JPH06215058A - Measuring circuit designing device for multi-terminal device - Google Patents

Abstract

PURPOSE:To provide a measuring circuit designing device for the multi-terminal device which can greatly be decreased in design man-hours and immediately cope with a change of a tester in use. CONSTITUTION:This device has a knowledge base part 6 which has knowledge base files 71, 72... to be applied to testers of respective makers and also has a knowledge base file 8 wherein measuring methods are described; when an IC characteristic measuring circuit is represented with signal sources, detectors, etc., having ideal characteristics and inputted from an input part 1, a measuring circuit conversion part 9 automatically converts the ideal measuring circuit into a measuring circuit which can be measured by an actually existent tester by using the knowledge base, etc., of a skilled test engineer obtained from the knowledge base part 6.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a measuring circuit design device for a multi-terminal device, and more particularly to a measuring circuit design suitable for designing a measuring circuit for measuring the characteristics of a multi-terminal device such as a semiconductor integrated circuit. Regarding the device.

[0002]

2. Description of the Related Art The characteristics of a multi-terminal device such as a semiconductor integrated circuit (IC) is measured by a dedicated tester (measuring device). The characteristics and specifications of this tester are uniform among manufacturers. The characteristics and specifications are different for each manufacturer. Therefore, when measuring the characteristics of the IC, by designing a measurement circuit that conforms to the characteristics and specifications of the tester to be used and interposing this measurement circuit with the tester, I
This makes it possible to measure the characteristics of C.

[0003]

Conventionally, an engineer (hereinafter referred to as a test engineer) who specializes in designing the measurement circuit designs the measurement circuit based on a specification written by an IC designer. . However, the test engineer needs to be familiar with the specifications and characteristics of each tester used, and it takes many years for the skill, and the human resources of the test engineer itself are scarce, and the number of new ICs increasing year by year. The current situation is that the number of designs cannot be met.

The present invention has been made in view of the above problems, and an object of the present invention is to reduce the design man-hours significantly and to quickly respond even if the tester used is changed. To provide a measuring circuit designing device.

[0005]

In order to achieve the above object, a measuring circuit designing apparatus according to the present invention has an input section for inputting data of an ideal measuring circuit and data of the ideal measuring circuit input from this input section. Of the ideal measurement circuit written in the storage unit, the knowledge base unit including the knowledge base that describes the knowledge base and the measurement method for supporting the tester of each maker, and the data of the ideal measurement circuit written in the storage unit. The measurement circuit conversion unit is configured to convert the data of the actual measurement circuit to be actually used for characteristic measurement based on each knowledge base and write the data in the storage unit.

[0006]

When a characteristic measuring circuit of a multi-terminal device such as an IC is expressed by a signal source or detector having ideal characteristics and input, the ideal measuring circuit can be learned by a skilled test engineer. It is automatically converted into a measurement circuit that can be measured by an existing tester using a base. According to this, since the test engineer does not need to intervene in the conversion to the actual coordinate circuit, the design man-hour can be greatly reduced and the tester to be used can be promptly dealt with.

[0007]

Embodiments of the present invention will now be described in detail with reference to the drawings. FIG. 1 is a system conceptual diagram showing an embodiment of the present invention. In FIG. 1, an input unit 1 such as a keyboard
From the ideal signal source and ideal detector by the circuit designer,
Alternatively, data on peripheral components having ideal characteristics are input as data of the ideal measurement circuit. The data of this ideal measurement circuit is stored in the storage device 3 by the input / output device 2.
Is written in a predetermined area of. With respect to the data of the ideal measurement circuit written in the storage device 3, it is displayed on the display 5 using the circuit simulator 4 whether the description is correct.
If it is incorrect, it can be corrected by using the input unit 1 and the input / output device 2.

The knowledge base unit 6 includes a tester knowledge base file 7 ₁ , 7 ₂ , ... For supporting testers of one or a plurality of makers, and a measurement know-how knowledge base file 8 describing a measurement method. have. Tester knowledge base file 7 _1, 7 _2, the ...., knowledge base are stored regarding the specifications and characteristics of the tester of each manufacturer. Then, the knowledge base file corresponding to the tester actually used for measurement is specified by the test engineer in the input unit 1. On the other hand, the measurement know-how knowledge base file 8 stores a knowledge base concerning know-how of a skilled test engineer such as how much the gain of the amplifier should be set for a certain signal level. This know-how can be held for each tester used for measurement.

The measurement circuit conversion unit 9 converts the data of the ideal measurement circuit described in the data about the ideal signal source, the detector and the peripheral parts and written in the storage device 3 into the knowledge base files 7 ₁ and 7 for the tester. ₂ , ... and measurement know-how Based on each knowledge base of the knowledge base file 8, it is converted into the data of the tester measurement circuit that can be measured by the tester actually used for the characteristic measurement. The data of this tester measurement circuit is
It is written in a predetermined area of the storage device 3. For the actual tester measurement circuit, see the circuit simulator 4
You can check the operation using.

Next, regarding the actual design of the measurement circuit by the measurement circuit designing apparatus having the above-mentioned structure, for example, an IC with 6 pins is used.
An example will be described where the characteristic of is measured. First, as shown in FIG. 2, a circuit designer uses an ideal signal source 12, an ideal voltage source 13, an ideal detector 14, and peripheral components R ₁ having ideal characteristics to measure a characteristic of the IC under test 11, as shown in FIG.
Expressed as R ₂ , C ₁ , C _2, etc., and input from the input unit 1,
The data regarding this ideal circuit is written into the storage device 3 via the input / output device 2. Then, the test engineer specifies the tester knowledge base files 7 ₁ , 7 ₂ , ... Corresponding to the tester actually used for the characteristic measurement by the input unit 1.

The measurement circuit conversion unit 9 is based on a knowledge base such as a signal level, a signal waveform, and a signal frequency obtained from a corresponding knowledge base file, and further, know-how of a skilled test engineer obtained from a measurement know-how knowledge base file 8. As shown in FIG. 3, the peripheral circuit necessary for actually performing the measurement such as inserting the amplifier 15 or the attenuator 16 and the capacitor C ₃ is automatically provided between the tester and the IC 11 to be measured. In addition, the IC 11 to be measured is automatically converted into a measurement circuit that can be measured by a tester actually used. At this time, the peripheral components (R ₁ , R ₂ , C ₁ , C ₂ ) that do not need to be converted remain as they are without conversion.

As described above, the tester knowledge base files 7 ₁ , 7 ₂ , ... For dealing with the testers of the respective manufacturers and the measurement know-how knowledge base file 8 in which the know-how of the experienced test engineer is described are prepared. If the measurement specifications are described by the ideal signal source 12, the ideal voltage source 12, the ideal detector 14, and the ideal peripheral components R ₁ , R ₂ , C ₁ , and C ₂ that are easily understood by the circuit designer, So good
The contents of measurement can be easily described.

Further, since circuit simulation can be performed by using the circuit simulator 4, it is possible to easily find a description error in specifications. Further, since conversion to an actual measurement circuit does not require the intervention of a test engineer, the number of man-hours required for design can be significantly reduced. Furthermore, since the circuit can be converted into several kinds of testers only by creating a knowledge base, even if the tester used is changed due to the production line, it can be dealt with quickly.

By the way, since measurement circuits having different circuit configurations are used for measurement of IC characteristics, it is necessary to combine several hundreds of measurement circuits for each measurement item into one comprehensive measurement circuit. There is. Another embodiment of the present invention for that purpose is shown in FIG. In FIG. 4, from the input unit 1,
Data regarding the measurement circuits 1 to N for each measurement item is input as data of the ideal measurement circuit, and the netlist is created in the storage device 3. Based on these netlists, the circuit synthesizing unit 17 sets one measurement circuit for each measurement item.
The process of combining the two integrated measurement circuits is performed.

That is, the circuit synthesizing unit 17 includes the storage device 3
The net list of the measurement circuit written for each measurement item is read for the number of items you want to measure, and based on the read net list of multiple measurement circuits, it is combined into one ideal total measurement circuit and the net list is output. Along with
A relay condition file for making an equivalent circuit for each measurement item is created by the relays included in the comprehensive measurement circuit, and stored in the storage device 3. Based on the net list of the total measurement circuit and the relay condition file stored in the storage device 3, the operator should drive one circuit diagram satisfying the contents of each input measurement circuit and which relay should be driven for each test. You can know.

Next, in the circuit synthesizing section 17, as an example, the measurement circuit (a) for each of the measurement items 1 to 4 as shown in FIG.
(D) to (d) are combined with the total measurement circuit (a) shown in FIG. 6, and the algorithm for creating the relay condition file (b) will be described with reference to the flowcharts of FIGS. 7 and 8. It is assumed that the data regarding the measurement circuits for each of the hundreds of measurement items used for measuring the characteristics of the IC are input in advance and stored in the storage device 3 as a net list.

In the flowcharts of FIGS. 7 and 8,
First, the netlists of a plurality of measurement circuits to be synthesized are read from the storage device 3 (step S1), and attention is paid to one terminal A having an IC (step S2). As shown in FIG. The elements directly connected to are extracted from the netlists of the plurality of measurement circuits that have already been read (step S3). Next, the number of extracted elements is "0".
It is determined whether or not (step S4), and if it is "0", nothing is connected to the terminal A (step S5), and it is determined whether or not there is a terminal of the IC that is not circuit-synthesized. (Step S6).

Then, if any of them remains, one of the terminals of the IC which is not circuit-synthesized is selected (step S
7) Then, returning to step S3, the circuit synthesis is repeated for a new terminal A, while if there is no remaining one, the series of processing is terminated. If it is determined in step S4 that it is not "0", it is determined whether or not the same element exists among the extracted elements (step S8), and if it exists, it is shown in FIG. 9B. As described above, after consolidating the same element into one element (step S9), if not present, directly between the terminal A and the extracted elements B and C as shown in FIG. 9C, Connection is made with make relays _RL -1, _RL -2 (step S10).

Next, the switch conditions (a) of make relays R _L -1, R _L -2 shown in FIG. 10 are set so that the electrical connection state between terminal A and elements B, C becomes equivalent for each measurement item. ) Is obtained (step S11), and then it is determined whether or not there is a relay whose switch condition is ON for all measurement items (step S12). Then, if there is a relay whose switch condition is ON for all measurement items, the relay whose switch condition is all ON is changed to a direct connection, and the relay is deleted from the switch condition (a) (step S13), and then turned ON. If there is no such relay, it is directly judged whether or not there are two make relays whose switch conditions are “exclusion” in the switch conditions (a) of make relays _RL −1 and _RL −2. (Step S14).

When there are two make relays that have been rejected in the switch conditions, the relay terminals on the element side, which has the most electrically connected items, of the two corresponding relays are not connected. to the Mariofu, as shown in FIG. 9 (d), 2 two make the relay R _L -1, to change the R _L -2 to one transfer relay R _L -10, the transfer relay R _L -10 Switch condition (b) is created (step S15), the two relays converted into transfer relays are deleted from the switch condition (a) (step S16), and then the process returns to step S14.

If there are not two make relays that are rejected in the switch condition, the terminal A, the relay R _L -10 connected to it, the netlist of the elements B and C, and the switch condition of the relay ( (a) and (b) are written to the storage device 3 (step S17), and then it is determined whether or not there is a circuit branch other than the branch connected to the terminal A in the elements B and C that has not been subjected to circuit synthesis. (Step S18). If there is the above circuit branch, one of the terminals not connected to the terminal A among the terminals of the elements B and C is selected (step S19), and this is newly set as the terminal A in step S3.
Return to and repeat circuit synthesis. On the other hand, if there is no branch circuit, the process directly proceeds to step S6.

In the above embodiment, the case where the present invention is applied to the characteristic measurement of the IC has been described. However, the present invention is not limited to this, and the present invention is applied to the characteristic measurement of general multi-terminal devices other than the IC. It is possible.

[0023]

As described above, according to the present invention,
The characteristic measurement circuit of a multi-terminal device such as an IC is represented by a signal source or detector having ideal characteristics and input, and the ideal measurement circuit is stored in the knowledge base of a skilled test engineer. Since it is configured to automatically convert to a measurement circuit that can be measured by an actually existing tester, it does not require the intervention of a test engineer to perform conversion to an actual coordinate circuit, and the design man-hour can be greatly reduced. , Even if the tester to be used is changed, it can respond promptly.

[Brief description of drawings]

FIG. 1 is a system conceptual diagram showing an embodiment of the present invention.

FIG. 2 is a circuit diagram of an ideal measurement circuit before change.

FIG. 3 is a circuit diagram of a tester measurement circuit actually used after the change.

FIG. 4 is a system conceptual diagram showing another embodiment of the present invention.

FIG. 5 is a circuit diagram showing a circuit example for each measurement item before circuit synthesis.

FIG. 6 is a diagram showing an integrated measurement circuit and a relay condition file after combination.

FIG. 7 is a flowchart (No. 1) showing an algorithm of circuit synthesis.

FIG. 8 is a flowchart (part 2) showing an algorithm of circuit synthesis.

FIG. 9 is a circuit diagram showing a circuit state in each process of circuit synthesis.

FIG. 10 is a diagram showing relay conditions.

[Explanation of symbols]

1 Input Section 3 Storage Section 4 Circuit Simulator 5 Display 6 Knowledge Base Section 7 ₁ , 7 ₂ , ... Tester Knowledge Base File 8 Measurement Know-how Knowledge Base File 9 Measurement Circuit Conversion Section 17 Circuit Synthesis Section

Claims (5)

[Claims] 1. An input unit for inputting data of an ideal measurement circuit, a storage unit for storing data of the ideal measurement circuit input from the input unit, a knowledge base and a measurement for supporting a tester of each manufacturer. A knowledge base section including a knowledge base that describes the method, and an actual measurement circuit that actually uses the data of the ideal measurement circuit written in the storage section for characteristic measurement based on each knowledge base of the knowledge base section. And a measuring circuit converting unit for writing the data into the storage unit and writing the data in the storage unit. 2. The measurement circuit design apparatus for a multi-terminal device according to claim 1, further comprising a circuit simulator for confirming the operation of the actual measurement circuit based on the data stored in the storage unit. 3. A netlist of the ideal measurement circuit input from the input section for each measurement item is created and stored in the storage section, and a plurality of netlists are read from the storage section to provide a multi-terminal device. 3. The measuring circuit designing device for a multi-terminal device according to claim 1, further comprising a circuit synthesizing unit for reading an element connected to each of the terminals and synthesizing it into one integrated measuring circuit. 4. The circuit synthesizing unit arranges elements connected to each terminal of the multi-terminal device so that the same element does not overlap with the same terminal, and a make relay is interposed between the terminal and each element. 4. The measuring circuit design device for a multi-terminal device according to claim 3, wherein the on / off condition of the make relay is created for each measurement item and stored in the storage unit. 5. The multi-terminal device measurement according to claim 3, wherein the circuit synthesizing unit converts a make relay connected to the same terminal and having a switch condition of discharging to a transfer relay. Circuit design equipment.