JPH1021548A - Optical disk device, and device for inspecting optical disk recording surface - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide an optical disk device and an optical disk recording surface inspection device capable of detecting damage or stains stuck to an optical disk recording surface which impedes information recording. SOLUTION: The optical disk 1 includes functions for detecting a defect such as damage or stains stuck to the recording surface of an optical disk 2 and the position of the defect from absolute time-in-pregroove(ATIP) data and sending this information to a host device such as a personal computer 4 and the host device to which the optical disk device 1 is connected incorporates an application program for displaying the image of the position of the defect on a display based on the information of the detect position received from the optical disk device 1. Thus, damage or stains impeding information recording are very easily detected compared with the conventional device, the labor necessary for this inspection is greatly reduced and the waste of the optical disk 2 caused by an information recording failure is eliminated.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

[0001] 1. Field of the Invention [0002] The present invention relates to an optical disk apparatus and an optical disk recording surface inspection apparatus capable of detecting scratches and stains on the recording surface of an optical disk.

[0002]

2. Description of the Related Art Conventionally, when information is recorded on a recordable optical disc, if a defect is formed on the recording surface of the optical disc by dust, scratches, fingerprints, or the like, the defect is formed on the defective portion. Cannot record information. For this reason, if information is recorded on an optical disk on which such a defect is formed, information cannot be normally recorded, and one optical disk becomes unusable and wasted.

In order to prevent such waste, before recording information on an optical disc, a position of dirt or the like is found by silent observation, dust is blown off with a gas blower or the like, and dirt is wiped off. Needed.

[0004]

However, it is very troublesome to find dirt or the like attached to the recording surface of an optical disk by silent glance, and when dirt or the like that is an obstacle during information recording is small, it cannot be found. There was something.

SUMMARY OF THE INVENTION In view of the above problems, an object of the present invention is to provide an optical disk apparatus and an optical disk recording surface inspection apparatus capable of detecting scratches, dirt, and the like on an optical disk recording surface that interfere with information recording.

[0006]

According to the present invention, in order to achieve the above object, according to the first aspect, a plurality of tracks are provided, and position information on a disk is recorded in advance on the tracks, and information is added. In an optical disk device for accessing information on a recordable optical disk based on a command from a higher-level device, a rotation driving unit for rotating the optical disk, a light source for emitting a light beam, and a light source for emitting the light beam to the optical disk. An optical system that converges on a recording surface and receives reflected light of the light beam, and an irradiation position setting unit that sets an irradiation position of the light beam on the optical disc;
A light receiving element that receives the reflected light received by the optical system and outputs an electric signal at a level corresponding to the reflected light intensity, based on the electric signal output from the light receiving element,
A defect detection unit that detects the presence of a defect such as a scratch or dirt attached to the recording surface of the optical disc, and outputs a defect detection signal when detecting the presence of the defect; based on an output signal of the light receiving element, Position information reproducing means for reproducing position information at a light beam irradiation position on the optical disk; and transmitting defect existence position information to a host device based on a detection result by the defect detecting means and position information reproduced by the information reproducing means. An optical disc device provided with a defect existence position information sending means is proposed.

According to the optical disk device, the optical disk is rotated by the rotation driving means, and the light beam emitted from the light source is focused on the recording surface of the optical disk via the optical system. At this time, the irradiation position of the light beam on the optical disk is set by the irradiation position setting means. Light reflected from the recording surface of the optical disk is received by a light receiving element via an optical system, and an electric signal having a level corresponding to the intensity of the reflected light is output from the light receiving element.
Further, based on the electric signal output from the light receiving element, the presence of a defect such as a scratch or dirt on the recording surface of the optical disc is detected by the defect detection means, and the defect is detected when the presence of the defect is detected. A signal is output. Further, based on an output signal of the light receiving element, position information at a light beam irradiation position on the optical disk is reproduced by position information reproducing means, and a detection result by the defect detecting means and position information reproduced by the information reproducing means. The defect existence position information sending means sends the defect existence position information to the host device based on the information. Therefore, the host device can recognize the presence or absence of a defect such as a scratch or dirt on the recording surface of the optical disc and the position of the defect based on the position information sent by the defect existence position information sending means.

According to a second aspect of the present invention, in the optical disk device according to the first aspect, the defect detecting means detects that the defect exists when a signal level output from the light receiving element is out of a predetermined level range. An optical disc device that outputs a defect detection signal is proposed.

According to the optical disk device, when the signal level output from the light receiving element is out of a predetermined level range, the defect detection means outputs a defect detection signal assuming that the defect exists. That is, if there is a defect such as a scratch or dirt on the recording surface of the optical disc, the light reflectance of the recording surface increases more than usual, or light is scattered by the defect. The intensity will be above or below the normal level range.

According to a third aspect of the present invention, in the optical disk device according to the first aspect, the defect detecting means converts an output signal of the light receiving element into a digital signal.
An optical disc apparatus comprising: a D conversion unit; and an error detection unit that detects an error based on an error correction code in the digital signal, and outputs a defect detection signal assuming that the defect exists when the error occurs at a predetermined value or more. Suggest.

According to the optical disk apparatus, the output signal of the light receiving element is converted into a digital signal by the defect detecting means, and an error based on an error correction code in the digital signal is detected. When the above occurs, a defect detection signal is output assuming that the defect exists. That is,
If there is a defect such as a scratch or dirt on the recording surface of the optical disk, the light reflectance of the recording surface increases more than usual, or light is scattered by the defect, and thus the light is reflected from the recording surface. The resulting digital signal contains more errors than usual.

According to a fourth aspect of the present invention, in the optical disk device according to any one of the first to third aspects, a command receiving means for receiving a test command from a higher-level device, and a command received by the command receiving means. An optical disc device provided with a drive control means for driving the defect existence position information sending means.

According to the optical disk device, the inspection command transmitted from the higher-level device is received by the command receiving means,
When the inspection command is received, the drive control means drives the defect existence position information sending means.

According to a fifth aspect of the present invention, in the optical disk device according to the fourth aspect, the drive control means, when receiving the inspection command by the command receiving means, places a predetermined number of track intervals in the radial direction of the optical disk. There is proposed an optical disk device that drives and controls the irradiation position setting means so as to irradiate a light beam to an arbitrary track existing in the optical disk.

According to the optical disk apparatus, when the inspection receiving instruction is received by the instruction receiving means, the drive control means allows the drive control means to arbitrarily select an arbitrary track that exists discretely in the radial direction of the optical disk with a predetermined number of track intervals. The irradiation position setting means is driven and controlled so as to emit a light beam. As a result, the light beam is radiated only to the tracks that exist in the radial direction of the optical disc among the tracks, the defects existing on the tracks are detected, and the position information of the defects is transmitted to the host device.

According to a sixth aspect of the present invention, in the optical disk device according to the fourth or fifth aspect, when the inspection receiving command is received by the command receiving device, the drive control unit determines the rotation speed during normal information recording and reproduction. Also proposes an optical disk device that drives and controls the rotation drive means to rotate the optical disk at high speed.

According to the optical disk device, when the instruction receiving unit receives the inspection command, the drive control unit rotates the optical disk so as to rotate the optical disk at a speed higher than the rotation speed during normal information recording and reproduction. The driving means is driven and controlled. Thereby, the time required for the recording surface inspection of the optical disk is reduced.

According to a seventh aspect of the present invention, there are provided a plurality of tracks on which position information on the disk is recorded in advance, and information such as scratches and dirt on the recording surface of the optical disk on which information can be additionally recorded is provided. What is claimed is: 1. An apparatus for inspecting the recording surface of an optical disk for inspecting for the presence or absence of a defect, comprising: a rotation driving means for rotating the optical disk; a light source for emitting a light beam; and a light source for condensing the light beam on a recording surface of the optical disk. An optical system for receiving the reflected light of the beam, an irradiation position setting means for setting an irradiation position of the light beam on the optical disk, and a level corresponding to the intensity of the reflected light by receiving the reflected light received by the optical system A light receiving element that outputs an electric signal of the optical disk; and a light receiving element that detects scratches and dirt on the recording surface of the optical disk based on the electric signal output from the light receiving element. A defect detecting means for detecting the presence of a defect and outputting a defect detection signal when detecting the presence of a defect; and a position for reproducing position information at a light beam irradiation position on the optical disk based on the output signal of the light receiving element. Information reproduction means, defect existence position detection means for detecting a defect existence position based on the detection result by the defect detection means and position information reproduced by the information reproduction means, and display means for displaying the defect existence position on a display. The present invention proposes an optical disk recording surface inspection device provided with the above.

According to the optical disk recording surface inspection apparatus,
The optical disk is rotated by the rotation driving means, and the light beam emitted from the light source is focused on the recording surface of the optical disk via the optical system. At this time, the irradiation position of the light beam on the optical disk is set by the irradiation position setting means. Light reflected from the recording surface of the optical disk is received by a light receiving element via an optical system, and an electric signal having a level corresponding to the intensity of the reflected light is output from the light receiving element. Further, based on the electric signal output from the light receiving element, the presence of a defect such as a scratch or dirt on the recording surface of the optical disc is detected by the defect detection means, and the defect is detected when the presence of the defect is detected. A signal is output. Further, based on an output signal of the light receiving element, position information at a light beam irradiation position on the optical disk is reproduced by position information reproducing means, and a detection result by the defect detecting means and position information reproduced by the information reproducing means. On the basis of,
Defect existing position information detecting means detects defect existing position information. Further, the defect existence position information is displayed on a display by a display means. This makes it possible to recognize the presence or absence of a defect such as a scratch or dirt on the recording surface of the optical disk and the position of the defect.

According to an eighth aspect of the present invention, in the apparatus for inspecting the recording surface of an optical disk according to the seventh aspect, the irradiating position setting means may irradiate an arbitrary track existing at a predetermined number of track intervals in a radial direction of the optical disk. We propose a recording surface inspection device for optical disks that irradiates a beam.

According to the recording surface inspection apparatus for an optical disk,
The irradiation position setting means irradiates a light beam to an arbitrary track that exists discretely in the radial direction of the optical disc with a predetermined number of track intervals. As a result, the light beam is emitted only to the discrete tracks among the tracks, the defects existing on the tracks are detected, and the position information of the defects is displayed on the display.

According to a ninth aspect of the present invention, in the optical disk recording surface inspection apparatus according to the seventh or eighth aspect, the rotation driving means rotates the optical disk at a high rotational speed during information recording and reproduction. Suggest.

According to the optical disk recording surface inspection apparatus,
The rotation drive unit rotates the optical disk at a high rotation speed during normal information recording and reproduction. Thereby, the time required for the recording surface inspection of the optical disk is reduced.

According to a tenth aspect of the present invention, in the optical disk recording surface inspection apparatus according to any one of the seventh to ninth aspects,
The display means proposes an optical disk recording surface inspection device that displays the position of the defect in a superimposed manner on the planar shape of the optical disk.

According to the recording surface inspection apparatus for an optical disk,
Since the display position of the defect is schematically displayed by the display means so as to overlap the planar shape of the optical disc, the position and shape of the defect can be easily visually recognized.

Further, in claim 11, claims 7 to 10
In the optical disk recording surface inspection device according to any one of the above, the defect detection means, when a signal level output from the light receiving element is out of a predetermined level range, as a presence of the defect, the defect detection signal We propose an optical disk recording surface inspection device for output.

According to the optical disk recording surface inspection apparatus,
When the signal level output from the light receiving element is out of a predetermined level range, the defect detection unit outputs a defect detection signal indicating that the defect exists. That is, if there is a defect such as a scratch or dirt on the recording surface of the optical disc, the light reflectance of the recording surface increases more than usual, or light is scattered by the defect. The intensity will be above or below the normal level range.

Further, in claim 12, claims 7 to 10
In the optical disk recording surface inspection apparatus according to any one of the above, the defect detection unit may include an A / D conversion unit that converts an output signal of the light receiving element into a digital signal, and an error based on an error correction code in the digital signal. An apparatus for inspecting a recording surface of an optical disc, comprising: an error detecting means for detecting the defect; and outputting a defect detection signal on the assumption that the defect exists when the error occurs at a predetermined value or more.

According to the optical disk recording surface inspection apparatus,
The output signal of the light receiving element is converted into a digital signal by the defect detection means, and an error based on an error correction code in the digital signal is detected. When the error occurs at a predetermined value or more, the defect exists. As a result, a defect detection signal is output. That is, if there is a defect such as a scratch or dirt on the recording surface of the optical disc, the light reflectance of the recording surface increases more than usual, or light is scattered by the defect. Will contain more errors than usual.

[0030]

Next, an embodiment of the present invention will be described. FIG. 1 is a configuration diagram showing an optical disk device according to the first embodiment of the present invention. In the figure, reference numeral 1 denotes an optical disk device which records information to be recorded input from a higher-level device (not shown) on a write-once optical disk 2 having a spiral tracking groove, or is recorded on the optical disk 2. The information is reproduced and output to the host device.

The optical disk device 1 includes an optical pickup 1
1, spindle motor 12, thread mechanism 13, thread servo circuit 14, sample hold circuit 15, RF
Amplifier circuit 16, auto slice circuit 17, signal processing circuit 18, audio circuit 19, focus servo circuit 2
0, tracking servo circuit 21, wobble detection circuit 2
2, ATIP decoder 23, motor servo circuit 24,
A defect detection circuit 25, a C1 / C2 decoder 26,
CPU 27, data input / output interface circuit 28, C
It comprises a D encoder 29, a modulation circuit 30, an automatic power control circuit 31, and an electronic switch 32.

The optical pickup 11 includes a lens 111, a half mirror 112, a laser 113, an optical detector 114,
It comprises a voltage (hereinafter referred to as I / V) conversion circuit 115, a tracking servo mechanism 116, and a focus servo mechanism 117.

The laser 113 is connected to the automatic power control circuit 29.
The laser beam is emitted by the current input from the optical disk 2, and the laser beam is irradiated to the optical disc 2 via the half mirror 112 and the lens 111. The reflected light from the optical disc 2 is incident on the optical detector 114 via the lens 111 and the half mirror 112.

The light detector 114 is, as shown in FIG.
It consists of a well-known four-division photodetector, and performs tracking correction using the total received light amount of the detectors 114a and 114d located on the left side of the track of the optical disc 2 and the total received light amount of the detectors 114b and 114c located on the right side of the track. Focus correction can be performed by an astigmatism method or the like using the total received light amount of the located detectors 114a and 114c and the total received light amount of the detectors 114b and 114d.
114a to 114d output currents corresponding to the intensity of incident light.

The I / V conversion circuit 115 converts the current output from each of the detectors 114a to 114d of the optical detector 114 into a voltage proportional to the current value and outputs it.

The irradiation position of the laser beam applied to the optical disk 2 via the lens 111 is finely adjusted in the radial direction of the optical disk by the tracking servo mechanism 116, and the focus of the laser beam applied to the optical disk 2 is adjusted. Fine adjustment is made by a focus servo mechanism.

Further, the entire optical pickup 11 is configured to be movable in the radial direction of the optical disk 2 by the sled mechanism 13.

The spindle motor 12 has a signal processing circuit 18 selected by the electronic switch 32 or an ATI
The optical disk 2 is rotated at a predetermined rotation speed by a drive signal from the P decoder 23.

The sled mechanism 13 moves the optical pickup 11 in the radial direction of the optical disk 2 according to a drive control signal from the sled servo circuit 14.

The sample and hold circuit 15 samples and holds a voltage corresponding to the information reproduction level in the light reflected from the optical disk 2. As a result, the tracking servo and the focus servo are driven based on the sampled and held voltage values.

The RF amplification circuit 16 includes an I / V conversion circuit 115
And outputs the RF signal by synthesizing the voltages corresponding to the detectors 114a to 114d, and amplifies and outputs the RF signal.

The auto slicing circuit 17 slices the RF signal output from the RF amplifying circuit 16 at a predetermined level, generates a complete rectangular wave digital signal (EFM signal), and outputs it to the signal processing circuit 18.

The signal processing circuit 18 demodulates the input EFM signal, and when the signal is an audio signal, the audio circuit 1
9 for a digital data signal.
Output to Further, the signal processing circuit 18 outputs a servo signal for driving a spindle motor when data is reproduced from the optical disc 2.

The audio circuit 19 comprises a signal processing circuit 18
In addition to amplifying the audio signal input from, in the case of stereo, the signal is separated into right and left and output.

The focus servo circuit 20 includes detectors 114a to 114d output from the sample hold circuit 15.
Is generated, and a drive signal for driving the focus servo mechanism 117 is generated and output.

The tracking servo circuit 21 comprises detectors 114a to 114a output from the sample and hold circuit 15.
Input a signal corresponding to 4d, and use the tracking servo mechanism 11
A drive signal for driving 6 is generated and output.

The wobble detection circuit 22 receives an RF signal and, based on the RF signal, a wobble signal recorded in a spiral and meandering track in a recording area of the write-once optical disc 2 in a known manner. And outputs the wobble signal.

The ATIP decoder 23 reproduces ATIP data from the wobble signal and outputs this to the CPU 27 and the motor servo circuit 24.

Here, on the write-once optical disc 2, tracks undulating (meandering) with a small amplitude are formed in a spiral shape in advance. The undulation of this track represents absolute time information called ATIP (Absolute Time In Pregroove) data. The fundamental frequency is 22.05 KHz, and the frequency is the length corresponding to one bit of the ATIP data (frequency of 44.1 KHz). FSK (Frequenze) so that it changes by ± 1 KHz according to the content of the bit every seven cycles), that is, whether this bit is “1” or “0”.
cy Shift Keying) modulated.

Also, one frame of ATIP data is one.
Consisting of a number of consecutive frames each including a constant (84 bits) bit and having a fixed pattern of frame synchronizing signal at a predetermined position, each frame has a frequency of 75 Hz during normal speed reproduction. Is repeated.

Therefore, the position on the optical disk can be recognized by reading the ATIP data.

The motor servo circuit 24 receives the ATIP data from the ATIP decoder 23 and
A control signal is input from 27, and a drive signal for driving the spindle motor 12 is generated and output based on the control signal.
The rotation speed of the spindle motor 12 is set based on a control signal from the CPU 27.

The defect detection circuit 25 receives the RF signal, detects the envelope thereof, and outputs a defect detection signal to the CPU 27 on the assumption that a defect has been detected when the level of the envelope signal falls outside a predetermined level range. I do.

The C1 and C2 decoder 26 receives the EFM signal from the signal processing circuit 18, detects the number of CIRC (Cross Interleaved Reed-Solomon Code) C1 and C2 errors in the EFM signal per unit time, and detects
Output to U27.

The CPU 27 controls other main circuits, sends out digital data reproduced by the signal processing circuit 18 to a higher-level device such as a personal computer via a data input / output interface circuit 28, and
The recording target information input from the host device is transferred to the CD encoder 2
9 to write information to the optical disk.

The CPU 27 outputs a control signal (not shown) to the thread servo circuit 14 and the tracking servo circuit 21 when receiving the inspection command from the host device.
In addition to controlling the irradiation position of the laser beam on the optical disk 2, the position information (absolute time information) of the defect is read from the ATIP data at the time when the defect detection signal is input from the defect detection circuit 25, and this information is stored and this information is stored in the memory. The data is transmitted to the host device via the data input / output interface circuit for each track.

Further, the CPU 27 inputs the number of C1 and C2 errors from the C1 and C2 decoder 26 and determines that a defect exists when the number of C1 and C2 errors exceeds a predetermined value. (Absolute time information) is read and stored, and this information is sent to the host device via the data input / output interface circuit for each track.

The data input / output interface circuit 28
It comprises a well-known SCSI or ATAPI interface, and transfers commands and data between the CPU 27 and the CD encoder 29 and a higher-level device such as a personal computer.

The CD encoder 29 converts recording target information input from the CPU 27 and the data input / output interface circuit 28 into an EFM signal and outputs the EFM signal.

The modulation circuit 30 receives the EFM signal output from the CD encoder 29 and outputs a laser
Modulate 113 drive signal.

The automatic power control circuit 31
Keep the current value of the drive signal output from the
The laser power emitted from 113 is maintained at a constant value.

The electronic switch 32 operates based on the control signal of the CPU 27, and selects either the drive signal output from the signal processing circuit 18 or the drive signal output from the motor servo circuit 24 to the spindle motor 12. Send out.

On the other hand, the defect detection circuit 25
, An envelope detection circuit 41, a DC component extraction circuit 42, a dark defect detection level generation circuit 43,
It comprises a bright defect detection level generation circuit 44, a first comparison circuit 45, a second comparison circuit 46, and a defect detection signal output circuit 47.

The envelope detection circuit 41 includes differential amplifiers 41a and 41b, diodes 41c and 41d, capacitors 41e and 41f, and resistors 41g to 41j. The non-inverting input terminal of the differential amplifier 41a has R
The RF signal output from the F signal detection circuit 21 is input, and the inverting input terminal is connected to the output terminal thereof via a capacitor 41e and one end of a resistor 41g, and the other end of the resistor 41g is connected via a diode 41c. And the anode of the diode 41d. Here, the inverting input terminal side of the differential amplifier 41a becomes the anode of the diode 41c.

The non-inverting input terminal of the differential amplifier 41b is connected to the cathode of a diode 41d and grounded via a capacitor 41f and a parallel circuit of a resistor 41h and a resistor 41i connected in series. I have. Further, the output terminal of the differential amplifier 41b is connected to its inverting input terminal, and the differential amplifier 41b is connected via a resistor 41j.
a is connected to the inverting input terminal.

Thus, the envelope detection circuit 41 detects the envelope component of the RF signal, that is, the envelope, and outputs the envelope signal EV.

The DC component extraction circuit 42 comprises a resistor 42a and a capacitor 42b. One end of the resistor 42a receives an envelope signal EV, and the other end is grounded via a capacitor 42b. Thereby, the resistor 4
2a, the DC component EDC of the envelope signal EV from the other end.
Is output.

The dark defect detection level generation circuit 43
Is composed of a differential amplifier 43a, resistors 43b to 43e, and an electronic switch SW1. Differential amplifier 43a
The DC component ED of the envelope signal is
C has been entered.

The output terminal of the differential amplifier 43a is connected to its inverting input terminal and the resistors 43b, 43
c and a second voltage dividing circuit including resistors 43d and 43e.

Further, each of the voltages V11 and V12 generated by the first and second voltage dividing circuits is input to two contacts SW1a and SW1b of the electronic switch SW1, and is switched by the switching control signal Vcom1.
1 is switched, and either one of the voltages V11 and V12 is output from the contact SW1c of the electronic switch SW1 as the dark defect detection level voltage Va. Here, the switching control signal Vcom1 is a low / high level binary signal, and may be manually input or may be input from the CPU.

Bright defect detection level generation circuit 44
Is composed of a differential amplifier 44a, resistors 44b to 44e, and an electronic switch SW2. Differential amplifier 44a
The envelope signal EV is input to the non-inverting input terminal of the.

The output terminal of the differential amplifier 44a is connected to its inverting input terminal, and the resistors 44b, 44
c and a second voltage dividing circuit including resistors 44d and 44e.

Further, each of the voltages V21 and V41 generated by the first and second voltage dividing circuits is input to two contacts SW2a and SW2b of the electronic switch SW2, and is switched by the switching control signal Vcom2.
2 is switched, and one of the voltages V21 and V41 is output from the contact SW2c of the electronic switch SW2 as the bright defect detection level voltage Vb. Here, the switching control signal Vcom2 is a low / high level binary signal, and may be manually input or may be input from the CPU.

The first comparison circuit 45 includes a comparator 45
a and a resistor 45b, and a comparator 45a
, A dark defect detection level voltage V output from the dark defect detection level generation circuit 43.
a is input, and the envelope signal EV is input to the inverting input terminal.
Is entered. Further, the output terminal of the comparator 45a is pulled up to a high level voltage via a resistor 45b.

As a result, the dark defect detection signal D1 output from the output terminal of the comparator 45a becomes high when the level of the voltage Va is higher than the voltage level of the envelope signal EV, and becomes high when the level of the voltage Va is higher than the envelope signal EV. When the voltage is equal to or lower than the voltage level of the EV, the level is low. When the dark defect detection signal D1 is at a high level, it is determined that a dark defect has been detected.

The second comparison circuit 46 includes a comparator 46
a and a resistor 46b, and a comparator 46a
Is connected to the non-inverting input terminal of the bright defect detection level generating circuit 44.
b is input, and the inverted input terminal is connected to the output terminal of the differential amplifier 43a of the dark defect detection level generation circuit 43. As a result, a signal equivalent to the DC component EDC of the envelope signal is input to the inverting input terminal of the comparator 46a. Further, the output terminal of the comparator 46a is pulled up to a high level voltage via a resistor 46b.

As a result, the bright defect detection signal D2 output from the output terminal of the comparator 46a becomes high when the level of the voltage Vb is higher than the voltage level of the DC component EDC of the envelope signal. Is low when the voltage is equal to or lower than the voltage level of the DC component EDC. When the bright defect detection signal D2 is at a high level, it is determined that a bright defect has been detected.

The defect detection signal output circuit 47
It is composed of an input OR circuit 47a and a resistor 47b.
A dark defect detection signal D1 and a bright defect detection signal D2 are input to the R circuit 47a, and when one or both of them become high level, the OR circuit 47a is output.
The output signal of “a” becomes high level. The output signal of the OR circuit 47a is supplied to the defect detection signal D via the resistor 47b.
Output as F.

Next, the operation of the defect detection circuit 25 having the above configuration will be described with reference to a signal waveform diagram shown in FIG. The intensity of the reflected light, that is, the RF signal level changes depending on the type of defect attached to the surface of the optical disk. For example, if the surface of the protective layer of the optical disk 1 is damaged, the intensity of the reflected light from the optical disk decreases, and if pits are formed on the aluminum disk, the intensity of the reflected light increases. Generally, in the case of a write-once optical disc, a dark defect is almost present.

The RF signal is detected by the RF signal detecting circuit 21 from the reflected light whose level has changed due to the defect, and the envelope of the RF signal is detected as a signal by the envelope detecting circuit 41.

The DC component of the envelope signal EV is extracted by the DC component extraction circuit 42.

Thereafter, in the dark defect detection level generating circuit 43, the DC component level EDC of the envelope signal EV is divided by a predetermined voltage dividing ratio, and a dark defect detection level Va lower by a predetermined amount than the DC component level is obtained. Generated.

Further, in the bright defect detection level generating circuit 44, the envelope signal EV is divided by a predetermined voltage dividing ratio to generate a bright defect detection level Vb lower by a predetermined amount than the level of the envelope signal EV.

The dark defect detection level Va is compared in the first comparison circuit 45 with the level of the envelope signal EV. As a result, a portion of the envelope signal EV whose level has dropped particularly, that is, a dark defect portion is detected. At this time, the first comparison circuit 45 outputs a high-level pulsed dark defect detection signal D1.

The bright defect detection level Vb is
The second comparator 46 compares the level of the DC component EDC of the envelope signal EV. As a result, in the bright defect detection level obtained by lowering the level of the envelope signal EV by a predetermined amount, a portion having a particularly high level, that is, a bright defect portion is detected. At this time, the second comparison circuit 46 outputs a high-level pulsed bright light. The defect detection signal D2 is output.

Further, the dark defect detection signal D1 and the bright defect detection signal D2 are connected to an OR circuit 47a.
And output as a defect detection signal D3.

Therefore, a signal used for defect detection,
That is, since each of the envelope signal EV, the DC component EDC of the envelope signal, the dark defect detection level Va, and the bright defect detection level Vb fluctuates according to the level of the RF signal, a portion where information is recorded or a portion where information is not recorded is used. Thus, even if the level of the RF signal fluctuates due to the difference, the appropriate dark defect detection level and bright defect detection level are generated, and the dark defect and the bright defect can be accurately detected.

Further, the dark defect detection level Va and the light defect detection level Vb are converted into envelope signal E by the respective detection level generation circuits 43 and 44.
Since it is generated from V or its direct-current component EDC by resistance voltage division, a minute level difference can be generated with the precision of the resistor, so that a defect having a low detection level such as a fingerprint or dirt can be easily detected. it can.

Further, since the dark defect detection level Va and the bright defect detection level Vb can be selected from two types, it is possible to perform appropriate defect detection by switching these levels depending on the type of the optical disk and the like. it can.

Next, the first embodiment of the present invention having the above-described configuration will be described.
The operation of this embodiment will be described with reference to FIGS.
As shown in FIG. 5, the optical disk device 1 is used by being connected to a host device 3 such as a personal computer via a data input / output interface circuit 28.

The CPU 27 of the optical disk device 1 operates on the basis of a command input from the higher-level device 3 to access information on the optical disk 2 in the same manner as in a known optical disk device, and based on the command from the higher-level device 3. Then, the presence of a defect such as a scratch or dirt on the recording surface of the optical disk 2 is detected, and this existence position information is sent to the host device.

Upon receiving the inspection command from the higher-level device 3, the optical disk device 1 performs a recording surface inspection process in accordance with the flow charts shown in FIGS. That is, the CPU 27
When the inspection command is received from the host device 3, the TOC information of the optical disk 2 mounted on the device 1 is read (SA1),
It is determined whether the optical disk 2 is a blank disk (SA2). If the result of this determination is that the disc is a blank disc, the CPU 27 drives the sled mechanism 13 via the sled servo circuit 14 and moves the optical pickup 11 to the innermost track (SA3).

Next, the CPU 27 switches the electronic switch 32 to drive the spindle motor 12 by the drive signal of the motor servo circuit 24, and sets the ATIP servo tracking state to ON (SA4). After this, CP
U27 outputs a control signal to the motor servo circuit 24 to increase the rotation speed of the optical disk 2 by two times, four times, six times
Rotate as double or eight times (SA5).

Next, the CPU 27 monitors the defect detection signal from the defect detection circuit 25 to detect a defect (SA6). When a defect is detected, the CPU 27 reads the ATIP data from the ATIP decoder 23 and detects the position of the defect. At the same time as (SA7), it is determined whether the inspection for one round of the track is completed (SA8).

As a result of this determination, if the inspection for one track has not been completed, the process proceeds to SA6, and if the inspection for one track has been completed, the CPU 27 determines the position information of the detected defect. Is transmitted to the host device 3 via the data input / output interface circuit 28 (SA
9).

Next, the CPU 27 controls the thread servo circuit 14 or the tracking servo circuit 22 to perform a track jump (SA10). Here, for example, a track jump is performed to tracks separated by 64 tracks.

Thereafter, it is determined whether or not the jump destination track is beyond the outermost track (SA11). If it does not exceed the outermost track, the flow shifts to the process of SA6, where the jump is made to the outermost track. If yes, the inspection process ends.

As a result of the determination in SA2, if the loaded optical disk 2 is not a blank disk, the CPU 27 checks the start position of a blank portion (information unrecorded portion) (SA12) and adjusts the rotation speed. The speed is set to 2 × or higher (SA13), and at the same time, the sled mechanism 13 is driven via the sled servo circuit 14 to move the optical pickup 11 to the innermost track (SA14).

Next, the CPU 27 starts data reproduction (SA15), detects the number of errors input from the C1 / C2 decoder 26 (SA16), and detects a defect when the number of errors is equal to or more than a predetermined reference value. AT
The ATIP data is read from the IP decoder 23 to detect the position of the defect (SA17), and it is determined whether the inspection for one round of the track is completed (SA).
18).

If the result of this determination is that the inspection for one track has not been completed, the process proceeds to SA15, and if the inspection for one track has been completed, the CPU 27 sets
The position information of the detected defect is transmitted to the host device 3 via the data input / output interface circuit 28 (S
A19).

Next, the CPU 27 controls the thread servo circuit 14 or the tracking servo circuit 22 to perform a track jump (SA20). Here, for example, a track jump is performed to tracks separated by 64 tracks.

Thereafter, it is determined whether or not the jump destination track is in the blank area (SA21). If the track is not in the blank area, the process proceeds to SA15. The process proceeds to SA4 to inspect the blank area.

Since the existence position information of the defect such as a scratch or dirt on the optical disk 2 is transmitted to the host device 3 by the above-described processing, the host device 3 can easily and accurately detect the defect only by sending the inspection command. The presence or absence of the defect and the position of the defect can be known.

Therefore, the user of the optical disk 2 can easily know the existence of a defect by sending an inspection command from the higher-level device to the optical disk device 1 before starting to record information on the optical disk 2. Information recording can be performed after dirt or the like attached to the recording surface of the optical disk is removed, and there is no possibility that information recording fails and the optical disk is wasted.

In the first embodiment, the number of C1 and C2 errors in the information recording portion on the optical disk 2 is used. However, the defect detection from the defect detection circuit 25 is performed similarly to the blank portion (information non-recording portion). This may be performed using a signal.

In the first embodiment, the inspection time is shortened by inspecting only the tracks that exist intermittently every 64 tracks at the time of inspecting the recording surface to detect the presence of a defect, but the inspection time is shortened. There is no. For example, the inspection time can be further reduced by increasing the number of tracks to be jumped, and more detailed defect detection can be performed by inspecting all the tracks.

Further, the configuration of the optical disk device 1 in the first embodiment is an example, and it goes without saying that the present invention is not limited to this.

Next, a description will be given of an optical disk recording surface inspection apparatus according to a second embodiment of the present invention. FIG. 8 is a configuration diagram illustrating an optical disk recording surface inspection device (hereinafter, referred to as a recording surface inspection device) according to the second embodiment. In the figure, the same components as those in the above-described first embodiment are denoted by the same reference numerals, and description thereof is omitted.

The difference between the first embodiment and the second embodiment is that a personal computer (hereinafter, referred to as a PC) 4 is connected to the optical disk device 1 of the first embodiment, and an optical disk The recording surface inspection apparatus includes the optical disk device 1 and the PC 4 with a built-in recording surface inspection program.

The operation of the optical disk device 1 is the same as that of the first embodiment, and a description thereof will be omitted.

The PC 4 has a built-in recording surface inspection program. When the program is started, an application screen shown in FIG. 9 is displayed on the display. On the application screen, a menu bar 51 for selecting a pull-down menu of “File (F)”, “Measurement (M)”, and “Help (H)”, a plurality of icons 52 for selecting main processes, an optical disk CD image display area 53 for displaying the state of the recording surface as an image, disk information display area 54 for displaying "total capacity", "used area", and "free area" of the optical disk, session information display area 55 for the optical disk, and inspection A comment display area 56 for displaying the resulting comment is provided.

On this screen, when an inspection start (not shown) is selected from the pull-down menu of “Measurement (M)”,
The recording surface inspection of the optical disk to be inspected is started based on the flowchart shown in FIG.

When the inspection is started, the PC 4 sends a TOC information read command to the optical disk device 1 (SB
1), in response to the T transmitted from the optical disc device 1
The OC information is read (SB2), the disc information is displayed in the disc information display area 54 (SB3), and the session information is displayed in the session information display area 55 (SB4).

Next, after transmitting the inspection start command to the optical disk device 1 (SB5), the PC 4 inputs defect position information for one track transmitted from the optical disk device 1 (SB6), and from this position information, the defect is detected. Calculate the coordinates for displaying the existence position as an image (S
Along with B7), the coordinates of the defect are displayed as images in the CD image display area 53 of the display (SB8).

In this image display, as shown in FIG. 11, the defect position 53a is discolored and displayed. Thus, the position and shape of a defect such as a scratch or dirt can be easily visually recognized.

Thereafter, the PC 4 receives all the defect position information and determines whether or not the inspection has been completed (SB).
9) If the inspection is not completed, the process proceeds to the above-described SB6. If the inspection is completed, the amount of defects is determined (SB10), and a comment based on the result of this determination is displayed in the comment display area 56. It is displayed (SB11).

Further, by opening the pull-down menu of “File (F)”, it goes without saying that processing such as storage of inspection results and reading of the stored inspection results can be performed.

As described above, according to the recording surface inspection apparatus of the second embodiment, the position and shape of the scratches and dirt on the recording surface of the optical disk can be easily and accurately detected, and the inspection result is displayed as an image. Since it can be visually recognized, even a beginner who handles the optical disk can clean the recording surface of the optical disk while observing the inspection result, thereby preventing information recording failure and not wasting the optical disk.

In the second embodiment, the same optical disk apparatus as that of the first embodiment, which can write information on an optical disk, is used. However, the present invention is not limited to this. The same effect can be obtained by using.

Next, a third embodiment of the present invention will be described. FIG. 12 is a configuration diagram showing an optical disk recording surface inspection apparatus according to the third embodiment of the present invention. In the figure, the same components as those in the above-described first embodiment are denoted by the same reference numerals, and description thereof is omitted. In addition, the first embodiment and the third embodiment
The difference from the second embodiment is that the audio circuit 19, the data input / output interface circuit 28, the CD encoder 29, and the modulation circuit 3 in the optical disc device of the first embodiment
0, and an operation unit 61 including a keyboard, a display control unit 62, a display 63, and a frequency generator (hereinafter referred to as FG) 64 for outputting a predetermined pulse in response to the rotation of the spindle motor 12. Is provided to configure the recording surface inspection device 7 for the optical disk.

The operation unit 61 and the display control unit 62 are
7 and the key input from the operation unit 61
The display control unit 62 generates a display signal based on the display data input from the CPU 27, outputs the display signal to the display 63, and displays a predetermined screen on the display 63.

The FG 64 outputs 48 pulse signals to the CPU while the spindle motor 12 makes one rotation, for example.
27. Thus, the CPU 27 can recognize the irradiation position of the laser beam on the optical disc 2 by counting the pulses.

Here, a program memory (not shown) of the CPU 27 stores an optical disk access program substantially similar to that of the first embodiment and a recording surface inspection program substantially similar to that of the second embodiment. Yes, CPU2
7 executes the optical disk recording surface inspection processing shown in the flowcharts of FIGS. 13 and 14 based on this program.

That is, when this apparatus is started, the CPU 27
Starts the execution of the program and displays the ninth
An inspection screen almost similar to that shown in the figure is displayed (SC1)
At the same time, the TOC information of the optical disk to be inspected is read (SC2), the disk information is displayed in the disk information display area 54, and the session information is displayed in the session information display area 55 (SC3, SC4). Determine whether the disk is a disk (SC
5).

If the result of this determination is that the disc is a blank disc, the CPU 27 drives the sled mechanism 13 via the sled servo circuit 14 to move the optical pickup 11 to the innermost track (SC6).

Next, the CPU 27 switches the electronic switch 32 to drive the spindle motor 12 by the drive signal of the motor servo circuit 24, and sets the ATIP servo tracking state to ON (SC7). After this, CP
U27 outputs a control signal to the motor servo circuit 24 to increase the rotation speed of the optical disk 2 by two times, four times, six times
Rotate as double or eight times (SC8).

Next, the CPU 27 monitors the defect detection signal from the defect detection circuit 25 and performs defect detection (SC9). When a defect is detected, the CPU 27 reads the ATIP data from the ATIP decoder 23 and detects the position of the defect. Along with (SC10), it is determined whether the inspection for one round of the track is completed (SC11).

As a result of this determination, if the inspection for one track has not been completed, the processing shifts to the process of SC9. If the inspection for one track has been completed, the CPU 27 determines from the defect location information. The coordinates for displaying the defect position as an image are calculated (SC12), and the defect position is displayed as an image in the CD image display area 53 of the display using the coordinates (SC13).

Here, the CPU 27 counts the number of pulses output from the FG 64, and sets the starting position of the track to be inspected on each track on a straight line extending in the radial direction of the optical disc as shown in FIG. This gives 1
It is possible to simplify the process of determining whether or not the rotation has been completed and the process of calculating the coordinates when displaying the image on the display 63.

Next, the CPU 27 controls the thread servo circuit 14 or the tracking servo circuit 22 to perform a track jump (SC14). Here, for example, a track jump is performed to tracks separated by 64 tracks.

Thereafter, it is determined whether or not the jump destination track exceeds the outermost track (SC15). If not, the process proceeds to SC9, and if the jump destination track does not exceed the outermost track, the process proceeds to SC9. If there is, the presence amount of defects on the entire recording surface of the optical disc is determined (SC16), and a comment based on the result of this determination is displayed in the comment display area 56 (SC17).

As a result of the determination in SC5, if the loaded optical disk 2 is not a blank disk, the CPU 27 checks the start position of a blank portion (information unrecorded portion) (SC18), and adjusts the rotation speed. The speed is set to 2 × or higher (SC19), and the sled mechanism 13 is driven via the sled servo circuit 14 to move the optical pickup 11 to the innermost track (SC20).

Next, the CPU 27 starts data reproduction (SC21), detects the number of errors input from the C1 / C2 decoder 26 (SC22), and detects a defect when the number of errors is equal to or more than a predetermined reference value. AT
The ATIP data is read from the IP decoder 23 to detect the position of the defect (SC23), and it is determined whether the inspection for one round of the track is completed (SC23).
24).

As a result of this determination, if the inspection for one track has not been completed, the process proceeds to SC21. If the inspection for one track has been completed, the CPU 27 proceeds to SC21.
The coordinates for displaying the image of the defect position are calculated from the defect position information (SC25).
At the same time, the position of the defect is displayed as an image on the CD image display area 53 of the display using the coordinates (SC26).

Next, the CPU 27 controls the thread servo circuit 14 or the tracking servo circuit 22 to perform a track jump (SC27). Here, for example, a track jump is performed to tracks separated by 64 tracks.

Thereafter, it is determined whether or not the jump destination track is in the blank area (SC28). If the track is not in the blank area, the process proceeds to SC21. The process proceeds to SC7, where a blank area is inspected.

The position information of the defect such as a scratch or dirt on the optical disk 2 is displayed as an image on the screen of the display 63 by the above-described processing, so that the defect can be easily and accurately detected only by executing the inspection command. The presence / absence and the location of the defect can be known.

Therefore, the user of the optical disk 2 can easily know the presence of a defect by inspecting the optical disk with the present apparatus before starting to record information on the optical disk 2, so that the recording surface of the optical disk 2 Information recording can be performed after removing attached dirt and the like, and there is no possibility that information recording fails and the optical disk is wasted.

In the third embodiment, the number of C1 and C2 errors in the information recording portion on the optical disk 2 is used. However, the defect detection from the defect detection circuit 25 is performed similarly to the blank portion (information non-recording portion). This may be performed using a signal.

Further, in the third embodiment, the inspection time is reduced by inspecting only tracks that exist intermittently every 64 tracks at the time of recording surface inspection, and the inspection time is shortened. However, the present invention is not limited to this. There is no. For example, the inspection time can be further reduced by increasing the number of tracks to be jumped, and more detailed defect detection can be performed by inspecting all the tracks.

The configuration in the third embodiment is an example, and it goes without saying that the present invention is not limited to this.

[0142]

As described above, according to the optical disk apparatus of the first aspect of the present invention, the defect existence position is determined based on the detection result by the defect detection means of the optical disk apparatus and the position information reproduced by the information reproduction means. Since the information transmitting means sends the defect existence position information to the host device, the host device uses the position information sent by the defect existence position information sending means to detect the presence of defects such as scratches and dirt on the recording surface of the optical disc. Presence and the position of the defect can be recognized. Accordingly, it is possible to detect defects such as scratches and dirt, which are obstacles to information recording, more easily than in the past, and to greatly reduce the time and effort required for this, and to achieve higher accuracy than in the past. Defects can be detected. Thus, the optical disk is not wasted.

According to the optical disk device of the second aspect, in addition to the above effects, when the signal level output from the light receiving element is out of the predetermined level range, the defect is detected as the presence of the defect. So that
Defects existing in a portion where information is recorded and a portion where information is not recorded can be easily detected.

According to the optical disk apparatus of the third aspect, in addition to the above effects, an error based on an error correction code in a digital signal reproduced from the reflected light from the optical disk is detected, and the error is determined by a predetermined value. When the above occurs, the defect is detected as the existence of the defect, so that the defect in the information recording portion on the optical disk can be detected with high accuracy.

Further, according to the optical disk device of the fourth aspect, in addition to the above effects, the inspection command transmitted from the higher-level device is received by the command receiving means, and the drive control is performed when the inspection command is received. Since the defect presence position information sending means is driven by the means, it is possible to switch between normal information access to the optical disk and access for recording surface inspection by the inspection command.

According to the optical disk apparatus of the fifth aspect, in addition to the above-described effects, a light beam is radiated only to a predetermined number of tracks in the tracks that are discretely present in the radial direction of the optical disk. Since the defect existing on the optical disk is detected and the position information of the defect is sent to the host device, the defect on the recording surface of the optical disk can be roughly inspected and the inspection time can be greatly reduced. .

According to the optical disk apparatus of the present invention, in addition to the above effects, when the inspection instruction is received by the instruction receiving means, the drive control means controls the optical disk at a high rotational speed at the time of information recording and reproduction. Since the rotation driving means is controlled so as to rotate, the time required for inspecting the recording surface of the optical disk can be further reduced.

According to the optical disk recording surface inspection apparatus of the present invention, the defect existence position information detection means detects the defect existence position based on the detection result by the defect detection means and the position information reproduced by the information reproduction means. Since the information is detected and the position information is displayed on the display by the display means, it is possible to easily recognize the presence or absence of a defect such as a scratch or dirt on the recording surface of the optical disk and the position of the defect. Accordingly, it is possible to detect defects such as scratches and dirt, which are obstacles to information recording, more easily than in the past, and to greatly reduce the time and effort required for this, and to achieve higher accuracy than in the past. Defects can be detected. Thus, the optical disk is not wasted.

According to the recording surface inspection apparatus for an optical disk according to the present invention, in addition to the above-described effects, the light beam is applied only to a predetermined number of tracks that are discretely present in the radial direction of the optical disk among the tracks. Then, the defect existing on the track is detected, and the position information of the defect is displayed on the display, so that the defect existing on the recording surface of the optical disk can be roughly inspected and the inspection time can be greatly reduced. be able to.

According to the optical disk recording surface inspection apparatus of the ninth aspect, in addition to the above-described effects, the rotation driving means is driven and controlled so as to rotate the optical disk at a high rotational speed during information recording and reproduction. Therefore, the time required for inspecting the recording surface of the optical disk can be further reduced.

According to the optical disk recording surface inspection apparatus of the tenth aspect, in addition to the above-described effects, the position of the defect is schematically displayed by the display means so as to overlap the planar shape of the optical disk. The position and shape of the defect can be easily visually recognized.

According to the optical disk recording surface inspection apparatus of the eleventh aspect, in addition to the above effects, when the signal level output from the light receiving element is out of the predetermined level range, a defect exists. Therefore, it is possible to easily detect a defect existing in a portion where information is recorded and a portion where information is not recorded.

According to the optical disk recording surface inspection apparatus of the twelfth aspect, in addition to the above effects, an error based on an error correction code in a digital signal reproduced from light reflected from the optical disk is detected. When an error occurs equal to or more than a predetermined value, the defect is detected as the existence of the defect, so that the defect in the information recording portion on the optical disk can be detected with high accuracy.

[Brief description of the drawings]

FIG. 1 is a configuration diagram illustrating an optical disc device according to a first embodiment of the present invention.

FIG. 2 is a diagram illustrating a configuration of a light detector according to the first embodiment of the present invention.

FIG. 3 is a configuration diagram showing a defect detection circuit according to the first embodiment of the present invention.

FIG. 4 is a waveform chart illustrating the operation of the defect detection circuit according to the first embodiment of the present invention.

FIG. 5 is a diagram illustrating an example of use of the optical disc device according to the first embodiment of the present invention.

FIG. 6 is a flowchart for explaining the operation of the optical disc device according to the first embodiment of the present invention;

FIG. 7 is a flowchart for explaining the operation of the optical disc device according to the first embodiment of the present invention;

FIG. 8 is a configuration diagram showing a recording surface inspection device for an optical disc according to a second embodiment of the present invention.

FIG. 9 is a diagram showing an application screen according to the second embodiment of the present invention.

FIG. 10 is a flowchart for explaining the operation of an inspection program according to the second embodiment of the present invention;

FIG. 11 is a view for explaining an image display of a defect position in the second embodiment of the present invention.

FIG. 12 is a configuration diagram showing an optical disk recording surface inspection device according to a third embodiment of the present invention.

FIG. 13 is a flowchart for explaining the operation of the third embodiment of the present invention;

FIG. 14 is a flowchart for explaining the operation of the third embodiment of the present invention;

FIG. 15 is a view for explaining the function of the FG in the third embodiment of the present invention.

[Explanation of symbols]

DESCRIPTION OF SYMBOLS 1 ... Optical disk apparatus, 2 ... Optical disk, 3 ... Host apparatus,
4 personal computer (PC), 7 recording surface inspection device, 11 optical pickup, 111 lens, 112 half mirror, 113 laser, 114 optical detector, 115
Current / voltage (I / V) conversion circuit, 116: tracking servo mechanism, 117: focus servo mechanism, 12: spindle motor, 13: thread mechanism, 14: thread servo circuit, 15: sample hold circuit, 16: RF amplifier circuit , 17 ... Auto slice circuit, 18 ... Signal processing circuit, 19 ... Audio circuit, 20 ... Focus servo circuit, 21 ... Tracking servo circuit, 22 ... Wobble detection circuit, 23 ... ATIP decoder, 24 ... Motor servo circuit, 25 ... Defect Detection circuit, 26 ... C1 · C
2 decoder, 27 CPU, 28 data input / output interface circuit, 29 CD encoder, 30 modulation circuit, 31 automatic power control circuit, 32 electronic switch,
41: envelope detection circuit, 42: DC component extraction circuit, 43: dark defect detection level generation circuit, 44 ...
Bright defect detection level generation circuit, 45: first comparison circuit, 46: second comparison circuit, 47: defect detection signal output circuit, 51: menu bar, 52: icon,
53 ... CD image display area, 54 ... Disc information display area, 55 ... Session information display area, 56 ... Comment display area, 61 ... Operation section, 62 ... Display control section, 63 ... Display, 64 ... Frequency generator (F
G).

──────────────────────────────────────────────────の Continuation of the front page (51) Int.Cl. ⁶ Identification code Agency reference number FI Technical display location G11B 23/00 G11B 23/00 H (72) Inventor Isao Matsuda 6-16 Ueno, Taito-ku, Tokyo No. 20 Taiyo Denki Co., Ltd. (72) Inventor Yukihide Omura 6-16-20 Ueno, Taito-ku, Tokyo Taiyo Denki Co., Ltd. (72) Inventor Yasuhiro Kobayashi 6-16-20 Ueno, Taito-ku, Tokyo Taiyo Denki Co., Ltd.

Claims (12)

[Claims] 1. An optical disk having a plurality of tracks, on which position information on a disk is recorded in advance, and on which information can be additionally recorded, accesses information based on a command from a higher-level device. An optical disc device that performs: a rotation driving unit that rotates the optical disc; a light source that emits a light beam; an optical system that focuses the light beam on a recording surface of the optical disc and receives reflected light of the light beam; Irradiation position setting means for setting an irradiation position of the light beam on the optical disk; a light receiving element for receiving the reflected light received by the optical system and outputting an electric signal of a level corresponding to the reflected light intensity; The presence of defects such as scratches and dirt on the recording surface of the optical disk is detected based on the electric signal output from the light receiving element, and the defect is detected. Defect detection means for outputting a defect detection signal when detecting the presence of an object; position information reproduction means for reproducing position information at a light beam irradiation position on the optical disk based on an output signal of the light receiving element; An optical disc device comprising: a defect existence position information transmitting unit that transmits defect existence position information to a host device based on a detection result by a defect detection unit and position information reproduced by the information reproduction unit. 2. The apparatus according to claim 1, wherein said defect detection means outputs a defect detection signal assuming that said defect exists when a signal level output from said light receiving element is out of a predetermined level range. 2. The optical disc device according to 1. 3. The defect detecting means includes: A / D converting means for converting an output signal of the light receiving element into a digital signal; and error detecting means for detecting an error based on an error correction code in the digital signal. 2. The optical disk device according to claim 1, wherein when the error occurs at a predetermined value or more, the defect detection signal is output as a signal indicating that the defect exists. 4. An apparatus according to claim 1, further comprising: command receiving means for receiving a test command from a higher-level device; and drive control means for driving said defect location information transmitting means when said test command is received by said command receiving means. The optical disk device according to claim 1, wherein: 5. The irradiation position setting means for irradiating a predetermined number of tracks existing at a predetermined number of track intervals with a light beam when the inspection control command is received by the command receiving means. 5. The optical disk apparatus according to claim 4, wherein the drive means is controlled. 6. The drive control means drives and controls the rotation drive means to rotate the optical disc at a higher speed than a normal information recording / reproducing rotation speed when receiving the inspection command by the command receiving means. The optical disk device according to claim 4, wherein: 7. An optical disk having a plurality of tracks, on which positional information on the disk is recorded in advance, and inspecting the recording surface of the optical disk on which information can be additionally recorded for defects such as scratches and dirt. A recording surface inspection apparatus for an optical disc, comprising: a rotation driving unit for rotating the optical disc; a light source for emitting a light beam; An optical system for receiving light, an irradiation position setting means for setting an irradiation position of the light beam on the optical disk, and receiving the reflected light received by the optical system and outputting an electric signal of a level corresponding to the intensity of the reflected light And detecting the presence of a defect such as a scratch or dirt on the recording surface of the optical disc based on the electric signal output from the light receiving element. A defect detection unit that outputs a defect detection signal when detecting the presence of a defect; and a position information reproduction unit that reproduces position information at a light beam irradiation position on the optical disk based on an output signal of the light receiving element. A defect existence position detection means for detecting a defect existence position based on a detection result by the defect detection means and position information reproduced by the information reproduction means; anddisplay means for displaying the defect existence position on a display. Characteristic optical disk recording surface inspection device. 8. An optical disk recording surface inspection apparatus according to claim 7, wherein said irradiation position setting means irradiates a predetermined number of tracks existing at a predetermined number of track intervals with a light beam. 9. The optical disk recording surface inspection apparatus according to claim 7, wherein said rotation driving means rotates the optical disk at a higher speed than a rotation speed during normal information recording / reproduction. 10. The recording surface inspection of an optical disk according to claim 7, wherein said display means displays the existence position of said defect in a manner superimposed on a planar shape of said optical disk. apparatus. 11. The apparatus according to claim 1, wherein the defect detection unit outputs a defect detection signal assuming that the defect exists when a signal level output from the light receiving element is out of a predetermined level range. 7
11. The optical disk recording surface inspection apparatus according to any one of claims 10 to 10. 12. The defect detection means includes A / D conversion means for converting an output signal of the light receiving element into a digital signal, and error detection means for detecting an error based on an error correction code in the digital signal, 11. The optical disk recording surface inspection apparatus according to claim 7, wherein when the error occurs at a predetermined value or more, the defect detection signal is output as the presence of the defect.