JPH08195371A - Cleaning device and method - Google Patents
Cleaning device and methodInfo
- Publication number
- JPH08195371A JPH08195371A JP7019821A JP1982195A JPH08195371A JP H08195371 A JPH08195371 A JP H08195371A JP 7019821 A JP7019821 A JP 7019821A JP 1982195 A JP1982195 A JP 1982195A JP H08195371 A JPH08195371 A JP H08195371A
- Authority
- JP
- Japan
- Prior art keywords
- cleaning
- liquid
- rinse
- cleaning treatment
- valve
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Cleaning By Liquid Or Steam (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Abstract
Description
【発明の詳細な説明】Detailed Description of the Invention
【0001】[0001]
【産業上の利用分野】本発明は、被処理基板を洗浄する
洗浄装置及びその方法に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a cleaning apparatus and method for cleaning a substrate to be processed.
【0002】[0002]
【従来の技術】半導体デバイスの製造工程では、半導体
ウエハ(以下、単に「ウエハ」という)表面のパーティ
クル、有機汚染物、金属不純物等のコンタミネーション
を除去するために洗浄装置が使用されており、その中で
もウェット洗浄装置は、前記コンタミネーションを効果
的に除去でき、しかも、バッチ処理が可能でスループッ
トが良好であるため幅広く普及している。2. Description of the Related Art In a semiconductor device manufacturing process, a cleaning apparatus is used to remove contaminants such as particles, organic contaminants and metal impurities on the surface of a semiconductor wafer (hereinafter simply referred to as "wafer"). Among them, the wet cleaning apparatus is widely used because it can effectively remove the contamination and can perform batch processing and has good throughput.
【0003】この種の洗浄装置では、薬液槽内にてウエ
ハに対して、例えば、アンモニア,フッ酸,塩酸等によ
る薬液処理を行った後、リンス槽内にて、例えば、純水
等によりリンスを行っており、その装置構成について
は、薬液槽及びリンス槽の組が各薬液毎にシリーズに配
列され、例えば、50枚程度のウエハを一括して各槽に
順次搬送するための搬送系が設けられている。前記薬液
槽やリンス槽は、薬液またはリンス液が底部から供給さ
れ、整流板を通った後、ウエハ群の板面に沿って上昇す
るように構成されているが、近時において、装置の小型
化を図るために、薬液槽とリンス層とを共通化する、い
わゆる、1バス方式の洗浄装置が検討されている。In this type of cleaning apparatus, a wafer is subjected to chemical treatment with, for example, ammonia, hydrofluoric acid, hydrochloric acid or the like in a chemical bath, and then rinsed with pure water or the like in a rinse bath. Regarding the apparatus configuration, a set of a chemical solution tank and a rinse tank is arranged in series for each chemical solution, and for example, a transfer system for transferring about 50 wafers in a batch to each tank sequentially is provided. It is provided. The chemical solution tank or the rinse tank is configured such that the chemical solution or the rinse solution is supplied from the bottom, passes through the straightening plate, and then rises along the plate surface of the wafer group. In order to achieve the improvement, a so-called one-bath type cleaning device in which the chemical bath and the rinse layer are shared is being studied.
【0004】図8は、1バス方式の洗浄装置の一例を示
す要部断面図である。図8において、1は処理槽であ
り、処理槽1の上部周縁にはオーバーフローした液を受
けるための受容槽10が設けられ、処理槽1の底部には
薬液の循環路の一部を兼用するリンス液供給管11が例
えば二ヶ所に接続されている。処理槽1のリンス液供給
口12には、拡散板12aが取り付けられ、その上方に
は、複数の通流孔13aを有する整流板13が配設され
ている。FIG. 8 is a sectional view of an essential part showing an example of a one-bath cleaning device. In FIG. 8, reference numeral 1 is a processing tank, a receiving tank 10 for receiving an overflowed liquid is provided at an upper peripheral edge of the processing tank 1, and a bottom of the processing tank 1 also serves as a part of a chemical liquid circulation path. The rinse liquid supply pipe 11 is connected to, for example, two places. A diffusion plate 12a is attached to the rinse liquid supply port 12 of the processing tank 1, and a rectifying plate 13 having a plurality of flow holes 13a is arranged above the diffusion plate 12a.
【0005】この装置を用いた洗浄工程について述べる
と、まず、図示しない洗浄処理液供給部から処理槽1内
に薬液例えば、フッ酸が供給され循環されており、次い
で、例えば、50枚程度のウエハWを保持具14に垂直
に配列保持させて薬液内に浸漬し、洗浄処理を行った後
にリンス液供給管11からリンス液例えば、純水が処理
槽1内に供給され、リンス液により薬液が置換されるこ
とにより、リンス処理を行っていた。A cleaning process using this apparatus will be described. First, a chemical solution such as hydrofluoric acid is supplied and circulated into the processing tank 1 from a cleaning processing solution supply unit (not shown), and then, for example, about 50 sheets. The wafers W are vertically arrayed and held by the holder 14 and immersed in a chemical solution, and after a cleaning process, a rinse solution, for example, pure water, is supplied from the rinse solution supply pipe 11 into the processing tank 1, and the rinse solution is used. The rinsing process was performed by replacing
【0006】図9は、図8における洗浄装置の液循環系
を説明するための概略図である。図9において、15は
洗浄処理液の循環路となる洗浄処理液流路、16はリン
ス液が供給されるためのリンス液供給路、17は処理槽
1に接続される共通流路であり、Pはポンプ、Fはフィ
ルタ、Va〜Vcはバルブである。FIG. 9 is a schematic diagram for explaining the liquid circulation system of the cleaning apparatus in FIG. In FIG. 9, 15 is a cleaning treatment liquid flow path that serves as a circulation passage of the cleaning treatment liquid, 16 is a rinse liquid supply passage for supplying the rinse liquid, 17 is a common passage connected to the treatment tank 1, P is a pump, F is a filter, and Va to Vc are valves.
【0007】以上の構成において、ウエハWの洗浄処理
時には、バルブVa及びバルブVcが閉じられるととも
に、バルブVbが開けられ、ポンプPによって洗浄処理
液が洗浄処理液流路15及び共通流路17を介して処理
槽1内に循環されてウエハW表面の酸化膜がエッチング
される。一方、リンス処理時には、バルブVbが閉じら
れるとともに、バルブVa及びバルブVcが開けられ、
リンス液がリンス液供給路16及び共通流路17を介し
て処理槽1内に供給され、洗浄処理液はオーバーフロー
により受容槽10に収容され、洗浄処理液流路15及び
バルブVaを介して排出される。In the above structure, during the cleaning process of the wafer W, the valves Va and Vc are closed and the valve Vb is opened, and the cleaning process liquid is pumped by the pump P through the cleaning process liquid flow path 15 and the common flow path 17. The oxide film on the surface of the wafer W is etched by being circulated in the processing bath 1 via the via. On the other hand, during the rinse process, the valve Vb is closed and the valves Va and Vc are opened.
The rinse liquid is supplied into the processing tank 1 through the rinse liquid supply passage 16 and the common flow passage 17, and the cleaning treatment liquid is stored in the receiving tank 10 due to overflow and is discharged through the cleaning treatment liquid passage 15 and the valve Va. To be done.
【0008】[0008]
【発明が解決しようとする課題】しかしながら、図9に
示す洗浄装置にあっては、リンス液により洗浄処理液を
置換する場合、バルブVbを閉じるとともに、バルブV
a及びバルブVcを開けた状態でリンス液を供給すると
いう構成となっていたため、以下に述べるような問題点
があった。すなわち、バルブVb及びバルブVc間に存
在する共通流路17との接続部となる分岐点Tからバル
ブVbのバルブ本体までの間には、洗浄処理液の溜まり
場となるいわばデッドゾーンとなり、リンス液をリンス
液供給路16を通じて処理槽1内に供給するときに、こ
のデッドゾーンに滞留する洗浄処理液がリンス液中に徐
々に混入し、このためリンス処理時において、リンス液
への置換時間(具体的には、比抵抗の回復時間)を長く
し、リンス液を多量に消費し、リンス効率を低減させる
要因となっていた。However, in the cleaning apparatus shown in FIG. 9, when the cleaning treatment liquid is replaced with the rinse liquid, the valve Vb is closed and the valve Vb is closed.
Since the rinse liquid is supplied with the valve a and the valve Vc opened, there are problems as described below. That is, between the branch point T, which is a connection portion with the common flow path 17 existing between the valve Vb and the valve Vc, and the valve main body of the valve Vb, there is a so-called dead zone, which is a pool of the cleaning treatment liquid, and the rinse liquid. When the cleaning treatment liquid staying in the dead zone is gradually mixed into the rinse liquid when the cleaning liquid is supplied into the treatment tank 1 through the rinse liquid supply passage 16, the replacement time with the rinse liquid during the rinse treatment ( Specifically, it has been a factor of increasing the specific resistance recovery time), consuming a large amount of rinse liquid, and reducing rinse efficiency.
【0009】本発明は、このような事情のもとになされ
たものであり、その目的は、洗浄処理とリンス処理とを
同一処理槽で行うにあたって、比抵抗の回復時間が短
く、スループットが高く、リンス液の使用量の少い洗浄
装置を提供することにある。The present invention has been made under the circumstances as described above, and an object thereof is to perform a cleaning process and a rinsing process in the same processing tank so that the recovery time of the specific resistance is short and the throughput is high. Another object of the present invention is to provide a cleaning device that uses a small amount of rinse liquid.
【0010】[0010]
【課題を解決するための手段】請求項1の発明は、処理
槽内に洗浄処理液を流入する洗浄処理液流路と、この洗
浄処理液流路の途中に接続されると共にその接続部から
下流側を洗浄処理液流路と共用し、処理槽内にリンス液
を供給するためのリンス液供給路と、を備え、複数の被
処理基板を前記処理槽内に配列して洗浄処理液により洗
浄し、次いでリンス液供給路から処理槽内にリンス液を
供給してリンス処理を行う洗浄装置において、前記洗浄
処理液流路における前記接続部の近傍に流路切り替え用
バルブを設け、このバルブを、大径の第1の流路及びこ
の第1の流路よりも小径の第2の流路を並列化した流路
と、これら流路を夫々開閉する弁体とを含む構成とし、
前記バルブの上流側には、排出用バルブが介設された排
出路を分岐させ、洗浄処理液の流入時には前記第1の流
路を開きかつ第2の流路及び排出用バルブを閉じてお
き、リンス処理時には、第1の流路を閉じかつ第2の流
路及び排出用バルブを開いて、リンス液により前記接続
部の近傍の洗浄処理液流路内の洗浄処理液を前記排出路
を通じて排出するように各バルブを制御する制御部を設
けたことを特徴とする。According to a first aspect of the present invention, there is provided a cleaning treatment liquid flow path for introducing a cleaning treatment liquid into a treatment tank, and a cleaning treatment liquid flow path connected in the middle of the cleaning treatment liquid flow path and from a connecting portion thereof. The downstream side is also used as a cleaning treatment liquid flow path, and a rinse liquid supply passage for supplying a rinse liquid into the treatment tank is provided, and a plurality of substrates to be processed are arranged in the treatment tank to be cleaned by the cleaning treatment liquid. In a cleaning device for cleaning and then supplying the rinse liquid from the rinse liquid supply path into the treatment tank to perform the rinse treatment, a passage switching valve is provided in the vicinity of the connection portion in the cleaning treatment liquid passage, and this valve is used. A flow path in which a large-diameter first flow path and a second flow path having a smaller diameter than the first flow path are arranged in parallel, and a valve body that opens and closes each of these flow paths,
On the upstream side of the valve, a discharge path provided with a discharge valve is branched so that the first flow path is opened and the second flow path and the discharge valve are closed when the cleaning treatment liquid flows in. During the rinsing process, the first flow path is closed and the second flow path and the discharge valve are opened to allow the rinse liquid to flow the cleaning process liquid in the cleaning process liquid flow path near the connection portion through the discharge path. It is characterized in that a control unit for controlling each valve so as to discharge is provided.
【0011】請求項2の発明は、処理槽内に洗浄処理液
を流入する洗浄処理液流路と、この洗浄処理液流路の途
中に接続されると共にその接続部から下流側を洗浄処理
液流路と共用し、処理槽内にリンス液を供給するための
リンス液供給路と、を備え、複数の被処理基板を前記処
理槽内に配列して洗浄処理液により洗浄し、次いでリン
ス液供給路から処理槽内にリンス液を供給してリンス処
理を行う洗浄装置において、前記洗浄処理液流路におけ
る前記接続部の近傍に流路切り替え用バルブを設け、こ
のバルブの上流側にて排出用バルブが介設された排出路
を分岐させ、これら両方のバルブのうち少なくとも一方
を流量を調整できる構成とし、リンス処理時には流路切
り替え用バルブ及び排出用バルブを開くと共に、これら
バルブの少なくとも一方により流路を絞り、前記接続部
の近傍の洗浄処理液流路内の洗浄処理液をリンス液によ
り前記排出路を通じて排出するように各バルブを制御す
る制御部を設けたことを特徴とする。According to a second aspect of the present invention, there is provided a cleaning treatment liquid channel for flowing the cleaning treatment liquid into the treatment tank, and a cleaning treatment liquid which is connected in the middle of the cleaning treatment liquid passage and has a downstream side from the connecting portion. And a rinse liquid supply path for supplying a rinse liquid into the processing bath in common with the flow passage, and arranging a plurality of substrates to be processed in the processing bath and cleaning with a cleaning treatment liquid, and then a rinse liquid In a cleaning device that supplies a rinse liquid from a supply path into a processing tank to perform a rinse process, a flow path switching valve is provided near the connection portion in the cleaning process liquid flow path, and discharge is performed on the upstream side of this valve. The discharge path with the valve for the flow path is branched, and at least one of these valves is configured to adjust the flow rate.The flow path switching valve and the discharge valve are opened during the rinsing process, and at the same time, the number of these valves is reduced. A control unit is provided for controlling each valve so that the flow path is narrowed by one side, and the cleaning processing liquid in the cleaning processing liquid flow path near the connection portion is discharged through the discharge path by the rinse liquid. .
【0012】請求項3の発明は、処理槽内に洗浄処理液
を流入する洗浄処理液流路と、この洗浄処理液流路の途
中に接続されると共にその接続部から下流側を洗浄処理
液流路と共用し、処理槽内にリンス液を供給するための
リンス液供給路と、を備え、複数の被処理基板を前記処
理槽内に配列して洗浄処理液により洗浄し、次いでリン
ス液供給路から処理槽内にリンス液を供給してリンス処
理を行う洗浄装置において、前記洗浄処理液流路におけ
る前記接続部の近傍に、閉じたときにもわずかに流路が
残るように構成された流路切り替え用バルブを設け、こ
のバルブの上流側にて排出用バルブが介設された排出路
を分岐させ、リンス処理時には流路切り替え用バルブを
閉じかつ排出用バルブを開き、これにより前記接続部の
近傍の洗浄処理液流路内の洗浄処理液をリンス液により
前記流路切り替え用バルブ及び排出路を通じて排出する
ように各バルブを制御する制御部を設けたことを特徴と
する。According to a third aspect of the present invention, there is provided a cleaning treatment liquid channel for flowing the cleaning treatment liquid into the treatment tank, and a cleaning treatment liquid which is connected in the middle of the cleaning treatment liquid passage and has a downstream side from the connection portion. And a rinse liquid supply path for supplying a rinse liquid into the processing bath in common with the flow passage, and arranging a plurality of substrates to be processed in the processing bath and cleaning with a cleaning treatment liquid, and then a rinse liquid In a cleaning device that supplies a rinse liquid from a supply path into a processing tank to perform a rinse process, in the vicinity of the connection part in the cleaning process liquid flow path, a flow path is slightly left even when closed. A flow path switching valve is provided, and a discharge path in which a discharge valve is provided is branched on the upstream side of this valve, and the flow path switching valve is closed and the discharge valve is opened at the time of rinsing processing. Cleaning solution near the connection Characterized in that a control unit for controlling the valves so the cleaning liquid in the road is discharged through the flow path switching valve and the discharge passage by the rinse liquid.
【0013】請求項4の発明は、処理槽内に洗浄処理液
を流入する洗浄処理液流路と、この洗浄処理液流路の途
中に接続されると共にその接続部から下流側を洗浄処理
液流路と共用し、処理槽内にリンス液を供給するための
リンス液供給路と、を備え、複数の被処理基板を前記処
理槽内に配列して洗浄処理液により洗浄し、次いでリン
ス液供給路から処理槽内にリンス液を供給してリンス処
理を行う洗浄装置において、前記洗浄処理液流路から排
出路を分岐させ、洗浄処理液により洗浄処理が終了した
後、リンス液供給路から処理槽内にリンス液を供給する
一方、リンス液供給路から接続部、洗浄処理液流路及び
排出路を通じてリンス液を排出し、この排出工程時に
は、前記接続部から排出路の出口に至るまでの少なくと
も一部は、処理槽内へのリンス液の供給に支障がない程
度に細い流路とされることを特徴とする。According to a fourth aspect of the present invention, there is provided a cleaning treatment liquid channel for flowing the cleaning treatment liquid into the treatment tank, and a cleaning treatment liquid which is connected to the middle of the cleaning treatment liquid passage and has a downstream side from the connection portion. And a rinse liquid supply path for supplying a rinse liquid into the processing bath in common with the flow passage, and arranging a plurality of substrates to be processed in the processing bath and cleaning with a cleaning treatment liquid, and then a rinse liquid In a cleaning device that supplies a rinse liquid from the supply path into the processing tank to perform a rinse process, the discharge path is branched from the cleaning process liquid channel, and after the cleaning process is completed by the cleaning process liquid, the rinse liquid is supplied from the rinse liquid supply path. While supplying the rinse liquid into the treatment tank, the rinse liquid is discharged from the rinse liquid supply passage through the connection portion, the cleaning treatment liquid passage and the discharge passage, and during the discharging process, from the connection portion to the outlet of the discharge passage. At least part of the Characterized in that it is a rinse liquid fine flow path to an extent not to interfere with the supply of.
【0014】請求項5の発明は、処理槽内に洗浄処理液
を流入する洗浄処理液流路と、この洗浄処理液流路の途
中に接続されると共にその接続部から下流側を洗浄処理
液流路と共用し、処理槽内にリンス液を供給するための
リンス液供給路と、を備え、複数の被処理基板を前記処
理槽内に配列して洗浄処理液により洗浄し、次いでリン
ス液供給路から処理槽内にリンス液を供給してリンス処
理を行う洗浄装置において、前記洗浄処理液流路におけ
る前記接続部の近傍に流路切り替え用バルブを設け、
前記接続部から前記流路切り替え用バルブのバルブ本体
までの流路の長さを当該流路の径よりも短く設定したこ
とを特徴とする。According to a fifth aspect of the present invention, there is provided a cleaning treatment liquid flow path for introducing the cleaning treatment liquid into the treatment tank, and the cleaning treatment liquid flow path is connected in the middle of the cleaning treatment liquid flow path and the downstream side from the connection portion. And a rinse liquid supply path for supplying a rinse liquid into the processing bath in common with the flow passage, and arranging a plurality of substrates to be processed in the processing bath and cleaning with a cleaning treatment liquid, and then a rinse liquid In a cleaning device that supplies a rinse liquid from a supply path into the processing tank to perform a rinse process, a flow path switching valve is provided near the connection portion in the cleaning process liquid flow path,
The length of the flow path from the connection portion to the valve body of the flow path switching valve is set to be shorter than the diameter of the flow path.
【0015】請求項6の発明は、処理槽内に洗浄処理液
を流入する洗浄処理液流路と、この洗浄処理液流路の途
中に接続されると共にその接続部から下流側を洗浄処理
液流路と共用し、処理槽内にリンス液を供給するための
リンス液供給路と、を備え、複数の被処理基板を前記処
理槽内に配列して洗浄処理液により洗浄し、次いでリン
ス液供給路から処理槽内にリンス液を供給してリンス処
理を行う洗浄装置において、前記接続部には、バルブ本
体に連続し、洗浄処理液、リンス液流路及びこれらの共
用流路の三方に夫々接続される接続配管が形成されたバ
ルブが設けられ、バルブ本体には洗浄処理液流路を開閉
する弁体が設けられていることを特徴とする。According to a sixth aspect of the present invention, there is provided a cleaning treatment liquid flow path for introducing the cleaning treatment liquid into the processing tank, and the cleaning treatment liquid flow path is connected in the middle of the cleaning treatment liquid flow path and the downstream side from the connection portion. And a rinse liquid supply path for supplying a rinse liquid into the processing bath in common with the flow passage, and arranging a plurality of substrates to be processed in the processing bath and cleaning with a cleaning treatment liquid, and then a rinse liquid In a cleaning device that supplies a rinse liquid from a supply path into a processing tank to perform a rinse process, the connection part is connected to a valve body, and a cleaning process liquid, a rinse liquid flow path, and a shared flow path for these are provided on three sides. It is characterized in that a valve having connection pipes connected to each other is provided, and a valve body for opening and closing the cleaning treatment liquid flow path is provided in the valve body.
【0016】[0016]
【作用】請求項1の発明では、洗浄処理が終了した後、
リンス処理を行うにあったて、リンス液が流路切換え用
バルブ内の小径の第2の流路及び排出路を通じて流れる
ので、デッドゾーンに滞留している洗浄処理液が排出さ
れ、従って処理槽内への洗浄処理液の混入が防止され
る。また洗浄処理液の排出のために小径の第2の流路を
開いているので、処理槽内の洗浄処理液が第2の流路を
介して流出することも防止される。請求項2、3、また
は4の発明では、リンス液が例えば流路切換え用バルブ
及び排出用のバルブを通じて排出され、バルブの調整に
より流量を小さくしているので、やはり処理槽内への洗
浄処理液の混入を防止しつつ処理槽内の洗浄処理液の流
出も防止される。In the invention of claim 1, after the cleaning process is completed,
When performing the rinse treatment, the rinse liquid flows through the small-diameter second flow passage and the discharge passage in the flow passage switching valve, so that the cleaning treatment liquid staying in the dead zone is discharged, and thus the treatment tank It is possible to prevent the cleaning treatment liquid from entering the inside. Further, since the small-diameter second flow path is opened for discharging the cleaning treatment liquid, the cleaning treatment liquid in the processing tank is also prevented from flowing out through the second flow passage. In the invention of claim 2, 3 or 4, since the rinse liquid is discharged through, for example, the flow path switching valve and the discharge valve, and the flow rate is reduced by adjusting the valves, the cleaning process in the processing tank is also performed. While preventing the mixing of the liquid, the outflow of the cleaning processing liquid in the processing tank is also prevented.
【0017】請求項5の発明では、デッドゾーンの長さ
よりも流路の径を大きくしているのでリンス液を処理槽
内に供給するときに、デッドゾーンに滞留している洗浄
処理液がリンス液により置換されやすくなり、処理槽内
への洗浄処理液の混入が抑えられる。また請求項6の発
明ではデッドゾーンが極めて短くなるので処理槽内への
洗浄処理液の混入が抑えられる。According to the fifth aspect of the invention, since the diameter of the flow path is made larger than the length of the dead zone, when the rinse liquid is supplied into the processing tank, the cleaning treatment liquid remaining in the dead zone is rinsed. The liquid is easily replaced by the liquid, and mixing of the cleaning liquid into the processing tank is suppressed. Further, in the invention of claim 6, since the dead zone is extremely short, it is possible to suppress the mixing of the cleaning treatment liquid into the treatment tank.
【0018】[0018]
【実施例】本発明の実施例に係る洗浄装置の主要部を述
べる前に、搬送系なども含めた装置全体について図1を
参照しながら簡単に説明すると、装置全体は、洗浄処理
前の被処理基板例えばウエハをカセット単位で収容する
搬入部Aと、ウエハの洗浄処理が行われる洗浄処理部B
と、洗浄処理後のウエハをカセット単位で取り出すため
の搬出部Cとの3つのゾーンによって構成されている。DESCRIPTION OF THE PREFERRED EMBODIMENTS Before describing the main parts of a cleaning apparatus according to an embodiment of the present invention, the entire apparatus including a transport system will be briefly described with reference to FIG. A carry-in section A for accommodating processed substrates such as wafers in cassette units, and a cleaning processing section B for cleaning the wafers.
And a carry-out section C for taking out the wafer after cleaning processing in cassette units.
【0019】搬入部Aでは、例えば25枚のウエハが収
納されたカセットCが外部からカセット搬送手段20に
より待機部21に一旦搬入された後、ローダ部22に搬
送され、ここで図では見えないウエハチャックによりカ
セットC内のウエハが専用のウエハ保持具に移し替えら
れる。洗浄処理部Bでは、搬入部Aと搬出部Cとを結ぶ
ラインに沿って例えば3台のウエハ搬送機構R1〜R3
が設けられ、ウエハ搬送機構R1〜R3は、ウエハを保
持したウエハ保持具を装置内に搬送する保持具搬送手段
を備えている。また前記搬入部A側から順に、ウエハ搬
送機構R1の保持具搬送手段23を洗浄、乾燥する洗浄
・乾燥槽T1、3つの処理槽T2〜T4、ウエハ搬送機
構手段R3の保持具搬送手段24を洗浄、乾燥する洗浄
・乾燥槽T5、ウエハを蒸気乾燥させるウエハ乾燥槽T
6が設けられている。In the carry-in section A, a cassette C containing, for example, 25 wafers is once carried into the standby section 21 by the cassette carrying means 20 from the outside and then carried to the loader section 22, which is not visible in the figure. The wafer chuck transfers the wafers in the cassette C to a dedicated wafer holder. In the cleaning processing section B, for example, three wafer transfer mechanisms R1 to R3 are provided along a line connecting the carry-in section A and the carry-out section C.
The wafer transfer mechanisms R1 to R3 are provided with a holder transfer means for transferring a wafer holder holding a wafer into the apparatus. Further, in order from the loading section A side, a cleaning / drying tank T1 for cleaning and drying the holder transporting means 23 of the wafer transporting mechanism R1, three processing tanks T2 to T4, and a holder transporting means 24 of the wafer transporting mechanism R3 are provided. Cleaning / drying tank T5 for cleaning and drying, and wafer drying tank T for steam-drying wafers
6 is provided.
【0020】処理槽T2〜T4は、洗浄処理液により洗
浄され、かつ夫々例えば純水でリンスされるように構成
され、ウエハは例えば50枚一括して後述の専用の保持
具で保持されてウエハ搬送機構R1〜R3により、順次
処理槽T2〜T4内にて洗浄処理が行われる。洗浄処理
部Bの上方には、前記ウエハチャックによってウエハが
取り出された後の空のカセットCを洗浄、乾燥するため
の洗浄・乾燥ライン25が設けられており、この洗浄乾
燥ラインへのカセットCの供給は、前記ローダ部22及
び昇降機構26によって行われる。The processing tanks T2 to T4 are configured to be cleaned with a cleaning processing solution and rinsed with, for example, pure water. For example, 50 wafers are collectively held by a dedicated holder described later and the wafers are held. A cleaning process is sequentially performed in the processing tanks T2 to T4 by the transport mechanisms R1 to R3. A cleaning / drying line 25 for cleaning and drying the empty cassette C after the wafer is taken out by the wafer chuck is provided above the cleaning processing section B. The cassette C to the cleaning / drying line is provided. Is supplied by the loader unit 22 and the elevating mechanism 26.
【0021】ここで上述の専用のウエハ保持具及び処理
槽装置の概観を図2に示すと、ウエハ保持具3は、保持
具本体30に、ウエハWの下端を保持する保持棒31、
とウエハWの下部両側を保持する保持棒32、33とを
設けてなり、これら保持棒31〜33には、ウエハWを
保持するための保持溝34が所定のピッチで例えば50
本形成されている。前記保持具搬送手段は、例えばウエ
ハ保持具3の上部にて前後に夫々水平に折曲された被支
持部30a,30bの下面を夫々支持する一対のアーム
61a,61bよりなる。FIG. 2 shows an overview of the above-mentioned dedicated wafer holder and processing tank apparatus. The wafer holder 3 includes a holder main body 30 and a holding rod 31 for holding the lower end of the wafer W.
And holding rods 32 and 33 for holding both sides of the lower part of the wafer W, and holding grooves 34 for holding the wafer W are formed on these holding rods 31 to 33 at a predetermined pitch, for example, 50.
The book is formed. The holder transporting means is composed of, for example, a pair of arms 61a and 61b that respectively support the lower surfaces of the supported portions 30a and 30b that are horizontally bent back and forth above the wafer holder 3, respectively.
【0022】前記3つの処理槽T2〜T4は、同一の構
造であり、各処理槽3(T2〜T4)及びそれに関連す
る装置構成の例について図2及び図3を参照しながら詳
述する。処理槽4は、例えば矩形状に成形されると共に
上縁部に越流用の三角形状の切欠部41が形成されてお
り、処理槽3の上縁部の外側には越流した液を受容する
受容槽42が設けられている。The three processing tanks T2 to T4 have the same structure, and an example of the structure of each processing tank 3 (T2 to T4) and its related apparatus will be described in detail with reference to FIGS. 2 and 3. The processing tank 4 is formed, for example, in a rectangular shape, and a triangular notch 41 for overflow is formed at the upper edge portion, and the overflowed liquid is received outside the upper edge portion of the processing tank 3. A receiving tank 42 is provided.
【0023】前記処理槽4の外部には、受容槽42内の
洗浄処理液を処理槽4の底部に供給するよう、つまり処
理槽4からオーバーフローした洗浄処理液を処理槽4の
外部を通じて処理槽4の底部に循環させるように、受容
槽42の底部と処理槽4の底部との間に洗浄処理液流路
5が設けられている。処理槽4の底部付近における洗浄
処理液流路5の途中にはリンス液供給路6が接続されて
おり、その接続部60から下流側即ち処理槽4の底部ま
での間は、洗浄処理液流路5及びリンス液供給路6が共
用している。洗浄処理液流路5及びリンス液供給路6に
おける接続部60の近傍には、流路の切り替えを行う流
路切り替え用バルブV1、V2、が夫々介設されてい
る。To the outside of the processing tank 4, the cleaning processing liquid in the receiving tank 42 is supplied to the bottom of the processing tank 4, that is, the cleaning processing liquid overflowing from the processing tank 4 is passed through the outside of the processing tank 4 to the processing tank 4. A cleaning treatment liquid flow path 5 is provided between the bottom of the receiving tank 42 and the bottom of the processing tank 4 so as to circulate at the bottom of the processing tank 4. A rinsing liquid supply passage 6 is connected in the middle of the cleaning treatment liquid flow passage 5 near the bottom of the treatment bath 4, and the cleaning treatment liquid flow is provided from the connection portion 60 to the downstream side, that is, the bottom of the treatment bath 4. The path 5 and the rinse liquid supply path 6 are shared. In the vicinity of the connection portion 60 in the cleaning treatment liquid flow path 5 and the rinse liquid supply path 6, flow path switching valves V1 and V2 for switching the flow paths are provided respectively.
【0024】洗浄処理液流路5におけるバルブV1の上
流側には、排出用バルブV3が介設された第1の排出路
51が分岐されており、その分岐点から更に上流側に向
かってバルブV4、フィルタF及びポンプPが介設され
ている。また洗浄処理液流路5におけるポンプPの上流
側には、バルブV5が介設された第2の排出路52が分
岐されている。On the upstream side of the valve V1 in the cleaning treatment liquid flow path 5, there is branched a first discharge path 51 in which a discharge valve V3 is interposed, and from the branch point to a valve further upstream. A V4, a filter F and a pump P are provided. On the upstream side of the pump P in the cleaning treatment liquid flow path 5, a second discharge path 52 in which a valve V5 is provided is branched.
【0025】前記流路切り替え用バルブV1は、親子バ
ルブなとど呼ばれているものであり、大径の例えば3/
4インチの第1の流路71(第1の流路は、流量10リ
ットル/分以上の洗浄液が通過出来ればどのような流路
形状でも良い)とこの第1の流路71よりも小径の例え
ば1/8インチの第2の流路72(第2の流路は流量2
リットル/分以下の洗浄液あるいはリンス液が通過出来
ればどのような流路形状でもよい。)とを並列化した流
路と、これら流路71、72を夫々開閉する弁体73、
74とを備えている。またこの実施例の装置は、上述の
各バルブV1〜V5を所定のシーケンスで制御する制御
部61を有している。なお上述の各流路は例えばPFA
チューブにより構成される。The flow path switching valve V1 is called a parent-child valve and has a large diameter, for example, 3 /.
A 4-inch first flow path 71 (the first flow path may have any flow path shape as long as a cleaning liquid having a flow rate of 10 liters / minute or more can pass therethrough) and a diameter smaller than that of the first flow path 71. For example, the second channel 72 of 1/8 inch (the second channel has a flow rate of 2
Any flow passage shape may be used as long as it can pass a cleaning liquid or a rinse liquid at a rate of 1 / min or less. ) And a valve body 73 for opening and closing the channels 71, 72, respectively.
And 74. Further, the apparatus of this embodiment has a control section 61 for controlling the above-mentioned valves V1 to V5 in a predetermined sequence. Each of the above-mentioned flow paths is, for example, PFA.
Composed of tubes.
【0026】前記処理槽4内には洗浄処理液流路5の出
口付近に拡散板43が設けられると共に、その上方(ウ
エハ保持具3が支持される位置よりも下方側)には、例
えばウエハWの配列方向に沿ったスリットや孔部などが
形成された整流板44が設けられている。また処理槽4
の上方には、保持具3の搬送時に干渉しない位置に洗浄
処理液供給部45が配設されている。A diffusion plate 43 is provided in the processing tank 4 near the outlet of the cleaning treatment liquid flow path 5, and above the wafer (below the position where the wafer holder 3 is supported), for example, a wafer. A current plate 44 having slits and holes along the W arrangement direction is provided. In addition, processing tank 4
A cleaning treatment liquid supply unit 45 is disposed above the above, at a position where it does not interfere with the transportation of the holder 3.
【0027】次に上述実施例の作用について述べる。先
ず洗浄処理液供給部45から洗浄処理液例えば0.5%
フッ酸溶液を処理槽4内に供給し、図5(a)に示すよ
うにバルブV1の第1の流路71及びバルブV4を開い
てポンプPにより洗浄処理液を循環させておく。このと
きバルブV1の第2の流路72及びバルブV2、V3、
V5は閉じておく。そして例えば50枚のウエハWが並
列に配置されたウエハ保持具3を保持具搬送手段のアー
ム35a、35bにより処理槽4内へ搬入し、ウエハW
を洗浄処理液に浸漬して所定時間洗浄処理例えばエッチ
ングを行う。なおウエハ保持具3は処理槽4内の図示し
ない支持部で支持されるようになっている。続いてポン
プPを停止すると共に図5(b)に示すようにバルブV
1の第1の流路71及びバルブV4を閉じ、バルブV1
の第2の流路72、バルブV2、V3、V5を開き、図
示しないリンス液供給源よりリンス液供給路6にリンス
液例えば純水を供給する。このリンス液は接続部60か
ら処理槽4の底部を介して処理槽4内へリンス液が供給
される一方、洗浄処理液流路5内に流れ込み、バルブV
1の第2の流路72を通って第1の排出路51より排出
される。そして例えばバルブV2を開いた後処理槽4内
の比抵抗に影響を及ぼさない程十分に第2の流路72の
洗浄液をリンスした後、つまり接続部60や第2の流路
72の接続部が十分洗浄液からリンス液に置換した後例
えば30秒後にバルブV1の第2の流路72を閉じ、リ
ンス液供給路6を流れるリンス液の全てを処理槽4内に
供給する。Next, the operation of the above embodiment will be described. First, the cleaning treatment liquid is supplied from the cleaning treatment liquid supply unit 45, for example, 0.5%.
The hydrofluoric acid solution is supplied into the processing tank 4, the first flow path 71 of the valve V1 and the valve V4 are opened, and the cleaning processing solution is circulated by the pump P as shown in FIG. 5A. At this time, the second flow path 72 of the valve V1 and the valves V2, V3,
Keep V5 closed. Then, the wafer holder 3 in which, for example, 50 wafers W are arranged in parallel is loaded into the processing tank 4 by the arms 35a and 35b of the holder transfer means, and the wafer W is held.
Is immersed in a cleaning treatment liquid, and cleaning treatment such as etching is performed for a predetermined time. The wafer holder 3 is supported by a support portion (not shown) in the processing tank 4. Then, the pump P is stopped and the valve V is turned off as shown in FIG.
1, the first flow path 71 and the valve V4 are closed, and the valve V1
The second flow path 72 and the valves V2, V3, and V5 are opened, and a rinse liquid, for example, pure water, is supplied to the rinse liquid supply passage 6 from a rinse liquid supply source (not shown). The rinse liquid is supplied from the connecting portion 60 into the processing bath 4 through the bottom of the processing bath 4, and at the same time, flows into the cleaning processing liquid flow path 5 and the valve V
It is discharged from the first discharge path 51 through the first second flow path 72. Then, for example, after rinsing the cleaning liquid in the second flow passage 72 sufficiently so as not to affect the specific resistance in the post-treatment tank 4 with the valve V2 opened, that is, the connection portion 60 or the connection portion of the second flow passage 72. After the cleaning solution is sufficiently replaced with the rinse solution, the second flow path 72 of the valve V1 is closed, for example, 30 seconds later, and all of the rinse solution flowing through the rinse solution supply path 6 is supplied into the processing tank 4.
【0028】処理槽4内ではリンス液が拡散板43によ
り拡散され、整流板44に整流されて上昇し、処理槽4
内の洗浄処理液が純水により置換されてリンス処理が行
われる。処理槽4内の液の比抵抗が純水の比抵抗になっ
た後リンス液の供給を止め、リンス処理が終了する。な
お処理槽4からオーバーフローした液は第2の排出路5
2を通じて排出され、処理槽4内の液は、ウエハ保持具
3が搬出された後、例えばバルブV1の第1の流路71
及び第1の排出路51を通じて搬出される。こうした一
連のバルブの開閉操作は制御部61よりの制御信号に基
づいて行われる。In the processing tank 4, the rinsing liquid is diffused by the diffusion plate 43, rectified by the rectifying plate 44, and rises.
The cleaning treatment liquid in the inside is replaced with pure water to perform the rinse treatment. After the specific resistance of the liquid in the processing tank 4 becomes the specific resistance of pure water, the supply of the rinse liquid is stopped and the rinse process is completed. In addition, the liquid overflowing from the processing tank 4 is the second discharge path 5
After being discharged from the wafer holder 3, the liquid in the processing bath 4 is discharged through the second channel 71 of the valve V1, for example.
And is discharged through the first discharge path 51. The series of opening / closing operations of the valve is performed based on a control signal from the control unit 61.
【0029】上述実施例によれば、バルブV1の第1の
流路71を閉じて洗浄処理液の循環を止めた後、バルブ
V1の第2の流路72を開いて洗浄処理液流路中をリン
ス液を逆流させ排出しているので、接続部60とバルブ
V1との間の洗浄処理液流路5内の洗浄処理液がリンス
液により置換され、リンス液に混入して処理槽4内に入
り込むおそれはない。従って処理槽4内の液がリンス液
に置換されるまでの時間即ち比抵抗の立上りを早めるこ
とができ、リンス処理の時間が短縮化され、リンス液の
消費量が少なくなる。そしてリンス液が洗浄処理液流路
5内を逆流するときにはバルブV1内の小径の第2の流
路72を通るので、リンス液供給路6から処理槽4内へ
のリンス液の供給には実質影響がない。According to the above-described embodiment, after closing the first flow passage 71 of the valve V1 to stop the circulation of the cleaning treatment liquid, the second flow passage 72 of the valve V1 is opened so that the cleaning treatment liquid passage Since the rinse liquid is discharged by backflowing the rinse liquid, the cleaning treatment liquid in the cleaning treatment liquid passage 5 between the connection portion 60 and the valve V1 is replaced by the rinse liquid and mixed with the rinse liquid to be stored in the treatment tank 4. There is no danger of getting in. Therefore, the time until the liquid in the processing tank 4 is replaced with the rinse liquid, that is, the rise of the specific resistance can be accelerated, the time of the rinse treatment can be shortened, and the consumption amount of the rinse liquid can be reduced. When the rinse liquid flows back through the cleaning treatment liquid flow path 5, it passes through the small-diameter second flow passage 72 in the valve V1, so that the rinse liquid is substantially supplied from the rinse liquid supply passage 6 into the processing tank 4. There is no effect.
【0030】リンス液を洗浄処理液流路5内を逆流させ
るときには、逆流するリンス液の流量が多くならないよ
うに接続部60から排出路51の排出口までの少なくと
も一個所を小径にすることが必要であるが、そのために
は上述のように親子バルブをバルブV1として用いる代
りにバルブV1、V3の少なくとも一方を流量が調整で
きる構成とするか、あるいは別途流量調整バルブを設
け、リンス液の逆流(洗浄処理液流路5内の逆流)時に
制御部61よりの制御信号によりバルブを絞って流量を
小さくしてもよい。またあるいは、バルブV1として閉
状態になった時でも完全に流路がなくならないように、
わずかに流路を残しておくようなバルブを用い、リンス
処理時にバルブV3を開きかつバルブV1を閉じて、こ
のバルブV1のわずかな流路を通じてリンス液を逆流さ
せてもよい。When the rinse liquid is made to flow backward in the cleaning treatment liquid flow path 5, at least one portion from the connection portion 60 to the discharge port of the discharge passage 51 should be made small in diameter so that the flow rate of the rinse liquid flowing backward is not increased. It is necessary to do so, but instead of using the parent-child valve as the valve V1 as described above, at least one of the valves V1 and V3 can be adjusted in flow rate, or a separate flow rate adjustment valve is provided to allow the reverse flow of the rinse liquid. At the time of (backflow in the cleaning treatment liquid flow path 5), the valve may be throttled by the control signal from the controller 61 to reduce the flow rate. Alternatively, even if the valve V1 is closed, the flow passage is not completely lost.
It is also possible to use a valve that leaves a slight flow path, open the valve V3 and close the valve V1 during the rinse process, and allow the rinse liquid to flow backward through the slight flow path of the valve V1.
【0031】ここでリンス処理時に洗浄処理液流路5内
を通じてリンス液を小流量だけ排出するにあたって、P
FA(テトラフルオロエレチレン−パーフルオロアルキ
ルビニルエーテル共重合体)チューブの管径が3/4イ
ンチ、リンス液供給路6内のリンス液の流量が15リッ
トル/分程度、処理槽4の容積が12〜20リットルの
場合、リンス液の逆流量は、0.4〜0.5リットル/
分であることが好ましい。これは0.2〜0.3リット
ル/分程度の流量ではバルブV1と接続部60との間の
洗浄処理液が処理槽4内へのリンス液の流れの中に混入
して比抵抗の立上がりの遅れが発生し、逆に0.5リッ
トル/分以上の場合には、リンス液供給路6からのリン
ス液の大半が排出路51を通じて排出されてしまい、か
えって比抵抗の立上りが悪くなるからである。Here, when discharging the rinse liquid through the cleaning treatment liquid flow path 5 at a small flow rate during the rinse treatment, P
The diameter of the FA (tetrafluoroethylene / perfluoroalkyl vinyl ether copolymer) tube is 3/4 inch, the flow rate of the rinse liquid in the rinse liquid supply passage 6 is about 15 liters / minute, and the volume of the processing tank 4 is 12. In the case of ~ 20 liter, the reverse flow rate of the rinse liquid is 0.4-0.5 liter /
It is preferably minutes. This is because at a flow rate of about 0.2 to 0.3 liters / minute, the cleaning treatment liquid between the valve V1 and the connection portion 60 is mixed into the flow of the rinse liquid into the treatment tank 4 to raise the specific resistance. When 0.5 liter / min or more is generated, conversely, most of the rinse liquid from the rinse liquid supply passage 6 is discharged through the discharge passage 51, which rather deteriorates the rise of the specific resistance. Is.
【0032】更に本発明は、図6に示すように、バルブ
V1としては通常の開閉機能を有するバルブを用い、こ
のバルブV1のバルブ本体62から突出している接続用
配管63と接続部60側の配管64との合計の長さ(デ
ッドゾーンの長さ)つまりバルブ本体62の下流端から
接続部60に至るまでの長さをLとし、その管径をDと
すると、DがLよりも大きくなるように構成するように
しても好い。本発明者はLを1/2インチ、Dを3/4
インチに設定した場合と、Lを9/4インチ、Dを3/
4インチに設定した場合との夫々について比抵抗の回復
を測定したところ後者の方が前者に比べて回復時間が大
幅に短縮され、従って管径Dがデッドゾーンの長さL以
上の場合には、洗浄処理液の循環を止めた後リンス液を
リンス液供給管6に供給したときに、デッドゾーン内に
滞留している洗浄処理液が速やかにリンス液により置換
されることが理解される。Further, according to the present invention, as shown in FIG. 6, a valve having a normal opening / closing function is used as the valve V1, and the connecting pipe 63 protruding from the valve body 62 of the valve V1 and the connecting portion 60 side. Let L be the total length with the pipe 64 (length of the dead zone), that is, the length from the downstream end of the valve body 62 to the connecting portion 60, and let the pipe diameter be D, D is larger than L. Even if it is configured to be. The present inventor has set L to 1/2 inch and D to 3/4
When set to inch, L is 9/4 inch, D is 3 /
When the recovery of the specific resistance was measured for each of the case of setting to 4 inches, the recovery time of the latter was significantly shorter than that of the former, and therefore when the pipe diameter D was the length L of the dead zone or more. It is understood that when the rinse liquid is supplied to the rinse liquid supply pipe 6 after the circulation of the cleaning liquid is stopped, the cleaning liquid remaining in the dead zone is promptly replaced by the rinse liquid.
【0033】更にまた本発明では、図7に示すように洗
浄処理液流路5とリンス液供給路6の接続部60におい
て、洗浄処理液流路5、リンス液供給路6及び共用流路
80に、夫々接続される接続配管81a〜81cを備え
たバルブ8を設け、このバルブ8のバルブ本体82内
に、洗浄処理液流路5及びリンス液供給路6の一方を共
用流路に接続するための流路切り替えの弁体を設けるよ
うにしてもよい。ただしこのバルブ8は洗浄処理液流路
5を開閉する弁体のみを有し、リンス液供給路6の開閉
については別個にリンス液供給路6に専用のバルブを設
けるようにしてもよい。このようないわば集積化バルブ
を接続部60に設ければデッドゾーンはほとんどなくな
るので、やはり比抵抗の立上がりが早くなるという効果
が得られる。なお図7の実施例において、処理槽4内の
液を排出するためには、先の実施例のように第2の排出
路を設けてもよいし、あるいは別途排出路を処理槽4に
接続してもよい。Furthermore, in the present invention, as shown in FIG. 7, at the connecting portion 60 between the cleaning treatment liquid flow path 5 and the rinse liquid supply passage 6, the cleaning treatment liquid flow passage 5, the rinse liquid supply passage 6 and the common flow passage 80 are provided. Is provided with a valve 8 having connection pipes 81a to 81c respectively connected thereto, and one of the cleaning treatment liquid passage 5 and the rinse liquid supply passage 6 is connected to the common passage in the valve body 82 of the valve 8. A valve body for switching the flow path may be provided. However, the valve 8 may have only a valve body that opens and closes the cleaning treatment liquid passage 5, and a separate valve may be provided in the rinse liquid supply passage 6 for opening and closing the rinse liquid supply passage 6. In other words, if an integrated valve is provided in the connecting portion 60, the dead zone is almost eliminated, so that the effect of increasing the specific resistance quickly can be obtained. In the embodiment of FIG. 7, in order to discharge the liquid in the treatment tank 4, a second discharge passage may be provided as in the previous embodiment, or a separate discharge passage may be connected to the treatment tank 4. You may.
【0034】以上において本発明は、洗浄処理液供給源
から洗浄処理液流路を通じて処理槽内に洗浄処理液を供
給し、洗浄処理液の循環を行わない装置に対しても適用
できる。そしてまたフッ酸溶液により酸化膜をエッチン
グする場合に限らず、例えばリン酸溶液によって窒化膜
をエッチングする場合やリン酸、酢酸、硝酸の混合液に
よってアルミニウムをエッチングする場合にも適用でき
る。またその他洗浄処理としてはAPM溶液(アンモニ
ア+過酸化水素水+純水)によりパーティクルの除去を
行う場合HPM溶液(塩酸+過酸化水素水+純水)によ
り金属汚染を洗浄する場合、あるいはSPM溶液(硫酸
+過酸化水素水)によりレジスト膜の有機物を除去する
場合などであってもよい。なお被処理基板としては、液
晶基板やプリンと基板などであってもよい。In the above, the present invention can also be applied to an apparatus in which the cleaning treatment liquid is supplied from the cleaning treatment liquid supply source into the processing tank through the cleaning treatment liquid flow path and the cleaning treatment liquid is not circulated. Further, the invention is not limited to the case of etching an oxide film with a hydrofluoric acid solution, but can be applied to the case of etching a nitride film with a phosphoric acid solution or the case of etching aluminum with a mixed solution of phosphoric acid, acetic acid, and nitric acid. Other cleaning treatments include APM solution (ammonia + hydrogen peroxide solution + pure water) for removing particles, HPM solution (hydrochloric acid + hydrogen peroxide solution + pure water) for cleaning metal contamination, or SPM solution. For example, the organic matter of the resist film may be removed with (sulfuric acid + hydrogen peroxide solution). The substrate to be processed may be a liquid crystal substrate or a pudding and substrate.
【0035】[0035]
【発明の効果】以上のように本発明によれば、洗浄処理
液による処理の後、リンス液供給路からリンス液を処理
槽内に供給する場合に、洗浄処理液流路内の洗浄処理液
が処理槽内に徐々に混入することを防止でき、この結果
リンス液による置換の時間が短縮し、リンス処理を短時
間で行うことができると共にリンス液の消費量を低減す
ることができる。As described above, according to the present invention, when the rinse liquid is supplied from the rinse liquid supply passage into the processing tank after the treatment with the cleaning treatment liquid, the cleaning treatment liquid in the cleaning treatment liquid passage is provided. Can be prevented from gradually mixing into the processing tank, and as a result, the time for replacement with the rinse liquid can be shortened, the rinse treatment can be performed in a short time, and the consumption amount of the rinse liquid can be reduced.
【図1】本発明の実施例に係る洗浄装置の全体構成を示
す概略斜視図である。FIG. 1 is a schematic perspective view showing an overall configuration of a cleaning device according to an embodiment of the present invention.
【図2】本発明の一施例に用いられる処理槽及びウエハ
保持具を示す斜視図である。FIG. 2 is a perspective view showing a processing tank and a wafer holder used in one embodiment of the present invention.
【図3】本発明の一実施例に係る処理槽及び配管系を示
す説明図である。FIG. 3 is an explanatory diagram showing a processing tank and a piping system according to an embodiment of the present invention.
【図4】本発明の一実施例に用いられる流路切り替え用
バルブの内部構造を示す概略断面図である。FIG. 4 is a schematic cross-sectional view showing the internal structure of a flow path switching valve used in an embodiment of the present invention.
【図5】本発明の一実施例の作用を示す説明図である。FIG. 5 is an explanatory diagram showing an operation of one embodiment of the present invention.
【図6】本発明の他の実施例に係る接続部付近を示す拡
大図である。FIG. 6 is an enlarged view showing the vicinity of a connecting portion according to another embodiment of the present invention.
【図7】本発明の更に他の実施例に係る処理槽及び配管
系を示す説明図である。FIG. 7 is an explanatory view showing a processing tank and a piping system according to still another embodiment of the present invention.
【図8】従来の洗浄装置の要部を示す断面図である。FIG. 8 is a sectional view showing a main part of a conventional cleaning device.
【図9】従来の洗浄装置の処理槽及び配管系を示す説明
図である。FIG. 9 is an explanatory diagram showing a processing tank and a piping system of a conventional cleaning device.
3 ウエハ保持具 4 処理槽 42 受容槽 5 洗浄処理液流路 51 第1の排出路 52 第2の排出路 6 リンス液供給路 60 接続部 71 大径の第1の流路 72 小径の第2の流路 8 集積化バルブ 3 Wafer Holder 4 Processing Tank 42 Receiving Tank 5 Cleaning Processing Liquid Channel 51 First Discharging Channel 52 Second Discharging Channel 6 Rinsing Liquid Supply Channel 60 Connection Part 71 Large First Channel 72 Small Diameter Second Channel 8 Integrated valve
Claims (6)
理液流路と、この洗浄処理液流路の途中に接続されると
共にその接続部から下流側を洗浄処理液流路と共用し、
処理槽内にリンス液を供給するためのリンス液供給路
と、を備え、複数の被処理基板を前記処理槽内に配列し
て洗浄処理液により洗浄し、次いでリンス液供給路から
処理槽内にリンス液を供給してリンス処理を行う洗浄装
置において、 前記洗浄処理液流路における前記接続部の近傍に流路切
り替え用バルブを設け、このバルブを、大径の第1の流
路及びこの第1の流路よりも小径の第2の流路を並列化
した流路と、これら流路を夫々開閉する弁体とを含む構
成とし、 前記バルブの上流側には、排出用バルブが介設された排
出路を分岐させ、 洗浄処理液の流入時には前記第1の流路を開きかつ第2
の流路及び排出用バルブを閉じておき、リンス処理時に
は、第1の流路を閉じかつ第2の流路及び排出用バルブ
を開いて、リンス液により前記接続部の近傍の洗浄処理
液流路内の洗浄処理液を前記排出路を通じて排出するよ
うに各バルブを制御する制御部を設けたことを特徴とす
る洗浄装置。1. A cleaning treatment liquid flow path for introducing a cleaning treatment liquid into a treatment tank, and a cleaning treatment liquid flow passage connected to an intermediate part of the cleaning treatment liquid flow passage and sharing the downstream side from the connection portion with the cleaning treatment liquid flow passage. ,
A rinse liquid supply path for supplying a rinse liquid into the processing tank, and arranging a plurality of substrates to be processed in the processing tank to wash them with a cleaning processing liquid; and then from the rinse liquid supply path into the processing tank. In a cleaning device for supplying a rinse liquid to the rinse treatment device, a flow passage switching valve is provided in the vicinity of the connection portion in the cleaning treatment liquid flow passage, and the valve is provided with a large-diameter first flow passage and this A configuration is provided that includes a flow passage in which a second flow passage having a diameter smaller than that of the first flow passage is arranged in parallel, and a valve body that opens and closes each of these flow passages. An exhaust valve is provided upstream of the valve. The discharge path provided is branched so that the first flow path is opened and the second flow path is opened when the cleaning treatment liquid flows in.
Of the cleaning treatment liquid flow in the vicinity of the connection portion with the rinse liquid by closing the first flow passage and the second flow passage and the discharge valve at the time of the rinsing process. A cleaning device comprising a control unit for controlling each valve so that the cleaning liquid in the passage is discharged through the discharge passage.
理液流路と、この洗浄処理液流路の途中に接続されると
共にその接続部から下流側を洗浄処理液流路と共用し、
処理槽内にリンス液を供給するためのリンス液供給路
と、を備え、複数の被処理基板を前記処理槽内に配列し
て洗浄処理液により洗浄し、次いでリンス液供給路から
処理槽内にリンス液を供給してリンス処理を行う洗浄装
置において、 前記洗浄処理液流路における前記接続部の近傍に流路切
り替え用バルブを設け、このバルブの上流側にて排出用
バルブが介設された排出路を分岐させ、これら両方のバ
ルブのうち少なくとも一方を流量を調整できる構成と
し、リンス処理時には流路切り替え用バルブ及び排出用
バルブを開くと共に、これらバルブの少なくとも一方に
より流路を絞り、前記接続部の近傍の洗浄処理液流路内
の洗浄処理液をリンス液により前記排出路を通じて排出
するように各バルブを制御する制御部を設けたことを特
徴とする洗浄装置。2. A cleaning treatment liquid flow channel for flowing a cleaning treatment liquid into a treatment tank, and a cleaning treatment liquid flow passage connected to an intermediate portion of the cleaning treatment liquid flow passage and sharing the downstream side from the connection portion with the cleaning treatment liquid flow passage. ,
A rinse liquid supply path for supplying a rinse liquid into the processing tank, and arranging a plurality of substrates to be processed in the processing tank to wash them with a cleaning processing liquid; and then from the rinse liquid supply path into the processing tank. In a cleaning device for supplying a rinse liquid to the rinse processing device, a flow path switching valve is provided near the connection portion in the cleaning processing liquid flow path, and an exhaust valve is provided upstream of this valve. The discharge path is branched, and at least one of these valves is configured to adjust the flow rate.The flow path switching valve and the discharge valve are opened during the rinse process, and the flow path is throttled by at least one of these valves. A control unit is provided to control each valve so that the rinse liquid in the rinse liquid passage in the vicinity of the connection portion is discharged through the discharge passage by a rinse liquid. Cleaning device.
理液流路と、この洗浄処理液流路の途中に接続されると
共にその接続部から下流側を洗浄処理液流路と共用し、
処理槽内にリンス液を供給するためのリンス液供給路
と、を備え、複数の被処理基板を前記処理槽内に配列し
て洗浄処理液により洗浄し、次いでリンス液供給路から
処理槽内にリンス液を供給してリンス処理を行う洗浄装
置において、 前記洗浄処理液流路における前記接続部の近傍に、閉じ
たときにもわずかに流路が残るように構成された流路切
り替え用バルブを設け、このバルブの上流側にて排出用
バルブが介設された排出路を分岐させ、リンス処理時に
は流路切り替え用バルブを閉じかつ排出用バルブを開
き、これにより前記接続部の近傍の洗浄処理液流路内の
洗浄処理液をリンス液により前記流路切り替え用バルブ
及び排出路を通じて排出するように各バルブを制御する
制御部を設けたことを特徴とする洗浄装置。3. A cleaning treatment liquid flow channel for flowing a cleaning treatment liquid into a treatment tank, and a cleaning treatment liquid flow passage connected to an intermediate part of the cleaning treatment liquid flow passage and sharing the downstream side from the connection portion with the cleaning treatment liquid flow passage. ,
A rinse liquid supply path for supplying a rinse liquid into the processing tank, and arranging a plurality of substrates to be processed in the processing tank to wash them with a cleaning processing liquid; and then from the rinse liquid supply path into the processing tank. In a cleaning device for supplying a rinse liquid to the rinse treatment device, in the vicinity of the connection part in the cleaning treatment liquid flow passage, a passage switching valve configured to leave a slight passage even when closed. Is provided, and the discharge path in which the discharge valve is provided is branched on the upstream side of this valve, and the flow path switching valve is closed and the discharge valve is opened during the rinsing process, thereby cleaning the vicinity of the connection part. A cleaning apparatus comprising a control unit for controlling each valve so that the cleaning processing liquid in the processing liquid flow path is discharged by a rinse liquid through the flow path switching valve and the discharge path.
理液流路と、この洗浄処理液流路の途中に接続されると
共にその接続部から下流側を洗浄処理液流路と共用し、
処理槽内にリンス液を供給するためのリンス液供給路
と、を備え、複数の被処理基板を前記処理槽内に配列し
て洗浄処理液により洗浄し、次いでリンス液供給路から
処理槽内にリンス液を供給してリンス処理を行う洗浄装
置において、 前記洗浄処理液流路から排出路を分岐させ、洗浄処理液
により洗浄処理が終了した後、リンス液供給路から処理
槽内にリンス液を供給する一方、リンス液供給路から接
続部、洗浄処理液流路及び排出路を通じてリンス液を排
出し、この排出工程時には、前記接続部から排出路の出
口に至るまでの少なくとも一部は、処理槽内へのリンス
液の供給に支障がない程度に細い流路とされることを特
徴とする洗浄方法。4. A cleaning treatment liquid flow channel for flowing a cleaning treatment liquid into a treatment tank, and a cleaning treatment liquid flow passage connected to an intermediate part of the cleaning treatment liquid flow passage and sharing the downstream side from the connection portion with the cleaning treatment liquid flow passage. ,
A rinse liquid supply path for supplying a rinse liquid into the processing tank, and arranging a plurality of substrates to be processed in the processing tank to wash them with a cleaning processing liquid; and then from the rinse liquid supply path into the processing tank. In a cleaning device for supplying a rinse liquid to the rinse treatment device, the discharge passage is branched from the cleaning treatment liquid passage, and after the cleaning treatment is completed by the cleaning treatment liquid, the rinse liquid is supplied from the rinse liquid supply passage into the treatment tank. Meanwhile, the rinse liquid is discharged from the rinse liquid supply passage through the connection portion, the cleaning treatment liquid passage and the discharge passage, and at the time of this discharge step, at least a part from the connection portion to the outlet of the discharge passage, A cleaning method characterized in that the flow path is thin enough not to hinder the supply of the rinse liquid into the processing tank.
理液流路と、この洗浄処理液流路の途中に接続されると
共にその接続部から下流側を洗浄処理液流路と共用し、
処理槽内にリンス液を供給するためのリンス液供給路
と、を備え、複数の被処理基板を前記処理槽内に配列し
て洗浄処理液により洗浄し、次いでリンス液供給路から
処理槽内にリンス液を供給してリンス処理を行う洗浄装
置において、 前記洗浄処理液流路における前記接続部の近傍に流路切
り替え用バルブを設け、 前記接続部から前記流路切り
替え用バルブのバルブ本体までの流路の長さを当該流路
の径よりも短く設定したことを特徴とする洗浄装置。5. A cleaning treatment liquid flow channel for flowing a cleaning treatment liquid into a treatment tank, and a cleaning treatment liquid flow passage connected to an intermediate portion of the cleaning treatment liquid flow passage and sharing the downstream side from the connection portion with the cleaning treatment liquid flow passage. ,
A rinse liquid supply path for supplying a rinse liquid into the processing tank, and arranging a plurality of substrates to be processed in the processing tank to wash them with a cleaning processing liquid; and then from the rinse liquid supply path into the processing tank. In a cleaning device for supplying a rinse liquid to the rinse processing device, a flow path switching valve is provided in the vicinity of the connection portion in the cleaning processing liquid flow path, and from the connection portion to the valve body of the flow path switching valve. The cleaning device is characterized in that the length of the channel is set shorter than the diameter of the channel.
理液流路と、この洗浄処理液流路の途中に接続されると
共にその接続部から下流側を洗浄処理液流路と共用し、
処理槽内にリンス液を供給するためのリンス液供給路
と、を備え、複数の被処理基板を前記処理槽内に配列し
て洗浄処理液により洗浄し、次いでリンス液供給路から
処理槽内にリンス液を供給してリンス処理を行う洗浄装
置において、 前記接続部には、バルブ本体に連続し、洗浄処理液、リ
ンス液流路及びこれらの共用流路の三方に夫々接続され
る接続配管が形成されたバルブが設けられ、バルブ本体
には洗浄処理液流路を開閉する弁体が設けられているこ
とを特徴とする洗浄装置。6. A cleaning treatment liquid flow channel for flowing a cleaning treatment liquid into a treatment tank, and a cleaning treatment liquid flow passage connected to an intermediate part of the cleaning treatment liquid flow passage and sharing the downstream side from the connection portion with the cleaning treatment liquid flow passage. ,
A rinse liquid supply path for supplying a rinse liquid into the processing tank, and arranging a plurality of substrates to be processed in the processing tank to wash them with a cleaning processing liquid; and then from the rinse liquid supply path into the processing tank. In the cleaning device for supplying a rinse liquid to the rinse device, the connecting portion is connected to the valve body, and the connection pipes are connected to the cleaning process liquid, the rinse liquid flow path, and the shared flow path of these, respectively. A cleaning device, wherein a valve having a valve formed therein is provided, and a valve body that opens and closes a cleaning treatment liquid flow path is provided in the valve body.
Priority Applications (8)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7019821A JPH08195371A (en) | 1995-01-12 | 1995-01-12 | Cleaning device and method |
US08/583,979 US5730162A (en) | 1995-01-12 | 1996-01-11 | Apparatus and method for washing substrates |
TW085114511A TW349232B (en) | 1995-01-12 | 1996-01-12 | Substrate cleaning device and substrate cleaning method |
TW085114509A TW348265B (en) | 1995-01-12 | 1996-01-12 | Apparatus and method for washing substrates |
TW085114510A TW349231B (en) | 1995-01-12 | 1996-01-12 | Substrate cleaning device and substrate cleaning method |
TW085100348A TW348264B (en) | 1995-01-12 | 1996-01-12 | Apparatus and method for washing substrates |
KR1019960000944A KR100239942B1 (en) | 1995-01-12 | 1996-01-12 | Apparatus and method for washing substrates |
US08/976,262 US5817185A (en) | 1995-01-12 | 1997-11-21 | Method for washing substrates |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7019821A JPH08195371A (en) | 1995-01-12 | 1995-01-12 | Cleaning device and method |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH08195371A true JPH08195371A (en) | 1996-07-30 |
Family
ID=12009988
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7019821A Pending JPH08195371A (en) | 1995-01-12 | 1995-01-12 | Cleaning device and method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH08195371A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109396102A (en) * | 2017-08-18 | 2019-03-01 | 爱思开矽得荣株式会社 | Wafer cleaning device and the cleaning method for using the equipment |
-
1995
- 1995-01-12 JP JP7019821A patent/JPH08195371A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109396102A (en) * | 2017-08-18 | 2019-03-01 | 爱思开矽得荣株式会社 | Wafer cleaning device and the cleaning method for using the equipment |
US11152228B2 (en) | 2017-08-18 | 2021-10-19 | Sk Siltron Co., Ltd. | Wafer cleaning apparatus and cleaning method using the same |
CN109396102B (en) * | 2017-08-18 | 2022-02-18 | 爱思开矽得荣株式会社 | Wafer cleaning apparatus and cleaning method using the same |
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