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JPH0777189B2 - Method of removing organic film - Google Patents

Method of removing organic film

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Publication number
JPH0777189B2
JPH0777189B2 JP61244150A JP24415086A JPH0777189B2 JP H0777189 B2 JPH0777189 B2 JP H0777189B2 JP 61244150 A JP61244150 A JP 61244150A JP 24415086 A JP24415086 A JP 24415086A JP H0777189 B2 JPH0777189 B2 JP H0777189B2
Authority
JP
Japan
Prior art keywords
substrate
ozone
treatment
gas
organic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP61244150A
Other languages
Japanese (ja)
Other versions
JPS6399529A (en
Inventor
輝美 松岡
Original Assignee
クロリンエンジニアズ株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by クロリンエンジニアズ株式会社 filed Critical クロリンエンジニアズ株式会社
Priority to JP61244150A priority Critical patent/JPH0777189B2/en
Publication of JPS6399529A publication Critical patent/JPS6399529A/en
Publication of JPH0777189B2 publication Critical patent/JPH0777189B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Drying Of Semiconductors (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は有機物被膜の乾燥状態での除去方法及び装置に
関するもので、特に半導体装置の製造に用いるレジスト
膜の除去方法に関するものである。
The present invention relates to a method and an apparatus for removing an organic film in a dry state, and more particularly to a method for removing a resist film used for manufacturing a semiconductor device.

(従来技術) 半導体装置を製造する場合には、写真処理技術あるい
は、X線照射、電子線照射等で回路パターンが描かれた
レジスト膜を形成したシリコン等の基板にエッチング等
の処理を施した後に該レジスト膜を除去することが必要
である。
(Prior Art) In the case of manufacturing a semiconductor device, a substrate such as silicon having a resist film on which a circuit pattern is drawn is subjected to a treatment such as etching by a photographic processing technique or X-ray irradiation, electron beam irradiation or the like. It is necessary to remove the resist film later.

レジスト膜は酸化力のある液体中へ浸漬する湿式処理に
より除去したり、酸素プラズマ、紫外線、オゾンなどの
乾式処理によって除去している。
The resist film is removed by a wet process of immersing in a liquid having oxidizing power, or a dry process of oxygen plasma, ultraviolet rays, ozone, or the like.

溶液による湿式処理は、廃液処理に手数がかかり、また
液体中に含まれる不純物が半導体装置に悪影響を及ぼす
という問題点から乾式処理への要望が高まっている。
In the wet treatment with a solution, waste liquid treatment is troublesome and impurities contained in the liquid adversely affect the semiconductor device, and thus there is an increasing demand for a dry treatment.

乾式処理の中心であった酸素プラズマによる方法は、プ
ラズマによって半導体装置に損傷が生じることがあり、
オゾンや紫外線による除去方法が注目されている。
The oxygen plasma method, which has been the center of dry processing, may damage the semiconductor device due to the plasma.
Attention has been paid to the removal method using ozone or ultraviolet rays.

(発明が解決しようとする問題点) オゾンが供給されているハウジング内で半導体基板を加
熱しつつ有機物被膜を除去することは、例えば、特開昭
52-20766号として知られている。この様な方法により、
有機物被膜の除去を続けていると除去装置のオゾン噴射
ノズルを初めとする処理室内に各種の有機化合物の付着
が認められる。付着物は、レジスト等の溶剤や低分子有
機物あるいは、分解によって生じる物質などである。こ
の様な付着物は、装置ひいては処理すべき半導体基板の
汚染を引き起こすという問題点があった。
(Problems to be Solved by the Invention) Removing the organic film while heating the semiconductor substrate in the housing to which ozone is supplied is disclosed in, for example, Japanese Patent Application Laid-Open
Known as No. 52-20766. By this method,
When the removal of the organic substance film is continued, various organic compounds are found to be deposited in the processing chamber including the ozone injection nozzle of the removing device. The adhered substance is a solvent such as a resist, a low molecular weight organic substance, or a substance generated by decomposition. There is a problem in that such deposits cause contamination of the device and eventually the semiconductor substrate to be processed.

又、オゾンの発生装置はオゾンの発生を安定化する為に
連続運転をすることが不可欠である。オゾン発生装置の
連続運転に対応し、オゾンの供給を連続化するために、
処理すべき基板をコンベアシステム等により連続的に導
入し、窒素ガスでシールすることを行うことが提案され
ている。ところが、12.5cmないし20cmの直径の円形の基
板上の有機物被膜をむらなく短時間に除去するために
は、処理すべき基板を回転することが有効であるが、コ
ンベアシステムに基板の回転機構を設けることは、極め
て複雑な機構になる。
Further, it is essential that the ozone generator is continuously operated in order to stabilize the ozone generation. Corresponding to the continuous operation of the ozone generator, in order to keep the ozone supply continuous,
It has been proposed that a substrate to be treated is continuously introduced by a conveyor system or the like and sealed with nitrogen gas. However, in order to remove the organic film on the circular substrate having a diameter of 12.5 cm to 20 cm uniformly and in a short time, it is effective to rotate the substrate to be processed, but a conveyor system has a substrate rotating mechanism. Providing is a very complex mechanism.

従って、基板の回転機構を設ける場合には、バッチ式の
処理を採用することが好ましい。バッチ式の装置への基
板の出し入れもシールガス等の手段によりオゾンの噴射
を停止しないことも可能であるが、オゾンが無駄とな
り、極めて不経済である。
Therefore, when a substrate rotating mechanism is provided, it is preferable to employ batch type processing. It is possible to take the substrate in and out of the batch type apparatus, and to stop the injection of ozone by means of a seal gas or the like, but ozone is wasted and it is extremely uneconomical.

(問題点を解決するための手段) そこで、本発明では処理室内壁への有機物の付着を減少
させるために、オゾンによる処理を行う前に、大量の気
体を流しつつ基板を加熱すること或いは外部から気体を
供給することなく気体を吸引除去しつつ加熱をおこなう
ことにより、基板の予熱と基板上の有機物被膜から発生
する有機溶剤や低分子物質を速やかに外部へ排除し、有
機物被膜の除去のための処理室内壁面への有機物の付着
を減少させるとともに、有機物被膜の除去のための処理
室の運転を連続化することにより、オゾンの発生装置の
連続運転を可能としたものである。
(Means for Solving Problems) Therefore, in the present invention, in order to reduce the adhesion of organic substances to the inner wall of the processing chamber, the substrate is heated while flowing a large amount of gas before the treatment with ozone, or the external By heating while sucking and removing the gas without supplying gas from the substrate, preheating of the substrate and the organic solvent and low-molecular substances generated from the organic film on the substrate can be promptly removed to the outside to remove the organic film. In order to reduce the adhesion of organic substances to the wall surface of the processing chamber and to continuously operate the processing chamber for removing the organic film, the ozone generator can be continuously operated.

前記した基板の予熱及び有機溶剤や低分子物質の事前処
理は、有機物被膜の除去のための処理室とは別室におい
て行なっても良いし、処理室を複数個設けて、気体の供
給及び排出管を切り替えることにより処理室を事前処理
室と有機物被膜の除去室とに切り替えることにより、基
板の予熱と有機溶剤や低分子物質の事前処理とオゾンに
よる処理を同時並行して行うこともできる。
The above-described preheating of the substrate and pretreatment of the organic solvent or the low molecular weight substance may be performed in a room different from the processing chamber for removing the organic film, or a plurality of processing chambers may be provided to supply and exhaust gas pipes. By switching the treatment chamber between the pretreatment chamber and the organic substance film removal chamber by switching the above, it is possible to simultaneously perform preheating of the substrate, pretreatment of the organic solvent or low molecular weight substance, and treatment with ozone.

このようにすることにより、有機物被膜を除去すべき基
板の予熱を行いながら、有機物被膜に含まれている有機
溶剤や、低分子化合物をあらかじめ除去することが可能
となり、オゾン噴射ノズルをはじめとする処理室内に、
各種の有機物が付着するのを極めて効果的に防止するこ
とができるので、運転を停止して付着物を除去するとい
う時間的なロスを大幅に減少させることが可能となる。
By doing so, it becomes possible to remove the organic solvent and the low molecular weight compound contained in the organic film in advance while preheating the substrate from which the organic film should be removed, and the ozone injection nozzle and other parts can be removed. In the processing chamber,
Since it is possible to very effectively prevent the adhesion of various organic substances, it is possible to significantly reduce the time loss of stopping the operation and removing the adhered substances.

基板の予熱及び有機物被膜の事前処理を別室で行なった
場合には、有機物被膜の除去のための処理室内壁面への
各種の有機物の付着を極めて小さくすることが可能であ
るが、装置の面積が大きくなったり、基板の移動装置が
必要となり、基板の移動時に予熱した基板の温度の低下
などが生じるという不利な面を有している。一方、有機
物被膜の除去のための処理室を複数個設け、処理室を切
り替えて事前処理を行う方法は、処理室内壁面への有機
物の付着の点では前物に劣るが、装置が簡単で、装置の
大きさも小さくなるという有利な面を有している。
When preheating of the substrate and pretreatment of the organic coating are carried out in separate chambers, it is possible to reduce the adhesion of various organic substances to the inner wall of the processing chamber for removing the organic coating, but the area of the equipment is small. There is a disadvantage in that the size of the substrate becomes large, a device for moving the substrate is required, and the temperature of the substrate that has been preheated decreases when the substrate is moved. On the other hand, a method of providing a plurality of processing chambers for removing the organic film and performing pretreatment by switching the processing chambers is inferior to the former in terms of adhesion of organic substances to the wall surface of the processing chamber, but the device is simple, It has the advantage that the size of the device is also small.

基板の事前処理においては、気体を大量に流す方法と吸
引除去方法のいずれも採用することができるが、気体を
大量に流すと基板の温度が低下し予熱に長時間を要する
ことになるので、気体を大量に流す方法よりも吸引除去
する方法が好ましい。
In the pretreatment of the substrate, either a method of flowing a large amount of gas or a suction removal method can be adopted, but if a large amount of gas is caused to flow, the temperature of the substrate will decrease and preheating will take a long time. A method of suction removal is preferable to a method of flowing a large amount of gas.

また、基板を予熱しながら気体を吸引除去する事前処理
と同時にオゾンによる処理を並行して行うことことによ
り、オゾン発生装置を停止することなく連続した運転が
可能となり、オゾンの発生装置にとっても好ましく生産
性も向上する。
Further, by performing the treatment with ozone in parallel with the pretreatment for sucking and removing the gas while preheating the substrate, continuous operation is possible without stopping the ozone generator, which is also preferable for the ozone generator. Productivity is also improved.

以下添付の図面に基づいて、複数の処理室を設けて処理
室を切り替える方法に関して本発明を説明する。第1図
は本発明の方法を実施するための有機物被膜の処理装置
である。この装置は、2個の処理室1及び2を有してい
る。それぞれの処理室は、同様の構造をしているので一
方についてその構造を説明する。
Hereinafter, the present invention will be described with reference to the accompanying drawings regarding a method of providing a plurality of processing chambers and switching the processing chambers. FIG. 1 shows an apparatus for treating an organic film for carrying out the method of the present invention. This apparatus has two processing chambers 1 and 2. Since the respective processing chambers have the same structure, only one of them will be described.

処理室1内には、処理すべき半導体基板3を載置する基
板支持装置4があり、基板支持装置には回転機構が設け
られている。基板支持装置の下部には加熱装置5が設け
られ、処理装置内には高濃度のオゾン供給管6があり,
該供給管は冷却管7で包囲されている。オゾン供給管
は、半導体基板上へオゾンを噴射する複数のノズル8と
連結されており、冷却管により冷却されている。
In the processing chamber 1, there is a substrate support device 4 on which a semiconductor substrate 3 to be processed is placed, and the substrate support device is provided with a rotation mechanism. A heating device 5 is provided below the substrate supporting device, and a high-concentration ozone supply pipe 6 is provided in the processing device.
The supply pipe is surrounded by a cooling pipe 7. The ozone supply pipe is connected to a plurality of nozzles 8 for injecting ozone onto the semiconductor substrate, and is cooled by a cooling pipe.

処理室には、上部に気体吸引管9と気体排出管10が設け
られている。気体吸引管と気体排出管の位置および個数
は適宜に選ぶことができるが、処理室内での気体の流れ
や処理室内壁および基板の汚染を考慮すると、気体吸引
管は、処理室の上部に、また気体排出管は処理室の下部
に設けるのが好ましい。
A gas suction pipe 9 and a gas discharge pipe 10 are provided in the upper part of the processing chamber. The position and the number of the gas suction pipes and the gas discharge pipes can be appropriately selected, but in consideration of the gas flow in the processing chamber and the contamination of the inner wall of the processing chamber and the substrate, the gas suction pipe is provided at the upper part of the processing chamber. Further, it is preferable that the gas discharge pipe is provided in the lower part of the processing chamber.

処理室、オゾン供給管、ノズル等をはじめとする構成材
料は、ステンレスのようなオゾンに耐蝕性のある材料で
あれば、各種の材料を使用することができ、ノズルの本
数も処理すべき基板の大きさに応じて適宜に設定するこ
とができる。オゾンはオゾン発生装置11において発生さ
せ、切換装置12でいずれかの処理室に供給する。
As the constituent materials such as the processing chamber, the ozone supply pipe and the nozzle, various materials can be used as long as they are materials having corrosion resistance to ozone, such as stainless steel, and the number of nozzles to be processed is the substrate to be processed. Can be appropriately set according to the size of the. Ozone is generated in the ozone generator 11 and supplied to one of the processing chambers by the switching device 12.

気体吸引管には、切換装置13を介して気体吸引装置14が
接続されており、また気体排出管は、切換装置15を介し
てオゾン分解装置16が接続されている。
A gas suction device 14 is connected to the gas suction pipe via a switching device 13, and an ozone decomposing device 16 is connected to the gas discharge pipe via a switching device 15.

有機物被膜を除去する基板がいずれかの処理室に搬入さ
れ、加熱装置によりオゾン処理に必要な温度まで予熱し
ながら、処理室内の気体を吸引除去する。この際に、少
量のオゾンを噴射しても良い。事前処理を20ないし40秒
間行った後に、気体吸引装置、オゾン発生装置およびオ
ゾン分解装置を切換装置により切換えて、予熱および有
機溶剤や低分子物質の事前処理の終了した基板に高濃度
オゾンを噴射して、有機物被膜の除去を行う。
The substrate from which the organic film is removed is carried into one of the processing chambers, and the gas in the processing chamber is sucked and removed while preheating to a temperature required for ozone treatment by a heating device. At this time, a small amount of ozone may be injected. After performing pretreatment for 20 to 40 seconds, switch the gas suction device, ozone generator, and ozone decomposing device by the switching device to inject high-concentration ozone onto the substrate that has been preheated and pretreated with organic solvent or low-molecular substance. Then, the organic film is removed.

一方の処理室内で有機物被膜の除去を行っている間に、
他方の処理装置においては、処理すべき基板の搬入、搬
出、予熱或いは処理室内の気体の吸引除去を行うのが好
ましく、このようにすることによって、オゾン発生装置
の連続運転が可能となるとともに生産性が向上する。ま
た、各工程の切り替えはマイクロコンピュータなどを使
用した任意の制御装置により自動化することが可能であ
ることはいうまでもない。
While removing the organic film in one processing chamber,
In the other processing apparatus, it is preferable to carry in, carry out, preheat, or suck and remove the gas in the processing chamber of the substrate to be processed. By doing so, the ozone generator can be continuously operated and produced. The property is improved. Also, it goes without saying that the switching of each process can be automated by an arbitrary control device using a microcomputer or the like.

(実施例) 以下実施例に基づき本発明を説明する。(Examples) The present invention will be described below based on Examples.

東京応化工業(株)製ポジ型ホトレジストOFPR-800を1.
5μm塗布し現像した基板を、1分間に2.5回転する試料
支持装置上に載置し、電気ヒータにより基板を300℃迄
加熱しつつ処理室内の気体を30秒間吸収除去した。
Tokyo Ohka Kogyo Co., Ltd. positive photoresist OFPR-800 1.
The substrate coated with 5 μm and developed was placed on a sample support device rotating 2.5 times per minute, and the gas in the processing chamber was absorbed and removed for 30 seconds while the substrate was heated to 300 ° C. by an electric heater.

続いて、切換装置を作動させ、吸引除去を停止して、内
径0.7mmのノズルから基板上に約60,000ppmのオゾンを含
む酸素を1分間に6リットルの割合で噴射した。この処
理を1分30秒行い、内部のオゾンを窒素ガスでパージの
後に処理室から基板を取り出した。
Then, the switching device was operated to stop the suction removal, and oxygen containing about 60,000 ppm of ozone was sprayed onto the substrate from a nozzle having an inner diameter of 0.7 mm at a rate of 6 liters per minute. This treatment was performed for 1 minute and 30 seconds, and after purging the internal ozone with nitrogen gas, the substrate was taken out from the treatment chamber.

オゾンによる処理を行っている間に他の処理室では、予
熱と事前処理を行った。
While performing the treatment with ozone, preheating and pretreatment were performed in other treatment chambers.

事前処理では、基板の有機物被膜から蒸気が発生するの
が認められ、吸引装置の前に取り付けたトラップには発
生した蒸気を捕捉することができ、処理室内壁の汚染を
減少することができた。
In the pre-treatment, it was confirmed that vapor was generated from the organic film on the substrate, and the generated vapor could be trapped in the trap installed in front of the suction device, and the contamination of the inner wall of the treatment chamber could be reduced. .

(発明の効果) 有機物被膜を形成した基板から該被膜を除去する方法に
おいて有機物被膜を形成した基板を該被膜の除去温度ま
で予熱しつつ、室内の気体を吸引除去して、該被膜中の
有機溶剤や低分子物質を除去した後に被膜を除去するこ
とにより、有機物被膜の除去のための処理室内壁等への
有機物の付着を減少させることが可能となり、オゾンの
発生装置の運転を連続化することができ、生産性も向上
する。
(Effects of the Invention) In a method of removing a coating film from a substrate having an organic coating film, while preheating the substrate having the organic coating film to the removal temperature of the coating film, the gas in the room is removed by suction to remove the organic material in the coating film. By removing the film after removing the solvent and low molecular weight substances, it is possible to reduce the adhesion of organic substances to the inner wall of the processing chamber for removing the organic substance film, and to keep the ozone generator operating continuously. And productivity is improved.

【図面の簡単な説明】[Brief description of drawings]

第1図は、本発明の有機物の除去方法に用いる装置を示
す図である。。 1・2……処理室 3……基板支持装置 4……半導体基板 5……加熱装置 6……オゾン供給管 7……冷却管 8……ノズル 9……気体吸引管 10……気体搬出管 11……オゾン発生装置 12……切替装置 13……切替装置 14……気体吸引装置 15……切替装置 16……オゾン分解装置
FIG. 1 is a diagram showing an apparatus used in the method for removing organic substances of the present invention. . 1, 2 ... Processing chamber 3 ... Substrate support device 4 ... Semiconductor substrate 5 ... Heating device 6 ... Ozone supply pipe 7 ... Cooling pipe 8 ... Nozzle 9 ... Gas suction pipe 10 ... Gas discharge pipe 11 …… Ozone generator 12 …… Switching device 13 …… Switching device 14 …… Gas suction device 15 …… Switching device 16 …… Ozone decomposing device

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】有機物被膜を形成した基板から有機物被膜
を除去する方法において、有機物被膜を除去する処理室
を複数個設け、有機物被膜を加熱しつつ処理室内の気体
を吸引除去する加熱処理の間に、他の処理室において加
熱処理の終了した基板の有機物被膜面に加熱下でオゾン
を噴射することを特徴とする有機物被膜の除去方法。
1. A method for removing an organic coating from a substrate having an organic coating formed thereon, wherein a plurality of processing chambers for removing the organic coating are provided, and during the heating treatment for removing the gas in the processing chamber while heating the organic coating. In addition, a method for removing an organic film, comprising spraying ozone on the surface of the organic film of a substrate which has been heat-treated in another processing chamber under heating.
【請求項2】オゾンによる処理を、加熱しつつ処理室内
の気体を吸引除去する加熱処理を行った処理室において
引き続き行うことを特徴とする特許請求の範囲第1項記
載の有機物被膜の除去方法。
2. The method for removing an organic film according to claim 1, wherein the treatment with ozone is continuously performed in the treatment chamber in which the heating treatment for sucking and removing the gas in the treatment chamber while heating is performed. .
【請求項3】有機物被膜を加熱しつつ処理室内の気体を
吸引除去する加熱処理は、オゾン処理を行う処理室とは
別の処理室において行うことを特徴とする特許請求の範
囲第1項記載の有機物被膜の除去方法。
3. The heat treatment for sucking and removing the gas in the treatment chamber while heating the organic coating, is performed in a treatment chamber different from the treatment chamber for performing the ozone treatment. Method for removing organic coating of.
【請求項4】有機物被膜を加熱しつつ処理室内の気体を
吸引除去する加熱処理中に少量のオゾンを噴射すること
を特徴とする特許請求の範囲第1〜3項記載の有機物被
膜の除去方法。
4. A method for removing an organic coating according to any one of claims 1 to 3, wherein a small amount of ozone is injected during the heat treatment for sucking and removing the gas in the processing chamber while heating the organic coating. .
JP61244150A 1986-10-16 1986-10-16 Method of removing organic film Expired - Lifetime JPH0777189B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61244150A JPH0777189B2 (en) 1986-10-16 1986-10-16 Method of removing organic film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61244150A JPH0777189B2 (en) 1986-10-16 1986-10-16 Method of removing organic film

Publications (2)

Publication Number Publication Date
JPS6399529A JPS6399529A (en) 1988-04-30
JPH0777189B2 true JPH0777189B2 (en) 1995-08-16

Family

ID=17114503

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61244150A Expired - Lifetime JPH0777189B2 (en) 1986-10-16 1986-10-16 Method of removing organic film

Country Status (1)

Country Link
JP (1) JPH0777189B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2702966B2 (en) * 1988-06-13 1998-01-26 株式会社日立製作所 Surface treatment method
JP3999059B2 (en) 2002-06-26 2007-10-31 東京エレクトロン株式会社 Substrate processing system and substrate processing method

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5050869A (en) * 1973-09-05 1975-05-07
JPS5143079A (en) * 1974-10-11 1976-04-13 Hitachi Ltd TAISHOKUSEIJUSHIMAKUJOKYOHO
JPS5147373A (en) * 1974-10-22 1976-04-22 Nippon Electric Co Fuotorejisutomakuno jokyohoho
US4341592A (en) * 1975-08-04 1982-07-27 Texas Instruments Incorporated Method for removing photoresist layer from substrate by ozone treatment

Also Published As

Publication number Publication date
JPS6399529A (en) 1988-04-30

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