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JPH09264851A - Evaluator for grain particle - Google Patents

Evaluator for grain particle

Info

Publication number
JPH09264851A
JPH09264851A JP7651896A JP7651896A JPH09264851A JP H09264851 A JPH09264851 A JP H09264851A JP 7651896 A JP7651896 A JP 7651896A JP 7651896 A JP7651896 A JP 7651896A JP H09264851 A JPH09264851 A JP H09264851A
Authority
JP
Japan
Prior art keywords
grain
light
rice
quality
evaluation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7651896A
Other languages
Japanese (ja)
Other versions
JP3281794B2 (en
Inventor
Susumu Morimoto
進 森本
Ryoji Suzuki
良治 鈴木
Susumu Uenaka
進 上中
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kubota Corp
Original Assignee
Kubota Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kubota Corp filed Critical Kubota Corp
Priority to JP07651896A priority Critical patent/JP3281794B2/en
Publication of JPH09264851A publication Critical patent/JPH09264851A/en
Application granted granted Critical
Publication of JP3281794B2 publication Critical patent/JP3281794B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Sorting Of Articles (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PROBLEM TO BE SOLVED: To properly evaluate the quality of grain particles by a transmission image formed by transmitted light from the center part of the grain particle to prevent improper evaluation of the quality of the grain particle as caused by undesired transmission light from the peripheral part of the grain particle. SOLUTION: A transmission light through a location S intended for existence of grain particles (k) illuminated by a lighting means 2 such as white light source 2a is taken by an image pickup means 3 per pixel with the size thereof smaller than that of each grain particle. Thus, the quality such as acceptance of the grain particle is evaluated according to the quantity of the transmission light with a specified wavelength component passing through a filter means 8 based on image information corresponding to an evaluation range as specified range containing the center part in the existing area of each grain particle.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、穀粒を透過する特
定波長成分の光の透過光量によって穀粒の品質を評価す
る穀粒の評価装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a grain evaluation device for evaluating the quality of a grain based on the amount of transmitted light of a specific wavelength component transmitted through the grain.

【0002】[0002]

【従来の技術】上記穀粒の評価装置では、例えば、評価
すべき穀粒としての米粒(玄米)を一列状に移送しなが
ら横方向から特定波長の照明光で照明して、その米粒を
透過した透過光をシリコンフォトセル等の受光素子で受
光したときの透過光量の大きさによって米粒の良否等を
判定するようにしていた(例えば、特公平3−7335
4公報参照)。
2. Description of the Related Art In the above-mentioned grain evaluation apparatus, for example, rice grains (brown rice) as grains to be evaluated are transferred in a row while being illuminated with illumination light of a specific wavelength from the lateral direction to transmit the grains. The quality of rice grains is determined based on the amount of transmitted light when the transmitted light is received by a light receiving element such as a silicon photocell (for example, Japanese Patent Publication No. 3-7335).
4 gazette).

【0003】[0003]

【発明が解決しようとする課題】しかしながら、上記従
来技術では、穀粒の全体を透過した透過光を受光してい
るので、その透過光量には、穀粒の中心部の厚みが充分
に厚い部分を透過した光とともに、穀粒の周辺部の厚み
が薄い部分を透過し、穀粒の表面の凹凸状態等の影響を
受けた光、つまり穀粒についての情報量が少ない一方で
ノイズ的な情報を含む光も存在するため、穀粒の品質評
価が不適切になるおそれがあった。
However, in the above-mentioned prior art, since the transmitted light transmitted through the whole grain is received, the amount of transmitted light is such that the central portion of the grain is thick enough. Light that has been transmitted through the grain and is transmitted through the thin part of the peripheral part of the grain, and is affected by the unevenness of the grain surface, that is, the amount of information about the grain is small but noise-like information. Since there is also light containing, there is a possibility that the quality evaluation of the grain may be inappropriate.

【0004】本発明は、上記実情に鑑みてなされたもの
であって、その目的は、上記従来技術の不具合を解消す
べく、穀粒の周辺部からの不要な透過光の影響によって
穀粒の品質評価が不適切になることを防止することであ
る。
The present invention has been made in view of the above circumstances, and an object thereof is to eliminate the disadvantages of the above-mentioned prior art by the influence of unnecessary transmitted light from the peripheral portion of the grain. It is to prevent the quality evaluation from becoming inappropriate.

【0005】[0005]

【課題を解決するための手段】請求項1の構成によれ
ば、照明光が穀粒の存在予定箇所を透過したときの透過
画像が、穀粒の大きさよりも小さい大きさの画素を単位
として撮像され、その撮像画像情報における穀粒の存在
領域のうちで、その中心部を含む所定範囲として抽出し
た評価対象範囲に対応する画像情報つまりその評価対象
範囲内の各画素についての特定波長成分の光の透過光量
によって穀粒の品質を評価する。
According to the structure of claim 1, the transmission image when the illumination light is transmitted through the planned location of the grain has a unit of a pixel having a size smaller than the size of the grain. The image information corresponding to the evaluation target range extracted as a predetermined range including the central portion of the area where the grain is captured in the captured image information, that is, the specific wavelength component of each pixel in the evaluation target range Grain quality is evaluated by the amount of light transmitted.

【0006】従って、穀粒の透過画像のうちで中心部を
含む所定範囲の画像だけを評価対象とするので、従来の
ように、穀粒の全体を透過した透過光量を処理するため
に、穀粒の周辺部の厚みが薄い部分を透過し、又、穀粒
の表面の凹凸状態等の影響を受けている不要で且つノイ
ズ的な情報を含む透過光によって穀粒の品質評価が不適
切になることもなく、良好な品質評価を行うことができ
る。
Therefore, since only the image in the predetermined range including the center portion of the transmission image of the grain is to be evaluated, the grain is transmitted in order to process the amount of light transmitted through the whole grain as in the conventional case. The quality evaluation of grain is inappropriate due to the transmitted light that passes through the thin peripheral part of the grain and is also influenced by the unevenness of the grain surface and contains unnecessary and noise-like information. It is possible to carry out a good quality evaluation without any problem.

【0007】請求項2の構成によれば、請求項1におい
て、評価対象範囲内の各画素についての特定波長成分の
光の透過光量の大きさによって穀粒の品質を評価する。
According to the second aspect of the present invention, in the first aspect, the quality of the grain is evaluated by the magnitude of the transmitted light amount of the light of the specific wavelength component for each pixel within the evaluation target range.

【0008】従って、透過光量の大小によって、穀粒の
良否等の品質評価を明確な基準の下で判断することがで
き、もって、請求項1の好適な手段が得られる。
Therefore, the quality evaluation such as the quality of the grain can be judged based on the magnitude of the amount of transmitted light under a clear standard, and the preferable means of claim 1 can be obtained.

【0009】請求項3の構成によれば、請求項1又は2
において、評価対象範囲内の各画素についての特定波長
成分の光の透過光量のバラツキによって穀粒の品質を評
価する。
According to the configuration of claim 3, claim 1 or 2
In, the quality of the grain is evaluated by the variation in the transmitted light amount of the light of the specific wavelength component for each pixel in the evaluation target range.

【0010】従って、例えば評価対象範囲における透過
光量の大きさだけで穀粒の品質を評価する場合には、透
過光量が極端に小さい部分つまり品質の悪い部分が部分
的に存在していても全体的な透過光量の大きさが平均的
な値であるときには、不良として判断されないおそれが
あるのに比べて、上記透過光量が極端に小さい部分によ
って透過光量のバラツキが大きくなることによって不良
の穀粒と判断でき、もって、請求項1又は2の好適な手
段が得られる。
Therefore, for example, when the quality of the grain is evaluated only by the magnitude of the amount of transmitted light in the range to be evaluated, even if there is a portion where the amount of transmitted light is extremely small, that is, a portion of poor quality exists, When the size of the transmitted light amount is an average value, it may not be judged as a defect, whereas the variation in the transmitted light amount due to the extremely small amount of the transmitted light is large and thus the defective grain. Therefore, the preferred means of claim 1 or 2 can be obtained.

【0011】請求項4の構成によれば、請求項1、2又
は3において、400nmから500nmの範囲に含ま
れる第1特定波長成分と、630nmから680nmの
範囲に含まれる第2特定波長成分の2つの波長成分の夫
々の光が前記穀粒の評価対象範囲を透過するときの透過
光量の情報のうちで、いずれか一方の波長成分あるいは
両方の波長成分についての透過光量によって、米粒の品
質を評価する。
According to the structure of claim 4, in claim 1, 2 or 3, the first specific wavelength component contained in the range of 400 nm to 500 nm and the second specific wavelength component contained in the range of 630 nm to 680 nm. Among the information on the amount of transmitted light when the light of each of the two wavelength components passes through the evaluation target range of the grain, the quality of the rice grain is determined by the amount of transmitted light of one wavelength component or both wavelength components. evaluate.

【0012】従って、米粒の評価に適する上記2つの波
長成分についての透過光量の情報を、米粒の状態等を判
断しながら、より適切な評価ができるように適宜選択し
て使用することができ、もって、請求項1、2又は3の
好適な手段が得られる。
Therefore, the information on the amount of transmitted light of the above-mentioned two wavelength components suitable for evaluation of rice grains can be appropriately selected and used so that more appropriate evaluation can be performed while judging the state of rice grains, Therefore, the preferred means of claim 1, 2 or 3 can be obtained.

【0013】請求項5の構成によれば、請求項4におい
て、第1及び第2特定波長成分の2つの波長成分の光の
うちの少なくとも一方の光についての透過光量が設定値
よりも大きい米粒を良品と判定し、その透過光量が設定
値よりも小さい米粒を不良品と判定する。
According to the structure of claim 5, the rice grain according to claim 4, wherein the transmitted light amount of at least one of the light of the two wavelength components of the first and second specific wavelength components is larger than the set value. Is determined to be a non-defective product, and rice grains whose transmitted light amount is smaller than the set value are determined to be defective products.

【0014】従って、米粒の良否だけを明確且つ迅速に
評価することができ、もって、請求項1、2、3又は4
の好適な手段が得られる。
Therefore, only the quality of the rice grain can be clearly and quickly evaluated.
Is obtained.

【0015】請求項6の構成によれば、請求項5におい
て、第1特定波長成分の光に対する透過光量の差、ある
いは、第2特定波長成分の光に対する透過光量の差によ
って、良品における良質米と未熟米とを区別する。
According to the structure of claim 6, in claim 5, due to the difference in the amount of transmitted light for the light of the first specific wavelength component or the difference in the amount of transmitted light for the light of the second specific wavelength component, good quality rice And immature rice.

【0016】従って、良米についてさらに細かい品質の
評価ができ、もって、請求項5の好適な手段が得られ
る。
Therefore, finer quality evaluation of good rice can be performed, and the preferred means of claim 5 can be obtained.

【0017】請求項7の構成によれば、請求項5又は6
において、第2特定波長成分の光に対する透過光量の差
によって、不良品における死米と、着色米と被害米とを
区別する。
According to the configuration of claim 7, claim 5 or 6
In, the dead rice in the defective product, the colored rice and the damaged rice are distinguished from each other by the difference in the amount of transmitted light with respect to the light of the second specific wavelength component.

【0018】従って、不良米についてさらに細かい品質
の評価ができ、もって、請求項5又は6の好適な手段が
得られる。
Therefore, the quality of the defective rice can be evaluated more finely, and the preferred means of claim 5 or 6 can be obtained.

【0019】請求項8の構成によれば、請求項1、2、
3、4、5、6又は7において、広波長光源から発光し
た広い範囲の波長の光のうちの特定波長成分の光のみ
が、その広波長光源から撮像手段までの間の光の経路内
に設けたフィルター手段を通過して、照明光として穀粒
の存在予定箇所に投射され、その穀粒の存在予定箇所を
透過した特定波長成分の光の透過画像が撮像手段にて撮
像される。
According to the structure of claim 8, claims 1, 2,
In 3, 4, 5, 6 or 7, only the light of a specific wavelength component of the light of the wide range of wavelengths emitted from the wide wavelength light source is in the light path from the wide wavelength light source to the imaging means. After passing through the provided filter means, it is projected as illumination light on the planned location of the grain, and a transmission image of the light of the specific wavelength component transmitted through the planned location of the grain is captured by the imaging means.

【0020】従って、白色光源とフィルター手段とを用
いずに、例えば白色光源で照明した穀粒をカラー式の撮
像手段で撮像するのに比べて、白黒式の安価な撮像手段
が使用でき、又、LED等の単色光源を切り換えて特定
波長成分の光を発光させる場合には、最適な波長成分で
高い輝度の光を得るのが難しいのに比べて、フィルター
によって波長設定を容易にしながら光源の輝度を高くす
ることができ、もって、請求項1、2、3、4、5、6
又は7の好適な手段が得られる。
Therefore, as compared with the case where the grain illuminated by the white light source is imaged by the color type image pickup means without using the white light source and the filter means, the black and white type inexpensive image pickup means can be used, and , It is difficult to obtain high-luminance light with an optimum wavelength component when switching a monochromatic light source such as an LED or the like to emit light of a specific wavelength component. It is possible to increase the brightness, and therefore, the claims 1, 2, 3, 4, 5, 6
Or 7 suitable means are obtained.

【0021】請求項9の構成によれば、請求項1、2、
3、4、5、6、7又は8において、評価対象となる種
々の個数の穀粒が一層状態で平面状に並ぶ状態で保持さ
れている穀粒層における各穀粒の存在予定箇所上の位置
が判別され、その位置判別された各穀粒の前記評価対象
範囲における透過光量によって、穀粒の品質を評価す
る。
According to the structure of claim 9, claims 1, 2 and
3, 4, 5, 6, 7 or 8, on the planned location of each grain in the grain layer in which various numbers of grains to be evaluated are held in a state of being arranged in a plane in a single layer state. The position is discriminated, and the quality of the grain is evaluated by the amount of transmitted light in the evaluation target range of each grain whose position is discriminated.

【0022】従って、穀粒を複数個並べた状態で保持し
て各穀粒の品質を評価するので、例えば1個づつ保持し
て評価するのに比べて、多数の穀粒についての品質の評
価を迅速に行うことができ、もって、請求項1、2、
3、4、5、6、7又は8の好適な手段が得られる。
Therefore, since the quality of each grain is evaluated by holding a plurality of grains arranged side by side, it is possible to evaluate the quality of a large number of grains as compared with, for example, holding and evaluating one grain at a time. Can be carried out quickly, and therefore, the claims 1, 2 and
3, 4, 5, 6, 7 or 8 suitable means are obtained.

【0023】請求項10の構成によれば、請求項9にお
いて、広波長光源から発光した広い範囲の波長の光が、
その広波長光源から撮像手段までの間の光の経路から退
出したフィルター手段を通過せず、そのまま照明光とし
て穀粒の存在予定箇所に投射され、その穀粒の存在予定
箇所を透過した光の透過画像が撮像手段にて撮像され、
その透過光量が設定値よりも小さいと穀粒が存在し、透
過光量が設定値よりも大きいと穀粒が存在しないとし
て、穀粒層における各穀粒の存在位置が判別され、その
存在位置が判別された各穀粒について品質が評価され
る。
According to the structure of claim 10, in claim 9, the light of a wide wavelength range emitted from the wide wavelength light source is
It does not pass through the filter means that has exited from the light path between the wide-wavelength light source and the image pickup means, and is projected as the illumination light as it is to the planned location of the grain, and the light transmitted through the planned location of the grain The transparent image is captured by the image capturing means,
If the transmitted light amount is less than the set value, the grain exists, and if the transmitted light amount is greater than the set value, the grain does not exist, and the presence position of each grain in the grain layer is determined, and the presence position is The quality is evaluated for each determined grain.

【0024】従って、穀粒の品質評価用に備えた広波長
光源と撮像手段とを利用して、白色光によって穀粒層に
おける各穀粒の位置を的確に判別することができ、もっ
て、請求項9の好適な手段が得られる。
Therefore, the position of each grain in the grain layer can be accurately discriminated by the white light by utilizing the wide wavelength light source and the image pickup means provided for grain quality evaluation. The preferred measure of Item 9 can be obtained.

【0025】[0025]

【発明の実施の形態】以下、本発明の穀粒の評価装置の
実施形態を、米粒を評価すべき穀粒とする場合について
図面に基づいて説明する。
BEST MODE FOR CARRYING OUT THE INVENTION Embodiments of the grain evaluation apparatus of the present invention will be described below with reference to the drawings in which rice grains are used as grains to be evaluated.

【0026】図1及び図2に示すように、複数個の米粒
kをその存在予定箇所Sに載置させて保持する透明ガラ
ス性の支持板1が設けられ、その支持板1の下方側に、
上記存在予定箇所Sに対して照明光を投射する照明手段
としての照明光源2が上向きの状態で設けられ、支持板
1の上方側に、結像レンズ3aとCCD撮像素子3bと
を備えた下向き撮像方向の白黒式のCCDカメラ3が設
けられている。以上より、米粒の存在予定箇所Sにおい
て複数個の米粒が一層状態で平面状に並んだ穀粒層を保
持することができる穀粒保持手段が、支持板1にて構成
され、又、照明光源2からの照明光が米粒kの存在予定
箇所Sを透過したときの透過画像を、穀粒kの大きさよ
りも小さい大きさの画素を単位として撮像する撮像手段
が、CCDカメラ3にて構成される。尚、ここでは、米
粒kの存在予定箇所Sを、所定個数の複数個の米粒kが
存在する大きさに形成しているが、個数が異なる場合
や、1個の米粒kだけの場合等には、その個数に応じた
大きさに形成する。
As shown in FIG. 1 and FIG. 2, a transparent glass support plate 1 for placing and holding a plurality of rice grains k at the planned location S is provided, and below the support plate 1 is provided. ,
An illuminating light source 2 as an illuminating means for projecting illuminating light to the planned location S is provided in an upward state, and is provided above the support plate 1 with an imaging lens 3a and a CCD image pickup device 3b in a downward direction. A monochrome CCD camera 3 in the image pickup direction is provided. From the above, the grain holding means capable of holding a grain layer in which a plurality of rice grains are arranged in a plane in a single layer at the rice grain planned location S is constituted by the support plate 1 and the illumination light source. The CCD camera 3 is configured as an image pickup unit that picks up a transmission image when the illumination light from 2 passes through the planned location S of the rice grain k in units of pixels having a size smaller than the size of the grain k. It In addition, here, the planned location S of rice grains k is formed in a size such that a predetermined number of rice grains k are present. However, when the number of rice grains k is different, or when there is only one rice grain k, etc. Are formed in a size corresponding to the number.

【0027】前記照明光源2は、広い範囲の波長の光を
発光する広波長光源としての白色ランプ2aにて構成さ
れている。そして、その白色ランプ2aの発光波長のう
ちの特定波長成分の光のみを通過させて前記CCDカメ
ラ3が受光する状態に切り換え自在なフィルター手段と
してのバンドパスフィルタ8が、照明光源2からCCD
カメラ3までの間の光の経路内に(具体的にはCCDカ
メラ3の直面位置)に設けられている。
The illumination light source 2 is composed of a white lamp 2a as a wide wavelength light source which emits light of a wide range of wavelengths. Then, a bandpass filter 8 as a filter means that can switch to a state in which only the light of a specific wavelength component of the emission wavelength of the white lamp 2a is passed and the CCD camera 3 receives the light is provided from the illumination light source 2 to the CCD.
It is provided in the light path to the camera 3 (specifically, at the facing position of the CCD camera 3).

【0028】バンドパスフィルタ8は、図3にも示すよ
うに、400nmから500nmの範囲に含まれる第1
特定波長成分(450nm付近)、及び、630nmか
ら680nmの範囲に含まれる第2特定波長成分(65
0nm付近)の各光を透過するフィルタ部8aを備えた
円板がフィルタ切換用モータ7によって回転されて、そ
の各フィルタ部8aが結像レンズ3aの前に位置するよ
うになっている。また、上記バンドパスフィルタ8は、
照明光源2からCCDカメラ3までの間の光の経路に対
して挿入退出自在に構成されている。つまり、白色ラン
プ2aからの光をそのまま使用するときは、バンドパス
フィルタ8を照明光源2からCCDカメラ3までの間の
光の経路から退出させるべく、フィルタ部8aが形成さ
れていない切欠部分が結像レンズ3aの前に位置するよ
うにフィルタ切換用モータ7が作動する。
As shown in FIG. 3, the bandpass filter 8 includes the first bandpass filter 8 included in the range of 400 nm to 500 nm.
The specific wavelength component (around 450 nm) and the second specific wavelength component (65 included in the range of 630 nm to 680 nm)
A disk provided with a filter portion 8a that transmits each light of about 0 nm) is rotated by the filter switching motor 7, and each filter portion 8a is positioned in front of the imaging lens 3a. Further, the bandpass filter 8 is
It is configured so that it can be inserted into and removed from the light path from the illumination light source 2 to the CCD camera 3. That is, when the light from the white lamp 2a is used as it is, the band pass filter 8 is removed from the path of the light from the illumination light source 2 to the CCD camera 3 so that the cutout portion where the filter portion 8a is not formed is formed. The filter switching motor 7 operates so as to be positioned in front of the imaging lens 3a.

【0029】制御構成について説明すると、図4に示す
ように、マイクロコンピュータ利用の制御装置5が設け
られ、この制御装置5に、前記CCDカメラ3の撮像画
像信号が入力されている。一方、制御装置5からは、前
記フィルタ切換用モータ7に対する駆動信号と、後述の
ように各種の情報を表示するためのテレビモニター9に
対する画像信号とが出力されている。
The control configuration will be described. As shown in FIG. 4, a control device 5 utilizing a microcomputer is provided, and the image pickup image signal of the CCD camera 3 is input to the control device 5. On the other hand, the control device 5 outputs a drive signal for the filter switching motor 7 and an image signal for the television monitor 9 for displaying various kinds of information as described later.

【0030】前記制御装置5を利用して、前記CCDカ
メラ3の撮像画像情報に基づいて、前記穀粒層における
各米粒k夫々についての前記存在予定箇所S上の存在位
置を判別する位置判別手段100が構成されている。具
体的には、前記バンドパスフィルタ8が照明光源2から
CCDカメラ3までの間の光の経路から退出した状態
で、前記存在予定箇所Sの穀粒層を透過した照明光(白
色ランプ2aからの光)の透過光量が設定値よりも小さ
いときに米粒kの存在を検出して、前記各米粒の存在位
置を判別する。そして、この位置判別された各米粒kの
位置が、前記テレビモニター9の画面上に表示される。
A position discriminating means for discriminating the existing position on the planned existing place S for each rice grain k in the grain layer based on the image information of the CCD camera 3 using the control device 5. 100 are configured. Specifically, with the bandpass filter 8 leaving the light path from the illumination light source 2 to the CCD camera 3, the illumination light (from the white lamp 2a) that has passed through the grain layer at the planned existence location S. When the amount of transmitted light is smaller than the set value, the existence of the rice grain k is detected, and the existing position of each rice grain is determined. Then, the position of each rice grain k whose position has been determined is displayed on the screen of the television monitor 9.

【0031】上記米粒の位置判別について説明する。図
5に示すように、矩形状の前記存在予定箇所Sの横方向
をX方向に縦方向をY方向に設定し、CCDカメラ3の
CCD撮像素子3bをY方向に沿う各走査線においてX
方向に沿って走査駆動すると、各画素p毎の出力波形が
得られる。図において、x0は米粒kの存在しない箇所
の透過光の光量レベル、x1はこれより透過光量が少な
くなると米粒kが存在すると判断される米粒存否判断の
光量レベルを示すので、図6に示すように、この米粒存
否判断の光量レベルx1よりも小さい光量レベルの画素
pが連なった画像領域を各米粒kの存在領域として各米
粒kの位置を特定する。尚、x2は、これより透過光量
が少なくなると正常な米粒kではない着色米や異物等の
不良物が存在すると判断される光量レベルを示す。
The position discrimination of the rice grain will be described. As shown in FIG. 5, the horizontal direction of the planned existing location S having a rectangular shape is set to the X direction and the vertical direction is set to the Y direction, and the CCD image pickup device 3b of the CCD camera 3 is set to X in each scanning line along the Y direction.
When scanning is driven along the direction, an output waveform for each pixel p is obtained. In the figure, x0 indicates the light intensity level of the transmitted light in the portion where the rice grain k does not exist, and x1 indicates the light intensity level of the rice grain k existence determination that the rice grain k exists when the amount of transmitted light becomes smaller than this, so as shown in FIG. In addition, the position of each rice grain k is specified by setting the image region in which the pixels p of the light amount level smaller than the light amount level x1 of the rice grain presence / absence determination are continuous as the existence region of each rice grain k. Note that x2 indicates a light amount level at which it is determined that a defective substance such as colored rice or a foreign substance that is not a normal rice grain k exists if the transmitted light amount is smaller than this.

【0032】又、前記制御装置5を利用して、前記CC
Dカメラ3の撮像画像情報に基づいて、米粒kの存在領
域(各米粒kに対応する画素pの集まり)のうちで、図
6に示すように、その中心部を含む矩形状等の所定範囲
を評価対象範囲htとして抽出して、その評価対象範囲
htに対応する画像情報に基づいて、つまり前記第1及
び第2特定波長成分の光のうちの少なくとも一方の波長
成分の光に対する前記評価対象範囲ht内の各画素pの
透過光量の大きさによって、米粒kの品質を評価する品
質評価手段200が構成されている。上記評価対象範囲
htは、米粒kの存在領域のX方向での幅ΔX及びY方
向での幅ΔYの中点位置を中心として、例えば米粒kの
大きさの3分の1程度になるように設定する。そして、
この品質評価手段200は、前記位置判別手段100の
情報に基づいて、前記穀粒層における位置が判別された
各米粒k夫々についての透過画像によって求めた透過光
量によって各米粒の品質評価を行う。
Further, by using the control device 5, the CC
Based on the imaged image information of the D camera 3, within a region where rice grains k are present (a group of pixels p corresponding to each rice grain k), as shown in FIG. As the evaluation target range ht, and based on the image information corresponding to the evaluation target range ht, that is, the evaluation target for the light of at least one wavelength component of the light of the first and second specific wavelength components. A quality evaluation unit 200 that evaluates the quality of the rice grain k is configured based on the amount of transmitted light of each pixel p within the range ht. The evaluation target range ht is set to be, for example, about one-third of the size of the rice grain k around the midpoint position of the width ΔX in the X direction and the width ΔY in the Y direction of the existing region of the rice grain k. Set. And
The quality evaluation means 200 evaluates the quality of each rice grain based on the information of the position determination means 100 based on the amount of transmitted light obtained from the transmission image for each rice grain k whose position in the grain layer is determined.

【0033】実際には、透過光量の大きさを透過率によ
って判断する。つまり、支持板1上に米粒kが存在しな
い状態での透過光量を基準として米粒kが存在する状態
での透過光量のレベルをパーセントで表す。そして、具
体的な評価の内容として、先ず、前記第1及び第2特定
波長成分の光に対する透過率(評価対象範囲ht内の各
画素pでの透過率の平均値を意味する)が設定値よりも
大きい米粒を良品と判定し、その透過率が設定値よりも
小さい米粒を不良品と判定する。つまり、図7に示すよ
うに、第1特定波長成分(450nm付近)の光に対し
ては、良米a,bの透過率はおおよそ40%〜60%の
間にあるのに対して、不良米c,d,eの透過率はおお
よそ25%〜20%の間にあるので、透過率33%程度
に設定値を決めると米粒の良否が判定でき、第2特定波
長成分(650nm付近)の光に対しては、良米a,b
の透過率はおおよそ75%〜86%の間にあるのに対し
て、不良米c,d,eの透過率はおおよそ52%〜28
%の間にあるので、透過率63%程度に設定値を決める
と米粒の良否が判定できることになる。
In practice, the amount of transmitted light is determined by the transmittance. That is, the level of the amount of transmitted light when the rice grains k are present is expressed in percent with reference to the amount of transmitted light when the rice grains k are not present on the support plate 1. As specific contents of the evaluation, first, the transmittance for the light of the first and second specific wavelength components (meaning the average value of the transmittance at each pixel p within the evaluation target range ht) is set to the set value. A rice grain larger than this is determined as a good product, and a rice grain whose transmittance is smaller than the set value is determined as a defective product. That is, as shown in FIG. 7, with respect to the light of the first specific wavelength component (around 450 nm), the transmittances of the good rice a and b are between approximately 40% and 60%, whereas the transmittance is poor. Since the transmittance of rice c, d, and e is approximately between 25% and 20%, the quality of the rice grain can be determined by setting the set value to approximately 33%, and the second specific wavelength component (near 650 nm) can be determined. For light, fine rice a, b
Of the defective rice c, d, and e is approximately 52% to 28%.
Since it is in the range of%, it is possible to judge the quality of the rice grain if the set value is set to a transmittance of about 63%.

【0034】次に、前記第1特定波長成分又は第2特定
波長成分の光に対する透過率の差によって、良品におけ
る良質米と未熟米とを区別するとともに、前記第2特定
波長成分の光に対する透過率によって、不良品における
死米と、着色米及び被害米とを区別する。つまり、図7
に示すように、第1特定波長成分(450nm付近)の
光に対して良質米aの透過率は57%程度、未熟米bの
透過率は44%程度であり、第2特定波長成分(650
nm付近)の光に対して良質米aの透過率は85%程
度、未熟米bの透過率は75%程度であって、いずれの
波長においても良質米aの透過率が未熟米bの透過率よ
りもはるかに大きく、又、第2特定波長成分(650n
m付近)の光について死米eの透過率は28%程度であ
るのに対して、着色米d及び被害米cの透過率は47%
〜52%程度とはるかに大きいので区別できる。
Next, good quality rice and immature rice in non-defective products are distinguished from each other by the difference in the transmittance of the first specific wavelength component or the second specific wavelength component to the light, and the transmission of the second specific wavelength component to the light is performed. The rate distinguishes dead rice in defective products from colored rice and damaged rice. That is, FIG.
As shown in, the transmittance of the good quality rice a for the light of the first specific wavelength component (around 450 nm) is about 57%, the transmittance of the unripe rice b is about 44%, and the second specific wavelength component (650
The transmittance of good quality rice a is about 85% and the transmittance of immature rice b is about 75% with respect to light having a wavelength of around nm). Much larger than the second specific wavelength component (650 n
m), the transmittance of dead rice e is about 28%, while the transmittance of colored rice d and damaged rice c is 47%.
It can be distinguished because it is much larger, about 52%.

【0035】又、前記品質評価手段200は、前記評価
対象範囲ht内の各画素pの透過光量のバラツキによっ
て、前記米粒kの品質評価を行うように構成されてい
る。つまり、上記評価対象範囲ht内の各画素pの透過
率について、平均値が前述のように求まるので、その平
均値に対する標準偏差によって透過光量のバラツキを判
断する。具体的には、前記不良米における被害米と着色
米について、被害米の標準偏差の方が着色米の標準偏差
よりも大きいことから、不良米における被害米と着色米
の区別ができる。
The quality evaluation means 200 is configured to evaluate the quality of the rice grain k based on the variation in the amount of transmitted light of each pixel p within the evaluation target range ht. That is, since the average value of the transmittance of each pixel p within the evaluation target range ht is determined as described above, the variation of the transmitted light amount is determined based on the standard deviation with respect to the average value. Specifically, regarding the damaged rice and the colored rice in the defective rice, since the standard deviation of the damaged rice is larger than the standard deviation of the colored rice, the damaged rice and the colored rice in the defective rice can be distinguished.

【0036】そして、制御装置5は、上記米粒について
の各種の評価結果をテレビモニター9の画面上に、例え
ば色を変える等して、良米と不良米の区別や、良米及び
不良米における各種品質の米の区別をしながら表示す
る。
Then, the control device 5 distinguishes between the good rice and the bad rice by distinguishing between the good rice and the bad rice by, for example, changing the color of the various evaluation results of the rice grains on the screen of the television monitor 9. Display while distinguishing rice of various qualities.

【0037】〔別実施形態〕上記実施例では、照明手段
2を広い範囲の波長の光を発光する広波長光源2aにて
構成するとともに、その広波長光源2aの発光波長のう
ちの特定波長成分の光のみを通過させるように切り換え
るフィルター手段8によって特定波長成分の照明光を生
成したが、これ以外に、特定波長成分の光を発光するL
ED等の単波長光源を使用することもできる。また、特
定波長成分も、上記実施例のような、450nm付近で
ある第1特定波長成分、及び、650nm付近である第
2特定波長成分に限らず、評価すべき穀粒の種類等に応
じて適切な波長成分に設定することができる。尚、上記
第1特定波長成分は450nm以外の400nmから5
00nmの範囲に含まれる波長であれば良く、第2特定
波長成分は650nm以外の630nmから680nm
の範囲に含まれる波長であれば良い。又、フィルター手
段8の設置位置も、上記実施例のように、撮像手段3の
直前位置以外に、例えば、照明手段2の光投射側位置
や、支持板1の下側位置等、照明手段2から撮像手段3
までの間で適宜設定できる。
[Other Embodiments] In the above embodiment, the illuminating means 2 is constituted by the wide wavelength light source 2a which emits light of a wide range of wavelengths, and the specific wavelength component of the emission wavelength of the wide wavelength light source 2a. The illumination light of the specific wavelength component is generated by the filter means 8 which is switched so that only the light of the specific wavelength component is transmitted.
It is also possible to use a single wavelength light source such as an ED. Further, the specific wavelength component is not limited to the first specific wavelength component around 450 nm and the second specific wavelength component around 650 nm as in the above embodiment, and depending on the type of grain to be evaluated and the like. It can be set to an appropriate wavelength component. The first specific wavelength component is from 400 nm to 5 except 450 nm.
Any wavelength included in the range of 00 nm may be used, and the second specific wavelength component may be 630 nm to 680 nm other than 650 nm.
Any wavelength may be included within the range. Also, the installation position of the filter means 8 is not limited to the position immediately before the image pickup means 3 as in the above-described embodiment, but is, for example, the light projection side position of the lighting means 2 or the lower position of the support plate 1 and the like. To image pickup means 3
Can be set as appropriate.

【0038】上記実施例では、撮像手段3をCCDカメ
ラ(白黒式)によって構成したが、これに限るものでは
なく、例えば撮像管式のテレビカメラ等でもよい。又、
白黒式の撮像手段ではなく、カラー式の撮像手段(カラ
ーCCDカメラ等)でもよく、その場合は、照明手段2
は、広い範囲の波長の光を発光する広波長光源2aで構
成し、フィルター手段8は不要になる。
In the above embodiment, the image pickup means 3 is composed of a CCD camera (black and white type), but the present invention is not limited to this, and may be an image pickup tube type television camera or the like. or,
Instead of a black-and-white type imaging unit, a color type imaging unit (such as a color CCD camera) may be used.
Is composed of a wide-wavelength light source 2a that emits light of a wide range of wavelengths, and the filter means 8 is unnecessary.

【0039】上記実施例では、穀粒の品質評価のため
に、画像上における穀粒の存在領域の中心部を含む所定
範囲に設定される評価対象範囲htを、矩形状に形成し
たが円形状に形成してもよく、その大きさも穀粒の3分
の1程度に限らず、これよりも大きめ又は小さめに設定
できる。又、存在領域の中心部も、画面横方向及び縦方
向での各中点位置とするもの以外に、存在領域の重心位
置を求めてもよい。
In the above embodiment, in order to evaluate the quality of the grain, the evaluation target range ht set in a predetermined range including the center of the region where the grain exists on the image is formed in a rectangular shape. The grain size is not limited to about one-third of the grain and can be set larger or smaller than this. Also, the center of the existing area may be the center of gravity position of the existing area other than the center point positions in the horizontal and vertical directions of the screen.

【0040】上記実施例では、各画素の透過光量の大き
さを、透過率によって判断したが、これに限るものでは
なく、撮像手段(CCDカメラ)の出力を8ビット等の
デジタル値で表したものでもよい。
In the above embodiment, the magnitude of the amount of transmitted light of each pixel is judged by the transmittance, but the invention is not limited to this, and the output of the image pickup means (CCD camera) is represented by a digital value such as 8 bits. It may be one.

【0041】上記実施例では、評価対象範囲ht内の各
画素の透過光量の大きさによって穀粒の品質を評価する
場合に、その各画素の透過光量(透過率)の平均値によ
って行ったが、これに限るものではなく、例えば、適正
透過光量(透過率)の範囲を設定してその範囲を外れた
画素の数によって穀粒の品質を評価するようにしてもよ
い。
In the above embodiment, when the quality of the grain is evaluated by the size of the transmitted light amount of each pixel within the evaluation target range ht, the average value of the transmitted light amount (transmittance) of each pixel is used. However, the present invention is not limited to this, and for example, a range of an appropriate transmitted light amount (transmittance) may be set and the quality of the grain may be evaluated by the number of pixels outside the range.

【0042】上記実施例では、各画素の透過光量のバラ
ツキを、標準偏差にて判断したが、これに限るものでは
なく、分散でもよい。
In the above embodiment, the variation in the amount of transmitted light of each pixel is judged by the standard deviation, but the invention is not limited to this, and it may be dispersion.

【0043】上記実施例では、複数個の穀粒をその存在
予定箇所Sに保持して評価するようにしたが、複数個で
はなく1個の穀粒を保持して評価するようにしてもよ
い。尚、この場合は、存在予定箇所S上の各穀粒の位置
判別手段100は不要になり、フィルター手段8は照明
手段2から撮像手段3までの光の経路に対して挿入退出
自在に構成する必要はない(挿入状態のままでよい)。
In the above embodiment, a plurality of grains are held at the planned location S for evaluation, but one grain instead of a plurality of grains may be held for evaluation. . In this case, the position discriminating means 100 for each grain on the planned existence location S is not necessary, and the filter means 8 is configured to be insertable and retractable with respect to the light path from the illumination means 2 to the imaging means 3. It is not necessary (it can be left inserted).

【0044】上記実施例では、撮像画像情報に基づいて
判別した各穀粒の位置や、各穀粒についての品質評価の
結果を、テレビモニター9に表示させるように評価装置
を構成したが、必ずしも、テレビモニター9に表示させ
る必要はなく、例えば、評価結果を数字で表示したり、
あるいは、プリントアウトしてもよい。
In the above embodiment, the evaluation device is configured to display the position of each grain determined based on the captured image information and the result of the quality evaluation for each grain on the television monitor 9, but not necessarily. , It is not necessary to display it on the TV monitor 9, and for example, the evaluation result is displayed as a number,
Alternatively, it may be printed out.

【0045】尚、特許請求の範囲の項に図面との対照を
便利にするために符号を記すが、該記入により本発明は
添付図面の構成に限定されるものではない。
It should be noted that although reference numerals are given in the claims for convenience of comparison with the drawings, the present invention is not limited to the configurations of the accompanying drawings by the entry.

【図面の簡単な説明】[Brief description of drawings]

【図1】穀粒の評価装置の概略斜視図FIG. 1 is a schematic perspective view of a grain evaluation device.

【図2】同概略側面図FIG. 2 is a schematic side view of the same.

【図3】バンドパスフィルターを示す平面図FIG. 3 is a plan view showing a bandpass filter.

【図4】制御構成のブロック図FIG. 4 is a block diagram of a control configuration.

【図5】穀粒の位置判別を説明する図FIG. 5 is a diagram for explaining position determination of grain

【図6】米粒の品質評価の説明図FIG. 6 is an explanatory diagram of quality evaluation of rice grains.

【図7】米粒の品質評価の説明図[Figure 7] Illustration of quality evaluation of rice grains

【符号の説明】[Explanation of symbols]

1 穀粒保持手段 2 照明手段 2a 広波長光源 3 撮像手段 8 フィルター手段 100 位置判別手段 200 品質評価手段 1 Grain Holding Means 2 Illuminating Means 2a Wide Wavelength Light Source 3 Imaging Means 8 Filter Means 100 Position Discriminating Means 200 Quality Evaluating Means

Claims (10)

【特許請求の範囲】[Claims] 【請求項1】 穀粒を透過する特定波長成分の光の透過
光量によって穀粒の品質を評価する穀粒の評価装置であ
って、 穀粒の存在予定箇所に対して照明光を投射する照明手段
(2)と、 前記照明手段(2)からの照明光が前記存在予定箇所を
透過したときの透過画像を、穀粒の大きさよりも小さい
大きさの画素を単位として撮像する撮像手段(3)と、 前記撮像手段(3)の撮像画像情報に基づいて、穀粒の
存在領域のうちで、その中心部を含む所定範囲を評価対
象範囲として抽出して、その評価対象範囲に対応する画
像情報に基づいて、穀粒の品質を評価する品質評価手段
(200)とが設けられている穀粒の評価装置。
1. A grain evaluation device for evaluating the quality of a grain based on the amount of transmitted light of a specific wavelength component that transmits through the grain, the lighting device projecting illumination light onto a planned location of the grain. Means (2), and an image pickup means (3) for picking up a transmission image when the illumination light from the illumination means (2) has passed through the planned existence location, in units of pixels having a size smaller than the grain size. ) And an image corresponding to the evaluation target range by extracting, as the evaluation target range, a predetermined range including the central portion of the existing region of the grain based on the imaged image information of the imaging unit (3). A grain evaluation device provided with a quality evaluation means (200) for evaluating the quality of the grain based on the information.
【請求項2】 前記品質評価手段(200)は、前記評
価対象範囲内の各画素の透過光量の大きさによって、前
記穀粒の品質評価を行うように構成されている請求項1
記載の穀粒の評価装置。
2. The quality evaluation means (200) is configured to evaluate the quality of the grain according to the amount of transmitted light of each pixel in the evaluation target range.
The described grain evaluation device.
【請求項3】 前記品質評価手段(200)は、前記評
価対象範囲内の各画素の透過光量のバラツキによって、
前記穀粒の品質評価を行うように構成されている請求項
1又は2記載の穀粒の評価装置。
3. The quality evaluation means (200) determines the amount of transmitted light of each pixel in the evaluation target range,
The grain evaluation device according to claim 1 or 2, which is configured to perform quality evaluation of the grain.
【請求項4】 前記品質評価手段(200)は、米粒を
評価すべき穀粒として、400nmから500nmの範
囲に含まれる第1特定波長成分、及び、630nmから
680nmの範囲に含まれる第2特定波長成分の光のう
ちの少なくとも一方の波長成分の光に対する透過光量の
情報に基づいて、米粒の品質を評価するように構成され
ている請求項1、2又は3記載の穀粒の評価装置。
4. The quality evaluation means (200) uses a first specific wavelength component included in a range of 400 nm to 500 nm and a second specific wavelength included in a range of 630 nm to 680 nm as grains to be evaluated for rice grains. The grain evaluation device according to claim 1, 2 or 3, which is configured to evaluate the quality of the rice grain based on the information on the amount of transmitted light with respect to the light of at least one wavelength component of the light of the wavelength component.
【請求項5】 前記品質評価手段(200)は、前記第
1及び第2特定波長成分の光に対する透過光量が設定値
よりも大きい米粒を良品と判定し、その透過光量が設定
値よりも小さい米粒を不良品と判定するように構成され
ている請求項4記載の穀粒の評価装置。
5. The quality evaluation means (200) determines that a rice grain whose amount of transmitted light with respect to the light of the first and second specific wavelength components is larger than a set value is a good product, and the amount of transmitted light is smaller than the set value. The grain evaluation device according to claim 4, which is configured to determine a rice grain as a defective product.
【請求項6】 前記品質評価手段(200)は、前記第
1特定波長成分の光に対する透過光量の差又は第2特定
波長成分の光に対する透過光量の差によって、良品にお
ける良質米と未熟米とを区別するように構成されている
請求項5記載の穀粒の評価装置。
6. The quality evaluation means (200) determines whether good quality rice and immature rice are non-defective according to the difference in the amount of transmitted light with respect to the light of the first specific wavelength component or the difference in the amount of transmitted light with respect to the light of the second specific wavelength component. The grain evaluation device according to claim 5, wherein the grain evaluation device is configured to distinguish between.
【請求項7】 前記品質評価手段(200)は、前記第
2特定波長成分の光に対する透過光量の差によって、不
良品における死米と、着色米及び被害米とを区別するよ
うに構成されている請求項5又は6記載の穀粒の評価装
置。
7. The quality evaluation means (200) is configured to distinguish between dead rice in defective products and colored rice and damaged rice by the difference in the amount of transmitted light with respect to the light of the second specific wavelength component. The grain evaluation device according to claim 5 or 6.
【請求項8】 前記照明手段(2)が、広い範囲の波長
の光を発光する広波長光源(2a)にて構成され、 前記広波長光源(2a)の発光波長のうちの前記特定波
長成分の光のみを前記撮像手段(3)が受光する状態に
切り換え自在なフィルター手段(8)が、前記照明手段
(2)から前記撮像手段(3)までの間の光の経路内に
設けられている請求項1、2、3、4、5、6又は7記
載の穀粒の評価装置。
8. The illuminating means (2) comprises a wide wavelength light source (2a) which emits light in a wide range of wavelengths, and the specific wavelength component of the emission wavelength of the wide wavelength light source (2a). A filter means (8) that can be switched to a state in which only the light of (1) is received by the image pickup means (3) is provided in the light path from the illumination means (2) to the image pickup means (3). The grain evaluation device according to claim 1, 2, 3, 4, 5, 6 or 7.
【請求項9】 前記存在予定箇所において複数個の穀粒
が一層状態で平面状に並んだ穀粒層を保持することがで
きる穀粒保持手段(1)と、 前記撮像手段(3)の撮像画像情報に基づいて、前記穀
粒層における各穀粒夫々についての前記存在予定箇所上
の存在位置を判別する位置判別手段(100)とが設け
られ、 前記品質評価手段(200)は、前記位置判別手段(1
00)の情報に基づいて、前記穀粒層における位置が判
別された各穀粒夫々についての透過画像によって求めた
透過光量によって前記穀粒の品質評価を行うように構成
されている請求項1、2、3、4、5、6、7又は8記
載の穀粒の評価装置。
9. A grain holding means (1) capable of holding a grain layer in which a plurality of grains are arranged in a plane in a single layer at the planned location, and an image pickup by the image pickup means (3). Position determination means (100) for determining the existence position on the planned existence position of each grain in the grain layer based on the image information is provided, and the quality evaluation means (200) is configured to detect the position. Discrimination means (1
00) is configured to perform quality evaluation of the grain based on the amount of transmitted light obtained by a transmission image for each grain whose position in the grain layer has been determined. The grain evaluation device according to 2, 3, 4, 5, 6, 7 or 8.
【請求項10】 前記フィルター手段(8)が、前記照
明手段(2)から前記撮像手段(3)までの間の光の経
路に対して挿入退出自在に設けられ、 前記位置判別手段(100)は、前記フィルター手段
(8)が前記照明手段(2)から前記撮像手段(3)ま
での間の光の経路から退出した状態で、前記存在予定箇
所の穀粒層を透過した照明光の透過光量が設定値よりも
小さいときに穀粒の存在を検出して、前記各穀粒の存在
位置を判別するように構成されている請求項9記載の穀
粒の評価装置。
10. The position discriminating means (100), wherein the filter means (8) is provided so as to be insertable into and retractable from a light path from the illuminating means (2) to the imaging means (3). Is the transmission of the illumination light that has passed through the grain layer at the planned location in the state where the filter means (8) has exited the light path from the illumination means (2) to the imaging means (3). The grain evaluation device according to claim 9, wherein the grain evaluation device is configured to detect the presence of a grain when the light amount is smaller than a set value and determine the presence position of each grain.
JP07651896A 1996-03-29 1996-03-29 Grain evaluation device Expired - Fee Related JP3281794B2 (en)

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Application Number Priority Date Filing Date Title
JP07651896A JP3281794B2 (en) 1996-03-29 1996-03-29 Grain evaluation device

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JPH09264851A true JPH09264851A (en) 1997-10-07
JP3281794B2 JP3281794B2 (en) 2002-05-13

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JP2002139443A (en) * 2000-10-31 2002-05-17 Kett Electric Laboratory Quality discrimination apparatus for grain, etc.
WO2004106897A1 (en) * 2003-05-28 2004-12-09 Bm Alliance Coal Operations Pty Ltd Method and apparatus for determining particle parameter and processor performance in a coal and mineral processing system
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Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002139443A (en) * 2000-10-31 2002-05-17 Kett Electric Laboratory Quality discrimination apparatus for grain, etc.
WO2004106897A1 (en) * 2003-05-28 2004-12-09 Bm Alliance Coal Operations Pty Ltd Method and apparatus for determining particle parameter and processor performance in a coal and mineral processing system
US7542873B2 (en) 2003-05-28 2009-06-02 Bm Alliance Coal Operations Pty Ltd Method and apparatus for determining particle parameter and processor performance in a coal and mineral processing system
AU2004243334B2 (en) * 2003-05-28 2009-08-06 Bm Alliance Coal Operations Pty Ltd Method and apparatus for determining particle parameter and processor performance in a coal and mineral processing system
WO2011055698A1 (en) * 2009-11-09 2011-05-12 株式会社マルハニチロ水産 Fish egg maturity assessment device and fish egg maturity assessment method
JP2011115045A (en) * 2009-11-09 2011-06-16 Maruha Nichiro Seafoods Inc Fish egg maturity assessment device and fish egg maturity assessment method
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US9372155B2 (en) 2009-11-09 2016-06-21 Maruha Nichiro Corporation Roe maturity determination device
JP2013238579A (en) * 2012-04-20 2013-11-28 Hiroshima Univ Grain particle component analysis device and grain particle component analysis method
CN104062298A (en) * 2014-07-04 2014-09-24 江苏大学 Device and method for automatically monitoring impurity rate of grains in grain tank of combine harvester based on image processing
CN108645814A (en) * 2018-06-28 2018-10-12 浙江理工大学 A kind of high spectrum image acquisition method of the wetting zones of multicolour cloth for identification
CN108645814B (en) * 2018-06-28 2020-12-15 浙江理工大学 A Hyperspectral Image Acquisition Method for Identifying Wetted Regions of Multicolor Fabrics

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