JPH0590888A - Surface acoustic wave element - Google Patents
Surface acoustic wave elementInfo
- Publication number
- JPH0590888A JPH0590888A JP24802691A JP24802691A JPH0590888A JP H0590888 A JPH0590888 A JP H0590888A JP 24802691 A JP24802691 A JP 24802691A JP 24802691 A JP24802691 A JP 24802691A JP H0590888 A JPH0590888 A JP H0590888A
- Authority
- JP
- Japan
- Prior art keywords
- thin film
- surface acoustic
- acoustic wave
- diamond thin
- diamond
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000010897 surface acoustic wave method Methods 0.000 title claims abstract description 43
- 229910003460 diamond Inorganic materials 0.000 claims abstract description 52
- 239000010432 diamond Substances 0.000 claims abstract description 52
- 239000010409 thin film Substances 0.000 claims abstract description 47
- 239000013078 crystal Substances 0.000 claims abstract description 27
- 239000000758 substrate Substances 0.000 claims abstract description 27
- 238000000034 method Methods 0.000 description 24
- 229910052710 silicon Inorganic materials 0.000 description 19
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 18
- 239000010703 silicon Substances 0.000 description 18
- 150000001875 compounds Chemical class 0.000 description 6
- 239000007789 gas Substances 0.000 description 6
- 229930195733 hydrocarbon Natural products 0.000 description 5
- 229910052751 metal Inorganic materials 0.000 description 5
- 239000002184 metal Substances 0.000 description 5
- 229910052719 titanium Inorganic materials 0.000 description 5
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 4
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 description 4
- 229910052799 carbon Inorganic materials 0.000 description 4
- 150000002430 hydrocarbons Chemical class 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 3
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 3
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 3
- ZMANZCXQSJIPKH-UHFFFAOYSA-N Triethylamine Chemical compound CCN(CC)CC ZMANZCXQSJIPKH-UHFFFAOYSA-N 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 3
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 3
- 238000005530 etching Methods 0.000 description 3
- -1 ethylene, propylene Chemical group 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- 229910052750 molybdenum Inorganic materials 0.000 description 3
- 229910052760 oxygen Inorganic materials 0.000 description 3
- 239000001301 oxygen Substances 0.000 description 3
- 239000002994 raw material Substances 0.000 description 3
- 229910052721 tungsten Inorganic materials 0.000 description 3
- 229910052726 zirconium Inorganic materials 0.000 description 3
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 2
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- KAKZBPTYRLMSJV-UHFFFAOYSA-N Butadiene Chemical compound C=CC=C KAKZBPTYRLMSJV-UHFFFAOYSA-N 0.000 description 2
- UGFAIRIUMAVXCW-UHFFFAOYSA-N Carbon monoxide Chemical compound [O+]#[C-] UGFAIRIUMAVXCW-UHFFFAOYSA-N 0.000 description 2
- RGSFGYAAUTVSQA-UHFFFAOYSA-N Cyclopentane Chemical compound C1CCCC1 RGSFGYAAUTVSQA-UHFFFAOYSA-N 0.000 description 2
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 2
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 2
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical compound OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 description 2
- 229910013641 LiNbO 3 Inorganic materials 0.000 description 2
- UFWIBTONFRDIAS-UHFFFAOYSA-N Naphthalene Chemical compound C1=CC=CC2=CC=CC=C21 UFWIBTONFRDIAS-UHFFFAOYSA-N 0.000 description 2
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 2
- ATUOYWHBWRKTHZ-UHFFFAOYSA-N Propane Chemical compound CCC ATUOYWHBWRKTHZ-UHFFFAOYSA-N 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- HSFWRNGVRCDJHI-UHFFFAOYSA-N alpha-acetylene Natural products C#C HSFWRNGVRCDJHI-UHFFFAOYSA-N 0.000 description 2
- 229910002092 carbon dioxide Inorganic materials 0.000 description 2
- 239000001569 carbon dioxide Substances 0.000 description 2
- 229910002091 carbon monoxide Inorganic materials 0.000 description 2
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- 230000000052 comparative effect Effects 0.000 description 2
- 238000010894 electron beam technology Methods 0.000 description 2
- 239000010408 film Substances 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 239000011261 inert gas Substances 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 2
- 229910017604 nitric acid Inorganic materials 0.000 description 2
- FDPIMTJIUBPUKL-UHFFFAOYSA-N pentan-3-one Chemical compound CCC(=O)CC FDPIMTJIUBPUKL-UHFFFAOYSA-N 0.000 description 2
- 239000003870 refractory metal Substances 0.000 description 2
- GETQZCLCWQTVFV-UHFFFAOYSA-N trimethylamine Chemical compound CN(C)C GETQZCLCWQTVFV-UHFFFAOYSA-N 0.000 description 2
- 238000001039 wet etching Methods 0.000 description 2
- PMPVIKIVABFJJI-UHFFFAOYSA-N Cyclobutane Chemical compound C1CCC1 PMPVIKIVABFJJI-UHFFFAOYSA-N 0.000 description 1
- XDTMQSROBMDMFD-UHFFFAOYSA-N Cyclohexane Chemical compound C1CCCCC1 XDTMQSROBMDMFD-UHFFFAOYSA-N 0.000 description 1
- LVZWSLJZHVFIQJ-UHFFFAOYSA-N Cyclopropane Chemical compound C1CC1 LVZWSLJZHVFIQJ-UHFFFAOYSA-N 0.000 description 1
- OTMSDBZUPAUEDD-UHFFFAOYSA-N Ethane Chemical compound CC OTMSDBZUPAUEDD-UHFFFAOYSA-N 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- 229910003334 KNbO3 Inorganic materials 0.000 description 1
- 229910012463 LiTaO3 Inorganic materials 0.000 description 1
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 1
- 239000003929 acidic solution Substances 0.000 description 1
- 230000003213 activating effect Effects 0.000 description 1
- 150000001298 alcohols Chemical class 0.000 description 1
- 239000012670 alkaline solution Substances 0.000 description 1
- 150000001412 amines Chemical class 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 150000004945 aromatic hydrocarbons Chemical class 0.000 description 1
- RWCCWEUUXYIKHB-UHFFFAOYSA-N benzophenone Chemical compound C=1C=CC=CC=1C(=O)C1=CC=CC=C1 RWCCWEUUXYIKHB-UHFFFAOYSA-N 0.000 description 1
- 239000012965 benzophenone Substances 0.000 description 1
- 229910052796 boron Inorganic materials 0.000 description 1
- 239000001273 butane Substances 0.000 description 1
- 150000001721 carbon Chemical class 0.000 description 1
- 125000004432 carbon atom Chemical group C* 0.000 description 1
- 239000003245 coal Substances 0.000 description 1
- 229910052681 coesite Inorganic materials 0.000 description 1
- 239000000571 coke Substances 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 229910052906 cristobalite Inorganic materials 0.000 description 1
- HWEQKSVYKBUIIK-UHFFFAOYSA-N cyclobuta-1,3-diene Chemical compound C1=CC=C1 HWEQKSVYKBUIIK-UHFFFAOYSA-N 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 150000001993 dienes Chemical class 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 239000007772 electrode material Substances 0.000 description 1
- 125000002534 ethynyl group Chemical group [H]C#C* 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 229910002804 graphite Inorganic materials 0.000 description 1
- 239000010439 graphite Substances 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- DMEGYFMYUHOHGS-UHFFFAOYSA-N heptamethylene Natural products C1CCCCCC1 DMEGYFMYUHOHGS-UHFFFAOYSA-N 0.000 description 1
- 238000005984 hydrogenation reaction Methods 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000010849 ion bombardment Methods 0.000 description 1
- 238000005468 ion implantation Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 150000002576 ketones Chemical class 0.000 description 1
- 229910052743 krypton Inorganic materials 0.000 description 1
- DNNSSWSSYDEUBZ-UHFFFAOYSA-N krypton atom Chemical compound [Kr] DNNSSWSSYDEUBZ-UHFFFAOYSA-N 0.000 description 1
- 229910052746 lanthanum Inorganic materials 0.000 description 1
- 238000001755 magnetron sputter deposition Methods 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 1
- 229910052753 mercury Inorganic materials 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 239000011259 mixed solution Substances 0.000 description 1
- 238000010295 mobile communication Methods 0.000 description 1
- IJDNQMDRQITEOD-UHFFFAOYSA-N n-butane Chemical compound CCCC IJDNQMDRQITEOD-UHFFFAOYSA-N 0.000 description 1
- OFBQJSOFQDEBGM-UHFFFAOYSA-N n-pentane Natural products CCCCC OFBQJSOFQDEBGM-UHFFFAOYSA-N 0.000 description 1
- 229910052754 neon Inorganic materials 0.000 description 1
- GKAOGPIIYCISHV-UHFFFAOYSA-N neon atom Chemical compound [Ne] GKAOGPIIYCISHV-UHFFFAOYSA-N 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 238000005240 physical vapour deposition Methods 0.000 description 1
- 238000005268 plasma chemical vapour deposition Methods 0.000 description 1
- 238000001020 plasma etching Methods 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 230000001902 propagating effect Effects 0.000 description 1
- 239000001294 propane Substances 0.000 description 1
- MWWATHDPGQKSAR-UHFFFAOYSA-N propyne Chemical group CC#C MWWATHDPGQKSAR-UHFFFAOYSA-N 0.000 description 1
- 229910052704 radon Inorganic materials 0.000 description 1
- SYUHGPGVQRZVTB-UHFFFAOYSA-N radon atom Chemical compound [Rn] SYUHGPGVQRZVTB-UHFFFAOYSA-N 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- SBIBMFFZSBJNJF-UHFFFAOYSA-N selenium;zinc Chemical compound [Se]=[Zn] SBIBMFFZSBJNJF-UHFFFAOYSA-N 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 229910052682 stishovite Inorganic materials 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 229910052717 sulfur Inorganic materials 0.000 description 1
- 238000001308 synthesis method Methods 0.000 description 1
- 125000000383 tetramethylene group Chemical group [H]C([H])([*:1])C([H])([H])C([H])([H])C([H])([H])[*:2] 0.000 description 1
- 229910052905 tridymite Inorganic materials 0.000 description 1
- 239000012808 vapor phase Substances 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- 229910001868 water Inorganic materials 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
Landscapes
- Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)
Abstract
(57)【要約】
【目的】 表面弾性波の伝搬損失を低減することのでき
る表面弾性波素子を提供する。
【構成】 基板と基板上に形成されるダイヤモンド薄膜
と、ダイヤモンド薄膜上に形成される圧電体薄膜と、特
定の波長の表面弾性波を発生させこれを取出すための1
対の電極とを備え、ダイヤモンド薄膜が(100)結晶
配列したダイヤモンド薄膜であることを特徴とする。
(57) [Summary] [Object] To provide a surface acoustic wave device capable of reducing the propagation loss of a surface acoustic wave. [Structure] A substrate, a diamond thin film formed on the substrate, a piezoelectric thin film formed on the diamond thin film, and 1 for generating and extracting a surface acoustic wave of a specific wavelength.
And a pair of electrodes, and the diamond thin film is a diamond thin film in which (100) crystals are arranged.
Description
【0001】[0001]
【産業上の利用分野】この発明は、たとえば高周波フィ
ルタなどに用いられる表面弾性波素子に関するものであ
り、特にダイヤモンド薄膜を用いた表面弾性波素子に関
するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a surface acoustic wave device used for, for example, a high frequency filter, and more particularly to a surface acoustic wave device using a diamond thin film.
【0002】[0002]
【従来の技術】表面弾性波素子は、弾性体表面を伝搬す
る表面波を利用した電気−機械変換素子である。図5
は、表面弾性波素子の一般的構造を示している。2. Description of the Related Art A surface acoustic wave element is an electro-mechanical conversion element utilizing surface waves propagating on the surface of an elastic body. Figure 5
Shows the general structure of a surface acoustic wave device.
【0003】図5を参照して、表面弾性波素子24は、
圧電体21の上に1対のくし型電極22および23を形
成することにより構成されている。Referring to FIG. 5, the surface acoustic wave element 24 is
It is configured by forming a pair of comb-shaped electrodes 22 and 23 on the piezoelectric body 21.
【0004】くし型電極22に電気信号を印加すると、
圧電体21に歪が生じ、この歪が表面弾性波となって圧
電体21を伝搬し、もう一方のくし型電極23で電気信
号として取出される。このように表面弾性波素子では、
表面波の励振に圧電体1の圧電現象が利用される。When an electric signal is applied to the comb-shaped electrode 22,
Strain occurs in the piezoelectric body 21, and this strain becomes a surface acoustic wave, propagates through the piezoelectric body 21, and is taken out as an electric signal by the other comb-shaped electrode 23. Thus, in the surface acoustic wave device,
The piezoelectric phenomenon of the piezoelectric body 1 is used to excite the surface wave.
【0005】この素子の周波数特性は、図5に示すよう
に、くし型電極における電極周期をλ0 、表面弾性波の
速度をνとすれば、f0 =ν/λ0 で定められる周波数
f0 を中心とした帯域通過特性となる。As shown in FIG. 5, the frequency characteristic of this element is such that when the electrode period of the comb-shaped electrode is λ 0 and the velocity of the surface acoustic wave is ν, the frequency f is defined by f 0 = ν / λ 0. Bandpass characteristics centered on 0 .
【0006】表面弾性波素子は部品点数が少なく、小型
にすることができ、しかも表面波の伝搬経路上において
信号の出入れが容易である。この素子は、フィルタ、遅
延線、発振器、共振器、コンボルバ、および相関器等に
応用することができる。The surface acoustic wave device has a small number of parts, can be made compact, and can easily input and output signals on the propagation path of the surface wave. This element can be applied to filters, delay lines, oscillators, resonators, convolvers, correlators, and the like.
【0007】特に、表面弾性波フィルタは、早くからテ
レビの中間周波数フィルタとして実用化され、さらにV
TRおよび各種の通信機器用フィルタに応用されてきて
いる。In particular, the surface acoustic wave filter has been put into practical use as an intermediate frequency filter for television from an early stage, and further V
It has been applied to TRs and filters for various communication devices.
【0008】この表面弾性波素子は、LiNbO3 およ
びLiTaO3 等の圧電体種結晶上にくし型電極を形成
することによって製造されてきた。しかしながら、近
年、ZnO等の圧電体薄膜をガラス等の基板上にスパッ
タ等の技術で成膜したものが用いられるようになってき
ている。しかしながら、ガラス上に成膜したZnO等の
圧電体薄膜は通常配向性のある多結晶質であり、散乱に
より損失が多く、100MHz以上の高周波帯で使用す
るには適していなかった。This surface acoustic wave device has been manufactured by forming a comb-shaped electrode on a piezoelectric seed crystal such as LiNbO 3 and LiTaO 3 . However, in recent years, a piezoelectric thin film such as ZnO formed on a substrate such as glass by a technique such as sputtering has been used. However, a piezoelectric thin film such as ZnO formed on glass is usually oriented polycrystalline and has a large loss due to scattering, and is not suitable for use in a high frequency band of 100 MHz or more.
【0009】一方、移動通信等の分野に用いられる表面
弾性波フィルタにおいては、より高い周波数域で使用で
きる素子が望まれている。上述したように、電極周期λ
0 がより小さくなるか、あるいは表面波の速度νがより
大きくなれば、素子の周波数特性はより高い中心周波数
f0 を有するようになる。On the other hand, in the surface acoustic wave filter used in the field of mobile communication and the like, an element which can be used in a higher frequency band is desired. As described above, the electrode period λ
When 0 becomes smaller or the velocity ν of the surface wave becomes larger, the frequency characteristic of the element has a higher center frequency f 0 .
【0010】そこで、弾性波がより速く伝搬される材
料、たとえばサファイアおよびダイヤモンド等の上に圧
電体膜を積層させた表面弾性波素子が開発されてきてい
る(たとえば、特開昭54−38874および特開昭6
4−62911)。Therefore, a surface acoustic wave device has been developed in which a piezoelectric film is laminated on a material that allows elastic waves to propagate faster, such as sapphire and diamond (see, for example, JP-A-54-38874 and JP-A-6
4-62911).
【0011】特に、ダイヤモンド中における音速は最も
速く、さらに熱的および化学的にも安定であるので、表
面弾性波素子を形成する基板としてダイヤモンドが注目
されている。ダイヤモンドを用いる表面弾性波素子は、
生産性および価格の面から基板上にダイヤモンド薄膜を
形成し、このダイヤモンド薄膜上に圧電体薄膜を形成す
るものが主に検討されている。In particular, diamond has attracted attention as a substrate for forming a surface acoustic wave device because it has the highest sound velocity in diamond and is stable both thermally and chemically. The surface acoustic wave device using diamond is
From the viewpoint of productivity and cost, a method of forming a diamond thin film on a substrate and forming a piezoelectric thin film on the diamond thin film is mainly studied.
【0012】[0012]
【発明が解決しようとする課題】しかしながら、このよ
うなダイヤモンド薄膜を用いた従来の表面弾性波素子に
おいては表面弾性波の伝搬損失が大きく、高い効率の表
面弾性波素子にすることができないという問題があっ
た。However, in the conventional surface acoustic wave device using such a diamond thin film, the propagation loss of the surface acoustic wave is large, and it is not possible to make the surface acoustic wave device highly efficient. was there.
【0013】この発明の目的は、表面弾性波の伝搬損失
を軽減することができ、高い効率を示す表面弾性波素子
を提供することにある。An object of the present invention is to provide a surface acoustic wave device which can reduce the propagation loss of surface acoustic waves and exhibits high efficiency.
【0014】[0014]
【課題を解決するための手段】この発明に従う表面弾性
波素子は、基板と、基板上に形成されるダイヤモンド薄
膜と、ダイヤモンド薄膜上に形成される圧電体薄膜と、
特定の波長の表面弾性波を発生させこれを取出すための
1対の電極とを備え、ダイヤモンド薄膜が、(100)
結晶配列したダイヤモンド薄膜であることを特徴として
いる。A surface acoustic wave device according to the present invention comprises a substrate, a diamond thin film formed on the substrate, and a piezoelectric thin film formed on the diamond thin film.
A diamond thin film is provided with a pair of electrodes for generating and extracting a surface acoustic wave having a specific wavelength.
It is characterized by being a diamond thin film in which crystals are arranged.
【0015】この発明において用いられる基板は、多結
晶のダイヤモンド薄膜をその上に形成できるものであれ
ば特に限定されない。たとえば、Si、Mo、W、Ga
As、およびLiNbO3 などを挙げることができる。The substrate used in the present invention is not particularly limited as long as a polycrystalline diamond thin film can be formed thereon. For example, Si, Mo, W, Ga
As, LiNbO 3 and the like can be mentioned.
【0016】この発明においては、ダイヤモンド薄膜を
(100)結晶配列するよう形成させている。(10
0)結晶配列させる方法としては、後に実施例において
述べるように、面方位を揃えた種結晶を基板上に配列し
ておき、この基板上にダイヤモンド薄膜を成長させる方
法がある。ダイヤモンド薄膜の成長方法は、たとえば、
CVD法、マイクロ波プラズマCVD法、プラズマCV
D法、PVD法、および熱フィラメント法など従来から
公知の方法を用いることができる。In the present invention, the diamond thin film is formed so as to have a (100) crystal arrangement. (10
0) As a method for arranging crystals, as will be described later in Examples, there is a method of arranging seed crystals having the same plane orientation on a substrate and growing a diamond thin film on the substrate. The diamond thin film growth method is, for example,
CVD method, microwave plasma CVD method, plasma CV
Conventionally known methods such as the D method, the PVD method, and the hot filament method can be used.
【0017】原料ガスを分解励起してダイヤモンドを気
相合成法で成長させる方法としては、たとえば、1)熱
電子放射材を1500K以上の温度に加熱して原料ガス
を活性化する方法、2)直流、高周波又はマイクロ波電
界による放電を利用する方法、3)イオン衝撃を利用す
る方法、4)レーザーなどの光を照射する方法、5)原
料ガスを燃焼させる方法、がある。As a method for decomposing and exciting the raw material gas to grow diamond by the vapor phase synthesis method, for example, 1) a method of activating the raw material gas by heating a thermoelectron emitting material to a temperature of 1500 K or higher, 2) There are a method of using discharge by a direct current, a high frequency or a microwave electric field, 3) a method of using ion bombardment, 4) a method of irradiating light such as a laser, and 5) a method of burning a source gas.
【0018】この発明において、使用する原料物質とし
ては、炭素含有化合物が一般的である。この炭素含有化
合物は、好ましくは水素ガスと組合せて用いられる。ま
た必要に応じて、酸素含有化合物および/または不活性
ガスと組合せて用いられる場合もある。In the present invention, the raw material used is generally a carbon-containing compound. This carbon-containing compound is preferably used in combination with hydrogen gas. Further, if necessary, it may be used in combination with an oxygen-containing compound and / or an inert gas.
【0019】炭素含有化合物としては、たとえばメタ
ン、エタン、プロパン、ブタン等のパラフィン系炭化水
素:エチレン、プロピレン、ブチレン等のオレフィン系
炭化水素:アセチレン、アリレン等のアセチレン系炭化
水素:ブタジエン等のジオレフィン系炭化水素:シクロ
プロパン、シクロブタン、シクロペンタン、シクロヘキ
サン等の脂環式炭化水素:シクロブタジエン、ベンゼ
ン、トルエン、キシレン、ナフタレン等の芳香族炭化水
素:アセトン、ジエチルケトン、ベンゾフェノン等のケ
トン類:メタノール、エタノール等のアルコール類:ト
リメチルアミン、トリエチルアミンなどのアミン類:炭
酸ガス、一酸化炭素などを挙げることができる。これら
は、1種を単独で用いることもできるし、2種以上を併
用することもできる。あるいは炭素含有化合物は、グラ
ファイト、石炭、コークスなどの炭素原子のみから成る
物質であってもよい。Examples of the carbon-containing compound include paraffinic hydrocarbons such as methane, ethane, propane and butane: olefinic hydrocarbons such as ethylene, propylene and butylene: acetylene hydrocarbons such as acetylene and allylene: diene such as butadiene. Olefinic hydrocarbons: cycloaliphatic hydrocarbons such as cyclopropane, cyclobutane, cyclopentane and cyclohexane: aromatic hydrocarbons such as cyclobutadiene, benzene, toluene, xylene and naphthalene: ketones such as acetone, diethyl ketone and benzophenone: Alcohols such as methanol and ethanol: amines such as trimethylamine and triethylamine: carbon dioxide gas, carbon monoxide and the like. These can be used individually by 1 type and can also use 2 or more types together. Alternatively, the carbon-containing compound may be a substance composed of only carbon atoms, such as graphite, coal or coke.
【0020】酸素含有化合物としては、酸素、水、一酸
化炭素、二酸化炭素、過酸化水素が容易に入手できるゆ
え好ましい。As the oxygen-containing compound, oxygen, water, carbon monoxide, carbon dioxide and hydrogen peroxide are preferable because they are easily available.
【0021】不活性ガスは、たとえば、アルゴン、ヘリ
ウム、ネオン、、クリプトン、キセノン、ラドンであ
る。The inert gas is, for example, argon, helium, neon, krypton, xenon or radon.
【0022】この発明において用いられる圧電体層とし
ては、ZnO、AlN、Pb(Zr,Ti)O3 、(P
b,La)(Zr,Ti)O3 、LiTaO3 、LiN
bO 3 、SiO2 、Ta2 O5 、Nb2 O5 、BeO、
Li2 B4 O7 、KNbO3 、ZnS、ZnSeおよび
CdSなどを主成分とするものを使用することができ
る。圧電体層は、種結晶および多結晶のいずれであって
もよいが、素子をより高周波域で使用するためには、表
面波の散乱の少ない種結晶がより好ましい。As the piezoelectric layer used in the present invention
ZnO, AlN, Pb (Zr, Ti) O3, (P
b, La) (Zr, Ti) O3, LiTaO3, LiN
bO 3, SiO2, Ta2OFive, Nb2OFive, BeO,
Li2BFourO7, KNbO3, ZnS, ZnSe and
It is possible to use one that has CdS as a main component.
It The piezoelectric layer is either a seed crystal or a polycrystal.
However, in order to use the device at higher frequencies, the
A seed crystal with less scattering of surface waves is more preferable.
【0023】ZnO、AlNおよびPb(Zr,Ti)
O3 等の圧電体層は、CVD法によって形成することが
できる。ZnO, AlN and Pb (Zr, Ti)
The piezoelectric layer such as O 3 can be formed by the CVD method.
【0024】この発明で設けられる電極としては、くし
型電極またはインタデジタル・トランスデューサ(ID
T)電極と称される電極を用いることができる。この電
極は、たとえばエッチングにより作製することができ
る。The electrodes provided in the present invention are comb-shaped electrodes or interdigital transducers (ID
It is possible to use electrodes called T) electrodes. This electrode can be produced by etching, for example.
【0025】電極材料としては抵抗率の小さい電極が好
ましく、Au、Ag、およびAlなどの低温で蒸着可能
な金属、Ti、W、およびMoなどの高融点金属、なら
びにたとえば、Tiの上にAlを形成するような2種類
以上の金属の組合わせなどが可能である。電極の作製の
容易さからは、AlおよびTiが好ましい。またダイヤ
モンド薄膜を誘電体とするときの密着性からは、Wおよ
びMoが好ましい。As the electrode material, an electrode having a low resistivity is preferable, and a metal that can be deposited at a low temperature such as Au, Ag, and Al, a refractory metal such as Ti, W, and Mo, and, for example, Al on Ti. It is possible to combine two or more kinds of metals to form Al and Ti are preferable from the viewpoint of easy production of the electrode. Further, W and Mo are preferable in terms of adhesion when the diamond thin film is used as a dielectric.
【0026】電極の作製方法としては、電極用金属を成
膜した後に、レジストを電極用金属の表面に均一に塗布
し、ガラス等の透明平板に電極のパターンを形成したマ
スクを載せた後、水銀ランプなどを用いて露光する方法
がある。また、電子ビームにより電極を直接に形成する
ことも可能である。As a method of manufacturing the electrode, after forming the metal for the electrode, a resist is uniformly applied on the surface of the metal for the electrode, and a mask having a pattern of the electrode is placed on a transparent flat plate such as glass. There is a method of exposing using a mercury lamp or the like. It is also possible to directly form the electrodes with an electron beam.
【0027】電極のエッチング方法は、たとえば、Al
等の低融点金属の場合、水酸化ナトリウム溶液等のアル
カリ性溶液、または硝酸等の酸性溶液によるウェットエ
ッチングが可能である。The electrode etching method is, for example, Al.
In the case of a low melting point metal such as, wet etching with an alkaline solution such as sodium hydroxide solution or an acidic solution such as nitric acid is possible.
【0028】高融点金属の場合はフッ酸と硝酸の混合溶
液を用いてエッチングすることができる。またBCl3
等のガスを用いて反応性イオンエッチング法により電極
を作製することも可能である。In the case of a refractory metal, etching can be performed using a mixed solution of hydrofluoric acid and nitric acid. Also BCl 3
It is also possible to produce an electrode by a reactive ion etching method using such a gas.
【0029】電極は、また半導電性ダイヤモンドを用い
て形成することも可能である。高純度で形成されたダイ
ヤモンドは絶縁性であるが、B、Al、P、およびS等
の不純物をイオン注入などの方法で添加したり、あるい
は電子線照射を用いて格子欠陥を導入したり、水素化処
理などを施すことによって、半導電性ダイヤモンドを形
成することができる。The electrodes can also be formed using semiconductive diamond. Although diamond formed with high purity is insulating, impurities such as B, Al, P, and S are added by a method such as ion implantation, or lattice defects are introduced by using electron beam irradiation. A semiconductive diamond can be formed by performing hydrogenation treatment or the like.
【0030】[0030]
【発明の作用効果】この発明に従う表面弾性波素子にお
いては、ダイヤモンド薄膜が(100)結晶配列してい
る。このため、従来のダイヤモンド薄膜のように粒界で
の不連続により表面弾性波の散乱を生じることがなく、
表面弾性波の伝搬損失を小さくすることができる。In the surface acoustic wave device according to the present invention, the diamond thin films are arranged in (100) crystals. Therefore, unlike the conventional diamond thin film, scattering of surface acoustic waves does not occur due to discontinuity at the grain boundary,
The propagation loss of surface acoustic waves can be reduced.
【0031】したがって、この発明に従う表面弾性波素
子は、高い効率の表面弾性波素子とすることができ、高
周波フィルタとして用いる場合には、フィルタ特性の優
れた高効率の高周波フィルタとすることができる。Therefore, the surface acoustic wave element according to the present invention can be a high efficiency surface acoustic wave element, and when used as a high frequency filter, it can be a high efficiency high frequency filter having excellent filter characteristics. ..
【0032】[0032]
【実施例】まず、シリコン基板上に(100)結晶配列
したダイヤモンド薄膜を形成するための種結晶をシリコ
ン基板上に形成する。図1は、ダイヤモンドの種結晶を
選択的に成長させるための孔を形成したシリコン基板を
示している。図1を参照して、シリコン基板1上には図
2に平面図で示すような格子状のレジスト2が形成され
る。このようなレジスト2の存在下において、シリコン
基板1に対し異方性エッチングを施し、図1に示される
ような(111)面の傾斜面5を有した100μm角程
度の種結晶成長用孔3を形成させる。EXAMPLE First, a seed crystal for forming a diamond thin film having a (100) crystal array on a silicon substrate is formed on the silicon substrate. FIG. 1 shows a silicon substrate having holes formed therein for selectively growing a diamond seed crystal. Referring to FIG. 1, a lattice-shaped resist 2 as shown in a plan view of FIG. 2 is formed on silicon substrate 1. In the presence of such a resist 2, the silicon substrate 1 is anisotropically etched to form seed crystal growth holes 3 of about 100 μm square having a (111) plane inclined surface 5 as shown in FIG. To form.
【0033】このシリコン基板1上に市販の直径75〜
100μmの(111)面ダイヤモンド種結晶の粉末を
載せて適度にふるうことにより、成長用孔3内に種結晶
を埋め込む。A commercially available diameter of 75-
A (111) face diamond seed crystal powder of 100 μm is placed and appropriately sieved to embed the seed crystal in the growth hole 3.
【0034】図3は、このようにしてシリコン基板にダ
イヤモンドの種結晶を埋め込んだ状態を示している。図
3を参照して、種結晶成長用孔3のそれぞれには、種結
晶4が埋め込まれている。FIG. 3 shows a state in which a diamond seed crystal is embedded in the silicon substrate in this manner. Referring to FIG. 3, seed crystal 4 is embedded in each seed crystal growth hole 3.
【0035】このようにして種結晶4が所定の間隔で配
置されたシリコン基板1上に、ダイヤモンド薄膜を成長
させ、(100)結晶配列したダイヤモンド薄膜を成長
させた。Thus, a diamond thin film was grown on the silicon substrate 1 on which the seed crystals 4 were arranged at a predetermined interval, and a diamond thin film having a (100) crystal array was grown.
【0036】まず、反応室にH2 およびCH4 を20
0:1の割合で混合した混合ガスを、全流量が約20s
ccmとなるように導入した。次に、反応室の圧力を約
40Torrに維持し、マイクロ波パワー400Wで放
電してプラズマ状態とし、種結晶を配列した上記のシリ
コン基板の上にダイヤモンド薄膜を25μm成長させ
た。基板温度は約850℃とした。First, 20 H 2 and CH 4 were added to the reaction chamber.
The mixed gas mixed at a ratio of 0: 1 has a total flow rate of about 20 s.
It was introduced so as to be ccm. Next, the pressure in the reaction chamber was maintained at about 40 Torr, a microwave power of 400 W was discharged, and a plasma state was obtained, and a diamond thin film was grown to 25 μm on the above-mentioned silicon substrate on which seed crystals were arranged. The substrate temperature was about 850 ° C.
【0037】ダイヤモンド薄膜を100μmの厚みで成
長させた後、このダイヤモンド薄膜の上に抵抗加熱法に
よりAlを500Å蒸着し、フォトリソグラフィ法を用
いて、電極幅および電極間隔が2μmのくし型電極を作
製した。電極の作製法としては、ウェットエッチング法
を用いた。After growing a diamond thin film to a thickness of 100 μm, 500 liters of Al was vapor-deposited on the diamond thin film by a resistance heating method, and a comb-shaped electrode having an electrode width and an electrode interval of 2 μm was formed by photolithography. It was made. A wet etching method was used as a method for manufacturing the electrodes.
【0038】くし型電極を作製したダイヤモンド薄膜の
上に、圧電体薄膜として、ZnO薄膜を0.9μmの厚
みで形成した。ZnO薄膜は、マグネトロンスパッタ装
置を用いて形成した。A ZnO thin film having a thickness of 0.9 μm was formed as a piezoelectric thin film on the diamond thin film on which the comb-shaped electrode was produced. The ZnO thin film was formed using a magnetron sputtering device.
【0039】比較として、従来の方法に従い、シリコン
基板の上にランダムに配した多結晶ダイヤモンド膜を成
長させ、上記の実施例と同様にして表面弾性波素子を作
製した。For comparison, according to the conventional method, a randomly arranged polycrystalline diamond film was grown on a silicon substrate, and a surface acoustic wave device was produced in the same manner as in the above-mentioned embodiment.
【0040】上記の実施例の表面弾性波素子と比較の表
面弾性波素子について伝搬損失を比較したところ、この
発明に従う上記の実施例の表面弾性波素子の伝搬損失
は、比較の表面弾性波素子の伝搬損失の1/4であっ
た。When the propagation losses of the surface acoustic wave device of the above-mentioned embodiment and the comparative surface acoustic wave device are compared, the propagation loss of the surface acoustic wave device of the above-mentioned embodiment according to the present invention is found to be the comparative surface acoustic wave device. It was 1/4 of the propagation loss.
【0041】以上のことから明らかなように、この発明
に従いダイヤモンド薄膜を(100)結晶配列させるこ
とにより、著しく表面弾性波の伝搬損失を低減させるこ
とができた。As is clear from the above, by arranging the diamond thin film in the (100) crystal according to the present invention, the propagation loss of the surface acoustic wave could be remarkably reduced.
【0042】図4は、シリコンウェハを示しており、こ
の発明に従う表面弾性波素子は、たとえば図4に示すよ
うなシリコンウェハ全体を格子状に分割し、その格子状
の領域の中にのみ上記のような種結晶5を配列すること
によって、この格子状の領域内だけでダイヤモンド薄膜
を成長させることができる。このようにすることによ
り、ダイヤモンド薄膜成長領域11の境界にあたる格子
の部分にはダイヤモンド薄膜が形成されず、表面弾性波
素子をシリコンウェハ上で作製した後、各素子を切離す
際、この境界部分にダイヤモンド薄膜が形成されていな
いので、容易に各素子を分離させることができる。FIG. 4 shows a silicon wafer, and the surface acoustic wave device according to the present invention divides the entire silicon wafer into a lattice shape as shown in FIG. By arranging the seed crystals 5 as described above, the diamond thin film can be grown only in this lattice-shaped region. By doing so, the diamond thin film is not formed in the lattice part corresponding to the boundary of the diamond thin film growth region 11, and after the surface acoustic wave device is produced on the silicon wafer, when separating each device, this boundary part Since the diamond thin film is not formed on, each element can be easily separated.
【0043】このように上記実施例の方法に従い種結晶
を配列した基板を用いてダイヤモンド薄膜を成長させる
方法では、製造工程をより容易にすることができる。As described above, the method of growing the diamond thin film by using the substrate on which the seed crystals are arranged according to the method of the above embodiment can facilitate the manufacturing process.
【図1】ダイヤモンドの種結晶を選択的に成長させるた
めの孔を形成したシリコン基板を示す断面図である。FIG. 1 is a cross-sectional view showing a silicon substrate having a hole for selectively growing a diamond seed crystal.
【図2】図1に示すシリコン基板の平面図である。FIG. 2 is a plan view of the silicon substrate shown in FIG.
【図3】図1のシリコン基板にダイヤモンドの種結晶を
埋め込んだ状態を示す断面図である。FIG. 3 is a cross-sectional view showing a state where a diamond seed crystal is embedded in the silicon substrate of FIG.
【図4】格子内の領域のみにダイヤモンド薄膜を成長さ
せたシリコンウェハを示す平面図である。FIG. 4 is a plan view showing a silicon wafer on which a diamond thin film is grown only in a region within a lattice.
【図5】表面弾性波素子の一般的構造を示す斜視図であ
る。FIG. 5 is a perspective view showing a general structure of a surface acoustic wave device.
1 シリコン基板 2 レジスト 3 種結晶成長用孔 4 種結晶 10 シリコンウェハ 11 ダイヤモンド薄膜成長領域 1 Silicon Substrate 2 Resist 3 Seed Crystal Growth Hole 4 Seed Crystal 10 Silicon Wafer 11 Diamond Thin Film Growth Region
───────────────────────────────────────────────────── フロントページの続き (72)発明者 藤森 直治 兵庫県伊丹市昆陽北一丁目1番1号 住友 電気工業株式会社伊丹製作所内 ─────────────────────────────────────────────────── ─── Continuation of front page (72) Inventor Naoji Fujimori 1-1-1 Kunyokita, Itami City, Hyogo Prefecture Sumitomo Electric Industries, Ltd. Itami Works
Claims (1)
ド薄膜と、ダイヤモンド薄膜上に形成される圧電体薄膜
と、特定の波長の表面弾性波を発生させこれを取出すた
めの1対の電極とを備える表面弾性波素子において、 前記ダイヤモンド薄膜が、(100)結晶配列したダイ
ヤモンド薄膜であることを特徴とする、表面弾性波素
子。1. A substrate, a diamond thin film formed on the substrate, a piezoelectric thin film formed on the diamond thin film, and a pair of electrodes for generating and extracting surface acoustic waves of a specific wavelength. A surface acoustic wave device comprising: a surface acoustic wave device, wherein the diamond thin film is a diamond thin film having a (100) crystal arrangement.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP03248026A JP3132515B2 (en) | 1991-09-26 | 1991-09-26 | Method for manufacturing surface acoustic wave device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP03248026A JP3132515B2 (en) | 1991-09-26 | 1991-09-26 | Method for manufacturing surface acoustic wave device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0590888A true JPH0590888A (en) | 1993-04-09 |
JP3132515B2 JP3132515B2 (en) | 2001-02-05 |
Family
ID=17172102
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP03248026A Expired - Fee Related JP3132515B2 (en) | 1991-09-26 | 1991-09-26 | Method for manufacturing surface acoustic wave device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP3132515B2 (en) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0669412A1 (en) * | 1994-02-25 | 1995-08-30 | Sumitomo Electric Industries, Ltd. | Aluminim nitride thin film substrate and process for producing same |
EP0674386A1 (en) * | 1994-03-25 | 1995-09-27 | Sumitomo Electric Industries, Ltd. | Orientational material and surface acoustic wave device |
EP0674385A1 (en) * | 1994-03-25 | 1995-09-27 | Sumitomo Electric Industries, Ltd. | Orientational material, orientational substrate and surface acoustic wave device |
EP0674384A1 (en) * | 1994-03-25 | 1995-09-27 | Sumitomo Electric Industries, Ltd | Orientational material and surface acoustic wave device |
EP0676485A1 (en) * | 1994-04-07 | 1995-10-11 | Sumitomo Electric Industries, Limited | Diamond wafer and method of producing a diamond wafer |
EP0699776A1 (en) * | 1994-06-09 | 1996-03-06 | Sumitomo Electric Industries, Limited | Wafer and method of producing a wafer |
US7949021B2 (en) | 2005-09-29 | 2011-05-24 | Sumitomo Electric Industries, Ltd. | Light source apparatus |
-
1991
- 1991-09-26 JP JP03248026A patent/JP3132515B2/en not_active Expired - Fee Related
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0669412A1 (en) * | 1994-02-25 | 1995-08-30 | Sumitomo Electric Industries, Ltd. | Aluminim nitride thin film substrate and process for producing same |
US5571603A (en) * | 1994-02-25 | 1996-11-05 | Sumitomo Electric Industries, Ltd. | Aluminum nitride film substrate and process for producing same |
EP0674386A1 (en) * | 1994-03-25 | 1995-09-27 | Sumitomo Electric Industries, Ltd. | Orientational material and surface acoustic wave device |
EP0674385A1 (en) * | 1994-03-25 | 1995-09-27 | Sumitomo Electric Industries, Ltd. | Orientational material, orientational substrate and surface acoustic wave device |
EP0674384A1 (en) * | 1994-03-25 | 1995-09-27 | Sumitomo Electric Industries, Ltd | Orientational material and surface acoustic wave device |
EP0930702A2 (en) * | 1994-03-25 | 1999-07-21 | Sumitomo Electric Industries, Ltd. | Orientational material and surface acoustic wave device |
EP0930702A3 (en) * | 1994-03-25 | 2000-04-19 | Sumitomo Electric Industries, Ltd. | Orientational material and surface acoustic wave device |
EP0676485A1 (en) * | 1994-04-07 | 1995-10-11 | Sumitomo Electric Industries, Limited | Diamond wafer and method of producing a diamond wafer |
US5776246A (en) * | 1994-04-07 | 1998-07-07 | Sumitomo Electric Industries, Ltd. | Diamond wafer and method of producing a diamond wafer |
EP0699776A1 (en) * | 1994-06-09 | 1996-03-06 | Sumitomo Electric Industries, Limited | Wafer and method of producing a wafer |
US7949021B2 (en) | 2005-09-29 | 2011-05-24 | Sumitomo Electric Industries, Ltd. | Light source apparatus |
Also Published As
Publication number | Publication date |
---|---|
JP3132515B2 (en) | 2001-02-05 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP3163606B2 (en) | Surface acoustic wave device | |
JP3205976B2 (en) | Surface acoustic wave device | |
JP3252865B2 (en) | Surface acoustic wave device and method of manufacturing surface acoustic wave device | |
US5160869A (en) | Surface acoustic wave device | |
US5355568A (en) | Method of making a surface acoustic wave device | |
US5401544A (en) | Method for manufacturing a surface acoustic wave device | |
JP3225495B2 (en) | Surface acoustic wave device and method of manufacturing the same | |
JP3109060B2 (en) | Surface acoustic wave device | |
JPH10270978A (en) | Surface acoustic wave element and its manufacture | |
JP3132515B2 (en) | Method for manufacturing surface acoustic wave device | |
US6642813B1 (en) | Surface acoustic wave device utilizing a ZnO layer and a diamond layer | |
JP3248258B2 (en) | Surface acoustic wave device | |
US5463901A (en) | Stacked piezoelectric surface acoustic wave device with a boron nitride layer in the stack | |
JPH0590893A (en) | Surface acoustic wave element | |
JPH0590874A (en) | Surface acoustic wave element | |
US6984918B1 (en) | Saw device | |
JPH08316782A (en) | Surface acoustic wave element | |
JP3341759B2 (en) | Surface acoustic wave device | |
JPH0590886A (en) | Surface acoustic wave device | |
JPH0548383A (en) | Surface acoustic wave device and manufacturing method thereof | |
JP3132074B2 (en) | Diamond surface acoustic wave device | |
JPH0567941A (en) | Surface acoustic wave device | |
JPH0590860A (en) | Method for manufacturing surface acoustic wave device | |
JPH0590862A (en) | Semiconductor composite element and manufacturing method thereof |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
FPAY | Renewal fee payment (prs date is renewal date of database) |
Year of fee payment: 7 Free format text: PAYMENT UNTIL: 20071124 |
|
FPAY | Renewal fee payment (prs date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20081124 Year of fee payment: 8 |
|
FPAY | Renewal fee payment (prs date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20091124 Year of fee payment: 9 |
|
LAPS | Cancellation because of no payment of annual fees |