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JPH10172945A - Wafer cleaning device - Google Patents

Wafer cleaning device

Info

Publication number
JPH10172945A
JPH10172945A JP34468296A JP34468296A JPH10172945A JP H10172945 A JPH10172945 A JP H10172945A JP 34468296 A JP34468296 A JP 34468296A JP 34468296 A JP34468296 A JP 34468296A JP H10172945 A JPH10172945 A JP H10172945A
Authority
JP
Japan
Prior art keywords
wafer
cleaning
cover
pure water
nozzle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP34468296A
Other languages
Japanese (ja)
Inventor
Taichi Shiojima
太一 塩島
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
UMC Japan Co Ltd
Original Assignee
Nippon Steel Semiconductor Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Semiconductor Corp filed Critical Nippon Steel Semiconductor Corp
Priority to JP34468296A priority Critical patent/JPH10172945A/en
Publication of JPH10172945A publication Critical patent/JPH10172945A/en
Pending legal-status Critical Current

Links

Landscapes

  • Cleaning By Liquid Or Steam (AREA)
  • Cleaning Or Drying Semiconductors (AREA)

Abstract

PROBLEM TO BE SOLVED: To prevent a wafer from being contaminated by water drops by providing an upper cover which prevents chemicals or cleaning liquid from being splashed and by injecting pure water toward the inside of the upper cover. SOLUTION: A chemical/pure water nozzle 3 is positioned above a rotating table 4 and through which a chemical for etching or the like and pure water for cleaning is injected toward a wafer 5 held on the rotating table 4. The wafer 5 is etched and cleaned. A cover prevents the chemical and pure water from being scattered to the outside of a cleaning chamber in the upper part of a body 6. A cover cleaning nozzle 7 is attached to the body 6 and through which pure water is injected like shower toward the under face of the cover 2 so as to wash out liquid drops attached to the cover 2. The wafer 5 is fixed to the rotating table 4 by a supporting nail 10. Thereafter, the wafer 5 and the rotating table 4 are rotated by a motor.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は、半導体装置の製造に用
いられるウェハー洗浄装置に関するもので、特にウェハ
ーを効率的に洗浄することを目的とする。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a wafer cleaning apparatus used for manufacturing a semiconductor device, and more particularly to an efficient cleaning of a wafer.

【0002】[0002]

【従来技術】ウエハー洗浄装置の従来技術としては、特
開平8−139065号公報に開示されたものが知られ
ている。このウェハー洗浄装置は、ウェハー21を載置
するための凹部22−1を有するフレーム22と、フレ
ーム22を上面に載せ、下方に設けられたモータ(図示
しない)によって回転される回転テーブル23と、フレ
−ム22の中心と回転テーブル23の中心とを貫通し、
フレーム22上に載置されたウェハー21の下面を吸着
して安定させる吸入管24と、回転テーブル23の周囲
に設けられ、ウェハー21を洗浄する洗浄水を噴射する
ウォーターノズル25が側壁を貫通して取り付けられた
円筒形のボディー26と、ボディー26の頂部の出入り
口を開閉するための、上方に凸型形状をしたカバー27
と、ボディー26を保持するベース28とから構成され
ている。
2. Description of the Related Art As a prior art of a wafer cleaning apparatus, one disclosed in Japanese Patent Application Laid-Open No. 8-1390065 is known. The wafer cleaning apparatus includes a frame 22 having a concave portion 22-1 for mounting a wafer 21, a rotary table 23 on which the frame 22 is mounted on an upper surface and rotated by a motor (not shown) provided below. Penetrating the center of the frame 22 and the center of the turntable 23,
A suction pipe 24 for adsorbing and stabilizing the lower surface of the wafer 21 mounted on the frame 22 and a water nozzle 25 provided around the rotary table 23 for spraying cleaning water for cleaning the wafer 21 penetrate the side wall. And a cover 27 having an upwardly convex shape for opening and closing the entrance at the top of the body 26.
And a base 28 that holds the body 26.

【0003】[0003]

【発明が解決しようとする課題】上記従来技術のウエハ
ー洗浄装置では、ボディーとカバーによって洗浄水の外
部への飛散は防止できる。しかしながら、カバーの下面
に形成された水滴がボディー内部でウェハーの表面に落
下して半導体チップの表面に傷を生じたり、半導体チッ
プを汚染するなどの問題がある。この解決案として上部
カバーを凸形にしたり、頂角を鈍角にしてカバーの下面
に形成された水滴が端の方に流れるようにしているが、
水滴の粘度や含まれた不純物によっては端に流れる前
に、ウェハー上に落下してしまうという問題があった。
従って、本発明の目的は、上記問題点を解決し、水滴に
よるウェハーの汚染の防止が可能な改善されたウェハー
洗浄装置を提供することある。
In the above-described conventional wafer cleaning apparatus, scattering of the cleaning water to the outside can be prevented by the body and the cover. However, there is a problem in that water droplets formed on the lower surface of the cover fall on the surface of the wafer inside the body, causing damage to the surface of the semiconductor chip and contaminating the semiconductor chip. As a solution to this, the upper cover is made convex or the apex angle is made obtuse so that water droplets formed on the lower surface of the cover flow toward the end,
Depending on the viscosity of the water droplet and the impurities contained therein, there is a problem that the water droplet may drop on the wafer before flowing to the edge.
SUMMARY OF THE INVENTION Accordingly, an object of the present invention is to provide an improved wafer cleaning apparatus which can solve the above-mentioned problems and can prevent contamination of a wafer by water droplets.

【0004】[0004]

【課題を解決するため手段】上記従来技術の課題を解決
するための本発明のウエハー洗浄装置は、ウェハーを保
持し回転させる回転テーブルと、この回転テーブルの上
方に設置され、ウェハーをエッチングするための薬液と
ウエハーを洗浄するための洗浄液の少なくとも一方を噴
射するノズルと、薬液又は洗浄液の飛散を防止するため
の上部カバーと、この上部カバーの内部に向けて純水を
噴射するカバー洗浄ノズルと、ウェハーを出し入れする
扉を有するボディーと、上記ボディーを保持するベース
とを備えている。
A wafer cleaning apparatus according to the present invention for solving the above-mentioned problems of the prior art is provided with a rotary table for holding and rotating a wafer, and a rotary table installed above the rotary table for etching the wafer. A nozzle for injecting at least one of a chemical solution and a cleaning solution for cleaning the wafer, an upper cover for preventing scattering of the chemical solution or the cleaning solution, and a cover cleaning nozzle for spraying pure water toward the inside of the upper cover. , A body having a door for taking in and out a wafer, and a base for holding the body.

【0005】[0005]

【実施例】図1は本発明の一実施例のウェハー洗浄装置
の構造を示す断面図である。ウェハー5は、下方のモー
ター(図示しない)によって回転される回転テーブル4
上に開閉可能な支持爪10で固定される。ボディー6
は、上下に開閉可能な扉8を持ち、左右の搬送室からウ
ェハー5を出し入れする。回転テーブル4は、上下運動
されることにより、扉8を通して搬入/搬出されるウェ
ハー5を支持爪10により、つかんだりはなしたりす
る。
FIG. 1 is a sectional view showing the structure of a wafer cleaning apparatus according to one embodiment of the present invention. The wafer 5 has a rotating table 4 rotated by a lower motor (not shown).
It is fixed on a support claw 10 which can be opened and closed. Body 6
Has a door 8 that can be opened and closed up and down, and puts the wafer 5 in and out of the left and right transfer chambers. The rotary table 4 is vertically moved, so that the wafer 5 loaded / unloaded through the door 8 is gripped or released by the support claws 10.

【0006】薬液/純水ノズル3は、テーブル4上に位
置しエッチング用などの薬液や洗浄用の純水を回転テー
ブル4上に保持されたウェハー5に噴射し、ウェハー5
をエッチングしたり洗浄したりする。カバー2は、ボデ
ィー6の上部における洗浄室の外部への薬液や純水の飛
散を防止する。カバー洗浄ノズル7は、ボディー6に取
り付けられると共に、カバー2に付着した液滴を洗い流
すように、カバー2の下面に向けてシャワー状に純水を
噴射する。
The chemical / pure water nozzle 3 is located on the table 4 and injects a chemical such as etching and pure water for cleaning onto the wafer 5 held on the rotary table 4.
Is etched or washed. The cover 2 prevents scattering of a chemical solution or pure water to the outside of the cleaning chamber in the upper part of the body 6. The cover washing nozzle 7 is attached to the body 6 and sprays pure water toward the lower surface of the cover 2 in a shower-like manner so as to wash out droplets attached to the cover 2.

【0007】この実施例のウェハー洗浄装置1におい
て、 ウェハー5は、 支持爪10で回転テーブル4に固定
される。その後、ウェハー5と回転テーブル4とがモー
ター(図示しない)によって回転される。同時に、薬液
/純水ノズル3から、エッチング液が1.5kg/cm2 〜2.5k
g/cm2 の吐出圧で噴射され、ウェハー5がエッチングさ
れる。エッチングの終了後に、薬液/純水ノズル3から
純水が噴射され、ウェハー5上に残留している薬液が洗
い流される。このウエハーの洗浄ト同時に、カバー洗浄
ノズル7からカバー2の下面に向けて、1.5kg/cm2 〜2.
5kg/cm2 の吐出圧で純水が噴射される。
In the wafer cleaning apparatus 1 of this embodiment, the wafer 5 is fixed to the turntable 4 by the support claws 10. Thereafter, the wafer 5 and the turntable 4 are rotated by a motor (not shown). At the same time, the etchant from the chemical / pure water nozzle 3 is 1.5kg / cm 2 -2.5k
The ejection is performed at a discharge pressure of g / cm 2 , and the wafer 5 is etched. After the end of the etching, pure water is sprayed from the chemical / pure water nozzle 3, and the chemical remaining on the wafer 5 is washed away. At the same time as the cleaning of the wafer, 1.5 kg / cm 2 to 2.
Pure water is injected at a discharge pressure of 5 kg / cm 2 .

【0008】カバー洗浄ノズル7はシャワー状の純水の
噴射流を形成できるように先端が細かく分岐されてお
り、1個や2個程度の少ない個数ででカバー2の全面を
洗浄できる。このときの噴射時間は、ウェハー5をエッ
チングする場合、エッチングの終了後に薬液/純水ノズ
ル3から洗浄用の純水が噴射されるのと同時に5秒間か
ら10秒間とする。
The tip of the cover cleaning nozzle 7 is finely branched so that a shower-like jet of pure water can be formed, and the entire surface of the cover 2 can be cleaned with a small number of one or two. In this case, when the wafer 5 is etched, the cleaning time is set to 5 seconds to 10 seconds at the same time when the cleaning pure water is sprayed from the chemical / pure water nozzle 3 after the etching is completed.

【0009】ウェハー5に対して純水による洗浄のみ行
う場合は、薬液/純水ノズル3からの純水の噴射が終了
する直前の15秒前から5秒間のみ、カバー洗浄ノズル
7から純水の噴射を行う。洗浄終了後、回転テーブル4
は、薬液/純水ノズル3から何も噴射されない状態で回
転を続け、ウェハー5上に残留する水を振り切る。ウエ
ハーは、その後、扉8を通して搬出される。
In the case where only cleaning with pure water is performed on the wafer 5, pure water is supplied from the cover cleaning nozzle 7 only for 5 seconds from 15 seconds immediately before the injection of the pure water from the chemical / pure water nozzle 3 ends. Perform injection. After cleaning, turn table 4
Keeps rotating without spraying anything from the chemical / pure water nozzle 3, and shakes off the water remaining on the wafer 5. The wafer is then unloaded through door 8.

【0010】図2は、本発明の他の実施例のウエハー洗
浄装置の構成を示すブロック図であり、本図中、図1と
同一の参照番号を付した構成要素は、既に説明した図1
中の対応の構成要素と同一のものであるから重複する説
明を省略する。この実施例のウェハー洗浄装置では、カ
バー洗浄ノズル側のカバー2の高さをほぼ1cmだけ高
くすることにより図1の場合と同様の効果を得ることが
できる。
FIG. 2 is a block diagram showing the configuration of a wafer cleaning apparatus according to another embodiment of the present invention. In FIG. 2, the components denoted by the same reference numerals as those in FIG.
Since they are the same as corresponding components in the figure, duplicate description will be omitted. In the wafer cleaning apparatus of this embodiment, the same effect as in FIG. 1 can be obtained by increasing the height of the cover 2 on the cover cleaning nozzle side by approximately 1 cm.

【0011】[0011]

【発明の効果】以上詳細に説明したように、本発明のウ
ェハー洗浄装置は、カバーの下面に形成された水滴が効
率よく洗浄されるため、水滴内の薬液成分および洗浄屑
が除去され、従来装置の問題であったカバーの下面に形
成された水滴が端の方に流れてウェハー上に落下するこ
とを防ぐことができる。
As described above in detail, in the wafer cleaning apparatus of the present invention, since the water droplets formed on the lower surface of the cover are efficiently cleaned, the chemical components and the cleaning debris in the water droplets are removed, and the wafer cleaning device according to the present invention is used. Water droplets formed on the lower surface of the cover, which is a problem of the apparatus, can be prevented from flowing toward the end and falling onto the wafer.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施例のウエハー洗浄装置の構成を
示す断面図である。
FIG. 1 is a sectional view showing a configuration of a wafer cleaning apparatus according to one embodiment of the present invention.

【図2】本発明の他の実施例のウエハー洗浄装置の構成
を示す断面図である。
FIG. 2 is a sectional view showing a configuration of a wafer cleaning apparatus according to another embodiment of the present invention.

【図3】従来のウエハー洗浄装置の構成を示す断面図で
ある。
FIG. 3 is a cross-sectional view illustrating a configuration of a conventional wafer cleaning apparatus.

【符号の説明】[Explanation of symbols]

1 ウエハー洗浄装置 2 カバー 3 薬液/純水ノズル 4 回転テーブル 5 ウエハー 6 ボディー 7 カバー洗浄ノズル 9 ベース DESCRIPTION OF SYMBOLS 1 Wafer cleaning apparatus 2 Cover 3 Chemical liquid / pure water nozzle 4 Rotary table 5 Wafer 6 Body 7 Cover cleaning nozzle 9 Base

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】支持爪その他の保持手段によりウェハーを
保持すると共にモータによって回転される回転テーブル
と、 前記回転テーブル上方に設置され、ウエハーを処理する
ための薬液とこのウエハーを洗浄するための洗浄液の少
なくとも一方を噴射する噴射ノズルと、 この噴射ノズルから噴射される薬液又は洗浄液の飛散を
防止するための上部カバーと、 前記上部カバーの内部に向けて純水その他の洗浄液を噴
射するカバー洗浄ノズルと、 ウェハーを出し入れする扉を有するボディーとを備えた
ことを特徴とするウェハー洗浄装置。
1. A rotating table which holds a wafer by a supporting claw or other holding means and is rotated by a motor, a chemical solution disposed above the rotating table, for treating a wafer, and a cleaning solution for cleaning the wafer. An injection nozzle for injecting at least one of the following: an upper cover for preventing a chemical solution or a cleaning liquid injected from the injection nozzle from scattering; and a cover cleaning nozzle for injecting pure water or another cleaning liquid toward the inside of the upper cover. And a body having a door for taking in and out the wafer.
【請求項2】 請求項1において、 前記カバー洗浄ノズルからの洗浄液の噴射は、前記噴射
ノズルからの洗浄液の噴射の期間内に行われることを特
徴とするウエハー洗浄装置。
2. The wafer cleaning apparatus according to claim 1, wherein the ejection of the cleaning liquid from the cover cleaning nozzle is performed within a period of the injection of the cleaning liquid from the injection nozzle.
【請求項3】 請求項1又は2において、 前記カバー洗浄ノズルからの洗浄液の噴射は、前記噴射
ノズルからの洗浄液の噴射が終了する直前の短期間にわ
たって行われることを特徴とするウエハー洗浄装置。
3. The wafer cleaning apparatus according to claim 1, wherein the jetting of the cleaning liquid from the cover cleaning nozzle is performed for a short period immediately before the jetting of the cleaning liquid from the jet nozzle is completed.
JP34468296A 1996-12-09 1996-12-09 Wafer cleaning device Pending JPH10172945A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP34468296A JPH10172945A (en) 1996-12-09 1996-12-09 Wafer cleaning device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP34468296A JPH10172945A (en) 1996-12-09 1996-12-09 Wafer cleaning device

Publications (1)

Publication Number Publication Date
JPH10172945A true JPH10172945A (en) 1998-06-26

Family

ID=18371169

Family Applications (1)

Application Number Title Priority Date Filing Date
JP34468296A Pending JPH10172945A (en) 1996-12-09 1996-12-09 Wafer cleaning device

Country Status (1)

Country Link
JP (1) JPH10172945A (en)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000216122A (en) * 1999-01-20 2000-08-04 Toshiba Ceramics Co Ltd Surface grinding method for semiconductor wafer
KR100558539B1 (en) * 1999-02-22 2006-03-10 삼성전자주식회사 Etch Cover Cleaning Tool
US7578887B2 (en) * 2003-01-28 2009-08-25 Ebara Corporation Apparatus for and method of processing substrate
CN103187339A (en) * 2011-12-28 2013-07-03 大日本网屏制造株式会社 Substrate processing apparatus and substrate processing method
JP2014042843A (en) * 2013-11-25 2014-03-13 Fujifilm Corp Washing and sterilizing apparatus and control method of washing and sterilizing apparatus
JP2014075438A (en) * 2012-10-03 2014-04-24 Ebara Corp Substrate cleaning device and polishing device
KR20160060475A (en) * 2014-11-20 2016-05-30 주식회사 제우스 Substrate liquid processing apparatus and substrate liquid processing method
JP2019533315A (en) * 2016-10-25 2019-11-14 エーシーエム リサーチ (シャンハイ) インコーポレーテッド Apparatus and method for wet process on semiconductor substrate
TWI774756B (en) * 2018-04-24 2022-08-21 大陸商盛美半導體設備(上海)股份有限公司 Apparatus and method for wet processing of semiconductor substrates

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000216122A (en) * 1999-01-20 2000-08-04 Toshiba Ceramics Co Ltd Surface grinding method for semiconductor wafer
KR100558539B1 (en) * 1999-02-22 2006-03-10 삼성전자주식회사 Etch Cover Cleaning Tool
US7578887B2 (en) * 2003-01-28 2009-08-25 Ebara Corporation Apparatus for and method of processing substrate
CN103187339A (en) * 2011-12-28 2013-07-03 大日本网屏制造株式会社 Substrate processing apparatus and substrate processing method
JP2014075438A (en) * 2012-10-03 2014-04-24 Ebara Corp Substrate cleaning device and polishing device
US10096492B2 (en) 2012-10-03 2018-10-09 Ebara Corporation Substrate cleaning apparatus and polishing apparatus
JP2014042843A (en) * 2013-11-25 2014-03-13 Fujifilm Corp Washing and sterilizing apparatus and control method of washing and sterilizing apparatus
KR20160060475A (en) * 2014-11-20 2016-05-30 주식회사 제우스 Substrate liquid processing apparatus and substrate liquid processing method
JP2019533315A (en) * 2016-10-25 2019-11-14 エーシーエム リサーチ (シャンハイ) インコーポレーテッド Apparatus and method for wet process on semiconductor substrate
US11626297B2 (en) 2016-10-25 2023-04-11 Acm Research (Shanghai), Inc. Apparatus and method for wet process on semiconductor substrate
TWI774756B (en) * 2018-04-24 2022-08-21 大陸商盛美半導體設備(上海)股份有限公司 Apparatus and method for wet processing of semiconductor substrates

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