JPH07176855A - Manufacture of printed circuit board, printed circuit board, and equipment - Google Patents
Manufacture of printed circuit board, printed circuit board, and equipmentInfo
- Publication number
- JPH07176855A JPH07176855A JP103894A JP103894A JPH07176855A JP H07176855 A JPH07176855 A JP H07176855A JP 103894 A JP103894 A JP 103894A JP 103894 A JP103894 A JP 103894A JP H07176855 A JPH07176855 A JP H07176855A
- Authority
- JP
- Japan
- Prior art keywords
- circuit board
- printed circuit
- plating
- heating
- resist
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Non-Metallic Protective Coatings For Printed Circuits (AREA)
- Manufacturing Of Printed Wiring (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、プリント回路板の製造
法、プリント回路板及びこれを用いた機器に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method of manufacturing a printed circuit board, a printed circuit board and a device using the same.
【0002】[0002]
【従来の技術】従来、プリント回路板の製造において、
プリント回路板の永久保護被膜として、ソルダーレジス
トが広く用いられている。このソルダーレジストは半田
付け時のはんだブリッジの防止及び使用時の導体部の腐
食防止と電気絶縁性の保持等を目的として使用されてき
たが、最近、プリント回路板端子部や表面実装方式部品
の接続用パット部等の接続信頼性向上を目的にソルダー
レジスト形成後に金等のめっきを実施することが多く行
なわれソルダーレジストはめっきレジストとしての性能
も要求されている。しかし、めっきの際にレジストと銅
との界面にめっき液がもぐりこみ、レジストがはがれる
ため配線不良となることが問題であった。一方、めっき
レジストと銅等の下地金属との密着性を向上させる手段
として、密着性促進剤の開発が行なわれており、インダ
ゾール又はその誘導体(特開昭53−702号公報)、
フタラゾン又はその誘導体(特開昭55−65202号
公報)、テトラゾール又はその誘導体(特開昭5−12
5726号公報)、ロフィン又はその誘導体(特開昭5
−125727号公報)等の複素環式窒素化合物をレジ
スト組成中に添加することが提案されているが、めっき
に十分な耐性(以下耐めっき性と示す)を持たせるには
不十分であった。2. Description of the Related Art Conventionally, in the manufacture of printed circuit boards,
Solder resists are widely used as permanent protective coatings for printed circuit boards. This solder resist has been used for the purpose of preventing solder bridges during soldering, preventing corrosion of conductors during use, and maintaining electrical insulation, but recently, it has been used for printed circuit board terminals and surface mount type components. For the purpose of improving the connection reliability of the connection pad and the like, plating of gold or the like is often performed after forming the solder resist, and the solder resist is also required to have a performance as a plating resist. However, there is a problem in that the plating solution penetrates into the interface between the resist and copper during plating and the resist peels off, resulting in wiring failure. On the other hand, an adhesion promoter has been developed as a means for improving the adhesion between a plating resist and a base metal such as copper, and indazole or its derivative (JP-A-53-702),
Phthalazone or its derivative (JP-A-55-65202), tetrazole or its derivative (JP-A-5-12)
5726), lophine or a derivative thereof (Japanese Patent Laid-Open No. Sho 5 (1999) -58242).
It has been proposed to add a heterocyclic nitrogen compound such as JP-A-125727) to the resist composition, but it was insufficient to have sufficient resistance to plating (hereinafter referred to as plating resistance). .
【0003】[0003]
【発明が解決しようとする課題】本発明は、上記した従
来の技術の問題点を解消した。耐めっき性の優れたソル
ダーレジストを用いたプリント回路板の製造法、プリン
ト回路板及びこのプリント回路板を用いた機器に関す
る。The present invention has solved the above-mentioned problems of the conventional techniques. The present invention relates to a method for manufacturing a printed circuit board using a solder resist having excellent plating resistance, a printed circuit board, and a device using the printed circuit board.
【0004】[0004]
【課題を解決するための手段】本発明は、回路基板上に
パターン状にソルダーレジストを形成する工程を経た
後、酸素濃度(体積比)を15%以下とした雰囲気下で
加熱する工程を経ることを特徴とするプリント回路板の
製造法に関する。According to the present invention, after a step of forming a solder resist in a pattern on a circuit board, a step of heating in an atmosphere having an oxygen concentration (volume ratio) of 15% or less is performed. And a method for manufacturing a printed circuit board.
【0005】以下、本発明を詳細に説明する。本発明の
プリント回路板の製造は、例えば、次のようにして行な
うことができる。回路基板上にレジストを適用した後、
アートワークと呼ばれるネガ又はポジパターンを通して
活性光線をパターン状に照射し、現像液で現像し端子接
続部の開口したパターン状のソルダーレジストを形成す
る。さらにレジストを十分に硬化させるため活性光線を
照射した後、加熱する。このようにして得られる十分に
硬化されたソルダーレジストが設けられた回路基板にめ
っきを行ない、プリント回路板を得ることができる。The present invention will be described in detail below. The printed circuit board of the present invention can be manufactured, for example, as follows. After applying the resist on the circuit board,
Actinic rays are radiated in a pattern through a negative or positive pattern called artwork, and the pattern is developed with a developing solution to form a pattern-shaped solder resist having an opening at a terminal connection portion. Further, in order to sufficiently cure the resist, it is heated after being irradiated with an actinic ray. The printed circuit board can be obtained by plating the circuit board provided with the sufficiently hardened solder resist thus obtained.
【0006】本発明における上記回路基板としては、公
知のものを用い得るが、例えば、銅張り積層板上にレジ
ストを適用した後、所望の回路パターンに対応したアー
トワークと呼ばれるネガ又はポジパターンを通して活性
光線をパターン状に照射、現像液で現像、加熱乾燥して
回路パターンに対応したレジストパターンとし、次いで
エッチング液でエッチングして不要な銅を取り去り、そ
の後レジストを剥離することにより得ることができる
(サブトラクティブ法と呼ばれる)。As the above-mentioned circuit board in the present invention, a known one can be used. For example, after applying a resist on a copper-clad laminate, a negative or positive pattern called an artwork corresponding to a desired circuit pattern is used. It can be obtained by irradiating actinic rays in a pattern, developing with a developing solution, heating and drying to form a resist pattern corresponding to the circuit pattern, then etching with an etching solution to remove unnecessary copper, and then peeling the resist. (Called the subtractive method).
【0007】回路基板を製造するために用いられるレジ
スト及びプリント回路板を得るために用いられソルダー
レジストとなるレジストについては特に制限はなく、公
知のものを用い得るが、例えば、有機溶剤を使用せず、
ラミネート法によって適用されるドライフィルム型レジ
スト、ディップコート法、ロールコート法、カーテンコ
ート法、スクリーン印刷法等によって適用される液状レ
ジスト、電着塗装法によって適用される電着レジスト、
サートラック法によって適用されるトナー型レジストな
どが挙げられる。液状レジストを用いる場合、レジスト
中に含まれる溶剤を揮発する手法として、乾燥機の中で
加熱乾燥することが一般的であるが、その場合、加熱雰
囲気の酸素濃度(体積比)を15%以下(好ましくは1
0%以下、より好ましくは5%以下)とし、温度を70
〜250℃、好ましくは80〜200℃で1〜120
分、より好ましくは5〜90分の範囲として行なうこと
が望ましい。There is no particular limitation on the resist used for producing the circuit board and the resist used as the solder resist used for obtaining the printed circuit board, and known ones can be used. For example, an organic solvent should be used. No
Dry film type resist applied by laminating method, liquid resist applied by dip coating method, roll coating method, curtain coating method, screen printing method, etc., electrodeposition resist applied by electrodeposition coating method,
Examples thereof include toner type resists applied by the Thurtrack method. When a liquid resist is used, as a method of volatilizing the solvent contained in the resist, it is common to heat and dry in a dryer. In that case, the oxygen concentration (volume ratio) of the heating atmosphere is 15% or less. (Preferably 1
0% or less, more preferably 5% or less) and the temperature is 70%.
-250 ° C, preferably 1 to 120 at 80 to 200 ° C
Minutes, more preferably 5 to 90 minutes.
【0008】パターン状に活性光線を照射する際の、活
性光線としては、例えば、カーボンアーク灯、超高圧水
銀灯、高圧水銀灯、キセノンランプ等の紫外線を有効に
放射するものが用いられる。現像の方法には、剥離方式
等の乾式現像法、ディップ方式、バドル方式、スプレー
方式、高圧スプレー方式等の湿式現像法などがあり、高
圧スプレー方式が好ましい。また、湿式現像で使用され
る現像液としては安全かつ安定であり、操作性が良好な
ものが用いられ、例えば、一般の溶剤現像型のレジスト
では1,1,1−トリクロロエタン等が、アルカリ現像
型のレジストでは炭酸ナトリウムの希薄溶液等が用いら
れる。When the actinic ray is applied in a pattern, as the actinic ray, for example, a carbon arc lamp, an ultrahigh pressure mercury lamp, a high pressure mercury lamp, a xenon lamp or the like that effectively radiates ultraviolet rays is used. The developing method includes a dry developing method such as a peeling method, a wet developing method such as a dipping method, a paddle method, a spray method, and a high pressure spray method, and the high pressure spray method is preferable. In addition, as a developer used in wet development, one that is safe and stable and has good operability is used. For example, in a general solvent-developable resist, 1,1,1-trichloroethane or the like is used in alkali development. A dilute solution of sodium carbonate or the like is used for the type resist.
【0009】回路基板及びプリント回路板の製造には、
用いられる各方法に対応して、1以上の加熱工程が含ま
れるが、パターン状にソルダーレジストを形成する工程
を経た後、このレジストを十分に硬化するため加熱する
工程でその加熱雰囲気の酸素濃度(体積比)を15%以
下(好ましくは10%以下、より好ましくは5%以下)
とすることが耐めっき性、密着性等の点から必要であ
る。加熱温度は70〜250℃の範囲とすることが好ま
しく、80〜200℃の範囲とすることがより好まし
い。加熱時間は、1〜120分間とすることが好まし
く、5〜90分間とすることがより好ましい。加熱の温
度及び時間がこの範囲外であると耐めっき性、密着性等
が劣る傾向がある。In the manufacture of circuit boards and printed circuit boards,
Depending on each method used, one or more heating steps are included, but after the step of forming the solder resist in a pattern, the oxygen concentration of the heating atmosphere is increased in the heating step to sufficiently cure the resist. (Volume ratio) is 15% or less (preferably 10% or less, more preferably 5% or less)
Is required from the viewpoint of plating resistance, adhesion, etc. The heating temperature is preferably 70 to 250 ° C, more preferably 80 to 200 ° C. The heating time is preferably 1 to 120 minutes, more preferably 5 to 90 minutes. If the heating temperature and time are out of this range, the plating resistance, adhesion, etc. tend to be poor.
【0010】回路基板上にパターン状にソルダーレジス
トを形成する工程が、パターン状露光の後に湿式現像を
行なうものである場合、現像後、酸素濃度(体積比)を
15%以下(好ましくは10%以下、より好ましくは5
%以下)とした雰囲気で加熱乾燥することが耐めっき
性、密着性等の点から好ましい。この加熱温度は50〜
200℃の範囲とすることが好ましく、加熱時間は1〜
60分間とすることが好ましい。When the step of forming the solder resist in a pattern on the circuit board is to perform wet development after pattern exposure, the oxygen concentration (volume ratio) after development is 15% or less (preferably 10%). Or less, more preferably 5
% Or less), it is preferable to dry by heating in an atmosphere of plating resistance and adhesion. This heating temperature is 50 ~
The temperature is preferably in the range of 200 ° C., and the heating time is 1 to
It is preferably 60 minutes.
【0011】上記した2つの加熱工程以外の加熱工程で
も加熱雰囲気の酸素濃度(体積比)を15%以下とする
ことが好ましい。Even in heating steps other than the above two heating steps, it is preferable that the oxygen concentration (volume ratio) of the heating atmosphere is 15% or less.
【0012】加熱の手段は、特に制限されないが、通
常、熱風乾燥機、電気炉等の加熱機器を用いることがで
きる。加熱機器内の酸素濃度は自然状態では大気中の酸
素濃度と同等の約21%(体積比)である。この酸素濃
度(体積比)を15%以下とする手段としては、加熱機
器内を窒素、アルゴン等の不活性ガスで置換すること、
真空ポンプを用いることなどが挙げられ、その酸素濃度
は可能なかぎり低い値であることが好ましい。酸素濃度
の測定は、酸素濃度計により容易に行なうことができ、
市販の酸素濃度計としては、デジタル酸素濃度計XPO
−318E(新コスモス電機社製)等が挙げられる。The heating means is not particularly limited, but usually a heating device such as a hot air dryer or an electric furnace can be used. In the natural state, the oxygen concentration in the heating device is about 21% (volume ratio), which is equivalent to the oxygen concentration in the atmosphere. As a means for adjusting the oxygen concentration (volume ratio) to 15% or less, the inside of the heating device is replaced with an inert gas such as nitrogen or argon,
A vacuum pump may be used, and the oxygen concentration thereof is preferably as low as possible. The oxygen concentration can be easily measured with an oxygen concentration meter,
As a commercially available oxygen concentration meter, a digital oxygen concentration meter XPO
-318E (manufactured by New Cosmos Electric Co., Ltd.) and the like.
【0013】めっきを行なう方法には、特に制限はな
く、電解めっき法、無電解めっき法、これらを組み合わ
せた方法等の公知の方法を用い得るが、通常、めっき浴
を用いて行われる。めっき浴の種類については特に限定
はなく種々のめっき浴を用いることができ、例えば、ピ
ロリン銅めっき浴、硫酸銅めっき浴、はんだめっき浴、
ニッケルめっき浴、パラジウムめっき浴、金めっき浴等
が挙げられる。The method of plating is not particularly limited, and known methods such as an electrolytic plating method, an electroless plating method, and a combination of these methods can be used. Usually, a plating bath is used. There is no particular limitation on the type of plating bath, and various plating baths can be used. For example, pyrophosphorus copper plating bath, copper sulfate plating bath, solder plating bath,
A nickel plating bath, a palladium plating bath, a gold plating bath, etc. may be mentioned.
【0014】[0014]
【実施例】以下、本発明を実施例により詳しく説明す
る。なお、以下において酸素濃度はデジタル酸素濃度計
XPO−318E(新コスモス電機社製)を用い、セン
サーを加熱機器としての箱形乾燥機の排気口に設置して
測定した。EXAMPLES The present invention will be described in detail below with reference to examples. In the following, the oxygen concentration was measured by using a digital oxygen concentration meter XPO-318E (manufactured by New Cosmos Electric Co., Ltd.) and installing a sensor at the exhaust port of a box dryer as a heating device.
【0015】実施例1 アルカリ現像型ドライフィルムソルダーレジストSR−
2300G(日立化成工業社製)を、感光層膜厚90μ
mとして、#800のサンドペーパーで研磨し水洗して
空気流で水切りしあらかじめ加熱雰囲気を窒素で置換し
ながら酸素濃度(体積比)を約3%とした箱形乾燥機で
100℃で10分間予備加熱した回路厚65μmの回路
基板(サブトラクティブ法で作製)に、真空ラミネータ
ーHLM−V570(日立コンデンサー社製)を用いて
下記のラミネート条件下でラミネートした。 基板予熱ローラー温度:100℃ ヒートシュー温度:90℃ ラミネート圧力(シリンダー圧):5kgf/cm2 真空チャンバー内の圧力:10mmHg ラミネート速度:0.8m/minExample 1 Alkali development type dry film solder resist SR-
2300G (manufactured by Hitachi Chemical Co., Ltd.) with a photosensitive layer thickness of 90μ
m is sanded with # 800 sandpaper, washed with water, drained with a stream of air, preheated atmosphere is replaced with nitrogen, and the oxygen concentration (volume ratio) is about 3% in a box dryer at 100 ° C. for 10 minutes. A circuit board having a circuit thickness of 65 μm (prepared by the subtractive method) that was preheated was laminated using a vacuum laminator HLM-V570 (manufactured by Hitachi Capacitor) under the following laminating conditions. Substrate preheating roller temperature: 100 ° C Heat shoe temperature: 90 ° C Laminating pressure (cylinder pressure): 5kgf / cm 2 Pressure in vacuum chamber: 10mmHg Laminating speed: 0.8m / min
【0016】次いで、このようにして得られた基板にネ
ガフィルムを使用し、3kW高圧水銀灯(オーク製作所社
製、HMW−201B)で100mJ/cm2のパターン状露
光を行ない、次いで、ドライフィルム上のポリエチレン
テレフタレートフィルムを除去し、30℃で1重量%の
炭酸ナトリウム水溶液を100秒間スプレーすることに
より未露光部を除去し部品の端子接続部を開口した。次
いで、基板の水洗を1分間行なった後、レジスト中に含
まれる水分を除去するため、加熱雰囲気を窒素で置換し
ながら酸素濃度を約3%(体積比)とした箱形乾燥機で
90℃で10分間加熱乾燥を行なった。Then, using a negative film on the substrate thus obtained, a pattern exposure of 100 mJ / cm 2 was performed with a 3 kW high pressure mercury lamp (HMW-201B, manufactured by Oak Manufacturing Co., Ltd.), and then on the dry film. The polyethylene terephthalate film was removed, and an unexposed portion was removed by spraying a 1 wt% sodium carbonate aqueous solution at 30 ° C. for 100 seconds to open the terminal connection portion of the component. Then, after washing the substrate with water for 1 minute, in order to remove the water contained in the resist, the heating atmosphere was replaced with nitrogen and the oxygen concentration was adjusted to about 3% (volume ratio) with a box dryer at 90 ° C. It was dried by heating for 10 minutes.
【0017】次いで、形成したソルダーレジストを充分
に硬化させるため、高圧水銀灯(東芝電材社製)で2J/
cm2の露光を行ない、その後加熱雰囲気を窒素で置換し
ながら酸素濃度(体積比)を約3%とした箱形乾燥機で
150℃、60分間加熱を行なった。Next, in order to sufficiently cure the formed solder resist, a high pressure mercury lamp (manufactured by Toshiba Denshi Co., Ltd.) was used at 2 J /
cm 2 was exposed, and then while heating the atmosphere was replaced with nitrogen, heating was carried out at 150 ° C. for 60 minutes in a box dryer having an oxygen concentration (volume ratio) of about 3%.
【0018】次いで、めっきを行なうため、脱脂、水洗
を1分間行ない、250g/リットルの過硫酸アンモニウム水
溶液中に2分間浸漬した。さらに水洗を1分間行なった
後10重量%の硫酸水溶液に1分間浸漬し、再び水洗を
1分間行なった。次いで、ニッケルめっき浴(硫酸ニッ
ケル350g/リットル、塩化ニッケル45g/リットル、ホウ酸4
5g/リットル、ナイカルpc−3(メルテックス社製商品
名)30ml/リットルおよびニッケルクリームNAW−4
(メルテックス社製商品名)0.1ml/リットル)に入れ、
ニッケルめっきを50℃、3A/dm2で10分間行なっ
た。ニッケルめっき終了後直ちに水洗し、続いて金スト
ライク(アッシドストライク、高純度化学社製商品名)
を40℃、5A/dm2で10秒間行なった。金ストライク
めっき終了後直ちに水洗し、続いて金めっき(テンペレ
ックス401、日本エレクトロプレーティングエンジニ
ャー社製商品名)を30℃、1A/dm2で10分間行なっ
た。金めっき終了後水洗を行ない、室温で放置乾燥しプ
リント回路板を得た。Next, in order to perform plating, degreasing and washing with water were carried out for 1 minute, and the plate was immersed in a 250 g / liter ammonium persulfate aqueous solution for 2 minutes. Further, after washing with water for 1 minute, it was immersed in a 10% by weight sulfuric acid aqueous solution for 1 minute, and washed again with water for 1 minute. Next, nickel plating bath (nickel sulfate 350g / liter, nickel chloride 45g / liter, boric acid 4
5 g / liter, Nical pc-3 (product name manufactured by Meltex) 30 ml / liter and nickel cream NAW-4
(Meltex brand name) 0.1 ml / liter),
Nickel plating was performed at 50 ° C. and 3 A / dm 2 for 10 minutes. Immediately after completion of nickel plating, wash with water and then gold strike (Assid strike, trade name of Kojundo Chemical Co., Ltd.)
Was carried out at 40 ° C. and 5 A / dm 2 for 10 seconds. Immediately after completion of the gold strike plating, the plate was washed with water, and then gold plating (Temperex 401, trade name of Nippon Electroplating Engineering Co., Ltd.) was performed at 30 ° C. and 1 A / dm 2 for 10 minutes. After completion of gold plating, the plate was washed with water and left to dry at room temperature to obtain a printed circuit board.
【0019】実施例2 アルカリ現像性液状ソルダーレジストBSR−4000
Z25(太陽インク社製)を回路厚50μmの回路基板
(サブトラクティブ法で作製)上にバーコーターで塗布
し、加熱雰囲気をアルゴンガスで置換しながら酸素濃度
(体積比)を約2%とした箱形乾燥機で80℃で20分
間乾燥加熱し、厚さ40μm(回路上20μm)の感光
層を形成した。Example 2 Alkali developable liquid solder resist BSR-4000
Z25 (manufactured by Taiyo Ink Co., Ltd.) was applied on a circuit board having a circuit thickness of 50 μm (prepared by the subtractive method) with a bar coater, and the oxygen concentration (volume ratio) was adjusted to about 2% while displacing the heating atmosphere with argon gas. The film was dried and heated at 80 ° C. for 20 minutes in a box dryer to form a photosensitive layer having a thickness of 40 μm (20 μm on the circuit).
【0020】次いで、このようにして得られた基板にネ
ガフィルムを使用し、3kW高圧水銀灯(オーク製作所社
製、HMW−680型)で250mJ/cm2のパターン状露
光を行ない、30℃で1重量%の炭酸ナトリウム水溶液
を60秒間スプレーすることにより未露光部を除去し部
品の端子接続部を開口した。次いで、基板水洗を1分間
行なった後、レジスト中に含まれる水分を除去するた
め、加熱雰囲気をアルゴンガスで置換しながら酸素濃度
(体積比)を約2%とした箱形乾燥機で90℃で10分
間加熱を行なった。Then, using a negative film on the substrate thus obtained, a pattern exposure of 250 mJ / cm 2 was performed with a 3 kW high pressure mercury lamp (HMW-680, manufactured by Oak Manufacturing Co., Ltd.), and the exposure was carried out at 30 ° C. for 1 hour. The unexposed part was removed by spraying a 60% by weight aqueous solution of sodium carbonate for 60 seconds to open the terminal connection part of the component. Next, after washing the substrate with water for 1 minute, in order to remove the water contained in the resist, the heating atmosphere was replaced with argon gas and the oxygen concentration (volume ratio) was adjusted to about 2% with a box dryer at 90 ° C. It was heated for 10 minutes.
【0021】次いで形成したソルダーレジストを十分に
硬化させるため、高圧水銀灯(東芝電材社製)で3J/cm
2の露光を行ない、その後加熱雰囲気をアルゴンガスで
置換しながら酸素濃度(体積比)を約2%とした箱形乾
燥機で150℃、45分間加熱を行なった。Next, in order to sufficiently cure the formed solder resist, a high pressure mercury lamp (manufactured by Toshiba Denshi Co., Ltd.) was used to obtain 3 J / cm
2 exposure was carried out, and thereafter, while heating atmosphere was replaced with argon gas, heating was carried out at 150 ° C. for 45 minutes in a box dryer having an oxygen concentration (volume ratio) of about 2%.
【0022】次いで、めっきを行なうため、脱脂、水洗
を1分間行ない、250g/リットル過硫酸アンモニウム水溶
液中に2分間浸漬した。さらに水洗を1分間行なった後
10重量%硫酸水溶液に1分間浸漬し、再び水洗を1分
間行なった。次いでニッケルめっき浴(硫酸ニッケル3
40g/リットル、塩化ニッケル45g/リットル、ホウ酸45g/リッ
トル、ナイカルpc−3(メルテックス社製商品名)30
ml/リットルおよびニッケルクリームNAW−4(メルテッ
クス社製商品名)0.1ml/リットル)に入れ、ニッケルめ
っきを50℃、3A/dm2で10分間行なった。ニッケル
めっき終了後直ちに水洗し、続いて金ストライク(オー
ロボンド−TN、日本エレクトロプレーティングエンジ
ニャー社製商品名)を40℃、5A/dm2で10秒間行な
った。金ストライク終了後直ちに水洗し、続いて金めっ
き(オートロネクス−CI、日本エレクトロプレーティ
ングエンジニャー社製商品名)を30℃、1A/dm2で1
0分間行なった。金めっき終了後水洗を行ない、室温で
放置乾燥しプリント回路板を得た。Next, in order to perform plating, degreasing and washing with water were carried out for 1 minute, and the plate was immersed in a 250 g / liter ammonium persulfate aqueous solution for 2 minutes. After further washing with water for 1 minute, it was immersed in a 10% by weight sulfuric acid aqueous solution for 1 minute and again washed with water for 1 minute. Then nickel plating bath (nickel sulfate 3
40 g / liter, nickel chloride 45 g / liter, boric acid 45 g / liter, Nical pc-3 (product name manufactured by Meltex) 30
ml / liter and nickel cream NAW-4 (trade name of Meltex, 0.1 ml / liter), and nickel plating was performed at 50 ° C. and 3 A / dm 2 for 10 minutes. Immediately after the completion of nickel plating, the plate was washed with water, and subsequently subjected to gold strike (Aurobond-TN, trade name of Nippon Electroplating Engineering Co., Ltd.) at 40 ° C. and 5 A / dm 2 for 10 seconds. Immediately after the gold strike is finished, the plate is washed with water and then gold plated (Autoronex-CI, trade name of Nippon Electroplating Engineering Co., Ltd.) at 30 ° C. and 1 A / dm 2
It was performed for 0 minutes. After completion of gold plating, the plate was washed with water and left to dry at room temperature to obtain a printed circuit board.
【0023】比較例1 現像後の加熱乾燥及びレジストを十分に硬化させるため
の加熱を大気循環型の箱形乾燥機で行なうこととした以
外は、実施例1と同様に行なった。Comparative Example 1 The same procedure as in Example 1 was carried out except that heating and drying after development and heating for sufficiently curing the resist were carried out in an atmospheric circulation type box dryer.
【0024】比較例2 現像後の加熱乾燥及びレジストを十分に硬化させるため
の加熱を大気循環型の電気炉で行なうこととした以外
は、実施例2と同様に行なった。Comparative Example 2 The procedure of Example 2 was repeated, except that the heating and drying after development and the heating for sufficiently curing the resist were carried out in an air circulation type electric furnace.
【0025】実施例1〜2及び比較例1〜2での金めっ
き後のレジストの耐めっき性を調べるため基板にセロテ
ープをはり、これを垂直方向に引きはがしてレジストの
はがれの有無を調べた(90°ピールテスト)。その
後、上方から光学顕微鏡でめっきのもぐりの有無を観察
した。めっきのもぐりを生じた場合はレジストを介して
その下部にめっきの浸潤が観察される。結果を表1に示
した。In order to examine the plating resistance of the resists after gold plating in Examples 1 and 2 and Comparative Examples 1 and 2, cellophane tape was peeled off from the substrate and peeled in the vertical direction to check whether the resist peeled off. (90 ° peel test). After that, the presence or absence of chipping of the plating was observed with an optical microscope from above. In the case where the plating is removed, infiltration of the plating is observed under the resist through the resist. The results are shown in Table 1.
【0026】[0026]
【表1】 [Table 1]
【0027】実施例1〜2の場合、加熱工程に窒素又は
アルゴンガスを用い、加熱雰囲気を酸素濃度15%以下
としたので、銅表面の酸化を防止でき、耐めっき性が良
好であることが示される。一方、比較例1〜2の場合は
大気中の酸素の影響で銅表面が酸化され、耐めっき性が
低下した。なお実施例1〜2ではめっき後の半田付け性
等の他の特性も良好であった。In the case of Examples 1 and 2, since nitrogen or argon gas was used in the heating step and the heating atmosphere was set to an oxygen concentration of 15% or less, oxidation of the copper surface can be prevented and plating resistance is good. Shown. On the other hand, in Comparative Examples 1 and 2, the copper surface was oxidized due to the effect of oxygen in the atmosphere, and the plating resistance was lowered. In Examples 1 and 2, other properties such as solderability after plating were also good.
【0028】[0028]
【発明の効果】本発明のプリント回路板の製造法によれ
ば、めっきもぐりが原因で起こる不良を低減することが
でき、高密度、高精度及び高信頼性を有するプリント回
路板を得ることができ、このプリント回路板は、テレ
ビ、オーディオ、マイコン、パソコン、ファクシミリ、
通信機、測定器、制御器、交換器、ゲーム機等の各種の
機器に好適に用いることができる。According to the method of manufacturing a printed circuit board of the present invention, it is possible to reduce defects caused by the chipping of plating and obtain a printed circuit board having high density, high accuracy and high reliability. Yes, this printed circuit board can be used for TV, audio, microcomputer, personal computer, facsimile,
It can be suitably used for various devices such as a communication device, a measuring device, a controller, an exchange, and a game machine.
フロントページの続き (72)発明者 大友 聡 茨城県日立市東町四丁目13番1号 日立化 成工業株式会社山崎工場内Front page continuation (72) Inventor Satoshi Otomo 4-13-1, Higashimachi, Hitachi, Ibaraki Prefecture Hitachi Chemical Co., Ltd. Yamazaki Plant
Claims (4)
ストを形成する工程を経た後、酸素濃度(体積比)を1
5%以下とした雰囲気下で加熱する工程を経ることを特
徴とするプリント回路板の製造法。1. An oxygen concentration (volume ratio) is set to 1 after a step of forming a solder resist in a pattern on a circuit board.
A method of manufacturing a printed circuit board, comprising a step of heating in an atmosphere of 5% or less.
る工程が、パターン状露光の後に湿式現像を行ない、そ
の現像後酸素濃度(体積比)を15%以下とした雰囲気
下で加熱乾燥する工程を含むものである請求項1記載の
プリント回路板の製造法。2. The step of forming a solder resist in a pattern includes a step of performing wet development after pattern exposure and heating and drying in an atmosphere having an oxygen concentration (volume ratio) of 15% or less after development. The method for manufacturing a printed circuit board according to claim 1, wherein
製造法により製造されたプリント回路板。3. A printed circuit board manufactured by the method for manufacturing a printed circuit board according to claim 1.
機器。4. A device using the printed circuit board according to claim 3.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP00103894A JP3624427B2 (en) | 1993-11-05 | 1994-01-11 | Printed circuit board manufacturing method, printed circuit board and equipment |
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5-275855 | 1993-11-05 | ||
JP27585593 | 1993-11-05 | ||
JP00103894A JP3624427B2 (en) | 1993-11-05 | 1994-01-11 | Printed circuit board manufacturing method, printed circuit board and equipment |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH07176855A true JPH07176855A (en) | 1995-07-14 |
JP3624427B2 JP3624427B2 (en) | 2005-03-02 |
Family
ID=26334196
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP00103894A Expired - Lifetime JP3624427B2 (en) | 1993-11-05 | 1994-01-11 | Printed circuit board manufacturing method, printed circuit board and equipment |
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JP (1) | JP3624427B2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7124418B2 (en) | 2001-05-24 | 2006-10-17 | Sanyo Electric Co., Ltd. | Method for treating circuit board for use in disk recorder or player apparatus |
US9269620B2 (en) | 2011-12-12 | 2016-02-23 | Samsung Electronics Co., Ltd. | Method of manufacturing bump |
-
1994
- 1994-01-11 JP JP00103894A patent/JP3624427B2/en not_active Expired - Lifetime
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7124418B2 (en) | 2001-05-24 | 2006-10-17 | Sanyo Electric Co., Ltd. | Method for treating circuit board for use in disk recorder or player apparatus |
US9269620B2 (en) | 2011-12-12 | 2016-02-23 | Samsung Electronics Co., Ltd. | Method of manufacturing bump |
Also Published As
Publication number | Publication date |
---|---|
JP3624427B2 (en) | 2005-03-02 |
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