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JPH06334215A - Surface emitting light emitting diode - Google Patents

Surface emitting light emitting diode

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Publication number
JPH06334215A
JPH06334215A JP14002593A JP14002593A JPH06334215A JP H06334215 A JPH06334215 A JP H06334215A JP 14002593 A JP14002593 A JP 14002593A JP 14002593 A JP14002593 A JP 14002593A JP H06334215 A JPH06334215 A JP H06334215A
Authority
JP
Japan
Prior art keywords
light
active layer
layer
emitting diode
chip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14002593A
Other languages
Japanese (ja)
Inventor
Takashi Saka
貴 坂
Toshihiro Kato
俊宏 加藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Daido Steel Co Ltd
Original Assignee
Daido Steel Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Daido Steel Co Ltd filed Critical Daido Steel Co Ltd
Priority to JP14002593A priority Critical patent/JPH06334215A/en
Publication of JPH06334215A publication Critical patent/JPH06334215A/en
Pending legal-status Critical Current

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Abstract

(57)【要約】 【目的】 高い発光効率を得ることができるチップ状の
面発光型発光ダイオードを提供する。 【構成】 オーミック電極24直下の部分に位置する活
性層16から上方へ向かう光のうちのチップの厚み方向
に対して78.7°より小さい角度範囲の光は、従来は
オーミック電極24により遮光されていたが、本面発光
型発光ダイオード10によれば、その角度範囲のうち6
3.04°以上のAに示す角度範囲の光は低屈折率層2
0との境界面25により反射され、またその後に反射面
32により反射されるなどしてチップ側面30から外部
へ放射されることにより輝度に寄与するので、従来の発
光ダイオードに比較して発光効率が高くなるのである。
(57) [Summary] [Object] To provide a chip-shaped surface-emitting light-emitting diode capable of obtaining high luminous efficiency. [Structure] Of the light traveling upward from the active layer 16 located directly below the ohmic electrode 24, light in the angle range smaller than 78.7 ° with respect to the thickness direction of the chip is conventionally shielded by the ohmic electrode 24. However, according to the surface-emitting light-emitting diode 10, 6 of the angular range is
Light in the angle range of 3.04 ° or more shown in A is the low refractive index layer 2
The light is emitted from the chip side surface 30 to the outside by being reflected by the boundary surface 25 with 0 and then by the reflecting surface 32, and thus contributes to the brightness. Therefore, the luminous efficiency is higher than that of the conventional light emitting diode. Will be higher.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は面発光型発光ダイオード
の改良に関し、とくに発光効率を高める技術に関するも
のである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an improvement of a surface-emitting type light emitting diode, and more particularly to a technique for improving luminous efficiency.

【0002】[0002]

【従来の技術】光通信や表示器などに発光ダイオードが
多用されている。かかる発光ダイオードは一般に、半導
体基板の上に液相エピタキシー(LPE;Liquid Phase Epit
axy)法などのエピタキシャル成長法によりpn接合を形
成したダイオードを用いて構成される。通常、このよう
な発光ダイオードの一種に、電極が一部に設けられた光
取出面と、その光取出面に平行に設けられて光を発生す
る活性層と、その活性層の下側に設けられてその活性層
から下側へ向かって放射された光を光取出面へ向かって
反射する反射手段、たとえばチップの底面或いは半導体
基板上に形成されたBR層などを備え、前記活性層から
発生された光を前記光取出面から放射するようにしたチ
ップ状の面発光型発光ダイオードが知られている。この
ような形式の面発光型発光ダイオードによれば、活性層
から下側へ向かって放射された光が反射手段によって光
取出面側へ反射されるので、発光効率が比較的に改善さ
れる。
2. Description of the Related Art Light emitting diodes are widely used in optical communication and displays. Such a light emitting diode is generally formed on a semiconductor substrate by liquid phase epitaxy (LPE).
axy) method or other epitaxial growth method is used to form the pn junction. Usually, one kind of such a light emitting diode is provided with a light extraction surface having an electrode partially provided, an active layer which is provided in parallel with the light extraction surface and which generates light, and an active layer provided below the active layer. The active layer is provided with a reflection means for reflecting the light emitted downward from the active layer toward the light extraction surface, for example, a BR layer formed on the bottom surface of the chip or on the semiconductor substrate. There is known a chip-shaped surface emitting light emitting diode that emits the emitted light from the light extraction surface. According to the surface emitting light emitting diode of this type, the light emitted downward from the active layer is reflected toward the light extraction surface side by the reflecting means, so that the light emitting efficiency is relatively improved.

【0003】[0003]

【発明が解決しようとする課題】ところで、上記従来の
面発光型発光ダイオードの光取出面に設けられた電極
は、活性層に光を発生させる電流を供給するために必要
なものであるが、アルミニウムや金などのように光を透
過させない金属によって構成されているため、光の取り
出し面積を減少させ、発光効率が未だ充分に得られなか
った。活性層のうちの電極直下に位置する部分の活性層
の電流密度が高いため、その部分から発生する比較的高
輝度の光が電極によって光取出面から取り出されること
が阻害されるのである。
The electrode provided on the light extraction surface of the conventional surface emitting light emitting diode is necessary for supplying a current for generating light to the active layer. Since it is made of a metal that does not transmit light, such as aluminum and gold, the light extraction area is reduced, and sufficient luminous efficiency cannot be obtained yet. Since the current density of the active layer in the portion of the active layer located immediately below the electrode is high, the electrode prevents the light having relatively high brightness generated from that portion from being extracted from the light extraction surface.

【0004】本発明は以上の事情を背景として為された
ものであり、その目的とするところは、高い発光効率を
得ることができるチップ状の面発光型発光ダイオードを
提供することにある。
The present invention has been made in view of the above circumstances, and an object of the present invention is to provide a chip-shaped surface-emitting light emitting diode which can obtain high luminous efficiency.

【0005】[0005]

【課題を解決するための手段】本発明者は以上の事情を
背景として種々検討を重ねた結果、活性層と光取出面と
の間に、その活性層よりも上側に位置する層よりも低い
屈折率を有する低屈折率層を設けると、従来は電極によ
って妨げられていた光を外部へ導出することができるこ
とを見出した。本発明は斯る知見に基づいて為されたも
のである。
The inventors of the present invention have made various studies in view of the above circumstances, and as a result, have found that the distance between the active layer and the light extraction surface is lower than that of the layer positioned above the active layer. It has been found that by providing a low-refractive index layer having a refractive index, light that was conventionally blocked by an electrode can be guided to the outside. The present invention has been made based on such findings.

【0006】すなわち、本発明の要旨とするところは、
電極が一部に設けられた光取出面と、その光取出面に平
行に設けられて光を発生する活性層と、その活性層の下
側に設けられてその活性層から下側へ向かって放射され
た光を反射するための反射手段とを備え、前記活性層か
ら発生された光を前記光取出面から放射するようにした
チップ状の面発光型発光ダイオードにおいて、前記活性
層と光取出面との間に、その活性層の光取出面側に位置
する層よりも相対的に屈折率が低い低屈折率層を設けた
ことにある。
That is, the gist of the present invention is to
An electrode is provided on a part of the light extraction surface, an active layer is provided in parallel with the light extraction surface to generate light, and an active layer is provided below the active layer and extends downward from the active layer. A chip-shaped surface-emitting light-emitting diode, comprising: a reflection means for reflecting the emitted light, wherein the light emitted from the active layer is emitted from the light extraction surface. This is because a low refractive index layer having a relatively lower refractive index than the layer positioned on the light extraction surface side of the active layer is provided between the layer and the surface.

【0007】[0007]

【作用】このようにすれば、前記活性層の光取出面側に
位置する層と低屈折率層との間の境界面において、その
活性層から光取出面側に向かって発射された光のうちチ
ップの厚み方向に対する傾斜角度が所定値以上の光が全
反射される。このため、電極直下に位置する部分の活性
層から発射されて本来電極により妨げられる光のうち上
記所定値よりも大きい傾斜角を有する光が上記境界面に
よって全反射され、チップの側面から外部へ取り出され
る。また、電極直下の部分以外の活性層から発生した光
のうちの厚み方向に対する傾斜角が所定値よりも大きい
光も上記と同様にチップの側面から外部へ取り出され
る。
With this configuration, the light emitted from the active layer toward the light extraction surface side is formed at the interface between the layer located on the light extraction surface side of the active layer and the low refractive index layer. Of these, light having an inclination angle of a predetermined value or more with respect to the thickness direction of the chip is totally reflected. Therefore, of the light emitted from the portion of the active layer located immediately below the electrode and originally obstructed by the electrode, the light having an inclination angle larger than the above-mentioned predetermined value is totally reflected by the boundary surface to the outside from the side surface of the chip. Taken out. Further, of the light generated from the active layer other than the portion immediately below the electrode, the light having an inclination angle with respect to the thickness direction larger than a predetermined value is also extracted to the outside from the side surface of the chip in the same manner as described above.

【発明の効果】電極と活性層との間の距離が小さいた
め、電極直下の活性層から上側へ放射された光が電極に
よって比較的大きく阻害されるが、その上側へ放射され
た光のうちチップの厚み方向に対して所定角よりも大き
い光が活性層の光取出面側に位置する層と低屈折率層と
の間の境界面において全反射され、チップの側面から外
部へ取り出されるので、高い発光効率が得られる。な
お、電極直下の部分以外の活性層から発生した光は光取
出面およびチップの側面から外部へ取り出されるので、
上記境界面の存在はその電極直下の部分以外の活性層か
ら発生した光の取り出しに影響しない。
Since the distance between the electrode and the active layer is small, the light emitted upward from the active layer directly below the electrode is relatively largely blocked by the electrode. Of the light emitted upward, Light larger than a predetermined angle with respect to the thickness direction of the chip is totally reflected at the boundary surface between the layer located on the light extraction surface side of the active layer and the low refractive index layer, and is extracted to the outside from the side surface of the chip. , High luminous efficiency can be obtained. In addition, since the light generated from the active layer other than the portion immediately below the electrode is extracted to the outside from the light extraction surface and the side surface of the chip,
The existence of the boundary surface does not affect the extraction of light generated from the active layer other than the portion immediately below the electrode.

【0008】[0008]

【実施例】以下、本発明の一実施例を図面に基づいて詳
細に説明する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described in detail below with reference to the drawings.

【0009】第1図は本発明の一実施例であるダブルヘ
テロ構造を備えたチップ状の面発光型発光ダイオード1
0の積層構成を説明するための図である。図において、
発光ダイオード10は、基板12上において、クラッド
層14、活性層16、クラッド層18、低屈折率層2
0、キャップ層22、およびオーミック電極24が順次
積層されることにより構成されている。
FIG. 1 shows a chip-shaped surface-emitting light emitting diode 1 having a double hetero structure according to an embodiment of the present invention.
It is a figure for demonstrating the laminated constitution of 0. In the figure,
The light emitting diode 10 includes a cladding layer 14, an active layer 16, a cladding layer 18, and a low refractive index layer 2 on a substrate 12.
0, the cap layer 22, and the ohmic electrode 24 are sequentially stacked.

【0010】上記基板12は200μm程度の厚みを備
えたn−Al0.1 Ga0.9 As化合物半導体、クラッド
層14は4μm程度の厚みを備えたn−Al0.45Ga
0.55As化合物半導体、活性層16は0.1μm程度の
厚みを備えたp−GaAs化合物半導体、クラッド層1
8は12μm程度の厚みを備えたp−Al0.45Ga0.55
As化合物半導体、低屈折率層20は0.1μm程度の
厚みを備えたp−Al0.6 Ga0.4 As化合物半導体、
キャップ層22は0.1μm程度の厚みを備えたp−G
aAs化合物半導体であり、それらの各層は、たとえ
ば、有機金属化学気相成長(MOCVD;Metal Organic Chemi
cal Vapor Deposition) 法や分子線エピタキシー(MBE;M
olecular Beam Epitaxy)法、或いは気相エピタキシー(V
PE;Vapor Phase Epitaxy) 法などによって、共通のチャ
ンバ内において基板12上に単結晶の状態で順次成長さ
せられることにより形成されている。また、上記オーミ
ック電極24はたとえばよく知られたホトリソグラフィ
技術を用いてキャップ層22上の光取出面26上におい
てその光取出面26より小さな面積たとえば120μm
φにて中央部に設けられたp型Au−Zn電極である。
The substrate 12 is an n-Al 0.1 Ga 0.9 As compound semiconductor having a thickness of about 200 μm, and the cladding layer 14 is an n-Al 0.45 Ga having a thickness of about 4 μm.
0.55 As compound semiconductor, active layer 16 is a p-GaAs compound semiconductor having a thickness of about 0.1 μm, cladding layer 1
8 is p-Al 0.45 Ga 0.55 having a thickness of about 12 μm.
As compound semiconductor, the low refractive index layer 20 is a p-Al 0.6 Ga 0.4 As compound semiconductor having a thickness of about 0.1 μm,
The cap layer 22 is a p-G layer having a thickness of about 0.1 μm.
Each of these layers is, for example, metal organic chemical vapor deposition (MOCVD).
cal Vapor Deposition) method and molecular beam epitaxy (MBE; M
olecular beam epitaxy method or vapor phase epitaxy (V
By PE (Vapor Phase Epitaxy) method or the like, it is formed by sequentially growing in a single crystal state on the substrate 12 in a common chamber. The ohmic electrode 24 has an area smaller than the light extraction surface 26, for example, 120 μm on the light extraction surface 26 on the cap layer 22 by using a well-known photolithography technique.
It is a p-type Au-Zn electrode provided in the central portion at φ.

【0011】上記低屈折率層20は、p−Alx Ga
1-x As化合物半導体の混晶比xが0.6に設定される
ことにより屈折率n20が3.20とされ、隣接するクラ
ッド層18の屈折率n18=3.29よりも低くされてい
る。この低屈折率層20の屈折率n20はその混晶比xを
大きくするほど小さくされるけれども、反対に抵抗値が
高くなるために、本実施例では混晶比xが0.6とされ
ているのである。したがって、全反射角度を低くするた
めに、低屈折率層20の混晶比xを0.6からさらに高
くしてその屈折率n20を低くする、あるいはクラッド層
18のAl混晶比を低くしてn18を大きくしても良い。
The low refractive index layer 20 is made of p-Al x Ga.
By setting the mixed crystal ratio x of the 1-x As compound semiconductor to 0.6, the refractive index n 20 is set to 3.20, which is lower than the refractive index n 18 = 3.29 of the adjacent clad layer 18. ing. The refractive index n 20 of the low refractive index layer 20 is made smaller as the mixed crystal ratio x is increased, but on the contrary, since the resistance value is increased, the mixed crystal ratio x is set to 0.6 in this embodiment. -ing Therefore, in order to reduce the total reflection angle, the mixed crystal ratio x of the low refractive index layer 20 is further increased from 0.6 to lower its refractive index n 20 , or the Al mixed crystal ratio of the cladding layer 18 is lowered. Then, n 18 may be increased.

【0012】このように低屈折率層20の屈折率n20
クラッド層18のそれよりも相対的に低くされることに
より、低屈折率層20とクラッド層18との間の境界面
25において、活性層16の発光波長880nmの光で
は、63.04°以上の厚み方向(図1の垂直方向)に
対する角度範囲で上方の光取出面26へ向かう光が全反
射される。
By thus making the refractive index n 20 of the low refractive index layer 20 relatively lower than that of the cladding layer 18, at the interface 25 between the low refractive index layer 20 and the cladding layer 18, With the light having an emission wavelength of 880 nm of the active layer 16, the light toward the upper light extraction surface 26 is totally reflected in the angle range with respect to the thickness direction (vertical direction in FIG. 1) of 63.04 ° or more.

【0013】以上のように構成された面発光型発光ダイ
オード10においては、オーミック電極24から基板1
2の底面に設けられたオーミック電極28へ駆動電流が
流されると、活性層16からは880nmの波長の光が
発生させられる。オーミック電極24直下に位置しない
部分の活性層16から光取出面26側へ向かう光のう
ち、チップの厚み方向に対して63.04°以下の角度
範囲の光は低屈折率層20を通過し、光取出面26から
外部へ放射される一方、チップの厚み方向に対して6
3.04°以上の角度範囲の光はクラッド層18と低屈
折率層20との境界面25により全反射されるが、チッ
プ側面30から外部へ放射される。また、上記オーミッ
ク電極24直下に位置しない部分の活性層16から下方
へ向かう光は反射面32により上方へ反射されるので、
上記と同様に外部へ取り出される。いずれにしても、オ
ーミック電極24直下に位置しない部分の活性層16か
ら上方および下方へ発光された光は、光取出面26或い
はチップ側面30から外部へ放射されて輝度に寄与す
る。
In the surface-emitting light-emitting diode 10 constructed as above, the ohmic electrode 24 to the substrate 1
When a drive current is applied to the ohmic electrode 28 provided on the bottom surface of the second electrode 2, light having a wavelength of 880 nm is generated from the active layer 16. Of the light traveling from the active layer 16 toward the light extraction surface 26 side that is not located immediately below the ohmic electrode 24, the light in the angle range of 63.04 ° or less with respect to the thickness direction of the chip passes through the low refractive index layer 20. , Is radiated from the light extraction surface 26 to the outside, while being 6 in the thickness direction of the chip.
The light in the angle range of 3.04 ° or more is totally reflected by the boundary surface 25 between the cladding layer 18 and the low refractive index layer 20, but emitted from the chip side surface 30 to the outside. Further, since the light that goes downward from the portion of the active layer 16 that is not located directly below the ohmic electrode 24 is reflected upward by the reflecting surface 32,
It is taken out in the same manner as above. In any case, the light emitted upward and downward from the active layer 16 in the portion not directly below the ohmic electrode 24 is emitted to the outside from the light extraction surface 26 or the chip side surface 30 and contributes to the brightness.

【0014】一方、オーミック電極24直下の部分に位
置する活性層16から発光された光は、活性層16とオ
ーミック電極24との間の有効距離を12μmと仮定
し、図2に示すようにチップの中心線上の活性層16か
ら放射された光について説明すると、従来では、活性層
16から上方へ向かう光のうちの厚み方向に対して7
8.7°以下の角度範囲の光と、活性層16から下方へ
向かう光のうちのチップの厚み方向に対して8.2°以
下の角度範囲の光とがオーミック電極24により外部へ
の放射が阻止され、発光効率が得られない一因となって
いた。しかし、本実施例では、オーミック電極24直下
の部分に位置する活性層16から上方へ向かう光のうち
の63.04°以上の角度範囲の光は境界面25により
全反射され、またその後上記反射面32により反射され
るなどしてチップ側面30から外部へ放射されることに
より輝度に寄与するので、従来の発光ダイオードに比較
して発光効率が所定の割合で高くなるのである。なお、
上記オーミック電極24直下の部分に位置する活性層1
6から下方へ向かう光のうち、チップの厚み方向に対し
て8.2°乃至63.04°の光は反射面32によって
反射された後、境界面25を通過して光取出面26に到
達するが、63.04°以上の光は境界面25により全
反射されてチップ側面30に到達する。
On the other hand, the light emitted from the active layer 16 located immediately below the ohmic electrode 24 is assumed to have an effective distance of 12 μm between the active layer 16 and the ohmic electrode 24, and as shown in FIG. Light emitted from the active layer 16 on the center line of the active layer 16 will be described below.
The light in the angle range of 8.7 ° or less and the light in the angle range of 8.2 ° or less with respect to the thickness direction of the chip of the light traveling downward from the active layer 16 are emitted to the outside by the ohmic electrode 24. Was blocked, which was one of the reasons why the luminous efficiency was not obtained. However, in this embodiment, the light in the angle range of 63.04 ° or more out of the light traveling upward from the active layer 16 located directly below the ohmic electrode 24 is totally reflected by the boundary surface 25, and then the above-mentioned reflection is performed. The light is emitted from the side surface 30 of the chip by being reflected by the surface 32 and contributes to the brightness, so that the light emission efficiency is increased at a predetermined rate as compared with the conventional light emitting diode. In addition,
Active layer 1 located directly under the ohmic electrode 24
Of the light traveling downward from 6, the light of 8.2 ° to 63.04 ° with respect to the thickness direction of the chip is reflected by the reflecting surface 32 and then passes through the boundary surface 25 to reach the light extraction surface 26. However, the light of 63.04 ° or more is totally reflected by the boundary surface 25 and reaches the chip side surface 30.

【0015】上述のように、従来では、オーミック電極
24と活性層16との間の距離が小さいため、オーミッ
ク電極24直下に位置する部分の活性層16から上側へ
放射された光のうちチップの厚み方向に対して78.7
°以下の大きな角度範囲の光はオーミック電極24によ
り遮光されて輝度に寄与できなかったが、本実施例の面
発光型発光ダイオード10によれば、上記上側へ放射さ
れた光のうちチップの厚み方向に対して63.04°乃
至78.7°の比較的大きな角度範囲の光、すなわち図
2のAに示す角度範囲の光が、低屈折率層20との境界
面25により全反射されてチップ側面30から外部へ取
り出されるので、発光効率が高められる。オーミック電
極24直下に位置する部分の活性層16を通過する電流
の密度は高いので、その効果には顕著なものがある。
As described above, in the related art, since the distance between the ohmic electrode 24 and the active layer 16 is small, of the light emitted upward from the active layer 16 in a portion located immediately below the ohmic electrode 24, the chip of the light is emitted. 78.7 in the thickness direction
Light in a large angle range of less than or equal to ° was blocked by the ohmic electrode 24 and could not contribute to the brightness. However, according to the surface-emitting light emitting diode 10 of the present embodiment, the thickness of the chip among the light emitted to the upper side is The light in the relatively large angle range of 63.04 ° to 78.7 ° with respect to the direction, that is, the light in the angle range shown in FIG. 2A is totally reflected by the boundary surface 25 with the low refractive index layer 20. Since the light is taken out from the side surface 30 of the chip, the luminous efficiency can be improved. Since the density of the current passing through the active layer 16 in the portion directly below the ohmic electrode 24 is high, the effect is remarkable.

【0016】また、本実施例によれば、オーミック電極
24直下に位置する部分の活性層16から上側へ放射さ
れた光は境界面25において屈折することにより、オー
ミック電極24により外部へ取り出されることが阻止さ
れる角度範囲が小さくされるので、この点においても、
発光効率が高められる利点がある。
Further, according to the present embodiment, the light emitted upward from the portion of the active layer 16 located immediately below the ohmic electrode 24 is refracted at the boundary surface 25 and is extracted to the outside by the ohmic electrode 24. Since the angle range in which is blocked is reduced,
There is an advantage that the luminous efficiency can be improved.

【0017】図3は、本発明の他の実施例を示す図1に
相当する図である。図において、クラッド層14と基板
12との間には、n型の光波干渉型光反射層40が設け
られている。この光波干渉型光反射層40は、たとえ
ば、対を成す各数十μmの厚みのAlAs層およびAl
0.2 Ga0.8 As層が十数対乃至数十対積層されること
により構成され、ブラッグ反射の原理によって中心波長
が880乃至900nm程度の比較的広い反射帯域を備
えており、活性層16からの880nmおよびそれより
も長波長の光を反射できるように構成されている。
FIG. 3 is a view corresponding to FIG. 1 showing another embodiment of the present invention. In the figure, an n-type light wave interference type light reflection layer 40 is provided between the cladding layer 14 and the substrate 12. The light wave interference type light reflection layer 40 is formed of, for example, a pair of AlAs layers and Al layers each having a thickness of several tens of μm.
It is configured by laminating dozens to dozens of pairs of 0.2 Ga 0.8 As layers, has a relatively wide reflection band with a center wavelength of about 880 to 900 nm according to the principle of Bragg reflection, and has 880 nm from the active layer 16. And a light having a longer wavelength than that can be reflected.

【0018】本実施例においても、図4に示すように、
オーミック電極24直下の部分に位置する活性層16か
ら上方へ向かう光のうちの63.04°以上の角度範囲
の光は境界面25により全反射され、またその後上記反
射面32により反射されるなどしてチップ側面30から
外部へ放射され、輝度に寄与するので、従来に比較し
て、63.04°乃至78.7°の比較的大きな角度範
囲の光、すなわち図4のAに示す角度範囲の光が、境界
面25により全反射されてチップ側面30から外部へ取
り出されるので、発光効率が高められる。
Also in this embodiment, as shown in FIG.
Of the light traveling upward from the active layer 16 located immediately below the ohmic electrode 24, light in the angle range of 63.04 ° or more is totally reflected by the boundary surface 25, and then reflected by the reflective surface 32. Then, the light is radiated to the outside from the chip side surface 30 and contributes to the brightness. Therefore, light in a relatively large angle range of 63.04 ° to 78.7 °, that is, the angle range shown in A of FIG. Light is totally reflected by the boundary surface 25 and is extracted to the outside from the chip side surface 30, so that the luminous efficiency is improved.

【0019】上記図1および図3の実施例では、オーミ
ック電極24直下に位置するためにその部分の活性層1
6の電流密度が高くなる構造であったが、オーミック電
極24直下に位置する部分に対してオーミック電極24
直下に位置しない部分の電流密度を相対的に高くするた
めに、オーミック電極24直下以外の部分にZnなどの
不純物をドーピングしてその部分の導電率を高めた構造
であっても、本発明の一応の効果を享受することができ
る。
In the embodiment shown in FIGS. 1 and 3, the active layer 1 in that portion is located immediately below the ohmic electrode 24.
6 has a structure in which the current density is high.
In order to relatively increase the current density in the portion not directly underneath, even in the structure in which the conductivity of that portion is increased by doping impurities such as Zn into the portion other than directly under the ohmic electrode 24 You can enjoy tentative effects.

【0020】また、前述の実施例では、光取出面26上
においてオーミック電極24が直接設けられていたが、
活性層16からオーミック電極24側へ向かって発生し
た光を下側へ反射するためなどの目的のためにたとえば
前記光波干渉型光反射層40と同様に構成されたp型の
化合物半導体層であってそのオーミック電極24と同じ
面積の層を介して光取出面26上に間接的に設けられて
いてもよい。
Further, in the above-described embodiment, the ohmic electrode 24 is directly provided on the light extraction surface 26, but
It is a p-type compound semiconductor layer configured in the same manner as the light wave interference type light reflection layer 40 for the purpose of reflecting the light generated from the active layer 16 toward the ohmic electrode 24 side downward. It may be indirectly provided on the light extraction surface 26 via a layer having the same area as the ohmic electrode 24.

【0021】また、前述の図1および図3の実施例のn
およびpを反転させてもよい。このような場合における
低屈折率層20では、屈折率n20を2.97程度に低く
することができる。
Also, n in the embodiment of FIGS. 1 and 3 described above is used.
And p may be inverted. In the low refractive index layer 20 in such a case, the refractive index n 20 can be lowered to about 2.97.

【0022】また、前記実施例の面発光型発光ダイオー
ド10はGaAs/AlGaAsダブルヘテロ構造を成
しているが、GaP,InP,InGaAsPなど他の
化合物半導体から成る発光ダイオードや単一ヘテロ構
造、あるいはホモ構造の発光ダイオードであってもよ
い。
Further, although the surface emitting light emitting diode 10 of the above-mentioned embodiment has a GaAs / AlGaAs double hetero structure, it is a light emitting diode made of another compound semiconductor such as GaP, InP, InGaAsP, or a single hetero structure, or It may be a light emitting diode having a homo structure.

【0023】その他一々例示はしないが、本発明は当業
者の知識に基づいて種々の変更,改良を加えた態様で実
施することができる。
Although not illustrated one by one, the present invention can be implemented in various modified and improved modes based on the knowledge of those skilled in the art.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例である面発光型発光ダイオー
ドの積層構造を説明する断面図である。
FIG. 1 is a cross-sectional view illustrating a laminated structure of a surface-emitting light emitting diode that is an embodiment of the present invention.

【図2】図1の面発光型発光ダイオードの作用を説明す
る図である。
FIG. 2 is a diagram illustrating an operation of the surface emitting light emitting diode of FIG.

【図3】本発明の他の実施例の図1に相当する図であ
る。
FIG. 3 is a view corresponding to FIG. 1 of another embodiment of the present invention.

【図4】図3の面発光型発光ダイオードの作用を説明す
る図である。
FIG. 4 is a diagram illustrating an operation of the surface emitting light emitting diode of FIG.

【符号の説明】[Explanation of symbols]

10:面発光型発光ダイオード 16:活性層 20:低屈折率層 24:オーミック電極 26:光取出面 32:反射面(反射手段) 40:光波干渉型光反射層(反射手段) 10: surface emitting light emitting diode 16: active layer 20: low refractive index layer 24: ohmic electrode 26: light extraction surface 32: reflecting surface (reflecting means) 40: light wave interference type light reflecting layer (reflecting means)

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 電極が一部に設けられた光取出面と、該
光取出面に平行に設けられて光を発生する活性層と、該
活性層の下側に設けられてその活性層から下側へ向かっ
て放射された光を反射するための反射手段とを備え、前
記活性層から発生された光を前記光取出面から放射する
ようにしたチップ状の面発光型発光ダイオードにおい
て、 前記活性層と光取出面との間に、該活性層の上側に位置
する層よりも相対的に屈折率が低い低屈折率層を設けた
ことを特徴とする面発光型発光ダイオード。
1. A light extraction surface having an electrode partially provided thereon, an active layer provided in parallel with the light extraction surface to generate light, and an active layer provided below the active layer from the active layer. In a chip-shaped surface-emitting light-emitting diode, which is provided with a reflection means for reflecting light emitted toward the lower side, and is adapted to emit light generated from the active layer from the light extraction surface, A surface emitting light emitting diode comprising a low refractive index layer having a relatively lower refractive index than a layer located above the active layer between the active layer and the light extraction surface.
JP14002593A 1993-05-18 1993-05-18 Surface emitting light emitting diode Pending JPH06334215A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14002593A JPH06334215A (en) 1993-05-18 1993-05-18 Surface emitting light emitting diode

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14002593A JPH06334215A (en) 1993-05-18 1993-05-18 Surface emitting light emitting diode

Publications (1)

Publication Number Publication Date
JPH06334215A true JPH06334215A (en) 1994-12-02

Family

ID=15259202

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14002593A Pending JPH06334215A (en) 1993-05-18 1993-05-18 Surface emitting light emitting diode

Country Status (1)

Country Link
JP (1) JPH06334215A (en)

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