JPH0766979B2 - Method for manufacturing corrugated solar cell - Google Patents
Method for manufacturing corrugated solar cellInfo
- Publication number
- JPH0766979B2 JPH0766979B2 JP2260570A JP26057090A JPH0766979B2 JP H0766979 B2 JPH0766979 B2 JP H0766979B2 JP 2260570 A JP2260570 A JP 2260570A JP 26057090 A JP26057090 A JP 26057090A JP H0766979 B2 JPH0766979 B2 JP H0766979B2
- Authority
- JP
- Japan
- Prior art keywords
- layer
- corrugated
- impurity layer
- impurity
- shaped groove
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/547—Monocrystalline silicon PV cells
Landscapes
- Photovoltaic Devices (AREA)
Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明はコルゲート型基板を用いた太陽電池の製造方法
に関する。The present invention relates to a method for manufacturing a solar cell using a corrugated substrate.
従来、基板表面または裏面に、該基板とは異なる型の不
純物層や異なる濃度の不純物層を形成させてコルゲート
型太陽電池を作製する場合に、まず、ウエハ表面および
裏面にV形溝を作ってコルゲート型基板を形成した後
に、その基板の表面または裏面に、該基板とは異なる型
の不純物層や異なる濃度の不純物層を形成させてコルゲ
ート型太陽電池を作製していた。Conventionally, when a corrugated solar cell is manufactured by forming an impurity layer of a type different from that of the substrate or an impurity layer of a different concentration on the front surface or the back surface of the substrate, first, a V-shaped groove is formed on the front surface and the back surface of the wafer. After forming a corrugated type substrate, an impurity layer of a type different from that of the substrate or an impurity layer of a different concentration is formed on the front surface or the back surface of the substrate to manufacture a corrugated solar cell.
これに関する従来技術として、例えば、アイ・イー・イ
ー・イー、トランザクション オン エレクトロン デ
バイセス、第37巻、第2号、(1990年)第344頁から第3
47頁〔IEEE,TRANSACTIONS ON ELECTRON DEVICES,VOL.3
7,NO.2,(1990)pp.344-347〕に示されているように、
コルゲート基板を形成した後に、該コルゲート基板の裏
面凸部にp+層を形成させて作製するコルゲート型シリ
コン太陽電池の提案がなされている。Prior art relating to this is, for example, IEE, Transaction on Electron Devices, Vol. 37, No. 2, (1990), pages 344 to 3.
Page 47 (IEEE, TRANSACTIONS ON ELECTRON DEVICES, VOL.3
7, NO.2, (1990) pp.344-347],
A corrugated silicon solar cell has been proposed in which a corrugated substrate is formed and then a p + layer is formed on a convex portion on the back surface of the corrugated substrate.
上述したごとく従来技術においては、コルゲート型太陽
電池を作製する場合、コルゲート型基板を形成した後
に、基板とは異なる型の不純物層(例えばp+層)や異
なる濃度の不純物層を形成していたために、コルゲート
型基板の表面または裏面の凸部のみに上記の不純物層を
選択的に形成させる場合には、他の部分に上記不純物層
が形成されないようにマスクを用いなければならないと
いう煩雑な工程を必要とする問題があった。As described above, in the prior art, when manufacturing a corrugated solar cell, after forming a corrugated substrate, an impurity layer of a different type (for example, p + layer) or an impurity layer of a different concentration from the substrate is formed. In the case of selectively forming the impurity layer only on the convex portion on the front surface or the back surface of the corrugated substrate, a complicated process of using a mask so that the impurity layer is not formed on other portions is required. There was a problem I needed.
本発明の目的は、上記従来技術における問題点を解消す
るものであって、コルゲート型太陽電池を作製する場合
に、コルゲート型基板を形成する前の工程で、ウエハ表
面あるいは裏面の所定の部分に必要とする不純物層を形
成させておき、その後にV形溝を形成させることによ
り、極めて簡略化された工程でコルゲート型太陽電池を
製造する方法を提供することにある。An object of the present invention is to solve the problems in the above-mentioned conventional techniques, and in the case of producing a corrugated solar cell, in a step before forming the corrugated substrate, a predetermined portion of the front surface or the back surface of the wafer is formed. It is an object of the present invention to provide a method for manufacturing a corrugated solar cell by a very simplified process by forming a necessary impurity layer and then forming a V-shaped groove.
上記本発明の目的を達成するために、ウエハにV形溝を
形成してコルゲート型基板を作製する前に、ウエハ表面
の設定の部分にあらかじめ必要とする不純物層(例えば
p+層)を形成した後、コルゲート型基板にするための
V形溝を形成させることにより、コルゲート型太陽電池
の製造工程を一段と簡略化することができる。In order to achieve the above-mentioned object of the present invention, before forming a V-shaped groove in a wafer to produce a corrugated substrate, an impurity layer (for example, p + layer) required in advance is formed in a set portion of the wafer surface. After that, by forming a V-shaped groove for forming a corrugated substrate, the manufacturing process of the corrugated solar cell can be further simplified.
本発明のコルゲート型太陽電池の作製工程が簡略化でき
る理由を、図面を引用して説明する。The reason why the manufacturing process of the corrugated solar cell of the present invention can be simplified will be described with reference to the drawings.
従来のコルゲート型太陽電池では、コルゲート型基板表
面または裏面に、該基板とは異なる型の不純物層や異な
る濃度の不純物層を形成させる場合に、例えば第5図に
示すように、ウエハ表面1および裏面4に、コルゲート
型基板5を形成させるためのV形溝を作り、次にコルゲ
ート型基板5の表面または裏面に、該コルゲート型基板
5とは異なる型の不純物層6,7や異なる濃度の不純物層
6,7を形成させていた。これに対し、本発明において
は、例えば第1図に示すように、ウエハ表面1またはウ
エハ裏面4に該コルゲート型基板5とは異なる型の不純
物層6,7や異なる濃度の不純物層6,7を、図中の破線で示
す表面の不純物拡散面2または裏面の不純物拡散面3の
深さにまで形成し、次にウエハ表面1およびウエハ裏面
4にV形溝を形成させることにより、コルゲート型基板
5の表面または裏面の凸部にのみ、他の部分とは異なる
不純物層6,7を形成させることができる。従来は、コル
ゲート型基板5の凸部にのみ他の部分とは異なる不純物
層6,7を形成させる時に、コルゲート型基板5の形成後
に、何らかのマスクを用いて選択的に形成させていた。
しかし、本発明の方法では、この不純物層6,7を形成さ
せる工程において、煩雑なマスクの形成工程を省略する
ことができる。また、上記マスクとコルゲート型基板5
の凸部との位置合わせをする必要がないためにセルファ
ラインで高精度の加工が可能となる。In a conventional corrugated solar cell, when an impurity layer of a type different from that of the substrate or an impurity layer of a different concentration is formed on the front surface or the back surface of the corrugated substrate, for example, as shown in FIG. A V-shaped groove for forming the corrugated substrate 5 is formed on the back surface 4, and then, on the front surface or the back surface of the corrugated substrate 5, impurity layers 6 and 7 of a different type from the corrugated substrate 5 and different concentrations are formed. Impurity layer
It was forming 6,7. On the other hand, in the present invention, as shown in FIG. 1, for example, on the front surface 1 or the back surface 4 of the wafer, the impurity layers 6 and 7 of different types from the corrugated substrate 5 and the impurity layers 6 and 7 of different concentrations are formed. Is formed to the depth of the impurity diffusion surface 2 on the front surface or the impurity diffusion surface 3 on the back surface shown by the broken line in the figure, and then a V-shaped groove is formed on the wafer front surface 1 and the wafer back surface 4 to form a corrugated type. Impurity layers 6 and 7 different from the other portions can be formed only on the convex portions on the front surface or the rear surface of the substrate 5. Conventionally, when the impurity layers 6 and 7 different from the other portions are formed only on the convex portions of the corrugated substrate 5, after the corrugated substrate 5 is formed, it is selectively formed using some mask.
However, in the method of the present invention, a complicated mask forming step can be omitted in the step of forming the impurity layers 6 and 7. In addition, the mask and corrugated substrate 5
Since it is not necessary to align the position with the convex portion of, it is possible to perform highly accurate processing with the self line.
第2図ないし第4図を用いて、本発明の一実施例を説明
する。An embodiment of the present invention will be described with reference to FIGS. 2 to 4.
ウエハとしては、(100)表面を持つp型単結晶Siを用
い、ウエハの表面1に、第2図に示すように、通常の熱
拡散法によるリン拡散を行い、n+層6nを形成した。ウ
エハ裏面4には、通常の熱拡散法によるボロン拡散を行
いp+層7pを形成した。次に、ウエハ表面1およびウエ
ハ裏面4に酸化膜8を形成し、これをエッチングマスク
としてアルカリ溶液で異方性エッチングを行い、V形溝
を形成してコルゲート型基板5を作成した。これによ
り、コルゲート型基板5の凸部にn+層6nおよびp+層
7pを、特別な工程を経ることなく簡便に、かつ正確に形
成させることができた。その後、第3図に示すように、
表面のV形溝斜面に、コルゲート型基板5の表面の凸部
のn+層6nとは異なる不純物濃度を有するn+層9nを、
裏面のV形溝斜面に、コルゲート型基板5の裏面の凸部
のp+層7pとは異なる不純物濃度を有するp+層10p
を、それぞれ形成させた。さらに、第4図に示すよう
に、表面に酸化膜よりなる表面パッシベーション膜11
と、反射防止膜13を形成し、これらの膜に開けられたコ
ンタクトホールを通して、n+層6nとオーミック接触を
持つ表面電極15を形成した。裏面には酸化膜による裏面
パッシベーション膜12と裏面反射鏡14を形成し、これら
の膜に開けられたコンタクトホールを通してp+層7pと
オーミック接触を持つ裏面電極16を形成した。As the wafer, p-type single crystal Si having a (100) surface was used, and phosphorus was diffused on the surface 1 of the wafer by a normal thermal diffusion method as shown in FIG. 2 to form an n + layer 6n. On the back surface 4 of the wafer, boron was diffused by a normal thermal diffusion method to form a p + layer 7p. Next, an oxide film 8 was formed on the front surface 1 of the wafer and the back surface 4 of the wafer, and anisotropic etching was performed with an alkaline solution using the oxide film 8 as an etching mask to form a V-shaped groove, thereby forming a corrugated substrate 5. As a result, the n + layer 6n and the p + layer are formed on the convex portion of the corrugated substrate 5.
7p could be formed easily and accurately without any special process. Then, as shown in FIG.
An n + layer 9n having an impurity concentration different from that of the convex n + layer 6n on the surface of the corrugated substrate 5 is provided on the slope of the V-shaped groove on the surface.
The p + layer 10p having an impurity concentration different from that of the p + layer 7p of the convex portion on the back surface of the corrugated substrate 5 is provided on the slope of the V-shaped groove on the back surface.
Were respectively formed. Further, as shown in FIG. 4, a surface passivation film 11 made of an oxide film is formed on the surface.
Then, the antireflection film 13 was formed, and the surface electrode 15 having ohmic contact with the n + layer 6n was formed through the contact holes formed in these films. A back surface passivation film 12 made of an oxide film and a back surface reflecting mirror 14 were formed on the back surface, and a back surface electrode 16 having ohmic contact with the p + layer 7p was formed through a contact hole formed in these films.
上記の実施例においては、単結晶Siウエハを用いた場合
を例に挙げて説明たが、これはGaAs,InP,Ge等の半導体
材料やその他の化合物半導体材料を用いた単結晶ウエハ
であっても良い。また、等方性エッチングや機械加工、
レーザ加工等によって本発明のコルゲート型基板を形成
する場合には、単結晶のみならず多結晶、非晶質材料を
用いることができる。In the above embodiments, the case of using a single crystal Si wafer has been described as an example, but this is a single crystal wafer using a semiconductor material such as GaAs, InP, or Ge, or another compound semiconductor material. Is also good. In addition, isotropic etching and machining,
When forming the corrugated substrate of the present invention by laser processing or the like, not only a single crystal but also a polycrystalline or amorphous material can be used.
また、第4図で説明した表面および裏面パッシベーショ
ン膜11,12や反射防止膜13についても、その他の材料を
用いて形成したり、または省略したりした場合、あるい
は表面電極15、裏面電極16の形成位置や形状が異なる場
合であっても本発明の効果があることは言うまでもな
い。Further, the front surface and back surface passivation films 11 and 12 and the antireflection film 13 described with reference to FIG. 4 may be formed by using other materials or may be omitted, or the front surface electrode 15 and the back surface electrode 16 may not be formed. Needless to say, the effect of the present invention can be obtained even when the formation position and shape are different.
以上本発明の実施例において、コルゲート型基板の凸部
やV形溝斜面に形成するコルゲート型基板とは異なる型
の不純物層や異なる濃度の不純物層の形成方法として、
不純物を拡散する方法について説明したが、これはコル
ゲート型基板表面あるいはウエハ表面に、コルゲート型
基板とは異なる型の不純物層や異なる濃度の不純物層を
堆積させることによって形成しても本発明と同様の効果
を有するものである。As described above, in the embodiments of the present invention, as a method of forming an impurity layer of a type different from that of the corrugated substrate or an impurity layer having a different concentration, which is formed on the convex portion of the corrugated substrate or the slope of the V-shaped groove,
Although the method of diffusing the impurities has been described, this is the same as the present invention even if it is formed by depositing an impurity layer of a type different from that of the corrugated substrate or an impurity layer of a different concentration on the surface of the corrugated substrate or the wafer. It has the effect of.
コルゲート型基板を用いて薄型太陽電池を形成する場合
に、本発明の方法でコルゲート型基板の凸部に上記基板
とは異なる型の不純物層や異なる濃度の不純物層を形成
させることにより、コルゲート型基板の形成後に、マス
クを用い上記の不純物層を形成させる従来の工程に比
べ、一段と簡便で、しかも高性能のコルゲート型太陽電
池を得ることができる。When a thin solar cell is formed using a corrugated substrate, the corrugated substrate is formed by forming an impurity layer of a different type or a different concentration from the substrate on the convex portion of the corrugated substrate by the method of the present invention. It is possible to obtain a corrugated solar cell that is much simpler and has higher performance than the conventional process of forming the impurity layer using a mask after forming the substrate.
第1図は本発明のコルゲート型太陽電池の構成の一例を
示す模式図、第2図ないし第4図は本発明の実施例にお
いて例示したコルゲート型太陽電池の構成の一例を示す
模式図、第5図は従来のコルゲート型太陽電池の構成の
一例を示す模式図である。 1…ウエハ表面、2…表面の不純物拡散面 3…裏面の不純物拡散面 4…ウエハ裏面、5…コルゲート型基板 6…不純物層、6n…n+層 7…不純物層、7p…p+層 8…酸化膜エッチングマスク 9n…n+層、10p…p+層 11…表面パッシベーション膜 12…裏面パッシベーション膜 13…反射防止膜、14…裏面反射鏡 15…表面電極、16…裏面電極FIG. 1 is a schematic diagram showing an example of the configuration of the corrugated solar cell of the present invention, and FIGS. 2 to 4 are schematic diagrams showing an example of the configuration of the corrugated solar cell exemplified in the examples of the present invention. FIG. 5 is a schematic view showing an example of the configuration of a conventional corrugated solar cell. DESCRIPTION OF SYMBOLS 1 ... Wafer surface, 2 ... Front surface impurity diffusion surface 3 ... Back surface impurity diffusion surface 4 ... Wafer back surface 5 ... Corrugated substrate 6 ... Impurity layer, 6n ... n + layer 7 ... Impurity layer, 7p ... p + layer 8 ... Oxidation Film etching mask 9n ... n + layer, 10p ... p + layer 11 ... Front surface passivation film 12 ... Back surface passivation film 13 ... Antireflection film, 14 ... Back surface reflecting mirror 15 ... Front surface electrode, 16 ... Back surface electrode
Claims (2)
コルゲート型基板の表面および裏面の一方の凸部に上記
コルゲート基板とは異なる型の第1の不純物層を有し、
他方の凸部に上記コルゲート基板とは異なる濃度の第2
の不純物層を有し、上記第1の不純物層の存在する上記
V形溝の斜面に上記第1の不純物層と同一導電型の第3
の不純物層を有し、かつ上記第2の不純物層の存在する
上記V形溝の斜面に上記第2の不純物層と同一導電型の
第4の不純物層を有するコルゲート基板を用いたコルゲ
ート型太陽電池の製造方法において、上記第1の不純物
層の不純物を含む第1の層および上記第2の不純物層の
不純物を含む第2の層を、上記V形溝の形成前に上記ウ
ェハの所定の部分に形成する工程と、上記V形溝の形成
により該V形溝の存在する上記ウェハの表面または裏面
の上記第1の層または第2の層の一部を除去して、上記
コルゲート基板の上記凸部に上記第1および第2の不純
物層を形成する工程と、該第1および第2の不純物層形
成工程後に、上記V形溝の斜面に上記第3の不純物層お
よび第4の不純物層を形成する工程を含むことを特徴と
するコルゲート型太陽電池の製造方法。1. A corrugated substrate having a V-shaped groove on the front and back surfaces of a wafer, and a convex portion on one of the front and back surfaces of the corrugated substrate having a first impurity layer of a different type from the corrugated substrate,
The other convex portion has a second concentration different from that of the corrugated substrate.
Third impurity layer having the same conductivity type as that of the first impurity layer on the slope of the V-shaped groove in which the first impurity layer exists.
Corrugated solar cell using the corrugated substrate having the impurity layer of 4 and a fourth impurity layer of the same conductivity type as the second impurity layer on the slope of the V-shaped groove in which the second impurity layer exists. In the method for manufacturing a battery, a first layer containing impurities of the first impurity layer and a second layer containing impurities of the second impurity layer are formed on a predetermined surface of the wafer before forming the V-shaped groove. And a part of the first layer or the second layer on the front surface or the back surface of the wafer where the V-shaped groove exists is removed by the step of forming the V-shaped groove, After the step of forming the first and second impurity layers on the convex portion and the step of forming the first and second impurity layers, the third impurity layer and the fourth impurity layer are formed on the slope of the V-shaped groove. Corrugated type characterized by including a step of forming a layer Method of manufacturing a solar cell.
び裏面同時に行う特許請求の範囲第1項記載のコルゲー
ト型太陽電池の製造方法。2. The method for manufacturing a corrugated solar cell according to claim 1, wherein the V-shaped groove is formed simultaneously on the front surface and the back surface of the wafer.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2260570A JPH0766979B2 (en) | 1990-10-01 | 1990-10-01 | Method for manufacturing corrugated solar cell |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2260570A JPH0766979B2 (en) | 1990-10-01 | 1990-10-01 | Method for manufacturing corrugated solar cell |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH04139769A JPH04139769A (en) | 1992-05-13 |
JPH0766979B2 true JPH0766979B2 (en) | 1995-07-19 |
Family
ID=17349787
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2260570A Expired - Fee Related JPH0766979B2 (en) | 1990-10-01 | 1990-10-01 | Method for manufacturing corrugated solar cell |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0766979B2 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2786825B2 (en) * | 1995-02-10 | 1998-08-13 | 司電機産業株式会社 | Solar cell equipment |
WO1998043304A1 (en) * | 1997-03-21 | 1998-10-01 | Sanyo Electric Co., Ltd. | Photovoltaic element and method for manufacture thereof |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6231834A (en) * | 1985-08-02 | 1987-02-10 | Hitachi Ltd | Shutter control device |
JPH0539640Y2 (en) * | 1987-07-22 | 1993-10-07 |
-
1990
- 1990-10-01 JP JP2260570A patent/JPH0766979B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JPH04139769A (en) | 1992-05-13 |
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