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JPH06224469A - Semiconductor light emitting device - Google Patents

Semiconductor light emitting device

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Publication number
JPH06224469A
JPH06224469A JP3138893A JP3138893A JPH06224469A JP H06224469 A JPH06224469 A JP H06224469A JP 3138893 A JP3138893 A JP 3138893A JP 3138893 A JP3138893 A JP 3138893A JP H06224469 A JPH06224469 A JP H06224469A
Authority
JP
Japan
Prior art keywords
light emitting
emitting device
led
semiconductor light
leds
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3138893A
Other languages
Japanese (ja)
Inventor
Akihiro Osaki
哲広 大崎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kyocera Corp
Original Assignee
Kyocera Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kyocera Corp filed Critical Kyocera Corp
Priority to JP3138893A priority Critical patent/JPH06224469A/en
Publication of JPH06224469A publication Critical patent/JPH06224469A/en
Pending legal-status Critical Current

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Abstract

(57)【要約】 【構成】 基板1上にLED5のアレイを備え、相隣接
するLED5の間に各LED5の側面から出る光の反射
壁10が設けられている。各LED5の側面から発する
光は反射壁10において反射するため、隣接するLED
5において反射することはない。 【効果】 例えば電子写真用感光ドラムの露光用光源に
利用した場合には画像の滲みを防止してシャープな画像
を得ることができ、光の利用効率が上がり光量が増大す
る。
(57) [Summary] [Structure] An array of LEDs 5 is provided on a substrate 1, and a reflection wall 10 for reflecting light emitted from the side surface of each LED 5 is provided between adjacent LEDs 5. Since the light emitted from the side surface of each LED 5 is reflected by the reflection wall 10, the adjacent LEDs
There is no reflection at 5. [Effect] For example, when it is used as a light source for exposure of an electrophotographic photosensitive drum, blurring of an image can be prevented and a sharp image can be obtained, and the light utilization efficiency is increased and the light amount is increased.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、基板上にLEDアレイ
を備えた半導体発光装置に関し、例えばページプリンタ
の感光ドラムの露光用光源として用いられる。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor light emitting device having an LED array on a substrate, and is used as a light source for exposing a photosensitive drum of a page printer, for example.

【0002】[0002]

【従来の技術】図8に示すような基板100上にLED
101のアレイを備えた半導体発光装置を、例えばペー
ジプリンタの感光ドラムの露光用光源として用い、各L
ED101の図において上方側の発光面101aから図
中実線矢印で示すように発する光によって、感光ドラム
上に各LED101に対応するドットを潜像として形成
することが提案されている。
2. Description of the Related Art LEDs on a substrate 100 as shown in FIG.
A semiconductor light emitting device having an array of 101 is used as a light source for exposing a photosensitive drum of a page printer, and each L
It has been proposed to form a dot corresponding to each LED 101 as a latent image on the photosensitive drum by light emitted from the light emitting surface 101a on the upper side in the figure of the ED 101 as shown by the solid line arrow in the figure.

【0003】[0003]

【発明が解決しようとする課題】しかし、各LED10
1からは発光面101aからだけでなく側面101bか
らも図中破線矢印で示すように光が発せられ、その光は
隣接するLED101の側面101bにおいて反射す
る。そのため、例えば図において中央のLED101の
みしか発光していない場合でも、その両隣のLED10
1の端部までもが発光したように見え、感光ドラム上に
潜像として形成されるドットの輪郭が不明瞭になって電
子写真画像の滲みの原因になる。また、各LED101
から発する光の利用効率が低いという問題がある。
However, each LED 10
Light is emitted from No. 1 not only from the light emitting surface 101a but also from the side surface 101b as indicated by a dashed arrow in the figure, and the light is reflected by the side surface 101b of the adjacent LED 101. Therefore, for example, even if only the central LED 101 in the drawing emits light, the LEDs 10 on both sides of the LED 10
It seems that even the end portion of 1 emits light, and the outline of dots formed as a latent image on the photosensitive drum becomes unclear, which causes blurring of the electrophotographic image. In addition, each LED 101
There is a problem that the utilization efficiency of the light emitted from is low.

【0004】本発明は、上記従来技術の問題を解決する
ことのできる半導体発光装置を提供することを目的とす
る。
It is an object of the present invention to provide a semiconductor light emitting device which can solve the above problems of the prior art.

【0005】[0005]

【課題を解決するための手段】本発明は、基板上にLE
Dアレイを備えた半導体発光装置において、相隣接する
LEDの間に各LEDの側面から出る光の反射壁が設け
られていることを特徴とするものである。
SUMMARY OF THE INVENTION The present invention provides LE on a substrate.
A semiconductor light emitting device including a D array is characterized in that a reflection wall for light emitted from a side surface of each LED is provided between adjacent LEDs.

【0006】[0006]

【作用】本発明の構成によれば、各LEDの側面から発
する光は、隣接するLEDとの間に設けられた反射壁に
おいて反射するため隣接するLEDにおいて反射するこ
とはない。
According to the structure of the present invention, the light emitted from the side surface of each LED is reflected by the reflection wall provided between the adjacent LEDs and is not reflected by the adjacent LEDs.

【0007】[0007]

【実施例】以下、図面を参照して本発明の実施例を説明
する。
Embodiments of the present invention will be described below with reference to the drawings.

【0008】図2に示す半導体発光装置4は、シリコン
基板1の一方の主面側に列をなして形成された複数のメ
サ形状のLED5のアレイと、各LED5の隣接間に形
成された反射壁10とを備えている。
The semiconductor light emitting device 4 shown in FIG. 2 has an array of a plurality of mesa-shaped LEDs 5 formed in rows on one main surface side of the silicon substrate 1 and reflections formed between adjacent LEDs 5. And a wall 10.

【0009】その半導体発光装置4の製造方法を図3〜
図7に基づいて説明する。
A method of manufacturing the semiconductor light emitting device 4 will be described with reference to FIGS.
It will be described with reference to FIG.

【0010】まず、図3に示すようにシリコン基板1の
一方の主面1aと他方の主面1bの全面に、酸化シリコ
ン膜2a、2bを熱酸化法により形成する。例えば、シ
リコン基板1を1100℃〜1150℃の酸素(O2
雰囲気中において約60分間酸化処理することで、厚さ
1500Å〜10000Åの酸化シリコン膜2a、2b
を形成する。
First, as shown in FIG. 3, silicon oxide films 2a and 2b are formed on the entire surface of one main surface 1a and the other main surface 1b of a silicon substrate 1 by a thermal oxidation method. For example, the silicon substrate 1 may be oxygen (O 2 ) at 1100 ° C to 1150 ° C.
By oxidizing in an atmosphere for about 60 minutes, the silicon oxide films 2a and 2b having a thickness of 1500Å to 10000Å
To form.

【0011】次に、図4に示すようにシリコン基板1の
一方の主面1aに形成された酸化シリコン膜2aの一部
をフォトリソグラフィーにより帯状に除去することで、
その一方の主面1aに形成された酸化シリコン膜2aを
絶縁マスクとする。
Next, as shown in FIG. 4, a part of the silicon oxide film 2a formed on the one main surface 1a of the silicon substrate 1 is removed by photolithography into a strip shape.
The silicon oxide film 2a formed on the one main surface 1a is used as an insulating mask.

【0012】次に、そのマスク2aにより選択された帯
状のシリコン基板部分に、図5に示すようにIII −V族
やII−VI族の半導体結晶を、例えば有機金属気相エピタ
キシー(MOCVD)や分子線エピタキシー(MBE)
を用い成長させてエピタキシャル層3を形成する。その
エピタキシャル層3は、例えばガリウム砒素(GaA
s)、ガリウム砒素リン(GaAsP)、ガリウムリン
(GaP)等の成長層であるバッファー層3aと、ガリ
ウム砒素、アルミニウムガリウム砒素(AlGaA
s)、インジウムガリウム砒素(InGaAs)、ガリ
ウム砒素リン等の成長層であるn形半導体層3b、p形
半導体層3cおよび高濃度にドープされたp+形半導体
層3dとで構成する。
Next, as shown in FIG. 5, a semiconductor crystal of III-V group or II-VI group is formed on the strip-shaped silicon substrate portion selected by the mask 2a, for example, metal organic vapor phase epitaxy (MOCVD) or Molecular beam epitaxy (MBE)
To grow the epitaxial layer 3. The epitaxial layer 3 is made of, for example, gallium arsenide (GaA).
s), gallium arsenide phosphide (GaAsP), gallium phosphide (GaP), and other buffer layers 3a, and gallium arsenide and aluminum gallium arsenide (AlGaA).
s), indium gallium arsenide (InGaAs), gallium arsenide phosphide, and the like, which are n-type semiconductor layers 3b, p-type semiconductor layers 3c, and heavily-doped p + -type semiconductor layers 3d.

【0013】次に、その帯状に成長したエピタキシャル
層3をLED5になる部分と反射壁10になる部分とを
残して除去するため、図6の(1)に示すようにLED
5に対応する部分と反射壁10に対応する部分とにレジ
スト11を形成し、しかる後に図6の(2)に示すよう
にエッチングを行ない、次に、図6の(3)に示すよう
にレジスト11を除去する。なお、エッチングは深さ方
向だけでなく横方向にも進行するためレジスト11の幅
はエッチング深さの2倍以上とする。エッチング液は一
般的な硫酸、過酸化水素および水を混合したものを用い
ることができる。なお、面方位によりエッチングレート
が相違することに基づき、互いに対向するLED5の上
部側面は逆メサ部5′となっている。
Next, in order to remove the epitaxial layer 3 that has grown in the shape of a strip, leaving a portion that will become the LED 5 and a portion that will become the reflection wall 10, as shown in FIG.
5, a resist 11 is formed on a portion corresponding to 5 and a portion corresponding to the reflection wall 10, and thereafter, etching is performed as shown in (2) of FIG. 6, and then, as shown in (3) of FIG. The resist 11 is removed. Since the etching progresses not only in the depth direction but also in the lateral direction, the width of the resist 11 is at least twice the etching depth. As the etching liquid, a mixture of general sulfuric acid, hydrogen peroxide and water can be used. Since the etching rate differs depending on the plane orientation, the upper side surfaces of the LEDs 5 facing each other are reverse mesa portions 5 '.

【0014】次に、図7に示すようにLED5を保護膜
9により覆い、p+ 形半導体層3dと基板1の他方の主
面1bとに電極6a、6bを接続する。その電極6a、
6bは例えばクロム金(CrAu)を用いる。なお、各
LED5は例えば60μm×50μm程度の平面視矩形
のメサ形状とし、84μm程度のピッチで配置すると共
に、そのピッチ間中央に反射壁10を位置させる。
Next, as shown in FIG. 7, the LED 5 is covered with a protective film 9, and electrodes 6a and 6b are connected to the p + type semiconductor layer 3d and the other main surface 1b of the substrate 1. The electrode 6a,
For 6b, for example, chrome gold (CrAu) is used. Each LED 5 has, for example, a mesa shape with a rectangular shape in plan view of about 60 μm × 50 μm, is arranged at a pitch of about 84 μm, and the reflection wall 10 is positioned at the center between the pitches.

【0015】上記構成によれば、図1に示すように、各
LED5の側面5bから発する光は図中破線矢印で示す
ように反射壁10において反射するため、隣接するLE
D5において反射することはなく、各LED5の図にお
いて上方側の発光面5aから図中実線矢印で示すように
発する光と共に利用することが可能になる。
According to the above structure, as shown in FIG. 1, the light emitted from the side surface 5b of each LED 5 is reflected by the reflection wall 10 as indicated by the broken line arrow in the figure, so that the adjacent LEs are adjacent to each other.
It does not reflect at D5, and can be used together with the light emitted from the light emitting surface 5a on the upper side of each LED 5 in the figure as indicated by the solid line arrow in the figure.

【0016】なお、本発明は上記実施例に限定されるも
のではない。例えば、基板はシリンコンに限定されずG
aAs等を用いてもよい。また、反射壁10に反射率の
大きい金属等を蒸着してもよい。
The present invention is not limited to the above embodiment. For example, the substrate is not limited to SILICON
You may use aAs etc. Further, a metal having a high reflectance may be vapor-deposited on the reflection wall 10.

【0017】[0017]

【発明の効果】本発明の半導体発光装置によれば、各L
EDの発する光が隣接するLEDにおいて反射するのを
防止して各発光領域を絞ることができるので、例えば電
子写真用感光ドラムの露光用光源として利用した場合に
は画像の滲みを防止してシャープな画像を得ることがで
き、また、光の利用効率が上がり光量が増大する。
According to the semiconductor light emitting device of the present invention, each L
Since it is possible to prevent the light emitted from the ED from being reflected by the adjacent LED and narrow down each light emitting region, for example, when it is used as an exposure light source of an electrophotographic photosensitive drum, blurring of an image is prevented and sharpness is reduced. It is possible to obtain a clear image, and the light utilization efficiency is increased, and the light amount is increased.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施例の半導体発光装置の構成説明図FIG. 1 is a structural explanatory view of a semiconductor light emitting device according to an embodiment of the present invention.

【図2】本発明の実施例の半導体発光装置の斜視図FIG. 2 is a perspective view of a semiconductor light emitting device according to an embodiment of the present invention.

【図3】本発明の実施例の半導体発光装置の製造の第1
工程の説明図
FIG. 3 is a first process for manufacturing a semiconductor light emitting device according to an embodiment of the present invention.
Illustration of process

【図4】本発明の実施例の半導体発光装置の製造用絶縁
マスクの平面図
FIG. 4 is a plan view of an insulating mask for manufacturing a semiconductor light emitting device according to an embodiment of the present invention.

【図5】本発明の実施例の半導体発光装置の製造途中で
の断面図
FIG. 5 is a sectional view of the semiconductor light emitting device according to the embodiment of the present invention during manufacture.

【図6】本発明の実施例の半導体発光装置のエッチング
工程の説明図
FIG. 6 is an explanatory diagram of an etching process of a semiconductor light emitting device according to an embodiment of the present invention.

【図7】本発明の実施例の半導体発光装置の断面構成を
示す図
FIG. 7 is a diagram showing a cross-sectional structure of a semiconductor light emitting device according to an embodiment of the present invention.

【図8】従来の半導体発光装置の構成説明図FIG. 8 is a structural explanatory view of a conventional semiconductor light emitting device.

【符号の説明】[Explanation of symbols]

1 基板 5 LED 10 反射壁 1 substrate 5 LED 10 reflective wall

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 基板上にLEDアレイを備え、相隣接す
るLEDの間に各LEDの側面から出る光の反射壁が設
けられている半導体発光装置。
1. A semiconductor light-emitting device comprising an LED array on a substrate, wherein reflective walls for light emitted from the side surface of each LED are provided between adjacent LEDs.
JP3138893A 1993-01-26 1993-01-26 Semiconductor light emitting device Pending JPH06224469A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3138893A JPH06224469A (en) 1993-01-26 1993-01-26 Semiconductor light emitting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3138893A JPH06224469A (en) 1993-01-26 1993-01-26 Semiconductor light emitting device

Publications (1)

Publication Number Publication Date
JPH06224469A true JPH06224469A (en) 1994-08-12

Family

ID=12329881

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3138893A Pending JPH06224469A (en) 1993-01-26 1993-01-26 Semiconductor light emitting device

Country Status (1)

Country Link
JP (1) JPH06224469A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002015287A1 (en) * 2000-08-11 2002-02-21 Osram Opto Semiconductors Gmbh Radiation-emitting semiconductor chip and luminescent diode
JP2005277152A (en) * 2004-03-25 2005-10-06 Daido Steel Co Ltd Point light source light emitting diode and its manufacturing method
JP2006245380A (en) * 2005-03-04 2006-09-14 Toshiba Corp Semiconductor light emitting device and method for manufacturing semiconductor light emitting device
JP2008124372A (en) * 2006-11-15 2008-05-29 Fuji Xerox Co Ltd Led array, led array head and image recording apparatus
WO2014087938A1 (en) * 2012-12-03 2014-06-12 シチズンホールディングス株式会社 Led module
FR3087580A1 (en) * 2018-10-23 2020-04-24 Aledia METHOD FOR PRODUCING AN OPTOELECTRONIC DEVICE COMPRISING HOMOGENEOUS LIGHT-EMITTING LIGHT-EMITTING DIODES
WO2024024239A1 (en) * 2022-07-28 2024-02-01 株式会社ジャパンディスプレイ Display device and method for manufacturing same

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002015287A1 (en) * 2000-08-11 2002-02-21 Osram Opto Semiconductors Gmbh Radiation-emitting semiconductor chip and luminescent diode
US6891199B2 (en) 2000-08-11 2005-05-10 Osram Gmbh Radiation-emitting semiconductor chip and light-emitting diode
JP2005277152A (en) * 2004-03-25 2005-10-06 Daido Steel Co Ltd Point light source light emitting diode and its manufacturing method
JP2006245380A (en) * 2005-03-04 2006-09-14 Toshiba Corp Semiconductor light emitting device and method for manufacturing semiconductor light emitting device
JP2008124372A (en) * 2006-11-15 2008-05-29 Fuji Xerox Co Ltd Led array, led array head and image recording apparatus
WO2014087938A1 (en) * 2012-12-03 2014-06-12 シチズンホールディングス株式会社 Led module
JP5634647B1 (en) * 2012-12-03 2014-12-03 シチズンホールディングス株式会社 LED module
US9810381B2 (en) 2012-12-03 2017-11-07 Citizen Watch Co., Ltd. LED module
FR3087580A1 (en) * 2018-10-23 2020-04-24 Aledia METHOD FOR PRODUCING AN OPTOELECTRONIC DEVICE COMPRISING HOMOGENEOUS LIGHT-EMITTING LIGHT-EMITTING DIODES
WO2020084226A1 (en) * 2018-10-23 2020-04-30 Aledia Method for producing an optoelectronic device comprising multi-dimensional homogenous light-emitting diodes
US11894413B2 (en) 2018-10-23 2024-02-06 Aledia Method for producing an optoelectronic device comprising light-emitting diodes which are homogeneous in dimensions
WO2024024239A1 (en) * 2022-07-28 2024-02-01 株式会社ジャパンディスプレイ Display device and method for manufacturing same

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