JPH07231659A - Partial smoother circuit - Google Patents
Partial smoother circuitInfo
- Publication number
- JPH07231659A JPH07231659A JP6018229A JP1822994A JPH07231659A JP H07231659 A JPH07231659 A JP H07231659A JP 6018229 A JP6018229 A JP 6018229A JP 1822994 A JP1822994 A JP 1822994A JP H07231659 A JPH07231659 A JP H07231659A
- Authority
- JP
- Japan
- Prior art keywords
- capacitor
- transistor
- resistor
- zener diode
- diode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Dc-Dc Converters (AREA)
- Protection Of Static Devices (AREA)
- Direct Current Feeding And Distribution (AREA)
- Rectifiers (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、交流の入力電圧を整流
した後、平滑する部分平滑回路に関するもので、部分平
滑回路の部品の短絡事故又は開放事故によって装置が焼
損あるいは絶縁破壊して安全性を損なうことのないよう
にするものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a partial smoothing circuit for smoothing after rectifying an AC input voltage, which is safe because a device of the partial smoothing circuit is short-circuited or opened and the device burns or dielectric breakdown occurs. It is something that does not impair the sex.
【0002】[0002]
【従来の技術】ここで部分平滑回路の部品が短絡又は開
放したとき、回路がどのような状態になるか説明する。
図2は従来より使用されている部分平滑回路を用いたス
イッチング電源で、部分平滑回路の部品が短絡又は開放
すると次の現象が起こる。 コンデンサC1又はダイオードD3のいずれかが短絡
すると、コンデンサC2の印加電圧が正常時の約2倍の
電圧になる。 コンデンサC2又はダイオードD2のいずれかが短絡
すると、コンデンサC1の印加電圧が正常時の約2倍の
電圧になる。 ダイオードD2が開放するとコンデンサC1の印加電
圧が正常時よりも高い電圧になる。その電圧は負荷によ
っても異なるが約1.5倍になる。 ダイオードD3が開放するとコンデンサC2の印加電
圧が正常時よりも高い電圧になる。その電圧は負荷によ
っても異なるが、約1・5倍になる。2. Description of the Related Art Here will be described what state a circuit becomes when a part of a partial smoothing circuit is short-circuited or opened.
FIG. 2 shows a switching power supply using a partial smoothing circuit which has been conventionally used. When the parts of the partial smoothing circuit are short-circuited or opened, the following phenomenon occurs. When either the capacitor C1 or the diode D3 is short-circuited, the voltage applied to the capacitor C2 becomes about twice the voltage at the normal time. When either the capacitor C2 or the diode D2 is short-circuited, the voltage applied to the capacitor C1 becomes about twice as high as the normal voltage. When the diode D2 is opened, the voltage applied to the capacitor C1 becomes higher than that in the normal state. The voltage is about 1.5 times, though it depends on the load. When the diode D3 is opened, the voltage applied to the capacitor C2 becomes higher than that in the normal state. Although the voltage varies depending on the load, it increases about 1.5 times.
【0003】[0003]
【発明が解決しようとする課題】以上のからの状態
に基づき、従来回路の課題について説明する。従来の部
分平滑回路は、回路内の部品が短絡又は開放すると、コ
ンデンサC1又はコンデンサC2に正常時よりも高い電
圧が印加され、コンデンサの定格電圧を超えるためコン
デンサが破壊する。部分平滑回路に使用されるコンデン
サは一般に電解コンデンサであるので、防爆弁が作動
し、電解液が霧状に飛散し、回路の絶縁を破壊したり、
回路部品を焼損させるような重大な危険が生ずる。The problems of the conventional circuit will be described based on the above conditions. In the conventional partial smoothing circuit, when a component in the circuit is short-circuited or opened, a voltage higher than that in the normal state is applied to the capacitor C1 or the capacitor C2, and the capacitor is damaged because the rated voltage of the capacitor is exceeded. Since the capacitors used in the partial smoothing circuit are generally electrolytic capacitors, the explosion-proof valve operates, the electrolytic solution is scattered in a mist, and the insulation of the circuit is destroyed.
There is a serious risk of burning circuit components.
【0004】[0004]
【課題を解決するための手段】本発明は、上述の課題を
解決したものであり、図1のようにコンデンサC1又は
コンデンサC2の印加電圧が定格電圧を超えると、コン
デンサの両端に接続されているツェナーダイオードD5
又はツェナーダイオードD6のツェナー電圧を超えるた
め、それぞれトランジスタQ2又はトランジスタQ3と
Q2がオンとなりツェナーダイオードD4及びスイッチ
ング素子Q1を短絡破壊し、回路に短絡電流が流れ、入
力のヒューズFを熔断し入力の電源供給を遮断し、コン
デンサの破損を防止することにより装置の絶縁破壊、あ
るいは焼損の危険を防止しようとするものである。The present invention has been made to solve the above-mentioned problems. When the applied voltage of the capacitor C1 or C2 exceeds the rated voltage as shown in FIG. Zener diode D5
Alternatively, since the Zener voltage of the Zener diode D6 is exceeded, the transistor Q2 or the transistors Q3 and Q2 are turned on, the Zener diode D4 and the switching element Q1 are short-circuited and broken, a short-circuit current flows in the circuit, and the input fuse F is blown to blow the input. This is intended to prevent the risk of insulation breakdown or burning of the device by cutting off the power supply and preventing the capacitor from being damaged.
【0005】すなわち、第1のコンデンサC1の負極
(−)と第2のコンデンサC2の正極(+)との間に第
1のダイオードD1が充電電流の流れる方向に接続さ
れ、かつ第1のコンデンサC1の負極(−)と第2のコ
ンデンサC2の負極との間に第2のダイオードD2がコ
ンデンサC1の放電電流の流れる方向に接続され、さら
に第1のコンデンサC1の正極(+)と第2のコンデン
サC2の正極(+)との間に第3のダイオードD3がコ
ンデンサC2の放電電流が流れる方向に接続されてなる
部分平滑回路において、上記第1のコンデンサC1の正
極と負極との間に抵抗R3とツェナーダイオードD5の
直列回路が、ツェナーダイオードD5のアノードを負極
側にして接続され、第2のコンデンサC2の正極と負極
との間にツェナーダイオードD6と抵抗R4の直列回路
がツェナーダイオードD6のカソードを正極側にして接
続され、又抵抗R3をPNPトランジスタQ2のエミッ
タ・ベース間に接続され、該トランジスタQ2のエミッ
タを第1のコンデンサC1の正極(+)に接続され、該
トランジスタQ2のコレクタを抵抗R5を介してスイッ
チング素子Q1の起動用ツェナーダイオードのカソード
に接続され、さらに上記抵抗R4をNPNトランジスタ
Q3のベース・エミッタ間に接続され、該トランジスタ
Q3のエミッタを第2のコンデンサC2の負極(−)に
接続され、該トランジスタQ3のコレクタを上記トラン
ジスタQ2のベースに接続したことを特徴とする部分平
滑回路である。That is, the first diode D1 is connected between the negative electrode (-) of the first capacitor C1 and the positive electrode (+) of the second capacitor C2 in the charging current flowing direction, and the first capacitor D1 is connected. The second diode D2 is connected between the negative electrode (−) of C1 and the negative electrode of the second capacitor C2 in the direction in which the discharge current of the capacitor C1 flows, and the positive electrode (+) of the first capacitor C1 and the second In the partial smoothing circuit in which the third diode D3 is connected between the positive electrode (+) of the capacitor C2 and the discharge current of the capacitor C2, between the positive electrode and the negative electrode of the first capacitor C1. A series circuit of the resistor R3 and the Zener diode D5 is connected with the anode of the Zener diode D5 on the negative side, and the Zener die is connected between the positive and negative electrodes of the second capacitor C2. A series circuit of a diode D6 and a resistor R4 is connected with the cathode of the Zener diode D6 on the positive side, and a resistor R3 is connected between the emitter and base of the PNP transistor Q2, and the emitter of the transistor Q2 is connected to the first capacitor C1. Of the transistor Q2 is connected to the cathode of the zener diode for starting the switching element Q1 via the resistor R5, and the resistor R4 is connected between the base and emitter of the NPN transistor Q3. , The emitter of the transistor Q3 is connected to the negative electrode (−) of the second capacitor C2, and the collector of the transistor Q3 is connected to the base of the transistor Q2.
【0006】[0006]
【作用】本発明は、上述のように構成されているので、
回路内の部分の故障によってコンデンサに定格電圧以上
の電圧が印加されるとスイッチング電源素子を短絡さ
せ、入力のヒューズを熔断して、電源入力の給電を止め
るから、コンデンサを破壊から守り、装置の焼損や絶縁
破壊を防止することができる。Since the present invention is constructed as described above,
When a voltage higher than the rated voltage is applied to the capacitor due to a fault in the circuit, the switching power supply element is short-circuited, the input fuse is blown, and the power supply to the power supply input is stopped. Burnout and dielectric breakdown can be prevented.
【0007】[0007]
【実施例】図1は本発明の一実施例の回路図であって、
図2と同じものは、同一符号で示す。同図において、T
1はコンバータトランス、Q1はスイッチング素子(こ
こではFETを示す)、R1及びR2は抵抗器、D4は
ツェナーダイオード、「制御回路」はスイッチング電源
部のQ1のパルス幅を制御する回路、C1及びC2は部
分平滑回路のコンデンサ、D1、D2及びD3は部分平
滑回路のダイオード、D0は交流入力を整流する商用ダ
イオード、Fはヒューズであって、本発明の回路は次の
各部から形成される。D5及びD6はツェナーダイオー
ド、R3、R4及びR5は抵抗器、Q2はPNP型トラ
ンジスタ、Q3はNPN型トランジスタである。FIG. 1 is a circuit diagram of an embodiment of the present invention,
The same parts as those in FIG. 2 are designated by the same reference numerals. In the figure, T
1 is a converter transformer, Q1 is a switching element (here, FET is shown), R1 and R2 are resistors, D4 is a zener diode, and a "control circuit" is a circuit for controlling the pulse width of Q1 of the switching power supply unit, C1 and C2. Is a capacitor of the partial smoothing circuit, D1, D2 and D3 are diodes of the partial smoothing circuit, D0 is a commercial diode for rectifying an AC input, F is a fuse, and the circuit of the present invention is formed by the following parts. D5 and D6 are Zener diodes, R3, R4 and R5 are resistors, Q2 is a PNP type transistor, and Q3 is an NPN type transistor.
【0008】ツェナーダイオードD5は抵抗器R3と直
列に接続され、コンデンサC1の正極(+)と負極
(−)の間に接続され、該トランジスタQ2のエミッタ
・ベース間に抵抗器R3が接続され、該トランジスタQ
2のエミッタをコンデンサC1の正極(+)に接続し、
該トランジスタQ2のコレクタを抵抗器R5を介して、
ツェナーダイオードD4のカソードに接続されている。
ツェナーダイオードD6は抵抗器R4と直列に接続さ
れ、コンデンサC2の正極(+)と負極(−)の間に接
続され、トランジスタQ3のベース・エミッタ間に抵抗
器R4を接続して、コンデンサC2の負極(−)にトラ
ンジスタQ3のエミッタを接続し、該トランジスタQ3
のコレクタをトランジスタQ2のベースに接続された回
路である。The Zener diode D5 is connected in series with the resistor R3, is connected between the positive electrode (+) and the negative electrode (-) of the capacitor C1, and the resistor R3 is connected between the emitter and base of the transistor Q2. The transistor Q
2 emitter is connected to the positive electrode (+) of the capacitor C1,
The collector of the transistor Q2 via a resistor R5,
It is connected to the cathode of the Zener diode D4.
The Zener diode D6 is connected in series with the resistor R4, is connected between the positive electrode (+) and the negative electrode (−) of the capacitor C2, and the resistor R4 is connected between the base and emitter of the transistor Q3 to connect the capacitor C2. The emitter of the transistor Q3 is connected to the negative electrode (-),
Is a circuit in which the collector of is connected to the base of the transistor Q2.
【0009】正常な状態では、部分平滑回路のコンデン
サC1及びコンデンサC2の電圧Vは、およそ次の式で
表される電圧が印加されている。In a normal state, the voltage V of the capacitors C1 and C2 of the partial smoothing circuit is approximately the voltage expressed by the following equation.
【0010】[0010]
【数1】 [Equation 1]
【0011】ここで、コンデンサC1又はダイオードD
3が破壊して短絡した場合、コンデンサC2の電圧は正
常時の電圧の2倍、つまり√2×Vac(r.m.
s.)で表される電圧が印加されることになる。同様
に、コンデンサC2又はダイオードD2が破壊して短絡
するとコンデンサC1の電圧が正常時の2倍の電圧にな
る。このようにコンデンサC1が異常な電圧になると、
ツェナーダイオードD5にツェナー電流が流れ、抵抗器
R3の両端の電圧が上がり、トランジスタQ2のベース
・エミッタ間の電圧が上がり、トランジスタQ2がオン
となり抵抗器R5を通して電流が流れるため、ツェナー
ダイオードD4を短絡破壊させ、スイッチング素子Q1
を短絡破壊させるため、入力に大電流が流れヒューズF
を熔断することにより、コンデンサC1の破壊(弁作
動)を防止し、電解液による絶縁破壊を防止することが
出来る。Here, the capacitor C1 or the diode D
3 is destroyed and short-circuited, the voltage of the capacitor C2 is twice the normal voltage, that is, √2 × Vac (rm.
s. ) Will be applied. Similarly, when the capacitor C2 or the diode D2 is destroyed and short-circuited, the voltage of the capacitor C1 becomes twice the voltage at the normal time. In this way, when the capacitor C1 has an abnormal voltage,
A Zener current flows through the Zener diode D5, the voltage across the resistor R3 rises, the voltage between the base and emitter of the transistor Q2 rises, the transistor Q2 turns on, and the current flows through the resistor R5. Therefore, the Zener diode D4 is short-circuited. Break down the switching element Q1
In order to destroy the short circuit of the fuse, a large current flows to the input and the fuse F
By melting the capacitor C1, it is possible to prevent the capacitor C1 from breaking (valve operation) and prevent the dielectric breakdown due to the electrolytic solution.
【0012】又、コンデンサC2が異常な電圧になる
と、ツェナーダイオードD6にツェナー電流が流れ、抵
抗器R4の両端電圧が上がり、トランジスタQ3のベー
ス・エミッタ間の電圧が上がり、トランジスタQ3がオ
ンするため、抵抗器R3の両端電圧が上がり、トランジ
スタQ2のベース・エミッタ間電圧が上がりトランジス
タQ2がオンし抵抗器R5に電流が流れるため、上述の
ステップによりツェナーダイオードD4、スイッチング
素子Q1を短絡させ、ヒューズFを熔断し、コンデンサ
C2の破壊を防止し、電解液による絶縁破壊を防ぐこと
ができる。When the capacitor C2 becomes an abnormal voltage, a Zener current flows through the Zener diode D6, the voltage across the resistor R4 rises, the voltage between the base and emitter of the transistor Q3 rises, and the transistor Q3 turns on. , The voltage across the resistor R3 rises, the base-emitter voltage of the transistor Q2 rises, the transistor Q2 turns on, and the current flows through the resistor R5. Therefore, the Zener diode D4 and the switching element Q1 are short-circuited by the above steps, and the fuse F can be blown to prevent the capacitor C2 from being destroyed, and the dielectric breakdown due to the electrolytic solution can be prevented.
【0013】[0013]
【発明の効果】本発明の部分平滑回路によって、回路の
焼損及び絶縁破壊を防止し、電源装置の安全性を保つ効
果がある。The partial smoothing circuit of the present invention has the effect of preventing circuit burnout and insulation breakdown and maintaining the safety of the power supply device.
【図1】本発明の一実施例の部分平滑回路図である。FIG. 1 is a partial smoothing circuit diagram of an embodiment of the present invention.
【図2】従来の部分平滑回路図である。FIG. 2 is a conventional partial smoothing circuit diagram.
C1 第1のコンデンサ C2 第2のコンデンサ D1 第1のダイオード D2 第2のダイオード D3 第3のダイオード D0 商用ダイオード D4 起動用のツェナーダイオード D5 ツェナーダイオード D6 ツェナーダイオード F ヒューズ Q1 スイッチング素子(FET又はトランジスタ) Q2 PNP型トランジスタ Q3 NPN型トランジスタ R1 抵抗器 R2 抵抗器 R3 抵抗器 R4 抵抗器 R5 抵抗器 C1 1st capacitor C2 2nd capacitor D1 1st diode D2 2nd diode D3 3rd diode D0 Commercial diode D4 Zener diode for starting D5 Zener diode D6 Zener diode F fuse Q1 Switching element (FET or transistor) Q2 PNP type transistor Q3 NPN type transistor R1 resistor R2 resistor R3 resistor R4 resistor R5 resistor
Claims (1)
2のコンデンサC2の正極(+)との間に第1のダイオ
ードD1が充電電流の流れる方向に接続され、かつ第1
のコンデンサC1の負極(−)と第2のコンデンサC2
の負極(−)との間に第2のダイオードD2がコンデン
サC1の放電電流の流れる方向に接続され、さらに第1
のコンデンサC1の正極(+)と第2のコンデンサC2
の正極(+)との間に第3のダイオードD3がコンデン
サC2の放電電流の流れる方向に接続されてなる部分平
滑回路において、上記第1のコンデンサC1の正極
(+)と負極(−)との間に抵抗R3と直列に接続され
たツェナーダイオードD5が該ツェナーダイオードD5
のアノードをコンデンサC1の負極(−)側にして接続
され、かつ第2のコンデンサC2の正極(+)と負極
(−)との間に抵抗R4と直列に接続されたツェナーダ
イオードD6が、該ツェナーダイオードD6のカソード
をコンデンサC2の正極(+)側にして接続され、かつ
上記抵抗R3をトランジスタQ2のベース・エミッタ間
に接続され、該トランジスタQ2のエミッタを第1のコ
ンデンサC1の正極(+)に接続され、該トランジスタ
Q2のコレクタを抵抗R5を介してスイッチング素子Q
1の起動用のツェナーダイオードD4のカソードに接続
され、かつ上記抵抗R4をトランジスタQ3のベース・
エミッタ間に接続され、該トランジスタQ3のエミッタ
を第2のコンデンサC2の負極(−)に接続され、該ト
ランジスタQ3のコレクタを上記トランジスタQ2のベ
ースに接続したことを特徴とする部分平滑回路。1. A first diode D1 is connected between a negative electrode (−) of a first capacitor C1 and a positive electrode (+) of a second capacitor C2 in a charging current flowing direction, and
Negative electrode (−) of the second capacitor C1 and the second capacitor C2
The second diode D2 is connected between the negative electrode (−) of the capacitor C1 and the negative electrode (−) in the direction in which the discharge current of the capacitor C1 flows,
Positive electrode (+) of the second capacitor C1 and the second capacitor C2
In the partial smoothing circuit in which the third diode D3 is connected between the positive electrode (+) and the positive electrode (+) of the first capacitor C2 in the flowing direction of the discharge current of the capacitor C2, the positive electrode (+) and the negative electrode (−) of the first capacitor C1 are connected. The Zener diode D5 connected in series with the resistor R3 between
Of the zener diode D6 connected in series with the resistor R4 between the positive electrode (+) and the negative electrode (−) of the second capacitor C2 with the anode of the capacitor C1 being the negative electrode (−) side. The cathode of the Zener diode D6 is connected with the positive electrode (+) side of the capacitor C2, and the resistor R3 is connected between the base and the emitter of the transistor Q2. The emitter of the transistor Q2 is the positive electrode (+) of the first capacitor C1. ), The collector of the transistor Q2 is connected to the switching element Q via the resistor R5.
1 is connected to the cathode of the Zener diode D4 for starting, and the resistor R4 is connected to the base of the transistor Q3.
A partial smoothing circuit connected between the emitters, the emitter of the transistor Q3 being connected to the negative electrode (−) of the second capacitor C2, and the collector of the transistor Q3 being connected to the base of the transistor Q2.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP01822994A JP3318425B2 (en) | 1994-02-15 | 1994-02-15 | Partial smoothing circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP01822994A JP3318425B2 (en) | 1994-02-15 | 1994-02-15 | Partial smoothing circuit |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH07231659A true JPH07231659A (en) | 1995-08-29 |
JP3318425B2 JP3318425B2 (en) | 2002-08-26 |
Family
ID=11965841
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP01822994A Expired - Fee Related JP3318425B2 (en) | 1994-02-15 | 1994-02-15 | Partial smoothing circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP3318425B2 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011151988A (en) * | 2010-01-22 | 2011-08-04 | Funai Electric Co Ltd | Power supply circuit |
US8610315B2 (en) | 2007-07-31 | 2013-12-17 | Canon Kabushiki Kaisha | Circuit and heating apparatus that completely cuts power to a supply circuit due to blowout of a fuse on a single supply line |
JP2014176198A (en) * | 2013-03-08 | 2014-09-22 | Canon Inc | Power-supply device and image formation device |
-
1994
- 1994-02-15 JP JP01822994A patent/JP3318425B2/en not_active Expired - Fee Related
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8610315B2 (en) | 2007-07-31 | 2013-12-17 | Canon Kabushiki Kaisha | Circuit and heating apparatus that completely cuts power to a supply circuit due to blowout of a fuse on a single supply line |
JP2011151988A (en) * | 2010-01-22 | 2011-08-04 | Funai Electric Co Ltd | Power supply circuit |
JP2014176198A (en) * | 2013-03-08 | 2014-09-22 | Canon Inc | Power-supply device and image formation device |
Also Published As
Publication number | Publication date |
---|---|
JP3318425B2 (en) | 2002-08-26 |
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