JPH0718824B2 - Deposition point measuring method and apparatus - Google Patents
Deposition point measuring method and apparatusInfo
- Publication number
- JPH0718824B2 JPH0718824B2 JP63276220A JP27622088A JPH0718824B2 JP H0718824 B2 JPH0718824 B2 JP H0718824B2 JP 63276220 A JP63276220 A JP 63276220A JP 27622088 A JP27622088 A JP 27622088A JP H0718824 B2 JPH0718824 B2 JP H0718824B2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- temperature
- light
- point
- amount
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 230000008021 deposition Effects 0.000 title claims description 43
- 238000000034 method Methods 0.000 title claims description 27
- 238000001556 precipitation Methods 0.000 claims description 23
- 230000008034 disappearance Effects 0.000 claims description 19
- 239000013307 optical fiber Substances 0.000 claims description 19
- 238000001816 cooling Methods 0.000 claims description 18
- 238000005259 measurement Methods 0.000 claims description 16
- 238000010438 heat treatment Methods 0.000 claims description 13
- 229910052751 metal Inorganic materials 0.000 claims description 3
- 239000002184 metal Substances 0.000 claims description 3
- 239000013078 crystal Substances 0.000 description 9
- 238000001514 detection method Methods 0.000 description 4
- 239000000295 fuel oil Substances 0.000 description 4
- 229930195733 hydrocarbon Natural products 0.000 description 4
- 150000002430 hydrocarbons Chemical class 0.000 description 4
- 239000003507 refrigerant Substances 0.000 description 4
- 238000010998 test method Methods 0.000 description 4
- 239000004215 Carbon black (E152) Substances 0.000 description 3
- 230000005679 Peltier effect Effects 0.000 description 3
- 238000002347 injection Methods 0.000 description 3
- 239000007924 injection Substances 0.000 description 3
- 238000003756 stirring Methods 0.000 description 3
- 230000002411 adverse Effects 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 238000011088 calibration curve Methods 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000002425 crystallisation Methods 0.000 description 1
- 230000008025 crystallization Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 230000008014 freezing Effects 0.000 description 1
- 238000007710 freezing Methods 0.000 description 1
- 239000003921 oil Substances 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 238000003908 quality control method Methods 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
Landscapes
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Description
【発明の詳細な説明】 [産業上の利用分野] 本発明は、航空燃料油試験方法に関し、特に、航空燃料
油の析出点を自動的に測定する方法とその装置に関す
る。Description: TECHNICAL FIELD The present invention relates to an aviation fuel oil test method, and more particularly to a method and an apparatus for automatically measuring the precipitation point of aviation fuel oil.
[従来の技術] 航空ガソリンおよび航空タービン燃料油の品質管理を図
る目的から、航空燃料油の試験が義務づけられており、
その試験方法の一つに、析出点を測定する方法がある。
この析出点試験方法は、JIS K2276において規格が示さ
れており、この規格によれば、「析出点とは、試料を冷
却した際、生成した炭化水素の結晶が、試料の温度を上
昇させたとき消える温度をいう。」と定義されている。[Prior Art] For the purpose of quality control of aviation gasoline and aviation turbine fuel oil, testing of aviation fuel oil is obligatory.
One of the test methods is a method of measuring the precipitation point.
This precipitation point test method is specified in JIS K2276, and according to this standard, "the precipitation point means that when the sample is cooled, the crystals of the hydrocarbons generated raise the temperature of the sample. It is the temperature at which it disappears. "
また、析出点の測定は、第6図に示す試験器を用い、次
のようにして行なうのが一般的(JIS法)であった。The deposition point was generally measured (JIS method) by using the tester shown in FIG. 6 as follows.
すなわち、試料約25mlを試料容器51に貯留し、冷媒53を
入れたジュワー瓶52の中で、炭化水素の結晶が析出する
までかき混ぜ棒54でかき混ぜながら冷却する。結晶が析
出したならば、ジュワー瓶52から試料容器51を取り出し
て、かき混ぜながら徐々に加熱し、析出した炭化水素の
結晶が完全に消えたときの温度を、温度計25によって析
出温度として検出する。That is, about 25 ml of a sample is stored in a sample container 51, and cooled in a Dewar bottle 52 containing a refrigerant 53 while stirring with a stirring rod 54 until hydrocarbon crystals are deposited. If crystals are deposited, the sample container 51 is taken out of the Dewar bottle 52 and gradually heated while stirring, and the temperature at which the deposited hydrocarbon crystals completely disappear is detected by the thermometer 25 as the deposition temperature. .
そして、この検出を、結晶の析出温度と消失温度の差が
3℃以内になるまで繰り返して行ない、3℃以内となっ
たときの消失温度を析出点としていた。Then, this detection was repeated until the difference between the crystal precipitation temperature and the disappearance temperature was within 3 ° C, and the disappearance temperature when it was within 3 ° C was defined as the precipitation point.
なお、析出点を自動的に測定する試験方法として、上述
した第6図に示す試料容器とほぼ同様の試料容器を用
い、この容器内の試料の状態変化を、試料表面の反射率
の変化として検出し、かつこの変化にもとづいて析出点
を自動的に測定する特開昭62−173140号に示すものがあ
る。As a test method for automatically measuring the deposition point, a sample container similar to the sample container shown in FIG. 6 was used, and a change in the state of the sample in this container was used as a change in the reflectance of the sample surface. There is one disclosed in JP-A-62-173140 which detects and automatically measures the precipitation point based on this change.
[解決すべき問題点] しかしながら、上述した従来の析出点測定方法のうち前
者の方法(JIS法)は、測定に用いる試料が25mlと多量
のため、測定中に試料の攪拌を行なっても温度分布が不
均一になりやすく、高い測定精度を得にくいという問題
があった。また、多量の試料を冷却,加熱しつつ析出温
度と消失温度の差が3℃以内になるまで測定を繰り返す
ため、測定に長時間を要するという問題があった。[Problems to be solved] However, the former method (JIS method) among the above-mentioned conventional deposition point measuring methods uses a large amount of a sample of 25 ml for measurement, and therefore, even if the sample is stirred during measurement, the temperature is There is a problem that the distribution tends to be non-uniform and it is difficult to obtain high measurement accuracy. Further, since a large amount of sample is cooled and heated and the measurement is repeated until the difference between the precipitation temperature and the disappearance temperature is within 3 ° C., there is a problem that the measurement takes a long time.
一方、後者の特開昭61−173140号の方法は、析出点を自
動的に測定できる点で優れたものではあるが、前者の方
法と同様に多量の試料を用いるため、前者方法の有する
問題点をそのまま保有していた。またこの方法は、析出
点の測定を試料表面の反射率の変化にもとづいて行なっ
ているため、試料の表面的な結晶化現象のみをもって試
料が完全に結晶化したと判断することになり、高い測定
精度を得られないという問題があった。On the other hand, the latter method of JP-A-61-173140 is excellent in that the deposition point can be automatically measured, but since a large amount of sample is used as in the former method, the problems of the former method I kept the points as they were. Further, in this method, since the deposition point is measured based on the change in reflectance of the sample surface, it is judged that the sample is completely crystallized only by the surface crystallization phenomenon of the sample, which is high. There was a problem that the measurement accuracy could not be obtained.
本発明は上記の問題点にかんがみてなされたもので、析
出点の測定を、少量の試料を用いて、短時間のうちに自
動的かつ精度よく行なえるようにした析出点の測定方法
およびその装置の提供を目的とする。The present invention has been made in view of the above problems, the measurement of the deposition point, using a small amount of the sample, a method of measuring the deposition point that can be automatically and accurately performed in a short time and its The purpose is to provide a device.
[問題点の解決手段] 上記目的を達成するために、本発明の析出点の測定方法
は、析出点既知の試料を試料室内に少量貯留し、この試
料室内の試料に光源からの光を光ファイバを介して直接
入射するとともに、試料を透過した光を光ファイバを介
して直接受光することによって、析出点における透過光
量を求め判定点として記憶する工程、析出点未知の試料
を上記試料室内に少量貯留して冷却,加熱を行なうとと
もに、この試料に光源からの光を光ファイバを介して直
接入射し、かつ試料を透過した光を光ファイバを介して
直接受光することによって透過光量を求め、さらにこの
透過光量と前記判定点を比較し、透過光量が上記判定点
と同じ量となったときの析出温度,消失温度を繰り返し
検出し、この析出温度と消失温度の差が所定の温度以内
となったときの消失温度を析出点として決定する工程と
からなる方法としてある。[Means for Solving Problems] In order to achieve the above object, a method for measuring a deposition point of the present invention is such that a small amount of a sample having a known deposition point is stored in a sample chamber and light from a light source is emitted to the sample in the sample chamber. Directly incident through the fiber, and by directly receiving the light transmitted through the sample through the optical fiber, the process of obtaining the transmitted light amount at the deposition point and storing it as the judgment point, the sample of unknown deposition point in the sample chamber The amount of transmitted light is obtained by storing a small amount of light, cooling and heating, directly injecting light from a light source into the sample through an optical fiber, and directly receiving light transmitted through the sample through the optical fiber. Further, the amount of transmitted light is compared with the judgment point, the precipitation temperature and the disappearance temperature when the amount of transmitted light becomes the same as the judgment point are repeatedly detected, and the difference between the precipitation temperature and the disappearance temperature is a predetermined temperature. And a step of determining a disappearance temperature when the temperature falls within the range as a precipitation point.
また、本発明の析出点の測定装置は、熱伝導が良好な金
属ブロックからなる測定セルに形成され、少量の試料を
貯留する試料室と、試料室内の試料を、冷却,加熱する
温度調節装置と、試料室内の試料温度を測定する温度セ
ンサと、上記試料室を挟んで対向する位置に発光用と受
光用の光ファイバの端部を配置するとともに、上記発光
用光ファイバの上記測定セルと離れた入力端側に光源を
配置し、かつ上記受光用光ファイバの上記測定セルから
離れた出力端側に受光素子を配置した透過光量検出器
と、析出点既知試料の析出点における透過光量を判定点
として予め記憶するとともに、この判定点と上記検出器
からの出力を比較して析出点未知試料の析出温度と消失
温度を求め、かつ析出温度と消失温度の差が一定温度以
内となったときの消失温度を析出点と決定する制御部と
からなる構成としてある。Further, the deposition point measuring device of the present invention is formed in a measuring cell made of a metal block having good heat conduction, and a sample chamber for storing a small amount of sample and a temperature adjusting device for cooling and heating the sample in the sample chamber. A temperature sensor for measuring the sample temperature in the sample chamber, and the end portions of the optical fibers for light emission and light reception are arranged at positions facing each other across the sample chamber, and the measurement cell for the optical fiber for light emission is provided. A light source is arranged on the side of the input end that is remote, and a transmitted light amount detector in which a light receiving element is arranged on the side of the output end that is remote from the measuring cell of the optical fiber for receiving light, and the amount of transmitted light at the deposition point of the deposition point known sample is It is stored in advance as a judgment point, and the judgment point and the output from the detector are compared to obtain the precipitation temperature and the disappearance temperature of the sample with an unknown precipitation point, and the difference between the precipitation temperature and the disappearance temperature is within a certain temperature. Disappearance of time It is constituted comprising a control unit for determining the freezing point temperature.
[実施例] 以下、本発明の実施例について図面を参照しながら説明
する。[Embodiment] An embodiment of the present invention will be described below with reference to the drawings.
まず、析出点の測定装置の一実施例について、第1図お
よび第2図を参照しながら説明する。First, an embodiment of a deposition point measuring device will be described with reference to FIGS. 1 and 2.
第1図は実施例装置の概略全体図、第2図は第1図装置
の要部拡大断面図を示す。これら図面において、10は測
定セル、20は温度調節装置、30は検出部、40は制御部を
示す。FIG. 1 is a schematic overall view of the apparatus of the embodiment, and FIG. In these drawings, 10 is a measuring cell, 20 is a temperature control device, 30 is a detection unit, and 40 is a control unit.
測定セル10は、少量(例えば、2〜3ml)の試料(炭化
水素油)を貯留する試料室11と、この試料室11と連接す
る注入路12,排出口13,空気抜き口14、および注入路12を
介して試料を試料室11に注入する注入器15を有してい
る。この測定セル10には、熱伝導が良好で腐食に強いア
ルミニウム等を用いることが好ましい。The measurement cell 10 includes a sample chamber 11 that stores a small amount (for example, 2 to 3 ml) of a sample (hydrocarbon oil), an injection path 12, a discharge port 13, an air vent port 14, and an injection path that are connected to the sample chamber 11. It has an injector 15 for injecting the sample into the sample chamber 11 via 12. For this measuring cell 10, it is preferable to use aluminum or the like, which has good thermal conductivity and is resistant to corrosion.
温度調節装置20は、電子温調器21とクールジャケット23
を有している。このうち電子温調器21は、p形半導体と
n形半導体を金属で接合したペルチェ効果素子によって
形成されており、測定セルの両側に配置してある。この
電子温調器21は、ペルチェ効果素子の熱電現象を利用し
たもので、制御器22によってペルチェ効果素子に流れる
電流の方向を変えることにより、熱の発生と吸収を行な
わせ、試料の加熱と冷却を行なう。一方、クールジャケ
ット23も測定セル10の両側に配置されており、このクー
ルジャケット23へは、冷媒タンク24から制御弁25を介し
て冷媒が循環供給される。The temperature controller 20 includes an electronic temperature controller 21 and a cool jacket 23.
have. Of these, the electronic temperature controller 21 is formed by a Peltier effect element in which a p-type semiconductor and an n-type semiconductor are joined with a metal, and is arranged on both sides of the measuring cell. This electronic temperature controller 21 utilizes the thermoelectric phenomenon of the Peltier effect element.By changing the direction of the current flowing through the Peltier effect element by the controller 22, heat is generated and absorbed to heat the sample. Cool down. On the other hand, the cool jacket 23 is also arranged on both sides of the measuring cell 10, and the refrigerant is circulated and supplied from the refrigerant tank 24 to the cool jacket 23 via the control valve 25.
上記温度調節装置20は、クールジャケット23に冷媒を流
すことによって比較的強力な冷却を行ない、電子温調器
21によって、低温下における試料の微妙な温度制御を行
なう。The temperature control device 20 performs relatively strong cooling by flowing a refrigerant through the cool jacket 23, and an electronic temperature controller.
21 makes delicate temperature control of the sample under low temperature.
検出部30は、第2図に示すように、試料室11に貯留され
ている試料の温度を検出する温度センサ31(例えば、白
金測温体)と、同試料の透過光量を検出する透過光量検
出器32とからなっている。このうち、透過光量検出器32
は、試料室11を挟んで対向する位置に光ファイバ33,34
の端部を直接配設し、かつ、一方の光ファイバ33の入力
端に光源35を設け、他方の光ファイバ34の出力端に受光
素子36を設けた構成としてある。As shown in FIG. 2, the detection unit 30 includes a temperature sensor 31 (for example, a platinum thermometer) that detects the temperature of the sample stored in the sample chamber 11, and a transmitted light amount that detects the transmitted light amount of the sample. It is composed of a detector 32. Of these, the transmitted light amount detector 32
Are the optical fibers 33, 34 at positions facing each other across the sample chamber 11.
Is arranged directly, the light source 35 is provided at the input end of one optical fiber 33, and the light receiving element 36 is provided at the output end of the other optical fiber 34.
このように光ファイバ33,34を介し、測定セル10から離
れた位置に光源35と受光素子36を設けると、光源35と受
光素子36は測定セル10による温度の悪影響を受けない。When the light source 35 and the light receiving element 36 are provided at positions apart from the measuring cell 10 via the optical fibers 33 and 34, the light source 35 and the light receiving element 36 are not adversely affected by the temperature of the measuring cell 10.
制御部40は、マイクロコンピュータ等を用いて構成して
あり、温度センサ31と透過光量検出器32からの出力信号
および/または図示せざるメモリに記憶されているデー
タ等にもとづいて、制御器22,制御弁25等の制御を行な
うとともに、各種データの比較,演算,処理等を行な
う。The control unit 40 is configured using a microcomputer or the like, and based on the output signals from the temperature sensor 31 and the transmitted light amount detector 32 and / or the data stored in a memory (not shown), the controller 22 Then, the control valve 25 and the like are controlled, and various data are compared, operated, and processed.
なお、41はプリンタ,ディスプレイ等の出力部であり、
制御部40から出力されるデータを印刷,表示等する。41 is an output unit such as a printer or a display,
The data output from the control unit 40 is printed or displayed.
次に、析出点測定方法の一実施例について、第3図〜第
5図を参照しつつ説明する。Next, an example of a deposition point measuring method will be described with reference to FIGS.
ここで、第3図は実施例方法の手順を示すフローチャー
ト、第4図は試料注入時の概念図、第5図は試料温度と
透過光量の関係を示すタイムチャートである。Here, FIG. 3 is a flow chart showing the procedure of the method of the embodiment, FIG. 4 is a conceptual diagram at the time of sample injection, and FIG. 5 is a time chart showing the relationship between sample temperature and the amount of transmitted light.
JIS法などによって析出点の測定が行なわれ、析出
点既知となっている試料を、測定セル10の試料室11内に
注入して2〜3ml貯留する。The deposition point is measured by the JIS method or the like, and a sample of which deposition point is known is injected into the sample chamber 11 of the measuring cell 10 to store 2-3 ml.
試料室11の一側に配置した光ファイバ33を介して、
光源35から試料中に光を入射し、試料の析出点における
透過光量を試料室11の他側に配置した光ファイバ34を介
して受光素子36で検出する。このとき検出した透過光量
を判定点(電圧信号)として制御部40のメモリに記憶さ
せる。Through the optical fiber 33 arranged on one side of the sample chamber 11,
Light enters the sample from the light source 35, and the amount of transmitted light at the sample deposition point is detected by the light receiving element 36 via the optical fiber 34 arranged on the other side of the sample chamber 11. The amount of transmitted light detected at this time is stored in the memory of the control unit 40 as a determination point (voltage signal).
測定セル10より析出点既知の試料を排出し、析出点
未知の新たな試料を、第4図(a),(b)に示す態様
で試料室11に注入して2〜3ml貯留する。A sample with a known deposition point is discharged from the measurement cell 10, and a new sample with an unknown deposition point is injected into the sample chamber 11 in the manner shown in FIGS. 4 (a) and 4 (b) to store 2-3 ml.
試料室11内の試料を冷却しつつ、光源35より光を試
料中に入射し、このときの透過光量を受光素子36で検出
する。While cooling the sample in the sample chamber 11, light is made incident on the sample from the light source 35, and the amount of transmitted light at this time is detected by the light receiving element 36.
イ.冷却開始時は、試料はまだ透明で、透過光量も多
い。I. At the start of cooling, the sample is still transparent and has a large amount of transmitted light.
ロ.冷却を開始してしばらく経過すると、試料中の結晶
が発生しはじめ、透過光量は徐々に減少する。B. After a while after cooling is started, crystals in the sample start to be generated and the amount of transmitted light gradually decreases.
ハ.冷却が進むと、試料中に結晶が十分析出し、透過光
量は少なくなる。C. As cooling progresses, crystals are sufficiently precipitated in the sample and the amount of transmitted light decreases.
(第5図中のイ,ロ,ハを参照。) 制御部40は、冷却継続中に受光素子36で受光した透
過光量を判定点と比較し、判定点と同じ光量のときの試
料温度を析出温度として記憶する。(See (a), (b), and (c) in FIG. 5). The control unit 40 compares the amount of transmitted light received by the light receiving element 36 during the continuous cooling with the determination point, and determines the sample temperature when the amount of light is the same as the determination point. Store as the precipitation temperature.
試料の冷却により、透過光量が20%になると、制御
部40は制御器22を介し電子温調器21を加熱モードに切り
替え、試料の加熱を開始する。When the amount of transmitted light reaches 20% by cooling the sample, the control unit 40 switches the electronic temperature controller 21 to the heating mode via the controller 22 and starts heating the sample.
ニ.加熱を開始してしばらく経過すると、試料中の結晶
が消えかかり、透過光量は徐々に増加する。D. After starting heating for a while, the crystals in the sample start to disappear, and the amount of transmitted light gradually increases.
ホ.加熱が進むと、試料中の結晶が完全に消失し、透過
光量は多くなる。E. As the heating progresses, the crystals in the sample disappear completely and the amount of transmitted light increases.
(第5図中のニ,ホを参照) 制御部40は、加熱継続中に受光素子36で受光した透
過光量を判定点と比較し、判定点と同じ光量のときの試
料温度を消失温度として記憶する。(Refer to D and E in FIG. 5) The control unit 40 compares the amount of transmitted light received by the light receiving element 36 during the heating continuation with the determination point, and sets the sample temperature when the amount of light is the same as the determination point as the disappearance temperature. Remember.
試料の加熱により、透過光量が90%になると、制御
部40は制御器22を介し電子温調器21を冷却モードに切り
替える。When the amount of transmitted light reaches 90% by heating the sample, the control unit 40 switches the electronic temperature controller 21 to the cooling mode via the controller 22.
上述した試料の冷却と加熱を、析出温度と消失温度
の差(T)が所定温度、例えば3℃以内に入るまで繰り
返す。そして、析出温度と消失温度の差(T)が3℃以
内に入ったときの消失温度を、試験した試料の析出点と
決定する。The above-described cooling and heating of the sample are repeated until the difference (T) between the precipitation temperature and the disappearance temperature falls within a predetermined temperature, for example, within 3 ° C. Then, the disappearance temperature when the difference (T) between the precipitation temperature and the disappearance temperature falls within 3 ° C. is determined as the precipitation point of the tested sample.
試料室11の内部に注入,貯留される試料は2〜3mlとい
った少ない量なので、冷却,加熱による試料の温度調節
は短時間のうちに行なえる。Since the amount of the sample injected and stored in the sample chamber 11 is as small as 2-3 ml, the temperature of the sample can be adjusted by cooling and heating in a short time.
なお、析出点既知の試料(JIS法により測定:析出点−4
9.5℃)を、上述した本発明の実施例装置と方法によ
り、冷却速度を変えて測定したところ、次のような結果
を得られた。Samples with known deposition points (measured by JIS method: deposition point-4
(9.5 ° C.) was measured by the above-described apparatus and method of the embodiment of the present invention while changing the cooling rate, and the following results were obtained.
冷 却 速 度 測定した析出点 (℃/min) (℃) 100 −49.3 200 −49.6 このように、冷却速度を二倍にしたときの測定値の変化
はほんの僅かであった。また、JIS法では、少数点以下
の数値を0.5単位にまとめるので、JIS法によって求めた
結果との間においても、精度上の有意な差は認められず
問題はなかった。Precipitation point measured by cooling rate (℃ / min) (℃) 100 −49.3 200 −49.6 Thus, there was only a slight change in the measured value when the cooling rate was doubled. Also, in the JIS method, since the numbers below the decimal point are summarized in 0.5 units, no significant difference in accuracy was observed between the results obtained by the JIS method and there was no problem.
本発明は上記実施例に限定されるのもではなく、要旨の
範囲内において種々変形が可能である。The present invention is not limited to the above embodiments, but can be variously modified within the scope of the gist.
例えば、析出点の測定方法において、析出点の異なる試
料を予め数種類測定しておき検量線として記憶させても
よい。For example, in the method of measuring the deposition point, several kinds of samples having different deposition points may be measured in advance and stored as a calibration curve.
また、析出点の測定装置においては、温度調節装置20の
冷却,加熱の態様,手段として上記実施例以外の態様,
手段を用いてもよく、さらに光源,受光素子の位置も、
測定セルの温度による悪影響を受けない範囲で試料室に
近づけて配置してもよい。Further, in the measuring device of the deposition point, the mode of cooling and heating of the temperature control device 20, the mode other than the above embodiment,
Means may be used, and the positions of the light source and the light receiving element are
It may be placed close to the sample chamber within a range that is not adversely affected by the temperature of the measurement cell.
[発明の効果] 以上のように、本発明の析出点の測定方法によれば、析
出点の自動測定を、短時間のうちに精度よく行なうこと
ができる。[Effects of the Invention] As described above, according to the method for measuring the deposition point of the present invention, the automatic measurement of the deposition point can be performed accurately in a short time.
また、本発明の析出点の測定装置によれば、析出点の自
動測定を簡便な装置により、短時間のうちに精度よく行
なうことができる。Further, according to the deposition point measuring apparatus of the present invention, automatic measurement of the deposition point can be accurately performed in a short time with a simple apparatus.
第1図は実施例装置の概略全体図、第2図は第1図装置
の要部拡大断面図、第3図は実施例方法の手順を示すフ
ローチャート、第4図は試料注入時の概念図、第5図は
試料温度と透過光量の関係を示すタイムチャート、第6
図は従来の析出点測定器具の全体図を示す。 10:測定セル、11:試料室 20:温度調節装置、21:電子温調器 22:制御器、23:冷却ジャケット 30:検出部、31:温度センサ 32:透過光量検出器、35:光源 36:受光素子、40:制御部FIG. 1 is a schematic overall view of the apparatus of the embodiment, FIG. 2 is an enlarged cross-sectional view of an essential part of the apparatus of FIG. 1, FIG. 3 is a flow chart showing the procedure of the method of the embodiment, and FIG. FIG. 5 is a time chart showing the relationship between the sample temperature and the amount of transmitted light.
The figure shows an overall view of a conventional deposition point measuring instrument. 10: Measurement cell, 11: Sample chamber 20: Temperature controller, 21: Electronic temperature controller 22: Controller, 23: Cooling jacket 30: Detection part, 31: Temperature sensor 32: Transmitted light intensity detector, 35: Light source 36 : Light receiving element, 40: Control unit
フロントページの続き (56)参考文献 特開 昭59−43337(JP,A) 特開 昭58−7550(JP,A) 特開 昭61−173140(JP,A)Continuation of front page (56) Reference JP-A-59-43337 (JP, A) JP-A-58-7550 (JP, A) JP-A-61-173140 (JP, A)
Claims (2)
し、この試料室内の試料に光源からの光を光ファイバを
介して直接入射するとともに、試料を透過した光を光フ
ァイバを介して直接受光することによって、析出点にお
ける透過光量を求め判定点として記憶する工程、 析出点未知の試料を上記試料室内に少量貯留して冷却,
加熱を行なうとともに、この試料に光源からの光を光フ
ァイバを介して直接入射し、かつ試料を透過した光を光
ファイバを介して直接受光することによって透過光量を
求め、さらにこの透過光量と前記判定点を比較し、透過
光量が上記判定点と同じ量となったときの析出温度,消
失温度を繰り返し検出し、この析出温度と消失温度の差
が所定の温度以内となったときの消失温度を析出点とし
て決定する工程、 とからなることを特徴とした析出点の測定方法。1. A small amount of a sample having a known deposition point is stored in a sample chamber, light from a light source is directly incident on the sample in the sample chamber through an optical fiber, and light transmitted through the sample is transmitted through the optical fiber. By directly receiving the light, the amount of transmitted light at the deposition point is calculated and stored as a judgment point. A small amount of a sample with an unknown deposition point is stored in the sample chamber and cooled,
While heating, the light from the light source is directly incident on the sample through the optical fiber, and the light transmitted through the sample is directly received through the optical fiber to obtain the transmitted light amount. The judgment points are compared, the precipitation temperature and disappearance temperature when the amount of transmitted light becomes the same as the above judgment points are repeatedly detected, and the disappearance temperature when the difference between the precipitation temperature and the disappearance temperature is within a predetermined temperature And a step of determining as the deposition point, and a method of measuring the deposition point, which comprises:
セルに形成され、少量の試料を貯留する試料室と、 試料室内の試料を、冷却,加熱する温度調節装置と、 試料室内の試料温度を測定する温度センサと、 上記試料室を挟んで対向する位置に発光用と受光用の光
ファイバの端部を配置するとともに、上記発光用光ファ
イバの上記測定セルと離れた入力端側に光源を配置し、
かつ上記受光用光ファイバの上記測定セルから離れた出
力端側に受光素子を配置した透過光量検出器と、 析出点既知試料の析出点における透過光量を判定点とし
て予め記憶するとともに、この判定点と上記検出器から
の出力を比較して析出点未知試料の析出温度と消失温度
を求め、かつ析出温度と消失温度の差が一定温度以内と
なったときの消失温度を析出点と決定する制御部と からなることを特徴とした析出点の測定装置。2. A sample chamber, which is formed in a measuring cell made of a metal block having good heat conduction and stores a small amount of sample, a temperature control device for cooling and heating the sample in the sample chamber, and a sample temperature in the sample chamber. And a temperature sensor for measuring the temperature of the sample chamber, and the ends of the optical fibers for light emission and light reception are arranged at positions facing each other across the sample chamber, and a light source is provided on the input end side of the optical fiber for light emission, which is separated from the measurement cell. Place
And the transmitted light amount detector in which a light receiving element is arranged on the output end side of the light receiving optical fiber away from the measurement cell, and the transmitted light amount at the deposition point of the sample whose deposition point is known is stored as a determination point in advance, and this determination point Control to determine the deposition temperature and the disappearance temperature of the sample whose deposition point is unknown and to determine the disappearance temperature when the difference between the precipitation temperature and the disappearance temperature is within a certain temperature as the precipitation point. A deposition point measuring device, characterized in that
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63276220A JPH0718824B2 (en) | 1988-11-02 | 1988-11-02 | Deposition point measuring method and apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63276220A JPH0718824B2 (en) | 1988-11-02 | 1988-11-02 | Deposition point measuring method and apparatus |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH02124454A JPH02124454A (en) | 1990-05-11 |
JPH0718824B2 true JPH0718824B2 (en) | 1995-03-06 |
Family
ID=17566363
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JP63276220A Expired - Lifetime JPH0718824B2 (en) | 1988-11-02 | 1988-11-02 | Deposition point measuring method and apparatus |
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JP (1) | JPH0718824B2 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2681428B1 (en) * | 1991-09-17 | 1994-08-12 | Total Raffinage Distribution | DEVICE FOR DETECTING THE APPEARANCE OR THE DISAPPEARANCE OF TWO PHASES IN A LIQUID HYDROCARBON PRODUCT. |
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US4519717A (en) * | 1982-06-07 | 1985-05-28 | Gca Corporation | On-stream cloud point analyzer |
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1988
- 1988-11-02 JP JP63276220A patent/JPH0718824B2/en not_active Expired - Lifetime
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