JPH08209527A - Device for detecting abnormality of linear material - Google Patents
Device for detecting abnormality of linear materialInfo
- Publication number
- JPH08209527A JPH08209527A JP1416295A JP1416295A JPH08209527A JP H08209527 A JPH08209527 A JP H08209527A JP 1416295 A JP1416295 A JP 1416295A JP 1416295 A JP1416295 A JP 1416295A JP H08209527 A JPH08209527 A JP H08209527A
- Authority
- JP
- Japan
- Prior art keywords
- diffracted light
- abnormal
- linear body
- normal
- fluff
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000005856 abnormality Effects 0.000 title claims abstract description 37
- 239000000463 material Substances 0.000 title abstract description 6
- 230000002159 abnormal effect Effects 0.000 claims abstract description 64
- 238000001514 detection method Methods 0.000 claims abstract description 45
- 230000001678 irradiating effect Effects 0.000 claims abstract description 6
- 230000003287 optical effect Effects 0.000 abstract description 24
- 230000035945 sensitivity Effects 0.000 abstract description 13
- 239000004065 semiconductor Substances 0.000 abstract description 10
- 238000010586 diagram Methods 0.000 description 6
- 238000000034 method Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 3
- 238000005520 cutting process Methods 0.000 description 2
- 239000004744 fabric Substances 0.000 description 2
- 239000013307 optical fiber Substances 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000009987 spinning Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 239000012209 synthetic fiber Substances 0.000 description 1
- 229920002994 synthetic fiber Polymers 0.000 description 1
Landscapes
- Treatment Of Fiber Materials (AREA)
- Filamentary Materials, Packages, And Safety Devices Therefor (AREA)
- Auxiliary Weaving Apparatuses, Weavers' Tools, And Shuttles (AREA)
- Looms (AREA)
- Spinning Or Twisting Of Yarns (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、多数の細線を撚って形
成され、且つ所定速度で走行する線状体の異常部例えば
糸の毛羽をレーザ光によって検出する線状体の異常検出
装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus for detecting an abnormality in a linear body formed by twisting a large number of thin wires and detecting an abnormal portion of a linear body running at a predetermined speed, for example, a fluff of a thread by a laser beam. Regarding
【0002】[0002]
【従来の技術】従来の線状体の異常検出装置としては、
例えば特開平5−163666号公報に記載されている
ものが知られている。この従来例は、多数の細線を撚っ
て形成された糸状体の毛羽を検出する毛羽検出器であっ
て、糸状体に、その側方からレーザ光を照射するレーザ
光源と、糸状体を照射したレーザ光の回折面に配設され
た、0次回折光と前記糸状体の延びる方向に略直交する
方向へ広がる回折光とを除く回折光の照射領域に広がる
受光面を有する光センサとを備えた毛羽検出器であっ
て、高速で走行する糸状体の毛羽を高感度で検出するよ
うにしている。2. Description of the Prior Art As a conventional linear body abnormality detecting device,
For example, the one described in JP-A-5-163666 is known. This conventional example is a fluff detector that detects the fluff of a filament formed by twisting a large number of fine wires, and irradiates the filament with a laser light source that irradiates a laser beam from the side of the filament. And an optical sensor having a light receiving surface which is arranged on the diffracting surface of the laser beam and which spreads in the irradiation area of the diffracted light excluding the 0th-order diffracted light and the diffracted light which spreads in a direction substantially orthogonal to the extending direction of the filamentous body. A fluff detector, which detects fluff of a filamentous body that runs at high speed with high sensitivity.
【0003】[0003]
【発明が解決しようとする課題】しかしながら、上記従
来例の線状体の異常検出装置にあっては、糸状体の側面
にレーザ光源からのレーザ光を照射して、このレーザ光
源に対して糸状体を挟んで反対側に光センサを配置し
て、糸状体の回折光を検出するようにしているので、糸
状体の毛羽に対して直接レーザ光が照射されるレーザ光
と直交する方向に突出延長している場合及びレーザ光源
に向かう方向に突出延長している場合には、比較的高感
度で検出することができるが、毛羽がレーザ光の照射面
の裏側で光センサに向かって突出延長している場合には
感度がその他の場合に比較して1/10程度に低下して
しまい正確な毛羽検出を行うことができないと共に、毛
羽の検出感度を表す光センサの毛羽の有無による出力電
圧差即ち毛羽有り時の出力電圧から毛羽無し時の出力電
圧を減算した値を大きな値とすることができないという
未解決の課題がある。However, in the above-described conventional linear body abnormality detecting apparatus, the side surface of the filamentous material is irradiated with laser light from the laser light source, and the filamentous material is applied to the laser light source. An optical sensor is placed on the opposite side of the body so as to detect the diffracted light of the filament, so that the fluff of the filament is directly irradiated with the laser light. When it is extended or when it is projected and extended in the direction toward the laser light source, it can be detected with relatively high sensitivity, but the fluff is projected and extended toward the optical sensor on the back side of the laser light irradiation surface. In this case, the sensitivity is reduced to about 1/10 of that in other cases, and accurate fluff detection cannot be performed, and the output voltage depending on the presence or absence of fluff of the optical sensor, which indicates the fluff detection sensitivity. When there is a difference or fluff There is an unsolved problem that it is not possible to a value obtained by subtracting the output voltage during fluff without the output voltage a large value.
【0004】そこで、本発明は上記従来例の未解決の課
題に着目してなされたものであり、糸状体を含む線状体
の異常を異常箇所の位置にかかわらず高検出感度で正確
に検出することができる線状体の異常検出装置を提供す
ることを目的としている。Therefore, the present invention has been made by paying attention to the unsolved problem of the above-mentioned conventional example, and accurately detects an abnormality of a linear body including a filamentous body with high detection sensitivity regardless of the position of the abnormal place. It is an object of the present invention to provide a linear body abnormality detecting device capable of performing the above.
【0005】[0005]
【課題を解決するための手段】上記目的を達成するため
に、請求項1に係る線状体の異常検出装置は、多数の細
線を撚って形成され、且つ所定速度で走行する線状体の
異常部をレーザ光によって検出する線状体の異常検出装
置において、前記線状体にその走行方向と交差する方向
から平行なレーザ光を照射するレーザ光源と、該レーザ
光源と前記線状体を挟んで対向する回折面に配置された
レーザ光を反射する反射手段と、前記レーザ光源及び線
状体間に配設されたレーザ光を透過する透孔を有し、当
該線状体での回折光を受光する受光手段とを備えたこと
を特徴としている。In order to achieve the above object, an apparatus for detecting an abnormality of a linear body according to a first aspect of the present invention is a linear body formed by twisting a large number of fine wires and traveling at a predetermined speed. In a linear body abnormality detecting device for detecting an abnormal part of the linear body by a laser beam, a laser light source for irradiating the linear body with parallel laser light from a direction intersecting the traveling direction, and the laser light source and the linear body. A reflecting means for reflecting the laser light, which is disposed on the diffractive surface facing each other with the laser light source interposed therebetween, and a through hole for transmitting the laser light, which is disposed between the laser light source and the linear body, It is characterized by including a light receiving means for receiving diffracted light.
【0006】また、請求項2に係る線状体の異常検出装
置は、請求項1の発明において、前記受光手段は、前記
透孔から前記線状体の走行方向と直行する方向に当該線
状体の振れを考慮した帯状に形成された正常時の回折光
を受光する正常回折光受光部と、この正常回折光受光部
を挟んで対称的に配設された異常部による回折光を受光
する異常回折光受光部とで構成されていることを特徴と
している。According to a second aspect of the present invention, there is provided the linear object abnormality detecting device according to the first aspect of the present invention, wherein the light receiving means extends in the direction perpendicular to the traveling direction of the linear body from the through hole. A normal diffracted light receiving part that receives the diffracted light in a normal state that is formed in a band shape considering the shake of the body and a diffracted light by an abnormal part that is symmetrically arranged with the normal diffracted light receiving part interposed It is characterized in that it is configured with an abnormal diffracted light receiving section.
【0007】さらに、請求項3に係る線状体の異常検出
装置は、請求項1又は2の発明において、線状体が細線
を撚って形成された糸であり、異常部が毛羽であること
を特徴としている。さらにまた、請求項4に係る線状体
の異常検出装置は、前記線状体に照射されるレーザ光
は、長径が線状体の振れ方向となる楕円ビームに選定さ
れていることを特徴としている。Further, in the apparatus for detecting an abnormality of a linear body according to a third aspect, in the invention of the first or second aspect, the linear body is a thread formed by twisting a thin wire, and the abnormal portion is a fluff. It is characterized by that. Furthermore, the linear body abnormality detecting apparatus according to claim 4 is characterized in that the laser beam with which the linear body is irradiated is selected as an elliptical beam having a major axis in the deflection direction of the linear body. There is.
【0008】[0008]
【作用】請求項1の発明においては、レーザ光源から出
射されたレーザ光が所定速度で走行する線状体にその側
面から照射され、この照射光が線状体から突出延長する
毛羽等の異常部で回折された回折光が反射手段である反
射ミラーで反射されて受光手段の異常回折光受光部に受
光されると共に、レーザ光の線状体による回折光が反射
ミラーで反射された反射光が再度線状体のレーザ光照射
面とは反対側に照射されることにより、この反射光でも
異常部回折された回折光が得られ、これが直接受光手段
に受光される。このため、受光手段での受光量がレーザ
光の照射による異常回折光量と、反射ミラーで反射され
た反射光による異常回折光量との和となるので、受光手
段から出力される毛羽等の異常部の有無による出力差を
前述した従来例に比較して倍増することができると共
に、異常部の箇所にかかわらず高感度で異常検出を行う
ことができる。According to the first aspect of the present invention, the laser light emitted from the laser light source is irradiated onto the linear body traveling at a predetermined speed from the side surface thereof, and the irradiated light is abnormal such as fluff protruding and extending from the linear body. The diffracted light diffracted by the reflection section is reflected by the reflection mirror that is the reflection means and is received by the abnormal diffraction light receiving section of the light receiving section, and the diffracted light by the linear body of the laser light is reflected by the reflection mirror. Is again irradiated to the side opposite to the laser light irradiation surface of the linear body, so that diffracted light that is anomalously diffracted by this reflected light is obtained and is directly received by the light receiving means. Therefore, the amount of light received by the light receiving means is the sum of the amount of abnormally diffracted light due to the irradiation of the laser light and the amount of abnormally diffracted light due to the reflected light reflected by the reflecting mirror. It is possible to double the output difference depending on the presence / absence of the above-mentioned case as compared with the above-mentioned conventional example, and it is possible to detect the abnormality with high sensitivity regardless of the location of the abnormal portion.
【0009】請求項2の発明においては、受光手段が、
線状体の振れを考慮した帯状の正常回折光受光部と、こ
の正常回折光受光部を挟んで対称的に配設された異常回
折光受光部とで構成されていることにより、線状体の走
行経路がレーザ光の照射方向に対して直交する方向に振
れる場合でも、正常回折光受光部で正確に正常回折光を
受光することができ、線状体の断線の有無を検出するこ
とができると共に、異常回折光受光部で線状体の振れに
よる正常回折光を誤検出することを確実に防止する。In the invention of claim 2, the light receiving means is
The linear body is composed of the band-shaped normal diffracted light receiving section in consideration of the shake of the linear body and the abnormal diffracted light receiving section symmetrically arranged with the normal diffracted light receiving section sandwiched therebetween. Even when the traveling route of the device swings in the direction orthogonal to the irradiation direction of the laser light, the normal diffracted light receiving unit can accurately receive the normal diffracted light, and it is possible to detect the presence or absence of disconnection of the linear body. In addition, it is possible to surely prevent the abnormal diffracted light receiving section from erroneously detecting the normal diffracted light due to the shake of the linear body.
【0010】請求項3の発明においては、線状体が糸状
体であり、異常部が毛羽であるので、毛羽を正確に検出
することができ、この糸状体で布を織る場合に毛羽位置
での応力集中による切断を事前に検出することができ
る。請求項4の発明においては、線状体に照射されるレ
ーザ光が、線状体の振れ方向を長径とする楕円ビームに
選定されているので、線状体が振れる場合でも、良好な
回折光を反射ミラーを介して受光手段に受光させること
ができる。According to the third aspect of the present invention, since the filamentous body is the linear body and the fluff is the abnormal portion, the fluff can be accurately detected, and when the cloth is woven with this filament, the fluff position is detected. It is possible to detect the disconnection due to the stress concentration in advance. In the invention of claim 4, since the laser beam applied to the linear body is selected as an elliptical beam having a major axis in the deflection direction of the linear body, excellent diffracted light can be obtained even when the linear body swings. Can be received by the light receiving means via the reflection mirror.
【0011】[0011]
【実施例】以下、図面に基づいて本発明の実施例を説明
する。図1は、本発明の一実施例を示す概略構成図であ
り、図中、1は検査対象となる線状体としての糸であっ
て、多数の合成繊維製の細線を撚り合わせて最大径が1
00μm程度の合繊糸に形成されており、所定の走行装
置によって水平方向に例えば4000〜6000m/分
程度の高速で走行する。なお、紡糸装置では、糸1が図
示しないが、50〜100mmのピッチで10〜30本
近く平行して走行する。Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is a schematic configuration diagram showing an embodiment of the present invention, in which 1 is a thread as a linear object to be inspected, and a large number of synthetic fiber fine wires are twisted together to have a maximum diameter. Is 1
It is formed into a synthetic yarn of about 00 μm and runs horizontally at a high speed of about 4000 to 6000 m / min by a predetermined running device. In the spinning device, although not shown, the yarn 1 runs in parallel with about 10 to 30 yarns at a pitch of 50 to 100 mm.
【0012】そして、糸1の走行方向と直交する前方位
置にレーザ光源としての半導体レーザ2がその出力光軸
を糸1の中心に一致させて配設されている。この半導体
レーザ2は、レーザ光の波長が630〜900nmで出
力が3〜5mWに選定されている。半導体レーザ2から
出射されたレーザ光3aは非球面レンズ等の光学レンズ
系4によってビーム径が短軸が1mmで長軸が3mmの
楕円ビームの平行レーザ光3bとしてその長軸が垂直方
向となるように糸1に照射される。A semiconductor laser 2 as a laser light source is disposed at a front position orthogonal to the running direction of the yarn 1 with its output optical axis aligned with the center of the yarn 1. The semiconductor laser 2 is selected such that the wavelength of the laser light is 630 to 900 nm and the output is 3 to 5 mW. The laser beam 3a emitted from the semiconductor laser 2 is converted into an elliptical parallel laser beam 3b having a beam diameter of 1 mm in the short axis and 3 mm in the long axis by the optical lens system 4 such as an aspherical lens, and the long axis is in the vertical direction. The yarn 1 is irradiated in this manner.
【0013】一方、半導体レーザ2とは糸1を挟んで反
対側即ち糸1より後方位置の回折面には、直径が例えば
20mmの平面状の反射手段としての反射ミラー5が配
設されている。ここで、糸1と反射ミラー5との間の距
離は出来るだけ短いことが糸1の表側のレーザ光の回折
光をより多く反射することができ、例えば2mm程度に
選定することが好ましい。On the other hand, a reflecting mirror 5 as a flat reflecting means having a diameter of, for example, 20 mm is provided on the opposite side of the semiconductor laser 2 with respect to the thread 1, that is, on the diffractive surface located behind the thread 1. . Here, the distance between the yarn 1 and the reflection mirror 5 is preferably as short as possible so that more diffracted light of the laser light on the front side of the yarn 1 can be reflected, and it is preferable to select about 2 mm, for example.
【0014】また、光学レンズ系4と糸1との間には糸
1から例えば15mm離れた位置に糸1の回折光を受光
する受光手段としての光センサ6が配設されている。こ
の光センサ6は、図2に示すように、例えば一辺が40
mmの方形基板6aに、その中心部にレーザ光3bを透
過する例えば直径5mmの透孔7が形成されていると共
に、反射ミラー5と対向する受光面に、透孔7の中心を
通る垂直線LVに沿って幅が糸1の上下の振れを考慮し
た例えば3mmの帯状に正常回折光を受光する例えばフ
ォトダイオードアレイで構成される正常回折光受光部8
a,8bが形成され、これら正常回折光受光部8a,8
bを挟んで左右対称的に半円形状の異常回折光を受光す
る同様にフォトダイオードアレイで構成される異常回折
光受光部9a,9bが形成された構成を有する。ここ
で、正常回折光受光部8a,8bと異常回折光受光部9
a,9bとの対向面には1mm程度の隙間10a,10
bが形成されている。各受光部8a,8b及び9a,9
bからは受光した回折光の光量に応じた検出電圧VN 及
びVA が出力される。Further, an optical sensor 6 as a light receiving means for receiving the diffracted light of the yarn 1 is disposed between the optical lens system 4 and the yarn 1 at a position separated by 15 mm from the yarn 1, for example. As shown in FIG. 2, the optical sensor 6 has, for example, a side of 40
A square substrate 6a having a diameter of 5 mm is formed with a through hole 7 having a diameter of, for example, 5 mm for transmitting the laser beam 3b at the center thereof, and a light receiving surface facing the reflection mirror 5 has a vertical line passing through the center of the through hole 7. A normal diffracted light receiving portion 8 configured by, for example, a photodiode array that receives normal diffracted light in a strip shape having a width of, for example, 3 mm in consideration of the vertical deflection of the yarn 1 along the LV.
a, 8b are formed, and these normal diffracted light receiving portions 8a, 8b are formed.
It has a configuration in which the extraordinary diffracted light receiving portions 9a and 9b which are symmetrically configured to receive the semicircular extraordinary diffracted light with the b in between are similarly formed. Here, the normal diffracted light receiving portions 8a and 8b and the abnormal diffracted light receiving portion 9
On the surface facing a and 9b, gaps 10a and 10 of about 1 mm are formed.
b is formed. Each light receiving portion 8a, 8b and 9a, 9
From b, detection voltages V N and V A corresponding to the amount of received diffracted light are output.
【0015】これら各受光部8a,8b及び9a,9b
から出力される検出電圧は、異常検出回路11に入力さ
れ、この異常検出回路11で糸1に細線切れによる毛羽
がある異常状態であるか否かを検出する。この異常検出
回路11では、正常回折光受光部8a,8bからの糸1
の0次回折光による検出電圧によって糸1自体の断線の
有無を判断すると共に、異常回折光受光部9a,9bか
らの糸1に生じた細線切りによる毛羽による異常回折光
に基づく検出電圧に基づいてそのときの検出電圧から糸
1が毛羽のない正常時の検出電圧を減算した検出電圧差
を算出し、これに基づいて毛羽の有無を判断し、その判
断結果である正常信号SN 及び異常信号SA を警報装置
12に供給する。Each of these light receiving portions 8a, 8b and 9a, 9b
The detection voltage output from is input to the abnormality detection circuit 11, and this abnormality detection circuit 11 detects whether or not the yarn 1 is in an abnormal state in which there is a fluff due to a broken thin line. In this abnormality detection circuit 11, the yarn 1 from the normal diffracted light receiving portions 8a and 8b is
The presence or absence of disconnection of the yarn 1 itself is determined by the detection voltage based on the 0th-order diffracted light, and based on the detection voltage based on the abnormal diffracted light due to the fluff caused by the fine line cutting generated in the yarn 1 from the abnormal diffracted light receiving portions 9a and 9b The detection voltage difference is calculated by subtracting the detection voltage when the yarn 1 is normal without fluff from the detection voltage at that time, and the presence or absence of fluff is determined based on this, and the normal signal S N and the abnormal signal that are the determination results are calculated. S A is supplied to the alarm device 12.
【0016】この警報装置12では、正常信号SN が供
給されたときには、正常状態を表す例えば青色の正常ラ
ンプ12Nを点灯し、異常信号SA が供給されたときに
は、毛羽発生の異常状態を表す例えば赤色の異常ランプ
12Aを点灯すると共に、ブザー12Bで警報音を発す
る。次に、上記実施例の動作を説明する。In the alarm device 12, when the normal signal S N is supplied, the normal lamp 12N for indicating a normal state is turned on, and when the abnormal signal S A is supplied, an abnormal state of fluff generation is displayed. For example, the red abnormality lamp 12A is turned on and the buzzer 12B emits an alarm sound. Next, the operation of the above embodiment will be described.
【0017】今、高速で水平方向に走行している糸1に
細線切れによる毛羽が生じていない正常状態であるもの
とすると、この正常状態では、半導体レーザ2から出射
され、光学レンズ系4で平行光となったレーザ光3bが
糸1の前面に照射されることにより、図3に示すよう
に、反射ミラー5の反射面上に糸1の走行方向と直交し
て垂直方向に延長する回折光を生じる。この回折光は、
糸1の真裏に当たる位置に生じる最も光量が多い0次回
折光L0 と、この0次回折光L0 の上下両側に夫々順次
生じる、糸の直径をd、レーザ光3の波長をλ、定数を
Aとしたときに下記(1)式で表される中心間隔S毎に
ピークを有する1次回折光L1 ,2次回折光L2 ……と
でなる回折光パターンとなるが、これら回折光の光強度
は、0次回折光L0 に比較して1次以上の次数の回折光
L1,L2 ……は光強度が遙に低くなる。Now, assuming that the yarn 1 running at high speed in the horizontal direction is in a normal state in which no fluff is generated due to the breakage of fine lines, in this normal state, the light is emitted from the semiconductor laser 2 and the optical lens system 4 is used. By irradiating the front surface of the yarn 1 with the laser light 3b that has become parallel light, as shown in FIG. 3, diffraction that extends in the vertical direction orthogonal to the traveling direction of the yarn 1 on the reflecting surface of the reflection mirror 5 is performed. Produces light. This diffracted light is
The 0th-order diffracted light L 0 having the largest amount of light generated at the position directly behind the yarn 1, and the yarn diameter d, the wavelength of the laser light 3 λ, and the constant A, which are sequentially generated on the upper and lower sides of the 0th- order diffracted light L 0 , respectively. , The first-order diffracted light L 1 and the second-order diffracted light L 2 have peaks for each center interval S represented by the following formula (1). The light intensity of the diffracted lights L 1, L 2, ... Of the 1st and higher orders is much lower than that of the 0th-order diffracted light L 0 .
【0018】S=A・λ/d …………(1) そして、反射ミラー5の反射面上の回折光が反射されて
光センサ7の正常回折光受光部8a,8bに受光される
と共に、反射ミラー5で反射された0次回折光は糸1の
裏側を照射することになり、この反射光による0次回折
光が同様に正常回折光受光部8a,8bで表側の回折光
に重畳され、正常回折光受光部8a,8bに図2で破線
図示の正常回折光パターンPN が受光される。S = Aλ / d (1) Then, the diffracted light on the reflecting surface of the reflecting mirror 5 is reflected and received by the normal diffracted light receiving portions 8a and 8b of the optical sensor 7. The 0th-order diffracted light reflected by the reflection mirror 5 irradiates the back side of the yarn 1, and the 0th-order diffracted light by this reflected light is similarly superimposed on the front-side diffracted light by the normal diffracted light receiving portions 8a and 8b. The normal diffracted light receiving portions 8a and 8b receive the normal diffracted light pattern P N shown by the broken line in FIG.
【0019】したがって、これら正常回折光受光部8
a,8bから検出装置が配設された雰囲気の外部入射光
量に糸1による0次回折光の光量を加算した比較的大き
な値の検出電圧VN が出力される。一方、糸1に毛羽等
の異常部がないことにより、異常部による回折光を生じ
ないので、光センサ6の異常回折光受光部9a,9bか
らは検出装置が配設された雰囲気の外部入射光量のみに
応じた比較的小さい異常回折光検出電圧VA が出力され
る。Therefore, the normal diffracted light receiving portion 8
From a and 8b, the detection voltage V N of a relatively large value is output, which is the sum of the external incident light quantity of the atmosphere in which the detection device is arranged and the light quantity of the 0th-order diffracted light by the yarn 1. On the other hand, since there is no abnormal portion such as fluff in the yarn 1, diffracted light is not generated by the abnormal portion, so that the abnormal diffracted light receiving portions 9a and 9b of the optical sensor 6 are incident on the outside in the atmosphere in which the detection device is arranged. A relatively small extraordinary diffracted light detection voltage V A corresponding to only the amount of light is output.
【0020】そして、これら検出電圧VN 及びVA が異
常検出回路11に供給されるので、この検出回路11
で、検出電圧VN が大きな値であるので、糸1に断線を
生じていないと判断すると共に、検出電圧VA が小さい
ので、この検出電圧VA から予め設定された正常時の検
出電圧VASを減算した値でなる検出電圧差が略零となる
ことにより、糸1に細線切れによる毛羽が発生していな
いと判断することができ、糸1が正常であることを表す
論理値“1”の正常信号SN を警報装置12に供給し
て、正常ランプ12Nを点灯させる。Since the detection voltages V N and V A are supplied to the abnormality detection circuit 11, the detection circuit 11
Since the detected voltage V N is a large value, it is determined that the yarn 1 is not broken, and the detected voltage V A is small, and the detected voltage V A set in advance from this detected voltage V A is normal. Since the detected voltage difference, which is a value obtained by subtracting AS , becomes substantially zero, it can be determined that the yarn 1 does not have fluff due to a broken thin line, and a logical value "1" indicating that the yarn 1 is normal. The normal signal S N of “” is supplied to the alarm device 12 to turn on the normal lamp 12N.
【0021】この糸1の正常状態から例えば図1に示す
ように糸1の上面側に上方に突出する毛羽13が生じて
いる場合には、半導体レーザ2から出射され、光学レン
ズ系4で平行光となったレーザ光3bが毛羽13に照射
されることにより、図1で破線図示の毛羽13による異
常回折光14が生じ、この異常回折光14が反射ミラー
5で反射されて光センサ7の異常回折光受光部9a,9
bに図2で破線図示の異常回折光パターンPA として受
光される。一方、糸1で回折された正常回折光は前述し
たように糸1の真裏に最も光強度の大きい0次回折光L
0 が反射ミラー5で反射されて糸1の裏側に照射される
ことにより、この反射光によっても毛羽13で異常回折
光15が生じ、この異常回折光15が直接異常回折光受
光部9a9bに前述した異常回折光14に重畳されて受
光される。When fluffs 13 projecting upward from the normal state of the yarn 1 as shown in FIG. 1 are generated, the yarn 1 is emitted from the semiconductor laser 2 and is paralleled by the optical lens system 4. When the fluff 13 is irradiated with the laser light 3b that has become light, an abnormal diffracted light 14 is generated by the fluff 13 shown by the broken line in FIG. 1, and the abnormal diffracted light 14 is reflected by the reflection mirror 5 and is reflected by the optical sensor 7. Extraordinary diffracted light receiving parts 9a, 9
The light is received as an abnormal diffracted light pattern P A indicated by a broken line in FIG. On the other hand, the normal diffracted light diffracted by the yarn 1 is the 0th-order diffracted light L having the highest light intensity directly behind the yarn 1 as described above.
Since 0 is reflected by the reflection mirror 5 and is applied to the back side of the thread 1, the reflected light also causes extraordinary diffracted light 15 in the fluff 13, and the extraordinary diffracted light 15 is directly transmitted to the extraordinary diffracted light receiver 9a9b. The extraordinary diffracted light 14 is superimposed and received.
【0022】このため、異常回折光受光部9a,9bか
ら比較的大きな異常回折光検出電圧VA が異常検出回路
11に出力されるので、この検出回路11で、入力され
た異常回折光検出電圧VA から正常時の異常回折光検出
電圧VASを減算した値でなる検出電圧差が大きな値とな
る。この検出電圧差は、例えばレーザ光3の波長λを7
80nm、レーザ出力を3mWとしたときに、下記表1
に示すように、2200mVとなり、前述した従来例と
同様の検出装置で同様の毛羽を検出したときの出力電圧
差970mVに比較して2倍以上の検出電圧差を得るこ
とができ、上部側に生じた毛羽13を高感度で検出する
ことができる。このように、検出電圧差が大きな値とな
ると、異常検出回路11から異常信号SA が警報装置1
2に出力され、この警報装置12で異常ランプ12Aが
点灯されると共に、ブザー12Bが作動されて警報音が
発せられる。Therefore, a relatively large abnormal diffracted light detection voltage V A is output from the abnormal diffracted light receiving sections 9a and 9b to the abnormality detection circuit 11, so that the abnormal diffracted light detection voltage input by the detection circuit 11 is detected. detecting the voltage difference becomes a value obtained by subtracting the abnormality diffracted light detected voltage V aS in the normal from V a becomes a large value. This detected voltage difference is, for example, the wavelength λ of the laser light 3 is
Table 1 below at 80 nm and laser output of 3 mW
As shown in FIG. 2, it becomes 2200 mV, and it is possible to obtain a detection voltage difference more than twice as large as the output voltage difference 970 mV when the same fluff is detected by the same detection device as the above-mentioned conventional example. The generated fluff 13 can be detected with high sensitivity. In this way, when the detected voltage difference becomes a large value, the abnormality detection circuit 11 sends the abnormality signal S A to the alarm device 1.
2 is output to the alarm device 12, the alarm lamp 12A is turned on, and the buzzer 12B is activated to emit an alarm sound.
【0023】同様に、糸1の裏側に毛羽13が生じてい
る場合には、表側に照射されたレーザ光3aによる異常
回折光よりも、反射ミラー5で反射された糸1による0
次回折光L0 が直接毛羽13に照射されることにより生
じる異常回折光の方が光強度が大きくなり、これが光セ
ンサ6の異常回折光受光部9a,9bに受光されるの
で、この場合の異常回折光検出電圧VA も上記した上部
の毛羽よりは低くなるが十分大きな値として出力され
る。このため、異常検出回路11で算出される検出電圧
差は表1に示すように例えば1400mVとなり、同様
の従来例の検出電圧差120mVに対して10倍以上と
なり、高感度で裏側に生じた毛羽13を正確に検出する
ことができ、この場合も警報装置12で警報が発せられ
る。Similarly, when the fluff 13 is formed on the back side of the yarn 1, the 0 due to the yarn 1 reflected by the reflection mirror 5 is more than the abnormal diffracted light due to the laser light 3a emitted to the front side.
The abnormal diffracted light generated by directly irradiating the fluff 13 with the next diffracted light L 0 has a higher light intensity, and this is received by the abnormal diffracted light receiving portions 9a and 9b of the optical sensor 6, so that the abnormal condition in this case occurs. The diffracted light detection voltage V A is also lower than that of the above fluff, but is output as a sufficiently large value. Therefore, the detection voltage difference calculated by the abnormality detection circuit 11 is, for example, 1400 mV as shown in Table 1, which is 10 times or more the detection voltage difference of 120 mV of the same conventional example, and the fluff generated on the back side with high sensitivity. 13 can be accurately detected, and in this case also, the alarm device 12 issues an alarm.
【0024】また、下側及び表面側に毛羽13が生じて
いる場合にも、大きな異常回折光検出電圧VA が出力さ
れ、これによって異常検出回路11で表1に示すように
夫々2100mV及び1800mVの検出電圧差を得る
ことができ、従来例における同様の検出電圧差980m
V及び950mVに対して2倍内外の感度を向上させる
ことができ、これらの場合も警報装置12で警報が発せ
られる。Further, even when the fluff 13 is generated on the lower side and the front side, a large abnormal diffracted light detection voltage V A is output, which causes the abnormality detection circuit 11 to output 2100 mV and 1800 mV, respectively, as shown in Table 1. Detection voltage difference of 980 m
It is possible to improve the sensitivity both inside and outside of V and 950 mV, and in these cases, the alarm device 12 also issues an alarm.
【0025】なお、表1では毛羽13が上部にある場合
を0度とし、これより毛羽13を時計方向に90度づつ
回転させた場合における本願発明の出力電圧差と従来例
の出力電圧差との比較結果を示している。In Table 1, the case where the fluff 13 is on the upper side is 0 degree, and the output voltage difference of the present invention and the output voltage difference of the conventional example when the fluff 13 is rotated clockwise by 90 degrees. The results of comparison are shown.
【0026】[0026]
【表1】 [Table 1]
【0027】さらに、糸1が所定の走行装置によって高
速で走行していることにより、レーザ光3bに対して上
下方向に振れながら走行するが、上述したように、レー
ザ光3bが長軸を垂直方向とし、短軸を水平方向とする
楕円ビームに形成されているので、糸1が上下に振れた
場合でもレーザ光3bを確実に糸1に照射することがで
き、レーザ光1の照射範囲から糸1が外れて糸切れと誤
判断されることを確実に防止することができる。Further, since the yarn 1 travels at a high speed by a predetermined traveling device, the yarn 1 travels while swinging vertically with respect to the laser beam 3b, but as described above, the laser beam 3b is perpendicular to the long axis. Since it is formed into an elliptical beam having a horizontal axis and a short axis, the laser beam 3b can be reliably irradiated onto the yarn 1 even when the yarn 1 is swung up and down. It is possible to reliably prevent the yarn 1 from coming off and being erroneously determined to be broken.
【0028】このように、上記実施例によると、糸1の
表側にはレーザ光3aを照射し、裏側にはレーザ光3a
の糸1による回折光のうち最も光強度が大きい0次回折
光を反射ミラー5で反射させて照射するようにしたの
で、糸1のレーザ光3aが照射される表面側とは反対側
の裏面側に毛羽13が生じている場合でも、その毛羽を
高感度で正確に検出することができ、しかも毛羽に対し
てレーザ光3aが直接照射されると共に、レーザ光3a
の糸1による0次回折光L0 の反射ミラー5で反射され
た反射光が照射されるので、直接光及び0次回折光の反
射光の双方について回折光を生じ、両者が重畳されて、
光センサ6の異常回折光受光部9a,9bに受光される
ので、これら異常回折光受光部9a,9bの出力電圧を
倍増させることができ、毛羽の検出感度を向上させるこ
とができる。As described above, according to the above-mentioned embodiment, the front side of the yarn 1 is irradiated with the laser beam 3a and the back side thereof is irradiated with the laser beam 3a.
Since the 0th-order diffracted light having the highest light intensity among the diffracted light from the yarn 1 is reflected by the reflection mirror 5 and is irradiated, the back surface side opposite to the surface side irradiated with the laser light 3a of the thread 1 Even if the fluff 13 is formed on the fluff, the fluff can be accurately detected with high sensitivity, and furthermore, the fluff is directly irradiated with the laser light 3a and the laser light 3a
Since the reflected light of the 0th-order diffracted light L 0 reflected by the yarn 1 is reflected by the reflection mirror 5, diffracted light is generated for both the direct light and the reflected light of the 0th-order diffracted light, and both are superposed.
Since the light is received by the extraordinary diffracted light receiving portions 9a and 9b of the optical sensor 6, the output voltage of these extraordinary diffracted light receiving portions 9a and 9b can be doubled, and the fluff detection sensitivity can be improved.
【0029】なお、上記実施例においては、異常部が糸
1の毛羽13である場合について説明したが、これに限
定されるものではなく、図4に示すようなモノフィラメ
ントのような単糸に発生する所謂コブと称される径が
1.2倍以上に部分的に膨出する異常部20である場合
でも、この異常部20で回折される異常回折光は正常時
の回折光と向きが異なるため光センサ6の異常回折光受
光部9a,9bで受光することができ、上記と同様の異
常検出を行うことができる。In the above embodiment, the case where the abnormal portion is the fluff 13 of the yarn 1 has been described, but the present invention is not limited to this and occurs in a single yarn such as a monofilament as shown in FIG. Even in the case where the diameter of the so-called bump is an abnormal portion 20 that partially bulges 1.2 times or more, the abnormal diffracted light diffracted by the abnormal portion 20 has a different direction from the diffracted light at the normal time. Therefore, the abnormal diffracted light receiving portions 9a and 9b of the optical sensor 6 can receive light, and the same abnormality detection as described above can be performed.
【0030】また、上記実施例においては、線状体とし
て糸1を適用した場合について説明したが、これに限ら
ず、細い銅線を撚り合わせた電線その他のワイヤや光フ
ァイバー等の細線を撚って形成した線状体であれば、本
発明を適用し得るものである。さらに、上記実施例で
は、糸1に照射するレーザ光3bを楕円ビームに形成し
た場合について説明したが、これに限定されるものでは
なく、円形ビームとするようにしてもよく、糸1の上下
方向の振れが少ない場合には、そのビーム径を糸1の径
に近づけることもできる。Further, in the above embodiment, the case where the thread 1 is applied as the linear body has been described, but the present invention is not limited to this, and an electric wire in which thin copper wires are twisted together or a thin wire such as an optical fiber or an optical fiber is twisted. The present invention can be applied to any linear body formed by the above. Further, in the above embodiment, the case where the laser beam 3b for irradiating the yarn 1 is formed into an elliptical beam has been described. However, the present invention is not limited to this, and a circular beam may be used. When the deflection in the direction is small, the beam diameter can be made close to the diameter of the yarn 1.
【0031】さらにまた、上記実施例においては、糸1
が水平方向に走行している場合について説明したが、こ
れに限らず垂直方向や任意の方向に走行している場合で
も上記と同様の構成で異常を検出することができる。な
おさらに、上記実施例においては、レーザ光源として半
導体レーザを適用した場合について説明したが、これに
限定されるものではなく、他の種々の気体レーザや固体
レーザを適用することができることは言うまでもない。Furthermore, in the above embodiment, the thread 1
Has been described as traveling in the horizontal direction. However, the present invention is not limited to this, and even in the case of traveling in the vertical direction or an arbitrary direction, an abnormality can be detected with the same configuration as above. Furthermore, in the above embodiment, the case where the semiconductor laser is applied as the laser light source has been described, but the present invention is not limited to this, and it goes without saying that various other gas lasers and solid-state lasers can be applied. .
【0032】また、上記実施例においては、反射ミラー
5が平面状である場合について説明したが、これに限定
されるものではなく、0次回折光を反射する中央部が平
面状でその回りを所要の曲率の円弧面状として全体とし
て凹面状に形成するようにしてもよい。さらに、上記実
施例では、異常検出回路11で異常を検出したときに、
警報装置12で警報を発するようにした場合について説
明したが、これに限らず異常信号SA を糸1の製造装置
或いは織機に供給して、これらを自動的に停止させるよ
うにしてもよい。Further, in the above embodiment, the case where the reflection mirror 5 has a plane shape has been described, but the present invention is not limited to this, and the central portion for reflecting the 0th-order diffracted light has a plane shape and the periphery thereof is required. You may make it form a concave shape as a whole as an arc surface shape of curvature. Furthermore, in the above embodiment, when the abnormality detection circuit 11 detects an abnormality,
Although the case where the alarm device 12 issues the alarm has been described, the invention is not limited to this, and the abnormal signal S A may be supplied to the manufacturing device of the yarn 1 or the loom to automatically stop them.
【0033】[0033]
【発明の効果】以上説明したように、請求項1に係る発
明によれば、レーザ光源から出射されたレーザ光が所定
速度で走行する線状体にその側面から照射され、この照
射光が線状体から突出延長する毛羽等の異常部で回折さ
れた回折光が反射手段で反射されて受光手段の異常回折
光受光部に受光されると共に、レーザ光の線状体による
回折光が反射手段で反射された反射光が再度線状体のレ
ーザ光照射面とは反対側に照射されることにより、この
反射光でも異常部回折された回折光が得られ、これが直
接受光手段に受光されるように構成されているので、受
光手段における異常回折光受光部にレーザ光による異常
回折光と、レーザ光が線状体で回折された回折光の反射
光による異常回折光とが重畳されて受光され、この異常
回折光受光部での検出光量を増加させることができると
共に、線状体のレーザ光照射面とは反対側に毛羽等の異
常部がある場合でも高感度で正確に異常検出を行うこと
ができるという効果が得られる。As described above, according to the first aspect of the invention, the laser light emitted from the laser light source is applied to the linear body traveling at a predetermined speed from the side surface thereof, and the irradiation light is emitted from the line. The diffracted light diffracted by the abnormal portion such as fluff protruding from the filamentous body is reflected by the reflecting means and received by the abnormal diffracted light receiving portion of the light receiving means, and the diffracted light by the linear body of the laser light is reflected by the reflecting means. The reflected light reflected by is again irradiated to the side opposite to the laser light irradiation surface of the linear body, so that the diffracted light that is diffracted by the abnormal portion is obtained even by this reflected light, and this is directly received by the light receiving means. With this configuration, the abnormal diffracted light receiving section of the light receiving means receives the abnormal diffracted light due to the laser light and the abnormal diffracted light due to the reflected light of the diffracted light diffracted by the linear light This abnormal diffracted light receiving section It is possible to increase the light output amount, the effect is obtained that the laser beam-irradiated surface of the linear body can be accurately abnormality detection with high sensitivity even when there is an abnormality of the fluff such as on the other side.
【0034】また、請求項2に係る発明によれば、受光
手段が、線状体の振れを考慮した帯状の正常回折光受光
部と、この正常回折光受光部を挟んで対称的に配設され
た異常回折光受光部とで構成されているので、線状体の
走行経路がレーザ光の照射方向に対して直交する方向に
振れる場合でも、正常回折光受光部で正確に正常回折光
を受光することができ、線状体の断線の有無を検出する
ことができると共に、異常回折光受光部で線状体の振れ
による正常回折光を誤検出することを確実に防止するこ
とができるという効果が得られる。According to the second aspect of the invention, the light receiving means is arranged symmetrically with the band-shaped normal diffracted light receiving section and the normal diffracted light receiving section sandwiched in consideration of the shake of the linear body. Since it is composed of the abnormal diffracted light receiving section, even if the traveling path of the linear body swings in the direction orthogonal to the irradiation direction of the laser light, the normal diffracted light receiving section accurately outputs the normal diffracted light. It can receive light, can detect the presence or absence of disconnection of the linear body, and can reliably prevent erroneous detection of normal diffracted light due to shake of the linear body in the abnormal diffracted light receiving unit. The effect is obtained.
【0035】さらに、請求項3に係る発明によれば、線
状体が糸状体であり、異常部が毛羽であるので、毛羽を
正確に検出することができ、この糸状体で布を織る場合
に毛羽位置での応力集中による切断を事前に検出するこ
とができるという効果が得られる。なおさらに、請求項
4の発明によれば、線状体に照射されるレーザ光が、線
状体の振れ方向を長径とする楕円ビームに選定されてい
るので、線状体が振れる場合でも、線状体にレーザ光を
確実に照射させることができ、良好な回折光を反射ミラ
ーを介して受光手段に受光させることができるという効
果が得られる。Further, according to the invention of claim 3, since the filamentous body is the linear body and the abnormal portion is the fluff, the fluff can be accurately detected, and when the cloth is woven with this filamentous body. Moreover, it is possible to obtain the effect that cutting due to stress concentration at the fluff position can be detected in advance. Still further, according to the invention of claim 4, since the laser beam with which the linear body is irradiated is selected as an elliptical beam having a major axis in the swing direction of the linear body, even when the linear body swings, It is possible to reliably irradiate the linear body with laser light, and to obtain good diffracted light that can be received by the light receiving means via the reflection mirror.
【図1】本発明の一実施例を示す概略構成図である。FIG. 1 is a schematic configuration diagram showing an embodiment of the present invention.
【図2】光センサの一例を示す正面図である。FIG. 2 is a front view showing an example of an optical sensor.
【図3】反射ミラー上の回折光の光強度を示す説明図で
ある。FIG. 3 is an explanatory diagram showing a light intensity of diffracted light on a reflection mirror.
1 糸 2 半導体レーザ 3a,3b レーザ光 4 光学レンズ系 5 反射ミラー 6 光センサ 7 透孔 8a,8b 正常回折光受光部 9a,9b 異常回折光受光部 11 異常検出回路 12 警報装置 13 毛羽 1 Thread 2 Semiconductor Laser 3a, 3b Laser Light 4 Optical Lens System 5 Reflecting Mirror 6 Optical Sensor 7 Through Holes 8a, 8b Normal Diffraction Light Receiving Section 9a, 9b Abnormal Diffraction Light Receiving Section 11 Abnormality Detection Circuit 12 Alarm Device 13 Fluff
【手続補正書】[Procedure amendment]
【提出日】平成7年2月8日[Submission date] February 8, 1995
【手続補正1】[Procedure Amendment 1]
【補正対象書類名】明細書[Document name to be amended] Statement
【補正対象項目名】図面の簡単な説明[Name of item to be corrected] Brief description of the drawing
【補正方法】変更[Correction method] Change
【補正内容】[Correction content]
【図面の簡単な説明】[Brief description of drawings]
【図1】本発明の一実施例を示す概略構成図である。FIG. 1 is a schematic configuration diagram showing an embodiment of the present invention.
【図2】光センサの一例を示す正面図である。FIG. 2 is a front view showing an example of an optical sensor.
【図3】反射ミラー上の回折光の光強度を示す説明図で
ある。 FIG. 3 is an explanatory diagram showing a light intensity of diffracted light on a reflection mirror.
【図4】糸の異常部の他の例を示す説明図である。FIG. 4 is an explanatory diagram showing another example of the abnormal portion of the yarn.
【符号の説明】 1 糸 2 半導体レーザ 3a,3b レーザ光 4 光学レンズ系 5 反射ミラー 6 光センサ 7 透孔 8a,8b 正常回折光受光部 9a,9b 異常回折光受光部 11 異常検出回路 12 警報装置 13 毛羽20 異常部 [Explanation of Codes] 1 thread 2 semiconductor laser 3a, 3b laser light 4 optical lens system 5 reflection mirror 6 optical sensor 7 through hole 8a, 8b normal diffracted light receiver 9a, 9b abnormal diffracted light receiver 11 abnormal detection circuit 12 alarm Device 13 Fluff 20 Abnormal part
【手続補正2】[Procedure Amendment 2]
【補正対象書類名】図面[Document name to be corrected] Drawing
【補正対象項目名】図4[Name of item to be corrected] Fig. 4
【補正方法】追加[Correction method] Added
【補正内容】[Correction content]
【図4】 [Figure 4]
───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.6 識別記号 庁内整理番号 FI 技術表示箇所 D03J 1/00 Z G01N 21/39 21/89 E ─────────────────────────────────────────────────── ─── Continuation of the front page (51) Int.Cl. 6 Identification code Internal reference number FI Technical display location D03J 1/00 Z G01N 21/39 21/89 E
Claims (4)
速度で走行する線状体の異常部をレーザ光によって検出
する線状体の異常検出装置において、前記線状体にその
走行方向と交差する方向から平行なレーザ光を照射する
レーザ光源と、該レーザ光源と前記線状体を挟んで対向
する回折面に配置されたレーザ光を反射する反射手段
と、前記レーザ光源及び線状体間に配設されたレーザ光
を透過する透孔を有し、当該線状体での回折光を受光す
る受光手段とを備えたことを特徴とする線状体の枝線検
出装置。1. A linear body abnormality detection device for detecting an abnormal portion of a linear body, which is formed by twisting a large number of thin wires and runs at a predetermined speed, with a laser beam. A laser light source for irradiating parallel laser light from a direction intersecting with the laser light source, a reflecting means for reflecting the laser light arranged on a diffraction surface facing the laser light source with the linear body interposed therebetween, the laser light source and the linear shape A branch line detecting device for a linear body, comprising: a light receiving means having a through hole disposed between the bodies for transmitting a laser beam and receiving diffracted light from the linear body.
体の走行方向と直行する方向に当該線状体の振れを考慮
した帯状に形成された正常時の回折光を受光する正常回
折光受光部と、この正常回折光受光部を挟んで対称的に
配設された異常部による回折光を受光する異常回折光受
光部とで構成されていることを特徴とする請求項1記載
の線状体の枝線検出装置。2. The normal diffraction that receives the diffracted light in a normal state, which is formed in a band shape in consideration of the shake of the linear body in a direction orthogonal to the traveling direction of the linear body, from the through hole. 2. The light receiving section and the abnormal diffracted light receiving section for receiving the diffracted light by the abnormal section symmetrically arranged with the normal diffracted light receiving section sandwiched therebetween. Branch detection device for linear objects.
り、異常部が毛羽であることを特徴とする請求項1又は
2に記載の線状体の異常検出装置。3. The abnormality detecting device for a linear body according to claim 1, wherein the linear body is a thread formed by twisting a fine wire, and the abnormal portion is a fluff.
径が線状体の振れ方向となる楕円ビームに選定されてい
ることを特徴とする請求項1乃至3の何れかに記載の線
状体の異常検出装置。4. The laser beam with which the linear body is irradiated is selected as an elliptical beam whose major axis is the deflection direction of the linear body. Abnormality detection device for linear objects.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1416295A JPH08209527A (en) | 1995-01-31 | 1995-01-31 | Device for detecting abnormality of linear material |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1416295A JPH08209527A (en) | 1995-01-31 | 1995-01-31 | Device for detecting abnormality of linear material |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH08209527A true JPH08209527A (en) | 1996-08-13 |
Family
ID=11853460
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1416295A Pending JPH08209527A (en) | 1995-01-31 | 1995-01-31 | Device for detecting abnormality of linear material |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH08209527A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102087143A (en) * | 2009-09-30 | 2011-06-08 | 里特捷克有限公司 | Method of monitoring color homogeneity of yarn surface and apparatus for making the same |
JP2012007248A (en) * | 2010-06-22 | 2012-01-12 | Nippon Electric Glass Co Ltd | Inspection device and inspection method for glass fiber bundle |
JP2017504001A (en) * | 2013-12-19 | 2017-02-02 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | Extreme ultraviolet (EUV) substrate inspection system with simplified optical elements and method of manufacturing the same |
CN107287716A (en) * | 2017-06-30 | 2017-10-24 | 枣阳丝源纺纱有限公司 | Spinning frame broken yarn monitoring prediction device |
TWI716736B (en) * | 2018-09-19 | 2021-01-21 | 張瑞峰 | Method for detecting auto-stop of loom warp yarn broken by laser |
-
1995
- 1995-01-31 JP JP1416295A patent/JPH08209527A/en active Pending
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102087143A (en) * | 2009-09-30 | 2011-06-08 | 里特捷克有限公司 | Method of monitoring color homogeneity of yarn surface and apparatus for making the same |
JP2012007248A (en) * | 2010-06-22 | 2012-01-12 | Nippon Electric Glass Co Ltd | Inspection device and inspection method for glass fiber bundle |
JP2017504001A (en) * | 2013-12-19 | 2017-02-02 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | Extreme ultraviolet (EUV) substrate inspection system with simplified optical elements and method of manufacturing the same |
CN107287716A (en) * | 2017-06-30 | 2017-10-24 | 枣阳丝源纺纱有限公司 | Spinning frame broken yarn monitoring prediction device |
TWI716736B (en) * | 2018-09-19 | 2021-01-21 | 張瑞峰 | Method for detecting auto-stop of loom warp yarn broken by laser |
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