JPH0592749U - Through-hole resistance measurement probe - Google Patents
Through-hole resistance measurement probeInfo
- Publication number
- JPH0592749U JPH0592749U JP3184092U JP3184092U JPH0592749U JP H0592749 U JPH0592749 U JP H0592749U JP 3184092 U JP3184092 U JP 3184092U JP 3184092 U JP3184092 U JP 3184092U JP H0592749 U JPH0592749 U JP H0592749U
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- Prior art keywords
- hole
- probe
- tip
- measurement
- terminal
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- Measuring Leads Or Probes (AREA)
Abstract
(57)【要約】
【目的】 プリント配線用の板には通電用のスルーホー
ルがある。このスルーホールの仕上り品質を調べる便利
な方法としてスルーホールの抵抗値を計測する方法があ
るが、普通スルーホールは数百μΩ程度の微小抵抗であ
るので4端子測定法で行う必要がある。この測定法を行
うための便利なスルーホール抵抗測定用プローブはその
先端部が円錐形凸状に出来ており、スルーホールの測定
端に当てるには便利であるが、このプローブは電流端子
と電圧端子と対等な関係で構成されているため、スルー
ホール内を流れる基準測定電流が一様に流れず、不均一
になるため測定誤差が生じる。本考案はこの測定誤差を
なくすことが目的である。
【構成】 抵抗測定用プローブの先端部の円錐形凸状の
外側部全体を電流端子1として、電圧端子2はこのプロ
ーブの円筒部の中心軸と一致するピン状導体として、こ
の円錐状先端の頂点のみで外側の電流端子と電気的接続
する。
(57) [Abstract] [Purpose] The printed wiring board has through holes for electricity. There is a method of measuring the resistance value of the through hole as a convenient method for checking the finish quality of the through hole. However, since a through hole usually has a minute resistance of about several hundred μΩ, it is necessary to perform the four-terminal measurement method. A convenient through-hole resistance measurement probe for performing this measurement method has a conical convex tip, which is convenient for applying to the measurement end of a through-hole. Since it is configured in an equal relationship with the terminals, the reference measurement current flowing in the through hole does not flow uniformly and becomes non-uniform, resulting in a measurement error. The purpose of the present invention is to eliminate this measurement error. [Structure] The entire outer portion of the conical convex shape of the tip of the resistance measuring probe is used as a current terminal 1, and the voltage terminal 2 is a pin-shaped conductor that coincides with the central axis of the cylindrical portion of the probe. Make electrical connection to the outer current terminal only at the apex.
Description
【0001】[0001]
本考案は物体特に板状の物体を貫通する穴すなわちスルーホール、通常はプリ ント板(絶縁物)に設けられた通電用の穴すなわち通常のスルーホールの電気抵 抗(単に抵抗という)値を測定するための触針すなわちプローブに関する。 The present invention determines the electric resistance (simply referred to as resistance) value of a hole that penetrates an object, particularly a plate-like object, that is, a through hole, or a hole for electricity that is usually provided in a print plate (insulator), that is, a normal through hole. It relates to a stylus or probe for measuring.
【0002】[0002]
プリント板等の導電用の穴すなわちスルーホールの出来上りの品質を検査する 一つの便利な方法として、スルーホール両端間の抵抗値を計ることによって検査 する方法がある。 One convenient method for inspecting the quality of finished conductive holes, that is, through holes, on a printed circuit board is to measure the resistance between both ends of the through holes.
【0003】 通常のスルーホールは抵抗値は小さく特にプリント配線用のプリント板の導通 用のスルーホールは通常数百μΩ程度のオーダをもつ微小抵抗であるため、電流 を通す測定用接続子の抵抗を測定値に含めないようにする4端子測定が必要であ る。The resistance value of an ordinary through hole is small, and in particular, the through hole for conduction of a printed wiring board for printed wiring is a very small resistance, usually on the order of several hundreds of μΩ. A 4-terminal measurement is required so that is not included in the measured value.
【0004】 図5に示されたものはスルーホール抵抗を4端子で測定できるようにし、かつ 容易に測定可能にした従来のプローブの先端部の構成であって、1は電流端子、 2は電圧端子、5は絶縁層である。その(a)は平面図、(b)は立面図である 。そして、図6にその測定中の状態が示されている。このようにプローブを2本 用い、プリント板3に設けられ、通常銅メッキ4されたスルーホール6の両側か ら測定端に押し当てて、二つの電流端子間に定電流回路から定った既知の電流す なわち基準測定電流を流す。このとき電流が電流端子接触線からスルーホール内 を流れる電流分布の一例の様子を示したのが図7(a)である。FIG. 5 shows the configuration of the tip portion of a conventional probe that allows the through-hole resistance to be measured with four terminals and can be easily measured, where 1 is a current terminal and 2 is a voltage terminal. Terminals 5 are insulating layers. (A) is a plan view and (b) is an elevation view. Then, FIG. 6 shows a state during the measurement. In this way, two probes are used, which are provided on the printed circuit board 3 and are pressed against the measurement end from both sides of the through hole 6 which is usually copper-plated 4, and is known from the constant current circuit between the two current terminals. Current, that is, the reference measurement current is passed. FIG. 7A shows an example of the distribution of the current flowing through the through hole from the current terminal contact line at this time.
【0005】 この図7(a)に示される例の場合、電圧端子接触線に最も近い電流路の部分 に図7(a)の矢印の如く電圧端子が当っているのと実質的に等しくなり、スル ーホールの実際の抵抗より内側の抵抗を測定することになりその分だけ誤差を生 じることになる。(図7の(b)を参照) このとき電圧端子で測定された電圧Vと既知の電流Iとからスルーホールの抵 抗RはR=V/Iの式から計算で求められる。In the case of the example shown in FIG. 7A, it is substantially equal to the voltage terminal contacting the portion of the current path closest to the voltage terminal contact line as shown by the arrow in FIG. 7A. However, the resistance inside the through hole is measured, which causes an error. (See (b) of FIG. 7) At this time, the resistance R of the through hole is calculated from the voltage V measured at the voltage terminal and the known current I from the equation R = V / I.
【0006】 この従来の技術の場合、スルーホールの測定端へのプローブの当り方によって は図7(a)に示したようにならないこともあるが、いずれにしても、従来のプ ローブでは測定すべきスルーホールの全周に対して、両測定端とも、電流端子が 接触する部分が半分以下しか密着接触すなわちコンタクトできないので、測定の ため流す既知の基準測定電流がスルーホール内を一様に流れないことになり、こ れが誤差を生ずる原因になっている。In the case of this conventional technique, depending on how the probe hits the measurement end of the through hole, the result may not be as shown in FIG. 7A, but in any case, the measurement is not performed by the conventional probe. For all the circumferences of the through hole, the current terminals contact at less than half of both measuring ends, that is, the contact can be made in close contact, that is, the known reference measurement current flowing for measurement is uniform in the through hole. It will not flow, which is a cause of error.
【0007】[0007]
従来のスルーホール抵抗測定用プローブでは先端の円錐形凸状の部分は図5に 示すように電流端子と電圧端子とが半々であり任意に端子の役割を交換しても全 く同じであるという便利の点はあっても、上述した如く基準測定電流が、スルー ホール側の原因でなく、プローブ側の原因で、スルーホールを一様に流れないこ とによる測定誤差を生じてしまうという問題があった。 In the conventional probe for measuring through-hole resistance, the conical convex portion at the tip has 50 and 50 current terminals and 50 voltage terminals as shown in FIG. Even though it is convenient, there is a problem that the reference measurement current is not caused by the through hole side but is caused by the probe side, which causes a measurement error because it does not flow uniformly through the through hole as described above. there were.
【0008】 本考案はこの問題の解決をはかろうとするものである。すなわち、プローブ側 の構成を改良することによって、測定のための基準測定電流ができる限り、そし て出来れば完全に一様にスルーホール内を流れるようにすることによって、この 問題を小さくするか又は解消しようとすることが本考案の目的である。The present invention seeks to solve this problem. In other words, by improving the configuration of the probe side, the reference measurement current for measurement should be made to flow in the through hole as uniformly as possible and, if possible, to reduce this problem. It is the purpose of the present invention to try to solve it.
【0009】[0009]
本考案は、まずスルーホールの抵抗を測定するための、先端部の電流端子とこ れと絶縁された電圧端子とを有するプローブの先端部を円錐形凸状に形成する。 ここまでは従来の技術におけるものと同じ考え方であるが、本考案では電流端子 と電圧端子とが対等ではなく、電圧端子を小さくして図4に示される如くプロー ブ先端部を4分割又は8分割など円錐の頂点を通る円錐の母線に沿って加工しや いように分割して両端子間を絶縁加工をほどこす。この場合、分割された部分の 小さい方を電圧端子とし、大きい部分又は分割数の大きい方を電流端子とする。 In the present invention, the tip of a probe having a current terminal at the tip and a voltage terminal insulated from the tip is formed into a conical convex shape for measuring the resistance of a through hole. Up to this point, the idea is the same as in the prior art, but in the present invention, the current terminal and the voltage terminal are not equal, and the voltage terminal is made smaller and the probe tip is divided into four or eight as shown in FIG. Insulation is performed between both terminals by dividing so that it can be easily processed along the generatrix of the cone that passes through the apex of the cone. In this case, the smaller of the divided parts is the voltage terminal, and the larger part or the one with the larger number of divisions is the current terminal.
【0010】 さらに本考案の別の態様においては、プローブの先端部を円錐形凸状に形成す ることは従来と同じであるが、この円錐形凸状の外側の全周をすべて電流端子と して構成し、電圧端子はこの円錐形凸状の内側の頂点近傍で外側の電流端子と電 気的に接続するように構成する。そして、プローブの先端部以外は円筒形に形成 し、この別の態様においてはプローブの円筒形状の外側の部分は電流端子へ測定 用の基準測定電流を導通する導通路となるべき所であって、円筒形の内部に設け られた電圧端子へ導通する通電路とは円筒形状のところにおいて電気的に接触し ないように構成する必要がある。In another aspect of the present invention, the tip of the probe is formed into a conical convex shape as in the conventional case, but the entire outer circumference of the conical convex shape is used as a current terminal. The voltage terminal is electrically connected to the current terminal on the outer side in the vicinity of the inner vertex of the conical convex shape. Then, except for the tip of the probe, it is formed in a cylindrical shape. It is necessary to configure so that the current-carrying path conducted to the voltage terminal provided inside the cylindrical shape does not make electrical contact with the cylindrical shape.
【0011】[0011]
本考案は従来の測定用プローブの外形の形状は変らず、電流端子部分は従来の ものより大きくなる。上の本考案の別の態様のものにおいてはスルーホールの測 定端に当たるプローブはすべて電流端子となる。 In the present invention, the outer shape of the conventional measuring probe is not changed, and the current terminal portion is larger than the conventional one. In another aspect of the present invention described above, all the probes that hit the measurement end of the through hole are current terminals.
【0012】 電流端子部分が大きいということは測定すべきスルーホールの測定端にプロー ブが接触したとき、プローブの電流端子かスルーホールの測定端に接する部分が 大きいということになるので、スルーホール内に基準測定電流が一様に近く流れ るようになり測定誤差が小さくなる。そのため、電圧端子部分は可能の限り小さ い方がよい。The fact that the current terminal portion is large means that when the probe comes into contact with the measurement end of the through hole to be measured, the portion in contact with the current terminal of the probe or the measurement end of the through hole is large. The reference measurement current flows almost uniformly within the area, reducing the measurement error. For this reason, the voltage terminal section should be as small as possible.
【0013】 又、本考案の別の態様においてはプローブがスルーホールの測定端に接触した ときその接触部のプローブはすべて電流端子であるので、スルーホール内に基準 測定電流が一様に流れるようになり、基準測定電流がスルーホール内を不均一に 流れることにもとづく測定誤差をなくすことができる。Further, according to another aspect of the present invention, when the probe contacts the measurement end of the through hole, all the probes at the contact part are current terminals, so that the reference measurement current flows uniformly in the through hole. Therefore, the measurement error due to the non-uniformity of the reference measurement current flowing in the through hole can be eliminated.
【0014】[0014]
【実施例】 理解の容易のため、上述した本考案の別の態様である実施例の方から述べる。Embodiments For ease of understanding, an embodiment which is another aspect of the present invention will be described.
【0015】 図1はその実施例のプローブの先端部を示す平面図(a)及び同プローブの先 端部を主として示す立面図(b)である。この円筒形のプローブを中空にして内 部の中心軸に沿って1本の導体をその先端でのみ円錐形凸状をなす外側の導体の 頂点で結合してピン状に設ける。このピン状に設けられた導体が電圧端子2であ って、外側の円筒形状の導体が先端部を含めて電流端子1とする。この実施例の 場合、円筒の最先端である円錐の頂点で電圧端子と電流端子とが電気的に接続し ているので非測定時の取り扱いに注意する必要があるが、測定すべきスルーホー ルの測定端と密着接触したときスルーホール内を基準測定電流が一様に流れ、電 圧の検出端もプローブとスルーホールとの接触面となるので、誤差を含まない測 定が可能となる。FIG. 1 is a plan view (a) showing a tip portion of a probe of the embodiment and an elevation view (b) mainly showing a tip portion of the probe. This cylindrical probe is made hollow, and one conductor is connected along the central axis of the inner part at the apex of the outer conductor having a conical convex shape only at its tip to form a pin shape. The pin-shaped conductor is the voltage terminal 2, and the outer cylindrical conductor is the current terminal 1 including the tip. In this example, since the voltage terminal and the current terminal are electrically connected at the apex of the cone, which is the tip of the cylinder, care must be taken when handling during non-measurement. The reference measurement current flows evenly through the through-hole when it comes into close contact with the measurement end, and the voltage detection end also becomes the contact surface between the probe and the through-hole, allowing measurement without error.
【0016】 その基準測定電流がプリント板3に設けられたスルーホール内の銅メッキ4部 を一様に流れる様子を示す図を図2にスルーホールを断面として示した。この図 2に示す如く実際に測定するときは本考案のプローブ2本(Hi端子とLo端子 として2本)を用い全体として4端子測定となるようにする必要があるのは勿論 である。FIG. 2 is a sectional view of the through hole, showing how the reference measurement current flows uniformly through the copper plating 4 in the through hole provided in the printed board 3. Of course, when actually measuring as shown in FIG. 2, it is necessary to use two probes of the present invention (two as the Hi terminal and the Lo terminal) so that the total four terminals can be measured.
【0017】 他の実施例として図3に示すものと図4に示すものの例について述べる。図3 に示すものは全体の形状は従来のものと同じで円筒形のプローブの先端が円錐凸 形に作られているが、同図に示されているものは電流端子部分を大きくとりその 分電圧端子部分を小さくしている。As another embodiment, examples of those shown in FIG. 3 and FIG. 4 will be described. The one shown in Fig. 3 has the same overall shape as the conventional one, and the tip of the cylindrical probe is made to be a conical convex shape. The voltage terminal is made smaller.
【0018】 図3の(a)に示す如く、プローブの先端部を示す平面投影面において頂点を 示す中心点からの回転角でほぼ270°の平面投影角の回転領域部分が電流端子 1の先端を表わしている。そして薄い絶縁物で作られた絶縁層5を除けば、平面 投影角で中心からほぼ90°の回転角の扇形部分すなわち回転領域が電圧端子2 の先端を表わしている。As shown in FIG. 3 (a), in the plane projection plane showing the tip of the probe, the rotation region portion of the plane projection angle of about 270 ° from the center point showing the apex is the tip of the current terminal 1. Is represented. With the exception of the insulating layer 5 made of a thin insulator, a fan-shaped portion having a rotation angle of about 90 ° from the center in a plane projection angle, that is, a rotation region represents the tip of the voltage terminal 2.
【0019】 このように、電流端子部分が大きいということは測定すべきスルーホールにプ ローブが密着接触した時電流端子が接する面が大きくなるので、スルーホール内 に流れる基準測定が一様に近く流れるようになりその分だけ測定誤差が小さくな るということである。ということは電圧端子2の先端部の扇形の中心角すなわち 回転角は可能な限り小さい方がよい。As described above, the fact that the current terminal portion is large means that the surface to which the current terminal contacts when the probe is in close contact with the through hole to be measured is large, so that the reference measurement flowing in the through hole is almost uniform. It means that the flow rate becomes larger and the measurement error becomes smaller accordingly. This means that the central angle of the fan shape at the tip of the voltage terminal 2, that is, the rotation angle, should be as small as possible.
【0020】 もっともあまり小さくすると製作上の困難が生ずるが、図4に示す如く先端部 の頂点と通る線で4分割又は8分割して、その1つに図示のように絶縁加工をほ どこして電圧端子として他をすべて電流端子としても良い。同図の場合は4分割 と8分割であるが製造上の困難を来たさない限り分割数を増やすことができ電流 端子を多くとった方がよいが、分割数が多ければ電圧端子を2つ又はそれ以上と することも可能である。しかし電流端子の部分を多くとるほど測定誤差は小さく なる。If it is made too small, manufacturing difficulty will occur, but as shown in FIG. 4, it is divided into 4 or 8 along the line passing through the apex of the tip, and one of them is subjected to insulation processing as shown in the figure. And all others may be current terminals. In the case of the figure, there are 4 divisions and 8 divisions, but it is better to increase the number of divisions as long as there is no difficulty in manufacturing and to use more current terminals. It may be one or more. However, the measurement error decreases as the number of current terminals increases.
【0021】[0021]
本考案はスルーホールそれも特に低抵抗のスルーホールを4端子測定で抵抗を 測定するのに適している。プローブの本体は円筒形でその先端が円錐形凸状に形 成され、さらにその頂点を中心に対称形に形成されているので、プローブが少し 傾むいても又スルーホールの孔の大小によらず測定が可能となる。その上、本考 案のように構成したプローブを2本用い、4端子測定の技術で抵抗を測定すれば 、従来のものに比較して測定のための基準測定電流がスルーホール内を一様に近 く、又は全く一様に流れるので、基準測定電流が不均一に流れることによる測定 誤差を小さく又は全く無くすことができる。 INDUSTRIAL APPLICABILITY The present invention is suitable for measuring the resistance of a through hole, especially a low resistance through hole by four-terminal measurement. The body of the probe is cylindrical and its tip is formed in a conical convex shape, and it is formed symmetrically around its apex.Therefore, even if the probe is slightly tilted, the size of the through hole hole It becomes possible to measure without any. Moreover, if two probes configured as in the present proposal are used and the resistance is measured by the 4-terminal measurement technique, the reference measurement current for measurement is more uniform in the through-hole than the conventional one. Since the current flows close to or completely uniform, the measurement error caused by the nonuniform flow of the reference measurement current can be reduced or eliminated altogether.
【図面の簡単な説明】[Brief description of drawings]
【図1】本考案の実施例のプローブを示す図。 (a)はその平面図 (b)はその立面図FIG. 1 is a diagram showing a probe according to an embodiment of the present invention. (A) is its plan view (b) is its elevation view
【図2】図1のプローブによる測定を行なうときのスル
ーホール内の基準測定電流の流れる様子を示す図。FIG. 2 is a diagram showing how a reference measurement current flows in a through hole when performing measurement with the probe of FIG.
【図3】本考案の他の実施例のプローブを示す図。 (a)はその平面図 (b)はその立面図FIG. 3 is a view showing a probe according to another embodiment of the present invention. (A) is its plan view (b) is its elevation view
【図4】本考案の他の実施例の変形例のプローブの先端
を示す図。 (a)4分割されたプローブの先端を示す平面図 (b)8分割されたプローブの先端を示す平面図FIG. 4 is a view showing a tip of a probe of a modified example of another embodiment of the present invention. (A) A plan view showing the tip of the probe divided into four (b) A plan view showing the tip of the probe divided into eight.
【図5】従来の技術におけるプローブを示す図 (a)その平面図 (b)その立面図FIG. 5 is a diagram showing a probe according to a conventional technique. (A) A plan view thereof (b) An elevation view thereof
【図6】従来の技術による測定を行なうときのプローブ
をスルーホールに密着接触させる形態を一部断面で示す
図。FIG. 6 is a partial cross-sectional view showing a mode in which a probe is brought into close contact with a through hole when performing measurement by a conventional technique.
【図7】従来の技術による測定時にスルーホール内の基
準測定電流の分布とその測定時の等価回路とを示す図。 (a)その基準測定電流の分布を示す図 (b)その測定時の等価回路図FIG. 7 is a diagram showing a distribution of a reference measurement current in a through hole at the time of measurement by a conventional technique and an equivalent circuit at the time of measurement. (A) Diagram showing the distribution of the reference measurement current (b) Equivalent circuit diagram at the time of measurement
1 電流端子 2 電圧端子 3 プリント板 4 銅メッキ 5 絶縁層 6 スルーホール 1 Current terminal 2 Voltage terminal 3 Printed board 4 Copper plating 5 Insulation layer 6 Through hole
Claims (4)
先端部に電流端子とこれと絶縁された電圧端子とを有す
るプローブにして、その先端部を円錐形凸状に形成し、
被測定部に接触する該円錐形凸状をなす先端部の外側に
おける、円錐の頂点からでる母線の、該頂点を中心とし
て該円錐形凸状を構成する全回転領域について平面投影
角として少なくとも180゜を超え全回転に対応する3
60゜未満で全回転角の大部分の回転角領域を電流端子
領域とし、残りの回転角領域を電圧端子領域としたこと
を特徴とするスルーホール抵抗測定用プローブ。1. For measuring the resistance of a through hole,
A probe having a current terminal and a voltage terminal insulated from this at the tip, and forming the tip into a conical convex shape,
At least 180 as a plane projection angle with respect to the entire rotation region of the generatrix extending from the apex of the cone on the outer side of the conical convex tip that contacts the measured portion and that forms the conical convex shape around the apex. Corresponding to all rotations over 3
A probe for measuring through-hole resistance, characterized in that most of the rotation angle region of less than 60 ° is a current terminal region and the remaining rotation angle region is a voltage terminal region.
て、その全回転角の連続する3/4又は7/8を実質的
にその領域とし、残りを実質的に電圧端子領域としたこ
とを特徴とするスルーホール抵抗測定用プローブ。2. The current terminal area according to claim 1, wherein the continuous 3/4 or 7/8 of all rotation angles is substantially the area and the rest is substantially the voltage terminal area. Through-hole resistance measurement probe.
ローブにして、その先端部を円錐形凸状に形成し、被測
定部に接触する該円錐形凸状をなす先端部の外側の全周
を実質的にすべて電流端子として、電圧端子はこの円錐
形凸状の内側の頂点近傍においてのみ内側から外側の電
流端子に電気的に接続される構成としたことを特徴とす
るスルーホール抵抗測定用プローブ。3. A probe for measuring the resistance of a through hole, the tip of which is formed into a conical convex shape, and the entire circumference of the outer side of the conical convex tip that contacts the measured portion. Is a current terminal, and the voltage terminal is electrically connected from the inside to the outside current terminal only near the apex of the inner side of the conical convex shape. probe.
構成し、この円筒状部は先端部の電流端子に導かれる電
気的導通路とし、その内側にはこの円筒状部とは絶縁さ
れ、この円筒の母線と平行的に電圧端子に電気的に接続
される導線が設けられる構成としたことを特徴とするス
ルーホール抵抗測定用プローブ。4. Except for the tip end portion of claim 3, the tip end portion is formed into a cylindrical shape, and this cylindrical portion serves as an electrical conduction path to be guided to a current terminal of the tip end portion, and the inside thereof is insulated from the cylindrical portion. A probe for measuring a through-hole resistance, characterized in that a conducting wire electrically connected to a voltage terminal is provided in parallel with the bus bar of the cylinder.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3184092U JPH0592749U (en) | 1992-05-14 | 1992-05-14 | Through-hole resistance measurement probe |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3184092U JPH0592749U (en) | 1992-05-14 | 1992-05-14 | Through-hole resistance measurement probe |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0592749U true JPH0592749U (en) | 1993-12-17 |
Family
ID=12342257
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3184092U Pending JPH0592749U (en) | 1992-05-14 | 1992-05-14 | Through-hole resistance measurement probe |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0592749U (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2004086062A1 (en) * | 2003-03-26 | 2004-10-07 | Jsr Corporation | Connecteur de mesure de resistances electriques, dispositif de connecteur de mesure de resistances electriques et leur procede de fabrication, dispositif de mesure de la resistance electrique de circuits substrats, et methode de mesure |
-
1992
- 1992-05-14 JP JP3184092U patent/JPH0592749U/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2004086062A1 (en) * | 2003-03-26 | 2004-10-07 | Jsr Corporation | Connecteur de mesure de resistances electriques, dispositif de connecteur de mesure de resistances electriques et leur procede de fabrication, dispositif de mesure de la resistance electrique de circuits substrats, et methode de mesure |
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