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JPH0637317Y2 - Sample holder for X-ray diffractometer - Google Patents

Sample holder for X-ray diffractometer

Info

Publication number
JPH0637317Y2
JPH0637317Y2 JP1988003838U JP383888U JPH0637317Y2 JP H0637317 Y2 JPH0637317 Y2 JP H0637317Y2 JP 1988003838 U JP1988003838 U JP 1988003838U JP 383888 U JP383888 U JP 383888U JP H0637317 Y2 JPH0637317 Y2 JP H0637317Y2
Authority
JP
Japan
Prior art keywords
sample
ray
cylindrical body
mounting base
surface portion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1988003838U
Other languages
Japanese (ja)
Other versions
JPH01110357U (en
Inventor
勝彦 清水
Original Assignee
理学電機株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 理学電機株式会社 filed Critical 理学電機株式会社
Priority to JP1988003838U priority Critical patent/JPH0637317Y2/en
Publication of JPH01110357U publication Critical patent/JPH01110357U/ja
Application granted granted Critical
Publication of JPH0637317Y2 publication Critical patent/JPH0637317Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Sampling And Sample Adjustment (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Description

【考案の詳細な説明】 本考案はX線の回折によって試料の物性解析を行う装置
における試料保持手段に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a sample holding means in an apparatus for analyzing physical properties of a sample by X-ray diffraction.

このようなX線回折装置は一般に、板状試料の表面を通
る直線を軸として、その試料を例えば一定の低速度で回
転すると共に固定のX線管からその試料面に一定の波長
のX線を投射し、かつ上記試料の周辺をこの試料の2倍
の角速度で回転するX線検出器で回折X線を検出するこ
とによって回折角を検出する構成である。しかしその試
料が大気中で短時間に変質するような場合は、これを不
活性ガス中に密閉するか、あるいは真空中に収容する必
要がある。このため従来は回折装置の試料台を密閉試料
室に交換して観測を行っていたが、その交換に際して精
密な再調整を必要とするから、観測の能率が著しく低下
する欠点があった。従って本考案は煩雑で長時間を要す
る調整操作を必要とすることなく、上述のような試料に
ついても、これを同一の試料台に取り付けて容易迅速に
観測を行うことのできる試料保持器を提供するものであ
る。
Such an X-ray diffractometer generally rotates the sample, for example, at a constant low speed with a straight line passing through the surface of the plate-shaped sample as an axis, and from a fixed X-ray tube to an X-ray of a constant wavelength on the sample surface. Is projected, and the diffraction angle is detected by detecting the diffracted X-rays by an X-ray detector that rotates the periphery of the sample at an angular velocity twice that of the sample. However, if the sample deteriorates in the air in a short time, it must be sealed in an inert gas or housed in a vacuum. For this reason, in the past, the sample stage of the diffractometer was replaced with a closed sample chamber for observation, but precise re-adjustment was required at the time of replacement, so there was a drawback that the efficiency of observation was significantly reduced. Therefore, the present invention provides a sample holder capable of easily and quickly observing a sample as described above by mounting it on the same sample table without requiring a complicated and time-consuming adjustment operation. To do.

本考案の試料保持器は、X線回折装置の試料取付台に円
筒面状の部分を設けると共に環状パッキングを介して上
記部分に気密に嵌合する有底円筒体を使用し、取付台上
の試料をこの円筒体で密閉するようにしたもので、上記
円筒体の周側面には試料面と対向するように帯状のX線
窓を形成し、また必要に応じては上記有底円筒体または
試料取付台に排気口を設ける。従って試料取付台を回折
装置に取り付けて精密な調整を行っておくことにより、
空気中で短時間に変質する試料の場合は前記有底円筒体
でこれを覆って内部を排気するか、あるいは試料と共に
除湿剤等を封入することにより試料の変質が防止され
る。しかも試料取付台は、これを取り替える必要が無い
から、その取付状態の再調整を必要としないもので、こ
のため空気中で変質し易い試料の観測を能率よく短時間
で行うことができる。
The sample holder of the present invention is provided with a cylindrical surface portion on the sample mount of the X-ray diffractometer and uses a bottomed cylindrical body which is hermetically fitted to the above-mentioned part through an annular packing. A sample is sealed with this cylindrical body, and a band-shaped X-ray window is formed on the circumferential side surface of the cylindrical body so as to face the sample surface, and if necessary, the bottomed cylindrical body or Provide an exhaust port on the sample mount. Therefore, by attaching the sample mount to the diffractometer and making precise adjustments,
In the case of a sample that deteriorates in air in a short time, the sample is prevented from being deteriorated by covering it with the bottomed cylindrical body and exhausting the inside, or by enclosing a dehumidifying agent together with the sample. Moreover, since the sample mounting table does not need to be replaced, it is not necessary to readjust the mounting state, and therefore, the sample easily deteriorated in the air can be efficiently observed in a short time.

第1図は本考案実施例の縦断面図、第2図は第1図にお
けるA-A断面図、また第3図はX線回折装置における第
2図と同一部分の断面を示した図である。このようにX
線回折装置の回転台1には試料取付台2の軸3を嵌合し
て固定する孔4を設けてある。その試料取付台2に、上
記回転台1の回転軸線pを中心線とする円筒面状の部分
5を形成すると共に上記軸線pを含む平面6を形成し、
かつ板ばね7を取付けてある。従って取付台2を回転台
1に取り付けて、例えば矩形板状の試料8における観測
面を上記平面6に密着させ、ばね7でこれを押圧して固
定することにより、回転軸線pが試料8の観測面に乗る
ように、この試料の取付を行うことができる。またパッ
キング9によって蓋板10を着脱自在に取り付けると共に
周側面に円弧状のX線窓11を形成してその窓をベリリウ
ムあるいはマイラーのよなX線透過材12で密閉した有底
円筒体13を設けてある。なおこの円筒体13の開口端は、
前記円筒面状の部分5に嵌合するように形成されて、そ
の内面に環状パッキング14が設けられ、更に必要に応じ
ては開閉弁15を有する排気口16も形成されている。すな
わちこのような円筒体13を前記試料取付台2の円筒面状
部分5に嵌合すると、試料8がその中に周収容されて、
かつパッキング9および14により気密状態が保持され
る。また回転台1には第3図のように、これと同軸的に
その2倍の角速度で回転する第2の回転台17を設けてX
線検出器18を取り付けると共に適当な位置にX線管19を
固定し、前記円弧状の窓11を通して試料8の表面にX線
を入射させるようにしてある。すなわち回転台1と17と
を1対2の角速度をもって回転することにより、試料8
に入射して回折を生じたX線が常に検出器18に集束して
検出される。
FIG. 1 is a vertical sectional view of an embodiment of the present invention, FIG. 2 is a sectional view taken along the line AA in FIG. 1, and FIG. 3 is a sectional view of the same portion as FIG. 2 in an X-ray diffraction apparatus. X like this
The rotary table 1 of the line diffraction apparatus is provided with a hole 4 into which the shaft 3 of the sample mounting table 2 is fitted and fixed. On the sample mounting base 2, a cylindrical surface-shaped portion 5 whose center line is the rotation axis p of the rotary base 1 is formed, and a flat surface 6 including the axis p is formed.
And the leaf spring 7 is attached. Therefore, by attaching the mounting base 2 to the rotary base 1 and bringing the observation surface of the rectangular plate-shaped sample 8 into close contact with the plane 6 and pressing it with the spring 7 to fix it, the rotation axis p of the sample 8 becomes This sample can be mounted so that it sits on the observation surface. Further, the lid plate 10 is detachably attached by the packing 9, an arc-shaped X-ray window 11 is formed on the peripheral side surface, and the bottomed cylindrical body 13 is sealed with an X-ray transmission material 12 such as beryllium or mylar. It is provided. The open end of this cylindrical body 13 is
An annular packing 14 is formed so as to be fitted into the cylindrical surface portion 5, and an inner surface thereof is provided with an annular packing 14 and, if necessary, an exhaust port 16 having an opening / closing valve 15 is also formed. That is, when such a cylindrical body 13 is fitted into the cylindrical surface portion 5 of the sample mounting base 2, the sample 8 is accommodated in the inside thereof,
Moreover, the airtight state is maintained by the packings 9 and 14. Further, as shown in FIG. 3, the rotary table 1 is provided with a second rotary table 17 which rotates coaxially with the rotary table 1 at twice the angular velocity, and X
The X-ray tube 19 is fixed at an appropriate position while the X-ray detector 18 is attached, and the X-ray is incident on the surface of the sample 8 through the arc-shaped window 11. That is, by rotating the turntables 1 and 17 at an angular velocity of 1: 2, the sample 8
X-rays which are incident on and diffracted are always focused on the detector 18 and detected.

上記実施例のように本考案の試料保持器は、試料取付台
2に円筒面状の部分5を形成し、パッキング14を介して
この部分に気密に嵌合する有底円筒体13で試料8を密封
するようにしたものである。従って試料を外気から遮断
してその変質を防止することができると共に必要に応じ
ては排気口16を設けることにより、円筒体13の内部を排
気して真空状態に保持し、あるいは円筒体の内部に任意
の気体あるいは吸湿剤等を封入すること等もできる。し
かも変質の恐れが無い試料に対しては円筒体13を必要と
しないだけで、これを同一の取付台2に取り付けて測定
を行い得るから、試料取付台の交換に伴う装置の再調整
を必要としない。従ってX線回折装置を各種の試料に対
して効率よく使用し得ると共に観測能率も向上する。ま
たX線透過材12を取り外して使用するときは、X線の減
衰を生ずることなく、散乱X線による妨害を防止するこ
ともできる等の効果がある。
In the sample holder of the present invention as in the above-described embodiment, the cylindrical surface portion 5 is formed on the sample mounting base 2 and the sample 8 is formed by the bottomed cylindrical body 13 which is hermetically fitted to this portion via the packing 14. Is to be sealed. Therefore, the sample can be shielded from the outside air to prevent its deterioration and, if necessary, the exhaust port 16 is provided to exhaust the inside of the cylindrical body 13 to keep it in a vacuum state, or the inside of the cylindrical body. It is also possible to enclose an arbitrary gas, a hygroscopic agent, or the like in. Moreover, since the cylindrical body 13 is not required for a sample which is not likely to be altered, and it can be mounted on the same mounting base 2 for measurement, it is necessary to readjust the device when the sample mounting base is replaced. Not. Therefore, the X-ray diffractometer can be efficiently used for various samples and the observation efficiency is improved. Further, when the X-ray transmission material 12 is detached and used, there is an effect that the X-rays are not attenuated and the interference by the scattered X-rays can be prevented.

【図面の簡単な説明】[Brief description of drawings]

第1図は本考案実施例の縦断面図、第2図は第1図にお
けるA-A断面図、第3図は第1図第2図の試料保持器を
取り付けたX線回折装置の平面図である。なお図におい
て、pはX線回折装置の回転軸線、8は試料、2は試料
取付台、5は円筒面状部分、14は環状パッキング、13は
有底円筒体、12はX線透過材、11はX線窓、である。
FIG. 1 is a vertical sectional view of an embodiment of the present invention, FIG. 2 is a sectional view taken along the line AA in FIG. 1, and FIG. 3 is a plan view of an X-ray diffractometer equipped with the sample holder shown in FIGS. is there. In the figure, p is the rotation axis of the X-ray diffractometer, 8 is a sample, 2 is a sample mount, 5 is a cylindrical surface portion, 14 is an annular packing, 13 is a bottomed cylindrical body, 12 is an X-ray transparent material, 11 is an X-ray window.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 【請求項1】X線回折装置の試料取付台に円筒面状の部
分を形成し、この円筒面状の部分の中心線と試料取付台
の回転軸線とが、試料取付台に取り付けた板状試料の分
析面に乗るようにし、有底円筒体の開口端を環状パッキ
ングを介して前記円筒面状の部分に気密に嵌合して前記
有底円筒体の内部に試料を収容し、前記有底円筒体の周
側面にX線透過材で密閉した円弧状のX線窓を形成した
ことを特徴とするX線回折装置の試料保持器。
1. An X-ray diffractometer, wherein a sample mounting base is formed with a cylindrical surface portion, and a center line of the cylindrical surface portion and a rotation axis of the sample mounting base are plate-shaped mounted on the sample mounting base. The sample is housed inside the bottomed cylindrical body by fitting the open end of the bottomed cylindrical body into the cylindrical surface portion through an annular packing in an airtight manner so as to ride on the analysis surface of the sample. A sample holder for an X-ray diffraction apparatus, wherein an arc-shaped X-ray window sealed with an X-ray transmitting material is formed on the peripheral side surface of a bottom cylinder.
JP1988003838U 1988-01-18 1988-01-18 Sample holder for X-ray diffractometer Expired - Lifetime JPH0637317Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1988003838U JPH0637317Y2 (en) 1988-01-18 1988-01-18 Sample holder for X-ray diffractometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1988003838U JPH0637317Y2 (en) 1988-01-18 1988-01-18 Sample holder for X-ray diffractometer

Publications (2)

Publication Number Publication Date
JPH01110357U JPH01110357U (en) 1989-07-25
JPH0637317Y2 true JPH0637317Y2 (en) 1994-09-28

Family

ID=31205825

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1988003838U Expired - Lifetime JPH0637317Y2 (en) 1988-01-18 1988-01-18 Sample holder for X-ray diffractometer

Country Status (1)

Country Link
JP (1) JPH0637317Y2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112557427A (en) * 2020-12-11 2021-03-26 东莞理工学院 Sample environment equipment convenient to conversion
CN112611764A (en) * 2020-12-11 2021-04-06 东莞理工学院 Vacuum stress sample environment prototype

Also Published As

Publication number Publication date
JPH01110357U (en) 1989-07-25

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