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JPH08288173A - Ceramic electronic component - Google Patents

Ceramic electronic component

Info

Publication number
JPH08288173A
JPH08288173A JP9082895A JP9082895A JPH08288173A JP H08288173 A JPH08288173 A JP H08288173A JP 9082895 A JP9082895 A JP 9082895A JP 9082895 A JP9082895 A JP 9082895A JP H08288173 A JPH08288173 A JP H08288173A
Authority
JP
Japan
Prior art keywords
external electrode
electronic component
ceramic
ceramic element
electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9082895A
Other languages
Japanese (ja)
Inventor
Kazuyuki Uchida
和行 内田
Yasumasa Fujita
泰誠 藤田
Kenichi Ito
健一 伊藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Murata Manufacturing Co Ltd
Original Assignee
Murata Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Murata Manufacturing Co Ltd filed Critical Murata Manufacturing Co Ltd
Priority to JP9082895A priority Critical patent/JPH08288173A/en
Publication of JPH08288173A publication Critical patent/JPH08288173A/en
Pending legal-status Critical Current

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Abstract

PURPOSE: To improve solderability of an external electrode by grinding a surface of a Cu sintering external electrode including glass formed on an end surface of a ceramic element. CONSTITUTION: A plurality of internal electrodes 2 are so arranged as to be overlapped in the interior of a ceramic element 1 via a dielectric layer 3 made of ceramics and led out alternately on both end surfaces of the ceramic element 1, and external electrodes 4 made of Cu electrically connected with the internal electrodes 2 are formed on both end surfaces of the ceramic element 1. This external electrode 4 is a Cu sintering electrode including glass, and further, the surface is ground. Accordingly, as glass leaked onto the surface of the external electrode 4 is removed, the electrode has an excellent soldering property. Thus, a plating film by wet type electrolytic plating is not required on the external electrode, and a fear that plating liquid leaks into the ceramic element is removed, so that ceramic electronic components excellent in reliability can be obtained.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、セラミック電子部品に
関し、外部電極として、Cuの焼付け電極を形成してな
るセラミック電子部品に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a ceramic electronic component, and more particularly to a ceramic electronic component formed with a Cu baking electrode as an external electrode.

【0002】[0002]

【従来の技術】例えば、セラミック電子部品であるとこ
ろの積層セラミックコンデンサは、図3に示すように、
複数の内部電極20がセラミックからなる誘電体層30
を介して重なり合うように配置されて、かつ交互に両端
面に引出されている構造を有するセラミック素子10
と、その両端面に、外部電極形成用の導電ペーストを塗
布、焼付けして形成された外部電極40とから構成され
ている。
2. Description of the Related Art For example, a monolithic ceramic capacitor, which is a ceramic electronic component, is
Dielectric layer 30 in which a plurality of internal electrodes 20 are made of ceramic
Ceramic element 10 having a structure in which it is arranged so as to overlap with each other and is alternately drawn out to both end faces.
And an external electrode 40 formed by applying and baking a conductive paste for forming an external electrode on both end surfaces thereof.

【0003】ところで、このようなセラミック電子部品
は、通常、塗布、焼付けして形成される外部電極40と
して、貴金属のAg粉またはAg/Pd合金粉とガラス
フリットとを含む導電ペーストが用いられているため、
セラミック電子部品の製造コストに占める外部電極材料
コストの比率が高く、コストアップの原因になってい
た。そこで、外部電極材料のコストの低減を図るため
に、外部電極40の卑金属化が取り組まれている。例え
ば外部電極40にはんだ食われしにくく、かつ導電性の
良いCuを用いるといった取り組みである。このCuの
外部電極40は、セラミック素子10の両端面に、Cu
粉とガラスフリットを含む導電ペーストを塗布、焼付け
して形成される。
By the way, in such a ceramic electronic component, a conductive paste containing noble metal Ag powder or Ag / Pd alloy powder and glass frit is usually used as the external electrode 40 formed by coating and baking. Because
The ratio of the external electrode material cost to the manufacturing cost of the ceramic electronic component is high, which causes a cost increase. Therefore, in order to reduce the cost of the external electrode material, the external electrode 40 is made to be a base metal. For example, an approach is to use Cu having good conductivity and being resistant to solder erosion by the external electrode 40. The Cu external electrodes 40 are formed on the both end surfaces of the ceramic element 10 by Cu.
It is formed by applying and baking a conductive paste containing powder and glass frit.

【0004】ところが、Cu粉は、焼結するに従って体
積が小さくなるため、焼結後は、ガラスが外部電極40
の表面に押出され、外部電極の表面がガラス膜で覆われ
た状態になる。この状態ではんだ付けすると、外部電極
のはんだ濡れ性が悪く、はんだ付き不良が発生し易いと
いう問題があった。
However, since the volume of Cu powder becomes smaller as it is sintered, the glass becomes external electrode 40 after sintering.
The surface of the external electrode is covered with the glass film. If soldering is performed in this state, there is a problem that the solder wettability of the external electrode is poor and a soldering defect is likely to occur.

【0005】そこで、上記焼付けしたCuの外部電極4
0のはんだ付き性を改善するため、図3に示すように、
外部電極40上に、はんだ付き性の良いSnまたはSn
/Pb合金を湿式電解メッキし、メッキ膜50を形成し
ていた。なお、SnまたはSn/Pb合金のメッキを実
施する前に、通常、Niメッキが実施される。
Therefore, the baked Cu external electrode 4 is used.
In order to improve the solderability of 0, as shown in FIG.
Sn or Sn with good solderability on the external electrode 40
The / Pb alloy was wet electrolytic plated to form the plating film 50. Note that Ni plating is usually performed before the Sn or Sn / Pb alloy plating is performed.

【0006】[0006]

【発明が解決しようとする課題】しかしながら、上記の
ような、Cuの外部電極40上に湿式電解メッキしてメ
ッキ膜50が形成されたセラミック電子部品(積層セラ
ミックコンデンサ)は、メッキ時に、メッキ液がCuの
外部電極40を通ってセラミック素子10内に浸入し、
セラミック素子10を構成する誘電体層30と内部電極
20との間の密着強度を劣化させる。このようなセラミ
ック電子部品をプリント基板などにはんだ付けすると、
サーマルショックで誘電体層30と内部電極20との間
にクラックが発生したりする場合があり、このクラック
が入ると容量落ちや絶縁抵抗劣化といった電気特性が劣
化する問題がある。また、上記のようなCuの外部電極
40を有するセラミック電子部品では、湿式電解メッキ
によるメッキ膜50を形成する工程が増加し、コストア
ップになる。
However, the above-mentioned ceramic electronic component (multilayer ceramic capacitor) in which the plating film 50 is formed on the Cu external electrode 40 by wet electrolytic plating is used as a plating solution during plating. Penetrates into the ceramic element 10 through the Cu external electrode 40,
The adhesion strength between the dielectric layer 30 forming the ceramic element 10 and the internal electrode 20 is deteriorated. When such a ceramic electronic component is soldered to a printed circuit board,
A crack may occur between the dielectric layer 30 and the internal electrode 20 due to the thermal shock, and if such a crack is generated, there is a problem that electrical characteristics such as capacitance drop and insulation resistance deterioration are deteriorated. Further, in the ceramic electronic component having the Cu external electrode 40 as described above, the number of steps for forming the plating film 50 by wet electrolytic plating is increased, resulting in an increase in cost.

【0007】そこで、本発明は、上記問題を解決するた
めに、外部電極40上にメッキを施さなくて済む、Cu
の焼付け電極を形成することによって、メッキ膜50形
成によるコストアップにならないで、かつサーマルショ
ックで誘電体層30と内部電極20との間にクラックが
入らない、信頼性の高いセラミック電子部品を提供する
ことを目的とする。
Therefore, according to the present invention, in order to solve the above-mentioned problem, it is not necessary to plate the external electrode 40 with Cu.
Providing a highly reliable ceramic electronic component in which the cost is not increased due to the formation of the plating film 50 by forming the baking electrode and the crack does not occur between the dielectric layer 30 and the internal electrode 20 due to the thermal shock. The purpose is to do.

【0008】[0008]

【課題を解決するため手段】本発明は、セラミック素子
の端面に外部電極を有するセラミック電子部品であっ
て、前記外部電極は、ガラスを含むCuの焼付け電極の
みからなり、その表面が研磨されていることを特徴とす
るセラミック電子部品である。
The present invention is a ceramic electronic component having an external electrode on an end face of a ceramic element, wherein the external electrode is composed only of a baked electrode of Cu containing glass, the surface of which is polished. It is a ceramic electronic component characterized by

【0009】[0009]

【作用】本発明では、セラミック素子の端面に形成され
たガラスを含むCuの焼付け外部電極の表面を研磨する
ことにより、外部電極の表面を覆うガラス膜を除去し、
外部電極のはんだ付き性を良くすることができる。よっ
て、この外部電極上に、従来のはんだ付き性を良くする
ための湿式電解メッキを施さなくて済む。
According to the present invention, the surface of the external electrode is baked by baking Cu containing glass formed on the end face of the ceramic element to remove the glass film covering the surface of the external electrode.
The solderability of the external electrode can be improved. Therefore, it is not necessary to perform conventional wet electrolytic plating on the external electrodes to improve solderability.

【0010】[0010]

【実施例】以下、本発明を実施例の説明から明らかにす
る。
EXAMPLES Hereinafter, the present invention will be clarified from the description of examples.

【0011】図1は本発明の一実施例のセラミック電子
部品である積層セラミックコンデンサの断面図を示して
いる。図1に示すように、セラミック素子1の内部に複
数の内部電極2が、セラミックからなる誘電体層3を介
して重なり合うように配置され、セラミック素子1の両
端面に交互に引出されており、そのセラミック素子1の
両端面に内部電極2と導通するCuからなる外部電極4
が形成されている。この外部電極4は、ガラスを含むC
uの焼付け電極であり、また、その表面が研磨されて、
外部電極4の表面に滲み出てきたガラスが除去されるた
め、はんだ付き性が良い電極となっている。よって、外
部電極4上に、従来のはんだ付き性を良くするための湿
式電解メッキが施されていない。
FIG. 1 is a sectional view of a monolithic ceramic capacitor which is a ceramic electronic component according to an embodiment of the present invention. As shown in FIG. 1, a plurality of internal electrodes 2 are arranged inside a ceramic element 1 so as to overlap with each other with a dielectric layer 3 made of ceramic interposed therebetween, and are alternately drawn out to both end surfaces of the ceramic element 1. External electrodes 4 made of Cu and electrically connected to the internal electrodes 2 on both end faces of the ceramic element 1.
Are formed. The external electrode 4 is C containing glass.
u is a baking electrode, and its surface is polished,
The glass exuding on the surface of the external electrode 4 is removed, so that the electrode has good solderability. Therefore, the conventional wet electrolytic plating for improving solderability is not applied on the external electrode 4.

【0012】以下に本発明のセラミック電子部品(積層
セラミックコンデンサ)を、その外部電極形成方法につ
いてより具体的に説明する。
The method of forming the external electrodes of the ceramic electronic component (multilayer ceramic capacitor) of the present invention will be described in more detail below.

【0013】まず、セラミック素子1の両端面に、外部
電極形成用のCu粉、ガラスフリットを含む導電ペース
トを塗布、焼付けし外部電極4を形成する。この場合、
図2のCuの焼付け外部電極4が形成された積層セラミ
ックコンデンサの断面図に示すように、外部電極4の表
面はガラス膜5で覆われている。すなわち、このガラス
膜5は、Cu粉が焼結する際に、Cu粉の体積が小さく
なり、その外部電極4が緻密になることにより、ガラス
が外部電極4の表面に押出された結果、形成されるもの
である。なお、導電ペーストの塗布は、浸漬方式、印刷
方式などいかなる方法でもよい。また、Cuの外部電極
4の焼付けは、所定の焼成温度で、かつ外部電極4が酸
化しないように中性または弱還元性雰囲気で焼成する。
First, a conductive paste containing Cu powder for forming an external electrode and glass frit is applied to both end faces of the ceramic element 1 and baked to form an external electrode 4. in this case,
As shown in the cross-sectional view of the laminated ceramic capacitor in which the Cu-baked external electrode 4 of FIG. 2 is formed, the surface of the external electrode 4 is covered with the glass film 5. That is, when the Cu powder is sintered, the volume of the Cu powder becomes small and the external electrode 4 becomes dense, so that the glass film 5 is formed as a result of the glass being extruded onto the surface of the external electrode 4. It is what is done. The conductive paste may be applied by any method such as a dipping method and a printing method. The external electrode 4 of Cu is baked at a predetermined baking temperature and in a neutral or weak reducing atmosphere so that the external electrode 4 is not oxidized.

【0014】次に、外部電極4が形成されたセラミック
素子1や研磨剤、並びに水や有機溶剤などの媒体をポッ
トの中に入れて、そのポットを回転台に載せて、所定の
回転速度で回転させ、バレル研磨し、外部電極4の表面
を覆うガラス5を除去する。その後、外部電極4の表面
が研磨されたセラミック素子1をポットから取り出し
て、セラミック電子部品とする。なお、研磨は、バレル
研磨法に限らず、サンドブラスト法などの他の研磨方法
であってもよい。
Next, the ceramic element 1 having the external electrodes 4 formed thereon, an abrasive, and a medium such as water or an organic solvent are put into a pot, and the pot is placed on a rotary table, and at a predetermined rotation speed. It is rotated and barrel-polished to remove the glass 5 covering the surface of the external electrode 4. After that, the ceramic element 1 whose surface of the external electrode 4 is polished is taken out from the pot to obtain a ceramic electronic component. The polishing is not limited to the barrel polishing method and may be another polishing method such as a sandblast method.

【0015】上記の外部電極形成方法により、図1に示
すような、外部電極4の表面を覆うガラス膜5が除去さ
れた、はんだ付き性が良いCuの焼付け外部電極4を有
するセラミック電子部品が得られる。従って、外部電極
4上に、はんだ付き性を良くするための、湿式電解メッ
キによるメッキ膜を形成する工程を無くすことができ
る。
By the above-mentioned external electrode forming method, a ceramic electronic component having a Cu-baked external electrode 4 having good solderability, in which the glass film 5 covering the surface of the external electrode 4 is removed, as shown in FIG. can get. Therefore, the step of forming a plating film by wet electrolytic plating on the external electrode 4 for improving solderability can be eliminated.

【0016】次に、本発明のセラミック電子部品の効果
を確認するために、L寸2.0mm、W寸1.25mm、T
寸0.8mmの、図1で示した本発明の実施例のセラミッ
ク電子部品と、図3で示した従来例のセラミック電子部
品(Cuの焼付け電極上に、NiとSnの2層のメッキ
膜を形成したもの)とをそれぞれ100個用いて、次に
示す、はんだ付き性、はんだ耐熱性の試験を行った。な
お、従来例のセラミック電子部品を作製するのに用いた
セラミック素子および導電ペーストは本発明の実施例に
用いたものと同じものを用いた。
Next, in order to confirm the effect of the ceramic electronic component of the present invention, L dimension 2.0 mm, W dimension 1.25 mm, T
The ceramic electronic component of the embodiment of the present invention shown in FIG. 1 having a size of 0.8 mm and the ceramic electronic component of the conventional example shown in FIG. 3 (two layers of Ni and Sn plating films on a Cu baking electrode) And the heat resistance to solder heat resistance are shown below. The same ceramic element and conductive paste as those used in the examples of the present invention were used for producing the conventional ceramic electronic component.

【0017】これらの試験は、プリント基板上にセラミ
ック電子部品を載置し、260℃のはんだ槽中に5秒間
浸漬することによって行った。試験後にセラミック電子
部品のプリント基板へのはんだ付き状態を目視検査する
とともに、誘電体層3と内部電極2との間にクラックが
入っていないか、超音波探傷装置を用いて検査した。な
お、試験に先だって、セラミック電子部品をロジン25
%含有エタノールのフラックス溶液に浸漬した。その結
果、本発明のものは、100個全てに外部電極4のはん
だ付き不良の発生はなく、そして、クラックが入ってい
ないことを確認できた。一方、従来例のセラミック電子
部品は、100個のうち8個にクラックが入っているこ
とを確認できた。よって、本発明の実施例により得られ
た電子部品は、はんだ付き性が良く、かつその耐熱性が
優れていることが分かる。
These tests were carried out by placing a ceramic electronic component on a printed circuit board and immersing it in a solder bath at 260 ° C. for 5 seconds. After the test, the state of soldering of the ceramic electronic component to the printed board was visually inspected, and whether cracks were formed between the dielectric layer 3 and the internal electrode 2 was inspected using an ultrasonic flaw detector. Prior to the test, the ceramic electronic components were
It was immersed in a flux solution of ethanol containing 100%. As a result, it was confirmed that in all 100 of the present invention, no defective soldering of the external electrodes 4 occurred and no cracks were formed. On the other hand, in the conventional ceramic electronic component, it was confirmed that 8 out of 100 cracked parts. Therefore, it can be seen that the electronic components obtained according to the examples of the present invention have good solderability and excellent heat resistance.

【0018】[0018]

【発明の効果】以上のように、本発明のセラミック電子
部品は、はんだ付き性が良いCuの焼付け外部電極4を
有する。このため、外部電極4上に、湿式電解メッキに
よるメッキ膜の形成を必要としない。従って、セラミッ
ク素子1内へのメッキ液の浸入が無くなり、サーマルシ
ョックで誘電体層3と内部電極2との間にクラックが入
らずかつ電気特性の劣化のない、信頼性の高いセラミッ
ク電子部品を実現することができる。また、湿式電解メ
ッキによるメッキ膜を形成する工程を無くすことがで
き、メッキ膜形成によるコストアップにならないように
することができる。なお、本発明のセラミック電子部品
の外部電極4は、Cuからなる電極であるため、従来の
Agからなる電極に比べ、はんだ食われが起きにくい。
As described above, the ceramic electronic component of the present invention has the baked external electrode 4 of Cu having a good solderability. Therefore, it is not necessary to form a plating film on the external electrode 4 by wet electrolytic plating. Therefore, infiltration of the plating solution into the ceramic element 1 is eliminated, a crack is not generated between the dielectric layer 3 and the internal electrode 2 due to a thermal shock, and a highly reliable ceramic electronic component having no deterioration in electrical characteristics is provided. Can be realized. Further, it is possible to eliminate the step of forming a plated film by wet electrolytic plating, and it is possible to prevent an increase in cost due to the formation of the plated film. Since the external electrode 4 of the ceramic electronic component of the present invention is an electrode made of Cu, solder erosion is less likely to occur as compared with the conventional electrode made of Ag.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例にかかる積層セラミックコン
デンサの断面図である。
FIG. 1 is a cross-sectional view of a monolithic ceramic capacitor according to an embodiment of the present invention.

【図2】図1の積層セラミックコンデンサを形成する工
程を説明するための積層セラミックコンデンサの断面図
である。
FIG. 2 is a cross-sectional view of a monolithic ceramic capacitor for explaining a process of forming the monolithic ceramic capacitor of FIG.

【図3】従来の積層セラミックコンデンサの断面図であ
る。
FIG. 3 is a sectional view of a conventional monolithic ceramic capacitor.

【符号の説明図】[Explanation of symbols]

1・・・セラミック素子 2・・・内部電極 3・・・誘電体層 4・・・外部電極 5・・・ガラス膜 DESCRIPTION OF SYMBOLS 1 ... Ceramic element 2 ... Internal electrode 3 ... Dielectric layer 4 ... External electrode 5 ... Glass film

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 セラミック素子の端面に外部電極を有す
るセラミック電子部品であって、前記外部電極は、ガラ
スを含むCuの焼付け電極のみからなり、その表面が研
磨されていることを特徴とするセラミック電子部品。
1. A ceramic electronic component having an external electrode on an end face of a ceramic element, wherein the external electrode comprises only a baking electrode of Cu containing glass, and the surface is polished. Electronic components.
JP9082895A 1995-04-17 1995-04-17 Ceramic electronic component Pending JPH08288173A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9082895A JPH08288173A (en) 1995-04-17 1995-04-17 Ceramic electronic component

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9082895A JPH08288173A (en) 1995-04-17 1995-04-17 Ceramic electronic component

Publications (1)

Publication Number Publication Date
JPH08288173A true JPH08288173A (en) 1996-11-01

Family

ID=14009457

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9082895A Pending JPH08288173A (en) 1995-04-17 1995-04-17 Ceramic electronic component

Country Status (1)

Country Link
JP (1) JPH08288173A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002100529A (en) * 2000-09-21 2002-04-05 Murata Mfg Co Ltd Ceramic laminated electronic component and method of manufacturing the same
JP2010016326A (en) * 2008-06-02 2010-01-21 Murata Mfg Co Ltd Ceramic electronic component and method for manufacturing the same
JP2012134286A (en) * 2010-12-21 2012-07-12 Murata Mfg Co Ltd Electronic component

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002100529A (en) * 2000-09-21 2002-04-05 Murata Mfg Co Ltd Ceramic laminated electronic component and method of manufacturing the same
JP2010016326A (en) * 2008-06-02 2010-01-21 Murata Mfg Co Ltd Ceramic electronic component and method for manufacturing the same
US9805865B2 (en) 2008-06-02 2017-10-31 Murata Manufacturing Co., Ltd. Ceramic electronic component and method for manufacturing the same
JP2012134286A (en) * 2010-12-21 2012-07-12 Murata Mfg Co Ltd Electronic component

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