JPH0640004B2 - Ultrasonic measuring device probe holder - Google Patents
Ultrasonic measuring device probe holderInfo
- Publication number
- JPH0640004B2 JPH0640004B2 JP7183690A JP7183690A JPH0640004B2 JP H0640004 B2 JPH0640004 B2 JP H0640004B2 JP 7183690 A JP7183690 A JP 7183690A JP 7183690 A JP7183690 A JP 7183690A JP H0640004 B2 JPH0640004 B2 JP H0640004B2
- Authority
- JP
- Japan
- Prior art keywords
- holder
- probe
- measured
- measuring device
- ultrasonic measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000000523 sample Substances 0.000 title claims description 34
- 230000007797 corrosion Effects 0.000 claims description 2
- 238000005260 corrosion Methods 0.000 claims description 2
- 239000007822 coupling agent Substances 0.000 description 8
- 239000004677 Nylon Substances 0.000 description 5
- 238000005259 measurement Methods 0.000 description 5
- 229920001778 nylon Polymers 0.000 description 5
- PEDCQBHIVMGVHV-UHFFFAOYSA-N Glycerine Chemical compound OCC(O)CO PEDCQBHIVMGVHV-UHFFFAOYSA-N 0.000 description 4
- 230000002093 peripheral effect Effects 0.000 description 4
- BGPVFRJUHWVFKM-UHFFFAOYSA-N N1=C2C=CC=CC2=[N+]([O-])C1(CC1)CCC21N=C1C=CC=CC1=[N+]2[O-] Chemical compound N1=C2C=CC=CC2=[N+]([O-])C1(CC1)CCC21N=C1C=CC=CC1=[N+]2[O-] BGPVFRJUHWVFKM-UHFFFAOYSA-N 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 235000011187 glycerol Nutrition 0.000 description 2
- 239000003795 chemical substances by application Substances 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
Landscapes
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
- Length Measuring Devices Characterised By Use Of Acoustic Means (AREA)
Description
【発明の詳細な説明】 《産業上の利用分野》 本発明は超音波を設備配管等の外表面から当て、その反
射波の状況を見て配管などの肉厚を測定できるようにし
た超音波測定装置の探触子ホルダーに関する。DETAILED DESCRIPTION OF THE INVENTION <Industrial field of application> The present invention applies ultrasonic waves from the outer surface of equipment pipes, etc. The present invention relates to a probe holder of a measuring device.
《従来の技術》 この種の探触子ホルダーは被測定体と探触子との間にグ
リセリンやグリセリンに似た音響的特性を持つ接触媒質
を介在させ、被測定体の厚みや傷あるいは巣を測定して
いた。<Prior art> This type of probe holder has a thickness of the object to be measured, a scratch or a nest, which is caused by interposing glycerin or a couplant having acoustic characteristics similar to glycerin between the object and the probe. Was being measured.
例えば設備配管は金属製で、その内周面の酸化浸蝕によ
って管の肉厚が変化する。For example, the equipment pipe is made of metal, and the wall thickness of the pipe changes due to oxidative corrosion of the inner peripheral surface.
部分的には剥落あるいは膨出するなどの管内壁面変形で
ある。It is a deformation of the inner wall surface of the pipe, such as partial peeling or bulging.
超音波を使用した配管のモニタリングによって、その厚
さを測定する場合、探触子の摩耗を防止するため並びに
探触子と配管の間に空気を介在させないために探触子と
配管表面との間にカップリング剤(接触媒質)を供給し
ている。When measuring the thickness of the pipe by monitoring it using ultrasonic waves, in order to prevent wear of the probe and to prevent air from intervening between the probe and the pipe, A coupling agent (contact medium) is supplied between them.
《発明が解決しようとする課題》 カップリング剤を供給しながら前記探触子ホルダーを配
管の外周面に沿って自走させると、カップリング剤の流
れ落ちや乾燥によって超音波の伝播不良による欠測部分
がでた。あるいは測定装置の探触子支持部分が機械的ま
たは自然的な外乱によって位置を狂わせる場合があり、
この場合にも欠測部分を生じさせる原因になっていた。<Problems to be Solved by the Invention> When the probe holder is self-propelled along the outer peripheral surface of the pipe while supplying the coupling agent, a missing measurement due to poor propagation of ultrasonic waves due to the coupling agent flowing down or drying. The part came out. Alternatively, the probe supporting part of the measuring device may be displaced due to mechanical or natural disturbance,
Even in this case, it was a cause of the missing portion.
本発明は上記事情に鑑みてなされたものであって、その
目的は良好な測定データが得られるように被測定体に対
して探触子が常に一定の位置に保持できるような探触子
ホルダーを提供することにある。The present invention has been made in view of the above circumstances, and an object of the present invention is to provide a probe holder that can always hold the probe at a fixed position with respect to a measured object so that good measurement data can be obtained. To provide.
《課題を解決するための手段》 上記目的を達成するために本発明に係る超音波測定装置
の探触子ホルダーは被測定体の表面に沿って摺動移動さ
せ、該探触子から被測定体へ超音波を入射し、該入射波
の反射波受信までの時間的遅れにて被測定体の厚みと腐
飾状況とを知る超音波測定装置の探触子ホルダーにおい
て、探触子本体を嵌着した下部ホルダーを設け、さらに
該下部ホルダーを上下動自在に収容する上部ホルダーを
設け、これら両ホルダー間に同極性の磁石が上下方向へ
対向配置してあるのである。<< Means for Solving the Problem >> In order to achieve the above object, the probe holder of the ultrasonic measuring device according to the present invention is slidably moved along the surface of the object to be measured, and the object to be measured is measured from the probe. In the probe holder of the ultrasonic measurement device, in which the ultrasonic wave is incident on the body, and the thickness and the corroded state of the measured object are known by the time delay until the reflected wave of the incident wave is received, A fitted lower holder is provided, and an upper holder that accommodates the lower holder so as to be movable up and down is provided, and magnets of the same polarity are arranged vertically opposite each other between these holders.
《作 用》 上部ホルダーおよび下部ホルダーにそれぞれ同極性の磁
石が対向配置してあるために、磁石同士が反発し反発力
によって下部ホルダーは常に下の方へ押圧付勢する力を
受けている。<Operation> Since magnets of the same polarity are placed opposite to each other in the upper holder and the lower holder, the magnets repel each other and the repulsive force causes the lower holder to constantly receive a force that pushes downward.
したがって、測定装置本体側へ連結支持させた上部ホル
ダーが上下方向へ若干動いたとしても探触子本体を嵌着
してある下部ホルダー側は常に被測定体側へ均一に接触
状態を保つことができる。Therefore, even if the upper holder connected and supported to the measuring apparatus main body moves slightly in the vertical direction, the lower holder side to which the probe main body is fitted can always maintain a uniform contact state with the measured object side. .
《実施例》 以下本発明の好適な実施例について図面を参照して詳細
に説明する。<Example> Hereinafter, a preferred example of the present invention will be described in detail with reference to the drawings.
第1図に探触子ホルダー1の断面を示し、この探触子ホ
ルダー1は円形に立設した周壁を有するナイロンシュー
2の中心位置に円柱形の下部ホルダー3を立て、円筒形
の蓋に形成した上部ホルダー4を下部ホルダー3に被せ
てなる。FIG. 1 shows a cross section of the probe holder 1. The probe holder 1 has a cylindrical lower holder 3 placed at the center position of a nylon shoe 2 having a circularly erected peripheral wall, and a cylindrical lid. The upper holder 4 thus formed is placed on the lower holder 3.
そして、上部ホルダー4の中にリング状の永久磁石5を
水平に固定し、この永久磁石5に対向する下の方の位置
には下部ホルダー3に取り付けたリング状の永久磁石6
を設けている。この磁石5および磁石6はぞれぞれ同極
性の磁石として互いに反発するようになっている。Then, the ring-shaped permanent magnet 5 is horizontally fixed in the upper holder 4, and the ring-shaped permanent magnet 6 attached to the lower holder 3 is located at a lower position facing the permanent magnet 5.
Is provided. The magnet 5 and the magnet 6 repel each other as magnets having the same polarity.
探触子7は下部ホルダー3の中に上下動自在に嵌着して
あって、下部ホルダー3の内部には探触子7が上下動で
きるように縦の切欠8を穿ち、上部ホルダー4の上の方
から下部ホルダー3に垂直に貫通させて、下部ホルダー
3内の切欠8において探触子7本体を保持するホルダー
9の上端部に螺入したセンサーワーククリアランス調整
ネジ10を設け、さらに切欠8の内部において切欠8の
天面とホルダー9の上端部との間に反発バネ11を装着
し、ホルダー9を常に下方へ付勢している。このことに
より、調整ネジ10を時計方向または反時計方向へ回す
ことによってホルダー9を切欠8内において上下方向へ
若干微調整することができると共に、被測定体表面とセ
ンサーとの間に入るカップリング剤の量を調整すること
もできるようになる。さらにまた、永久磁石5,6の存
在により下部ホルダー3は常に下の方へ反発付勢されて
いる。ナイロンシュー2の中心部には探触子7に臨む穴
が開けてあって、その穴の回りには陥没するように切り
込んだ凹陥部12を刻設しており、さらに凹陥部12の
側面からナイロンシュー2の外周面に抜ける隘路13を
設け、この隘路13にはカップリング剤の供給口14を
接続している。The probe 7 is vertically movably fitted in the lower holder 3, and a vertical cutout 8 is formed in the lower holder 3 so that the probe 7 can move up and down. A sensor work clearance adjusting screw 10 is provided which vertically penetrates the lower holder 3 from above and is screwed into the upper end of a holder 9 for holding the probe 7 main body in the notch 8 in the lower holder 3. A repulsion spring 11 is mounted between the top surface of the notch 8 and the upper end of the holder 9 inside the holder 8 to constantly urge the holder 9 downward. As a result, the holder 9 can be finely adjusted in the vertical direction in the notch 8 by turning the adjusting screw 10 clockwise or counterclockwise, and the coupling between the surface of the object to be measured and the sensor can be achieved. It also becomes possible to adjust the amount of the agent. Furthermore, due to the presence of the permanent magnets 5 and 6, the lower holder 3 is always urged downward. A hole facing the probe 7 is formed in the center of the nylon shoe 2, and a recess 12 is formed around the hole so as to be recessed. Further, from the side surface of the recess 12 A bottleneck 13 is provided on the outer peripheral surface of the nylon shoe 2, and a coupling agent supply port 14 is connected to the bottleneck 13.
したがってカップリング剤供給口14から隘路13を通
ってカップリング剤は凹陥部12に供給され、探触子7
の測定面側と被測定体との間がカップリング剤で適正に
満たされる。Therefore, the coupling agent is supplied from the coupling agent supply port 14 through the bottleneck 13 to the concave portion 12, and the probe 7
The space between the measurement surface side and the object to be measured is properly filled with the coupling agent.
探触子7に接続するセンサー用ケーブル15は上部ホル
ダー4の側面に切換えた切欠16を通り、さらにナイロ
ンシュー2の側面を横方向へ抜いたU字溝17を通って
探触子7に接続している。The sensor cable 15 connected to the probe 7 is connected to the probe 7 through the cutout 16 which is switched to the side surface of the upper holder 4 and the U-shaped groove 17 which is formed by laterally cutting the side surface of the nylon shoe 2. is doing.
《効 果》 以上詳細に説明したように本発明の探触子ホルダーは探
触子本体を嵌着した下部ホルダーを設け、さらに該下部
ホルダーを上下動自在に収容する上部ホルダーを設け、
これら両ホルダー間に同極性の磁石が上下方向へ対向配
置してあるので、上部ホルダーを被測定体表面に沿って
移動させるようにした場合、上部ホルダーを支持する機
械的な要素に生じる予定外の変化や被測定体側の急激な
レベル変化に下部ホルダー側が敏捷に追従することがで
きる。それ故に信頼性の高い測定が可能になる効果があ
る。<Effect> As described in detail above, the probe holder of the present invention is provided with a lower holder fitted with the probe main body, and further provided with an upper holder for accommodating the lower holder in a vertically movable manner,
Since magnets of the same polarity are placed facing each other in the vertical direction between these two holders, when the upper holder is moved along the surface of the object to be measured, it is not expected that mechanical elements supporting the upper holder will be affected. It is possible for the lower holder side to agilely follow changes in the temperature and the rapid level change on the side of the measured object. Therefore, there is an effect that a highly reliable measurement is possible.
また、磁石によっているので、探触子の均一な接触レベ
ルを維持するための機構が簡潔になり、カップリング剤
によって腐蝕する恐れのある部品が減り、メンテナンス
の面でも有利になるものである。Further, since the magnet is used, the mechanism for maintaining a uniform contact level of the probe is simplified, the number of parts that may be corroded by the coupling agent is reduced, and it is also advantageous in terms of maintenance.
第1図は本発明の実施例に係る探触子ホルダーの縦断面
図である。 1……探触子ホルダー、2……ナイロンシュー 3……下部ホルダー、4……上部ホルダー 5……磁石、6……磁石 7……探触子、8……切欠 9……ホルダー、10……調節ネジ 11……バネ、12……凹陥部 13……隘路、14……供給口 15……ケーブル、16……切欠 17……U字溝FIG. 1 is a vertical sectional view of a probe holder according to an embodiment of the present invention. 1 ... Probe holder, 2 ... Nylon shoe 3 ... Lower holder, 4 ... Upper holder 5 ... Magnet, 6 ... Magnet 7 ... Probe, 8 ... Notch 9 ... Holder, 10 …… Adjusting screw 11 …… Spring, 12 …… Recessed portion 13 …… Bottle, 14 …… Supply port 15 …… Cable, 16 …… Notch 17 …… U-shaped groove
───────────────────────────────────────────────────── フロントページの続き (72)発明者 清水 満 東京都千代田区神田司町2丁目3番地 株 式会社大林組東京本社内 (72)発明者 阪戸 勲 東京都千代田区神田司町2丁目3番地 株 式会社大林組東京本社内 (72)発明者 向井 則光 東京都千代田区神田司町2丁目3番地 株 式会社大林組東京本社内 (72)発明者 後藤 和幸 東京都千代田区神田司町2丁目3番地 株 式会社大林組東京本社内 (56)参考文献 特開 昭59−180317(JP,A) ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Mitsuru Shimizu Inc. 2-3 Kandaji-cho, Chiyoda-ku, Tokyo Obayashi Corporation Tokyo Headquarters (72) Inventor Isao Sakato 2-3 Kandaji-cho, Chiyoda-ku, Tokyo Address Stock company Obayashi Corporation Tokyo head office (72) Inventor Norimitsu Mukai 2-3 Kandajimachi, Chiyoda-ku, Tokyo Address company Obayashi Corporation Tokyo head office (72) Inventor Kazuyuki Goto 2 Kandajimachi, Chiyoda-ku, Tokyo No. 3 Stock company Obayashi Corporation Tokyo head office (56) Reference JP-A-59-180317 (JP, A)
Claims (1)
させ、該探触子から被測定体へ超音波を入射し、該入射
波の反射波受信までの時間的遅れにて被測定体の厚みと
腐蝕状況とを知る超音波測定装置の探触子ホルダーにお
いて、探触子本体を嵌着した下部ホルダーを設け、さら
に該下部ホルダーを上下動自在に収容する上部ホルダー
を設け、これら両ホルダー間に同極性の磁石が上下方向
へ対向配置してあることを特徴とする超音波測定装置の
探触子ホルダー。1. A probe is slidably moved along a surface of an object to be measured, an ultrasonic wave is made incident on the object to be measured from the probe, and there is a time delay until reception of a reflected wave of the incident wave. In the probe holder of the ultrasonic measuring device that knows the thickness and corrosion state of the object to be measured, a lower holder in which the probe main body is fitted is provided, and an upper holder for accommodating the lower holder in a vertically movable manner is provided. A probe holder for an ultrasonic measuring device, wherein magnets of the same polarity are provided to oppose each other in the vertical direction between the two holders.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7183690A JPH0640004B2 (en) | 1990-03-23 | 1990-03-23 | Ultrasonic measuring device probe holder |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7183690A JPH0640004B2 (en) | 1990-03-23 | 1990-03-23 | Ultrasonic measuring device probe holder |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH03273109A JPH03273109A (en) | 1991-12-04 |
JPH0640004B2 true JPH0640004B2 (en) | 1994-05-25 |
Family
ID=13472028
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7183690A Expired - Lifetime JPH0640004B2 (en) | 1990-03-23 | 1990-03-23 | Ultrasonic measuring device probe holder |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0640004B2 (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007199013A (en) * | 2006-01-30 | 2007-08-09 | Disco Abrasive Syst Ltd | Thickness measuring device and grinding device |
KR101108246B1 (en) * | 2008-07-10 | 2012-01-31 | 김진희 | Ultrasonic Testing Equipment |
US8234942B2 (en) * | 2009-12-18 | 2012-08-07 | The Boeing Company | Stringer probe with magnetic spring balance |
JP5427259B2 (en) * | 2012-03-07 | 2014-02-26 | 日本車輌製造株式会社 | Ultrasonic probe positioning structure |
-
1990
- 1990-03-23 JP JP7183690A patent/JPH0640004B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH03273109A (en) | 1991-12-04 |
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