JPH0795998B2 - Endoscope - Google Patents
EndoscopeInfo
- Publication number
- JPH0795998B2 JPH0795998B2 JP62227585A JP22758587A JPH0795998B2 JP H0795998 B2 JPH0795998 B2 JP H0795998B2 JP 62227585 A JP62227585 A JP 62227585A JP 22758587 A JP22758587 A JP 22758587A JP H0795998 B2 JPH0795998 B2 JP H0795998B2
- Authority
- JP
- Japan
- Prior art keywords
- shape memory
- memory alloy
- resistance value
- bending portion
- current
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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- Instruments For Viewing The Inside Of Hollow Bodies (AREA)
- Endoscopes (AREA)
Description
【発明の詳細な説明】 ［産業上の利用分野］ この発明は形状記憶合金を用いて湾曲部を湾曲させる構
造の内視鏡に関する。Description: [Industrial application] The present invention relates to an endoscope having a structure in which a bending portion is bent using a shape memory alloy.
［従来の技術］ 一般に、内視鏡の湾曲部を湾曲させる構造としては、挿
入部に操作ワイヤを挿通し、その操作ワイヤの先端を上
記湾曲部の先端に連結するとともに、基端を操作部に設
けられたアングルノブに連結し、このアングルノブによ
って上記操作ワイヤを押し引き操作して上記湾曲部を湾
曲させるようにしたものが知られている。[Prior Art] Generally, as a structure for bending a bending portion of an endoscope, an operation wire is inserted into an insertion portion, a distal end of the operation wire is connected to a distal end of the bending portion, and a base end is operated. It is known that the bending portion is connected to an angle knob provided on the, and the angle knob pushes and pulls the operation wire to bend the bending portion.
しかしながら、このような構造によると、構造が複雑化
して挿入部の大径化を招くばかりか、かなり大きな操作
力が必要になるから、操作性が悪いなどのことがあっ
た。However, according to such a structure, not only the structure becomes complicated and the diameter of the insertion portion is increased, but also a considerably large operating force is required, which causes poor operability.
そこで、このような欠点を除去するため、湾曲部に形状
記憶合金を設け、これを通電加熱して変化させることに
より、上記湾曲部を湾曲させるようにする構造が実用化
されつつある。形状記憶合金を用いて湾曲部を湾曲させ
る場合、その湾曲量を制御するには、上記形状記憶合金
の抵抗値の変化を検出し、その検出値に応じて上記形状
記憶合金への通電量を制御することが行なわれる。その
ような先行技術としてはたとえば特願昭61−276089号
（特開昭63−130034号）がある。Therefore, in order to eliminate such a defect, a structure in which a shape memory alloy is provided in the curved portion and is heated by energization to change the curved portion to bend the curved portion is being put into practical use. When bending a bending portion using a shape memory alloy, in order to control the bending amount, a change in the resistance value of the shape memory alloy is detected, and the amount of electricity supplied to the shape memory alloy is determined according to the detected value. Control is performed. As such a prior art, there is, for example, Japanese Patent Application No. 61-276089 (Japanese Patent Laid-Open No. 63-130034).
［発明が解決しようとする問題点］ ところで、形状記憶合金は第７図に示すように形状回復
動作を始める温度T1から形状回復動作を終了する温度T2
においては電気抵抗はR1からR2へ減少する。また、第８
図Ａに示すように形状記憶合金は温度T1からT2において
負の抵抗温度係数を持つ。これに対して形状記憶合金へ
通電するための通電線は同図にＢで示すように正の抵抗
温度係数を持つ。また通電線は内視鏡の挿入部とユニバ
ーサルコードとにわたり長尺に設けられている。そのた
め、通電線の通電による温度変化や長さによる影響を受
け、形状記憶合金の抵抗値を正確に測定することができ
ず、しかもその抵抗値の変化量は小さいから、そのこと
によっても正確な測定が難しい。したがって、湾曲部の
湾曲量を正確に制御できないということがあった。[Problems to be Solved by the Invention] By the way, in the shape memory alloy, as shown in FIG. 7, the temperature T 1 at which the shape recovery operation is started to the temperature T 2 at which the shape recovery operation is finished is ended.
At, the electrical resistance decreases from R 1 to R 2 . Also, the eighth
As shown in FIG. A, the shape memory alloy has a negative temperature coefficient of resistance at temperatures T 1 to T 2 . On the other hand, the conducting wire for energizing the shape memory alloy has a positive temperature coefficient of resistance as indicated by B in the figure. In addition, the current-carrying wire is provided in a long length across the insertion portion of the endoscope and the universal cord. Therefore, the resistance value of the shape memory alloy cannot be accurately measured due to the influence of temperature change and length due to the energization of the current-carrying wire, and the amount of change in the resistance value is small. It is difficult to measure. Therefore, the bending amount of the bending portion may not be accurately controlled.
この発明は上記事情にもとずきなされたもので、その目
的とするところは、形状記憶合金の抵抗値を正確に測定
し、湾曲部の湾曲量の制御を確実に行なえるようにした
内視鏡を提供することにある。The present invention has been made in view of the above circumstances, and an object of the invention is to accurately measure the resistance value of a shape memory alloy and to reliably control the bending amount of a bending portion. To provide an endoscope.
［問題点を解決するための手段及び作用］ 上記問題点を解決するためにこの発明は、先端部に湾曲
部が設けられた挿入部と、上記湾曲部内に設けられたそ
の形状変化によって上記湾曲部を湾曲させる第１の形状
記憶合金と同じ特性を有する第２の形状記憶合金と、上
記第１および第２の形状記憶合金に同じ大きさの電流を
流す通電回路と、上記第２の形状記憶合金の抵抗値を検
出する抵抗値検出部と、この抵抗値検出部の検出信号に
よって上記通電回路を制御する通電制御部とを具備す
る。それによって上記第１の形状記憶合金と同等の第２
の形状記憶合金の抵抗値を測定して湾曲量を制御する。[Means and Actions for Solving Problems] In order to solve the above problems, the present invention provides an insertion portion having a bending portion at a distal end thereof, and a change in shape due to a change in the shape provided in the bending portion. A second shape memory alloy having the same characteristics as the first shape memory alloy for bending the portion, a current-carrying circuit for supplying a current of the same magnitude to the first and second shape memory alloys, and the second shape A resistance value detection unit that detects the resistance value of the memory alloy and an energization control unit that controls the energization circuit according to a detection signal of the resistance value detection unit are provided. As a result, the second shape memory alloy equivalent to the first shape memory alloy
The resistance of the shape memory alloy is measured to control the amount of bending.
［実施例］ 以下、この発明の第１の実施例を第１図と第２図を参照
して説明する。第１図に示す内視鏡１は操作部２を備え
ている。この操作部２には挿入部３と、ユニバーサルコ
ード４とが連結されている。上記挿入部３は可撓管部５
の先端に湾曲部６を介して先端構成部７が設けられてな
り、上記ユニバーサルコード４の末端には光源装置８に
連結されるコネクタ９が設けられている。[Embodiment] A first embodiment of the present invention will be described below with reference to FIGS. 1 and 2. The endoscope 1 shown in FIG. 1 includes an operation unit 2. The insertion portion 3 and the universal cord 4 are connected to the operation portion 2. The insertion part 3 is a flexible tube part 5.
A tip forming portion 7 is provided at the tip of the universal cord 4 via a curved portion 6, and a connector 9 connected to a light source device 8 is provided at the end of the universal cord 4.
上記湾曲部６にはその軸方向に沿って第１の形状記憶合
金11が配設されている。この第１の形状記憶合金11はた
とえばTi−Ni合金やCu−Zn−Al系合金などからなり、変
態温度以上に加熱すると、予め記憶された形状に変形
し、上記湾曲部６を湾曲させるようになっている。A first shape memory alloy 11 is arranged on the curved portion 6 along the axial direction thereof. The first shape memory alloy 11 is made of, for example, a Ti-Ni alloy or a Cu-Zn-Al alloy, and when heated to a temperature higher than the transformation temperature, the first shape memory alloy 11 is deformed into a previously stored shape, so that the bending portion 6 is bent. It has become.
上記第１の形状記憶合金11の両端にはそれぞれ第１の通
電線12と第２の通電線13との一端それぞれ接続されてい
る。これら通電線12、13は操作部２からユニバーサルコ
ード４に通されている。そして、第１の通電線12の他端
はコネクタ９を介して上記光源装置８に内蔵された通電
回路14に接続されている。また、上記第２の通電線13の
他端は同じくコネタク９を介して光源装置８内に設けら
れた第２の形状記憶合金15の一端に接続されている。こ
の第２の形状記憶合金15の他端は上記通電回路14に接続
されている。Both ends of the first shape memory alloy 11 are connected to one ends of a first conducting wire 12 and a second conducting wire 13, respectively. The energizing lines 12 and 13 are passed from the operation section 2 to the universal cord 4. The other end of the first conducting wire 12 is connected to the conducting circuit 14 built in the light source device 8 via the connector 9. The other end of the second conducting wire 13 is also connected to one end of a second shape memory alloy 15 provided in the light source device 8 via the connector 9 as well. The other end of the second shape memory alloy 15 is connected to the energizing circuit 14.
上記第２の形状記憶合金15は上記第１の形状記憶合金11
と同じ材質で同じ形状記憶処理がなされた、つまり同じ
く特性を有するものが用いられている。そして、この第
２の形状記憶合金15にはこの抵抗値を検出する抵抗値検
出部16が接続されている。この抵抗値検出部16にはここ
からの検出信号が入力される通電制御部17が接続され、
この通電制御部17によって上記通電回路14から出力され
る電流値が制御されるようになっている。The second shape memory alloy 15 is the first shape memory alloy 11
The same material that has been subjected to the same shape memory processing, that is, has the same characteristics is used. A resistance value detection unit 16 that detects this resistance value is connected to the second shape memory alloy 15. An energization control unit 17 to which a detection signal from this is input is connected to the resistance value detection unit 16,
The current value output from the energization circuit 14 is controlled by the energization control unit 17.
第２図は第１図に示した構成の回路図を示し、同図から
分るように第１の形状記憶合金11と第２の形状記憶合金
15とは直列に接続されているとともに、抵抗値検出部16
は上記第２の形状記憶合金15に対して並列に接続されて
いる。したがって、第１および第２の形状記憶合金11、
15には同じ大きさの電流ｉが流れるとともに、抵抗値検
出部16は第１、第２の通電線12、13の抵抗値を測定せ
ず、第２の形状記憶合金15の抵抗値だけを測定すること
ができるようになっている。なお、第２図中ｒは第１、
第２の通電線12、13の抵抗値を示す。FIG. 2 shows a circuit diagram of the configuration shown in FIG. 1, and as can be seen from the figure, the first shape memory alloy 11 and the second shape memory alloy are shown.
15 is connected in series with the resistance value detection unit 16
Are connected in parallel to the second shape memory alloy 15. Therefore, the first and second shape memory alloys 11,
A current i of the same magnitude flows through 15, and the resistance value detection unit 16 does not measure the resistance values of the first and second conducting wires 12 and 13, but only the resistance value of the second shape memory alloy 15. It can be measured. In FIG. 2, r is the first,
The resistance values of the second conducting wires 12 and 13 are shown.
このような構造の内視鏡１においては、通電回路14を作
動させ、第１、第２の通電線12、13を介して第１の形状
記憶合金11を通電加熱すれば、この第１の形状記憶合金
11は記憶された形状に変形するから、それによって湾曲
部６を湾曲させることができる。In the endoscope 1 having such a structure, if the energizing circuit 14 is operated and the first shape memory alloy 11 is energized and heated via the first and second energizing wires 12 and 13, this first Shape memory alloy
Since 11 is deformed to the memorized shape, the bending portion 6 can be bent accordingly.
上記第１の形状記憶合金11への通電と同時に第２の形状
記憶合金15にも同じ大きさの電流が流れて加熱されるた
め、この第２の形状記憶合金15も第１の形状記憶合金11
と同じ状態で変形する。そして、この第２の形状記憶合
金15の変態にともない変化する抵抗値が抵抗値検出部16
で検出され、その検出値が通電制御部17に入力されるこ
とによってこの通電制御部17が通電回路14から第１の形
状記憶合金11に流れる電流値を制御する。At the same time when the first shape memory alloy 11 is energized, an electric current of the same magnitude flows through the second shape memory alloy 15 to heat it, so that the second shape memory alloy 15 is also the first shape memory alloy. 11
It transforms in the same state as. The resistance value changing with the transformation of the second shape memory alloy 15 is the resistance value detecting unit 16
Is detected and the detected value is input to the energization control unit 17, which controls the value of the current flowing from the energization circuit 14 to the first shape memory alloy 11.
すなわち、第１の形状記憶合金11と同じ特性の第２の形
状記憶合金15の抵抗値を測定するようにしたので、第
１、第２の通電線12、13の温度変化や長さによる影響を
受けずに上記第１の形状記憶合金11と同等の第２の形状
記憶合金15の抵抗値を正確に求めることができる。した
がって、湾曲部６を所望する状態に湾曲させるに最適な
値の電流を上記通電回路14から上記第１の形状記憶合金
11へ流すことができるから、上記湾曲部６を高精度に湾
曲させることができる。第３図と第４図はこの発明の第
２の実施例を示し、これは第１の形状記憶合金11を第
１、第２の通電線12、13によって通電回路14に直接接続
するとともに、第２の形状記憶合金15を上記第１の形状
記憶合金11とは別の回路で上記通電回路14に接続するよ
うにした。第４図は第３図に示した構成の回路図であ
る。That is, since the resistance value of the second shape memory alloy 15 having the same characteristics as that of the first shape memory alloy 11 is measured, the influence of the temperature change and the length of the first and second current-carrying wires 12 and 13 is measured. It is possible to accurately obtain the resistance value of the second shape memory alloy 15 equivalent to the first shape memory alloy 11 without receiving the above. Therefore, a current having an optimum value for bending the bending portion 6 to a desired state is supplied from the energizing circuit 14 to the first shape memory alloy.
Since it can flow to 11, the bending portion 6 can be bent with high accuracy. FIGS. 3 and 4 show a second embodiment of the present invention, in which the first shape memory alloy 11 is directly connected to the current-carrying circuit 14 by the first and second current-carrying wires 12 and 13. The second shape memory alloy 15 is connected to the energizing circuit 14 in a circuit different from that of the first shape memory alloy 11. FIG. 4 is a circuit diagram of the configuration shown in FIG.
このような構成においても、上記第１の実施例と同様第
２の形状記憶合金15の抵抗を正確に測定し、それによっ
て湾曲部６を高精度に湾曲させることができる。Even in such a configuration, the resistance of the second shape memory alloy 15 can be accurately measured, and the bending portion 6 can be bent with high accuracy, as in the first embodiment.
第５図はこの発明の第３の実施例で、これは湾曲部６に
複数、この場合は２つの第１の形状記憶豪気金11を設
け、その湾曲部６を鎖線で示すように２方向に湾曲させ
ることができるようにしたものである。FIG. 5 shows a third embodiment of the present invention in which a plurality of, in this case, two first shape memory heavy metals 11 are provided in the bending portion 6, and the bending portion 6 is bidirectional as shown by a chain line. It is designed so that it can be bent.
また、第６図はこの発明の第４の実施例を示し、これは
湾曲部６の長さ方向に沿って３つの第１の形状記憶合金
11を配置し、湾曲部６を鎖線で示すように関節状に湾曲
させることができるようにしたものである。Further, FIG. 6 shows a fourth embodiment of the present invention, in which three first shape memory alloys are provided along the length direction of the bending portion 6.
11 is arranged so that the bending portion 6 can be bent like a joint as shown by a chain line.
これら第３、第４の実施例においても、光源装置８内に
第２の形状記憶合金を設け、その抵抗を測定して第１の
形状記憶合金11への通電を制御するようにすれば、湾曲
部６の湾曲を高精度に行うことができる。Also in these third and fourth embodiments, if the second shape memory alloy is provided in the light source device 8 and the resistance thereof is measured to control the energization to the first shape memory alloy 11, The bending of the bending portion 6 can be performed with high accuracy.
なお、上記各実施例において、第１の形状記憶合金11は
湾曲部６を湾曲させるときの負荷の影響で抵抗が変化す
る可能性があるから、第２の形状記憶合金15に第１の形
状記憶合金11と同じ負荷を加えるようにすれば、湾曲部
６の湾曲をさらに高精度に制御することができる。In each of the above embodiments, the resistance of the first shape memory alloy 11 may change due to the influence of the load when the bending portion 6 is bent. By applying the same load as the memory alloy 11, the bending of the bending portion 6 can be controlled with higher accuracy.
［発明の効果］ 以上述べたようにこの発明は湾曲部を湾曲させる第１の
形状記憶合金の他に、この第１の形状記憶合金と同じ特
性の第２の形状記憶合金を設け、これら両者に同じ大き
さの電流を流すとともに、第２の形状記憶合金の抵抗値
を測定して第１の形状記憶合金の変形量を制御するよう
にした。したがって、第１の形状記憶合金を通電加熱す
るための通電線の温度変化や長さによる抵抗値の影響を
受けずに上記第１の形状記憶合金と同等の第２の形状記
憶合金の抵抗値を測定することができるから、それによ
って湾曲部を高精度に湾曲させることができる。As described above, the present invention provides the second shape memory alloy having the same characteristics as the first shape memory alloy in addition to the first shape memory alloy that bends the bending portion. A current of the same magnitude was applied to the first shape memory alloy, and the resistance value of the second shape memory alloy was measured to control the deformation amount of the first shape memory alloy. Therefore, the resistance value of the second shape memory alloy equivalent to the first shape memory alloy is not affected by the resistance value due to the temperature change and the length of the current-carrying wire for electrically heating the first shape memory alloy. Can be measured, so that the bending portion can be bent with high accuracy.
第１図はこの発明の第１の実施例を示す内視鏡の構成
図、第２図は同じく回路図、第３図はこの発明の第２の
実施例を示す概略図、第４図は同じく回路図、第５図と
第６図はそれぞれこの発明の第３の実施例と第４の実施
例を示す湾曲部の概略図、第７図は形状記憶合金の温度
と抵抗値の関係の説明図、第８図は形状記憶合金と通電
線との温度と抵抗値の関係の説明図である。 ３…挿入部、６…湾曲部、11…第１の形状記憶合金、1
2、13…通電線、14…通電回路、15…第２の形状記憶合
金、16…抵抗値検出部、17…通電制御部。1 is a block diagram of an endoscope showing a first embodiment of the present invention, FIG. 2 is a circuit diagram of the same, FIG. 3 is a schematic view showing a second embodiment of the present invention, and FIG. Similarly, a circuit diagram, FIGS. 5 and 6 are schematic views of the bending portion showing the third and fourth embodiments of the present invention, respectively, and FIG. 7 shows the relationship between the temperature and the resistance value of the shape memory alloy. Explanatory drawing, FIG. 8 is explanatory drawing of the relationship of the temperature of a shape memory alloy and an electric wire, and resistance value. 3 ... insertion part, 6 ... curved part, 11 ... first shape memory alloy, 1
2, 13 ... energizing wire, 14 ... energizing circuit, 15 ... second shape memory alloy, 16 ... resistance value detecting section, 17 ... energizing control section.
Claims (1)
記湾曲部内に設けられその形状変化によって上記湾曲部
を湾曲させる第１の形状記憶合金と、この第１の形状記
憶合金と同じ特性を有する第２の形状記憶合金と、上記
第１および第２の形状記憶合金に同じ大きさの電流を流
す通電回路と、上記第２の形状記憶合金の抵抗値を検出
する抵抗値検出部と、この抵抗値検出部の検出信号によ
って上記通電回路を制御する通電制御部とを具備したこ
とを特徴とする内視鏡。1. An insertion portion having a curved portion at its tip, a first shape memory alloy which is provided in the curved portion and bends the curved portion by a change in its shape, and the first shape memory alloy. A second shape memory alloy having the same characteristics, a current-carrying circuit for supplying a current of the same magnitude to the first and second shape memory alloys, and resistance value detection for detecting the resistance value of the second shape memory alloy. And an energization control unit that controls the energization circuit according to a detection signal from the resistance value detection unit.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62227585A JPH0795998B2 (en) | 1987-09-11 | 1987-09-11 | Endoscope |
| US07/193,294 US4884557A (en) | 1987-05-15 | 1988-05-11 | Endoscope for automatically adjusting an angle with a shape memory alloy |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62227585A JPH0795998B2 (en) | 1987-09-11 | 1987-09-11 | Endoscope |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6470020A JPS6470020A (en) | 1989-03-15 |
| JPH0795998B2 true JPH0795998B2 (en) | 1995-10-18 |
Family
ID=16863221
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62227585A Expired - Lifetime JPH0795998B2 (en) | 1987-05-15 | 1987-09-11 | Endoscope |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0795998B2 (en) |
-
1987
- 1987-09-11 JP JP62227585A patent/JPH0795998B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6470020A (en) | 1989-03-15 |
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