * 1993-10-08 1995-04-21 Kokusai Electric Co Ltd Failure processing method in semiconductor manufacturing equipment
JPH08222368A (en) * 1995-02-14 1996-08-30 Ulvac Japan Ltd Organic electroluminescence element, manufacturing method thereof, and manufacturing apparatus thereof

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6380406A (en) * 1986-09-22 1988-04-11 セイコーエプソン株式会社 Manufacture of multi-layer film
JPS63137169A (en) * 1986-11-27 1988-06-09 Nec Corp Vacuum treatment apparatus
JPS6450414A (en) * 1987-08-21 1989-02-27 Hitachi Ltd Vacuum treatment apparatus
JPH04276074A (en) * 1991-03-05 1992-10-01 Fujitsu Ltd Vacuum treatment equipment
JPH0598434A (en) * 1991-10-04 1993-04-20 Matsushita Electron Corp Multichamber type sputtering apparatus
JPH07106215A (en) * 1993-10-08 1995-04-21 Kokusai Electric Co Ltd Failure processing method in semiconductor manufacturing equipment
JPH08222368A (en) * 1995-02-14 1996-08-30 Ulvac Japan Ltd Organic electroluminescence element, manufacturing method thereof, and manufacturing apparatus thereof

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0998170A3 (en) * 1998-10-28 2001-10-31 TDK Corporation System and process for fabricating an organic electro-luminescent display device
JP2013147754A (en) * 1999-12-27 2013-08-01 Semiconductor Energy Lab Co Ltd Film formation method
US8968823B2 (en) 1999-12-27 2015-03-03 Semiconductor Energy Laboratory Co., Ltd. Method of manufacturing a light emitting device
US9559302B2 (en) 1999-12-27 2017-01-31 Semiconductor Energy Laboratory Co., Ltd. Method of manufacturing a display device
KR20020008352A (en) * 2000-07-22 2002-01-30 이영춘 electroluminescent dispay
KR100744037B1 (en) * 2000-12-30 2007-08-01 현대엘씨디주식회사 Organic electroluminescent device manufacturing device
CN100358109C (en) * 2001-11-16 2007-12-26 郑光镐 Apparatus for manufacturing organic electro-luminescent devices for mass production
SG120097A1 (en) * 2002-05-09 2006-03-28 Sony Corp Method and apparatus for manufacturing organic electroluminescence device and system and method for manufacturing display unit using organic electroluminescence devices
CN100452480C (en) * 2004-04-08 2009-01-14 日本东北先锋公司 Method of and system for manufacturing organic EL devices
JP2010165620A (en) * 2009-01-19 2010-07-29 Konica Minolta Holdings Inc Method of manufacturing organic electroluminescent element

Similar Documents

Publication Publication Date Title
JP2845856B2 (en) Method for manufacturing organic electroluminescence device
CN100565784C (en) Manufacturing Equipment
JP4906018B2 (en) Film forming method, light emitting device manufacturing method, and film forming apparatus
US20110268870A1 (en) Film forming apparatus and film forming method
JP4054561B2 (en) Deposition method
TW200835796A (en) Vapor-deposition apparatus
JP2004047452A5 (en)
KR101046239B1 (en) Deposition Device, Deposition System and Deposition Method
JP2006152326A (en) Vapor deposition apparatus
JPH10270164A (en) Method and apparatus for manufacturing organic electroluminescence element
JPWO2010113659A1 (en) Film forming apparatus, film forming method, and organic EL element
JP2002334783A (en) Organic electroluminescence device manufacturing equipment
WO2008018500A1 (en) Film forming device, film forming system, and film forming method
JP2004079528A (en) Manufacturing apparatus
JP7129310B2 (en) Evaporation equipment
JP2004204289A (en) Apparatus and method for forming film, and apparatus and method for manufacturing display panel
US20050241585A1 (en) System for vaporizing materials onto a substrate surface
WO2007145256A1 (en) Apparatus for manufacturing light-emitting device and method for manufacturing light-emitting device
JP5244932B2 (en) Organic compound purification method, film formation method, or light emitting device manufacturing method
JP4172206B2 (en) Organic film forming equipment
JP2004217968A (en) Gas carrier system, film deposition system, and device of producing organic el element
JP2022003159A (en) Vapor deposition apparatus
WO2020242648A1 (en) Methods and systems for forming films on substrates
JP2004281523A (en) Film depositing device and film depositing method

Legal Events

Date Code Title Description
A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20030819