JPH08201273A - Optical-source device of near-infrared-component analyzer - Google Patents
Optical-source device of near-infrared-component analyzerInfo
- Publication number
- JPH08201273A JPH08201273A JP1423595A JP1423595A JPH08201273A JP H08201273 A JPH08201273 A JP H08201273A JP 1423595 A JP1423595 A JP 1423595A JP 1423595 A JP1423595 A JP 1423595A JP H08201273 A JPH08201273 A JP H08201273A
- Authority
- JP
- Japan
- Prior art keywords
- light emitting
- light
- source device
- emitting diode
- filter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、穀類などに含有される
化学成分を定量的に分析する近赤外成分分析器に関する
ものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a near infrared component analyzer for quantitatively analyzing chemical components contained in cereals and the like.
【0002】[0002]
【従来の技術】近赤外成分分析器は、穀類などに含有さ
れる複数種類の蛋白質、澱粉質、アミロース、脂肪酸な
どの各成分の含有率を測定するため、それぞれの成分毎
に異なる特定波長を有する近赤外光束を必要とする。波
長の異なる近赤外光束は、多数の光源から試料中の一点
に向けて照射される。このため各近赤外光束は互いに角
度を成すものであり、試料中の一点に入射した近赤外光
束は、試料の異なる箇所を通過して検出器に達するの
で、各近赤外光束は、同一条件のもとで試料を通過した
ものでなく、正確な成分分析結果を得ることができな
い。本出願人は、同一条件のもとで各近赤外光束を試料
に通過させて測定を行う近赤外成分分析器を特願平6−
176766号および特願平6−162202号で提案
した。本発明は、当該近赤外成分分析器の光源装置に新
規有用なる構成を持たせるように意図している。2. Description of the Related Art Near-infrared component analyzers measure the contents of various components such as proteins, starches, amylose and fatty acids contained in cereals, etc. A near infrared light flux having Near-infrared light fluxes having different wavelengths are emitted from a large number of light sources toward one point in the sample. Therefore, each near-infrared light flux forms an angle with each other, and the near-infrared light flux incident on one point in the sample passes through different points of the sample and reaches the detector. Since the sample did not pass under the same conditions, accurate component analysis results cannot be obtained. The present applicant has filed a patent application for a near-infrared component analyzer that performs measurement by passing each near-infrared light flux through a sample under the same conditions.
176766 and Japanese Patent Application No. 6-162202. The present invention intends to provide the light source device of the near-infrared component analyzer with a new and useful configuration.
【0003】[0003]
【発明が解決しようとしている問題点】これらの波長を
有する近赤外光は、通常発光ダイオードにより得られ
る。各発光ダイオードからそれぞれ波長の異なる近赤外
光を得るには、発光ダイオードからの光線をフィルタを
介して得るようにし、フィルタの透過波長をそれぞれ異
ならせるようされる。アレイとして配列される発光ダイ
オードの数は、通常10個以上であり、これらに濾過波
長を異ならせたフィルタをそれぞれ設けるため組立作業
が複雑である。本発明の第1目的は、発光ダイオードな
らびフィルタの組立を簡略化した近赤外成分分析器の光
源装置を提供するものことである。本発明の別の目的
は、発光ダイオードの発光面とフィルタを互いに破損さ
せることなく組み立てられる近赤外成分分析器の光源装
置を提供することである。The near infrared light having these wavelengths is usually obtained by a light emitting diode. In order to obtain near-infrared light having a different wavelength from each light emitting diode, a light ray from the light emitting diode is obtained through a filter, and the transmission wavelength of the filter is made different. The number of light emitting diodes arranged in an array is usually 10 or more, and the assembly work is complicated because filters having different filtering wavelengths are provided for these. A first object of the present invention is to provide a light source device for a near infrared component analyzer, which simplifies the assembly of a light emitting diode and a filter. Another object of the present invention is to provide a light source device for a near infrared component analyzer which can be assembled without damaging the light emitting surface of the light emitting diode and the filter.
【0004】[0004]
【問題を解決する手段】以上の目的を達成すべく、本発
明のよれば、それぞれ異なる波長で近赤外光を発する複
数個の光源からの近赤外光をほぼ同一の点に集光レンズ
で集光させた後拡散手段で拡散させ、かくして得られた
拡散光を被分析試料を保持する試料保持部を通して検出
器に導いて電気信号に変換するようにした近赤外成分分
析器の光源装置において、光源装置は、複数個の光源と
なる発光ダイオードのアレイで構成され、各発光ダイオ
ードは、発光面を集光レンズ側に向けてブロックに設け
た開孔に嵌合され、さらに開孔には、フィルタが発光面
をO−リング介して覆うようにはめ込まれていることを
特徴とする近赤外成分分析器の光源装置が提供される。In order to achieve the above object, according to the present invention, the near-infrared light from a plurality of light sources emitting near-infrared light at different wavelengths is condensed to substantially the same point. The light source of the near-infrared component analyzer is designed to be condensed by the diffusing means and then diffused by the diffusing means, and the diffused light thus obtained is guided to the detector through the sample holding portion holding the sample to be analyzed and converted into an electric signal. In the device, the light source device is composed of an array of light emitting diodes serving as a plurality of light sources, and each light emitting diode is fitted into an opening provided in the block with its light emitting surface facing the condensing lens side. A light source device for a near-infrared component analyzer is provided, in which a filter is fitted so as to cover the light emitting surface via an O-ring.
【0005】[0005]
【作用】ブロックに設けた多数の開孔に発光ダイオード
とフィルタをはめ込むようにしたので組み立てが非常に
容易となる。また、フィルタが弾性O−リングを介して
発光ダイオードの発光面に配置されているためフィルタ
と発光ダイオードの発光面とが衝接せず互いに破損する
恐れがない。またO−リングに発光面から発した光を遮
光するので光が漏れる恐れがない。Since the light emitting diode and the filter are fitted into the large number of openings provided in the block, the assembly becomes very easy. Further, since the filter is arranged on the light emitting surface of the light emitting diode via the elastic O-ring, the filter and the light emitting surface of the light emitting diode do not come into contact with each other, and there is no fear of damage to each other. Further, since the light emitted from the light emitting surface is shielded by the O-ring, there is no risk of light leakage.
【0006】[0006]
【実施例】以下、本発明の一実施例を添付図面を参照し
て詳細に説明する。図1において、基台1に設置された
直立枠2に筒体3が装着され、垂直枠2から水平方向に
延びている。筒体3内には、光源装置LSならびに光学
系が設けられている。光源装置LSは、筒体3の左端部
に正面をその右端部へ、すなわち直立枠2側へ向けてブ
ロック4が設けられ、このブロック4に設けた多数の貫
通孔4aにそれぞれはめ込んだ発光ダイオード9を有す
る。発光ダイオード9の発光面部9aは、その胴部9b
より小直径となっているので貫通孔4aもブロック4の
正面近くで小径部4bとされ、次いで拡径されて、この
拡径部4cにそれぞれ固有の透過波長を有するフィルタ
11がはめ込まれている。ブロック4の後面には大径の
凹部4dが設けられ、この凹部4dに露出する発光ダイ
オード9の底をアレイ支持板10で保持している。さら
アレイ支持板10の後方には、発光ダイオード9駆動制
御用の回路基板14が設けられ、パネル5で凹部4dが
閉じられている。また筒体3の後部は、蓋体7で塞がれ
ている。なお、ブロック4ならびにパネル5を金属など
の熱伝達の良好な材料製として、発光ダイオード9から
発生する熱を吸収し筒体3に伝達するヒートシンクの機
能を持たせると好適である。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described in detail below with reference to the accompanying drawings. In FIG. 1, a cylindrical body 3 is attached to an upright frame 2 installed on a base 1, and extends from the vertical frame 2 in the horizontal direction. A light source device LS and an optical system are provided in the cylindrical body 3. In the light source device LS, a block 4 is provided at the left end portion of the tubular body 3 with its front face toward the right end portion, that is, toward the upright frame 2 side, and the light emitting diodes fitted into a large number of through holes 4 a provided in the block 4 respectively. Have 9. The light emitting surface portion 9a of the light emitting diode 9 has a body portion 9b.
Since the diameter is smaller, the through hole 4a is also formed as a small diameter portion 4b near the front surface of the block 4, and then the diameter is expanded, and the expanded diameter portion 4c is fitted with the filters 11 each having its own transmission wavelength. . A large-diameter recess 4d is provided on the rear surface of the block 4, and the bottom of the light-emitting diode 9 exposed in the recess 4d is held by the array support plate 10. Further, behind the array support plate 10, a circuit board 14 for driving and controlling the light emitting diodes 9 is provided, and the panel 4 closes the recess 4d. The rear part of the cylinder 3 is closed by a lid 7. It is preferable that the block 4 and the panel 5 be made of a material having a good heat transfer such as metal so as to have a function of a heat sink that absorbs the heat generated from the light emitting diode 9 and transfers the heat to the cylindrical body 3.
【0007】発光ダイオード9より発し、フィルタを通
過した近赤外光は、ブロック4の正面に張り合わせたフ
レネルレンズ12により筒体3の右端に設けた支持体1
6を貫通するボア16a内で一点に集光する。ここで一
点に集光した近赤外光は、集光点の直後に設けた、支持
体16のボア16a中にはめ込まれた3枚の半透明板1
7,18,19により拡散される。なお、拡散光の強度
は、光軸Lに沿う水平方向が全体として最大となる。図
2を参照して直立枠2の内側に設けた上下動部材23
は、2本のネジ棒21,22と螺合されている。ネジ棒
21,22は、基台1に設けた軸受25,27および直
立枠2の頂部の試料容器保持部2aに設けた軸受24,
26とにより回転可能に保持されおり、基台1内部にお
いて下端部に嵌合されたギア21a,21bを介して基
台1に載置されたモータ28により互いに同期回転させ
られる。すなわちネジ棒21,22が回転することによ
り試料容器保持部2aから挿入され上下動部材23上に
配置された試料容器30が上下動できるようになってい
る。さらに上下動部材23の上面にサーミスタ素子31
が植え込まれており、試料容器30が載置された際にサ
ーミスタ31は、試料容器30の底部の両側に設けた貫
通孔32のいずれかに挿入されるようになっており、試
料容器30の試料温度を測定する。The near infrared light emitted from the light emitting diode 9 and passing through the filter is supported by the Fresnel lens 12 attached to the front of the block 4 at the right end of the cylindrical body 3.
The light is focused on one point in the bore 16a penetrating the hole 6. The near-infrared light focused at one point is the three semi-transparent plates 1 fitted in the bore 16a of the support 16 provided immediately after the focusing point.
It is diffused by 7, 18, and 19. The intensity of the diffused light is maximum in the horizontal direction along the optical axis L as a whole. With reference to FIG. 2, a vertical movement member 23 provided inside the upright frame 2
Is screwed with the two screw rods 21 and 22. The screw rods 21 and 22 are the bearings 25 and 27 provided on the base 1 and the bearings 24 and 27 provided on the sample container holding portion 2a on the top of the upright frame 2.
26 is rotatably held by the motor 26 and is rotated in synchronization with each other by a motor 28 mounted on the base 1 via gears 21a and 21b fitted to the lower end inside the base 1. That is, by rotating the screw rods 21 and 22, the sample container 30 inserted from the sample container holding portion 2a and arranged on the vertical movement member 23 can be moved up and down. Further, the thermistor element 31 is provided on the upper surface of the vertical movement member 23.
When the sample container 30 is placed, the thermistor 31 is inserted into one of the through holes 32 provided on both sides of the bottom of the sample container 30. Measure the sample temperature of.
【0008】なお、図2で明瞭なように、貫通孔32
は、試料容器30の底部に左右対称に設けられており、
試料容器30が向きを入れ違えて容器保持部2aに挿入
されてもサーミスタ31がいずれかの貫通孔32を介し
て試料容器30内に導入可能となっている。直立枠2の
前面壁2fおよび後面壁2rは、筒体3と整合する円形
の開口が設けられ、後面壁2rの開口2bには、3枚の
半透明体17,18,19の内の最後部のもの19がは
め込まれ、前面壁2fの開口には透明ガラス34がはめ
込まれている。さらに前面壁2fの後面側に矩形の凹部
35が形成され、この凹部35内に摺動部材36が設け
られ、前述の上下動部材23と連動して凹部35内を上
下し、上下動部材23が上昇すると後面壁2fの開口を
塞ぎ、逆に上下動部材23が下降すると後面壁2rの開
口を開くようになっている。上下動部材23が下降する
と、上下動部材23上に載置した試料容器30が当該開
口と整合し、光源9から発し半透明板17,18,19
を介して拡散光となった近赤外光が試料容器30内の試
料を透過し、さらに直立枠2の前面壁2fに設けた開口
の透明ガラス34を通して、当該透明ガラス34と整合
して、凹部35を覆う透明板38に取り付けた光学検出
器42に入射するようにされる。As is clear from FIG. 2, the through hole 32
Are symmetrically provided on the bottom of the sample container 30,
Even if the sample container 30 is inserted into the container holding portion 2a in the wrong direction, the thermistor 31 can be introduced into the sample container 30 through any of the through holes 32. The front wall 2f and the rear wall 2r of the upright frame 2 are provided with circular openings that are aligned with the tubular body 3, and the rear wall 2r has an opening 2b at the end of the three translucent bodies 17, 18, and 19 The part 19 is fitted, and the transparent glass 34 is fitted in the opening of the front wall 2f. Further, a rectangular concave portion 35 is formed on the rear surface side of the front wall 2f, and a sliding member 36 is provided in the concave portion 35. The sliding member 36 moves up and down in the concave portion 35 in cooperation with the above-mentioned vertical moving member 23 to move the vertical moving member 23. Is opened, the opening of the rear surface wall 2f is closed, and conversely, when the vertical movement member 23 is lowered, the opening of the rear surface wall 2r is opened. When the up-and-down moving member 23 descends, the sample container 30 placed on the up-and-down moving member 23 aligns with the opening, emits from the light source 9, and is translucent plate 17, 18, 19.
The near-infrared light that has become diffuse light through the sample is transmitted through the sample in the sample container 30, and further passes through the transparent glass 34 of the opening provided in the front wall 2f of the upright frame 2 to be aligned with the transparent glass 34, The light is incident on an optical detector 42 attached to a transparent plate 38 that covers the recess 35.
【0009】摺動部材36は、開口が設けられ、この開
口に光学的標準フィルター37がはめ込まれている。こ
の光学的標準フィルター37は、上下動部材35に連動
して摺動部材36が上昇した際に、透明ガラス34を覆
うようにし、よって拡散光は光学的標準フィルター37
を介して光検出器42に達するようになる。検出器42
は、直後に設けた演算処理回路43と共に透明板38に
取り付けたカバー39により覆われている。以下に本実
施例の近赤外成分分析器の動作を説明する。試料容器保
持部を通して上下動部材23に載せられた試料容器30
を、モータ28を駆動して上下動部材23を下降させて
図2に破線で示す位置23’まで下降させると、上述の
ように試料容器30の内部の試料に光軸Lに沿って拡散
光が透過した後検出器42に達する。上下動部材23
は、モータ28の回転を制御することにより、段階的に
降下させるようにでき、拡散光は試料の上下方向で各部
を照射でき、試料の各部が測定され、測定平均をとるよ
うにすれば、試料の成分測定の信頼度が向上できる。An opening is provided in the sliding member 36, and an optical standard filter 37 is fitted in this opening. The optical standard filter 37 covers the transparent glass 34 when the sliding member 36 moves up in association with the vertical movement member 35, so that the diffused light is the optical standard filter 37.
To reach the photodetector 42. Detector 42
Is covered with a cover 39 attached to the transparent plate 38 together with the arithmetic processing circuit 43 provided immediately after. The operation of the near infrared component analyzer of this embodiment will be described below. The sample container 30 placed on the vertical movement member 23 through the sample container holding part
When the motor 28 is driven to lower the vertical movement member 23 to the position 23 'shown by the broken line in FIG. 2, the diffused light is spread along the optical axis L to the sample inside the sample container 30 as described above. Reach the detector 42 after passing through. Vertical movement member 23
Can be lowered stepwise by controlling the rotation of the motor 28, diffused light can irradiate each part in the vertical direction of the sample, each part of the sample can be measured, and if a measurement average is taken, The reliability of sample component measurement can be improved.
【0010】拡散光には、発光ダイオード9からの近赤
外光をフィルタ11に通すことにより得られる異なる波
長のものが含まれているので、各波長をを有する近赤外
光が試料内の対応の成分に吸収されるので、各波長で近
赤外光の吸収度を調べれはかなりの精度で試料の成分分
析が可能である。試料の成分測定の後、モータ28を逆
転して上下動部材23を上昇させると、これに連動して
摺動部材36が上昇して光学的標準フィルター37が透
明ガラス38を覆うので、拡散光は、標準フィルター3
7を透過した後光強度を低下されて光学検出器42に達
する。このため検出器42は、強い光から防護されると
共に、この標準フィルター37により被測定時に光学的
校正をとることができる。Since the diffused light includes those having different wavelengths obtained by passing the near infrared light from the light emitting diode 9 through the filter 11, the near infrared light having each wavelength is in the sample. Since it is absorbed by the corresponding components, it is possible to analyze the components of the sample with considerable accuracy by examining the absorption of near infrared light at each wavelength. After measuring the components of the sample, when the motor 28 is rotated in the reverse direction to raise the vertical movement member 23, the sliding member 36 is raised in conjunction with this and the optical standard filter 37 covers the transparent glass 38. Is the standard filter 3
After passing through 7, the light intensity is reduced and reaches the optical detector 42. Therefore, the detector 42 is protected from strong light, and the standard filter 37 enables optical calibration at the time of measurement.
【0011】さて、図3および図4を参照するに光源装
置LSが拡大されて詳細に図示されており、底部をアレ
イ支持板10で固定された12個の発光ダイオード9が
ブロック4に設けた貫通孔4a内に嵌合され、小径の発
光面部9aが開口側小径部4b内にはまりこんでいる。
同貫通孔4aは、小径部4aに隣接して拡径部4cが設
けられ、また小径部4bと拡径部4cの間で画成される
肩部にO−リング50が装着されている。また拡径部4
cには前述のごとくフィルター11がはめ込まれてお
り、発光ダイオード9の発光面9aとフィルター11
は、O−リング50を介して組み合わされている。さら
にフィルタ11は、ブロック4の表面に設けたフレネル
レンズ12により抜け落ちが防止されている。Now, referring to FIGS. 3 and 4, the light source device LS is enlarged and shown in detail, in which the block 4 is provided with twelve light emitting diodes 9 whose bottoms are fixed by the array support plate 10. The small-diameter light emitting surface portion 9a is fitted in the through hole 4a, and is fitted in the opening-side small-diameter portion 4b.
The through hole 4a is provided with an enlarged diameter portion 4c adjacent to the small diameter portion 4a, and an O-ring 50 is attached to a shoulder portion defined between the small diameter portion 4b and the enlarged diameter portion 4c. Also, the expanded portion 4
As described above, the filter 11 is fitted in c, and the light emitting surface 9a of the light emitting diode 9 and the filter 11 are inserted.
Are combined via an O-ring 50. Further, the filter 11 is prevented from coming off by a Fresnel lens 12 provided on the surface of the block 4.
【0012】[0012]
【発明の効果】発光ダイオード9ならびにフィルター1
1をブロック4の貫通孔4aに挿入しフレネルレンズ1
2で押さえただけであるので組立が光源装置LSの組立
が簡単である。発光ダイオード9の発光面9aとフィル
ター11は、O−リング50を介して組み合わされてい
るのでO−リング50が互いの緩衝部材となり破損が防
止される。さらにO−リング50は、発光ダイオード9
の発光面部9aを囲んでいるので側方への向かう光を遮
光して光の漏洩が防止できる。EFFECT OF THE INVENTION Light emitting diode 9 and filter 1
1 into the through hole 4a of the block 4 and the Fresnel lens 1
The light source device LS can be easily assembled because it is only pressed by 2. Since the light emitting surface 9a of the light emitting diode 9 and the filter 11 are combined via the O-ring 50, the O-ring 50 serves as a buffer member for each other and damage is prevented. Further, the O-ring 50 is a light emitting diode 9
Since it surrounds the light emitting surface portion 9a, it is possible to block light that goes to the side and prevent leakage of light.
【図面の簡単な説明】[Brief description of drawings]
【図1】本発明の一実施例を示す縦断面図。FIG. 1 is a vertical sectional view showing an embodiment of the present invention.
【図2】図1のII−II線に沿った断面図。FIG. 2 is a sectional view taken along line II-II in FIG.
【図3】図1に図示の光源装置の拡大詳細断面図。FIG. 3 is an enlarged detailed sectional view of the light source device shown in FIG.
【図4】同光源装置の正面図。FIG. 4 is a front view of the light source device.
4 ブロック 4a 貫通孔 9 発光ダイオード 10 アレイ支持板 11 フィルタ 12 集光レンズ 17,18,19 半透明板 23 上下動部材 28 モータ 31 サーミスタ素子 30 試料容器 36 摺動部材 37 光学的標準板 42 検出器 43 演算処理回路 50 O−リング L 光軸 LS 光源装置 4 Blocks 4a Through Holes 9 Light Emitting Diodes 10 Array Support Plates 11 Filters 12 Condensing Lenses 17, 18, 19 Semi-Transparent Plates 23 Vertical Moving Members 28 Motors 31 Thermistor Elements 30 Sample Containers 36 Sliding Members 37 Optical Standard Plates 42 Detectors 43 arithmetic processing circuit 50 O-ring L optical axis LS light source device
Claims (3)
複数個の光源からの近赤外光をほぼ同一の点に集光レン
ズで集光させた後拡散手段で拡散させ、かくして得られ
た拡散光を被分析試料を保持する試料保持部を通して検
出器に導いて電気信号に変換するようにした近赤外成分
分析器の光源装置において、前記光源装置は、前記複数
個の光源となる発光ダイオードのアレイで構成され、各
発光ダイオードは、発光面を集光レンズ側に向けてブロ
ックに設けた開孔に嵌合され、さらに該開孔には、フィ
ルタが前記発光面をO−リング介して覆うようにはめ込
まれていることを特徴とする近赤外成分分析器の光源装
置。1. Near-infrared light from a plurality of light sources each emitting near-infrared light at different wavelengths is condensed at a substantially same point by a condenser lens and then diffused by a diffusing means, thus obtained. In the light source device of the near-infrared component analyzer, which is configured to guide the diffused light to a detector through a sample holding unit that holds a sample to be analyzed and convert it into an electric signal, the light source device is a light source that becomes the plurality of light sources Each light emitting diode is composed of an array of diodes, and each light emitting diode is fitted into an opening provided in the block with its light emitting surface facing the condenser lens side, and a filter is inserted into the opening through the light emitting surface through an O-ring. A light source device for a near-infrared component analyzer, which is fitted so as to cover it.
源装置において、前記集光レンズが前記ブロックに重ね
られ、前記開孔を塞ぐことを特徴とする近赤外成分分析
器の光源装置。2. The light source device for a near-infrared component analyzer according to claim 1, wherein the condenser lens is superposed on the block to close the opening. Light source device.
源装置において、前記集光レンズはフレネルレンズであ
ることを特徴とする近赤外成分分析器の光源装置。3. The light source device for the near-infrared component analyzer according to claim 2, wherein the condenser lens is a Fresnel lens.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1423595A JP3285460B2 (en) | 1995-01-31 | 1995-01-31 | Light source device for near-infrared component analyzer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1423595A JP3285460B2 (en) | 1995-01-31 | 1995-01-31 | Light source device for near-infrared component analyzer |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH08201273A true JPH08201273A (en) | 1996-08-09 |
JP3285460B2 JP3285460B2 (en) | 2002-05-27 |
Family
ID=11855423
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1423595A Expired - Fee Related JP3285460B2 (en) | 1995-01-31 | 1995-01-31 | Light source device for near-infrared component analyzer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP3285460B2 (en) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2000079247A1 (en) * | 1999-06-21 | 2000-12-28 | Kabushikikaisha Kajitsuhihakaihinshitsukenkyujo | Side multiple-lamp on-line inside quality inspecting device |
WO2001022062A1 (en) * | 1999-09-24 | 2001-03-29 | Kabushikikaisha Kajitsuhihakaihinshitsu Kenkyujo | Two side multiple lamp online inner part inspection apparatus |
WO2001079814A1 (en) * | 2000-04-13 | 2001-10-25 | Mitsui Mining & Smelting Co.,Ltd. | Device for evaluating internal quality of vegetable or fruit, method for warm-up operation of the device, and method for measuring internal quality |
JP2001356091A (en) * | 2000-04-13 | 2001-12-26 | Mitsui Mining & Smelting Co Ltd | Apparatus for evaluating internal quality of vegetables and fruits |
JP2002107297A (en) * | 2000-10-03 | 2002-04-10 | Mitsui Mining & Smelting Co Ltd | Produce internal quality evaluation device |
JP2005308733A (en) * | 2004-03-25 | 2005-11-04 | Nagasaki Prefecture | Method and instrument for measuring stress imparted to plant |
CN108550540A (en) * | 2018-05-21 | 2018-09-18 | 李慧 | A kind of diode pickling processing system |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100947399B1 (en) | 2001-11-22 | 2010-03-12 | 파나소닉 주식회사 | Coding method |
-
1995
- 1995-01-31 JP JP1423595A patent/JP3285460B2/en not_active Expired - Fee Related
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2000079247A1 (en) * | 1999-06-21 | 2000-12-28 | Kabushikikaisha Kajitsuhihakaihinshitsukenkyujo | Side multiple-lamp on-line inside quality inspecting device |
WO2001022062A1 (en) * | 1999-09-24 | 2001-03-29 | Kabushikikaisha Kajitsuhihakaihinshitsu Kenkyujo | Two side multiple lamp online inner part inspection apparatus |
US7068368B1 (en) | 1999-09-24 | 2006-06-27 | Kabushikikaisha Kajitsuhihakaihinshitsukenkyujo | Two-side multiple lamp online inner part inspection apparatus |
WO2001079814A1 (en) * | 2000-04-13 | 2001-10-25 | Mitsui Mining & Smelting Co.,Ltd. | Device for evaluating internal quality of vegetable or fruit, method for warm-up operation of the device, and method for measuring internal quality |
JP2001356091A (en) * | 2000-04-13 | 2001-12-26 | Mitsui Mining & Smelting Co Ltd | Apparatus for evaluating internal quality of vegetables and fruits |
JP2002107297A (en) * | 2000-10-03 | 2002-04-10 | Mitsui Mining & Smelting Co Ltd | Produce internal quality evaluation device |
JP2005308733A (en) * | 2004-03-25 | 2005-11-04 | Nagasaki Prefecture | Method and instrument for measuring stress imparted to plant |
CN108550540A (en) * | 2018-05-21 | 2018-09-18 | 李慧 | A kind of diode pickling processing system |
CN108550540B (en) * | 2018-05-21 | 2020-11-20 | 泗县田原秸秆回收再利用有限责任公司 | Diode pickling processing system |
Also Published As
Publication number | Publication date |
---|---|
JP3285460B2 (en) | 2002-05-27 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US4826660A (en) | Detector assembly for analyzer instrument | |
US7499154B2 (en) | Readhead for optical inspection apparatus | |
JP6051264B2 (en) | Photometer | |
JPH10267833A (en) | Photometric diagnostic reading head | |
WO2007021461A1 (en) | A system for optically analyzing a substance | |
US6124585A (en) | Apparatus for measuring the reflectance of strips having non-uniform color | |
US5104218A (en) | Micropipette adaptor for spectrofluorimeters | |
JPH08201273A (en) | Optical-source device of near-infrared-component analyzer | |
JP4247229B2 (en) | Immunochromatographic test piece measuring device | |
JP4448090B2 (en) | Immunochromatographic test strip measuring device and light source device | |
JP2000501179A (en) | Nephelometer | |
JP2894364B2 (en) | Optical measuring device | |
JP3313532B2 (en) | Near infrared component analyzer | |
JP2696069B2 (en) | Optical system of near infrared component analyzer | |
JP3284163B2 (en) | Sample container for near infrared component analyzer | |
CN218823928U (en) | Nucleic acid detector and fluorescence detection device thereof | |
JP2003307448A (en) | Boundary location detection apparatus and boundary location detection method | |
JPH11316189A (en) | Photometer for automatic analyzer | |
US20220091043A1 (en) | Device for detection of a bioluminescence reaction of a sample and a hand-held analyzing and measuring apparatus comprising the device | |
JP2000009740A (en) | Blood text device and dispensation device | |
WO2023052639A1 (en) | Measurement of photoluminescence in a droplet |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |