JPH06268668A - Speech path continuity test device - Google Patents

Abstract

PURPOSE:To provide a test device suitable for an ATM exchange system by sending a test cell at arbitrary speed. CONSTITUTION:It is necessary to execute tests to all the routes where data are passed. Therefore, it is necessary to pass the test cell from line correspondence parts 11-1M to all the line correspondence parts 21-2N connected to SW-IN and to pass the test cell fr6m the correspondence parts 21-2N connected to SW- OUT to the line correspondence parts 11-1M. A speech path inside conduction testing circuit 4 sends the test cell through the SW-OUT to the correspondence part 11. Successively the correspondence part 1M sends the arriving test cell through the SW-IN to the correspondence part 2M. The correspondence part 2N sends the arriving test cell through the SW-OUT to the correspondence part 1(N+1). Finally, the correspondence part 2N sends the arriving test cell to the circuit 4. Thus, the test cell from the circuit 4 is circulated through all the correspondence parts, the continuity test is performed by circulating one test cell through all the line correspondence parts, and the speech path continuity test device suitable for the ATM exchange system can be provided.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a speech path continuity test device for testing whether or not each functional block in a speech path in an ATM switching system is functioning normally.

[0002]

2. Description of the Related Art As a conventional speech path continuity test device, there is, for example, one shown in FIG. FIG. 13 shows an apparatus for testing a subscriber circuit of a D70 type digital automatic switching system.

As shown in the figure, the subscriber test circuit 8 is connected to the switch 5 when testing the subscriber circuits 7 _{1 to} 7 _N. The test signal output from the test signal transmitting section 81 of the subscriber test circuit 8 is sent to the subscriber circuit 7 via the switch 5.
It is sent to a _{1 ~7 N.} Then, the test signals returned by the subscriber circuits 7 _{1 to} 7 _N are returned to the subscriber test circuit 8 via the switch 5. The test signal receiving section 82 of the subscriber test circuit 8 confirms the returned test signal to determine whether the functions of the subscriber circuits 7 _{1 to} 7 _N are normal.

FIG. 14 is a block diagram showing the connection relationship in the pilot test for the D70 type digital automatic switching system. Switch interface device 9 _{1 to} 9 _N
Are connected to specific test channels (highway No. 8, slot No. 16, highway No. 12, slot No. 16 in the example of FIG. 14) to the pilot pattern generation circuit (PL).
G) The test pattern generated by 901 is sent at a fixed speed. The test pattern which has passed through the switch 5 is returned to the switch interface device 9 ₁ to 9 _N. Then, the pilot pattern check circuit (PCG) 902 determines the returned test pattern.

In this test, since the test pattern is transmitted to a specific test channel, the test pattern cannot be mixed with general data. Further, since the test pattern is returned to the same switch interface device as the switch interface device that sent the test pattern, it is not possible to set a test route connecting different switch interface devices. And, the standard route is the only route through which the test pattern passes. Therefore, a special route cannot be set, and it may be difficult to set a test route for individually testing a specific block in the communication path. Furthermore, it is difficult to perform the above two tests with the same test circuit.

[0006]

In the speech path of the ATM switching system, the speed of general data is not fixed. Also, the usage speed is different for each user. On the other hand, in the conventional speech path continuity test, as described above, the test pattern is passed through the test channel without being mixed with general data. Even if the test pattern can be mixed with general data, the test pattern sending speed remains a fixed speed.

Therefore, according to the concept of the conventional communication path continuity test, the communication path continuity test required in the ATM switching system is
That is, there is a problem in that it is not possible to implement a communication path continuity test at a plurality of types of speeds according to the service speed provided. Further, in the conventional way of thinking about the communication path continuity test, as described above, there is a problem that a test route for individually testing a specific portion in the communication path cannot be set.

Therefore, the present invention provides a speech path continuity test apparatus suitable for an ATM switching system capable of transmitting a test signal at an arbitrary speed and setting a special test route for individually testing a specific portion. The purpose is to provide.

[0009]

A speech path continuity testing apparatus according to the present invention is a speech communication in an ATM switching system having a switch section and each line corresponding section including a folding mechanism and a header conversion circuit connected to the switch section. It conducts a continuity test in the road, connected to the switch part in the call path,
Connected to a test cell generator that generates a test cell that has a cell header that indicates the destination etc. and a routing tag for switching and sends it to the switch at an arbitrary speed, and to the switch in the communication path, The test cell collecting unit collects the test cells returned by the line corresponding unit, and the test cell collating unit inspects the collected test cells.

[0010]

The test cell generator in the present invention sends the test cell at an arbitrary speed to allow the test cell at an arbitrary speed to pass through the actual speech path. Further, by attaching an arbitrary cell header and routing tag to the test cell, it is possible to conduct a continuity test for all speech paths in the switching system connected to the switch section.
The test cell collating unit performs collation from the collected test cells to determine whether the test route of the test target in the communication path is normal.

Further, the communication path continuity test apparatus according to the present invention utilizes the folding mechanism and the header conversion circuit provided in the line corresponding part, in addition to the standard route in the communication path through which general data passes. , Set a test route to individually test a specific part of the communication path, and conduct a continuity test using that route.

[0012]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1 is a block diagram showing the test configuration when a speech path continuity test is performed using the speech path continuity test apparatus according to the present invention. In the present embodiment, M line interface units 1 ₁ to 1 _M ,
The case where the ATM switching system by the switch unit 31 and the N line corresponding units 2 ₁ to 2 _N is tested is shown.
The communication path continuity test circuit 4 is connected to the switch unit 31. The line interface 1 ₁ to 1 _M and the line interface 2
_{1 to} 2 _N include a header conversion circuit 100 that replaces the header of the test cell and a test cell return mechanism that extracts the test cell and returns it. The header conversion circuit 100 is
It has a header conversion table. Below, the line interface 1 ₁ ~
Of 1 _M is referred to as # 1 line corresponding unit 1, the line interface unit 2 ₁ to 2 _N
Is referred to as # 2 line interface 2. Also, the continuity test circuit 4 in the communication path, the line corresponding parts 1 ₁ to 1 _M , the line corresponding parts 2 ₁ to 2 _N ,
And the switch unit 31 receives a command from the control unit 6.

In the ATM switching system shown in FIG. 1, the switch unit 31 is a switch unit having a two-sided structure in which the switch unit 31 is divided into SW-IN and SW-OUT. As shown in FIG. The communication path continuity test apparatus according to the present invention can also be applied to an ATM switching system having a single-sided switch unit 32.

FIG. 3 is a block diagram showing an example of the configuration of the communication path continuity test circuit 4. As shown in the figure, the in-traffic-channel continuity test circuit 4 includes a test cell generation unit 41 for simultaneously generating a plurality of types of test cells each including an arbitrary cell header and a routing tag, and an effective test. A test cell collection unit 42 that selectively takes in cells, and a test cell collation unit 43 that counts the number of bit errors, the number of lost cells, the number of mis-distributed cells, and the like for the test cells taken in by the test cell collection unit 42. Composed of. However, the test cell collecting unit 42 and the test cell collating unit 43 may be configured by one block. Further, the test cell generation unit 41 and the test cell collection unit 42 include the SW-IN and the SW-OUT of the switch unit 31.
It is connected to the.

Next, the operation will be described. Call path continuity test
The test is all that the general data (here general cell) passes
Must be run against the root of. That is, #
1-line compatible unit 1 → SW-IN of switch unit 31 → # 2 line pair
Response unit 2 and # 2 line interface 2 → SW of switch unit 31
-OUT → # 1 Executed for all routes of line interface 1
Need to be done. Therefore, everything connected to SW-IN
Line support part 1₁~ 1 _MFrom all connected to SW-IN
Line connection part 2₁~ 2_NTo pass the test cell against
In addition, all line compatible parts connected to SW-OUT
Two₁~ 2_NTo all lines connected from to SW-OUT
Part 1₁~ 1_MNeed to pass through the test cell
It

First, with reference to FIG. 4, a test of a conduction route for SW-IN will be described. The test cell generation unit 41 of the communication path continuity test circuit 4 sends the test cell to the line interface 1 ₁ via the SW-OUT of the switch unit 31 at an arbitrary speed. The test cell generator 41 includes a cell header and a routing tag corresponding to the line interface 1 ₁ in the test cell. The switch unit 31 selects the line corresponding unit 1 ₁ of the destination by using the cell header and the routing tag.

The folding mechanism line interface 1 ₁ has the folded arrived test cell, and sends toward the line interface 2 ₁ via the SW-IN. The line interface ₁₁ is
In accordance with an instruction from the control unit 6, information indicating the line interface 2 ₁ is set as a destination in the header conversion table. Line interface 1 ₁ of the header conversion circuit 100 refers to the contents of the header conversion table, it converts the cell header and routing tag has arrived test cell so as to correspond to the line interface 2 ₁ addressed. The switch unit 31 uses the cell header and the routing tag to select the destination line interface unit 2 ₁ .

Line interface 2₁Folding mechanism
Returns the test cell that arrived and calls via SW-OUT
It is sent to the internal continuity test circuit 4. Line correspondence here
Part 2 ₁The header conversion circuit 100 of the
Continuity test circuit in the communication path between cell header and routing tag
Convert to the one corresponding to 4. The switch unit 31 has
Using the cell header and routing tag, the line interface 2
₁Deliver the test cell from
It In addition, line support unit 2₁Follow the instructions from the control unit 6.
Then, as a destination in the header conversion table, the continuity test in the communication path
Information indicating the circuit 4 is set.

The test cell collection unit 42 of the communication test circuit 4 collects the arrived test cells. The test cell matching unit 43 counts the number of bit errors and the number of lost cells in the collected test cells.

Hereinafter, the control unit 6 is the line interface unit 1.₁Header
Changing the contents of the conversion table, the line interface 1₁Header
The conversion circuit 100 is sequentially connected to the line support unit 2₂, ..., line
Corresponding part 2_NCell header and routing tag corresponding to
The communication path continuity test circuit 4 is sequentially
If a test cell is sent, the line interface 1 in SW-IN ₁
To line interface 2₁, ..., line interface 2_NContinuity to
Confirmation can be done. Also, a continuity test circuit in the speech path
4 is the line interface 1 as the test cell destination₂...
Line interface 1_MTo SW-IN by selecting
Line support section 1₂~ Line interface 1_MFrom the line interface
Two₁, ..., line interface 2_NTo confirm continuity to
You can As described above, the SW-IN line interface is connected.
The line interface is connected from all the connected input terminals.
Continuity test of the continuity route to all output terminals
It can be carried out.

Next, the conduction route test for SW-OUT will be described with reference to FIG. The test cell generation unit 41 of the communication path continuity test circuit 4 sends the test cell to the line interface unit 2 ₁ via the SW-IN of the switch unit 31 at an arbitrary speed. The test cell generator 41 includes a cell header and a routing tag corresponding to the line interface 2 ₁ in the test cell. The switch unit 31 uses the cell header and the routing tag to select the destination line interface unit 2 ₁ .

The loopback mechanism of the line interface 2 ₁ loops back the arrived test cell and sends it to the line interface 1 ₁ via SW-OUT. Here, in the header conversion table, information indicating the line interface 1 ₁ is set as the destination. The header conversion circuit 100 of the line interface 2 ₁
Converting the cell header and routing tag has arrived test cell so as to correspond to the line interface 1 _1. Switch part 3
1 uses the cell header and the routing tag to select the line interface 1 ₁ of the destination.

Line interface 1₁Folding mechanism
Returns the arriving test cell and calls via SW-IN
It is sent to the internal continuity test circuit 4. Line correspondence here
Part 1 ₁The header conversion circuit 100 of the
Continuity test circuit in the communication path between cell header and routing tag
Convert to the one corresponding to 4. The switch unit 31 has
The line interface 1 using the cell header and the routing tag
₁Deliver the test cell from
It The communication path continuity test circuit 4 relates to the above-mentioned SW-IN.
As in the continuity test, the bit error in the arriving test cell
The number of cells and the number of lost cells are counted.

[0024] Hereinafter, header conversion circuit 1 of line interface 2 ₁
00, the line corresponding part 1 ₂ , ..., Line corresponding part 1 _M
If the in-communication-path continuity test circuit 4 sequentially sends out test cells by converting the cell header and the routing tag corresponding to, the line corresponding unit 2 ₁ to the line corresponding unit 1 ₁ , ... , it is possible to perform continuity check to line adapter 1 _M. Further, the call path continuity test circuit 4, the line interface 2 ₂ as the test cell sending destination, ..., by selecting sequentially the line interface 2 _N, line adapter 2 _2-line in SW-OUT Corresponding part 2 _N to line corresponding part 1 ₁ , ...
-, it is possible to perform continuity check to line adapter 1 _M.
As described above, the continuity test of the conduction route from all the input terminals connected to the line corresponding part of SW-OUT to all the output terminals connected to the line corresponding part can be performed.

By executing the above-described test, all the standard conduction routes in the communication path through which the general cell passes can be tested. It is also possible to send an arbitrary plurality of test cells to each conduction route, and it is also possible to individually set the number of cells to be transmitted for each conduction route.

By the way, in FIG. 4, SW-IN has M
There are × N conduction routes. Further, if the number of types of test cells (the number of types of cell headers) that the in-communication-path continuity test circuit 4 can send at one time is k, it is possible to simultaneously test k conduction routes. Therefore, a second embodiment is conceivable in which a continuity test is performed on k conduction routes at the same time. k
In the case of <M, if the quotient of M / k is a, in the present embodiment,
The header conversion table of the a × k line corresponding units is set at once by the control unit 6. In the header conversion table of each line corresponding part, a number indicating the line corresponding part to be the destination is set modulo N. For example, in the first cycle, the first line interface (line interface 1 ₁ ) to (a ×
Destinations are sequentially set by modulo N in the header conversion tables of the a × k line corresponding parts up to the k) th line corresponding part. If M = 64 and k = 10, then a is 6, and in that case, the destination is set in the header conversion tables of the line corresponding units 1 ₁ to 1 ₆₀ .

In the second cycle, the (a × k + 1) th to Mth line corresponding parts and the first to (2a × k−)
In each of the header conversion tables of the M) -th line interface, the modulo N following the destination set in the first cycle
Destinations are set in order. For example, M = 64, k =
10, in the case of a = 6, the line interface 1 _{61-1 64,} 1 ₁
The destination is set in the header conversion table of ~ ₁₅₆ .

Similarly, [(M × N) / (a ×
k)] In the cycles up to the cycle, the destination is set in the header conversion table. When k ≧ M, each cycle is configured with M line corresponding units as one unit. The header conversion table of the line interface is SW
On the output side of -OUT, the test cell is first set to be returned to the communication path continuity test circuit 4, and then SW-I
It will be fixed until the test for N is completed.

In each cycle, when the header conversion table is set, the intra-channel communication test circuit 4 simultaneously sends out k test cells to the line interface. Next, the destination is changed and k test cells are simultaneously sent to the line interface. This process of sending k test cells is repeated a times in one cycle. Note that the test cell is handled only by each line corresponding part for which the header conversion table is set in the cycle. In this way, the one-cycle continuity test in units of a × k line corresponding units is completed.

Then, the same procedure is followed [[M × N) / (a ×
k)] A cycle continuity test is performed. In the final cycle, the fraction [(M × N) − (a × k) × ((M × N)
/ (Axk))] continuity test is executed. As described above, the continuity test of M × N conduction routes is completed.

According to this embodiment, the number of commands issued from the control unit 6 for setting the header conversion table is reduced, the time required for setting the header conversion table is shortened as a whole, and the efficiency of the continuity test is improved. improves. At the same time, since the line corresponding part selected from the line corresponding parts circulates at (modulo N), it is possible to avoid concentration of test cells at a particular terminal on the output side of SW-IN at one time. That is, SW-I
It is possible to suppress the influence of the traffic increase due to the test cell on N.

The test of N × M conduction routes relating to SW-OUT is also realized by exchanging M and N in the above description. Next, the operation of the speech path continuity test apparatus according to the third embodiment of the present invention will be described. The communication path continuity test apparatus according to the present embodiment uses one or a small number of test cells, though a plurality of test cells are set, by setting a test route in which the same test cell continuously passes through a plurality of line corresponding units. This is to test all the line-corresponding parts existing in the communication path.

# 1 The number of lines in the line interface 1 is M, #
When the number of lines in the two-line support unit 2 is N, M = N
In the case of, the processing as shown in FIG. 6 is possible. That is, after the setting processing such as setting the destination of the test cell transmitted by the line corresponding unit in the header conversion table is performed for each line corresponding unit, the communication path continuity test circuit 4 switches the SW-O
The test cell is sent to the line interface 1 ₁ via the UT. Hereinafter, the line interface 1 _m (1 ≦ m ≦ M) sends out the test cell arriving at the line interface 2 _m via SW-IN. The line interface 2 _n (1 ≦ n ≦ N−1) sends out the test cell that has arrived at the line interface 1 _{(n + 1)} via SW-OUT. Finally,
The line interface 2 _N sends the arrived test cell to the intra-channel communication test circuit 4.

By the above operation, the test cells sent from the in-communication-path continuity test circuit 4 circulate through all the line corresponding parts, and one test cell can conduct the continuity test for all the line corresponding parts. When a defect is found by this test, for example, the test according to the first embodiment or the test according to the second embodiment is performed, and the defective portion is separated. Although the case where the test cell is first sent to the line interface 1 ₁ via SW-OUT has been described here, the test cell is first sent to the line interface 2 ₁ via SW-IN. It is also possible to do so. In that case, finally, the communication path continuity test circuit 4 recovers the test cell from the line interface 1 _M.

Next, a test method in the case of M> N will be described with reference to FIG. When the quotient of M / N is a and the remainder is b, each line corresponding part 1 ₁ to 1 of # 1 line corresponding part 1
_M is divided into a group of N line corresponding parts and one group of the remaining b line corresponding parts (when b = 0, this group does not exist).

The in-traffic-channel continuity test circuit 4 sends a test cell to the first line interface for a certain group. Then, in the same way as the processing as described above,
The test cell is circulated to all the line corresponding parts in the group. This processing is executed for the (a + 1) group, that is, for (a + 1) cycles.

In this case, in the kth cycle, (1≤
k ≦ a), the test cell is the line corresponding part 1 _m (kN + 1 ≦ m)
≤kN + N) to line _interface 2 _(m-kN) , and line interface 2 _n (1≤n≤N-1) to line _interface 1 _{(n + kN + 1)}
Sent to. Finally, the communication path continuity test circuit 4 collects the test cell from the line interface 2 _N. For b groups of the line interface of the last cycle, the continuity test is performed using the # 2 line corresponding unit 2 of the line interface unit 2 ₁ to 2 _b. As described above, the continuity test can be performed on all the circuit corresponding parts by (a + 1) test cells.

In FIG. 7, the route indicated by indicates a part of the test route in the first cycle.
The route indicated by indicates a part of the test route in the second cycle. And the route indicated by is the (a
A part of the test route in the +1) cycle is shown. However, when b = 0, there is no (a + 1) th cycle, so there is no route indicated by.

In this case, it is possible to collectively set the header conversion tables and the like of the line corresponding units 1 ₁ to 1 _M of the # 1 line corresponding unit 1 prior to a series of tests. However, the setting of the line corresponding units 2 ₁ to 2 _N of the # 2 line corresponding unit 2 needs to be performed at the beginning of each cycle for each cycle. In the present embodiment, the case where the in-traffic-channel continuity test circuit 4 collects the test cells for each cycle has been described. However, the loopback test mechanism for the line corresponding units 2 ₁ to 2 _N of the # 2 line corresponding unit 2 By performing the setting of the header conversion table in synchronization with the passage of the test cell, the continuity test of all cycles can be continuously executed by one test cell.

In the case of M <N, when the quotient of N / M is a and the remainder is b, each line corresponding part 2 _{1 of} # 2 line corresponding part 2
.About.2 _N are grouped into each group of a pieces and one group of remaining b pieces of line corresponding parts (when b = 0, this group does not exist). Then, by reversing the relationship between the # 1 line corresponding unit 1 and the # 2 line corresponding unit 2 from the case shown in FIG. 7 and conducting a continuity test of (a + 1) cycles, again (a + 1) test cells are obtained. Thus, the continuity test can be performed on all the line corresponding parts. Note that FIG.
Also in, the route indicated by indicates a part of the test route in the first cycle. The route indicated by
Part of the test route in the second cycle is shown. The route indicated by indicates a part of the test route in the (a + 1) th cycle. However, when b = 0, there is no (a + 1) th cycle, so there is no route indicated by.

As a test route of the continuity test in the speech path, in addition to the route shown in the first embodiment, an individual route passing only one line corresponding part and a switch part is also necessary. 9 to 12 are for explaining the continuity test for individually testing a specific portion in the speech path by the shortest test route.

As shown in FIG. 9, the communication path continuity test circuit 4 sends a test cell to the line interface 1 ₁ via SW-OUT. Line interface 1 _1, by the folding mechanism, folding the arriving test cell. The folded back test cell is transferred to the in-communication path continuity test circuit 4 via SW-IN. The communication path continuity test circuit 4 inputs the transferred test cell. Then, the test cell collection unit 42 of the in-communication-path continuity test circuit 4 collects the arrived test cells. The test cell matching unit 43 counts the number of bit errors and the number of lost cells in the collected test cells. Depending on the counting result,
You can see if the line interface 1 ₁ is normal.

The in-communication-path continuity test circuit 4 selects the line corresponding units 1 ₂ to 1 _M as the destinations of the test cells to check whether the other line corresponding units in the # 1 line corresponding unit 1 are normal. To be done. As described above, the continuity test for the specific line interface in the # 1 line interface 1 can be performed.

As shown in FIG. 10, if the test cell is transmitted via the SW-IN, the test cell is transferred to the # 2 line interface 2. # 2 when the test cell arrived here
The line corresponding part of the line corresponding part 2 returns the test cell. The folded back test cell is transferred to the communication path continuity test circuit 4 via SW-OUT. Therefore, the test cell collation unit 43 of the in-communication-path continuity test circuit 4 performs a predetermined count, so that the continuity test can be performed for a specific line corresponding unit in the # 2 line corresponding unit 2.

FIG. 11 shows a case where a continuity test of only the SW-OUT of the switch section 31 is performed. In that case,
The intra-communication-path continuity test circuit 4 sends to SW-OUT a test cell having a cell header and a routing tag for selecting the output side terminal to which the intra-communication line continuity test circuit 4 is connected. The switch unit 31 distributes the test cell to the output side terminal to which the in-communication-path continuity test circuit 4 is connected by the cell header and the routing tag. Therefore, the test cell is connected from the SW-OUT output side terminal to the communication path continuity test circuit 4
Will be collected. Then, the test cell matching unit 43 of the in-communication-path continuity test circuit 4 performs the above-described counting, so that the continuity test of only the SW-OUT of the switch unit 31 can be performed.

FIG. 12 shows a case where a continuity test is performed only on the SW-IN of the switch section 31. In that case,
The in-communication-path continuity test circuit 4 sends to SW-IN a test cell having a cell header and a routing tag for selecting the output side terminal to which the in-communication line continuity test circuit 4 is connected. Therefore, the test cell is recovered from the SW-IN output side terminal to the communication path continuity test circuit 4. Then, the test cell collation unit 43 of the in-communication-path continuity test circuit 4 performs a predetermined count, so that the continuity test of only the SW-IN of the switch unit 31 can be performed.

[0047]

As described above, according to the present invention,
The speech path continuity test device collects the test cell that sends out the test cell to the switch section at an arbitrary speed, the test cell collection section that collects the test cell folded back at the line corresponding section in the speech path, and the collected Since the configuration is provided with the test cell collating unit for inspecting the test cell, there is an effect that it is possible to provide a test which can perform a continuity test at a variable speed and during service provision. Moreover, not only the standard route but also the one capable of individually testing a specific part in the communication path can be provided.

[Brief description of drawings]

FIG. 1 is a configuration diagram showing a test configuration when performing a communication path continuity test according to the present invention.

FIG. 2 is a configuration diagram showing another test configuration when performing a speech path continuity test according to the present invention.

FIG. 3 is a block diagram showing a configuration example of a communication path continuity test circuit.

FIG. 4 is an explanatory diagram showing a test route when conducting a conduction route test in SW-IN.

FIG. 5 is an explanatory diagram showing a test route when conducting a conduction route test in SW-OUT.

FIG. 6 is an explanatory diagram showing a test route in the third embodiment when M = N.

FIG. 7 is an explanatory diagram showing a test route in the third embodiment when M ≧ N.

FIG. 8 is an explanatory diagram showing a test route in the third embodiment when M ≦ N.

FIG. 9 is an explanatory diagram showing a test route in the case of individually testing the # 1 line corresponding unit.

FIG. 10 is an explanatory diagram showing a test route in the case of individually testing the # 2 line corresponding unit.

FIG. 11 is an explanatory diagram showing a test route in the case of individually testing SW-OUT.

FIG. 12 is an explanatory diagram showing a test route in the case of individually testing SW-IN.

FIG. 13 is a block diagram showing a connection relationship at the time of a test by a conventional speech path continuity test device.

FIG. 14 is a block diagram showing a connection relationship during a conventional pilot test.

[Explanation of symbols]

1 ₁ to 1 _M line support part 2 ₁ to 2 _N line support part 31, 32 switch part 4 communication path continuity test circuit 6 control part

 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Kenji Miyabo 1-1-6 Uchisaiwaicho, Chiyoda-ku, Tokyo Nihon Telegraph and Telephone Corporation

Claims (1)

[Claims] 1. A speech path continuity test device for conducting a continuity test in a speech path of an ATM switching system having a switch part and respective line corresponding parts connected to the switch part and including a folding mechanism and a header conversion circuit. , A test cell generating unit for generating a test cell having a cell header and a routing tag and outputting the test cell to the switch unit at an arbitrary speed, and a test cell for recovering the test cell returned at the line corresponding unit in the communication path A communication path continuity test device comprising a collecting unit and a test cell collating unit that inspects the collected test cells.